Song Bian 0001 Shumpei Morita Michihiro Shintani Hiromitsu Awano Masayuki Hiromoto Takashi Sato 0001 Identification and Application of Invariant Critical Paths under NBTI Degradation. 2797-2806 2017 100-A IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 12 https://doi.org/10.1587/transfun.E100.A.2797 http://search.ieice.org/bin/summary.php?id=e100-a_12_2797 db/journals/ieicet/ieicet100a.html#BianMSAHS17