L. Panarella Ben Kaczer Quentin Smets Devin Verreck Tom Schram Daire Cott Dennis Lin Stanislav Tyaginov Inge Asselberghs Cesar J. Lockhart de la Rosa Gouri Sankar Kar Valeri Afanas'ev Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs. 1-6 2023 IRPS https://doi.org/10.1109/IRPS48203.2023.10117803 conf/irps/2023 db/conf/irps/irps2023.html#PanarellaKSVSCLTARKA23