APS012 APPLICATION NOTE

PRODUCTION TESTS FOR DW1000-

BASED PRODUCTS

Typical production tests that

should be applied to DW1000-
based products

Version 1.6

This document is subject to change without

notice

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Decawave Limited. No reproduction is permitted without prior express written permission of the
author
APS012: Production tests for DW1000-based products

Table of Contents
LIST OF TABLES ................................................................................................................................................ 3
LIST OF FIGURES............................................................................................................................................... 3
1 OVERVIEW ............................................................................................................................................... 5
1.1 INTRODUCTION ........................................................................................................................................... 5
1.2 GENERAL TEST SCOPE.................................................................................................................................... 5
2 TEST ENVIRONMENT ................................................................................................................................6
2.1 TEST SETUP OVERVIEW .................................................................................................................................. 6
2.2 CALIBRATING THE TEST SETUP ......................................................................................................................... 8
2.2.1 Overview ......................................................................................................................................... 8
2.2.2 DW1000 reference test board (RTB) ............................................................................................... 8
2.2.3 Calibrating the transmit path losses from the DUT to the spectrum analyser ............................... 9
2.2.3.1 Components of the path loss ...................................................................................................................... 9
2.2.3.2 Measuring the path loss .............................................................................................................................. 9
2.2.3.3 Obtaining a calibrated source ................................................................................................................... 10
2.2.4 Calibrating the receive path losses from the RTB to the DUT ....................................................... 11
2.2.5 Determining the antenna delay of the test setup using the two-way ranging method ................ 14
2.2.5.1 Step 1: Free space measurements ............................................................................................................ 14
2.2.5.2 Step 2: Measurements in the test setup ................................................................................................... 15

3 PRODUCTION TESTS ............................................................................................................................... 17

3.1 OVERVIEW ............................................................................................................................................... 17
3.2 OPERATIONAL TESTS .................................................................................................................................. 18
3.2.1 Tests Summary .............................................................................................................................. 18
3.3 DUT OPTIMIZATION ................................................................................................................................... 19
3.3.1 Crystal trim optimization .............................................................................................................. 19
3.3.1.1 Test applicability ....................................................................................................................................... 19
3.3.1.2 Test summary ............................................................................................................................................ 19
3.3.1.3 Test description ......................................................................................................................................... 19
3.3.1.4 DUT configuration ..................................................................................................................................... 20
3.3.1.5 Procedure .................................................................................................................................................. 20
3.3.1.6 Test limits .................................................................................................................................................. 20
3.3.1.7 Alternative method ................................................................................................................................... 21
3.3.2 Transmit spectrum optimization ................................................................................................... 21
3.3.2.1 Test applicability ....................................................................................................................................... 21
3.3.2.2 Test summary ............................................................................................................................................ 22
3.3.2.3 Test description ......................................................................................................................................... 22
3.3.2.4 DUT configuration ..................................................................................................................................... 23
3.3.2.5 Procedure .................................................................................................................................................. 23
3.3.2.6 Test limits .................................................................................................................................................. 24
3.3.2.7 Calibration for Smart Tx Power operation ................................................................................................ 25
3.4 SYSTEM TESTS ........................................................................................................................................... 27
3.4.1 Receiver sensitivity tests ............................................................................................................... 27
3.4.1.1 Test applicability ....................................................................................................................................... 27
3.4.1.2 Test summary ............................................................................................................................................ 27
3.4.1.3 Test description ......................................................................................................................................... 27
3.4.1.4 DUT configuration ..................................................................................................................................... 28
3.4.1.5 Procedure .................................................................................................................................................. 29
3.4.1.6 Reading statistics and calculating the frame receive rate ......................................................................... 29
3.4.1.7 Test limits .................................................................................................................................................. 30
3.4.2 DUT antenna delay calibration using two-way ranging (TWR) .................................................... 31
3.4.2.1 Test applicability ....................................................................................................................................... 31
3.4.2.2 Test summary ............................................................................................................................................ 31
3.4.2.3 Test description ......................................................................................................................................... 31
3.4.2.4 DUT configuration ..................................................................................................................................... 32
3.4.2.5 Procedure .................................................................................................................................................. 32
3.4.2.6 Test limits .................................................................................................................................................. 33

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4 REFERENCES ........................................................................................................................................... 35
5 DOCUMENT HISTORY ............................................................................................................................. 35
6 MAJOR CHANGES ................................................................................................................................... 35
7 FURTHER INFORMATION ........................................................................................................................ 36
8 APPENDIX A: TX POWER SPECTRAL LIMITS ............................................................................................. 37
9 APPENDIX B: CONFIGURE DW1000 IN RECEIVER MODE USING API ........................................................ 38
10 APPENDIX C: CONFIGURE DW1000 IN TRANSMIT MODE USING API ................................................... 39
11 APPENDIX D: CLEARING AND READING STATISTICS REGISTER USING API ........................................... 40
11.1 CLEARING ................................................................................................................................................. 40
11.2 READING .................................................................................................................................................. 40
12 APPENDIX E: ONE-TIME-PROGRAMMABLE (OTP) MEMORY MAP ....................................................... 41

LIST OF TABLES

Table 1: Test setup – general conditions ............................................................................................................... 6

Table 2: Suggested test equipment ........................................................................................................................ 7
Table 3: Measurements related to losses in the test setup ................................................................................... 8
Table 4: Measurements related to the antenna delay in the test setup ................................................................ 8
Table 5: Separation distance used for step 1 calibration ..................................................................................... 15
Table 6: Summary list of production tests ............................................................................................................ 17
Table 7: Production tests prior to checking / calibrating the transmitter and receiver ....................................... 18
Table 8: Production tests – crystal trim ................................................................................................................ 19
Table 9: DUT configuration for crystal trim test ................................................................................................... 20
Table 10: Crystal trim test limits ........................................................................................................................... 21
Table 11: Alternative crystal trim method test limits ........................................................................................... 21
Table 12: Production tests – transmit spectrum test ........................................................................................... 22
Table 13: DUT configuration for transmit spectrum test ..................................................................................... 23
Table 14: Transmit spectrum test limits ............................................................................................................... 25
Table 15: Receiver sensitivity test summary ........................................................................................................ 27
Table 16: DUT configuration for receiver sensitivity test ..................................................................................... 28
Table 17: Receiver sensitivity limits ...................................................................................................................... 30
Table 18: Product tests – DUT antenna delay calibration using TWR .................................................................. 31
Table 19: DUT configuration for antenna delay calibration ................................................................................. 32
Table 20: Two-way ranging test limits .................................................................................................................. 33
Table 21: Table of references .............................................................................................................................. 35
Table 22: Document History ................................................................................................................................ 35
Table 23: EU (left) & FCC (right) mask limits......................................................................................................... 37

LIST OF FIGURES

Figure 1: Customer product test setup block diagram .......................................................................................... 7

Figure 2: Identification of DUT test setup transmit path losses ............................................................................. 9
Figure 3: DUT test setup transmit path loss measurement .................................................................................... 9
Figure 4: DUT test setup transmit path loss measurement procedure ............................................................... 10
Figure 5: Identification of DUT receive path losses .............................................................................................. 11
Figure 6: DUT receive path loss measurement setup ........................................................................................... 12
Figure 7: Receive path loss measurement procedure .......................................................................................... 13
Figure 8: Two-way ranging calibration block diagram for step 1 ......................................................................... 14
Figure 9: Test setup for antenna delay measurement using two-way ranging – step 2 ...................................... 15
Figure 10: Using two-way ranging to determine the antenna delay of the test setup........................................ 16
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APS012: Production tests for DW1000-based products

