Qingshan Xia
Fuqin Deng
Qiqing Dong
Junhan Pu
Lanhui Fu
Qingshan Xia
Zhi Xu
Nannan Li
Min Zhao
SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images.
1-6
2025
INDIN
https://doi.org/10.1109/INDIN64977.2025.11279544
conf/indin/2025
db/conf/indin/indin2025.html#DengDPFXXLZ25
streams/conf/indin
Fuqin Deng
ZhengHong He
Lanhui Fu
Qingshan Xia
Zhi Xu
Nannan Li
ZhenBo Ren
Ping Su
Multi Focus Image Fusion Network Based On Focus Attention And Dual Feature Adaptation.
1-6
2025
INDIN
https://doi.org/10.1109/INDIN64977.2025.11279198
conf/indin/2025
db/conf/indin/indin2025.html#DengHFXXLRS25
streams/conf/indin
Fuqin Deng
Qingshan Xia
Lanhui Fu
Yingzhu Wu
Nannan Li 0001
Ningbo Yi
Guangming You
Zhi Xu
Fabric-DETR: An Efficient Transformer Network for Multi-Scale Fabric Defect Detection in Complex Environments.
1-6
2025
INDIN
https://doi.org/10.1109/INDIN64977.2025.11279566
conf/indin/2025
db/conf/indin/indin2025.html#DengXFWLYYX25
streams/conf/indin
Fuqin Deng
Zhi Xu
Lanhui Fu
Min Zhao
Nannan Li
Song Lu
Hufei Zhu
Qingshan Xia
Segment Anything in Industrial defect detection.
1-6
2025
INDIN
https://doi.org/10.1109/INDIN64977.2025.11279671
conf/indin/2025
db/conf/indin/indin2025.html#DengXFZLLZX25
streams/conf/indin
Fuqin Deng
Qiqing Dong
Lanhui Fu
ZhengHong He
Nannan Li
Nannan Li 0001
Song Lu
Junhan Pu
ZhenBo Ren
Ping Su
Yingzhu Wu
Zhi Xu
Ningbo Yi
Guangming You
Min Zhao
Hufei Zhu