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This document provides guidelines for measuring reflectance and transmittance from the International Commission on Illumination (CIE). The CIE is an international organization focused on lighting science and standards. The document describes current measurement methods for regular and diffuse reflectance and transmittance. It aims to provide guidance to CIE members and other interested parties on measurement procedures in the field of light and lighting.

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0% found this document useful (0 votes)
311 views11 pages

Previews Cie130-1998 Pre

This document provides guidelines for measuring reflectance and transmittance from the International Commission on Illumination (CIE). The CIE is an international organization focused on lighting science and standards. The document describes current measurement methods for regular and diffuse reflectance and transmittance. It aims to provide guidance to CIE members and other interested parties on measurement procedures in the field of light and lighting.

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n perez Perez
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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ISBN 978 3 900734 88 6

PRACTICAL METHODS
FOR THE MEASUREMENT
OF REFLECTANCE AND
TRANSMITTANCE
CIE 130-1998
UDC: 535.345.1 Descriptor: Regular transmittance
535.312 Regular reflectance
535.361.1 Diffuse transmittance
535.361.2 Diffuse reflectance
THE INTERNATIONAL COMMISSION ON ILLUMINATION
The International Commission on Illumination (CIE) is an organisation devoted to international co-operation and exchange of
information among its member countries on all matters relating to the art and science of lighting. Its membership consists of
the National Committees in 39 countries and one geographical area and of 11 individual members.
The objectives of the CIE are :
1. To provide an international forum for the discussion of all matters relating to the science, technology and art in the fields
of light and lighting and for the interchange of information in these fields between countries.
2. To develop basic standards and procedures of metrology in the fields of light and lighting.
3. To provide guidance in the application of principles and procedures in the development of international and national
standards in the fields of light and lighting.
4. To prepare and publish standards, reports and other publications concerned with all matters relating to the science,
technology and art in the fields of light and lighting.
5. To maintain liaison and technical interaction with other international organisations concerned with matters related to the
science, technology, standardisation and art in the fields of light and lighting.
The work of the CIE is carried on by eight Divisions each with about 20 Technical Committees. This work covers subjects
ranging from fundamental matters to all types of lighting applications. The standards and technical reports developed by
these international Divisions of the CIE are accepted throughout the world.
A plenary session is held every four years at which the work of the Divisions and Technical Committees is reviewed,
reported and plans are made for the future. The CIE is recognised as the authority on all aspects of light and lighting. As
such it occupies an important position among international organisations.

LA COMMISSION INTERNATIONALE DE L'ECLAIRAGE


La Commission Internationale de l'Eclairage (CIE) est une organisation qui se donne pour but la coopération internationale
et l'échange d'informations entre les Pays membres sur toutes les questions relatives à l'art et à la science de l'éclairage.
Elle est composée de Comités Nationaux représentant 39 pays plus un territoire géographique, et de 11 membres
individuels.
Les objectifs de la CIE sont :
1. De constituer un centre d'étude international pour toute matière relevant de la science, de la technologie et de l'art de la
lumière et de l'éclairage et pour l'échange entre pays d'informations dans ces domaines.
2. D'élaborer des normes et des méthodes de base pour la métrologie dans les domaines de la lumière et de l'éclairage.
3. De donner des directives pour l'application des principes et des méthodes d'élaboration de normes internationales et
nationales dans les domaines de la lumière et de l'éclairage.
4. De préparer et publier des normes, rapports et autres textes, concernant toutes matières relatives à la science, la
technologie et l'art dans les domaines de la lumière et de l'éclairage.
5. De maintenir une liaison et une collaboration technique avec les autres organisations internationales concernées par
des sujets relatifs à la science, la technologie, la normalisation et l'art dans les domaines de la lumière et de l'éclairage.
Les travaux de la CIE sont effectués par 8 Divisions, ayant chacune environ 20 Comités Techniques. Les sujets d'études
s'étendent des questions fondamentales, à tous les types d'applications de l'éclairage. Les normes et les rapports
techniques élaborés par ces Divisions Internationales de la CIE sont reconnus dans le monde entier.
Tous les quatre ans, une Session plénière passe en revue le travail des Divisions et des Comités Techniques, en fait
rapport et établit les projets de travaux pour l'avenir. La CIE est reconnue comme la plus haute autorité en ce qui concerne
tous les aspects de la lumière et de l'éclairage. Elle occupe comme telle une position importante parmi les organisations
internationales.