Figure 11: Crystal trim test setup block diagram ................................................................................................. 20

Figure 12: Transmit spectrum test setup block diagram ...................................................................................... 23
Figure 13: DUT transmit power calibration procedure......................................................................................... 24
Figure 14: Receiver sensitivity test setup block diagram ..................................................................................... 28
Figure 15: Receiver sensitivity test procedure..................................................................................................... 29
Figure 16: Two-way ranging test setup block diagram ........................................................................................ 31
Figure 17: DUT antenna delay calibration using TWR .......................................................................................... 33
Figure 18: OTP memory map ................................................................................................................................ 42

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APS012: Production tests for DW1000-based products

1 OVERVIEW
1.1 Introduction
This document is intended to be used as a guide for the production testing of DW1000-based
products. The tests suggested in this document refer only to tests associated with DW1000; you will
need to include additional tests to cover the other aspects of your product’s functionality.

The tests can be reduced or edited depending on the particular DW1000 use case.

1.2 General test scope

These tests assume the main active component in the product is the DW1000 IC. This IC is delivered
pre-tested however a number of product tests are required to ensure that the product is assembled
correctly.

For some tests the product also needs to be calibrated for correct operation and to ensure that FCC,
EU or other spectral mask regulations are met.

Calibration data can be programmed into non-volatile memory (OTP) on the DW1000 IC as part of
your production test or into off-chip non-volatile memory (NVM) so that firmware in the DUT can
subsequently access it and use it to configure the DW1000 during product operation.

For brevity throughout this document it is assumed that calibration data is programmed into
the DW1000 OTP.

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2 TEST ENVIRONMENT
2.1 Test setup overview
Table 1 below shows the general test conditions.

Table 1: Test setup – general conditions

Item Condition Value Units

Test voltage
Note: you should use the nominal voltage that is intended to be
1 used in your product during its normal operation. You should 2.8 – 3.6 V DC
record the actual voltage used during test because some
calibration parameters vary with supply voltage as detailed in
[1].
Voltage for programming calibration data into on-chip non-
volatile memory.
Note: this is required to program the DW1000 on-chip OTP
2 memory. If your product design does not support this voltage 3.7 to 3.9 V DC
then calibration data recorded during the tests in section 3.3
below will need to be stored in some other non-volatile
memory in your product
Test temperature
Should be
Note: you should record the temperature of the DW1000 recorded
3 during test using the on-chip ADC and store the resulting value °C
and stored
in OTP. Some calibration parameters vary with temperature as in OTP
detailed in [1].

Figure 1 below shows the test set up for testing DW1000-based products. The diagram assumes that
the product contains an integral antenna i.e. there is no RF connector and therefore the product must
be tested in an over-the-air (OTA) test set up.

Typically this setup consists of an RF absorber-lined screened box in which the Device-Under-Test
(DUT) and the test antenna are installed at a known distance apart.

If the DUT does have an RF connector, a coax cable should be used to directly connect the DUT to
the RF Switch – the test setup will need to be calibrated in this configuration.

This setup allows three different test modes: -

• DUT tests, where the RF section on the DUT is not used.

• DUT transmitter tests, where the DUT is connected via the RF switch to the spectrum
analyzer so that the transmit output of the DUT can be observed, measured and adjusted.
• DUT receiver tests, where the DUT is connected via the RF switch to the Reference Test
Board (RTB) so that a known signal can be provided to the DUT and the signal observed by
the DUT can be analyzed

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RF TEST ENCLOSURE

Test RF from DUT Spectrum GPIB / LAN etc.

SPI Antenna Analyzer
DUT
with
integral
antenna RF Switch
I/O TEST

RF to DUT Programmable GPIB / LAN etc.

Attenuator
Power to DUT

RF to DUT

Power Supply
GPIB / LAN
etc.. Reference Test SPI
Board

GPIB / LAN etc.

PC Test Controller

Figure 1: Customer product test setup block diagram

The following is a list of suggested test equipment. Where particular manufacturers’ equipment is
suggested, equipment with similar specifications should be perfectly acceptable.

Table 2: Suggested test equipment

Item Test Equipment Comment

Any supply capable of providing the required voltage and current
1 Programmable Power Supply
and which supports remote control over GPIB / LAN etc.
Any GPIB controller with the requisite number of ports and which
2 GPIB Controller
is compatible with the other equipment being used is acceptable
3 RF Switch e.g. Mini Circuits USB-1SPDT-A18 or similar
Any analyser with the appropriate frequency range and an RMS
4 Spectrum Analyser
detector is acceptable.
e.g. Agilent 11713A controller / Agilent 8495H 70 dB attenuator /
5 Programmable Attenuator
Agilent 8494 11dB attenuator

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2.2 Calibrating the test setup

2.2.1 Overview

In general, test setup calibration should be regularly carried out until such time as the test setup is
proven to be stable; thereafter the calibration interval can be extended.

Tests requiring the test setup to be calibrated fall into two categories: -

1. Those that deal with absolute power levels transmitted or received by the DUT (e.g. transmit
power level optimization / receiver sensitivity)
2. Those that deal with calibrating the antenna delay of the DUT (e.g. if your product is intended
to be used in or as a location system or range measurement device and you have decided
that antenna delay calibration is necessary to achieve the accuracy you require in your
application – see [5] for a detailed discussion on this topic).

Table 3: Measurements related to losses in the test setup

If you intend performing this test in Then the test setup needs to be measured for:
production: - -
Losses between the DUT and the spectrum
DUT transmit spectrum optimization
analyser
Losses between the Reference Test Board (RTB)
DUT receiver sensitivity tests
and the DUT

Table 4: Measurements related to the antenna delay in the test setup

If you intend calibrating: - Then: -

The “Calibration Distance” of the test setup needs
DUT antenna delay
to be determined.

2.2.2 DW1000 reference test board (RTB)

Any test in which the DUT needs to receive a calibrated UWB signal requires the use of an RTB. This
RTB needs to capable of being connected to the test setup via coax cable.

Decawave uses its own EVB1000, correctly calibrated using a spectrum analyzer, as an RTB for in-
house testing.

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2.2.3 Calibrating the transmit path losses from the DUT to the spectrum analyser

2.2.3.1 Components of the path loss

This section describes the method used to calibrate the losses in the transmit path from the DUT to
the spectrum analyzer such that the observed measurement at the spectrum analyzer can be
corrected for the path loss to give the actual transmit signal from the DUT.

