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"From statistical model checking to statistical model inference: ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yan Zhang et al. (2013)

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DOI: 10.1109/ICCAD.2013.6691186

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-06

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  dblp key:
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  - https://dblp.org/rec/conf/iccad/ZhangSSCA13
Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi, Xin Chen, Erika Ábrahám:
From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits. ICCAD 2013: 662-669

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