<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/mj/YuLZSZ21" mdate="2024-11-06">
<author>Tianyu Yu 0007</author>
<author>Weifeng L&#252;</author>
<author>Zhifeng Zhao</author>
<author>Peng Si</author>
<author>Kai Zhang</author>
<title>Negative drain-induced barrier lowering and negative differential resistance effects in negative-capacitance transistors.</title>
<pages>104981</pages>
<year>2021</year>
<volume>108</volume>
<journal>Microelectron. J.</journal>
<ee>https://doi.org/10.1016/j.mejo.2020.104981</ee>
<url>db/journals/mj/mj108.html#YuLZSZ21</url>
</article>
</dblp>
