MC33912
MC33912
VBAT 33912
VS1 VSENSE
VS2 HS1
L1
L2
LIN INTERFACE LIN L3
L4
VDD
PWMIN
ADOUT0 LS1
ADOUT1 M
MCU MOSI LS2
MISO ISENSEH
SCLK
CS ISENSEL
RXD HVDD
TXD
AGND
PGND
LGND
IRQ HS2
RST WDCONF
1 Orderable parts
The 33912G5 data sheet is within MC33912G5 product specifications, Pages 3 to 52
The 33912BAC data sheet is within MC33912BAC product specifications, Pages 53 to 103
MC33912G5AC -40 to 125 °C 1. Increase ESD Gun IEC61000-4-2 (gun test contact with 150 pF,
330 ohm test conditions) performance to achieve ±6.0 kV min on the
LIN pin.
2. Immunity against ISO7637 pulse 3b
2.5
MC34912G5AC -40 to 85 °C 3. Reduce EMC emission level on LIN
32-LQFP 4. Improve EMC immunity against RF - target new specification including
3x68pF
5. Comply with J2602 conformance test
MC33912BAC -40 to 125 °C
2.0 Initial release
MC34912BAC -40 to 85 °C
Notes
1. To order parts in Tape & Reel, add the R2 suffix to the part number.
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2 NXP Semiconductors
MC33912G5AC / MC34912G5AC
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NXP Semiconductors 3
MC33912G5AC / MC34912G5AC
INTERRUPT CONTROL
INTERNAL BUS
MODULE AGND
LVI, HVI,
VOLTAGE REGULATOR
ALL OT (VDD,HS,LS,LIN,SD)
RESET CONTROL
MODULE
LVR, WD, EXT ΜC 5.0 V OUTPUT
HVDD
MODULE
LS1
WINDOW LOW-SIDE
WATCHDOG CONTROL
MODULE LS2
MODULE
PWMIN PGND
VS2
MISO HIGH-SIDE
CONTROL VS2 HS1
MODULE
MOSI
SPI
& HS2
SCLK CONTROL
ANALOG MULTIPLEXER
VBAT
VSENSE
SENSE MODULE
CS
CHIP TEMPERATURE
ADOUT0 SENSE MODULE
L1
ANALOG INPUT
WAKE-UP MODULE MODULE
L2
L3
ISENSEH
CURRENT SENSE MODULE
ISENSEL
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4 NXP Semiconductors
MC33912G5AC / MC34912G5AC
4 Pin connections
VSENSE
AGND
HVDD
VDD
HS1
VS1
VS2
NC
32
31
30
29
27
26
28
25
RXD 1 24 HS2
TXD 2 23 L1
MISO 3 22 L2
MOSI 4 21 L3
SCLK 5 20 L4
CS 6 19 LS1
ADOUT0 7 18 PGND
PWMIN 8 17 LS2
10
11
12
13
14
15
16
9
ISENSEL
ADOUT1
IRQ
RST
WDCONF
LIN
ISENSEH
LGND
This pin is the receiver output of the LIN interface which reports the state of the bus
1 RXD Receiver Output
voltage to the MCU interface.
This pin is the transmitter input of the LIN interface which controls the state of the bus
2 TXD Transmitter Input
output.
SPI (Serial Peripheral Interface) data output. When CS is high, pin is in the high-
3 MISO SPI Output
impedance state.
4 MOSI SPI Input SPI (Serial Peripheral Interface) data input.
5 SCLK SPI Clock SPI (Serial Peripheral Interface) clock Input.
6 CS SPI Chip Select SPI (Serial Peripheral Interface) chip select input pin. CS is active low.
7 ADOUT0 Analog Output Pin 0 Analog Multiplexer Output.
8 PWMIN PWM Input High-side and Low-side Pulse Width Modulation Input.
Bidirectional Reset I/O pin - driven low when any internal reset source is asserted. RST
9 RST Internal Reset I/O
is active low.
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NXP Semiconductors 5
MC33912G5AC / MC34912G5AC
Internal Interrupt Interrupt output pin, indicating wake-up events from Stop mode or events from Normal
10 IRQ
Output and Normal request modes. IRQ is active low.
11 ADOUT1 Analog Output Pin 1 Current sense analog output.
Watchdog This input pin is for configuration of the watchdog period and allows the disabling of the
12 WDCONF
Configuration Pin watchdog.
13 LIN LIN Bus This pin represents the single-wire bus transmitter and receiver.
14 LGND LIN Ground Pin This pin is the device LIN ground connection. It is internally connected to the PGND pin.
15 ISENSEL
Current Sense Pins Current Sense differential inputs.
16 ISENSEH
17 LS2
Low-side Outputs Relay drivers low-side outputs.
19 LS1
This pin is the device low-side ground connection. It is internally connected to the LGND
18 PGND Power Ground Pin
pin.
20 L4
21 L3 These pins are the wake-up capable digital inputs(2). In addition, all Lx inputs can be
Wake-up Inputs
22 L2 sensed analog via the analog multiplexer.
23 L1
24 HS2
High-side Outputs High-side switch outputs.
25 HS1
26 VS2 These pins are device battery level power supply pins. VS2 is supplying the HSx drivers
Power Supply Pin
27 VS1 while VS1 supplies the remaining blocks.(3)
28 NC Not Connected This pin can be left open or connected to any potential ground or power supply.
29 VSENSE Voltage Sense Pin Battery voltage sense input.(4)
Hall Sensor Supply
30 HVDD +5.0 V switchable supply output pin.(5)
Output
Voltage Regulator
31 VDD +5.0 V main voltage regulator output pin.(6)
Output
32 AGND Analog Ground Pin This pin is the device analog ground connection.
Notes
2. When used as digital input, a series 33 kΩ resistor must be used to protect against automotive transients.
3. Reverse battery protection series diodes must be used externally to protect the internal circuitry.
4. This pin can be connected directly to the battery line for voltage measurements. The pin is self protected against reverse battery connections. It
is strongly recommended to connect a 10 kΩ resistor in series with this pin for protection purposes.
5. External capacitor (1.0 µF < C < 10 µF; 0.1 Ω < ESR < 5.0 Ω) required.
6. External capacitor (2.0 µF < C < 100 µF; 0.1 Ω < ESR < 10 Ω) required.
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MC33912G5AC / MC34912G5AC
5 Electrical characteristics
Electrical ratings
Supply Voltage at VS1 and VS2
VSUP(SS) • Normal Operation (DC) -0.3 to 27 V
VSUP(PK) • Transient Conditions (load dump) -0.3 to 40
VDD Supply Voltage at VDD -0.3 to 5.5 V
Input / Output Pins Voltage (7)
VIN • CS, RST, SCLK, PWMIN, ADOUT0, ADOUT1, MOSI, MISO, TXD, RXD, -0.3 to VDD +0.3 V
HVDD (8)
VIN(IRQ) -0.3 to 11
• Interrupt Pin (IRQ)
VHS HS1 and HS2 Pin Voltage (DC) - 0.3 to VSUP +0.3 V
VLS LS1 and LS2 Pin Voltage (DC) -0.3 to 45 V
L1, L2, L3 and L4 Pin Voltage
VLxDC • Normal Operation with a series 33 k resistor (DC) -18 to 40
V
VLxTR • Transient input voltage with external component (according to ISO7637-2) ±100
(See Figure 5, page 19)
VISENSE ISENSEH and ISENSEL Pin Voltage (DC) -0.3 to 40 V
VVSENSE VSENSE Pin Voltage (DC) -27 to 40 V
LIN Pin Voltage
VBUSDC • Normal Operation (DC) -18 to 40
V
VBUSTR • Transient input voltage with external component (according to ISO7637-2) -150 to 100
(See Figure 4, page 19)
