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"Ku band damage characteristics of GaAs pHEMT induced by a front-door ..."
Yang Liu et al. (2016)
- Yang Liu, Changchun Chai, Qingyang Fan, Chunlei Shi, Xiaowen Xi, Xinhai Yu, Yintang Yang:

Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse. Microelectron. Reliab. 66: 32-37 (2016)

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