Gain / loss
in test
Antenna
Loss in
DUT free space
with between Loss in coax Spectrum
integral DUT and Loss in coax interconnect Analyser
antenna test interconnect
antenna

Loss
through
RF switch

Need to determine the total loss in this path for all frequencies of interest

Figure 2: Identification of DUT test setup transmit path losses

The transmit power observed at the spectrum analyzer, PSA, is given by: -

PSA = PDUT – PATH LOSS

PSA = PDUT – (LFREESPACE – LTA – LI1 – LRFSW – LI2) or;

PDUT = PSA + (LFREESPACE + LTA + LI1 + LRFSW + LI2)

Where: -

PDUT = actual signal power transmitted by DUT

LFREESPACE = attenuation in free space between the DUT antenna and the test setup antenna
LTA = loss in the test antenna. If the test antenna has any gain this need to be subtracted
LI1, 2 = losses in the coax interconnect
LRFSW = loss in the RF switch

2.2.3.2 Measuring the path loss

Received
Known power
power
transmitted
measured
here
here

Calibrated
source with Spectrum
known output Analyser
power

Known distance

Unknown path loss

Figure 3: DUT test setup transmit path loss measurement

Calibrating the test setup involves inserting a DUT that has been previously calibrated in an anechoic
chamber and whose radiated output power is known.

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By observing the power measured at the spectrum analyzer and knowing the power transmitted by
the calibrated source, the path loss can be determined by subtraction.

It is important to perform this calibration for all UWB channel frequencies and values of PRF intended
to be used in your final product since the path loss will vary depending on frequency and PRF.

These path loss figures should be recorded for subsequent use in production testing.

The flowchart in Figure 4 below describes the measurement procedure.

2.2.3.3 Obtaining a calibrated source

A DUT should be calibrated in an anechoic chamber in a calibrated measurement setup. Once

calibrated there it can be used as a “golden unit” to calibrate the test setup.

START

Setup test / apply

power

Configure RF switch to
connect test antenna
to SA

Power up calibrated
source

Measure signal power

at SA

Record difference as
path loss for this
frequency

NO Select next channel

All frequencies
frequency on
done?
calibrated source

YES

COMPLETE

Figure 4: DUT test setup transmit path loss measurement procedure

It is recommended that the transmit path loss of the test setup be calibrated at regular intervals and it
must be carried out if any part of the transmit path in the test setup is replaced or modified.

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2.2.4 Calibrating the receive path losses from the RTB to the DUT

This section describes the method used to calibrate the loss in the receive path from the RTB to the
DUT such that the received signal level at the DUT can be determined for a given transmit signal level
from the RTB.
Gain / loss
in test
antenna Loss in
Loss in
DUT free space attenuator when
with between set to 0dB
integral DUT and Loss in coax
antenna test interconnect Reference
Loss in coax Loss in coax
antenna Attenuator Test
interconnect interconnect
Board
Loss
through
RF switch

Need to determine the total loss in this path for all frequencies of interest

Figure 5: Identification of DUT receive path losses

The receive signal power observed at the DUT, PRDUT, is given by: -

PRDUT = PRTB – PATH LOSS

PRDUT = PRTB – (LI1 + LATT + LI2 + LRFSW + LI3 + LTA + LFREESPACE)

Where: -

PRDUT = signal power received at DUT

PRTB = signal power transmitted by reference test board
LI1, 2, 3 = losses in the coax interconnect
LATT = losses in the attenuator
LRFSW = losses in the RF switch
LTA = losses in the test antenna. If the test antenna has any gain this needs to be
subtracted
LFREESPACE = attenuation in free space between the test setup antenna and the DUT antenna

Calibration involves the physical substitution of the DUT with a calibrated measurement setup. A
spectrum analyzer is connected to an antenna of the same type as that used in the DUT (or to an
antenna whose performance has been correlated with the DUT antenna) via coax interconnect whose
loss is known at the frequencies of interest.

The RTB is configured to transmit a known signal power and the power received at the spectrum
analyzer is measured and adjusted for gain / loss in the calibrated antenna and coax interconnect to
give the actual received power.

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Power received at
Received
antenna derived
power
from measured Known power
measured
power and known transmitted
here
losses here
Calibrated
antenna

Spectrum
Analyzer
Reference
Attenuator Test
Board
Coax with known Known distance
loss at
frequencies of
interest
Unknown path loss

Figure 6: DUT receive path loss measurement setup

The difference between the signal power received at the calibrated antenna and the power
transmitted by the reference test board is the path loss.

It is important to perform this calibration for all UWB channel frequencies and values of PRF intended
to be used in your product since the path loss will vary depending on frequency and PRF.

These path loss figures should be recorded for subsequent use in production testing.

The flowchart in Figure 7 below describes the measurement procedure.

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APS012: Production tests for DW1000-based products

START

Setup test

Configure RF switch to
connect RTB to test
antenna

Configure in-line
attenuator to 0 dB

Power up RTB

Measure signal power

at SA

Record difference as
path loss for this
frequency

NO Select next channel

All frequencies
frequency on
done?
calibrated source

YES

COMPLETE

Figure 7: Receive path loss measurement procedure

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APS012: Production tests for DW1000-based products

It is recommended that the receive path loss of the test setup be calibrated at regular intervals and it
must be carried out if any part of the receive path in the test setup is replaced or modified.

2.2.5 Determining the antenna delay of the test setup using the two-way ranging
method

Two-way ranging (TWR) between two DW1000-based units determines the time of flight between the
two units by exchanging messages, noting transmit and receive times and using an algorithm to
remove turn-around times at each node. TWR can be used to derive the delay in the test setup.

Calibrating the test setup involves two steps as follows: -

• Step 1: Two-way ranging is performed between a DUT and the RTB in free space, outside
the test setup. The units are separated by a known distance and the antenna delay of the
DUT is adjusted until the reported distance is correct. The units are now correctly calibrated to
report ranging measurements

• Step 2: The DUT and RTB are then inserted into the test setup and the process repeated.
The reported distance, which will be larger than the actual separation between the test
antenna and the DUT, reflects the fact that the test setup introduces some additional delay.
This difference in the reported distance should be noted as the “calibration distance” of the
test setup.

The test setup can now be used for production testing. During production testing of DUTs the distance
reported using two-way ranging with the DUT should be adjusted by this “calibration distance”. The
antenna delay in the DUT can then be adjusted to give the correct distance measurement thereby
correctly calibrating the antenna delay in the DUT.

It is recommended that the antenna delay of the test setup be calibrated at regular intervals and it
must be carried out if any element of the path between the RTB and the DUT is replaced or modified.

2.2.5.1 Step 1: Free space measurements

Known separation distance

Test
Antenna
DUT
with Reference Test
integral Board
antenna

PC Test PC Test
Controller Controller

Figure 8: Two-way ranging calibration block diagram for step 1

The separation distances used in the free space measurements must take account of sources of error
in two-way-ranging. See [3] for a detailed treatment of ranging accuracy vs. received signal level and
range bias. The range bias correction as applied in the DUT must be accounted for in the calibration
process. In Table 5 below, the distances given are the points at which the range bias correction is
chosen to be zero in the configuration described.

Table 5 below shows the separation distance used between the two DW1000 devices for this step 1.
These distances are based on Decawave’s EVB1000 and they assume: -

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APS012: Production tests for DW1000-based products

• A 1 dB loss between the RF port on the DW1000 and free space (i.e. a 1 dB RF circuitry loss
and a 0 dBi antenna gain).
• The radiated power from both nodes is at the regulatory limit of -41.3 dBm / MHz

If your design has different losses or uses an antenna with different gain then please refer to [3] for a
more detailed discussion of this topic.

Table 5: Separation distance used for step 1 calibration

Channel PRF Distance (m)

16 14.75
1
64 9.3
16 12.9
2
64 8.1
3 16 11.5
64 7.2
16 8.7
4
64 8.7
16 7.9
5
64 5.0
16 5.3
7
64 5.3

2.2.5.2 Step 2: Measurements in the test setup

Step 2 puts the DUT and RTB from step 1 into the test setup.