IVDD VDD output current Internally Limited A
Notes
7. Exceeding voltage limits on specified pins may cause a malfunction or permanent damage to the device.
8. Extended voltage range for programming purpose only.
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MC33912G5AC / MC34912G5AC
ESD Capability
• AECQ100
• Human Body Model - JESD22/A114 (CZAP = 100 pF, RZAP = 1500 Ω)
VESD1-1 • LIN Pin ± 8.0k
VESD1-2 • L1, L2, L3, and L4 ± 6.0k
VESD1-3 • all other Pins ±2000
• Charge Device Model - JESD22/C101 (CZAP = 4.0 pF)
VESD2-1 • Corner Pins (Pins 1, 8, 9, 16, 17, 24, 25 and 32) ± 750
VESD2-2 • All other Pins (Pins 2-7, 10-15, 18-23, 26-31) ± 500
• According to LIN Conformance Test Specification / LIN EMC Test
Specification, August 2004 (CZAP = 150 pF, RZAP = 330 Ω) V
• Contact Discharge, Unpowered
VESD3-1 • LIN pin with 220 pF ± 20k
VESD3-2 • LIN pin without capacitor ± 11k
VESD3-3 • VS1/VS2 (100 nF to ground) >± 12k
VESD3-4 • Lx inputs (33 kΩ serial resistor) ±6000
• According to IEC 61000-4-2 (CZAP = 150 pF, RZAP = 330 Ω)
• Unpowered
VESD4-1 • LIN pin with 220 pF and without capacitor ± 8000
VESD4-2 • VS1/VS2 (100 nF to ground) ± 8000
VESD4-3 • Lx inputs (33 kΩ serial resistor) ± 8000
Thermal ratings
Operating Ambient Temperature
TA 33912 -40 to 125 °C (9)
34912 -40 to 85
TJ Operating Junction Temperature -40 to 150 °C
TSTG Storage Temperature -55 to 150 °C
Thermal Resistance, Junction to Ambient
RθJA Natural Convection, Single Layer board (1s) 85 °C/W (9), (10)
TPPRT Peak Package Reflow Temperature During Reflow Note 14 °C (13), (14)
Notes
9. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient
temperature, air flow, power dissipation of other components on the board, and board thermal resistance.
10. Per JEDEC JESD51-2 with the single layer board (JESD51-3) horizontal.
11. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.
12. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1).
13. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause
malfunction or permanent damage to the device.
14. NXP’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and
Moisture Sensitivity Levels (MSL), go to www.NXP.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all
orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.
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MC33912G5AC / MC34912G5AC
Notes
15. Device is fully functional. All features are operating.
16. Total current (IVS1 + IVS2) measured at GND pins excluding all loads, cyclic sense disabled.
17. Total IDD current (including loads) below 100 µA.
18. Stop and Sleep Modes current increases if VSUP exceeds13.5 V.
19. This parameter is guaranteed after 90 ms.
20. This parameter is guaranteed by process monitoring but not production tested.
21. The Flag is set during power up sequence. To clear the flag, a SPI read must be performed.
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NXP Semiconductors 9
MC33912G5AC / MC34912G5AC
Load Regulation
LDRUN • Normal Mode, 1.0 mA < IVDD < 50 mA – – 80 mV
LDSTOP • Stop Mode, 0.1 mA < IVDD < 5.0 mA – – 50
Line Regulation
LRHVDD – – 40 mV
• IHVDD = 5.0 mA; IVDD = 5.0 mA
Load Regulation
LDHVDD – – 20 mV
• 1.0 mA > IHVDD > 15 mA; IVDD = 5.0 mA
Notes
22. Specification with external capacitor 2.0 µF < C < 100 µF and 100 mΩ ≤ ESR ≤ 10 Ω.
23. Measured when voltage has dropped 250 mV below its nominal Value (5.0 V).
24. This parameter is guaranteed by process monitoring but not production tested.
25. Specification with external capacitor 1.0 µF < C < 10 µF and 100 mΩ ≤ ESR ≤ 10 Ω.
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10 NXP Semiconductors
MC33912G5AC / MC34912G5AC
IOH High-state Output Current (0 V < VOUT < 3.5 V) -150 -250 -350 µA
Pull-down Current Limitation (internally limited)
IPD_MAX 1.5 – 8.0 mA
VOUT = VDD
VIL Low-state Input Voltage -0.3 – 0.3 x VDD V
VIH High-state Input Voltage 0.7 x VDD – VDD +0.3 V
CS Pull-up Current
IPUCS 10 20 30 µA
• 0 V < VIN < 3.5 V
Leakage Current
IOUT – – 2.0 mA
• VDD ≤ VOUT ≤ 10 V
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MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
Hysteresis (35)
VHYS 0.4 0.8 1.4 V
• 5.5 V < VSUP < 27 V
Analog multiplexer
Temperature Sense Analog Output Voltage
• TA = -40 °C 2.0 - 2.8
VADOUT0_TEMP V
• TA = 25 °C 2.8 3.0 3.6
• TA = 125 °C 3.6 - 4.6
Notes
35. The unused Lx pins must be connected to ground.
36. Analog multiplexer input disconnected from Lx input pin.
37. Analog multiplexer input connected to Lx input pin.
38. For VSUP 4.7 V to 18 V
39. Watchdog timing period calculation formula: tPWD [ms] = [0.466 * (REXT - 20)] + 10 with (REXT in kΩ)
40. These limits have been defined after laboratory characterization on 3 lots and 30 samples. These tighten limits could not be guaranteed by
production test.
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NXP Semiconductors 13
MC33912G5AC / MC34912G5AC
Notes
41. These limits have been defined after laboratory characterization on 3 lots and 30 samples. These tighten limits could not be guaranteed by
production test.
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14 NXP Semiconductors
MC33912G5AC / MC34912G5AC
VSERDIODE Voltage Drop at the serial Diode in pull-up path 0.4 1.0 V
VSHIFT_BAT VBAT_SHIFT 0 11.5% VBAT
VSHIFT_GND GND_SHIFT 0 11.5% VBAT
(45)
VBUSWU LIN Wake-up threshold from Stop or Sleep mode 5.3 5.8 V
RSLAVE LIN Pull-up Resistor to VSUP 20 30 60 kΩ
(46)
TLINSD Overtemperature Shutdown 140 160 180 °C
TLINSD_HYS Overtemperature Shutdown Hysteresis – 10 – °C
Notes
42. Parameters guaranteed for 7.0 V ≤ VSUP ≤ 18 V.
43. Loss of local ground must not affect communication in the residual network.
44. Node has to sustain the current which can flow under this condition. Bus must remain operational under this condition.
45. This parameter is 100% tested on an Automatic Tester. However, since it has not been monitored during reliability stresses, NXP does not
guarantee this parameter during the product's life time.
