Keysight i3070

In-Circuit Test System

Board Test Insight

User Guide
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Contents

1 Using Board Test Insight

Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Board Test Insight Window. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Dashboard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Board Explorer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Board Browser. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Menus and Toolbar . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

2 Debugging in Board Test Insight

Features of Device Test List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Run Options. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Debug Workflow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Verify the Fixture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Multiple-Board Panels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Multiple Board Versions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Macros. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

3 Debugging Pins, Pre-shorts, and Shorts

Debug Pins Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Debug Pre-shorts Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Debug Shorts and Opens Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

4 Debugging Analog In-Circuit Tests

Analog Components That Can Be Tested. . . . . . . . . . . . . . . . . . . . . 40
Change Device Type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Analog In-Circuit Test List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Debug Analog In-Circuit Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Device Test Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Sense . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
On Failure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Guard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Histogram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
MOA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
Measurement Options. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Techniques for Reducing Measurement Errors . . . . . . . . . . . . . . 55

3
 5 Auto Debug and Optimizer for Analog Tests
AutoDebug for Analog Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Customizing AutoDebug Rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Creating a New Rule . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Creating a New Rule Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
AutoDebug Actions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Optimizer for Analog Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Customizing the Optimizer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71

6 Debugging VTEP/TestJet Tests

VTEP/TestJet Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
Debug VTEP Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
AutoDebug for VTEP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Parameters for AutoDebug . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Debug TestJet Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
TestJet Macros . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Pins Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82

7 Debugging Polarity Check & Connect Check Tests

Power the Board . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Debug Polarity Check Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Debug Connect Check Tests. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

8 Debugging Powered Tests

Debug Digital Tests. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Digital Debug Workflow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Debug Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
Test Source. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Debug Boundary-Scan Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
Frame Debugger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
ITL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102
Debug Cover-Extend Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .104
Debug Panel for Cover Extend. . . . . . . . . . . . . . . . . . . . . . . . . .105
Debug Analog Powered Tests. . . . . . . . . . . . . . . . . . . . . . . . . . . . .109
Debug Mixed Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110

4
9 Debugging the Testplan
Features of the Testplan Editor. . . . . . . . . . . . . . . . . . . . . . . . . . . .114
Debug the Testplan. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
Example: Variable Watch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117
Example: Passing Test Parameters . . . . . . . . . . . . . . . . . . . . . .118
Testplan Variables. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119

10 Production Testing
Production Workflow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122

Appendix
BT-Basic Command Line . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .126
Supported BT-Basic Commands . . . . . . . . . . . . . . . . . . . . . . . .127

5
6
Using Board Test Insight

Overview 8
Board Test Insight Window 10
Dashboard 12
Board Explorer 13
Board Browser 14
Menus and Toolbar 18
Using Board Test Insight

Overview
Board Test Insight is used for debugging tests on the i3070 In-Circuit Test systems.
Board Test Insight enables you to quickly run and locate failing tests, then adjust
them so that they pass. The software will:
• execute device tests
• perform statistical analysis on the results
• display the information for you to evaluate
• allow you to modify test parameters and see the results
When you save the changes made during debugging, the debug software
automatically compiles the test source and updates the wirelist and testorder
files.
After debugging device tests, run and debug the testplan. Set breakpoints in the
testplan where further debug is required, and step through to determine the
changes required. Then run Board Test Grader to determine and fine-tune any
marginal tests.
Once the tests pass reliably when running the testplan with a known good board,
the project is ready for production testing.
Board Test Insight can also be used as the Operator interface for production testing.
For details, see Production Testing on page 125.

Launching Board Test Insight

Launch Board Test Insight (BTI) by clicking its icon on the desktop.
The features you can access in Board Test Insight depend on
the user account that you used to log in. The default i3070
user names can be used.
If unable to log in with a Windows user account, make sure
the user account is set up as a member of the
AgilentICTUsers or AgilentICTOperators group. Then log off
and log in again.

8 Board Test Insight

 Using Board Test Insight

Opening a project or file

Board Test Insight provides two options, open a project or open a file.
• Open Project loads the project (board directory). This opens the testplan and
also loads the object files into memory, enabling test execution and debugging.
To open a project, browse to the i3070 board directory and select the testplan.
• Multiple Board Versions
If the board directory supports multiple board versions, the base version is
automatically loaded. To load another version for debugging, select it from
the Version drop-down menu on the toolbar.
• Multiple-board Panels
The individual boards can be selected from the Board drop-down menu on
the toolbar.
• Open File opens individual files for editing only.

Board Test Insight 9

Using Board Test Insight

Board Test Insight Window

In the Board Test Insight window, the main workspace is the test editor for running
and editing the device tests, testplans and other board files. Multiple files can be
opened for editing.

