"Robust Estimators and Test Statistics for One-Shot Device Testing Under ..."

Narayanaswamy Balakrishnan et al. (2019)

> Home

Details and statistics

DOI: 10.1109/TIT.2019.2903244

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tit/BalakrishnanCMP19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tit/BalakrishnanCMP19
Narayanaswamy Balakrishnan, Elena Castilla, Nirian Martín, Leandro Pardo:
Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution. IEEE Trans. Inf. Theory 65(5): 3080-3096 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.