46. When overtemperature shutdown occurs, the LIN bus goes in recessive state and the flag LINOT in LINSR is set.
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MC33912G5AC / MC34912G5AC
Notes
47. This parameter is guaranteed by process monitoring but not production tested.
48. Watchdog timing period calculation formula: tPWD [ms] = [0.466 * (REXT - 20)] + 10 with (REXT in kΩ)
49. Analog Outputs are supplied by VDD and from 100 Hz to 4.0 kHz
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MC33912G5AC / MC34912G5AC
Delay Between the SPI Command and HS /LS Turn Off (52)
t S-OFF – – 10 μs
• 9.0 V < VSUP < 27 V
Delay Between Normal Request and Normal mode After a Watchdog (50)
t SNR2N – – 10 μs
Trigger Command (Normal Request Mode)
Delay Between CS Wake-up (CS LOW to HIGH) in Stop mode and:
t WUCS • Normal Request mode, VDD ON and RST HIGH 9.0 15 80 μs
t WUSPI • First Accepted SPI Command 90 — N/A
t 2CS Minimum Time Between Rising and Falling Edge on the CS 4.0 — — μs
J2602 deglitcher
VSUP Deglitcher (53)
tJ2602_DEG 35 50 70 μs
• (DIS_J2602 = 0)
LIN physical layer: driver characteristics for normal slew rate - 20.0 kbit/sec according to lin physical layer specification(54), (55)
Duty Cycle 1:
• THREC(MAX) = 0.744 * VSUP
D1 • THDOM(MAX) = 0.581 * VSUP
• D1 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 50 µs, 7.0 V ≤ VSUP ≤ 18 V 0.396 — —
Duty Cycle 2:
• THREC(MIN) = 0.422 * VSUP
D2 • THDOM(MIN) = 0.284 * VSUP
• D2 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 50 µs, 7.6 V ≤ VSUP ≤ 18 V — — 0.581
Notes
50. This parameter is guaranteed by process monitoring but not production tested.
51. This parameter is 100% tested on an Automatic Tester. However, since it has not been monitored during reliability stresses, NXP does not
guarantee this parameter during the product's life time.
52. Delay between turn on or off command (rising edge on CS) and HS or LS ON or OFF, excluding rise or fall time due to external load.
53. This parameter has not been monitoring during operating life test.
54. Bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold
defined at each parameter.
55. See Figure 7, page 20.
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NXP Semiconductors 17
MC33912G5AC / MC34912G5AC
Duty Cycle 4:
• THREC(MIN) = 0.389 * VSUP
D4 • THDOM(MIN) = 0.251 * VSUP
• D4 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 96 µs, 7.6 V ≤ VSUP ≤ 18 V — — 0.590
Notes
56. Bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold
defined at each parameter. See Figure 6, page 20.
57. See Figure 8, page 20.
58. VSUP from 7.0 to 18 V, bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to
LIN signal threshold defined at each parameter. See Figure 6, page 20.
59. See Figure 9, page 21
60. See Figure 10, page 21 for Sleep and Figure 11, page 21 for Stop mode.
61. This parameter is tested on automatic tester but has not been monitoring during operating life test.
62. The measurement is done with 1.0 µF capacitor and 0mA current load on VDD. The value takes into account the delay to charge the capacitor. The
delay is measured between the bus wake-up threshold (VBUSWU) rising edge of the LIN bus and when VDD reaches 3.0 V. See Figure 10, page 21.
The delay depends of the load and capacitor on VDD.
63. In Stop mode, the delay is measured between the bus wake-up threshold (VBUSWU) and the falling edge of the IRQ pin. See Figure 11, page 21.
64. This parameter is guaranteed by process monitoring but not production tested.
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18 NXP Semiconductors
MC33912G5AC / MC34912G5AC
33912
R0
TXD LIN
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NXP Semiconductors 19
MC33912G5AC / MC34912G5AC
TXD
tBIT tBIT
tBUS_DOM(MAX) tBUS_REC(MIN)
VLIN_REC
LIN
42.2% VSUP Thresholds of
THREC(MIN)
receiving node 2
THDOM(MIN) 28.4% VSUP
tBUS_DOM(MIN) tBUS_REC(MAX)
RXD
Output of receiving Node 1
tREC_PDF(1) tREC_PDR(1)
RXD
Output of receiving Node 2
tREC_PDR(2) tREC_PDF(2)
TXD
tBIT tBIT
tBUS_DOM(MAX) tBUS_REC(MIN)
VLIN_REC
LIN
38.9% VSUP Thresholds of
THREC(MIN)
receiving node 2
THDOM(MIN) 25.1% VSUP
tBUS_DOM(MIN) tBUS_REC(MAX)
RXD
Output of receiving Node 1
tREC_PDF(1) tREC_PDR(1)
RXD
Output of receiving Node 2
tREC_PDR(2) tREC_PDF(2)
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20 NXP Semiconductors
MC33912G5AC / MC34912G5AC
VLIN_REC
RXD
tREC_PDF tREC_PDR
VLIN_REC
LIN
5.0 V
VBUSWU
DOMINANT LEVEL
3.0 V
VDD
tWAKE_SLEEP
tPROPWL
VLIN_REC
LIN
5.0 V
VBUSWU
DOMINANT LEVEL
IRQ tWAKE_STOP
tPROPWL
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NXP Semiconductors 21
MC33912G5AC / MC34912G5AC
VSUP
VDD
RST
tNRTOUT
tRST
tPSCLK
CS
tLEAD tWSCLKH
tLAG
SCLK
tWSCLKL
tSISU tSIH
tVALID
tSODIS
tSOEN
MISO
D0 DON’T CARE D7
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22 NXP Semiconductors
MC33912G5AC / MC34912G5AC
6 Functional description
6.1 Introduction
The 33912 was designed and developed as a highly integrated and cost-effective solution for automotive and industrial applications. For
automotive body electronics, the 33912 is well suited to perform relay control in applications such as a window lift, sunroof, etc. via the
LIN bus. Power switches are provided on the device configured as high-side and low-side outputs. Other ports are also provided, which
include a current and voltage sense port, a Hall Sensor port supply, and four wake-up capable pins. An internal voltage regulator provides
power to a MCU device.
Also included in this device is a LIN physical layer, which communicates using a single wire. This enables this device to be compatible
with 3-wire bus systems, where one wire is used for communication, one for battery, and one for ground.
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NXP Semiconductors 23
MC33912G5AC / MC34912G5AC
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24 NXP Semiconductors
MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
7.1.1 Introduction
The 33912 offers three main operating modes: Normal (Run), Stop, and Sleep (Low-power). In Normal mode, the device is active and is
operating under normal application conditions. The Stop and Sleep modes are low power modes with wake-up capabilities.
In Stop mode, the voltage regulator still supplies the MCU with VDD (limited current capability), while in Sleep mode the voltage regulator
is turned off (VDD = 0 V). Wake-up from Stop mode is initiated by a wake-up interrupt. Wake-up from Sleep mode is done by a reset and
the voltage regulator is turned back on.
The selection of the different modes is controlled by the MOD1:2 bits in the Mode Control register (MCR). Figure 14 describes how
transitions are done between the different operating modes. Table 6, 28, gives an overview of the operating modes.
