"Series resistance degradation due to NBTI in PMOSFET."

Mahesh S. Krishnan et al. (2002)

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DOI: 10.1016/S0026-2714(02)00164-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li:
Series resistance degradation due to NBTI in PMOSFET. Microelectron. Reliab. 42(9-11): 1433-1438 (2002)

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