Figure 1 Board Test Insight window showing testplan

Board Outline – Outline of the board or pane. Output Panel – Shows BT-Basic output and print
First Pass Yield – First pass yield together with the statements. Test results appear here, when running tests
number of boards tested and the number that passed. from Test Lists, and running macros.
Worst Probe Report – Reports on probes associated This pane also contains the BT-Basic Command Line.
with test failures. Repair Ticket – Shows details of failing tests from running
Test Explorer – Lists all tests from testorder. the testplan.
Test Execution Queue – Lists tests waiting to be run. Watch – Monitors variables during debugging. Displays the
Macro Explorer – Pre-defined macros. See Macros on value of any variables in the current line of the testplan.
page 35. Call Stack – When testplan debugging pauses at a
Board Explorer – Summary of current board. breakpoint, shows subroutines in the execution stack and
line numbers.
Project Explorer – Lists the files in the project folder.

Show or hide the above panes from the View menu. (To show Project Explorer on the menu, enable it from Settings).

10 Board Test Insight

 Using Board Test Insight

Figure 2 Moving and docking panes

• Drag the title bar to float a pane.
• To dock the pane, drag it onto a docking icon.

When you drag a floating pane

onto another pane, the arrows of
the docking icon indicate where
it will be docked.

Or drag onto one of the

docking icons at the
sides of the window.

Board Test Insight 11

Using Board Test Insight

Dashboard
The Dashboard shows a test summary for the current board, reporting on the
number of tests passed and failed. Click the project name in the Test Explorer to
display the Dashboard.

Figure 3 Dashboard

12 Board Test Insight

 Using Board Test Insight

Board Explorer
The Board Explorer summarizes details of the current board file. The information
cannot be edited.
• In the Board Explorer, select a category to display a list (devices in the example
below).
• Select an item in the Device list to see additional details.
• Right-click on an item and select View in Browser to locate it in the board
graphics (Figure 6).

Figure 4 Board Explorer

Board Test Insight 13

Using Board Test Insight

Board Browser
The Board Browser provides a graphical display of the features on the board and
fixture, and can help you pinpoint the actual location of the device on the board.
From the Tools menu, select Board Browser to open it.

Figure 5 Board Browser

14 Board Test Insight

 Using Board Test Insight

Searching for a Component

1 To search for a component, select a category from the Board Browser toolbar
and enter the search text. The software displays matches as you type.

2 When you select a device, the display automatically zooms in to the device.

Figure 6 Locating a device

Device details
are displayed

Device is highlighted

3 Click an item in the dialog box (a probe in the example) to locate it.

Board Test Insight 15

Using Board Test Insight

Locating a device from a Device List

When viewing devices in a device list (example below), right-click on a device and
select View in Browser to locate that device in the board graphics as shown in
Figure 6.

16 Board Test Insight

 Using Board Test Insight

View component details from Board Browser

• In the Board Browser, place the cursor over any component to show its name.
• Right-click on the component and select Show Device in Table to show it in the
Device List (resistors in this example).
• Right-click and select Show Device Details to display the device details in the
device info dialog box (Figure 6).

View functions in Board Browser

• The Board Browser toolbar provides view functions such as zoom in/out, rotate,
full view, etc.
• Right-click on an empty spot in the board graphics for additional view options.

Board Test Insight 17

Using Board Test Insight

Menus and Toolbar

Table 1 Board Test Insight menus

Option Description
File menu
New Create a new text document.
Open Open File – Opens a file for editing.
Open Project – Loads a project (board directory).
Auto Load When a fixture is loaded and Auto Load selected, the system does the
following:
– acquire testhead
– lock fixture
– read fixture ID
– load testplan based on fixture ID
Auto Unload Does the following:
– acquire testhead
– unlock fixture
Close Project Closes the current project.
Save, Save All, Save As Options to save open files.
Exit Exits Board Test Insight.
Tools menu
Settings Change preferences for Board Test Insight. See Table 2.
Administrator Tools Settings
• Access Rights – Click on a role to assign access rights.
• Launch Menu – Add or remove applications from the Launch menu.
• File Watcher – Monitor the selected file for changes.
Extraction
Copy a project folder (board directory) from one system to another.
• Package – Saves the project folder into a .tar file.
• Extract – Deploys the project to the destination folder.
Macro Record – Start user actions in a macro. Note that this only records what
you type in the testplan. Mouse actions are not recorded.
Stop – Stop recording.
View Macro – Show the list of user-defined macros. Select a macro and
click Run to run it.
Repair Link Repair broken links for panelized boards.

18 Board Test Insight

 Using Board Test Insight

Table 1 Board Test Insight menus (continued)

Option Description
Board Browser Launches the Board Browser, which displays a graphical view of the
current board.
AutoDebug • Analog > Rule Editor – Define rules for auto debugging of analog
tests.
• Cover Extend > Parameter Settings – Set parameters for auto
debugging of Cover Extend tests.
• TestJet/VTEP > Parameter Settings – Set parameters for auto
debugging of TestJet/VTEP tests.
Optimizer Analog > Optimizer Rule Editor – Define rules for the auto optimization
of analog tests.
Safeguard • All – Runs safeguard all.
• None – Runs safeguard none.
Learn • On – Runs learn on.
• Off – Runs learn off.
Vacuum Well • Vacuum A On – Runs faon to turn on vacuum A.
• Vacuum B On – Runs fbon to turn on vacuum B.
(Available for panelized boards.)
• Vacuum Off – Turns off the vacuum.
Vacuum Preferences (For panelized boards) Specify the vacuum port to be activated for each
board, and the auxconnect commands to run.
Auxiliary Auxconnect and auxdisconnect commands for every relay defined in
the system config file.
AuxConnect <n> – Closes relay <n>.
AuxDisconnect <n> – Opens relay <n>.
SpecialAux Commands to declare and control special relays.
Set – Declare an auxiliary relay as “special”.
Clear – Clear the “special” setting for the relay.
Connect – Closes the special relay.
Disconnect – Opens the special relay.