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26 NXP Semiconductors
MC33912G5AC / MC34912G5AC
VVDD Low
DD Low
Disabled
Trigger
WD disabled
WDtrigger
WD
WD
(Interrupt)
VVDDLow
Low
Wake-Up Interrupt
DD
Normal
Wake-up
WD
WDFailed
failed
STOPCommand
Command
VVDD LOW (>t NRTOUT
DD Low (>NRTOUT ) expired) Expired
andand VSUV
VSUV =0 =0 Sleep Command
SLEEP Command
Stop
Wake-up
Wake-Up (Reset)
(Reset)
Sleep Stop
VDD
VDD Low
Low
Legend
WD: Watchdog
Notes:
WD Disabled: Watchdog disabled (WDCONF pin connected to GND)
WD
WD Trigger: - meansisWatchdog
Watchdog triggered by a SPI command
WD disabled - means Watchdog disabled (WDCONF terminal connected to GND)
WD Failed: No watchdog trigger or trigger occurs in closed window
WD trigger – means Watchdog is triggered by SPI command
Stop Command: Stop command sent via the SPI
WD failed – means no Watchdog trigger or trigger occurs in closed window
Sleep Command: Sleep command sent via the SPI
STOP Command - means STOP command sent via SPI
Wake-up from Stop Mode: L1, L2, L3 or L4 state change, LIN bus wake-up, Periodic wake-up, CS rising edge wake-up or RST wake-up.
SLEEP
Wake-up from SleepCommand
Mode: L1,- L2,
means
L3 orSLEEP command
L4 state change, send via wake-up,
LIN bus SPI Periodic wake-up.
Wake-Up - means L1 or L2 state change or LIN bus wake up or SS rising edge
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NXP Semiconductors 27
MC33912G5AC / MC34912G5AC
Notes
65. Operation can be enabled/controlled by the SPI.
66. Operation can be controlled by the PWMIN input.
67. HSx switches can be configured for cyclic sense operation in Stop mode.
68. HSx switches can be configured for cyclic sense operation in Sleep mode.
69. Windowing operation when enabled by an external resistor.
7.1.7 Interrupts
Interrupts are used to signal a microcontroller peripheral needs to be serviced. The interrupts which can be generated, change according
to the operating mode. While in Normal and Normal Request modes, the 33912 signals through interrupts special conditions which may
require a MCU software action. Interrupts are not generated until all pending wake-up sources are read in the Interrupt Source register
(ISR).
While in Stop mode, interrupts are used to signal wake-up events. Sleep mode does not use interrupts. Wake-up is performed by
powering-up the MCU. In Normal and Normal Request mode the wake-up source can be read by the SPI. The interrupts are signaled to
the MCU by a low logic level of the IRQ pin, which remains low until the interrupt is acknowledged by a SPI read command of the ISR
register. The IRQ pin is then be driven high.
Interrupts are only asserted while in Normal, Normal Request and Stop mode. Interrupts are not generated while the RST pin is low. The
following is a list of the interrupt sources in Normal and Normal Request modes. Some of these can be masked by writing to the SPI -
Interrupt Mask register (IMR).
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28 NXP Semiconductors
MC33912G5AC / MC34912G5AC
7.1.8 Reset
To reset a MCU the 33912 drives the RST pin low for the time the reset condition lasts. After the reset source is removed, the state
machine drives the RST output low for at least 1.0 ms (typical value) before driving it high. In the 33912, four main reset sources exist:
7.1.9.1 Wake-up from wake-up inputs (L1-L4) with cyclic sense disabled
The wake-up lines are dedicated to sense state changes of external switches and wake-up the MCU (in Sleep or Stop mode). In order to
select and activate direct wake-up from Lx inputs, the Wake-up Control register (WUCR) must be configured with appropriate LxWE inputs
enabled or disabled. The wake-up input’s state is read through the Wake-up Status register (WUSR). Lx inputs are also used to perform
cyclic-sense wake-up.
Note: Selecting an Lx input in the analog multiplexer before entering Low-power mode disables the wake-up capability of the Lx input
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NXP Semiconductors 29
MC33912G5AC / MC34912G5AC
7.1.9.2 Wake-up from wake-up inputs (L1-L4) with cyclic sense timer enabled
The SBCLIN can wake-up at the end of a cyclic sense period if on one of the four wake-up input lines (L1-L4) a state change occurs. One
or both HSx switch can be activated in Sleep or Stop modes from an internal timer. Cyclic sense and force wake-up are exclusive. If cyclic
sense is enabled, the force wake-up can not be enabled. In order to select and activate the cyclic sense wake-up from Lx inputs, before
entering in low power modes (Stop or Sleep modes), the following SPI set-up has to be performed:
In WUCR: select the Lx input to WU-enable.
In HSCR: enable the desired HSx.
• In TIMCR: select the CS/WD bit and determine the cyclic sense period with CYSTx bits.
• Perform Goto Sleep/Stop command.
7.1.9.4 CS wake-up
While in Stop mode, a rising edge on the CS causes a wake-up. The CS wake-up does not generate an interrupt, and is not reported in
the SPI.
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30 NXP Semiconductors
MC33912G5AC / MC34912G5AC
WD PERIOD (tPWD)
WD TIMING SELECTED BY RESISTOR
ON WDCONF PIN
Monitoring(71)
Block Fault Mode Condition Fallout Recovery
REG (Flag, Bit) Interrupt
VSUP<3.0 V (typ)
Battery Fail All modes - Condition gone VSR (BATFAIL, 0) -
then power-up
VDD Undervoltage All except Sleep VDD < 4.5 V (typ) Reset (70) - -
Condition gone
VDD Overtemp Temperature > IRQ low + ISR
- VSR (VDDOT,1)
Prewarning 115 °C (typ) (0101)
All except Low
Power modes
VDD Temperature > VDD shutdown,
- -
Overtemperature 170 °C (typ) Reset then Sleep
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MC33912G5AC / MC34912G5AC
Monitoring(71)
Block Fault Mode Condition Fallout Recovery
REG (Flag, Bit) Interrupt
Condition gone, to
High-side Drivers Temperature > Both HS thermal All flags in HSSR IRQ low + ISR
re-enable HS write
Overtemperature 160 °C (typ) shutdown are set (0010) (72)
to HSCR reg
Condition gone, to
Low-side Drivers Temperature > Both LS thermal All flags in LSSR are IRQ low + ISR
re-enable LS write to
Overtemperature 160 °C (typ) shutdown set (0011) (72)
LSCR reg
Watchdog WD timeout or WD -
Watchdog Timeout Normal clear within the Reset WDSR (WDTO, 3)
window closed
Notes
70. When in Reset mode a VDD undervoltage condition combined with no VSUP undervoltage (VSUV=0) sends the device to Sleep mode.
