IMAGING TECHNIQUES
Presented by
Hasanain Basim
University of Technology
2019-2020
OUTLINES
•Different Types of Microscopies
•Introduction
•Basic principle
•Sample Requirements
•Applications
•Conclusion
TYPES OF MICROSCOPES
• Light Microscopy (Polarizing Microscope).
• Scanning Electron Microscopy, SEM.
• Scanning Tunneling Microscopy, STM.
• Scanning Force Microscopy,SFM or Atomic Force Microscopy,
AFM.
• Transmission Electron Microscopy, TEM.
LIGHT MICROSCOPY
LIGHT MICROSCOPY
(INTRODUCTION)
• It is a simple instrument that magnifies small objects to view
structures and microscopic characteristics of materials.
LIGHT MICROSCOPY(BASIC PRINCIPLE)
• By placing a polarizer in the light's path before the sample, light is
made to vibrate in one direction only, which enables to isolate
specific properties of materials in specific orientations.
• Properties are obtained such as morphology(shape), size, crystal
system, melting point, eutectics, degree of crystallinity, Micro
hardness,……)
LIGHT MICROSCOPY(ANIMATION)
LIGHT MICROSCOPY
(SAMPLE REQUIREMENTS )
• All samples are accommodated.
LIGHT MICROSCOPY
(APPLICATION)
• Direct visual observation for final characterization
SCANNING ELECTRON MICROSCOPY
(SEM)(INTRODUCTION)
•The SEM provides a highly magnified image of the surface of a
material
•The resolution of the SEM can approach a few nm.
•Topographical information and information concerning the
composition near surface regions of the material are provided.
SCANNING ELECTRON MICROSCOPY
(BASIC PRINCIPLE)
• In the SEM, a source of electrons is focused (in vacuum) on the surface of the
specimen.
• As the electrons penetrate the surface, a number of interactions occur that can result in
the emission of electrons or photons from the surface.
• A reasonable fraction of the electrons emitted can be collected by appropriate detectors.
• In this way an image is produced on the cathode –ray tube( CRT); every point that the
beam strikes on the sample is mapped directly onto a corresponding point on the screen.
SCANNING ELECTRON MICROSCOPY
(ANIMATION)
SCANNING ELECTRON MICROSCOPY
DEVICE
SCANNING ELECTRON MICROSCOPY
IMAGE
SCANNING ELECTRON MICROSCOPY
(SAMPLE REQUIREMENTS)
•The specimen is vacuum compatible.
•Conducting samples.
•Insulator samples (coat it with a thin (10-nm) conducting film of
carbon, gold, or some other metal. ( uniform coating).
•Uncoated insulating samples also can be studied by using low
primary beam voltages.
SCANNING ELECTRON MICROSCOPY
(APPLICATIONS)
• A very accurate and precise metrology tool.
• The SEM provides a highly magnified image of the surface of a material.
• Topographical information and information concerning the composition near surface
regions of the material are provided.
• SEM is a useful tool for observing the magnetic domains of ferromagnetic materials,
magnetic tapes, and disk surfaces.
• The SEM to be used in a noncontact way to measure voltages on the surfaces of
semiconductor devices.
SCANNING TUNNELING MICROSCOPY (STM)
(INTRODUCTION)
• STM belongs to a family of Scanning Probe Microscopes (SPMs).
• SPMs are simpler to operate than electron microscopes.
• Because the instruments can operate under ambient conditions, the set-up time can be a
matter of minutes.
• An image can be acquired in less than a minute.
• Because STM measures a quantum-mechanical tunneling current, the tip must be within
a few A◦ of a conducting surface.
SCANNING TUNNELING MICROSCOPY
(BASIC PRINCIPLE)
•Scanning tunneling microscopes use an atomically sharp tip, usually made of tungsten or Pt-Ir.
•When the tip is within a few A◦ of the sample’s surface, and a bias voltage V, is applied between
the sample and the tip, quantum-mechanical tunneling takes place across the gap.
•This tunneling current depends exponentially on the separation between the tip and the sample.
•A single atom on the tip will image the single nearest atom on the sample surface.
•The quality of STM images depends critically on the mechanical and electronic structure of the
tip.
•STM employs a piezoelectric transducer to scan the tip across the sample.
STM (ANIMATION)
STM DEVICE
STM IMAGE
SCANNING TUNNELING MICROSCOPY
(SAMPLE REQUIREMENTS)
• STM requires a conducting surface to establish the tunneling current.
• STM requires solid surfaces that are somewhat rigid; otherwise the probes will deform the
surfaces while scanning.
• Oily or partially anchored dirt will interfere with the conductivity in STM.
SCANNING TUNNELING MICROSCOPY
(APPLICATION)
• Scanning Tunneling Microscopy (STM) can produce
topographic images of a surface with atomic resolution in all
three dimensions. Surfaces can be studied in air, in liquid, or in
ultrahigh vacuum.
