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SEM Vs TEM

The article compares Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), detailing their functions, advantages, and differences. SEM is used for surface imaging with lower resolution, while TEM provides higher resolution images of internal structures but requires ultrathin samples. Both techniques are essential in various scientific fields, and understanding their distinct capabilities helps in selecting the appropriate method for specific applications.

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0% found this document useful (0 votes)
48 views10 pages

SEM Vs TEM

The article compares Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), detailing their functions, advantages, and differences. SEM is used for surface imaging with lower resolution, while TEM provides higher resolution images of internal structures but requires ultrathin samples. Both techniques are essential in various scientific fields, and understanding their distinct capabilities helps in selecting the appropriate method for specific applications.

Uploaded by

gomathizoo
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

SEM vs TEM

Article Published: February 25, 2020


Nicole Gleichmann

Credit: Technology Networks

Electron microscopy is a valuable tool used to obtain high-resolution images in a


variety of applications, including biomedical research, forensics, and technology.
Electron microscopes can capture much higher resolution images than light
microscopes, contributing information that is otherwise unattainable.

Contents

What is SEM?

- How does SEM work?


What is TEM?

- How does a TEM work?

SEM vs TEM

- SEM vs TEM advantages

- SEM vs TEM similarities and differences

Every electron microscope works by accelerating a focused stream of electrons in a


vacuum towards a sample. Interactions between the electron beam and the
sample create an image, similar to how optical microscopes use light to capture
images. The image created reveals details of a sample’s surface or internal
composition, depending on the type of electron microscope that is used.

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM)


are the two most common types of electron microscopy. TEM and SEM differ in
how they work and what types of images they are able to capture. This article will
overview SEM and TEM, including what they are, how they work, and how they
compare to one another.

Continue reading below...


Article

Electron Microscopy Techniques, Strengths, Limitations and


Applications
Read More

What is SEM?

SEM can stand for either Scanning Electron Microscopy or Scanning Electron
Microscope. An SEM is a kind of electron microscope that uses a fine beam of
focused electrons to scan a sample’s surface. The microscope records information
about the interaction between the electrons and the sample, creating a magnified
image. SEM has the potential to magnify an image up to 2 million times.
Figure 1: A closer look at an SEM microscope. Credit: Technology Networks.

SEM images give insight into a sample’s topography and elemental composition.
SEM is able to capture 3-D black-and-white images of thin or thick samples.
The sample’s size is limited only by the size of the electron microscope chamber.

How does SEM work?

To obtain a high-resolution image, an electron source (also known as an electron


gun) emits a stream of high-energy electrons towards a sample. The electron beam
is focused using electromagnetic lenses. Once the focused stream reaches the
sample, it scans its surface in a rectangular raster.

The interaction between the electron beam and the sample creates secondary
electrons, backscattered electrons, and X-rays. These interactions are captured to
create a magnified image.

What is TEM?

TEM can stand for Transmission Electron Microscopy or Transmission Electron


Microscope (TEM). A TEM is a type of electron microscope that uses a broad beam
of electrons to create an image of a sample’s internal structure. A beam of
electrons is transmitted through a sample, creating an image that details a
sample’s morphology, composition, and crystal structure.
Figure 2: A closer look at a TEM microscope. Credit: Technology Networks.

Samples must be incredibly thin, often less than 150 nm thick, to allow electrons to
pass through them. After the transmission of the electrons through the sample,
they arrive at a detector below and a 2-D image is created.

TEMs have an incredible magnification potential of 10-50 million times. The details
provided are at the atomic level, the highest resolution of any electron microscope.
TEMs are often used to examine molecular and cellular structures.

How does a TEM work?

An electron source sends a beam of electrons through an ultrathin sample. When


the electrons penetrate the sample, they pass through lenses below. This data is
used to create images directly on a fluorescent screen or onto a computer screen
using a charge-coupled device (CCD) camera.

SEM vs TEM

SEM and TEM are both valuable tools in the biological, physical, and chemical
sciences. By understanding the differences between these two electron
microscopes, scientists can choose the correct type of microscope for their needs.

SEM vs TEM advantages

Scanning Electron Microscopes and Transmission Electron Microscopes each


contain unique advantages when compared to the other.

In comparison to TEMs, SEMs:

• Cost less
• Take less time to create an image
• Require less sample preparation
• Accept thicker samples
• Can examine larger samples

In comparison to SEMs, TEMs:

• Create higher resolution images


• Provide crystallographic and atomic data
• Create 2-D images that are often easier to interpret than SEM 3-D images
• Allow users to examine more characteristics of a sample

SEM vs TEM similarities and differences

There are many similarities between SEMs and TEMs. The components of these
two high-resolution microscopes are very similar. Each has an electron source/gun
that emits an electron stream towards a sample in a vacuum, and each contains
lenses and electron apertures to control the electron beam and capture images.

But the differences in function between the two are vast. They differ in how they
work, the types of samples that they require, the resolution of images that they
create, and more. Even the basic microscope setup is different. In SEM, the sample,
located at the base of the electron column, is scanned and the resulting electron
scattering is analyzed to produce an image. In TEM, the sample is placed in the
middle of the microscope and electrons pass through the sample before being
collected. TEM offers information on ultrathin samples' inner structure, while SEM
records information about a sample's surface.

The below table summarizes the differences between SEMs and TEMs.

Scanning Electron Transmission Electron


Microscopes (SEM) Microscopes (TEM)

Electron
Fine, focused beam Broad beam
stream

Image taken Topographical/surface Internal structure

Resolution Lower resolution Higher resolution

Magnification Up to 2,000,000 times Up to 50,000,000 times

Image
3-D 2-D
dimension

Sample
Thin and thick samples okay Ultrathin samples only
thickness

Penetrates
No Yes
sample

Sample
Less restrictive More restrictive
restriction

Sample
Less preparation required More preparation required
preparation

Cost Less expensive More expensive


Speed Faster Slower

More complicated; requires


Operation Easy to use
training

©2025 Technology Networks, all rights reserved, Part of the LabX Media Group

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