DIE INTERNATIONALE BELEUCHTUNGSKOMMISSION


Die Internationale Beleuchtungskommission (CIE) ist eine Organisation, die sich der internationalen Zusammenarbeit und
dem Austausch von Informationen zwischen ihren Mitgliedsländern bezüglich der Kunst und Wissenschaft der Lichttechnik
widmet. Die Mitgliedschaft besteht aus den Nationalen Komitees in 39 Ländern und einem geographischen Gebiet und aus
11 persönlichen Mitgliedern.
Die Ziele der CIE sind :
1. Ein internationaler Mittelpunkt für Diskussionen aller Fragen auf dem Gebiet der Wissenschaft, Technik und Kunst der
Lichttechnik und für den Informationsaustausch auf diesen Gebieten zwischen den einzelnen Ländern zu sein.
2. Grundnormen und Verfahren der Meßtechnik auf dem Gebiet der Lichttechnik zu entwickeln.
3. Richtlinien für die Anwendung von Prinzipien und Vorgängen in der Entwicklung internationaler und nationaler Normen
auf dem Gebiet der Lichttechnik zu erstellen.
4. Normen, Berichte und andere Publikationen zu erstellen und zu veröffentlichen, die alle Fragen auf dem Gebiet der
Wissenschaft, Technik und Kunst der Lichttechnik betreffen.
5. Liaison und technische Zusammenarbeit mit anderen internationalen Organisationen zu unterhalten, die mit Fragen der
Wissenschaft, Technik, Normung und Kunst auf dem Gebiet der Lichttechnik zu tun haben.
Die Arbeit der CIE wird in 8 Divisionen, jede mit etwa 20 Technischen Komitees, geleistet. Diese Arbeit betrifft Gebiete mit
grundlegendem Inhalt bis zu allen Arten der Lichtanwendung. Die Normen und Technischen Berichte, die von diesen
international zusammengesetzten Divisionen ausgearbeitet werden, sind von der ganzen Welt anerkannt.
Tagungen werden alle vier Jahre abgehalten, in der die Arbeiten der Divisionen überprüft und berichtet und neue Pläne für
die Zukunft ausgearbeitet werden. Die CIE wird als höchste Autorität für alle Aspekte des Lichtes und der Beleuchtung
angesehen. Auf diese Weise unterhält sie eine bedeutende Stellung unter den internationalen Organisationen.
Published by the

COMMISSION INTERNATIONALE DE L'ECLAIRAGE


CIE Central Bureau
Kegelgasse 27, A-1030 Vienna, AUSTRIA
Tel: +43(01)714 31 87 0, Fax: +43(01)714 31 87 18
e-mail: [email protected]
WWW: http://www.cie.co.at/

 CIE 1998
ISBN 978 3 900 734 88 6

PRACTICAL METHODS
FOR THE MEASUREMENT
OF REFLECTANCE AND
TRANSMITTANCE
CIE 130-1998
UDC: 535.345.1 Descriptor: Regular transmittance
535.312 Regular reflectance
535.361.1 Diffuse transmittance
535.361.2 Diffuse reflectance
CIE 130-1998

This Technical Report has been prepared by CIE Technical Committee 2-14 of Division 2
“Physical measurement of light and radiation” and has been approved by the Board of
Administration of the Commission Internationale de l'Eclairage for study and application. The
document reports on current knowledge and experience within the specific field of light and
lighting described, and is intended to be used by the CIE membership and other interested
parties. It should be noted, however, that the status of this document is advisory and not
mandatory. The latest CIE proceedings or CIE NEWS should be consulted regarding possible
subsequent amendments.