71. Registers to be read when back in Normal Request or Normal mode depending on the fault. Interrupts only generated in Normal, Normal Request
and Stop modes
72. Unless masked, If masked IRQ remains high and the ISR flags are not set.
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32 NXP Semiconductors
MC33912G5AC / MC34912G5AC
4.5
4
Vadout0 (V)
3.5
2.5
2
-50 0 50 100 150
Temperature (°C)
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NXP Semiconductors 33
MC33912G5AC / MC34912G5AC
Interrupt
HVSE Control VDD
Module VDD
High-Side Interrupt
PWMHSx
VS2
HSx
Cyclic Sense
Wake-up
Module
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34 NXP Semiconductors
MC33912G5AC / MC34912G5AC
VDD
Interrupt
VDD
HVSE Control
Module
PWMIN
High-voltage Shutdown
PWMLSx
Low-side Interrupt
active
clamp
LSx
PGND
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NXP Semiconductors 35
MC33912G5AC / MC34912G5AC
WAKE-UP
MODULE
LIN
Wake-up
MOD1:2
LSR0:1
VS1
LIN DRIVER
J2602
RXONLY Slope and Slew Rate Control
30 K
LIN
TXD
SLOPE
CONTROL
LGND
WAKE-UP
FILTER
RXD
RECEIVER
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MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
CS
MOSI A3 A2 A1 A0 C3 C2 C1 C0
SCLK
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38 NXP Semiconductors
MC33912G5AC / MC34912G5AC
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NXP Semiconductors 39
MC33912G5AC / MC34912G5AC
S7 S6 S5 S4
BATFAIL
VDDOT
VMS
VSUV
VSOV
LINOT
LINS
TXDOM
RXSHORT
HS1CL
HS1OP
HSS
HS2CL
HS2OP
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40 NXP Semiconductors
MC33912G5AC / MC34912G5AC
LS1CL
LS1OP
LSS
LS2CL
LS2OP
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MC33912G5AC / MC34912G5AC
Read L4 L3 L2 L1
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42 NXP Semiconductors
MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
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44 NXP Semiconductors
MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
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46 NXP Semiconductors
MC33912G5AC / MC34912G5AC
0 0 0 1
0 0 1 2
0 1 0 4
0 1 1 6
1 0 0 8
1 0 1 10
1 1 0 12
1 1 1 14
X 0 0 0 No cyclic sense(74)
0 0 0 1 20 ms
0 0 1 0 40 ms
0 0 1 1 60 ms
0 1 0 0 80 ms
0 1 0 1 100 ms
0 1 1 0 120 ms
0 1 1 1 140 ms
1 0 0 1 160 ms
1 0 1 0 320 ms
1 0 1 1 480 ms
1 1 0 0 640 ms
1 1 0 1 800 ms
1 1 1 0 960 ms
1 1 1 1 1120 ms
Notes
73. bit CYSX8 is located in Configuration register (CFR)
74. No Cyclic Sense and no Force Wake-up available.
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0 0 0 Disabled
0 0 1 Reserved
0 1 0 Die Temperature Sensor(75)
0 1 1 VSENSE input
1 0 0 L1 input
1 0 1 L2 input
1 1 0 L3 input
1 1 1 L4 input
Notes
75. Accessing the Die Temperature Sensor directly from the Disabled state is not
recommended. If this transition must be performed and to avoid the
intermediate state, wait at least 1.0 ms, then start the die temp measurement.
Possible access is Disabled → Vsense input → Die Temperature Sensor.
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MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
8 Typical application
The 33912 can be configured in several applications. The figure below shows the 33912 in the typical Slave Node Application.
V
BAT
D1
VS1
VS2
C2 C1
VDD
Internal
Bus
Interrupt
IRQ Voltage Regulator C5
C4 C3 Control Module
LVI, HVI, HTI, OCI
AGND
HVDD
5V Output Module Hall Sensor Supply
VDD Reset
RST LS1
Control Module
IRQ LVR, HVR, HTR, WD,
Low Side Control HB Type Relay
Module LS2
RST PGND
Window
PWMIN Watchdog Module Motor Output R1
TIMER
High Side Control
Module
HS1
MISO HS2
Wake Up Module R4
L3
Analog Input
Digital Input Module
R5
L4
Analog Input
RXD
ISENSEH C6
AGND
LGND
WDCONF
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MC33912G5AC / MC34912G5AC
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MC33912G5AC / MC34912G5AC
INTERRUPT
INTERNAL BUS
CONTROL AGND
MODULE
LVI, HVI, HTI, OCI VOLTAGE REGULATOR
RESET CONTROL
MODULE
LVR, HVR, HTR, WD 5V OUTPUT
HVDD
MODULE
LS1
WINDOW LOW-SIDE
WATCHDOG CONTROL
MODULE LS2
MODULE
PWMIN PGND
VS2
MISO HIGH-SIDE
CONTROL VS2 HS1
MODULE
MOSI
SPI
& HS2
SCLK CONTROL
ANALOG MULTIPLEXER
VBAT
VSENSE
SENSE MODULE
CS
CHIP TEMPERATURE
ADOUT0 SENSE MODULE
L1
ANALOG INPUT
WAKE-UP MODULE MODULE
L2
L3
ISENSEH
CURRENT SENSE MODULE
ISENSEL
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MC33912G5AC / MC34912G5AC
11 Pin connections
VSENSE
AGND
HVDD
VDD
HS1
VS1
VS2
NC
32
31
29
26
30
28
27
25
RXD 1 24 HS2
TXD 2 23 L1
MISO 3 22 L2
MOSI 4 21 L3
SCLK 5 20 L4
CS 6 19 LS1
ADOUT0 7 18 PGND
PWMIN 8 17 LS2
10
11
12
13
14
15
16
9
ISENSEL
RST
ISENSEH
ADOUT1
WDCONF
LIN
IRQ
LGND
This pin is the receiver output of the LIN interface which reports the state of the bus
1 RXD Receiver Output
voltage to the MCU interface.
This pin is the transmitter input of the LIN interface which controls the state of the bus
2 TXD Transmitter Input
output.
SPI (Serial Peripheral Interface) data output. When CS is high, pin is in the high-
3 MISO SPI Output
impedance state.
4 MOSI SPI Input SPI (Serial Peripheral Interface) data input.
5 SCLK SPI Clock SPI (Serial Peripheral Interface) clock Input.
6 CS SPI Chip Select SPI (Serial Peripheral Interface) chip select input pin. CS is active low.
7 ADOUT0 Analog Output Pin 0 Analog Multiplexer Output.
8 PWMIN PWM Input High-side and Low-side Pulse Width Modulation Input.
Bidirectional Reset I/O pin - driven low when any internal reset source is asserted. RST
9 RST Internal Reset I/O
is active low.
Internal Interrupt Interrupt output pin, indicating wake-up events from Stop mode or events from Normal
10 IRQ
Output and Normal request modes. IRQ is active low.
11 ADOUT1 Analog Output Pin 1 Current sense analog output.
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MC33912G5AC / MC34912G5AC
Watchdog This input pin is for configuration of the watchdog period and allows the disabling of the
12 WDCONF
Configuration Pin watchdog.
13 LIN LIN Bus This pin represents the single-wire bus transmitter and receiver.
14 LGND LIN Ground Pin This pin is the device LIN ground connection. It is internally connected to the PGND pin.
15 ISENSEL
Current Sense Pins Current Sense differential inputs.
16 ISENSEH
17 LS2
Low-side Outputs Relay drivers low-side outputs.
19 LS1
This pin is the device low-side ground connection. It is internally connected to the LGND
18 PGND Power Ground Pin
pin.
20 L4
21 L3 These pins are the wake-up capable digital inputs(76). In addition, all Lx inputs can be
Wake-up Inputs
22 L2 sensed analog via the analog multiplexer.
23 L1
24 HS2
High-side Outputs High-side switch outputs.
