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<dblp>
<article key="journals/tim/MengZDZZFZ23" mdate="2023-03-15">
<author orcid="0000-0002-2899-2932">Xianwei Meng</author>
<author orcid="0000-0001-9868-6431">Meng Zhang</author>
<author orcid="0000-0002-9072-9203">Kun Duan</author>
<author orcid="0000-0003-4288-1865">Xiang Zheng</author>
<author orcid="0000-0003-4899-1651">Yuwei Zhai</author>
<author orcid="0000-0001-9038-8309">Shiwei Feng 0001</author>
<author orcid="0000-0001-5001-4329">Yamin Zhang</author>
<title>Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection.</title>
<pages>1-9</pages>
<year>2023</year>
<volume>72</volume>
<journal>IEEE Trans. Instrum. Meas.</journal>
<ee>https://doi.org/10.1109/TIM.2023.3239625</ee>
<url>db/journals/tim/tim72.html#MengZDZZFZ23</url>
</article></dblp>