NOTE: To use the above commands, first specify the relay(s) to control
in the file AgilentICT_ROOT\lib\special_aux_set. The syntax
is: special aux set <n>.
For example, enter special aux set 5 in the file to control relay 5.
(This file is not required when executing the special aux commands
from the testplan or BT-Basic window.)

Board Test Insight 19

Using Board Test Insight

Table 1 Board Test Insight menus (continued)

Option Description
Debug menu
Run Run test(s) or testplan.
Debug Debug testplan.
Stop Stop execution.
Step Into Testplan debug functions. See Debug the Testplan on page 120.
Step Over
Step Out
View menu
Open or close panes in the Board Test Insight window.
Launch menu
Launch other board test applications such as Access Consultant and
Pushbutton Debug. An administrator can add or remove applications
from this menu.

Table 2 Application Settings

Option Description
General Enable or disable the following options:
• When application starts, open project/file last worked on.
• When application starts, reload Analog In-Circuit table preferences.
(If you customized the view of the Analog In-Circuit device list, for
example, moved or hid columns, reload the same view.)
• When project loads, load the macro files.
• Show Project Explorer in the View menu. (Board Test Insight must be
restarted for this change to take effect.)
Editor Settings • Choose the colors for syntax highlighting in the Test Editor.
• Enable/disable Smart Suggestion in the Test Editor and command box.
• Select Indent size – Used when the software auto indents commands in
the Test Editor.
Board Browser Choose colors to use in the Board Browser.

20 Board Test Insight

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21
Using Board Test Insight

22 Board Test Insight

Debugging in Board Test
Insight

Features of Device Test List 24

Run Options 27
Debug Workflow 29
Multiple-Board Panels 30
Multiple Board Versions 33
Macros 35

This chapter introduces the features and tools provided to facilitate debugging,
and describes a typical debug workflow in Board Test Insight.
Debugging in Board Test Insight

Features of Device Test List

When a project is loaded, the Test Explorer shows the number of tests for each
device type in the project. When tests are run, the number of failures are also
shown. Selecting a device type displays a Test List (or editor) from which the tests
can be run and debugged. See Figure 8.
The features of the test editor are described below, using resistors as an example.
Many of the features are common to all test types, though not all the features will
be available.

Figure 8 Resistor Test List

2. Select
device

1. Select
device type

Number of tests; number of failures in red 3. View/edit device parameters

(Not described in this overview; see
the chapters for the device types.)

Changing the Display

You can do the following in the device test list:
• Drag a column by the column header to reposition it.
• Click a column header to sort the table by that column.
• Choose the columns to show or hide from the Show Columns list.
• The first column (Test Name) remains in position as you scroll the table
sideways. To freeze additional columns, click the Freeze Column + button.

24 Board Test Insight

 Debugging in Board Test Insight

Editing a Test
• Fields with a white background in the test list can be edited. Click in a field to
edit the value for that test.
• To copy parameter values from one test to another:
a Right-click the test to copy and select Copy All Values.
b Right-click the second test and select Paste All Values.

Saving Changes
Whenever you make changes to a test (using any of the methods outlined here),
User will appear in the Save Testsource column to indicate a user change.
To save changes, make sure you select it and then click Save on the toolbar.

Mass Editing
The mass edit feature lets you apply the same change to multiple tests at once.
1 Select the tests.
You can use the standard Windows selection shortcuts (e.g. Ctrl-a to select all
rows, or Ctrl-click to select multiple rows).
2 Click on the value for any of the tests and make the change.

Click here to
select all tests

3 Press Enter to apply the change to the selected tests.

Board Test Insight 25

Debugging in Board Test Insight

Editing the Test Source

• Click the button next to a test to edit the test statement directly.
Press Enter to apply the changes.

• Or right-click the test and select Open Test Source to edit the test source.
After saving changes, you must select Reload from File to update the Test List.

Exporting the Test Data

An Export button lets you save the test data to a .csv file that you can view without
opening the project file in Board Test Insight.

26 Board Test Insight

 Debugging in Board Test Insight

Run Options
Select tests from a Test List to run them. You can use the standard Shift-click or
Ctrl-click to select multiple rows, or Ctrl-a to select all.
To execute tests, three Run options are provided on the toolbar.
• Run – Run once
• Run N Times – Run N number of times (from 3 to 500)
• Run Till Fail – Run until the first failure occurs
View the progress and test results in the Output Panel. When tests are executed
using Run, the results also appear in the Test Result column in the test list. You can
click the column header to sort the table by test results and show failed tests at the
top.