25 HS1
26 VS2 These pins are device battery level power supply pins.VS2 is supplying the HSx drivers
Power Supply Pin
27 VS1 while VS1 supplies the remaining blocks.(77)
29 VSENSE Voltage Sense Pin Battery voltage sense input.(78)
Hall Sensor Supply
30 HVDD +5.0 V switchable supply output pin.(79)
Output
Voltage Regulator
31 VDD +5.0 V main voltage regulator output pin.(80)
Output
32 AGND Analog Ground Pin This pin is the device analog ground connection.
Notes
76. When used as digital input, a series 33 kΩ resistor must be used to protect against automotive transients.
77. Reverse battery protection series diodes must be used externally to protect the internal circuitry.
78. This pin can be connected directly to the battery line for voltage measurements. The pin is self protected against reverse battery connections. It
is strongly recommended to connect a 10 kΩ resistor in series with this pin for protection purposes.
79. External capacitor (1.0 µF < C < 10 µF; 0.1 Ω < ESR < 5.0 Ω) required.
80. External capacitor (2.0 µF < C < 100 µF; 0.1 Ω < ESR < 10.0 Ω) required.
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MC33912G5AC / MC34912G5AC
12 Electrical characteristics
Electrical ratings
Supply Voltage at VS1 and VS2
VSUP(SS) • Normal Operation (DC) -0.3 to 27 V
VSUP(PK) • Transient Conditions (load dump) -0.3 to 40
VDD Supply Voltage at VDD -0.3 to 5.5 V
(81)
Input / Output Pins Voltage
VIN • CS, RST, SCLK, PWMIN, ADOUT0, ADOUT1, MOSI, MISO, TXD, RXD, -0.3 to VDD +0.3
V
HVDD
VIN(IRQ) • Interrupt Pin (IRQ) -0.3 to 11 (82)
VHS HS1 and HS2 Pin Voltage (DC) - 0.3 to VSUP +0.3 V
VLS LS1 and LS2 Pin Voltage (DC) -0.3 to 45 V
L1, L2, L3 and L4 Pin Voltage
VLxDC • Normal Operation with a series 33 kΩ resistor (DC) -18 to 40
V
VLxTR • Transient input voltage with external component (according to ISO7637-2) ±100
(See Figure 28)
VISENSE ISENSEH and ISENSEL Pin Voltage (DC) -0.3 to 40 V
VVSENSE VSENSE Pin Voltage (DC) -27 to 40 V
LIN Pin Voltage
VBUSDC • Normal Operation (DC) -18 to 40
V
VBUSTR • Transient input voltage with external component (according to ISO7637-2) -150 to 100
(See Figure 27)
IVDD VDD output current Internally Limited A
ESD Voltage
VESD1-1 • Human Body Model - LIN Pin ± 8000
VESD1-2 • Human Body Model - all other Pins ±2000
VESD2 • Machine Model ± 150 V (83)
Notes
81. Exceeding voltage limits on specified pins may cause a malfunction or permanent damage to the device.
82. Extended voltage range for programming purpose only.
83. Testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω), Machine Model (CZAP = 200 pF, RZAP = 0 Ω)
and the Charge Device Model, Robotic (CZAP = 4.0 pF).
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MC33912G5AC / MC34912G5AC
Thermal ratings
Operating Ambient Temperature
TA 33912 -40 to 125 °C (84)
34912 -40 to 85
TJ Operating Junction Temperature -40 to 150 °C
TSTG Storage Temperature -55 to 150 °C
Thermal Resistance, Junction to Ambient
RθJA Natural Convection, Single Layer board (1s) 85 °C/W (85), (86)
TPPRT Peak Package Reflow Temperature During Reflow Note 90 °C (89), (90)
Notes
84. The limiting factor is junction temperature; taking into account the power dissipation, thermal resistance, and heat sinking.
85. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient
temperature, air flow, power dissipation of other components on the board, and board thermal resistance.
86. Per JEDEC JESD51-2 with the single layer board (JESD51-3) horizontal.
87. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.
88. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1).
89. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause
malfunction or permanent damage to the device.
90. NXP’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and
Moisture Sensitivity Levels (MSL), Go to www.NXP.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all
orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.
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58 NXP Semiconductors
MC33912G5AC / MC34912G5AC
Notes
91. Device is fully functional. All features are operating.
92. Total current (IVS1 + IVS2) measured at GND pins excluding all loads, cyclic sense disabled.
93. Total IDD current (including loads) below 100 µA.
94. Stop and Sleep modes current increases if VSUP exceeds 13.5 V.
95. This parameter is guaranteed by process monitoring but not production tested.
96. The Flag is set during power up sequence. To clear the flag, a SPI read must be performed.
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NXP Semiconductors 59
MC33912G5AC / MC34912G5AC
Load Regulation
LDRUN • Normal mode, 1.0 mA < IVDD < 50 mA – 15 80 mV
LDSTOP • Stop mode, 0.1 mA < IVDD < 5.0 mA – 10 50
Line Regulation
LRHVDD – 25 40 mV
• IHVDD = 5.0 mA; IVDD = 5.0 mA
Load Regulation
LDHVDD – 10 20 mV
• 1.0 mA > IHVDD > 15 mA; IVDD = 5.0 mA
Notes
97. Specification with external capacitor 2.0 µF < C < 100 µF and 100 mΩ ≤ ESR ≤ 10 Ω.
98. Measured when voltage has dropped 250 mV below its nominal Value (5.0 V).
99. This parameter is guaranteed by process monitoring but not production tested.
100. Specification with external capacitor 1.0 µF < C < 10 µF and 100 mΩ ≤ ESR ≤ 10 Ω.
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IOH High-state Output Current (0 < VOUT < 3.5 V) -150 -250 -350 µA
Pull-down Current Limitation (internally limited)
IPD_MAX 1.5 – 8.0 mA
VOUT = VDD
VIL Low-state Input Voltage -0.3 – 0.3 x VDD V
VIH High-state Input Voltage 0.7 x VDD – VDD +0.3 V
CS Pull-up Current
IPUCS 10 20 30 µA
• 0 V < VIN < 3.5 V
Leakage Current
VOH – – 2.0 mA
• VDD ≤ VOUT ≤ 10 V
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MC33912G5AC / MC34912G5AC
(106)
THSSD_HYS Overtemperature Shutdown Hysteresis – 10 – °C
(106)
TLSSD_HYS Overtemperature Shutdown Hysteresis – 10 – °C
Notes
101. This parameter is production tested up to TA = 125 °C and guaranteed by process monitoring up to TJ = 150 °C.
102. When overcurrent occurs, the corresponding high-side stays ON with limited current capability and the HSxCL flag is set in the HSSR.
103. When open load occurs, the flag (HSxOP) is set in the HSSR.
104. When short-circuit occurs and if HVSE flag is enabled, both HS automatic shutdown.
105. When overtemperature shutdown occurs, both high-sides are turned off. All flags in HSSR are set.
106. Guaranteed by characterization but not production tested
107. When overcurrent occurs, the corresponding low-side stays ON with limited current capability and the LSxCL flag is set in the LSSR.
