<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/mr/StojadinovicDMPDDGP10" mdate="2024-02-05">
<author>Ninoslav Stojadinovic</author>
<author orcid="0000-0002-0214-2606">Danijel Dankovic</author>
<author>Ivica Manic</author>
<author orcid="0000-0001-9094-7967">Aneta Prijic</author>
<author orcid="0000-0003-3889-9595">Vojkan Davidovic</author>
<author orcid="0000-0003-0475-040X">Snezana Djoric-Veljkovic</author>
<author>Snezana Golubovic</author>
<author>Zoran Prijic</author>
<title>Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.</title>
<pages>1278-1282</pages>
<year>2010</year>
<volume>50</volume>
<journal>Microelectron. Reliab.</journal>
<number>9-11</number>
<ee>https://doi.org/10.1016/j.microrel.2010.07.122</ee>
<url>db/journals/mr/mr50.html#StojadinovicDMPDDGP10</url>
</article></dblp>
