<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/emccompo/AzumaSMNKTMHNTI13" mdate="2023-09-30">
<author>Naoya Azuma</author>
<author>Shunsuke Shimazaki</author>
<author>Noriyuki Miura</author>
<author orcid="0000-0002-0625-9107">Makoto Nagata</author>
<author>Tomomitsu Kitamura</author>
<author>Satoru Takahashi</author>
<author>Motoki Murakami</author>
<author>Kazuaki Hori</author>
<author>Atsushi Nakamura</author>
<author>Kenta Tsukamoto</author>
<author>Mizuki Iwanami</author>
<author>Eiji Hankui</author>
<author orcid="0000-0003-0567-4752">Sho Muroga</author>
<author orcid="0000-0002-7813-7977">Yasushi Endo</author>
<author>Satoshi Tanaka</author>
<author>Masahiro Yamaguchi</author>
<title>Measurements and simulation of substrate noise coupling in RF ICs with CMOS digital noise emulator.</title>
<pages>42-46</pages>
<year>2013</year>
<booktitle>EMC Compo</booktitle>
<ee>https://doi.org/10.1109/EMCCompo.2013.6735170</ee>
<crossref>conf/emccompo/2013</crossref>
<url>db/conf/emccompo/emccompo2013.html#AzumaSMNKTMHNTI13</url>
</inproceedings></dblp>
