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"Improving Productivity and Efficiency of SSD Manufacturing Self-Test ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yunfei Gu et al. (2023)

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DOI: 10.1109/ITC51656.2023.00039

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-25

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Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai:
Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction. ITC 2023: 226-235

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