F. B. Zhou
Jia Zhang
Le Yu
Haigang Yang
Y. L. Xie
F. B. Zhou
Wei Wang 0003
Self-test method and recovery mechanism for high frequency TSV array.
260-265
2011
VLSI-SoC
https://doi.org/10.1109/VLSISoC.2011.6081648
conf/vlsi/2011soc
db/conf/vlsi/vlsisoc2011.html#ZhangYYXZW11
Wei Wang 0003
Y. L. Xie
Haigang Yang
Le Yu
Jia Zhang