NOT USED IN THIS TEST

RF TEST ENCLOSURE

Test RF from DUT Spectrum GPIB / LAN etc.

SPI Antenna Analyzer
DUT
with
integral
antenna RF Switch
I/O TEST

RF to DUT Programmable GPIB / LAN etc.

Attenuator
Power to DUT

RF to DUT

Power Supply
GPIB / LAN
etc. Reference Test SPI
Board

GPIB / LAN etc.

PC Test Controller

Figure 9: Test setup for antenna delay measurement using two-way ranging – step 2
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The flowchart in Figure 10 below describes this two-step process.

START START STEP 2

Setup Step 2.
Setup step 1 / apply Configure DUT as
power “Anchor” / RTB as
“Tag”

Perform TWR using

antenna delay from
Configure DUT as
step 1
“Anchor” / Configure
RTB as “Tag”

Record reported
distance as
“Calibrated Distance”
See Two Way (CD)
Ranging
Perform TWR
Application
Note

NO All channels of
interest measured?

Is reported distance NO Adjust antenna delay

same as actual distance? in both devices
YES

Reduce antenna COMPLETE

YES delay to increase
reported distance

Record Antenna Delay

STEP 1 COMPLETE

Figure 10: Using two-way ranging to determine the antenna delay of the test setup

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APS012: Production tests for DW1000-based products

3 PRODUCTION TESTS
3.1 Overview
The full list of production tests described in this document is shown in the table below. The selection
of which tests to run depends on the intended application of the DW1000 product. For example if you
are not using GPIO lines in your application then there is no need to test their functionality.

Table 6: Summary list of production tests

Test Test Name Test Summary Test Setup Mode

Idle mode Apply supply voltage to product
1.1 DUT Only
current Measure supply current after 10 ms
1.2 SPI test Read the DW1000 device ID DUT Only
Use SPI commands to run GPIO strobe routing
GPIO strobe
1.3 Verify that all GPIO, IRQ and SYNC lines are DUT Only
test
asserted correctly.
Check that the RSTn line goes high after power
1.4 RSTn test DUT Only
is applied.
Use SPI commands to set the DUT into SLEEP
mode.
1.5 WAKEUP test DUT Only
Assert WAKEUP pin to bring device out of
SLEEP.
Check that the EXTON line goes high after
1.6 EXTON test DUT Only
power is applied.
Configure the DUT to output a CW test mode
signal. DUT connected to
Adjust the DUT crystal trim register until the Spectrum Analyzer
2.1 Crystal trim
output signal is as close to the chosen carrier or frequency
frequency as possible. counter
Program the adjust crystal trim value into OTP.
Configure the DUT to repeatedly transmit
frames.
Channel Adjust transmit power until transmit spectrum DUT connected to
2.2-2.3
spectrum meets spectral regulations. Spectrum Analyzer
Program adjusted transmit power values into
OTP.
Configure DUT to receive mode and Reference
3.1 Test Board to transmit mode. DUT connected to
Receiver
Reference Test
sensitivity Transmit frames and check the receive rate for Board
different receive signal power levels.
Antenna delay Configure DUT to Anchor mode and Reference
Test Board as Tag mode. DUT connected to
calibration using
3.2 Reference Test
two-way Check reported distances to ensure correct Board
ranging operation.

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3.2 Operational Tests

3.2.1 Tests Summary

Table 7: Production tests prior to checking / calibrating the transmitter and receiver

Test Test Name Test Description Limits Test Applicability Comments

These limits depend on
Min 10 mA what other circuitry is in
Idle mode current Apply supply voltage to product and measure Recommended on a
1.1 your product and the
consumption current after 10 ms Max 25 mA per-DUT basis
supply voltage you are
using during test
Recommended on a
1.2 SPI test Run SPI Test Pass / Fail
per-DUT basis
These limits depend on
Min 100 mA what other circuitry is in
Current Recommended on a
1.3 Configure DUT as transmit or receive your product and the
consumption Max 150 mA per-DUT basis
supply voltage you are
using during test
Use SPI commands to run GPIO strobe routing. GPIO, IRQ and SYNC Only necessary if you
1.6 GPIO strobe test Verify that all GPIO, IRQ and SYNC lines are lines go high then low are using these signals
asserted as requested in your product
Check that the reset line goes high after power is Recommended on a Wait 5 ms after
1.7 RSTn test Reset line goes high
applied per-DUT basis applying power

Using SPI commands to DUT set device into Sleep mode current <1 Only necessary if you
Current after WAKEUP
SLEEP mode µA then as per 1.1 are using WAKEUP
1.8 WAKEUP test should be the same as
above when WAKEUP functionality in your
Assert WAKEUP pin to bring device out of sleep Test 1.1 above
asserted product
Only necessary if you
Check that the EXTON line goes high after power are using EXTON Wait 5 ms after
1.9 EXTON test EXTON line goes high
is applied functionality in your applying power
product

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APS012: Production tests for DW1000-based products

3.3 DUT optimization

3.3.1 Crystal trim optimization

3.3.1.1 Test applicability

It is recommended that this test be carried out on a per-DUT basis to maximize range performance
over the lifetime of each unit.

This test is not applicable if your product uses a TCXO, OCXO or is intended to be driven by an
external reference (e.g. an anchor node in an RTLS using wired clock distribution).

3.3.1.2 Test summary

Table 8: Production tests – crystal trim

Test Test Name Test Description Limits Comments

Configure the DUT to output a This test is used to
CW test mode signal on your trim the loading
chosen channel center capacitance on the
frequency. Channel center DUT crystal
2.1 Xtal Trim frequency in MHz oscillator to center
Adjust the DUT crystal trim ± 3 ppm
register until the output signal is the carrier
as close to the channel center frequency. Refer to
frequency as possible. [1].

3.3.1.3 Test description

The crystal trim test setup is shown in Figure 11 below. The DUT is connected to the spectrum
analyzer. The spectrum analyzer allows the frequency of the CW signal from the DUT to be observed.

Note: for the purposes of performing this test you should ensure that your product software provides a
test mode that enables the DW1000 to output a CW signal on your primary operating channel.
Decawave’s software API includes a function to do this.

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APS012: Production tests for DW1000-based products

RF TEST ENCLOSURE

Test RF from DUT Spectrum GPIB / LAN etc.

SPI Antenna Analyzer
DUT
with
integral
antenna RF Switch
I/O TEST
NOT USED IN THIS TEST

RF to DUT Programmable GPIB / LAN etc.

Attenuator
Power to DUT

RF to DUT

Power Supply
GPIB / LAN
etc. Reference Test SPI
Board

GPIB / LAN etc.

PC Test Controller

Figure 11: Crystal trim test setup block diagram

3.3.1.4 DUT configuration

The DUT Configuration for this test is shown in Table 9 below.

Table 9: DUT configuration for crystal trim test

Parameter Setting
Channel Primary operating channel
PRF N/A
Data Rate N/A
Preamble code N/A
Preamble length N/A
Data payload N/A

3.3.1.5 Procedure

You should refer to section 8.1 in [2].

Program the resulting trim value into the on-chip one-time-programmable (OTP) memory in the
location indicated in section12 Appendix E: One-time-programmable (OTP) memory map.

