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"Extending a 65nm CMOS process design kit for high total ionizing dose effects."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Aristeidis Nikolaou et al. (2018)

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DOI: 10.1109/MOCAST.2018.8376561

access: closed

type: Conference or Workshop Paper

metadata version: 2025-10-14

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  - https://dblp.org/rec/conf/mocast/NikolaouBMPCBKK18
Aristeidis Nikolaou, Matthias Bucher, Nikos Makris, Alexia Papadopoulou, Loukas Chevas, Giulio Borghello, Henri D. Koch, Kostas Kloukinas, Tuomas S. Poikela, Federico Faccio:
Extending a 65nm CMOS process design kit for high total ionizing dose effects. MOCAST 2018: 1-4

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