Ce rapport technique a été préparé par le Comité Technique CIE 2-14 de la Division 2
“Mesures physiques de la lumière et des radiations” et a été approuvé par le Bureau
d'Administration de la Commission Internationale de l'Eclairage, pour étude et application. Le
document traite des connaissances courantes et de l'expérience dans le domaine spécifique
indiqué de la lumière et de l'éclairage, et il est établi pour l'usage des membres de la CIE et
autres groupements intéressés. Il faut cependant noter que ce document est indicatif et non
obligatoire. Pour connaître d'éventuels amendements, consulter les plus récents comptes
rendus de la CIE ou le CIE NEWS.

Dieser Technische Bericht ist vom CIE Technischen Komitee 2-14 der Division 2
“Physikalische Messungen von Licht und Strahlung” ausgearbeitet und vom Vorstand der
Commission Internationale de l'Eclairage gebilligt worden. Das Dokument berichtet über den
derzeitigen Stand des Wissens und Erfahrung in dem behandelten Gebiet von Licht und
Beleuchtung; es ist zur Verwendung durch CIE-Mitglieder und durch andere Interessierte
bestimmt. Es sollte jedoch beachtet werden, daß das Dokument eine Empfehlung und keine
Vorschrift ist. Die neuesten CIE-Tagungsberichte oder das CIE NEWS sollten im Hinblick auf
mögliche spätere Änderungen zu Rate gezogen werden.

Any mention of organisations or products does not imply endorsement by the CIE. Whilst
every care has been taken in the compilation of any lists, up to the time of going to press,
these may not be comprehensive.

Toute mention d'organisme ou de produit n'implique pas une préférence de la CIE. Malgré le
soin apporté à la compilation de tous les documents jusqu'à la mise sous presse, ce travail
ne saurait être exhaustif.

Die Erwähnung von Organisationen oder Erzeugnissen bedeutet keine Billigung durch die
CIE. Obgleich große Sorgfalt bei der Erstellung von Verzeichnissen bis zum Zeitpunkt der
Drucklegung angewendet wurde, ist es möglich, daß diese nicht vollständig sind.

 CIE 1998

II
CIE 130-1998

This guide is dedicated to the memory of the late Professor Jürgen Krochmann.

The following members of TC 2-14 "Measurement of Reflectance and Transmittance,


including Turbid Media" took part in the preparation of this Technical Report. The TC comes
under CIE Division 2 "Physical Measurement of Light and Radiation".

J. Krochmann* (Chairman) Germany


P. Polato (Chairman) Italy
F. Geotti-Bianchini Italy
D. Gundlach Germany
J.J. Hsia U.S.A.
L. Morren Belgium
H. Terstiege Germany
J. Verrill Great Britain

* Professor J. Krochmann passed away on 27 January 1991.

III
CIE 130-1998

Table of Contents

Summary ............................................................................................................................... VII


Résumé ................................................................................................................................. VII
Zusammenfassung ............................................................................................................... VIII

