WELCOME
Chapter One
Group-A
Course Title: Method of Experimental Physics
Course Code: PHY-407
Presented to Presented by
Dr. Rahima Nasrin Abdul Hafiz Tamim
Associate Professor Roll: 19PHY006
Department of Physics, University of Barishal Session: 2018-19
OUTLINES
SCANNING ELECTRON MICROSCOPY (SEM)
TRANSMISSION ELECTRON MICROSCOPY (TEM)
Energy Dispersive X-ray
WHAT IS ELECTRON MICROSCOPY?
Electron microscopy is a technique that uses a
beam of electrons instead of light to magnify
objects. It provides much higher resolution
than traditional light microscopy, enabling us
to visualize structures as small as 0.1
nanometers. By studying the interactions
between electrons and the specimen, we can
obtain detailed information about its
composition and morphology.
TYPES OF ELECTRON MICROSCOPY
There are four types of electron microscopy technique but
two types are most popular.
Such as
Scanning electron microscopy (SEM)
Transmission electron microscopy (TEM)
SCANNING ELECTRON MICROSCOPY (SEM)
SEM is a powerful tool for examining the
surface of specimens. It uses a focused
beam of electrons to scan the sample,
generating detailed 3D images with high
resolution. By detecting the secondary
electrons emitted from the surface, SEM
provides valuable information about the
sample's topography and composition.
SCANNING ELECTRON MICROSCOPY (SEM): CONSTRACTION
There are some main part of SEM , such as
Electron Source: SEMs use either
heated tungsten filaments or field
emission sources to generate a focused
electron beam.
Electron Lenses: Electromagnetic
lenses control and focus the electron
beam onto the specimen.
SCANNING ELECTRON MICROSCOPY (SEM): CONSTRACTION
Sample Stage: A specialized stage
facilitates precise specimen positioning
and rotation.
Detectors: Various detectors capture
electron interactions, revealing
topography, composition, and
elemental information.
Vacuum System: High-vacuum
chambers ensure unimpeded electron
travel.
SCANNING ELECTRON MICROSCOPY (SEM): CONSTRACTION
Beam Control: A system directs the
electron beam's trajectory and
scanning patterns.
Imaging System: It processes signals to
create high-resolution images,
controlled through a computer
interface.
SCANNING ELECTRON MICROSCOPY (SEM): WORKING
SEM operates by focusing a beam of
electrons onto a specimen's surface. When
the electrons interact with the specimen,
they generate signals like secondary
electrons and backscattered electrons.
Detectors capture these signals to create
detailed, high-resolution images, providing
information about the specimen's
topography, composition, and more.
TRANSMISSION ELECTRON MICROSCOPY (TEM)
TEM allows us to explore the internal
structure of specimens at an atomic level.
It works by transmitting a beam of
electrons through an ultra-thin sample. By
analyzing the interactions between the
electrons and the specimen, TEM produces
high-resolution images that reveal the
internal structure, such as the
arrangement of atoms and crystal defects.
TRANSMISSION ELECTRON MICROSCOPY (TEM): CONSTRACTION
There are some main part of TEM , such as
Electron Source: TEMs typically use a
tungsten filament or a field emission
gun as an electron source. These
sources emit a beam of high-energy
electrons.
Electron Lenses: Electromagnetic
lenses control and focus the electron
beam onto the specimen.
TRANSMISSION ELECTRON MICROSCOPY (TEM): CONSTRACTION
Sample Holder: The specimen is
mounted on a specialized holder, which
allows for precise positioning and
tilting. It must be ultra-thin (often less
than 100 nanometers thick) to allow
electrons to pass through.
Vacuum System: TEMs operate in a
high-vacuum environment to prevent
electron scattering and ensure electron
beam stability.
TRANSMISSION ELECTRON MICROSCOPY (TEM): CONSTRACTION
Electron Beam Control and Scanning System: This
system controls the trajectory and scanning of the
electron beam as it passes through the specimen.
It determines which areas of the specimen are
imaged.
Electron Detectors: Various detectors capture the
transmitted electrons that pass through the
specimen. The most common detector is the
fluorescent screen or photographic film, which
records the transmitted electrons to create the
final image.
TRANSMISSION ELECTRON MICROSCOPY (TEM): CONSTRACTION
Image Formation and Visualization: The
captured electrons form an image on the
detector, which can be visualized on a screen or
captured digitally.
Control and Imaging System: A computerized
control system allows the operator to adjust
imaging parameters and capture and analyze
TEM images.
TRANSMISSION ELECTRON MICROSCOPY (TEM): WORKING
TEM operates by transmitting a focused
beam of electrons through an ultra-thin
specimen. As electrons pass through the
specimen, they interact with its atoms,
leading to scattering and transmission.
Detectors capture the transmitted
electrons, forming high-resolution images
that reveal the specimen's internal
structure, including details at the atomic
and molecular levels.
Difference between SEM and TEM at a glance
They have difference in their construction and working principle.
SEM TEM
Energy Dispersive X-ray: EDX
Energy Dispersive X-ray: Principles
EDX is an analytical technique that works by
bombarding a specimen with a focused
electron beam from an electron microscope.
When the electrons collide with the specimen,
they dislodge inner-shell electrons from atoms.
As electrons from outer shells fill these
vacancies, they release X-rays with specific
energies. The EDX detector measures the
energies of these X-rays, allowing for the
identification of elements present in the
specimen and quantification of their
concentrations.
Energy Dispersive X-ray: Applications
There is a wide range uses of EDX.
Material Analysis: Identifying elements and
their concentrations in metals, minerals, and
composites.
Environmental Testing: Detecting pollutants and
assessing soil, water, and air quality.
Pharmaceuticals: Ensuring drug purity and
analyzing chemical compounds.
Forensics: Tracing elements in gunshot residues
and crime scene evidence
Energy Dispersive X-ray: Applications
Art and Archaeology: Authenticating artwork
materials and cultural artifacts.
Nanotechnology: Characterizing nanoparticles
and nanomaterials for research and
manufacturing.
Agriculture: Studying soil and plant composition
for agriculture and forestry.
Construction: Quality control of building
materials like concrete and cement.
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