Hema Lata Rao Maddi
Shengnan Zhu
Limeng Shi
Michael Jin
Jiashu Qian
Monikuntala Bhattacharya
Hema Lata Rao Maddi
Marvin H. White
Anant K. Agarwal
Tianshi Liu
Atsushi Shimbori
Chingchi Chen
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs.
1-5
2023
IRPS
https://doi.org/10.1109/IRPS48203.2023.10117998
conf/irps/2023
db/conf/irps/irps2023.html#ZhuSJQBMWALSC23
Anant K. Agarwal
Monikuntala Bhattacharya
Chingchi Chen
Michael Jin
Tianshi Liu
Jiashu Qian
Limeng Shi
Atsushi Shimbori
Marvin H. White
Shengnan Zhu