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XRD Techniques for Material Analysis

This document provides an overview of powder X-ray diffraction (XRD) technology. It discusses several XRD instruments for routine labs, advanced research, and process control. Applications include pharmaceuticals, geology, materials science, and more. Basic theory of XRD is explained involving Bragg's law and diffraction angles. Common geometries like Bragg-Brentano and position sensitive detectors are described. XRD allows for phase identification, quantification, and structural analysis by comparing diffraction patterns to databases.

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0% found this document useful (0 votes)
488 views1 page

XRD Techniques for Material Analysis

This document provides an overview of powder X-ray diffraction (XRD) technology. It discusses several XRD instruments for routine labs, advanced research, and process control. Applications include pharmaceuticals, geology, materials science, and more. Basic theory of XRD is explained involving Bragg's law and diffraction angles. Common geometries like Bragg-Brentano and position sensitive detectors are described. XRD allows for phase identification, quantification, and structural analysis by comparing diffraction patterns to databases.

Uploaded by

chandini
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

ARL EQUINOX 100/1000 bench-top XRD for


routine and research labs
Quick guide
• ARL EQUINOX 3000/5000 standalone XRD

Powder X-ray Diffraction (XRD) for advanced research

• ARL 9900 XRF-XRD integrated spectrometers


In brief for process control
• Analysis of structures, phases and compounds in polycrystalline materials
• Qualitative and quantitative phase analysis
• Polymorphic identification and quantification
• Amorphous versus crystalline phases
• Crystallite size, preferred orientations, texture and stress analysis of solid materials
• Phase transitions and structural investigations at low and high temperatures, non-ambient atmosphere, on thin films and small samples

Applications Basic theory


Stand-alone XRD instruments are widely In X-ray diffraction (XRD) the intensity
used in both research and industry dealing of X-rays diffracted by the sample are
with structural characterization of materials: measured according to the diffraction
angle (Bragg’s law: λ = 2d sinθ, with
• Pharmaceuticals
λ: wavelength, d: d spacing, θ: diffraction
• Geology and minerals angle). Many different diffraction Bragg-Brentano for the ARL 9900 XRF-XRD spectrometer
• Materials science research geometries in transmission and reflection
• Cement, ceramics, metals and other exist for powder samples, and the Theta-
applied materials Theta Bragg-Brentano is the most common

• Nanomaterials, thin films, one. In contrast to this Bragg-Brentano


semiconductors geometry it is possible to obtain a real-time
full pattern without moving parts by using
• Polymers, catalysts, chemicals and
a Thermo Scientific PSD (Position Sensitive
energy materials
Detector). Schematics of both these
Integrated XRF-XRD instruments are geometries are shown here. An XRD pattern
Position Sensitive Detectors for simultaneous real-time XRD
preferred for routine process and enables one to do several kinds of analyses ARL EQUINOX Series.
quality control in cement, metals and like finger-printing of the phase content by
mining industries. comparing the reflection positions and their relative intensities with the ones from
databases. This technique is commonly used for phase control in all kinds of industrial
processes. It is possible to obtain phase quantification and structural information of the
phases by applying sophisticated Rietveld methods in both industrial and university
research applications.

Technology
Powder XRD is one of the most established techniques for identifying and characterizing
polycrystalline materials with respect to their crystallography, polymorphic structures,
phases and crystallinity changes.

Various attachments are used in conjunction with powder diffractometer for measuring
the sample at different temperatures, in different environments and in different forms to
study high or low temperature phase transitions, texture, stress and other characteristic
properties preferably in real time and in-situ using area or fast detectors.

Find out more at [Link]/materialsscience

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