If the Run buttons on the toolbar are grayed out, try selecting
the test(s) again, or click on the title bar of the Test List or
Device List.

Board Test Insight 27

Debugging in Board Test Insight

The following are standard options in most of the test tables:

• Commented – Lets you comment out the test (e.g. failing tests) so that it is not
run. This is updated in the testplan.
For multiple board versions: When a test is commented, it is updated as skip in
the testorder file.
• Permanent – Marks the test as permanent so that the software does not
change it when regenerating the tests.
• Save Testsource – Changes made to test parameters during debugging are
temporary. Once the test is working properly, make sure this option is selected
and Save to save changes to the test source.
• Remarks – User comments on the test.

28 Board Test Insight

 Debugging in Board Test Insight

Debug Workflow
Before beginning debug, Verify the Fixture.
The following is a typical debug workflow in Board Test Insight.
1 Debug Pins Test
2 Debug Pre-shorts Tests
3 Debug Shorts and Opens Test
4 Debug Analog In-Circuit Tests
5 Debug VTEP/TestJet Tests
6 Debug Polarity Check Tests
7 Debug Connect Check Tests
8 Power the Board
9 Debug Digital Tests
10 Debug Boundary-Scan Tests
11 Debug Cover-Extend Tests
12 Debug Analog Powered Tests
13 Debug Mixed Tests
14 Debug the Testplan
15 Run Board Test Grader to evaluate how well tests are working and determine
fault coverage of the tests.

See the following for additional notes if you are debugging tests for Multiple-Board
Panels and Multiple Board Versions.

Board Test Insight 29

Debugging in Board Test Insight

Multiple-Board Panels
Note the following when running and debugging multiple-board panels.

Viewing panelized board tests

Select the board you want to work on from the Board drop-down list on the toolbar.

Running panelized board tests

When running panelized board tests, you will be prompted to select the board(s).
Select them by clicking the board outlines.

You can view the results in Board Outline as well as Output Panel. In case of failures,
check the Repair Ticket.

30 Board Test Insight

 Debugging in Board Test Insight

Debugging panelized board tests

When debugging tests for panelized boards, remember that one test source file has
links to the same test for all boards of a board type. You can edit the source test and
the change applies to all linked tests; or, you can edit a device test for just one of
the boards, leaving the others unchanged.

Repairing links
If any links between the boards are broken, this is indicated by an N in the Link ID
column.
To repair a link for a test, right-click the test in the Test List. Select Link/Unlink
followed by the test to link to.

When a test is linked to the base version, it will be compiled automatically.

Board Test Insight 31

Debugging in Board Test Insight

Repairing multiple links

1 From the Tools menu, select Repair Link.

2 Select Compile to compile the re-linked tests.

3 Click Link All to repair all links.

32 Board Test Insight

 Debugging in Board Test Insight

Multiple Board Versions

Note the following when running and debugging a board with multiple versions.

Viewing a version of the board

Select the version you want to work on from the Version drop-down list on the
toolbar.

Adding a device to a board version

To add a device from one board version to another, right-click the device. Select
Create New Version followed by the board version to add the device to.

Viewing all versions of a device

To view all versions of a particular device, right-click the device and select View All
Versions.

Board Test Insight 33

Debugging in Board Test Insight

Verify the Fixture

Verify the fixture and wiring.
1 find pins checks the wiring from any point on the fixture or board under test.
a Execute find pins from the command line.

b Hold the guided probe on the point in question, and click Start (F1).
The system finds the connections to this point and lists them on the screen.
c Use F6 to choose between the following:
– Show all dig gnds - lists every connection to a digital ground brc.
– Show one dig gnd - lists only one connection to ground.
d When you finish probing, click Done (F8).
2 Verify all nodes.
a Execute verify all nodes from the command line.

b Click Auto Start (F7) to begin.

c Follow the instructions on the screen to probe nodes and view the results in
the Output panel.

34 Board Test Insight

 Debugging in Board Test Insight

Macros
Table 3 describes the pre-defined i3070 macros available in Board Test Insight. If
you are familiar with the i3070 macros, you can run them from the Macro Explorer.
Results will be displayed in the Output Panel and updated in the Test Explorer.
• Right-click on a folder and select New to create a new macro in that folder.
• Right-click on a macro to select the options that let you run, edit, or delete it.

Table 3 Pre-defined macros

Category Description
Setup Macros Setup macros which are used to set up the testhead, load the testplan,
and do other steps required to execute a section of the testplan. These
macros set up the test environment so you can execute and debug tests.
Testplan Macros Testplan macros which are used to execute a section of the testplan (for
example, Digital Incircuit, Analog Functional).
When a macro is executed, failing tests and repair tickets are
automatically displayed on the screen.
Test Grader Macros Lists Board Test Grader and Test Coverage macros, which are used to
generate reports on the quality of the board test and test coverage.
Quick Report Macros The Generate Quick Report macro evaluates a board directory, identifies
areas where changes could be made to reduce test time, and suggests
strategies to maximize throughput. You can use the information to
determine how to adjust your tests, testplan, and system resources to
reduce test times and increase throughput.