108. When open load occurs, the flag (LSxOP) is set in the LSSR.
109. When short-circuit occurs and if HVSE Flag is enabled, both LS automatic shutdown
110. When overtemperature shutdown occurs, both low-sides are turned off. All flags in LSSR are set.
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62 NXP Semiconductors
MC33912G5AC / MC34912G5AC
Hysteresis
VHYS 0.5 1.0 1.5 V
• 5.5 V < VSUP < 27 V
Analog multiplexer
STTOV Internal Chip Temperature Sense Gain – 10.5 – mV/K
VSENSE Input Divider Ratio (RATIOVSENSE = VVSENSE / VADOUT0)
RATIOVSENSE 5.0 5.25 5.5
• 5.5 V < VSUP < 27 V
Notes
111. Analog multiplexer input disconnected from Lx input pin.
112. Analog multiplexer input connected to Lx input pin.
113. Watchdog timing period calculation formula: tPWD [ms] = 0.466 * (REXT - 20) + 10 (REXT in kΩ)
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64 NXP Semiconductors
MC33912G5AC / MC34912G5AC
Notes
114. Parameters guaranteed for 7.0 V ≤ VSUP ≤ 18 V.
115. When overtemperature shutdown occurs, the LIN bus goes in recessive state and the flag LINOT in LINSR is set.
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NXP Semiconductors 65
MC33912G5AC / MC34912G5AC
Notes
116. This parameter is guaranteed by process monitoring but not production tested.
117. Watchdog timing period calculation formula: tPWD [ms] = 0.466 * (REXT - 20) + 10 (REXT in kΩ)
118. Analog Outputs are supplied by VDD
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Delay Between Normal Request and Normal Mode After a Watchdog (119)
t SNR2N – – 10 μs
Trigger Command (Normal Request Mode)
Delay Between CS Wake-up (CS LOW to HIGH) in Stop mode and:
t WUCS • Normal Request mode, VDD ON and RST HIGH 9.0 15 80 μs
t WUSPI • First Accepted SPI Command 90 — N/A
t 2CS Minimum Time Between Rising and Falling Edge on the CS 4.0 — — μs
(121), (122)
LIN physical layer: driver characteristics for normal slew rate - 20.0 kBit/sec
Duty Cycle 1: D1 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 50 µs
D1 0.396 — —
• 7.0 V ≤ VSUP ≤ 18 V
LIN physical layer: driver characteristics for slow slew rate - 10.4 kBit/sec (121), (123)
Duty Cycle 3: D3 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 96 µs
D3 0.417 — — μs
• 7.0 V ≤ VSUP ≤ 18 V
Notes
119. This parameter is guaranteed by process monitoring but not production tested.
120. Delay between turn on or off command (rising edge on CS) and HS or LS ON or OFF, excluding rise or fall time due to external load.
121. Bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold
defined at each parameter. See Figure 29.
122. See Figure 30.
123. See Figure 31.
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MC33912G5AC / MC34912G5AC
Notes
124. VSUP from 7.0 V to 18 V, bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to
LIN signal threshold defined at each parameter. See Figure 29.
125. See Figure 32.
126. See Figure 33 for Sleep and Figure 34 for Stop mode.
127. The measurement is done with 1µF capacitor and 0 mA current load on VDD. The value takes into account the delay to charge the capacitor. The
delay is measured between the bus wake-up threshold (VBUSWU) rising edge of the LIN bus and when VDD reaches 3.0 V. See Figure 33. The
delay depends of the load and capacitor on VDD.
128. In Stop mode, the delay is measured between the bus wake-up threshold (VBUSWU) and the falling edge of the IRQ pin. See Figure 34.
129. This parameter is guaranteed by process monitoring but not production tested.
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68 NXP Semiconductors
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33912
R0
TXD LIN
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NXP Semiconductors 69
MC33912G5AC / MC34912G5AC
TXD
tBIT tBIT
tRDOM tRREC
TXD
tBIT tBIT
tRDOM tRREC
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70 NXP Semiconductors
MC33912G5AC / MC34912G5AC
VLIN_REC
VBUSREC
VSUP
LIN BUS SIGNAL
VBUSDOM
RXD
tRX_PDF tRX_PDR
VLIN_REC
LIN
0.4 VSUP
DOMINANT LEVEL
VDD
tPROPWL tWAKE
VLIN_REC
Vrec
LIN
0.4VSUP
0.4 VSUP
Dominant Level
Dominant level
IRQ
t PROPWL
TpropWL
t WAKE
Twake
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MC33912G5AC / MC34912G5AC
VSUP
VDD
RST
tNRTOUT
tRST
tPSCLK
CS
tLEAD tWSCLKH
tLAG
SCLK
tWSCLKL
tSISU tSIH
tVALID
tSODIS
tSOEN
MISO
D0 DON’T CARE D7
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13 Functional description
13.1 Introduction
The 33912 was designed and developed as a highly integrated and cost-effective solution for automotive and industrial applications. The
33912 is well suited to perform relay control in applications like window lift, sunroof, etc. via LIN bus, for automotive body electronics.
Power switches are provided on the device configured as high-side and low-side outputs. Other ports are also provided, which include a
current and voltage sense port, a Hall Sensor port supply, and four wake-up capable pins. An internal voltage regulator provides power
to a MCU device.
Also included in this device is a LIN physical layer, which communicates using a single wire. This enables this device to be compatible
with 3-wire bus systems, where one wire is used for communication, one for battery, and one for ground.
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74 NXP Semiconductors
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MC33912G5AC / MC34912G5AC
Integrated Supply
Hall Sensor Supply Voltage Regulator
HVDD VDD
Analog Circuitry High Side Drivers
Window Watchdog Wake-Up HS1 - HS2
Low Side Drivers
Digital / Analog Input
LS1 - LS2
Voltage, Current & Temperature Sense
LIN Physical Layer
MCU Interface and Output Control Interface
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14.1.1 Introduction
The 33912 offers three main operating modes: Normal (Run), Stop, and Sleep (Low Power). In Normal mode, the device is active and is
operating under normal application conditions. The Stop and Sleep modes are Low-power modes with wake-up capabilities.
In Stop mode, the voltage regulator still supplies the MCU with VDD (limited current capability), while in Sleep mode the voltage regulator
is turned off (VDD = 0 V). Wake-up from Stop mode is initiated by a wake-up interrupt. Wake-up from Sleep mode is done by a reset and
the voltage regulator is turned back on. The selection of the different modes is controlled by the MOD1:2 bits in the Mode Control register
(MCR). Figure 38 describes how transitions are done between the different operating modes. Table 37 gives an overview of the operating
modes.
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78 NXP Semiconductors
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VVDD Low
DD Low
Disabled
Trigger
WD disabled
WDtrigger
WD
WD
(Interrupt)
VVDDLow
Low
Wake-Up Interrupt
DD
Normal
Wake-Up
WD
WDFailed
failed
STOPCommand
Command
VVDD LOW (>t NRTOUT
DD Low (>NRTOUT ) expired) Expired
andand VSUV
VSUV =0 =0 Sleep Command
SLEEP Command
Stop
Wake-up
Wake-Up (Reset)
(Reset)
Sleep Stop
VDD
VDD Low
Low
Legend
WD: Watchdog
Notes:
WD Disabled: Watchdog disabled (WDCONF pin connected to GND)
WD
WD Trigger: - meansisWatchdog
Watchdog triggered by a SPI command
WD Failed: No disabled
WD watchdog- trigger
means orWatchdog disabled
trigger occurs (WDCONF
in closed terminal connected to GND)
window
WD trigger – means Watchdog is triggered by SPI command
Stop Command: Stop command sent via the SPI
WD failed – means no Watchdog trigger or trigger occurs in closed window
Sleep Command: Sleep command sent via the SPI
STOP Command - means STOP command sent via SPI
Wake-Up from Stop Mode: L1, L2, L3 or L4 state change, LIN bus wake-up, Periodic wake-up, CS rising edge wake-up or RST wake-up.