3.3.1.6 Test limits

The test limits for the crystal trim test are shown in the table below.

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APS012: Production tests for DW1000-based products

Table 10: Crystal trim test limits

Limit Name Limit Description Limit Comments

Center Refer to [1]
The frequency of the debug CW signal frequency
Trim_Freq
should be within the limit in MHz
±3 ppm

3.3.1.7 Alternative method

An alternative test method is possible that does not require a spectrum analyzer. This method
configures GPIO0 on the DW1000 to output a divided version of the internal system clock. This clock
signal may be observed using a frequency counter.

To do this, power up in default mode and configure the GPIO0 to output the system clock as follows:-

• Power up in default mode.

• Set bit [7] in register 0x26:00 GPIO_MODE

You should see a 62.4 MHz clock on GPIO0. This is a divided-by-2 version of the internal system
clock.

The crystal trim method is as described above.

Table 11: Alternative crystal trim method test limits

Limit Name Limit Description Limit Comments

62.4
The frequency of the system clock
Trim_Freq MHz ±3 Refer to [1]
signal should be within the limit
ppm

3.3.2 Transmit spectrum optimization

3.3.2.1 Test applicability

During design verification and characterization, you should measure the nominal loss in the RF path
between the DW1000 and the antenna to determine the nominal transmit power value required
from the DW1000 to compensate for this loss.

With the DW1000 configured with this nominal transmit power value, the power radiated from the DUT
antenna will vary between DUTs due to component tolerances etc.

It is strongly recommended that this test be carried out in production on a per-DUT basis to ensure
transmit power is as close to the allowed regulatory limit as possible to maximize range performance
and compensate for any inter-unit variation.

Not doing this test on a per-DUT basis will require the nominal Tx power setting to be “backed-off”
from the regulatory limit to ensure that all units are guaranteed to meet that regulatory limit. This will
result in some loss in performance.

This may be acceptable depending on your intended application and you need to weigh up the cost of
performing this test at manufacturing time vs. the resulting loss in performance for your intended
application.

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APS012: Production tests for DW1000-based products

3.3.2.2 Test summary

Table 12: Production tests – transmit spectrum test

Test Test Name Test Description Limits Comments

Configure DUT to transmit back- Spectrum should Set spectrum
to-back repeated frames on the be within the analyzer to: -
applicable channel(s). appropriate mask Center frequency,
Adjust transmit power until for your Span = 1 GHz,
2.2 Spectrum transmit spectrum meets jurisdiction Sweep time* = 1 s,
spectral regulations. (e.g. FCC and EU VBW = RBW = 1
Program adjusted transmit mask limits –see MHz,
power values into OTP. Appendix 1) Detector = RMS

*it may be possible to reduce the sweep time and speed up this test. As you reduce the sweep time, the measured power
changes. Provided there is good correlation between the power measured at the 1 s sweep time and the power measured at
the faster sweep time and there is always a fixed offset between the two then the test can be carried out at the faster sweep
time and can be adjusted by the fixed offset to give the actual transmit power.

Note: If you are calibrating the DUT before it is mounted in its enclosure you will need to take account
of any attenuation caused by the enclosure. This enclosure attenuation should be measured during
product design so that the transmit power of the DUT can be increased to compensate. It is
recommended that transmit power calibration be done on the final packaged product to ensure
maximum performance.

3.3.2.3 Test description

The DUT transmit spectrum test setup is shown in Figure 12 below. The DUT is connected to the
spectrum analyzer. The spectrum analyzer allows the transmit spectrum to be observed.

The path loss from the DUT to the spectrum analyzer should be calibrated as per section 2.2.3.

RF TEST ENCLOSURE

Test RF from DUT Spectrum GPIB / LAN etc.

SPI Antenna Analyzer
DUT
with
integral
antenna RF Switch
I/O TEST
NOT USED IN THIS TEST

RF to DUT Programmable GPIB / LAN etc.

Attenuator
Power to DUT

RF to DUT

Power Supply
GPIB /
Control Reference Test SPI
Board

GPIB / LAN etc.

PC Test Controller

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APS012: Production tests for DW1000-based products

Figure 12: Transmit spectrum test setup block diagram

3.3.2.4 DUT configuration

The DUT configuration for this test depends on the intended application of the DW1000 product.

Table 13: DUT configuration for transmit spectrum test

Parameter Setting
Each channel on which DUT is
Channel
intended to operate
Each value of PRF intended to be
PRF
used
N/A (assuming back to back repeated
Data Rate
frames)
Preamble code Depends on selected channel
Preamble length Length intended for normal operation
Data payload N/A

Note: For the purposes of performing this test you should ensure that your product software provides
for a test mode that enables the DW1000 to transmit back-to-back repeated frames on each of your
intended operating channels. Decawave’s software API includes a function to do this.

3.3.2.5 Procedure

You should refer to section 8.2 in [2]. The flowchart in Figure 13 describes the procedure.

The DUT is configured with the nominal Tx power value previously determined during design
verification and characterization. The resulting DUT output power is measured and the configured Tx
power value adjusted until the desired limit is reached.

Note for applications using a data rate of 6.81 Mbps, “Smart Tx Power” should be disabled (refer to
[2]). See also section 3.3.2.7.

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APS012: Production tests for DW1000-based products

START

Setup test / apply

power

Test setup NO
Calibrate test setup
calibrated?

YES

See appendix for a

Configure DUT for
description of how to
channel configuration
configure the DW1000
of interest
using the API

See appendix for a

description of how to Set Tx power to
configure the DW1000 approx -41.3 dBm /
transmit power using the MHz
API

Measure power on SA
and correct for
previously measured
test setup path loss

DUT output power NO Adjust Tx power in

= -41.3 dBm / MHz? appropriate direction

YES

Program Tx power
register value into
appropriate OTP
location

All channels of NO
interest calibrated?

YES

COMPLETE

Figure 13: DUT transmit power calibration procedure

As shown in Figure 13, this calibration process needs to be carried out for each of the channels on
which you intend your product to operate.

For each channel, program the resulting transmit power value into the on-chip OTP memory in the
location(s) indicated in section 12 Appendix E: One-time-programmable (OTP) memory map.

3.3.2.6 Test limits

The test limits for the transmit spectrum test are shown in the table below.

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APS012: Production tests for DW1000-based products

Table 14: Transmit spectrum test limits

Limit Name Limit Description Limit Comments

Spectrum should be within the Spectrum As previously noted if you are
appropriate regulatory mask for your should be calibrating the DUT before
intended jurisdiction. within the packaging in its enclosure you
See Appendix 1 for generally appropriate will need to compensate for
Mask_Fit applicable FCC and EU mask limits. mask for any radiated power loss due
Refer to your certification test house or your to the enclosure.
regulatory body for any specific jurisdiction
regulations appropriate to your use
case / application

3.3.2.7 Calibration for Smart Tx Power operation

3.3.2.7.1 Introduction

Refer to [2] for a detailed description of Smart Tx power operation.

This feature allows you to use a higher Tx power in your product than the regulatory limit provided the
frame duration you are using in normal operation is less than 1 ms and a maximum of 1 frame is
transmitted per ms. The increase in allowed Tx power depends on the length of the frame relative to 1
ms.

