Advanced Techniques

of Ultrasonic Examination

Ultrasonic Examination
Level 3 (EN 473)
Advanced Techniques
of Ultrasonic Examination

„ Automated Ultrasonic Examination

„ Computer Aided Processing of Ultrasonic Data
„ ALOK

„ SAFT

„ TOFD

„ Phased Array
„ Electromagnetic Acoustic Transducer (EMAT)
 Advanced Techniques
of Ultrasonic Examination

Automated Ultrasonic
Examination
Automated Ultrasonic Examination

„ Recording of data
„ Ultrasonic system
„ Position data by mechanical devices
• Scanning a cluster of probes along the surface
of the test object
or
• Fixed cluster of probes and moving of the test
object
„ Presentation of data
„ Correlation of the probe‘s position to the
ultrasonic data
Assembling of the
Examination Equipment

Probe 1
Triggering Control of Manipulator
Recording of Position Data

Probe n

Evaluation Presentation Processing Recording Ultrasonic

of Data of Data of Data of Data Electronic

Data
Storage
 Stationary Equipment
„ Characteristics
„ stationary installed
„ examination of a specific assembly in production lines
„ high automation level
„ automated evaluation
„ high examination speed
„ Example
„ continuos in-production examination of steel products (plates,
bars, rails, tubes)
„ Machine for examination of objects like axel leg, rolls, screws,
balls, stud, cylinders
„ In-production examination of assemblies for mechanical
engineering (shaft, wheel disk)
„ Manufacturing inspection of objects for aerospace (composite
material, glas fiber reinforced plasticsre, carbon fiber reinforced
plastics)
„ In-process controlling (random test)
 Mobile Equipment
„ Characteristics
„ not tied to a certain place

„ mostly applicable for variable examinations

• configure by adapting or exchange of assemblies
„ Example
„ Basic inspection and in-service inspection of components
• power plants
• chemical plants
• pipelines
„ Basic inspection and in-service inspection of means of
transportation
• air
• rail
 ALOK

Response Locus of
Amplitude and Travel
Time
ALOK
Response Locus of Amplitude and Travel Time

„ Signal processing which allows the detection of all echo

maxima appearing in the HF signal without limitated by
using a travel time monitor
„ Resolution of reflectors being one near to the other
„ Recording of every maxima detected within the A-scan by
„ amplitude
and
„ travel time
„ Correlation of the reflector‘s position to its maximum
 Principle
HF Presentation

amplitude
travel time response locus
travel time

amplitude
response locus
 Processing of Signals
rectified A-scan (half-wave presentation)
dejamed and non-densified data
amplitude

A3 A4
A1 A5
A2

trevel time

AM
filter function
-6dB AM-2 < AM
rise time [half-wave]: i = 2 AM-1 ≤ AM
AM/2
decay time [half-wave]: k=3 AM+1 ≤ AM
AM+2 ≤ AM
AM+3 ≤ AM

rectified A-scan (half-wave presentation)

dejamed and pre-densified data
amplitude

A3 A4
A1 A5
A2

travel time
Signal Processing

„ Storage of raw data

„ recorded and pre-densified data were stored as couple
maximum amplitude – travel time
„ recording of position data via movement of manipulator
axis and position of the probes in the cluster
„ Multi-channel system requires complete signal
processing and storage of the raw data for each
channel
„ simultanously application of many probes and beam
angles
„ increase of examination speed und detectivity
„ Detection of all relevant echo signals of the
A-scan in spite of dat reduction
Resolution

„ Signal identification by means of i,k-filter

„ Signal identification parameter k defines the resolution of
neighbouring echo signals in the A-scan
„ When detecting an echo signal the next can be identified
after a distance of k+1 half-waves

λ
R = (k + 1) ⋅
2
„ Resolution depends on
„ decay of the signals (characteristic of the probe)
„ wave length
Interfering Amplitudes
stochastic
noise

interfering
„ interfering signal signal
„ stochastic noise
„ rough interface
„ echos due to geometrical shape
 Signal Pattern Identification

response locus „ interfering signals and stochastic

amplitude

of amplitudes noise
„ no dynamic in travel time
„ isolated points in response locus of
travel time
„ echos from interfaces and
geometric shape
„ dynamic in travel time, but the rise
time is not characteristic for the
technique
„ reduction of data
travel time

response locus „ prerequisite for reconstruction of

of travel time the reflector
„ up to 90%
Presentation of the Data

„ Calculation of elements of the image for each

data set (position of the element)
„ travel time
„ beam angle
„ sound velocity
„ Presentation of amplitude height
„ coloured presentation according to their echo height for
each element
Presentation of the Data