Board Test Insight 35

Debugging in Board Test Insight

36 Board Test Insight

Debugging Pins, Pre-shorts,
and Shorts

Debug Pins Test 38

Debug Pre-shorts Tests 40
Debug Shorts and Opens Test 41

After loading the board, you can use the following testhead controls in Board Test
Insight to begin debugging:
1 Click Fixture Lock on the toolbar.
2 From the Tools menu, select Vacuum Well > Vacuum A On.
3 Click Unpowered on the toolbar.
Debugging Pins, Pre-shorts, and Shorts

Debug Pins Test

The pins test is used to verify that the board under test is contacting the fixture
properly during production testing. A voltage is applied to each node while
grounding all other nodes. If leakage current is found, the test passes; if leakage
current is not found, the test fails.
To debug the pins tests, do the following:
1 In the Test Explorer, select Pins (Figure 9).
2 In the Test List, select pins and click Run on the toolbar to run the pins test.
View the results in the Test Result column.
Note that when you use Run N Times (to check test stability) or Run Till Fail,
the test results only show in the Output Panel.
3 If any open nodes are reported, investigate the problem. Determine if the board
is properly contacting the fixture or if no leakage path from the node exists due
to circuit topology.
4 If the fixture and board are making contact and there is still no leakage current,
you can comment out the node from the pins file.
5 Run the tests again.
6 After all tests are working properly, save the changes using Save.
You can add a report limit <#> statement as the first line in
the pins file to instruct the debug software to stop listing
failures after the specified number. This prevents a very long
report when the entire board is not contacting the fixture.

38 Board Test Insight

 Debugging Pins, Pre-shorts, and Shorts

Figure 9 Pins test

Editing the Test Source

If you want to edit the test source directly, right-click to select Open Test Source.
After saving changes, remember to use Reload from File to update the pins table.

Board Test Insight 39

Debugging Pins, Pre-shorts, and Shorts

Debug Pre-shorts Tests

Pre-shorts tests usually include tests for devices such as potentiometers, jumpers,
and switch settings. These tests are executed first because the position of
potentiometers, jumpers, and switches affect shorts and opens testing.
1 In the Test Explorer, select Analog In-Circuit (Figure 9).
2 In the Test List, select the tests marked preshorts and click Run on the toolbar.
View the results under the Test Result column.
Note that when you use Run N Times (to check test stability) or Run Till Fail,
the test results only show in the Output Panel.
3 Debug the tests.
See Debugging Analog In-Circuit Tests on page 45 for information on the
specific device types.
4 After all tests are working properly, save the changes using Save.

Figure 10 Analog In-Circuit test list showing preshorts

40 Board Test Insight

 Debugging Pins, Pre-shorts, and Shorts

Debug Shorts and Opens Test

Shorts and opens testing checks for opens between nodes that are known to be
shorted, and for shorts between all other nodes.
1 In the Test Explorer, select Shorts (Figure 11).
2 In the Test List, select shorts and choose what information to include in the
shorts report:
• Report Common Devices – Lists all devices connected to two or more nodes
involved in a short or open.
• Report Netlist – Lists all devices and pins connected to each node involved
in a short or open.
• Report Phantoms – Lists all phantom shorts found during shorts testing.
You can also set the Report Limit – the maximum number of failures to report.
This prevents a very long report when the entire board is not contacting the
fixture.
3 Click Run on the toolbar to run the test.
4 Use the failure report to help you modify the test parameters for any failing
tests and run again.
5 After all tests are working properly, save the changes using Save.

Figure 11 Shorts test

Board Test Insight 41

Debugging Pins, Pre-shorts, and Shorts

Table 3-1 Shorts Test List

Column Description
Type Indicates whether this is a short or node test.
Node 1, Node 2 The node or node pair to be tested.
Failure Message The failure message to be printed in the shorts report.
Threshold Resistance value, in ohms, that determines a short or an open.
Settling Time The time to allow transients to settle before taking a measurement.

Adding Nodes or Expected Shorts

• Click the Add button.
• To add a short, select short and select the nodes. Start typing the node
name and select from the list of matching node names.
• To add a node, select node and enter a node name.

When you click OK, the new row is added to the bottom of the table.
• To delete a short or node that was added manually, select it and then click
Delete.
You cannot delete shorts or nodes that were generated by the i3070 In-Circuit
Test Software.

Moving a Node
1 Select the node to be moved and click Mark.
2 Click on the row where you want to insert the node, then click Paste Above or
Paste Below.
Note that you can only move one node at a time. If you select multiple rows,
only the row that you last clicked on will be moved.

42 Board Test Insight

 Debugging Pins, Pre-shorts, and Shorts

Editing the Test Source

If you want to edit the test source directly, right-click to select Open Test Source.
After saving changes, remember to use Reload from File to update the shorts table.