SLEEP
Wake-Up from SleepCommand
Mode: L1,- L2,
means SLEEP
L3 or command
L4 state change,send via wake-up,
LIN bus SPI Periodic wake-up.
Wake-Up - means L1 or L2 state change or LIN bus wake up or SS rising edge
Figure 38. Operating modes and transitions
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Notes
130. Operation can be enabled/controlled by the SPI.
131. Operation can be controlled by the PWMIN input.
132. HSx switches can be configured for cyclic sense operation in Stop mode.
133. HSx switches can be configured for cyclic sense operation in Sleep mode.
134. Windowing operation when enabled by an external resistor.
14.1.7 Interrupts
Interrupts are used to signal a microcontroller peripheral needs to be serviced. The interrupts which can be generated, change according
to the operating mode. While in Normal and Normal Request modes, the 33912 signals through interrupts special conditions which may
require a MCU software action. Interrupts are not generated until all pending wake-up sources are read in the Interrupt Source register
(ISR).
While in Stop mode, interrupts are used to signal wake-up events. Sleep mode does not use interrupts. Wake-up is performed by
powering-up the MCU. In Normal and Normal Request mode the wake-up source can be read by the SPI. The interrupts are signaled to
the MCU by a low logic level of the IRQ pin, which remains low until the interrupt is acknowledged by a SPI read. The IRQ pin then is
driven high.
Interrupts are only asserted while in Normal, Normal Request and Stop mode. Interrupts are not generated while the RST pin is low. The
following is a list of the interrupt sources in Normal and Normal Request modes. Some of these can be masked by writing to the SPI -
Interrupt Mask register (IMR).
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14.1.8 Reset
To reset a MCU the 33912 drives the RST pin low for the time the reset condition lasts. After the reset source is removed, the state
machine drives the RST output low for at least 1.0 ms (typical value) before driving it high. In the 33912, four main reset sources exist:
14.1.9.1 Wake-up from wake-up inputs (L1-L4) with cyclic sense disabled
The wake-up lines are dedicated to sense state changes of external switches and wake-up the MCU (in Sleep or Stop mode). To select
and activate direct wake-up from Lx inputs, the Wake-up Control register (WUCR) must be configured with appropriate LxWE inputs
enabled or disabled. The wake-up input’s state is read through the Wake-up Status register (WUSR). Lx inputs are also used to perform
cyclic-sense wake-up.
Note: Selecting an Lx input in the analog multiplexer before entering low power mode disables the wake-up capability of the Lx input
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14.1.9.2 Wake-up from wake-up inputs (L1-L4) with cyclic sense timer enabled
The SBCLIN can wake-up at the end of a cyclic sense period if on one of the four wake-up input lines (L1-L4) a state change occurs. The
HSx switch is activated in Sleep or Stop modes from an internal timer. Cyclic sense and force wake-up are exclusive. If cyclic sense is
enabled, the force wake-up can not be enabled. In order to select and activate the cyclic sense wake-up from Lx inputs, before entering
in low power modes (Stop or Sleep modes), the following SPI set-up has to be performed:
In WUCR: select the Lx input to WU-enable.
In HSCR: enable the desired HSx.
• In TIMCR: select the CS/WD bit and determine the cyclic sense period with CYSTx bits.
• Perform Goto Sleep/Stop command.
14.1.9.4 CS wake-up
While in Stop mode, a rising edge on the CS causes a wake-up. The CS wake-up does not generate an interrupt, and is not reported on
the SPI.
14.1.10Window watchdog
The 33912 includes a configurable window watchdog which is active in Normal mode. The watchdog can be configured by an external
resistor connected to the WDCONF pin. The resistor is used to achieve higher precision in the timebase used for the watchdog. SPI clears
are performed by writing through the SPI in the MOD bits of the Mode Control register (MCR).
During the first half of the SPI timeout, watchdog clears are not allowed, but after the first half of the SPI timeout window, the clear
operation opens. If a clear operation is performed outside the window, the 33912 resets the MCU, in the same way as when the watchdog
overflows.
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WD PERIOD (tPWD)
WD TIMING SELECTED BY REGISTER
ON WDCONF PIN
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Interrupt
HVSE Control VDD
Module VDD
High-voltage Shutdown
PWMIN
High-side Interrupt
PWMHSx
VS2
HSx
Cyclic Sense
Wake-up
Module
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VDD
Interrupt
VDD
HVSE Control
Module
PWMIN
High-voltage Shutdown
PWMLSx
Low-side Interrupt
active
clamp
LSx
PGND
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INTERRUPT
CONTROL WAKE-UP
MODULE MODULE
MOD1:2
LSR0:1
VS1
LINPE
LIN – DRIVER
LDVS
RXONLY Slope and Slew Rate Control
Overcurrent Shutdown (interrupt maskable)
RXSHORT Overtemperature Shutdown (interrupt maskable)
TXDOM
LINOT
LINOC
30K
LIN
TXD
SLOPE
CONTROL
LGND
WAKE-UP
FILTER
RXD
RECEIVER
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CS
MOSI A3 A2 A1 A0 C3 C2 C1 C0
SCLK
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BATFAIL
VDDOT
VMS
VSUV
VSOV
LINOC
LINOT
LINS
TXDOM
RXSHORT
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HS1CL
HS1OP
HSS
HS2CL
HS2OP
LS1CL
LS1OP
LSS
LS2CL
LS2OP
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Read L4 L3 L2 L1
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0 0 0 1
0 0 1 2
0 1 0 4
0 1 1 6
1 0 0 8
1 0 1 10
1 1 0 12
1 1 1 14
X 0 0 0 No cyclic sense
0 0 0 1 20 ms
0 0 1 0 40 ms
0 0 1 1 60 ms
0 1 0 0 80 ms
0 1 0 1 100 ms
0 1 1 0 120 ms
0 1 1 1 140 ms
1 0 0 1 160 ms
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1 0 1 0 320 ms
1 0 1 1 480 ms
1 1 0 0 640 ms
1 1 0 1 800 ms
1 1 1 0 960 ms
1 1 1 1 1120 ms
Notes
135. bit CYSX8 is located in Configuration register (CFR)
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0 0 0 Disabled
0 0 1 Reserved
0 1 0 Die Temperature Sensor
0 1 1 VSENSE input
1 0 0 L1 input
1 0 1 L2 input
1 1 0 L3 input
1 1 1 L4 input
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15 Typical application
The 33912 can be configured in several applications. The figure below shows the 33912 in the typical Slave Node Application.
V
BAT
D1
VS1
VS2
C2 C1
VDD
Internal
Bus
Interrupt
IRQ Voltage Regulator C5
C4 C3 Control Module
LVI, HVI, HTI, OCI
AGND
HVDD
5V Output Module Hall Sensor Supply
VDD Reset
RST LS1
Control Module
IRQ LVR, HVR, HTR, WD,
Low Side Control HB Type Relay
Module LS2
RST PGND
Window
PWMIN Watchdog Module Motor Output R1
TIMER
High Side Control
Module
HS1
MISO HS2
Wake Up Module R4
L3
Analog Input
Digital Input Module
R5
L4
Analog Input
RXD
ISENSEH C6
AGND
LGND
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16 Packaging
33912
33912
33912
17 Revision history
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