<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/access/AsmitaTGSH25" mdate="2025-07-14">
<author orcid="0000-0002-5626-1985">Asmita 0001</author>
<author orcid="0009-0006-8382-0099">Ryan Tsang</author>
<author orcid="0009-0009-1331-0706">Sujan Ghimire</author>
<author orcid="0000-0001-5998-8795">Soheil Salehi</author>
<author orcid="0000-0001-8904-4699">Houman Homayoun</author>
<title>Bare-Metal Firmware Fuzzing: A Survey of Techniques and Approaches.</title>
<pages>98253-98277</pages>
<year>2025</year>
<volume>13</volume>
<journal>IEEE Access</journal>
<ee type="oa">https://doi.org/10.1109/ACCESS.2025.3575691</ee>
<url>db/journals/access/access13.html#AsmitaTGSH25</url>
<stream>streams/journals/access</stream>
</article>
</dblp>