1. Scope...................................................................................................................................1
2. Definitions ............................................................................................................................1
2.1 Processes ......................................................................................................................1
2.1.1 Reflection ................................................................................................................1
2.1.2 Transmission ...........................................................................................................1
2.1.3 Absorption ...............................................................................................................2
2.1.4 Regular reflection; specular reflection (Regular transmission; direct transmission) 2
2.1.5 Diffuse reflection (Diffuse transmission) .................................................................2
2.1.6 Mixed reflection (Mixed transmission).....................................................................2
2.1.7 Isotropic diffuse reflection (Isotropic diffuse transmission) .....................................2
2.1.8 Perfect reflecting diffuser (Perfect transmitting diffuser).........................................2
2.1.9 Translucent medium................................................................................................2
2.2 Characteristics ...............................................................................................................2
2.2.1 Reflectance (ρ) (Transmittance (τ)) ........................................................................2
2.2.2 Regular reflectance (ρr) (Regular transmittance (τr))..............................................2
2.2.3 Diffuse reflectance (ρd) (Diffuse transmittance (τd))................................................2
2.2.4 Radiance factor/Luminance factor (β).....................................................................3
2.2.5 Radiance/Luminance coefficient (q)........................................................................3
2.2.6 Absorptance (α) ......................................................................................................3
3. Parameters affecting the characterictics .............................................................................3
3.1 Spectral parameters.......................................................................................................3
3.1.1 Spectral composition of the incident radiation ........................................................3
3.1.2 Integral characteristics ............................................................................................4
3.2 Geometric conditions .....................................................................................................4
3.3 Thin and thick translucent samples ...............................................................................6
3.4 Other parameters...........................................................................................................7
4. Measurement principles ......................................................................................................7
4.1 Absolute and relative methods ......................................................................................7
4.2 Spectral and integral characteristics..............................................................................7
4.2.1 Spectral method ......................................................................................................7
4.2.2 Integral method .......................................................................................................7
4.2.3 Photometer, radiometer, spectroradiometer ...........................................................8
4.3 Spatial evaluation...........................................................................................................8
4.3.1 Gonioradiometers/goniophotometers......................................................................8
4.3.2 Practical methods....................................................................................................8
4.3.2.1 Methods using an integrating sphere ..................................................................8
4.3.2.2 Directional methods .............................................................................................8
5. Measuring equipment ..........................................................................................................9
5.1 Components...................................................................................................................9
5.2 Equipment for irradiation................................................................................................9
5.2.1 Single and double beam .........................................................................................9
5.2.2 Geometric conditions ............................................................................................10
5.2.3 Spectral conditions ................................................................................................10
5.2.4 Polarization............................................................................................................10
5.2.5 Lamps....................................................................................................................11
5.3 Equipment for detection ...............................................................................................11
5.3.1 Irradiance/illuminance and radiance/luminance measurement ............................11
5.3.2 Radiometer/photometer head ...............................................................................11
5.3.3 Radiometer/photometer ........................................................................................12
5.3.4 Data recording.......................................................................................................12
5.4 Monochromator............................................................................................................12

6. Integrating sphere..............................................................................................................13

IV
CIE 130-1998

6.1 Measurment principles.................................................................................................13