SCANNING FORCE MICROSCOPY(SFM)
(INTRODUCTION)
• SFM belongs to a family of Scanning Probe Microscopes (SPMs).
• SPMs are simpler to operate than electron microscopes.
• Because the instruments can operate under ambient conditions, the set-
up time can be a matter of minutes.
• An image can be acquired in less than a minute.
SCANNING FORCE MICROSCOPY
(BASIC PRINCIPLE)
• Scanning force microscopes use a sharp tip mounted on a flexible cantilever.
• When the tip comes within a few A◦ of the sample's surface, repulsive van der
Waals forces between the atoms on the tip and those on the sample cause the
cantilever to deflect.
• The magnitude of the deflection depends on the tip-to-sample distance.
• SFM employs a piezoelectric transducer to scan the tip across the sample and a
feedback loop operates on the scanner to maintain a constant separation between the
tip and the sample.
SFM ( ANIMATION)
SFM DEVICE
SFM IMAGE
SCANNING FORCE MICROSCOPY
(SAMPLE REQUIREMENTS)
• SFM can image surfaces of any conductivity.
• SFM requires solid surfaces that are somewhat rigid; otherwise the
probes will deform the surfaces while scanning.
• Oily or partially anchored dirt will deflect the SFM tip
SCANNING FORCE MICROSCOPY
(APPLICATION)
• Scanning Force Microscopy (SFM) can produce topographic
images of a surface with atomic resolution in all three
dimensions. Surfaces can be studied in air, in liquid, or in
ultrahigh vacuum.
TRANSMISSION ELECTRON MICROSCOPY (TEM)
(INTRODUCTION)
• TEM is an established technique for examining the crystal
structure and the microstructure of materials.
• It is used to study all varieties of solid materials: metals,
ceramics, semiconductors, polymers, and composites.
TRANSMISSION ELECTRON MICROSCOPY
(BASIC PRINCIPLE)
• In TEM, a focused electron beam is incident on a thin sample.
• The signal in TEM is obtained from both undeflected and deflected
electrons that penetrate the sample thickness.
• A series of magnetic lenses at and below the sample position are
responsible for delivering the signal to a detector, usually a fluorescent
screen, a film plate, or a video camera.
TEM (ANIMATION)
TEM DEVICE
TEM IMAGE
TRANSMISSION ELECTRON MICROSCOPY
(SAMPLE REQUIREMENTS)
• Solid conductors and coated insulators.
TRANSMISSION ELECTRON MICROSCOPY
(APPLICATION)
• Atomic structure and microstructural analysis of solid materials,
providing high lateral resolution
CONCLUSION
REFERENCES ( LINKS )
• http://1.droppdf.com/files/MC684/encyclopedia-of-materials-characterization.pdf
• https://earthobservatory.sg/facilities/scanning-electron-microscope-sem-lab
• https://www.thermofisher.com/blog/microscopy/what-is-sem-scanning-electron-microscopy-explained/
• https://www.getnanomaterials.com/ag-100-20-nm/
• https://www.pinterest.com/pin/515310382334443578/
• https://www.pinterest.com/pin/444660163184691564/
• https://www.nanosurf.com/en/products/naiostm-stm-for-nanoeducation
• https://www.spectraresearch.com/product/nanosurf-naioafm-atomic-force-microscope/
• http://www.sciencegl.com/3Dsurf/Shots/nanoparticles/nanoparticles.html
• https://www.slideshare.net/guestc5e21a/principle-of-a-f-s
• https://www.google.com/search?q=tem+microscope&tbm=isch&ved=2ahUKEwi0s9-TteznAhWr2uAKHWsHAnwQ2-cCegQIABAA&oq=TEM&gs_l=i
mg.1.1.0i67l4j0l6.1214560.1215627..1219358...0.0..0.406.935.2-2j0j1......0....1..gws-wiz-img.OA4bRYiDyC4&ei=SexUXvTqK6u1gwfrjojgBw&bih=68
2&biw=1440#imgrc=gsZzhBbEIJnGHM
• https://figshare.com/articles/_Transition_electron_microscopy_TEM_image_of_naked_gold_nanoparticles_/1598926/1
• https://www.google.com/search?q=thank+you+so+much+presentation+images&sxsrf=ALeKk01obRDzRM9-p_zUFuUB7kSU60cfjw:1582632214074&s
ource=lnms&tbm=isch&sa=X&ved=2ahUKEwjO5re31OznAhXJysQBHQSVBVQQ_AUoAXoECAwQAw&biw=1440&bih=731#imgrc=-eOFHPuqKX
GvJM
• https://www.youtube.com/watch?v=uQ1gCIkCbIQ
• https://www.youtube.com/watch?v=HE2yE8SvHmA
• https://www.youtube.com/watch?v=8gCf1sEn0UU
• https://www.youtube.com/watch?v=fQJYuTpK8Fs&t=80s
THE END
