<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/mr/Gallois-Garreignot15" mdate="2020-02-22">
<author>S&#233;bastien Gallois-Garreignot</author>
<author>Naceur Benzima</author>
<author>Etienne Benmussa</author>
<author>Caroline Moutin</author>
<author>Pierre-Olivier Bouchard</author>
<author>Vincent Fiori</author>
<author>Cl&#233;ment Tavernier</author>
<title>Qualification of bumping processes: Experimental and numerical investigations on mechanical stress and failure modes induced by shear test.</title>
<pages>980-989</pages>
<year>2015</year>
<volume>55</volume>
<journal>Microelectron. Reliab.</journal>
<number>6</number>
<ee>https://doi.org/10.1016/j.microrel.2015.03.008</ee>
<url>db/journals/mr/mr55.html#Gallois-Garreignot15</url>
</article></dblp>