6.2 Sphere theory ..............................................................................................................13
6.3 Substitution and comparison methods ........................................................................14
6.4 Sphere coating.............................................................................................................14
6.5 Sphere geometry .........................................................................................................15
6.5.1 Diameters of the sphere and sample port.............................................................15
6.5.2 Ports ......................................................................................................................16
6.5.3 Radiometer/photometer head ...............................................................................18
6.5.3.1 Irradiance/illuminance measurement.................................................................18
6.5.3.2 Radiance/luminance measurement ...................................................................19
6.5.4 Auxiliary lamp/auxiliary screen..............................................................................19
6.5.5 Additional observations on sphere geometry........................................................20
7. Measurement of reflection characteristics using a sphere radiometer/photometer ..........21
7.1 Reflectance for directionally incident radiation ............................................................21
7.1.1 Introduction............................................................................................................21
7.1.2 Equipment for irradiation .......................................................................................21
7.1.3 Sphere geometry...................................................................................................21
7.1.3.1 Thin samples .....................................................................................................21
7.1.3.1.1 Near-normal incidence.............................................................................21
7.1.3.1.2 Other angles of incidence ........................................................................22
7.1.3.2 Thick translucent samples .................................................................................22
7.1.3.2.1 Near normal incidence .............................................................................22
7.1.3.2.2 Other angles of incidence ........................................................................22
7.1.4 Reflectance standards ..........................................................................................23
7.1.5 Measurements and calculations ...........................................................................24
7.1.5.1 Thin samples .....................................................................................................24
7.1.5.2 Thick translucent samples .................................................................................24
7.1.6 Corrections in the case of mixed reflection ...........................................................25
7.2 Diffuse reflectance .......................................................................................................26
7.2.1 Samples with diffuse reflection only ......................................................................26
7.2.2 Samples with mixed reflection...............................................................................26
7.2.3 Diffuse reflectance standards................................................................................26
7.2.4 Measurements and calculations ...........................................................................27
7.2.4.1 Thin samples .....................................................................................................27
7.2.4.2 Thick translucent samples .................................................................................28
7.3 Reflectance for hemispherical irradiation ....................................................................28
7.3.1 Surface reflecting materials...................................................................................28
7.3.1.1 Integrating sphere method.................................................................................28
7.3.1.2 Diffuse reflectance standards ............................................................................30
7.3.1.3 Measurements and calculations ........................................................................30
7.3.2 Thick translucent samples.....................................................................................30
7.3.2.1 Principle .............................................................................................................30
7.3.2.2 Measurements and calculations ........................................................................30
8. Measurement of transmission characteristics using a sphere radiometer/photometer ....31
8.1 Transmittance for directionally incident radiation ........................................................31
8.1.1 Absolute methods..................................................................................................31
8.1.2 Integrating sphere method ....................................................................................31
8.1.2.1 Sphere with small sample port ..........................................................................31
8.1.2.2 Sphere with large sample port...........................................................................32
8.1.2.3 Measurement of transmittance as a function of the angle of incidence ............33
8.1.3 Transmittance standards.......................................................................................33
8.1.4 Measurements and calculations ...........................................................................34
8.1.4.1 Small sample port ..............................................................................................34
8.1.4.2 Large sample port..............................................................................................34
8.1.5 Corrections in the case of mixed transmission .....................................................35

8.2 Diffuse transmittance ...................................................................................................37


8.2.1 Samples with diffuse transmission only ................................................................37
8.2.2 Samples with mixed transmission .........................................................................37

V
CIE 130-1998

8.2.3 Measurements and calculations ...........................................................................37


8.3 Transmittance for hemispherical irradiation.................................................................38
8.3.1 Equipment for irradiation .......................................................................................38
8.3.2 Integrating sphere method ....................................................................................39
8.3.3 Measurements and calculations ...........................................................................39
8.3.4 Calculation of τdif from measured values of τ(ε)....................................................40
9. Measurement of regular reflectance..................................................................................41
9.1 Samples with regular reflectance only.........................................................................41
9.1.1 Integrating sphere method ....................................................................................41
9.1.2 Illuminance ratio method .......................................................................................41
9.1.2.1 Absolute method................................................................................................41
9.1.2.1.1 Method with double reflection (V-W method) ..........................................41
9.1.2.1.2 Goniometric method.................................................................................42
9.1.2.2 Relative method .................................................................................................43
9.2 Samples with mixed reflection .....................................................................................45
9.2.1 Luminance ratio method........................................................................................45
9.2.1.1 Relative method .................................................................................................45
9.2.1.2 Goniometric method ..........................................................................................45
9.2.2 Integrating sphere method ....................................................................................45
10. Measurement of regular transmittance ...........................................................................46
10.1 Samples with regular transmittance only...................................................................46
10.1.1 Integrating sphere method ..................................................................................46
10.1.2 Illuminance ratio method .....................................................................................46
10.2 Samples with mixed transmittance ............................................................................47
10.2.1 Luminance ratio method......................................................................................47
10.2.2 Integrating sphere method ..................................................................................48
11. Measurement of absorptance..........................................................................................48
11.1 4π method ..................................................................................................................48
11.2 Calculation from reflectance and transmittance ........................................................49
12. Measurement of radiance/luminance factor and radiance/luminance coefficient ...........49
12.1 Radiance/luminance factor ........................................................................................49
12.1.1 Measurement geometry..........................................................................................49
12.1.2 Measurement with directional irradiation and observation..................................50
12.1.3 Measurement with diffuse irradiation and normal observation ...........................51
12.1.4 Standards for radiance/luminance factor............................................................52
12.2 Radiance/luminance coefficient .................................................................................52
13. Sources of error and corrections .....................................................................................52
13.1 General ......................................................................................................................52
13.2 Absolute and relative methods ..................................................................................52
13.3 Integral or spectral determinations ............................................................................53
13.3.1 Possible sources of error in detectors.................................................................53
13.3.2 Possible additional sources of error with integral detectors ...............................53
13.3.3 Possible additional sources of error with spectroradiometers ............................54
13.4 Geometrical considerations .......................................................................................54
13.4.1 Methods using an integrating sphere..................................................................54
13.4.2 Methods without an integrating sphere ...............................................................55
14. Characterization of the measuring equipment ................................................................55
14.1 Measurable quantities and required reference materials ..........................................55
14.2 Equipment for irradiation............................................................................................55
14.3 Monochromator..........................................................................................................56
14.4 Integrating sphere ......................................................................................................56
14.5 Detector .....................................................................................................................56
14.6 Further information.....................................................................................................56
15. Bibliography.....................................................................................................................57

