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Non-Ideal Behavior of Passive Components

The document discusses measuring the non-ideal behavior of lumped elements such as resistors, inductors, and capacitors using a network analyzer. It describes the experimental setup using an Agilent Technologies E5071C network analyzer along with calibration standards and SMA connectors. Procedures for one-port and two-port calibration of the network analyzer are provided. Non-ideal characteristics of each component including parasitic resistances and reactances are analyzed.

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0% found this document useful (0 votes)
438 views9 pages

Non-Ideal Behavior of Passive Components

The document discusses measuring the non-ideal behavior of lumped elements such as resistors, inductors, and capacitors using a network analyzer. It describes the experimental setup using an Agilent Technologies E5071C network analyzer along with calibration standards and SMA connectors. Procedures for one-port and two-port calibration of the network analyzer are provided. Non-ideal characteristics of each component including parasitic resistances and reactances are analyzed.

Uploaded by

Tushar Dave
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

EMI/EMC & ANTENNA LAB

“NON IDEAL BEHAVIOUR OF


LUMPED ELEMENTS”

RF & Microwave Engineering


Department of Electronics & Electrical Communication Engineering
INDIAN INSTITUTE OF TECHNOLOGY KHARAGPUR 721302
TO STUDY THE NON IDEAL CHARACTERTICS OF LUMPED ELEMENTS USING NETWORK
ANALYZER

INTRODUCTION: Frequency-dependent behavior of passive components is one of the key


concepts of RF, microwave, high-speed and all other types of high frequency design. In
actual resistors, capacitors and inductors, the physical length, width and height of the
device, the properties of the conductors and dielectric, plus the electrodes for attachment
to an external circuit are all part of the “component”. The first-order effects are the
additional resistance, capacitance and inductance the result from these real-world factors.
These first-order effects are usually the largest of all parasitic resistances and reactances,
although the mounting of devices on a printed circuit board can introduce significant
additional capacitance to the body of the component.

APPARATUS/COMPONENTS REQUIRED:
1. Network Analyzer – Agilent Technologies E5071C (100 KHz – 4.5 GHz):
A network analyzer is an instrument used to analyze the properties of an electrical
network, especially those associated with reflection and transmission of electrical
signal. In most laboratories, E5071C network analyzer is used and the available
network analyzer is used for 1- port or 2- port networks only.

Figure: 1
2. Open, short & Load (all are SMA type and are used for calibration).
3. Resistor, Inductor & Capacitor.
4. SMA type connector: SMA is an acronym for Sub-Miniature version A and was
developed in the 1960's. It uses a threaded interface. 50 Ω SMA connectors are
semi-precision, subminiature units that provide excellent electrical performance
from DC to 18 GHz. These high-performance connectors are compact in size and
mechanically have outstanding durability.
EXPERIMENTAL SETUP:

Figure: 2 Figure: 3
Calibration of any port Two port calibration requiring
thru connection

Figure: 4 Figure: 5
In case of one port component In case of two port component

THEORY: Resistor: In a resistor, the largest parasitic reactance is inductance. Inductive


reactance is near zero at low frequencies, increasing linearly with frequency. Thus, a resistor
will see an increasing inductive reactance that is in series with its resistance. Rather than
trying to compensate for this reactance, the best approach is to make resistors with very
low inductance, which is practical to do. The ideal frequency response of a resistor has a
magnitude equal to the value of the resistor and a phase angle of ∟0 for all frequencies as
shown in Fig.1 We denote this as
Z = R < 00

Figure: 6

Figure: 7

Actual resistors behave somewhat differently than this ideal at higher frequencies, with the
degree to which they differ depending on the construction technique used. For example,
since a wire-wound resistor is constructed of turns of wire, we would expect this resistor to
have a significant inductive behavior at higher frequencies. Carbon-composition resistors
would not be expected to exhibit this behavior to the same degree. A simple resistor has an
inductance associated with its length and capacitance created by the two “plates” that are
the end electrodes as shown in figure 2.

Both carbon-composition and wire-wound resistors exhibit other non-ideal effects. For
example, there is a certain “bridging capacitance” from end-to-end due to charge leakage
around the resistor body. Usually this is a minor effect. A more significant effect is
represented by the inductance and capacitance of the leads attached to the element.

Inductor: An inductor will include the effects of its interconnecting terminals, but it has
capacitance between those terminals, as well as capacitance between conductors of the
winding.

Figure: 8
The impedance of an ideal inductor is plotted against frequency in Fig. 3, and is given by
Z L = jωl = ωl ∟900
The magnitude increases linearly with frequency at a rate of +20 dB/decade and the angle is
+900 for all frequencies. There are numerous variations of the basic construction technique
of winding turns of wire on a cylindrical form. The specific construction technique will
determine the values of the parasitic elements in the model of the non ideal inductor that is
shown in Fig. 4. The process of winding turns of wire on a cylindrical form introduces
resistance of the wire as well as capacitance between neighboring turns. This produces the
parasitic elements R par and C par in the non ideal model. Some construction techniques wind
the turns of wire in layers to shorten the length of the inductor body. But this adds
capacitance between layers, which substantially increases C par . The non ideal inductor
should also include the inductance of the attachment leads L lead , as with all other elements.
At low frequencies the resistance dominates, and the impedance is R par . As frequency is
increased, the inductance of the model begins to dominate at a frequency of , and
the impedance increases at 20 dB/decade while the angle is +900. As frequency is further
increased, the impedance of the parasitic capacitance decreases until its magnitude equals
that of the inductor impedance. This occurs at the self-resonant frequency of the inductor,
The Bode plot of the model is also shown in Fig. 4
Figure: 9

CAPACITOR: At high frequencies, a capacitor has inductance associated with its length and
a resistance due to losses in the dielectric that separates the plates. The additional
capacitance due to the attachment electrodes is normally included in the nominal value.
The impedance of an ideal capacitor is plotted against frequency in Fig. 5, and is given by Z c
-1
= (jwc) . The magnitude of the impedance decreases linearly with frequency, or -20 dB/
Decade and the phase angle is constant at -900.

