A New Spectrum-based Fault Localization With the Technique of Test Case Optimization.

Jeongho Kim 0005 Jonghee Park Eunseok Lee 0001 A New Spectrum-based Fault Localization With the Technique of Test Case Optimization. 177-196 2016 32 J. Inf. Sci. Eng. 1 http://www.iis.sinica.edu.tw/page/jise/2016/201601_10.html db/journals/jise/jise32.html#KimPL16