"Online Degradation State Assessment Methodology for Multi-Mode Failures of ..."

Xiangxiang Liu et al. (2020)

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DOI: 10.1109/ACCESS.2020.2984385

access: open

type: Journal Article

metadata version: 2025-01-19

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Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht:
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access 8: 69471-69481 (2020)

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