Board Test Insight 43

Debugging Pins, Pre-shorts, and Shorts

44 Board Test Insight

Debugging Analog In-Circuit
Tests

Analog Components That Can Be Tested 46

Debug Analog In-Circuit Tests 50
Device Test Example 52
Measurement Options 59
Debugging Analog In-Circuit Tests

Analog Components That Can Be Tested

Analog in-circuit testing (unpowered) verifies that:
• analog components are properly loaded on the PC board
• component values are within specified tolerances
All the analog in-circuit device tests must pass before power is applied to the board
under test.

Table 4 Analog in-circuit tests

Analog Component Description of Test

Capacitor Measures capacitance from 10 pF to 30,000 uF. Variable capacitors can
be tested using the ad (Adjust) option.
Diode Measures the forward bias voltage of diodes.
FET The FET tests, nfetr and pfetr, measure the on resistance (Ron) of
N-channel and P-channel FETs, respectively. Note that the i3070
In-Circuit Test Software writes in-circuit tests for depletion mode FETs
only.
Fuse Checks for the presence of fuses by measuring the resistance of the
element. The result of the measurement is compared to a threshold to
determine pass or fail.
Inductor Measures inductance from 25 uH to 100 H. Test variable inductors by
including the ad (Adjust) option.
Jumper Checks for the presence or absence of a jumper by measuring its
resistance and comparing the result with the specified threshold.
Potentiometer Measures resistance from 0.1 ohm to 10M ohms.
Resistor Measures resistance from 0.1 ohm to 10M ohms. Variable resistors are
measured by including the ad (Adjust) option.
Switch Checks for open and closed contacts by measuring their resistance and
comparing the result with the specified threshold.
Transistor Two tests are provided for each transistor:
• The two PN junctions of the transistor are tested with diode tests. This
is a fast and reliable way to check for the presence of the device.
• The second test calculates the gain of npn and pnp transistors by
measuring the base current at two different values of emitter current.
The gain test is commented out by the software.
Zener Measures the reverse bias voltage of zeners up to 18 volts. The High
Voltage Zener (HVZ) test measures forward bias voltage above 18 V and
up to 60 V.

46 Board Test Insight

 Debugging Analog In-Circuit Tests

Analog In-Circuit Test List

In the Test Explorer, click Analog In-Circuit to view all analog in-circuit tests for the
board, or select a device type to view the device test list.

Common information and test options provided in the device tables are described
in Table 5 below. Additional columns for each device type show the measurement
options which are briefly explained in Measurement Options on page 59.

Table 5 Analog In-Circuit Test List

Column Description
Test Name Name of the device test.
Device Type The type of device.
Pre Shorts Device tests that need to be run before shorts testing. See Debug
Pre-shorts Tests on page 40.
Save Testsource Accepts modifications to the test. Changes are saved to the test source
files only when this option is selected.
Test Resul t Indicates if the test passed or failed.
Commented Lets you comment out the test.
Version For Multiple Board Versions: Shows the board version in which the test is
saved.
Test Time Time taken to run the test.

Board Test Insight 47

Debugging Analog In-Circuit Tests

Table 5 Analog In-Circuit Test List

Column Description
Measured value The measured value of the device.
Nominal Value The nominal value of the device.
Expected The expected value of the device.
Value/Threshold
Offset The value to compensate for the resistance contributed by the fixture.
Lower Tolerance levels determine whether the test passes or fails.
Tolerance/Limit Lower and upper limits of the device value are calculated based on the
tolerance values.
Upper
Tolerance/Limit
CPK The minimum CPK (process capability index) to be met for the test to be
considered stable.
pf Option Pass/fail parameter.
Remark Lets you add comments on the test.

Learn Capacitor Compensation

To eliminate the capacitance of the fixture and system from the measurement
results, use the capacitance compensation option for capacitors. Typically, small
capacitors up to 100 pF require compensation, because the capacitance of the
fixture and system is significant compared to the value of the device under test.
Before debugging capacitor tests, do the following:
1 In the Capacitor Test List, click the Value column header to sort the table by
capacitor value.
2 Select the low value capacitors and ensure the checkboxes in the Capacitor
Compensation column are selected.
3 Click the Learn Capacitor Compensation button.
The system runs the selected tests without the fixture activated. Since the
board under test is not in contact with the fixture, each measurement result is
the capacitance of the fixture and system only. This is how the system learns
the capacitance compensation value.
When done, the Test Result will show LC Pass.
When the individual capacitors are subsequently tested, the learned value is
subtracted from the result of the measurement before it is compared to the test
limits to decide a pass or fail.

48 Board Test Insight

 Debugging Analog In-Circuit Tests

Change Device Type

This option allows you to quickly make the following device type changes without
having to edit the source files:
• resistor to jumper
• jumper to resistor
1 In the Device list, right-click the device to be changed and select Change
Device Type followed by the target device type. For example:

2 When changing device type from jumper to a resistor, locate the changed
device in the Resistor Test List and enter the relevant values for the device.

3 Ensure the Save Testsource checkbox for the changed device is selected before
saving changes.
Note that a device change will update the testorder file.

