"Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer."

Foster F. Dai et al. (2004)

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DOI: 10.1109/TEST.2004.1386961

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Foster F. Dai, Charles E. Stroud, Dayu Yang, Shuying Qi:
Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer. ITC 2004: 271-280

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