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ORCIDHayoung Lee
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2020 – today
- 2026
[j34]Sooryeong Lee
, Juyong Lee, Hayoung Lee, Sungho Kang:
VASE: Vector Memory Using Bit-Level Address Segmentation for High-Speed Memory Testing. IEEE Trans. Circuits Syst. I Regul. Pap. 73(1): 334-346 (2026)- [j33]Yunje Hwang, Younghun Kang, Hayoung Lee:
DPR-PIM: Diagnosis and Pipelined Repair Architecture for Processing-in-Memory. IEEE Trans. Very Large Scale Integr. Syst. 34(5): 1567-1580 (2026) - 2025
- [j32]Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang:
RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution. IEEE Access 13: 2089-2100 (2025) - [j31]Hayoung Lee, Soyeop Yoo, Woong-Kee Loh, Ok-Ran Jeong:
Target-guided dialog generation with dynamic knowledge path by commonsense knowledge graph and relation prediction. Knowl. Based Syst. 329: 114390 (2025) - [j30]Sooryeong Lee, Hayoung Lee, Juyong Lee, Sungho Kang:
A New Pipelined Output Data Reducer of BOST for Improved Parallelism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(2): 765-776 (2025) - [j29]Hayoung Lee, Juyong Lee, Sungho Kang:
A Robust Test Architecture for Low-Power AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(4): 1581-1594 (2025) - [j28]Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, Sungho Kang:
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(5): 2014-2025 (2025) - [j27]Seung Ho Shin, Minho Cheong, Hayoung Lee, Byungsoo Kim, Sungho Kang:
A Novel CNN-Based Redundancy Analysis Using Parallel Solution Decision. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(7): 2789-2802 (2025) - [j26]Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Sungho Kang:
Multistage Enhanced Diagnosis With Fault Candidate Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(9): 3648-3652 (2025) - [j25]Seung Ho Shin, Hayoung Lee, Sungho Kang:
Effective Parallel Redundancy Analysis Using GPU for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 33(2): 462-474 (2025) - [j24]Juyong Lee, Hayoung Lee, Sooryeong Lee, Sungho Kang:
A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing. IEEE Trans. Very Large Scale Integr. Syst. 33(3): 867-871 (2025) - [j23]Hayoung Lee, Juyong Lee, Sungho Kang:
An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-in-Memory. IEEE Trans. Very Large Scale Integr. Syst. 33(5): 1452-1456 (2025) - [c20]Dohun Kim, Minho Bae, Hayoung Lee, Seonghee Lee:
Deep Learning-Based Damage Detection for an Intelligent Monitoring System for Cultural Heritage. AVSS 2025: 1-6 - [i3]Sujeong Lee, Hayoung Lee, Seongsoo Heo, Wonik Choi:
HuDEx: Integrating Hallucination Detection and Explainability for Enhancing the Reliability of LLM responses. CoRR abs/2502.08109 (2025) - [i2]Sujeong Lee, Hayoung Lee, Seongsoo Heo, Wonik Choi:
Integrated Framework for LLM Evaluation with Answer Generation. CoRR abs/2509.20097 (2025) - 2024
- [j22]Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Doohyun Yoon, Sungho Kang:
An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data. IEEE Access 12: 146463-146475 (2024) - [j21]Chaelim Park, Hayoung Lee, OkRan Jeong:
Leveraging Medical Knowledge Graphs and Large Language Models for Enhanced Mental Disorder Information Extraction. Future Internet 16(8): 260 (2024) - [j20]Hayoung Lee, Sooryeong Lee, Sungho Kang:
A New Fail Address Memory Architecture for Cost-Effective ATE. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(4): 1260-1273 (2024) - [j19]Seung Ho Shin, Hayoung Lee, Sungho Kang:
GRAP: Efficient GPU-Based Redundancy Analysis Using Parallel Evaluation for Cross Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(8): 2518-2531 (2024) - [j18]Juyong Lee, Hayoung Lee, Sooryeong Lee, Sungho Kang:
A New ISA for High-Speed and Area-Efficient ALPG. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3358-3362 (2024) - [j17]Hayoung Lee, Sooryeong Lee, Sungho Kang:
RA-Aware Fail Data Collection Architecture for Cost Reduction. IEEE Trans. Very Large Scale Integr. Syst. 32(6): 1136-1149 (2024) - [j16]Hayoung Lee, Jongho Park, Sungho Kang:
An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator. IEEE Trans. Very Large Scale Integr. Syst. 32(10): 1950-1954 (2024) - [c19]Juyong Lee, Sooryeong Lee, Hayoung Lee, Sungho Kang:
Scan Architecture with Data Observation for Multiple Scan Cell Fault Diagnosis. ISOCC 2024: 392-393 - [c18]Sooryeong Lee, Hayoung Lee, Juyong Lee, Sungho Kang:
APAPG: Address Pre-Processed ALPG for High-Speed Linear Test. ISOCC 2024: 396-397 - 2023
- [j15]Hayoung Lee, Ok-Ran Jeong:
Sentiment analysis and counselling for COVID-19 pandemic based on social media. Int. J. Web Grid Serv. 19(1): 34-57 (2023) - [j14]Hayoung Lee, Okran Jeong:
