Memory Packaging Challenges - TechSearch
Memory Packaging Challenges - TechSearch
Source: TPSS.
Source: Renesas.
© 2017 TechSearch International, Inc.
Trends for Top PoP Memory Package
Source: eWiseTech.
Source: Amkor.
Source: TPSS.
Source: Samsung.
Source: Infineon.
• Results from radar and camera sensors are fused with vehicle acceleraGon, braking,
and handling systems to avoid and reduce the possibility of accident in advance
• Modules include memory such as EEPROM
• Future systems other applicaGons may use high bandwidth memory (HBM)
• Samsung
– DIMMS for servers
– HBM (DRAM) stacks with TSVs
• SK Hynix Source: SK Hynix.
Source: SK Hynix.
© 2017 TechSearch International, Inc.
AMD’s “Fiji” with Silicon Interposer with TSVs
ASIC
• Large die size: 586 mm²
• Fine pitch: ~40 µm
• High bump count: >200 k
Si Interposer
• Huge die size: 36 mm x 28 mm
• High pad count
• High C4 count: >20 k
High Bandwidth Memory
• TSVs: 65 k; 10 µm diameter
(HBM)
• Die size: 5 x 7 mm
• High bump density: ~5 k
• Small UBM: 25 µm
• Stacked dies: 4 DRAM +
1 Logic
Package
• Organic BGA substrate
• Size: 55 mm x 55 mm
Source: AMD.
Source: Xilinx.