It is important to distinguish between the automatic and manual modes of Smart Tx power operation: -

• In automatic mode, Smart Tx power applies the appropriate power boost depending on the
frame duration. There are four different power settings: -

o Nominal (No boost)

o Frame duration between 250 and 500 µs – approx. 3dB boost
o Frame duration between 125 and 250 µs – approx. 6 dB boost
o Frame duration less than 125 µs – approx. 9 dB boost

• In manual mode, Smart Tx power applies whatever power boost has been programmed into
its registers and assumes the user has programmed the appropriate value for the frame
duration being transmitted.

When calibrating for either mode, you should first disable the Smart Tx power feature and calibrate
the transmit power as described in 3.3.2.5 above. This establishes a correct baseline for the Tx power
level.

During design verification you should calculate and verify the increase in Tx power relative to the
nominal regulatory limit for the product’s intended geographical region of operation (typically -41.3
dBm / MHz). Knowing these nominal values the DUT can then be calibrated.

The power boosts described are applied automatically based on a small set of frame parameters
rather than the actual frame duration. See the description of Smart Transmit Power Control in [2] to
check the detail of the functionality

3.3.2.7.2 Calibration procedure for automatic Smart Tx power operation

1. Disable Smart Tx power control bit DIS_STXP in Register file: 0x04 – System Configuration by
setting to 1. Note that when using Smart Tx power mode in your application, DIS_STXP will be
set to 0.

2. Configure the DUT for the nominal (-41.3 dBm/ MHz) transmit power case. Follow the procedure
in section 3.3.2.5 and store the resulting register value. This value is the value used in Register
1E:00 bits 7-0 called BOOSTNORM.
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APS012: Production tests for DW1000-based products

3. Configure the DUT for the Tx power for frame durations less than 500 µs (approximately 3 dB
boost). Follow the procedure in section 3.3.2.5 and record the resulting register value. This is the
value to be used in Register 1E:00 bits 15 – 8 called BOOST500.

4. Configure the DUT for the Tx power for frame durations less than 250 µs (approximately 6 dB
boost). Follow the procedure in section 3.3.2.5 and record the resulting register value. This is the
value to be used in Register 1E:00 bits 23 – 16 called BOOST250.

5. Configure the DUT for the Tx power for frame durations less than 125 µs (approximately 9 dB
boost). Follow the procedure in section 3.3.2.5 and record the resulting register value. This is the
value to be used in Register 1E:00 bits 31 – 24 called BOOST125.

6. The values obtained from steps 2 – 5 can then be stored in DW1000 OTP (See section 12
Appendix E: One-time-programmable (OTP) memory map).

Note: If the product uses frames of a fixed duration then depending on that duration one or more of
steps 3-5 can be omitted.

3.3.2.7.3 Calibration procedure for manual Smart TX power operation

In some products it may not be desirable to let DW1000 decide the Tx power boost based on the Tx
frame duration but Smart TX power is still desired.

In this case Manual Smart TX power mode can be used. The calibration procedure is almost the
same as for the automatic mode in section 3.3.2.7.2 above.

1. Disable Smart TX Power Control bit DIS_STXP in Register file: 0x04 –System Configuration by
setting to 1. This will be the setting for normal operation using Smart TX power in manual mode.

2. Configure the DUT for the nominal (-41.3 dBm/ MHz) transmit power case. Follow the procedure
in section 3.3.2.5 and store the resulting register value. This s the value to be used in Register
1E:00 bits 15-8 called TXPOWPHR.

3. Configure the DUT for the required Tx power boost as determined during design time depending
on the Tx frame duration and regulatory limits in the geographical region of product operation.
Follow the procedure in section 3.3.2.5 and store the resulting register value. This is the value to
be used in Register 1E:00 bits 23-16 called TXPOWSD.

4. The values obtained from steps 2 – 3 can then be stored in DW1000 OTP (See section 12
Appendix E: One-time-programmable (OTP) memory map).

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APS012: Production tests for DW1000-based products

3.4 System Tests

3.4.1 Receiver sensitivity tests

3.4.1.1 Test applicability

Receiver sensitivity testing must be carried out at design verification and characterization to verify
that the performance of that design is acceptable.

It should then be run on a per-DUT basis in production to ensure the DUT receiver is operating
correctly.

If the DUT is a transmit-only device then this test is not applicable.

3.4.1.2 Test summary

Table 15: Receiver sensitivity test summary

Test Test Name Test Description Limits Comments

Configure DUT to receive mode. Design
Configure RTB to transmit mode dependent

RX Transmit a fixed number of

3.1 frames and check the receive
Sensitivity
error rate for different receive
signal power levels
Repeat for all relevant channels

3.4.1.3 Test description

The Receiver sensitivity test sweeps the receiver power level at the DUT to determine the lowest
power level at which the DUT correctly receives 90% and 99% of frames transmitted by the RTB.

The test setup is shown in Figure 14 below. The test setup is configured to connect the RTB to the
DUT via the programmable attenuator. The RTB operates as the transmitter. The programmable
attenuator controls the signal level presented to the DUT and is initially set to maximum attenuation.
This attenuation is systematically reduced and the frame receive rate at each attenuation step is
recorded.

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APS012: Production tests for DW1000-based products

NOT USED IN THIS TEST

RF TEST ENCLOSURE

Test RF from DUT Spectrum GPIB / LAN etc.

SPI Antenna Analyzer
DUT
with
integral
antenna RF Switch
I/O TEST

RF to DUT Programmable GPIB / LAN etc.

Attenuator
Power to DUT

RF to DUT

Power Supply
GPIB / LAN
etc. Reference Test SPI
Board

GPIB / LAN etc.

PC Test Controller

Figure 14: Receiver sensitivity test setup block diagram

The RTB, programmable attenuator, interconnect cables and test antenna must be calibrated as per
section 2.2.4 so the signal power level presented to the DUT is known.

3.4.1.4 DUT configuration

The configuration for this test depends on the intended application of the DUT. Refer to Table 16.

Table 16: DUT configuration for receiver sensitivity test

Parameter Setting
Each channel on which the DUT is
Channel
intended to operate
Each value of PRF intended to be
PRF
used
Data Rate Each data rate intended to be used
Preamble code Depends on selected channel
Preamble length Length intended for normal operation
Data payload Length intended for normal operation

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APS012: Production tests for DW1000-based products

3.4.1.5 Procedure

START

Setup test / apply

power

Test setup
Calibrate test setup
calibrated?

See attenuation sweep

Set programmable
section for details on how
attenuator to highest
to determine the
attenuation setting
attenuation sweep

See appendix for a

description of how to
Configure RTB to Tx
configure the DW1000
mode
to transmit mode using
the API

See appendix for a

description of how to Configure DUT to Rx
configure the DW1000 mode with auto-Rx re-
to receive mode using enabe
the API

See appendix for a

description of how to
Clear statistics
Clear the DW1000
registers on DUT
statistics registers using
the API

Transmit min 200

frames from RTB

Read DUT statistics /

Calculate frame rate

Attenuation sweep NO Reduce attenuation by

complete? 1 dB

YES

NO
Result within limits? FAIL

YES

PASS

Figure 15: Receiver sensitivity test procedure

3.4.1.6 Reading statistics and calculating the frame receive rate

The statistics from the DW1000 IC is used to calculate the frame receive rate. See Appendix D for a
discussion of how to read the statistics from the DW1000.
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APS012: Production tests for DW1000-based products

Once the statistics are read from transmitting and receiving DW1000, the frame receive rate is

𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅𝑅
= 𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹𝐹
𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇𝑇

3.4.1.7 Test limits

The Test limits for the receiver sensitivity test are shown in Table 17 below.

