<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/mr/IraceMMRBBCNBPS16" mdate="2022-03-23">
<author orcid="0000-0003-1400-8380">Andrea Irace</author>
<author>Luca Maresca</author>
<author>Paolo Mirone</author>
<author>Michele Riccio</author>
<author orcid="0000-0002-9350-5483">Giovanni Breglio</author>
<author>Laura Bellemo</author>
<author>Rossano Carta</author>
<author>Marco Naretto</author>
<author>Nabil El Baradai</author>
<author>Isabella Para</author>
<author>Natale Di Santo</author>
<title>200 V Fast Recovery Epitaxial Diode with superior ESD capability.</title>
<pages>440-446</pages>
<year>2016</year>
<volume>64</volume>
<journal>Microelectron. Reliab.</journal>
<ee>https://doi.org/10.1016/j.microrel.2016.07.022</ee>
<url>db/journals/mr/mr64.html#IraceMMRBBCNBPS16</url>
</article>
</dblp>
