Scribd
Upload
22 views

NP Chart of Unidades Defectuosas: Sample

The document analyzes defect data from 45 samples of Unidades. It shows that the number of defects observed was 33.78% of samples, above the target of 30%. The process capability is 0.338, below the lower control limit of 0. The data indicates the process is producing more defects than expected and is not stable.

Uploaded by

Álvaro Ocampo
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOCX, PDF, TXT or read online on Scribd
22 views

NP Chart of Unidades Defectuosas: Sample

The document analyzes defect data from 45 samples of Unidades. It shows that the number of defects observed was 33.78% of samples, above the target of 30%. The process capability is 0.338, below the lower control limit of 0. The data indicates the process is producing more defects than expected and is not stable.

Uploaded by

Álvaro Ocampo
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOCX, PDF, TXT or read online on Scribd
You are on page 1/ 6

NP Chart of Unidades defectuosas

5
UCL=4.862

2 2
Sample Count

3 3

22 2
2 __
NP=1.689
1.5

0 LCL=0
0

1 5 9 13 17 21 25 29 33 37 41 45
Sample

Binomial Process Capability Analysis of Unidades defectuosas


P C har t Binomial P lot
1.0 U C L=0.972 3
Expected Defectives
P r opor tion

2 2
0.5 22 _
P =0.338 1

0.0 LC L=0 0
1 5 9 13 17 21 25 29 33 37 41 45 0.0 1.5 3.0
Sample O bser ved Defectives

C umulative % Defective H istogr am

S ummary S tats Tar


40 (95.0% confidence) 16
% Defectiv e: 33.78
35
% Defective

12
Fr equency

Low er C I: 27.63
U pper C I: 40.36
30
Target: 30.00 8
P P M Def: 337778
25
Low er C I: 276267 4
U pper C I: 403629
20
P rocess Z: 0.4185 0
0 10 20 30 40 Low er C I: 0.2440 0 10 20 30 40 50 60
Sample U pper C I: 0.5940 % Defective
P Chart of Unidades defectuosas_1
1.0
UCL=0.972

0.8

2 2
0.6 0.6
Proportion

222
0.4 _
P=0.338
0.3

0.2

0.0 LCL=0
0

1 5 9 13 17 21 25 29 33 37 41 45
Sample

Binomial Process Capability Analysis of Unidades defectuosas_1


P C har t Binomial P lot
1.0 U C L=0.972 3
Expected Defectives
P r opor tion

2 2
0.5 22 _
P =0.338 1

0.0 LC L=0 0
1 5 9 13 17 21 25 29 33 37 41 45 0.0 1.5 3.0
Sample O bser ved Defectives

C umulative % Defective H istogr am

S ummary S tats Tar


40 (95.0% confidence) 16
% Defectiv e: 33.78
35
% Defective

12
Fr equency

Low er C I: 27.63
U pper C I: 40.36
30
Target: 30.00 8
P P M Def: 337778
25
Low er C I: 276267 4
U pper C I: 403629
20
P rocess Z: 0.4185 0
0 10 20 30 40 Low er C I: 0.2440 0 10 20 30 40 50 60
Sample U pper C I: 0.5940 % Defective
C Chart of c

6 6
UCL=5.825

4
Sample Count

3 3

2 _
C=1.8

0 LCL=0
0

1 5 9 13 17 21 25 29 33 37 41 45
Sample

C Chart of c

6 6
UCL=5.825

2
4
Sample Count

2
3 3

22 2
2 _
C=1.8

0 LCL=0
0

1 5 9 13 17 21 25 29 33 37 41 45
Sample
Poisson Capability Analysis of c
U C har t P oisson P lot
Sample C ount P er Unit

1.2 U C L=1.165 4.5

Expected Defects
2
0.8 3.0

22 _
0.4 U =0.36 1.5

0.0 LC L=0 0.0


1 5 9 13 17 21 25 29 33 37 41 45 0 2 4
Sample O bser ved Defects

C umulative DP U H istogr am

S ummary S tats Tar


16
(95.0% confidence)
0.4 M ean Def: 1.8000
12

Fr equency
Low er C I: 1.4295
U pper C I: 2.2372
DP U

M ean DP U : 0.3600 8
0.3
Low er C I: 0.2859
U pper C I: 0.4474 4
M in DP U : 0.0000
0.2
M ax DP U : 0.8000 0
0 10 20 30 40 Targ DP U : 0.6000 0.0 0.2 0.4 0.6 0.8
Sample DP U

Chart of Observed and Expected Values


18 Expected
Observed
16

14

12

10
Value

0
c 0 1 2 3 >=4
Chart of Contribution to the Chi-Square Value by Category
1.4

1.2

1.0
Contributed Value

0.8

0.6

0.4

0.2

0.0
2 0 >=4 1 3
c

U Chart of unidad de producción xi

1.2 1.2
UCL=1.165

1.0
Sample Count Per Unit

2
0.8

2
0.6 0.6

222
0.4 _
U=0.36

0.2

0.0 LCL=0
0

1 5 9 13 17 21 25 29 33 37 41 45
Sample
Poisson Capability Analysis of unidad de producción xi
U C har t P oisson P lot
Sample C ount P er Unit

1.2 U C L=1.165 4.5

Expected Defects
2
0.8 3.0

22 _
0.4 U =0.36 1.5

0.0 LC L=0 0.0


1 5 9 13 17 21 25 29 33 37 41 45 0 2 4
Sample O bser ved Defects

C umulative DP U H istogr am

S ummary S tats Tar


16
(95.0% confidence)
0.4 M ean Def: 1.8000
12

Fr equency
Low er C I: 1.4295
U pper C I: 2.2372
DP U

M ean DP U : 0.3600 8
0.3
Low er C I: 0.2859
U pper C I: 0.4474 4
M in DP U : 0.0000
0.2
M ax DP U : 0.8000 0
0 10 20 30 40 Targ DP U : 0.6000 0.0 0.2 0.4 0.6 0.8
Sample DP U

You might also like