At dc the circuit appears as an open circuit (replace the inductor with a short circuit and the
capacitor with an open circuit). As frequency increases, the impedance of the capacitor
dominates and decreases linearly with frequency at a rate of -20 dB/decade. The impedance
of the inductor increases until it equals that of the capacitor at . At this
frequency the series combination appears as a short circuit (although the magnitudes of the
impedances are equal they are of opposite sign) and the net impedance of the branch is R s .
The frequency f0 is referred to as the self-resonant frequency of the capacitor.
For higher frequencies the magnitude of the impedance of the inductor dominates and the
impedance increases at a rate of +20 dB/decade, while the phase angle approaches +900.
The non – ideal behavior is shown in figure 6 and its characteristics .The Bode plots are
shown in Fig. 7.
Figure: 10

Figure: 11
PROCEDURE:
1-port calibration Procedure:

1) Press Channel Next/Channel Prev keys to select the channel for which you
want to perform the calibration.
2) Press Cal key.
3) Click Calibrate > 1-Port Cal > Select Port.
4) Select a test port (and corresponding S parameter) on which 1-port calibration
will be performed.
5) Connect an OPEN calibration standard to the selected test port (connector to
which the DUT is to be connected).
6) Lick Open to start the calibration measurement.
7) Connect a SHORT calibration standard to the selected test port (connector to
which the DUT is to be connected).
8) Click Short to start the calibration measurement.
9) Connect a LOAD calibration standard to the selected test port (connector to
which the DUT is to be connected).
10) Click Load to start the calibration measurement.
11) Click done to terminate the 1-port calibration process. Upon pressing this key,
12) Calibration coefficients will be calculated and saved. The error correction
function will also be automatically enabled.

2-Port Calibration procedure:

1) Press Channel Next/Channel Prev keys to select the channel for which you
want to perform the calibration.
2) Press Cal key.
3) Click Calibrate > 2-Port Cal.
4) Click Select Ports, then select the test ports on which you will perform full 2-
port calibration. (In the procedure below, the selected test ports are denoted
as x and y.)
5) Click Reflection.
6) Connect an OPEN calibration standard to test port x (the connector to which
the
7) DUT is to be connected).
8) Click Port x Open to start the calibration measurement (x denotes the test
port to which the standard is connected).
9) Disconnect the OPEN calibration standard and replace it with a SHORT
calibration standard.
10) Click Port x Short to start the calibration measurement (x denotes the test
port to which the standard is connected).
11) Disconnect the SHORT calibration standard and replace it with a LOAD
standard.
12) Click Port x Load to start the calibration measurement (x denotes the test
port to which the standard is connected).
13) Repeat the above procedure for port y.
14) Click Return.
15) Click Transmission.
16) Make a THRU connection between ports x and y (between the connectors to
which the DUT is to be connected).
17) Click Port x-y Thru to start the calibration measurement (x and y denote the
test ports between which the THRU connection is being made).
18) Click Return.
19) If an isolation calibration must be performed using a LOAD standard, follow
the procedure below.
20) Click Isolation (Optional).
21) Connect a LOAD standard to each of the two test ports (connectors to which
the DUT is to be connected).
22) Click Port x-y Isol to start the calibration measurement (x and y denote the
port numbers to which the LOAD standard is connected).
23) Click Return.
24) Click Done to terminate the full 2-port calibration process. Upon pressing this
key, calibration coefficients will be calculated and saved. The error correction
function will also be automatically enabled.

a. Connect the resistor, capacitor and inductor one after another for the study of their
[Link] 1 or 2 port according to the requirement calibration each
time you connect another element.
b. From the smith chart seen in the network analyzer, we can easily determine the
frequency by the use of marker where the elements are acting as capacitor, inductor
or resistor.
c. From the formula given above we can find all the parasitic and other non ideal R, L &
C.

OBSERVATIONS & CALCULATIONS:


The different frequencies at which the behavior of any component changes or deviates
between that of an ideal resistor, inductor and capacitor is to be noted down so that the
value of additional resistance, inductance and capacitance added can be calculated in each
case. This is done by observing the smith chart for different components and by the use of
[Link] marker can be moved to the required point at which there is a deviaton and the
corresponding frequency is reflected on the screen.

RESULT: For capacitor L lead =


For inductor C par = , R par =
For resistor C par = , L lead =

DISCUSSION: *In this you should write your experiences, additional information and special
remarks related to experiment*.

REFERENCES:
1. [Link]
2. [Link]
3. Introduction to electromagnetic compatibility – Clayton. R. Paul

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