BibTeX record journals/access/AjayanPSKT25

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@article{DBLP:journals/access/AjayanPSKT25,
  author       = {J. Ajayan and
                  Asisa Kumar Panigrahy and
                  Sachidananda Sen and
                  Maneesh Kumar and
                  Shubham Tayal},
  title        = {Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode
                  AlGaN/GaN Power HEMTs: {A} Critical Review},
  journal      = {{IEEE} Access},
  volume       = {13},
  pages        = {84541--84554},
  year         = {2025},
  url          = {https://doi.org/10.1109/ACCESS.2025.3569288},
  doi          = {10.1109/ACCESS.2025.3569288},
  timestamp    = {Wed, 11 Jun 2025 21:00:36 +0200},
  biburl       = {https://dblp.org/rec/journals/access/AjayanPSKT25.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}