VI
CIE 130-1998

PRACTICAL METHODS FOR THE MEASUREMENT OF REFLECTANCE AND


TRANSMITTANCE

SUMMARY
The characteristics of materials related to their reflection and transmission properties are
defined in accordance with the International Lighting Vocabulary and other relevant CIE
publications.
The parameters affecting these characteristics and the principles of measurement involved,
which are the same whether the measurement is made in terms of spectral or weighted (e.g.
luminous) characteristics, are specified.
Methods, using an integrating sphere, are recommended for the measurement of
- reflectance for directional ρ, ρ(ε) and hemispherical ρdif incidence of radiation,
- diffuse reflectance ρd,
- transmittance for directional τ, τ(ε) and hemispherical τdif incidence of radiation,
- diffuse transmittance τd.
Specific methods are also recommended for the measurement of
- regular reflectance ρr,
- regular transmittance τr,
- radiance/luminance factor β (radiance/luminance coefficient q).
The absorptance α can either be measured directly or calculated from the measured values
of reflectance and transmittance. Both procedures are described.
The principal measurement errors are examined and, where possible, methods for their
elimination indicated.

METHODES PRATIQUES DE MESURE DES FACTEURS DE REFLEXION ET DE


TRANSMISSION

RESUME
Les caractéristiques des matériaux qui se réfèrent à leurs propriétés de réflexion et de
transmission des rayonnements optiques sont définies en conformité avec le Vocabulaire
International de l’Eclairage et autres publications de la CIE sur le même sujet.
Les paramètres pouvant affecter les caractéristiques susdites et les principes de mesure sont
spécifiés, ces principes étant les mêmes qu’il s’agisse de mesures de caractéristiques
spectrales ou intégrales (lumineuses par exemple).
Des méthodes de mesure faisant usage d’une sphère intégratrice sont recommandées pour
les déterminations
- du facteur de réflexion sous incidence directionnelle ρ, ρ(ε) et hémisphériques ρdif,
- du facteur de réflexion diffuse ρd,
- du facteur de transmission sous incidence directionnelle τ, τ(ε) et hémisphériques
τdif,
- du facteur de transmission diffuse τd.
Des méthodes de mesure particulières sont recommandées pour les déterminations
- du facteur de réflexion régulière ρr,
- du facteur de transmission régulière τr,
- du facteur de luminance β (ou du coefficient de luminance q), ces grandeurs
pouvant être énergétiques ou lumineuses.

VII
CIE 130-1998

Le facteur d’absorption α peut être mesuré directement ou calculé à partir des mesures des
facteurs de réflexion et de transmission. Les deux procédures sont décrites.
Les erreurs de mesure les plus importantes et, dans la mesure du possible, des méthodes
pour les éliminer, sont indiquées.