C-Scan y

x
lack of fusion

pore

x y

B-Scan D-Scan
z
 Presentation as Response Locus

„ Response locus of travel „ Response locus of amplitudes

time „ amplitude vis probe position
„ travel time vis probe of one scan path
position of one scan path
travel time

amplitude

probe position x probe position x

 Triangulation

¾ complete description of the reflector

by surrounded sampling
z Examination with different beam
angles
z Scanning from opposite directions
z direct scanning and scanning after
skip distance

„ interface of the defect to

analyze is positioned on the
arc originated by different
probe positions
Abstract

„ Detection independent on travel time monitor

„ Digitalizing of the HF-signal
„ Signal identification by i,k-filters
„ Data reduction by identification of dynamic pattern
(characteristic incline of the response locus of the travel
time)
„ non-sensitive for noise and default signals
„ applicable for multi-channel examination
„ high examination speed
Computer Aided Processing of
Ultrasonic Data

Synthetic Aperture Focusing

Technique

SAFT
Basics

„ Imagining Technique
„ Analyzing technique of material defects
detected by searching technique
„ Determination of type, location, and dimensions of
defects is prerequisite for evaluating construction saftys
„ Developing of SAFT
„ based on RADAR technique (70th)
„ developed continuously to 3D-SAFT Algorithm
Resolution of Ultrasonic Examination

„ Good resolution when detailed description

of materail defects required
„ Axiale resolution determined by length of the
pulse
• use of high dampend probes
„ Lateral resolution determined by width of the
sound beam at the location of the defect
which has to be analyzed
• use of focussed sound beam
Focussing of Sound Beam

„ Optimized near field length by standardized

probes
„ Focussing probes with lenses of perspex
„ Phased array probes with electronically
controlled focus distance
„ Synthetic aperture
Standard Probes
D

„ Optimized field of
application in a distance
to the defect according
to the near field length

near field length

Focussed Probes
D

„ Point- or linear focussed

„ Focussing length possible
only in the range of near
field length of the
appropriated probe with
same diameter and
frequency
„ Probes for long distances
focus
have a large diameter
„ Range of long distances
need more than one probe
near field length
 Phased Array
D
„ Electronic controlled focus
distance
„ Focussing length possible only
in the range of near field
length of the appropriated
probe with same diameter
„ probes for long distances have
a large diameter
sequential „ Coupling specially on curved
focussing
surfaces difficult or impossible
in all depth
location „ Range of long depth needs
only one probe

near fiel length

Synthetic Aperture „ Simulation of a large probe by
moving a probe with a very
D‘ small diameter D along the
D distance D‘ (aperture)
„ Near field length is given by
aperture and frequency
„ Ultrasonic signals detected along
the distance D‘ are recorded,
stored, processed in the
computer, and calculated to the
respective volume
simultanious „ By re-construction algorithm a
focussing focussing can be realized
in all depth simultanous for all positions
positions between coupling surface and
near field length
„ Du to the use of small probes
coupling problems can be
near field length
avoided
Recording and Processing of Data
„ Recording and storage of the digitalized HF signal
„ digitalizing frequency about five times probe frequency
„ probe will be moved along of one ore more of one path
along the surface
„ digitalizing and storage of the HF signal along the
scanning path
„ Distance of two pulses ∆x aquivalent to half of
the wave length projected to the scanning
surface
λ ⋅ sin α
∆x <
2
„ 4 MHz, transverse wave probe, 45° beam angle
⇒ ∆x = 0.28 mm
 Beam Spread
(x, y) scanning line x

1
2
3 „ Beam spread as
beam spread great as possible
„ Ultrasonic signals of
several defects in
2 3 the beam are
1
simultanously
detected
„ defect are located
on the arc, the
angle is unknown

travel time t = tmax

t = t0
 Reconstruction of the Reflector‘s Location

„ deviation of the image plane into small pixel for reconstruction

„ constant distance in scan direction (x-direction)
„ constant distance in direction perpendicular to the scan direction
(z-direction)
„ all pixel were seized with zero before starting reconstruction

Pixel (1,n)
Pixel (1,1)

Pixel (2,1) Pixel (2,n)

Pixel (n,n)

Pixel (n,1)
Reconstruction of the reflector‘s location

„ Movement of the probe is simulated in the computer

„ seizure of image elements with signal amplitude laying
within the beam spread

(x, y)
 Averageing of the Amplitude Signal
„ Production of a B-scan by summarizing the amplitudes of different
probe locations
„ constructive interference of material areas with high amplitude
„ destructive interference of material areas with statistic noise signals
„ Simulation of a focus probe with unique focussing power along the
complete depth range
„ Increasing the signal-to-noise ratio by increas of examination density

