<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/seke/WangYZCW23" mdate="2023-09-06">
<author>Haifeng Wang</author>
<author>Kun Yang</author>
<author>Xiangnan Zhao</author>
<author>Yuchen Cui</author>
<author>Weiwei Wang</author>
<title>Contribution-based Test Case Reduction Strategy for Mutation-based Fault Localization (S).</title>
<pages>142-145</pages>
<year>2023</year>
<booktitle>SEKE</booktitle>
<ee>https://doi.org/10.18293/SEKE2023-180</ee>
<crossref>conf/seke/2023</crossref>
<url>db/conf/seke/seke2023.html#WangYZCW23</url>
</inproceedings>
</dblp>