A Knowledge-Grounded Task-Oriented Dialogue System with Hierarchical Structure for Enhancing Knowledge Selection. Sensors 23(2): 685 (2023) - [j13]Hayoung Lee, Seung Ho Shin, Younwoo Yoo, Sungho Kang:
TRUST: Through-Silicon via Repair Using Switch Matrix Topology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2377-2390 (2023) - [j12]Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang:
STRAIT: Self-Test and Self-Recovery for AI Accelerator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3092-3104 (2023) - [c17]Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang:
GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair. ISOCC 2023: 1-2 - [c16]Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
Redundancy Analysis Simplification Scheme for High-Speed Memory Repair. ISOCC 2023: 339-340 - [i1]Heungseok Park, Aeree Cho, Hyojun Jeon, Hayoung Lee, Youngil Yang, Sungjae Lee, Heungsub Lee, Jaegul Choo:
HPCClusterScape: Increasing Transparency and Efficiency of Shared High-Performance Computing Clusters for Large-scale AI Models. CoRR abs/2310.02120 (2023) - 2022
- [j11]Hogyeong Kim, Hayoung Lee, Donghyun Han, Sungho Kang:
Multibank Optimized Redundancy Analysis Using Efficient Fault Collection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(8): 2739-2752 (2022) - [j10]Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. Very Large Scale Integr. Syst. 30(6): 781-793 (2022) - [c15]Seung Ho Shin, Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Sungho Kang:
An Improved Early Termination Methodology Using Convolutional Neural Network. ISOCC 2022: 21-22 - [c14]Sooryeong Lee, Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
PROG: Per-Row Output Generator for BOST. ISOCC 2022: 23-24 - [c13]Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
FAME: Fault Address Memory Structure for Repair Time Reduction. ISOCC 2022: 31-32 - [c12]Jihye Kim, Hayoung Lee, Jongho Park, Sungho Kang:
ZOS: Zero Overhead Scan for Systolic Array-based AI accelerator. ISOCC 2022: 360-361 - 2021
- [j9]Hayoung Lee, Hyunggoy Oh, Sungho Kang:
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9: 56443-56456 (2021) - [j8]Donghyun Han, Hayoung Lee, Sungho Kang:
Effective Spare Line Allocation Built-in Redundancy Analysis With Base Common Spare for Yield Improvement of 3D Memory. IEEE Access 9: 76716-76729 (2021) - [j7]Donghyun Han, Hayoung Lee, Seungtaek Lee, Sungho Kang:
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory. IEEE Access 9: 133274-133288 (2021) - [c11]Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang:
Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory. ISOCC 2021: 427-428 - [c10]Seung Ho Shin, Hayoung Lee, Younwoo Yoo, Sungho Kang:
An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA. ISOCC 2021: 429-430 - 2020
- [j6]Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang:
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020) - [j5]Tae Hyun Kim, Hayoung Lee, Sungho Kang:
GPU-Based Redundancy Analysis Using Concurrent Evaluation. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 805-817 (2020) - [c9]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. ISOCC 2020: 51-52 - [c8]Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang:
Memory-like Defect Diagnosis for CMOL FPGAs. ISOCC 2020: 139-140 - [c7]Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong:
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9 - [c6]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. ITC-Asia 2020: 94-99
2010 – 2019
- 2019
- [j4]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019) - [c5]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares. ISOCC 2019: 235-236 - 2018
- [j3]Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang:
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018) - [j2]Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang:
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67(1): 264-273 (2018) - [j1]Donghyun Kim, Hayoung Lee, Sungho Kang:
An Area-Efficient BIRA With 1-D Spare Segments. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 206-210 (2018) - [c4]Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, Sungho Kang:
3D Memory Formed of Unrepairable Memory Dice and Spare Layer. TENCON 2018: 1362-1366 - 2017
- [c3]Donghyun Han, Hayoung Lee, Donghyun Kim, Sungho Kang:
A new repair scheme for TSV-based 3D memory using base die repair cells. ISOCC 2017: 11-12 - 2016
- [c2]Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang:
Discussion of cost-effective redundancy architectures. ISOCC 2016: 97-98 - 2013
- [c1]Hayoung Lee, Taeho Kang, Sangho Lee, Jong Kim, Yoonho Kim:
Punobot: Mobile Botnet Using Push Notification Service in Android. WISA 2013: 124-137
Coauthor Index
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last updated on 2026-06-20 01:32 CEST by the dblp team
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