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Chapter 4 Optical Receivers

The document summarizes key concepts in optical receivers discussed in Chapter 4. It describes different types of photodetectors including p-n photodiodes, p-i-n photodiodes, and avalanche photodiodes. It discusses detector responsivity, rise time, bandwidth, and noise mechanisms in receivers. The chapter also covers receiver sensitivity and the minimum received power needed depending on the bit error rate of the system. Finally, it introduces the quantum limit of photodetection.
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0% found this document useful (0 votes)
178 views

Chapter 4 Optical Receivers

The document summarizes key concepts in optical receivers discussed in Chapter 4. It describes different types of photodetectors including p-n photodiodes, p-i-n photodiodes, and avalanche photodiodes. It discusses detector responsivity, rise time, bandwidth, and noise mechanisms in receivers. The chapter also covers receiver sensitivity and the minimum received power needed depending on the bit error rate of the system. Finally, it introduces the quantum limit of photodetection.
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
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Chapter 4

OPTICAL RECEIVERS

Fiber-Optic Communications Systems, Third Edition.


Govind P. Agrawal

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CONTENTS
 Basic Concepts: Detector Responsivity. Rise Time
and Bandwidth
 Common Photodetectors: p–n Photodiodes, p–i–n
Photodiodes, Avalanche Photodiodes
 Receiver Noise: Noise Mechanisms, p–i–n Receivers,
APD Receivers
 Receiver Sensitivity: Bit-Error Rate, Minimum
Received Power
 Quantum Limit of Photodetection

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Principle of PN photodiodes
 Absorbed Light in p-n depletion region
 If (h≥ Eg= Ec - Ev), electrons are pulled up into
the conduction band, leaving holes in their
places in the valance band.
 Apply reverse bias, strong electric field
separates the generated holes and electrons:
holes move to the P-layer and electrons move to
the N-layer.
 These holes and electrons generate a current
flow in a semiconductor are called the carries or
photocurrents Ip.
 This current is collected by an external circuit
(load).

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Principle of PN photodiodes

 For intrinsic absorption, photons can be absorbed if:


hc hc
hv   Eg   
 where:  Eg
– h: Planck’s constant = 6.625. 10-34 (J.s)
– c: speed of light in vacuum = 3.108 (m/s)
– Eg: Energy of band gap (eV)
– cut-off wavelength: hc 1.24
c ( m)  
Eg Eg
– If the wavelength of incident light ≥c the photodiodes not
work.

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Example 4.1

A photodiode is made of GaAs, has the bandgap


energy of 1.43 eV at temperature of 3000K.
Calculate its cut-off wavelength?

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Solution 4.1
hc hc
h   Eg  
 Eg
hc
 C 
Eg
hc 1.24
C [ m]  
Eg Eg [eV ]

hc 1.24 (6.625 1034 j.s)(3 108 m / s)


C [ m]    19
 869nm
Eg Eg [eV ] (1.43eV )(1.6 10 j / eV )

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Typical operation range
of some types of photodiodes

Material Maximum  Typical operating


Band gap (eV)
(nm) range (nm)
1.17 1060 400 – 1060
Silicon (Si)

0.775 1600 600 -1600


Germanium (Ge)

1.424 870 650 – 870


Gallium Arsenide (GaAs)

0.73 1700 900-1700


InGaAs

0.75– 1.35 920– 1650 800 - 1650


InGaAsP

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PD Responsivity

 Example:
– Si Photodiode: R = 0.6A/W at wavelength of 900nm.
– Ge Photodiode: R = 0.45A/W at wavelength of 1300nm
– InGaAs Photodiode: R=0.62A/W at wavelength of 1300nm
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and 0.75A/W at 1500nm 11
Example 4.2

A photodiode has a coefficient of optical-electrical


conversion (responsivity) of 0.65 A/W. If the optical
power level of 10 W, find the photocurrent?

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Solution 4.2

A photodiode has a coefficient of optical-electrical


conversion (responsivity) of 0.65 A/W. If the optical
power level of 10 W, the photocurrent is calcutated
as follows:
Ipq
R 
P0 h
I p  RP0  (0.65 A / W )(105W )  6.5 A

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Example 4.3

A photodiode has quantum efficiency =0.6 that


operates at wavelength  = 0.85 m. Find its
responsivity and find the voltage across the load
RL = 50  if power at the receiver is P0 = 10 W
(assuming the light is completely absorbed).

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Solution 4.3
Ip q q (0.6)(1.6 1019 C )(0.85 106 m)
R     0.4105 A / W
P0 h hc 34
(6.625 10 J .s)(3 10 m / s)
8

I p  RP0  (0.4105 A/W)(10 10 W )  4.1 A


-6

V  RL I P  (50)(4.1106 A)  0.205mV

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P-I-N Photodiodes

 To increase the photon absorption


region , a layer of intrinsic
semiconductor material can be added
betwwen P and N layer.
  can be increased over that of a
simple P-N junction since the
depletion region is almost entirely
contained in the intrinsic region and
the intrinsic can be made long.
 Carrier diffusion effects minimized
since all light absorbed in intrinsic
region

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Avalanche Photodiode (APD)

 APDs internally multiply the primary


photocurrent before it enters to
following circuit.

 In order to carrier multiplication take


place, the photogenerated carriers must
traverse along a high field region.

 In this region, photogenerated electrons


and holes gain enough energy to ionize
bound electrons in VB upon colliding
with them.

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Avalanche Photodiode (APD)

 This multiplication is known as


impact ionization.

 The newly created carriers in the


presence of high electric field
result in more ionization called
avalanche effect.

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Example 4.4

An APD generates the current of 100 nA when the incident


power is 5 nW. Wavelength is equal 1.5 m. Find its RAPD
If the quantum efficiency is equal 0.7, find the multiply
factor M.

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Solution 4.4

Ip 100 109 A
RAPD   9
 20 A / W
P0 5 10 W

q
R APD  M
hc

hc (6.625 1034 J .s)(3 108 m)


M  RAPD  (20 A / W )  23.6
q 19
(0.7)(1,6 10 C )(1.5 10 m)6

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Receiver Sensitivity vs. Bit Rate

10 9
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The end of chapter 4

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