Performance improvement of timing and power variations due to random dopant fluctuation in negative-capacitance CMOS inverters.

Kai Zhang Weifeng Lü Peng Si Zhifeng Zhao Tianyu Yu 0007 Performance improvement of timing and power variations due to random dopant fluctuation in negative-capacitance CMOS inverters. 908-914 2020 14 IET Circuits Devices Syst. 6 https://doi.org/10.1049/iet-cds.2020.0101 db/journals/iet-cds/iet-cds14.html#ZhangLSZY20