Table 17: Receiver sensitivity limits

Limit Name Limit Description Limit Comments

The receive power level should be
equal to or less than the limit value for Design
RSL_99%
correct frame reception of 99% of dependent
transmitted frames
The receive power level should be
equal to or less than the limit value for Design
RSL_90%
correct frame reception of 90% of dependent
transmitted frames

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APS012: Production tests for DW1000-based products

3.4.2 DUT antenna delay calibration using two-way ranging (TWR)

3.4.2.1 Test applicability

At design verification and characterization the nominal value of antenna delay for your design should
be determined by testing over a sufficient sample of units.

During production testing antenna delay calibration may be optionally carried out on a per-DUT basis
to remove any inter-DUT variation and so maximize the achieved ranging accuracy.

You should refer to [5] for a discussion of antenna delay calibration in general, the accuracy that can
be achieved if you do not carry out this calibration step on a per-DUT basis and an explanation of how
to make an RTB.

3.4.2.2 Test summary

Table 18: Product tests – DUT antenna delay calibration using TWR

Number Test Name Test Description Limits Comments

Configure DUT and RTB for Depending on the
operation on applicable Measured range level of accuracy
channel(s). = target ±10 cm required in your
3.2 Ranging application these
Configure DUT to anchor mode
and RTB to Tag mode. Std dev < 4 cm limits may be
Perform Two Way Ranging relaxed

3.4.2.3 Test description

NOT USED IN THIS TEST

RF TEST ENCLOSURE

Test RF from DUT Spectrum GPIB / LAN etc.

SPI Antenna Analyzer
DUT
with
integral
antenna RF Switch
I/O TEST

RF to DUT Programmable GPIB / LAN etc.

Attenuator
Power to DUT

RF to DUT

Power Supply
GPIB /
Control Reference Test SPI
Board

GPIB / LAN etc.

PC Test Controller

Figure 16: Two-way ranging test setup block diagram

The test setup must be calibrated as per 2.2.5 above so that its group delay is known.

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APS012: Production tests for DW1000-based products

3.4.2.4 DUT configuration

The DUT configuration for this test depends on the intended application of the DW1000 product.
Refer to Table 19.

You should configure the DUT for your intended channel(s) of interest and configure the nominal
antenna delay for that channel determined during design time.

Table 19: DUT configuration for antenna delay calibration

Parameter Setting
Each channel on which DUT is
Channel
intended to operate
Each value of PRF intended to be
PRF
used
Data Rate As intended for normal operation
Preamble code Depends on selected channel
Preamble length Length intended for normal operation
As required by the two-way ranging
Data payload
process

3.4.2.5 Procedure

Use Decawave’s DecaRanging software or your own product software to perform two-way ranging.
You should refer to [4] for a discussion on Decawave’s implementation of two-way ranging.

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APS012: Production tests for DW1000-based products

START

Setup Test

Configure DUT for

channel configuration
of interest

Configure default
antenna delay value

Perform TWR
Modify antenna delay
value in DUT

Reported
distance = NO
“Calibrated
Distance”?

YES

Program OTP with

antenna delay value

All channels NO
calibrated?

YES

COMPLETE

Figure 17: DUT antenna delay calibration using TWR

3.4.2.6 Test limits

The test limits for the two-way ranging test are shown in Table 20 below.

Table 20: Two-way ranging test limits

Limit Name Limit Description Limit Comments

The reported distance should be within 10 cm of
Range_Dist
limit target
The standard deviation of the reported
Range_Stddev 4 cm
ranges should be within limit

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APS012: Production tests for DW1000-based products

The limits in Table 20 above are typical limits; depending on your intended application you may
decide that looser test limits are appropriate.

The resulting antenna delay values should be programmed into the on-chip OTP memory in the
locations indicated in section 12 Appendix E: One-time-programmable (OTP) memory map.

When using the stored antenna delay value to program the DW1000, it should be apportioned
between the Tx and Rx antenna delay registers as follows: -

Tx Antenna delay = stored antenna delay * 44%

Rx Antenna delay = stored antenna delay * 56%

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APS012: Production tests for DW1000-based products

4 REFERENCES
Reference is made to the following documents in the course of this application note: -

Table 21: Table of references

Ref Author Version Title

[1] Decawave Current DW1000 Data Sheet
[2] Decawave Current DW1000 User Manual
[3] Decawave Current APS011 Sources of error in TWR
[4] Decawave Current APS013 Two-way ranging implementation with the DW1000
APS014 Antenna delay calibration of DW1000-based
[5] Decawave Current
products & systems

5 DOCUMENT HISTORY
Table 22: Document History

Revision Date Description

1.0 21th November 2012 Initial release for production device.
1.1 31st March 2015 Scheduled update
1.2 31st July 2015 Update to correct bit settings in section 3.3.1.7
st
1.3 31 December 2015 Scheduled update
1.4 30th June 2016 Scheduled update
1.5 1st October 2016 Scheduled update
1.6 1st August 2018 Logo update

6 MAJOR CHANGES
Revision 1.1

Page Change Description

All Update of version number to 1.1 / Copyright notice to 2015
All Various typographical changes
2 Update to table of contents
3 Update to list of tables
6 Correction to OTP programming voltage to be consistent with DW1000 data sheet and user manual
21 Correction to note below Table 12 re spectrum analyzer sweep time
34 Addition of sections 5, 6, Table 22, this table, modification to numbering of section 7

Revision 1.2

Page Change Description

All Update of version number to 1.2
All Various typographical changes
2 Update to table of contents
20 Correction to bit settings to output clock on GPIO0 in section 3.3.1.7
34 Addition of v1.2 to document history Table 22
34 Addition of this table

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APS012: Production tests for DW1000-based products

Revision 1.3

Page Change Description

Front Page Update of version number to 1.3
All Various typographic corrections / Update of copyright notice to 2015
35 Addition of revision 1.3 to revision history Table 22
35 Addition of this table
41 Correction of reference to Figure 18

Revision 1.4

Page Change Description

Front Page Update of version number to 1.4
21 Correction to divided-by-2 system clock value to 62.4 MHz
35 Addition of revision 1.4 to revision history Table 22
36 Addition of this table
Appendix E Update for consistency with DW1000 user manual

Revision 1.5

Page Change Description

Front Page Update of version number to 1.5
All Various typographical corrections
Update procedure for Crystal Trim alternative method
21 • Power up in default mode.
• Set bit [7] in register 0x26:00 GPIO_MODE

Revision 1.6

Page Change Description

Front Page Update of version number to 1.6
All Logo update

7 FURTHER INFORMATION
Decawave develops semiconductors solutions, software, modules, reference designs - that enable
real-time, ultra-accurate, ultra-reliable local area micro-location services. Decawave’s technology
enables an entirely new class of easy to implement, highly secure, intelligent location functionality and
services for IoT and smart consumer products and applications.

For further information on this or any other Decawave product, please refer to our website
www.decawave.com.

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APS012: Production tests for DW1000-based products

8 APPENDIX A: TX POWER SPECTRAL LIMITS

In tables below 0 dBr refers to -41.3 dBm / MHz.

