Application Note - 0502
Calculating the Thickness of Free-Standing Films by FTIR
Qualitative and quantitative analysis of polymer materials is In the spectrum shown in Figure 1, we selected starting and
frequently done by preparing a relatively thin film of the mate- ending points in the spectrum of 2776.51 and 2036.60 cm-1 and
rial for infrared spectroscopy. These prepared sample materi- counted the number of fringes within this spectral region as 9.
als generally have parallel sides and smooth surfaces and typi- To count the number of fringes, select starting and ending
cally produce a well known “fringing effect”1, 2, which origi- points both as minima or maxima of the spectrum and then
nates from constructive and destructive interference of the IR count the number of opposing minima or maxima. In other
beam from these parallel surfaces of the sample. This effect is words if we select minima values for starting and ending points
clearly seen in the FTIR spectrum of a 1.5 mil thickness poly- in the spectrum, then select maxima points to count the num-
styrene sample shown in Figure 1. ber of fringes.
Using these values in our equation, we calculate a thick-
ness of 0.003825 cm or 38.25 microns for the polystyrene
film. This calculated value compares favorably with the
expected thickness of the 1.5 mil film (38 micrometer);
however, is more precise.
A convenient way to perform the above calculations is
by using PIKECalc software (PIKE Technologies part num-
ber; 007-0300). With this software package you can en-
ter the values for n, N, υ1, and υ2 and the thickness of the
free-standing film is calculated immediately.
References:
Figure 1. FTIR spectrum of 1.5 mil polystyrene film showing 1. Griffiths, P. R., de Haseth, J. A., Fourier Transform
“fringing effect”. Infrared Spectrometry (John Wiley & Sons, 1986).
2. Stuart, B., George, B., McIntyre P., Modern Infrared
From this fringing effect we can calculate the thickness of the Spectroscopy (John Wiley & Sons, 1998).
film using the following equation;
b = 1/2n x N / (υ1 - υ2)
where;
b = film thickness
n = refractive index of sample
N = number of fringes within a given spectral region
υ1, υ2 = start and end point in the spectrum in cm-1
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