Board Test Insight 49

Debugging Analog In-Circuit Tests

Debug Analog In-Circuit Tests

The following is a typical debugging procedure for analog components.
1 Run all unpowered analog tests:
In the Test Explorer, click Analog In-Circuit. Select all tests and click Run on the
toolbar.
Run

2 View failures:
Click the Test Result column header to sort the table and show the failed tests
at the top.
You can:
• run AutoDebug to automatically debug all the failed tests, or
• run AutoDebug on marginal failures only, and debug the other failed tests
manually.
If you run AutoDebug on selected tests and manually debug other tests, the
tests that you run during manual debug will be placed at the front of the test
execution queue.
3 To run AutoDebug on failed tests:
Select the tests and click AutoDebug on the toolbar.
4 To manually debug failed tests:
Check physical board and schematics
Right-click on a failed test and click View in Board Browser button to locate the
device in the board graphics display. The board graphics can help you
determine if the device is not loaded or see board topology problems.
Manually adjust test options and parameters
a Double-click a failed test and use the MOA and Histogram to help evaluate
the test results.
b Modify the test and measurement options or their values to enhance test
performance. See Device Test Example for details.
c Run the test again using AutoDebug or Run on the toolbar.

50 Board Test Insight

 Debugging Analog In-Circuit Tests

d If further fine-tuning is needed, you can:

– adjust the AutoDebug CPK value and run AutoDebug again, or
– adjust the test parameters again and re-test.
(See Customizing AutoDebug Rules on page 66 for information on adjusting
AutoDebug parameters.)
e If the test still fails, comment out the test.
5 Save the changes.
When all tests are working properly, ensure that the Save Testsource option is
selected for the tests you want to save, then click Save on the toolbar.
6 Optional: Run the Optimizer to evaluate and fine-tune analog in-circuit tests in
order to improve throughput. Select the tests, right-click and select Run
Optimizer.
For multiple-board panels, the Optimizer is run on all boards,
even if only some of the boards are currently selected.

(See Customizing the Optimizer on page 77 for information on adjusting the

Optimizer parameters.)

Board Test Insight 51

Debugging Analog In-Circuit Tests

Device Test Example

This section explains the data displayed for analog in-circuit tests, and gives
suggestions for changes during debugging.
1 To change the test and measurement options, click on a value in the Test List
and enter the new value. General test options are described in Table 5; and
Measurement Options for analog tests on page 59.
2 Double-click a device the Test List to view additional options for the test:
• Wiring/Guard
– Measurement
– Sense
– On Failure
– Guard
• Histogram
• MOA

52 Board Test Insight

 Debugging Analog In-Circuit Tests

Measurement
This provides details of the connect statement for the selected device. It shows the
names of the nodes connected to the Source (S) and Input (I) buses.

• Some measurement errors may be solved by swapping the S and I buses. (Click
the Swap button.)
• Minimize current splitting error by placing the S and I buses such that
maximum circuit impedance is between the I and G buses.

Sense
Specify the sensing options for the A and B buses by selecting them from the
drop-down menus. (See Techniques for Reducing Measurement Errors for
information on the errors that can be minimized using these options.)

Remote Sensing
Depending on the measurement accuracy required, remote sensing may be
specified. Remote sensing uses additional wires in the fixture, which must already
be available and included in the wirelist.
1 Click Add Remote Sensing to add remote sensing buses including A , B, and L
buses.

2 Click OK.

Board Test Insight 53

Debugging Analog In-Circuit Tests

On Failure
This specifies the statements to be printed or reported upon failure.

• To add a statement, click Add, then click in the new highlighted line to type the
statement.
• To edit a statement, click in the statement and make the change.
• To remove the statement, click in the statement and click Remove.
The system automatically includes the following in the on failure block:
• If the device under test has devices in parallel, these parallel devices are listed.
• If AutoDebug adjusts the expected value for the device and it differs from the
nominal value, the system inserts the following line in the test source file:
report "<nominal value>"

Guard
A device under test may have one or more parallel impedance paths due to the
circuit topology of the board. These can cause measurement errors by providing
current paths around the device under test.
The G bus is used to guard the device under test by breaking these parallel
impedance paths. Guarding, however, may cause its own measurement errors
(guard offset errors). When needed, the L bus can be used to correct for guard offset
errors. The L bus senses the guard (G bus) directly at the board under test.
The software may specify one of two levels of sensing: remote sensing that requires
extra L bus wires in the fixture, or testhead level sensing that connects the G and L
buses together inside the testhead with no additional wiring needed.
Guard settings for a device (example below) are derived from the following:
• During test generation, the i3070 In-Circuit Test Software determines the
possible guards for a device and recommends the default setting to use. All the
guards will be displayed.
• In addition, one-away guard information is obtained from the board file. Any
device directly connected to the device under test is a possible guard point.