Pixel (l,m)
Resolution and Accuracy of the Reconstruction

„ Axial resolution is given by the length of the

pulse
„ Lateral resolution is equal to half the probe‘s
diameter, when the aperture is long enough to
detect all signals which may be transmitted by
the reflector
„ Accuracy of the reflector‘s reconstruction
depends on
„ accuracy of sound velocity in the test object
„ accuracy of probe‘s delay distance
„ signal-to-noise ratio of the recorded ultrasound signals
„ recision of the manipulator
„ coupling fluctuation
„ knowledge of the test object‘s geometrie
„ homogeneity of the material
Aims of SAFT-Reconstruction

Determination of the defect‘s characteristics

„ location in depth
„ elongation in depth
„ type of defect
„ classification as planar or non-planar
as basis for fracture mechanic assessment
calculation
Interpretation of SAFT-Reconstruction

„ Restriction of interpretation due to effects of

wave dispersion and wave mode conversion
„ on interfaces
„ on the defect

L-wave
T-wave
T-wave

L-wave
L-wave

TL-LT
TLL
Geometry of the Object

„ Knowledge is important for interpretation of

indications
„ Appliance of additionally probes
„ e.g. image of the back wall
„ Mechanic and optic methods
„ scanning the outline of the surface
„ Detection of interfaces
„ e.g. transition between base matal and weld metal to
characterize lack of side wall fusion
Computer Aided Processing of
Ultrasonic Data

Time of Flight Defraction

Technique

TOFD
Basics
4 – 1: incidence wave
– 2: reflected wave
– 3: penetrated wave
– 4: defracted wave
1

2
4
Performance of Examination
„ Use of two probes scanning oposite to another
„ transmitter
„ receiver
„ located symmetrically to
the center of the weld
„ couple of probes
are moved
parallel to
the weld
seam on
one path
(non
parallel
examination)
Performance of Examination
transmitter Receiver

upper tip of
crack reflection
back wall

lower tip of
surface crack
wave
Performance of examination
„ Generally use of longitudinal waves
„ using transverse waves generates mode conversion that may
complicate the interpretation of the signals
„ Storage of HF signal every 1 mm on the scanning path
„ Digitalizing frequency equal to to higher than four times
nominal frequency of the probes
„ Range between
„ Signal of surface wave and
„ backwall signal
„ Large beam spreed
„ large examination volume
„ one couple of probes sufficient for wall thickness up to 70 mm
Performance of Examination
„ Maximum defraction when acoustic axis are orientated
120° one to another
„ setting the probe distance according to the expected depth of
the defects
„ Adapting to different geometries by
„ probe distance
„ probe frequency
„ size of transducers
„ Signal of defraction is low
„ about 20 dB to 30 dB below the level of the reflected signal
using puls-echo technique
„ considerable influence on the condition of the scanning
surface
„ no evaluation of signal height
 upper crack tip

reflection of backwall

lower crack tip

surface wave

movement
of probes

travel time Evaluation

Evaluation

„ Examination with high sensitivity

„ no regording level because of size of defraction signal
does not correspond with size of defect
„ recording of signals from small material irregularities
„ recording of the weld geometry
„ High number of indications requires high effort
for interpretation
„ much experience of the personnel required
 Interpretation
1
2
3 „ Phase of the defracted
4 signal
1. surface wave
2. upper tip (or defect with
4 not measurable depth)
2
• same phase than
1 3 signal from back wall
3. lower tip of defect
• same phase than
surface wave
4. signal of backwall
 Interpretation

„ Defects touching the

3
4 examination surface

3. lower tip of the defect

4 4. signal from back wall

3 • also changing of the

surface signal to a
grater travel time
Interpretation
„ Location in depth
„ Calculation by difference from travel time of the surface
wave to defracted signal
„ Extension in depth
„ Calculation by the distance to the surface
„ calculation as difference between first and second
signal of defraction
„ Additional examination with other beam angles ,
frequencies or probe distances
„ Parallel examination
„ examination path parallel to scanning direction of the
probes
„ moving the probes perpendicular to the weld direction
Accuracy of Determination of Depth and Location

„ depends on

„ accuracy of travel time measurement

„ inaccurateness of sound velocity

„ inaccurateness of probe distance

„ deviation of the defect from the center line of the weld

• during non parallel examination will be assumed that the

defect is located in the center between the two probes
Limits of the Technique

„ Dead zone due to the surface wave (except

defects touching the surface)
„ Dead zone due to the back wall signal when
defects touching the surface opposite the
scanning surface
„ Very small irregularities (pores, inclusions) were
indicated as cracks
„ Signals of severe cracks may be classified as
defects without extension
„ weld must be accessible from both sides