PRAKTISCHE METHODEN FÜR REFLEXIONS- UND TRANSMISSIONSMESSUNGEN

ZUSAMMENFASSUNG
Die Eigenschaften von Materialien in bezug auf ihre Reflexion und Transmission werden in
Übereinstimmung mit dem Internationalen Wörterbuch der Lichttechnik und den
entsprechenden CIE Publikationen definiert.
Es werden die Parameter, die diese Eigenschaften und Meßverfahren beeinflussen,
angegeben, wobei die Verfahren zur Messung der spektralen und integralen (z.B.
lichttechnischen) Eigenschaften gleich sind.
Meßmethoden, die eine Ulbricht-Kugel benutzen, werden empfohlen für
- Reflexionsgrad bei gerichtetem, ρ, ρ(ε) und diffusem ρdif Strahlungseinfall,
- Grad der gestreuten Reflexion ρd,
- Transmissionsgrad bei gerichtetem τ, τ(ε) und diffusem τdif Strahlungseinfall,
- Grad der diffusen Transmission τd.
Spezielle Meßmethoden werden empfohlen für
- Grad der gerichteten Reflexion ρr,
- Grad der gerichteten Transmission τr,
- Strahldichte/Leuchtdichtefaktor β (Strahldichte/Leuchtdichtekoeffizient q).
Der Absorptionsgrad α kann entweder direkt gemessen werden oder aus den gemessenen
Reflexions- und Transmissionsgraden errechnet werden. Beide Verfahren werden
beschrieben.
Es werden auch die häufigsten Meßfehler und, so weit wie möglich, Methoden zu ihrer
Beseitigung angeführt.

VIII
CIE 130-1998

1. SCOPE
The CIE has published four Technical Reports which are basic documents for this
Publication:
- International Lighting Vocabulary [1];
- Radiometric and Photometric Characteristics of Materials and their Measurement [2];
- Absolute Methods for Reflection Measurements [3];
- A Review of Publications on Properties and Reflection Values of Material Reflection
Standards [4].
The reflection and transmission properties of materials in the wavelength range of
optical radiation, particularly light, are important in many fields. This report deals mainly with
the wavelength range 200 nm < λ < 3 000 nm. These properties are characterized by
reflectance and transmittance with their regular and diffuse components, and
radiance/luminance factor.
Different methods are described in the literature for the measurement of these
characteristics and the results may differ according to the method used. It is, therefore,
necessary to standardize one or more methods for the measurement of each defined
quantity, designed to keep systematic errors as small as possible. This is the only way to
ensure that the results of measurements, obtained with different instruments are comparable.
This CIE Technical Report sets out to define recommended methods for measuring
the most important characteristics of reflection and transmission in industrial laboratories and
to describe both the measurement geometry and the radiometric/photometric specification of
the equipment used for irradiation and detection.
Absolute measurements of diffuse reflectance and measurements of the
gonioradiometric/goniophotometric properties of materials are outside the scope of this
publication. They are the subject of the work of other CIE Technical Committees.
Measurements on retroreflecting materials are also not treated here [5] and only a
few brief notes, for guidance, are given on luminescent materials [2].

2. DEFINITIONS
The definitions relating to materials which are given in this Technical Report apply to optical
radiation and particularly to visible radiation. The characteristics used for the description of
these properties are generally expressed in terms of radiant, luminous or spectral quantities,
but can also relate to other spectral weighting functions (see 3.1.2).
The definitions given here are taken from the International Lighting Vocabulary [1].
Where additional explanatory notes not in the ILV have been added, these are indicated by
an asterisk *.

2.1 Processes

2.1.1 Reflection
Process by which radiation is returned by a surface or a medium, without change of
frequency of its monochromatic components.
Note 1: Part of the radiation falling on a medium is reflected at the surface of the medium
(surface reflection); another part may be scattered back from the interior of the
medium (volume reflection).
Note 2: The frequency is unchanged only if there is no Doppler effect due to the motion of
the materials from which the radiation is returned.

2.1.2 Transmission
Passage of radiation through a medium without change of frequency of its monochromatic
components.

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