Detection of Blacktopped Counterfeit ICs Using Surface Texture Analysis.

Wed, 01 Jan 2025 00:00:00 +0100

John M. Klamut, Mai Abdelhakim, Samuel J. Dickerson, Ashish Avachat, Heng Ban, Philip Santillo:
Detection of Blacktopped Counterfeit ICs Using Surface Texture Analysis. TPS-ISA 2025: 392-398