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Seminar

The document discusses the transmission electron microscope (TEM), which uses a beam of electrons to image the internal structure of materials. It describes the key components of a TEM and various types including conventional TEM, high-resolution TEM, cryo-TEM, scanning TEM, and others. TEMs provide incredibly high resolution to study materials and biological structures at the nanoscale and atomic level. While powerful, TEMs also require complex sample preparation and their electron beams can potentially damage sensitive samples.
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0% found this document useful (0 votes)
19 views15 pages

Seminar

The document discusses the transmission electron microscope (TEM), which uses a beam of electrons to image the internal structure of materials. It describes the key components of a TEM and various types including conventional TEM, high-resolution TEM, cryo-TEM, scanning TEM, and others. TEMs provide incredibly high resolution to study materials and biological structures at the nanoscale and atomic level. While powerful, TEMs also require complex sample preparation and their electron beams can potentially damage sensitive samples.
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd

UNIVERSITY VOC COLLEGE OF ENGINEERING

(A Constituent College of Anna University , Chennai )


THOOTHUKUDI CAMPUS - 628008

ME8712 - TECHNICAL SEMINAR PRESENTATION


ABOUT TRANSMISSION ELECTRON MICROSCOPE

NAME : PONSELVAN P
REGISTER NO. : 953220114012
YEAR : IV
BRANCH : MECHANICAL ENGINEERING
INTRODUCTION :

• The transmission electron microscope consists of a series of intricate components


working harmoniously to produce these extraordinary images.
• An electron source generates a stream of high-energy electrons, which is then
manipulated and focused using electromagnetic lenses.
• These lenses guide the electrons through a vacuum system to eliminate
interference, allowing them to interact with the sample on a fundamental level.
• The electrons that successfully traverse the sample are collected and transformed
into an image, revealing the intricate details of the specimen's internal structure.
TYPES OF TRANSMISSION ELECTRON MICROSCOPE :

• Conventional TEM (CTEM)


• High-Resolution TEM (HRTEM)
• Cryo-TEM
• Scanning TEM (STEM)
• Energy-Filtered TEM (EFTEM)
• Electron Diffraction TEM (EDTEM)
• In situ TEM
• Aberration-Corrected TEM
• Environmental TEM (ETEM)
CONVENTIONAL TEM (CTEM) :

• This is the most basic type of TEM. It


produces high-resolution images of thin
sections of specimens, allowing
researchers to observe the internal
structures of materials and biological
samples at the nanometer and even
atomic scale.
• It's suitable for general imaging and
structural analysis
HIGH-RESOLUTION TEM (HRTEM):

• This type of TEM is optimized for


achieving the highest possible resolution in
imaging. It is capable of resolving atomic
lattice structures, defects, and even
individual atoms within a crystal lattice.
• HRTEM is widely used in materials
science and nanotechnology to study the
arrangement of atoms in various materials.
CRYO-TEM :

• Cryogenic Transmission Electron Microscopy


involves imaging samples at extremely low
temperatures, typically below -150°C.
• This helps preserve the native state of biological
samples, such as cells and biomolecules, by
preventing ice crystal formation during imaging.
• Cryo-TEM has revolutionized the study of
biological structures and processes.
SCANNING TEM (STEM):

• Unlike traditional TEM, STEM scans a focused electron


beam across the sample and collects signals, such as
transmitted electrons or emitted X-rays, to generate
images.
• STEM offers advantages in terms of enhanced contrast,
elemental mapping, and higher image resolution.
• It is commonly used for studying nanomaterials and
characterizing complex structures.
ENERGY-FILTERED TEM (EFTEM):

• EFTEM employs an energy-selective electron


imaging technique, allowing researchers to
obtain elemental and chemical information
about a sample.
• By filtering electrons of specific energies before
they reach the detector, EFTEM can create
images that highlight specific elements in a
sample, enabling chemical analysis
ELECTRON DIFFRACTION TEM (EDTEM):

• EDTEM is focused on studying the diffraction patterns


produced by the interaction of the electron beam with
crystalline materials.
• It provides valuable information about the crystal structure,
symmetry, and orientation of materials, contributing to the
field of crystallography.
IN SITU TEM:

• This type of TEM enables the observation of dynamic


processes as they occur in real-time within a controlled
environment.
• In situ TEM is used to study reactions, phase transitions,
and mechanical behaviors of materials under various
conditions, providing insights into their properties and
behavior.
ABERRATION-CORRECTED
TEM:
• Aberration correction technology minimizes imaging
distortions caused by lens imperfections, resulting in
even higher resolution and improved image quality.
• Aberration-corrected TEMs are capable of revealing
finer details and have become essential tools for
advanced research.
ENVIRONMENTAL TEM (ETEM):

• ETEM allows researchers to study materials


and processes under controlled gaseous
environments, such as high temperatures and
pressures.
• This type of TEM is valuable for
understanding how materials behave under
realistic conditions.
ADVANTAGES:

• TEM provides incredibly high resolution, allowing researchers to visualize


structures at the nanometer and even atomic scale. This level of detail is essential
for understanding the arrangement of atoms in materials, characterizing
nanoparticles, and studying cellular organelles.
• TEM can reveal the atomic arrangement within crystalline materials, enabling
scientists to study crystallography, defects, and interfaces at the atomic level. This
information is critical for materials science, nanotechnology, and the design of new
materials with specific properties.
• In the field of biology, TEM has revolutionized our understanding of cellular
structures, organelles, and molecular complexes. It has played a crucial role in
advancing knowledge of cell biology, microbiology, and the interactions of
biological molecules.
DISADVANTAGES :

• Preparing samples for TEM can be time-consuming and technically challenging.


Specimens need to be ultra-thin (typically less than 100 nanometers thick) and
must be carefully handled to avoid artifacts or damage during the preparation
process.
• The high-energy electron beam used in TEM can potentially alter or damage the
sample. This is particularly relevant for biological samples, where the electron
beam can cause radiation damage, artifacts, or structural changes.
• The high-energy electron beam used in TEM can potentially alter or damage the
sample. This is particularly relevant for biological samples, where the electron
beam can cause radiation damage, artifacts, or structural changes.
CONCLUSION :
The Transmission Electron Microscope (TEM) stands as an extraordinary scientific
tool that has profoundly impacted our understanding of the micro and nanoscale
world. Its ability to reveal intricate details of materials, cells, and particles at
resolutions beyond the capabilities of traditional light microscopy has led to
groundbreaking discoveries and advancements in a wide range of scientific
disciplines.
In essence, the Transmission Electron Microscope is not merely a tool of
observation; it is a gateway to a hidden universe that has reshaped our
understanding of matter and life. As we continue to refine and expand its
capabilities, the TEM will undoubtedly play a pivotal role in unraveling the
mysteries of the microscopic world and paving the way for future scientific
breakthroughs.

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