Misoo Kim Youngkyoung Kim Eunseok Lee 0001 Production and test bug report classification based on transfer learning. 107685 2025 181 Inf. Softw. Technol. https://doi.org/10.1016/j.infsof.2025.107685 db/journals/infsof/infsof181.html#KimKL25 streams/journals/infsof