Table 23: EU (left) & FCC (right) mask limits

Freq Max Mean Power Freq

FCC dBr
MHz dBr MHz
- -48.7 - -24
1,600 -48.7 960 -24
1,600 -43.7 1,610 -24
2,700 -43.7 1,610 -12
3,100 -28.7 1,990 -12
3,100 0 1,990 -10
4,800 0 3,100 -10
4,800 -28.7 3,100 0
6,000 -28.7 10,600 0
6,000 0 10,600 -10
8,500 0 11,000 -10
8,500 -23.7
10,600 -23.7
10,600 -43.7
11,000 -43.7

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APS012: Production tests for DW1000-based products

9 APPENDIX B: CONFIGURE DW1000 IN RECEIVER MODE USING API

When using Decawave’s DW1000 driver source code the following API functions can be used to
configure the DW1000 into receive mode. The user should study the current version of the DW1000
Device Driver API Guide available from Decawave and familiarize themselves with individual API
functions.

1. Power on the DUT.

2. Call dwt_initalise function passing relevant parameters, e.g. if reading of OTP saved values is
needed or not

dwt_initialise(DWT_LOADUCODE | DWT_LOADTXCONFIG | DWT_LOADANTDLY |

DWT_LOADXTALTRIM);

3. Setup callback functions for the receive and/or transmit events

dwt_setcallbacks(instance_txcallback, instance_rxcallback);

4. Set up interrupts

dwt_setinterrupt(xxxxxx)

5. Configure the DW1000 with the required parameters for particular channel / PRF etc. settings

dwt_configure()

6. Set the device’s antenna delay

dwt_setrxantennadelay()

7. Set any other receiver features/functions, rx auto re-enable, frame filtering, double-buffering etc.

8. Enable the receiver (with/without delay), if delay is used then need to set delay time first

dwt_setdelayedtrxtime()
dwt_rxenable(delay)

9. Wait for an interrupt event or poll the status register and process the receive event when one
occurs.

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APS012: Production tests for DW1000-based products

10 APPENDIX C: CONFIGURE DW1000 IN TRANSMIT MODE USING API

When using Decawave’s DW1000 driver source code the following API functions can be used to
configure the DW1000 into transmit mode. The user should study the current version of the DW1000
Device Driver API Guide available from Decawave and familiarize themselves with individual API
functions.

1. Power on the DUT.

2. Call dwt_initalise function passing relevant parameters, e.g. if reading of OTP saved values is
needed or not.

dwt_initialise(DWT_LOADUCODE | DWT_LOADTXCONFIG | DWT_LOADANTDLY |

DWT_LOADXTALTRIM);

3. Setup callback functions for receive and / or transmit events.

dwt_setcallbacks(instance_txcallback, instance_rxcallback);

4. Set up interrupts.

dwt_setinterrupt(xxxxxx)

5. Configure the DW1000 with the required parameters for particular channel / PRF etc. settings.

dwt_configure()
dwt_configuretxrf()

6. Set the device’s antenna delay.

dwt_settxantennadelay()

7. Set any other transmitter features / functions, continuous frame, Smart Tx power etc., then write
Tx frame data.

dwt_writetxdata(length, (uint8 *) frame, 0);

dwt_writetxfctrl(length, 0, 0);

8. Start the transmitter (with / without delay), if delay is used then you need to set delay time first.

dwt_setdelayedtrxtime()
dwt_starttx(DWT_START_TX_IMMEDIATE or DWT_START_TX_DELAYED);

9. Either wait for an interrupt event or poll the status register and process the transmit event when
one occurs.

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APS012: Production tests for DW1000-based products

11 APPENDIX D: CLEARING AND READING STATISTICS REGISTER USING API

11.1 Clearing
When using Decawave’s DW1000 driver source code then the following API function can be used to
clear the DW1000 statistics register. The user should study the current version of the DW1000 Device
Driver API Guide available from Decawave and familiarize themselves with individual API functions.

dwt_configeventcounters(1)

11.2 Reading
When using Decawave’s DW1000 driver source code then the following API function can be used to
read the DW1000 statistics register. The user should study the current version of the DW1000 Device
Driver API Guide available from Decawave and familiarize themselves with individual API functions.

dwt_readeventcounters()

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APS012: Production tests for DW1000-based products

12 APPENDIX E: ONE-TIME-PROGRAMMABLE (OTP) MEMORY MAP

The various values determined during the calibration process in 3.3.1 (Crystal Trim), 3.3.2 (Transmit
Spectrum) and 3.4.2 (Antenna delay calibration) should be programmed into the on-chip OTP for
future use. The procedure for programming the OTP is given in [2].

The memory map of the on-chip OTP is shown in Figure 18 below.

The locations assigned to storing the results of the various tests discussed in this document are
highlighted as shown. These are the locations expected by Decawave’s API software. You are not
required to use this memory map provided the device driver software you are using has been
appropriately modified and care is taken not to use any of the Decawave production test locations.

Also, depending on the intended operating channels of your product you may not have calibration
values for all fields.

Test Location highlighted like this

Crystal trim
Transmit power values per channel
Antenna delay values by PRF

Size
Programmed
Address (Used Byte [3] Byte [2] Byte [1] Byte [0]
By
Bytes)
0x000 4
64 bit EUID Customer
0x001 4
0x002 4
Alternative 64bit EUID Customer
0x003 4
0x004 4
LDO Tune DW Prod Test
0x005 4
0x006 4 {“0001,0000,0001”, "CHIP ID 5 nibbles (20 bits)"} DW Prod Test
0x007 4 {“0001” , "LOT ID – 7 nibbles (28 bits)"} DW Prod Test
0x008 2 - - Vbat @ 3.7V Vbat @ 3.3V DW Prod Test
Tmeas @ Ant
0x009 1/1 - - Tmeas@ 23oC Customer / DW Prod Test
Cal
0x00A 4 - Reserved
0x00B 4 - Reserved
0x00C 4 - Reserved
0x00D 4 - Reserved
0x00E 4 - Reserved
0x00F 5 - Reserved
0x010 4 CH1 TX Power Level PRF 16 Customer
0x011 4 CH1 TX Power Level PRF 64 Customer
0x012 4 CH2 TX Power Level PRF 16 Customer
0x013 4 CH2 TX Power Level PRF 64 Customer
0x014 4 CH3 TX Power Level PRF 16 Customer
0x015 4 CH3 TX Power Level PRF 64 Customer
0x016 4 CH4 TX Power Level PRF 16 Customer
0x017 4 CH4 TX Power Level PRF 64 Customer
0x018 4 CH5 TX Power Level PRF 16 Customer
0x019 4 CH5 TX Power Level PRF 64 Customer

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APS012: Production tests for DW1000-based products

Size
Programmed
Address (Used Byte [3] Byte [2] Byte [1] Byte [0]
By
Bytes)
0x01A 4 CH7 TX Power Level PRF 16 Customer
0x01B 4 CH7 TX Power Level PRF 64 Customer
0x01C 4 Tx / Rx Antenna Delay - PRF 64 Tx / Rx Antenna Delay - PRF 16 Customer
0x01D - - - - Customer
0x01E - - OTP Revision XTAL_Trim[4:0] Customer
0x01F - - - - Customer

: : : : : : Reserved

0x400 4 SR Register (See DW1000 User Manual) Customer

Figure 18: OTP memory map

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