54 Board Test Insight

 Debugging Analog In-Circuit Tests

To enable the guard(s) listed, you can:

• Click the check boxes to specify bus settings for specific guards.
• Click Select All Guards to enable all the guards.
• Click Interactive Guard to see the surrounding circuit of the device under test,
where you can select guard points more easily. See Using Interactive Guard.
Note that only one L or one GL guard can be enabled.
To add a new guard:
• Click Add Guard. Start typing the node name and let the system find and
display matching nodes. Select the node and click OK. (You can also search
using device.pin.)
To disable guard(s):
• Select a guard and click Remove Guard.
• Click Deselect All Guards to disable all the guards.
To view node connections:
• Click the button to view the devices and pins connected to the node, if
available. Details will not be shown for fixed nodes.

Board Test Insight 55

Debugging Analog In-Circuit Tests

Using Interactive Guard

Interactive Guard presents a simplified circuit diagram for the selected device,
using information from the board file.
• The selected device is highlighted in yellow.
• Nominal values are shown for devices, where applicable.
• To zoom in or out, move the cursor over the circuit diagram and turn the scroll
wheel on the mouse.

To add a guard:
1 Move the mouse over a node name where you want to enable a guard, and
right-click to select Add Guard.

2 To change the guard type, double-click on the G(uard) icon to toggle through
the available guard options for this node.
3 Click OK to save. Changes will be updated in the Guard table.
Interactive Guard shows a simplified view and not the full schematics, so in case the
node where you want to add a guard is not shown, return to the Guard table to add
the guard.

56 Board Test Insight

 Debugging Analog In-Circuit Tests

Histogram
The Histogram displays the distribution of measurements for the selected test
when Run N Times is used. (N can be any number from 3 to 500.) Up to eight
histograms are shown when the test is run again.

• The histogram shows the number of measurements that fall within the passing
and failing regions. The red marks are the high and low limits that define the
passing region. Colored bars show the number of measurements in each region.
• The blue cross shows the position of the mean.
• Measurements that fall outside the blue marks on the X-axis are considered
gross failures.
• The statistics calculated from the measurements are shown on the right of the
display.
• The percent passing and total statistics are calculated based on all
measurements. For all other statistics (such as CPK and standard deviation),
gross failures are not included in the calculations. This is an attempt to keep
invalid data from distorting the statistical measures.
• The CPK (process capability index) is an indication of how far the mean value
is from the test limits in units of three standard deviations. This value should
be at least one, and the higher the value the better the test. Note that this
index depends on a normality value of less than one.
• Normality is an indication of the distribution of the data as compared to a
normal distribution. This value should be less than one. If this value is
greater than one, the process capability index may not be valid.

Board Test Insight 57

Debugging Analog In-Circuit Tests

MOA
The MOA display helps in identifying possible measurement problems caused by
circuit topology on the board under test.
The model of the measuring operational amplifier (MOA) circuit shows all
measurement buses being used, and the value of the reference resistor. The display
lists the voltages at the following points:
• at the source
• at the I bus and the A and B buses, if they are used
• across the device under test
• across the reference resistor
• output of the MOA
• MOA mode

58 Board Test Insight

 Debugging Analog In-Circuit Tests

Measurement Options
Table 6 summarizes all the measurement options for the analog in-circuit devices.
Available options depend on the type of device. For detailed information about the
measurement options, refer to Analog Tests: Reference in Analog Testing.

Table 6 Measurement options

Option Name Description

ad Adjust Adjust a variable component before taking a measurement
am Amplitude (V) Sets the amplitude of the source voltage
ar ASRU Range Specifies the ASRU gain range
as ASRU Speedup Directs the system to use ASRU Speedup in executing tests.
co Voltage Compliance Sets the source voltage limit when testing components in the MOA feedback
(constant current configuration). This protects the component under test and the
MOA from damage due to excessive voltage during testing.
comp, Capacitor Specifies whether or not the capacitor test requires compensation.
nocomp Compensation
d wa Detector Wait Causes the detector to wait the specified number of seconds between
measurements when enhancement is used.
ed Extra Digit Directs the system to integrate the measurement over a complete line cycle.
en Enhancement Directs the system to perform an enhanced component test. That is, additional
measurements are made to improve accuracy.
fi Filter Directs the system to take a specified number of readings during a component
test and output the average as the test result. This helps reduce the effects of
system noise.
fr Frequency Sets the frequency of the AC source in Hz.
ico Current Compliance Specifies the current limit when testing components in the MOA input (constant
voltage configuration). This protects the component under test and the MOA from
damage due to excessive current during testing.
idc DC Current Specifies the DC source current.
idel ta Specifies the change in DC current to use when testing npn or pnp transistors.
interval Interval Specifies the interval between samples when testing capacitors in DC mode.
of DC Offset Selects a DC offset voltage for an AC source.
op Opposite Causes the expected result of a test to be reversed.
pf Pass/fail option Instructs the component measuring statements to set a return variable (if one is
specified) to 1 for pass, and to 0 for fail, instead of the measured value result. The
actual measured value is reported.

Board Test Insight 59

Debugging Analog In-Circuit Tests

Table 6 Measurement options (continued)

Option Name Description

pm Parallel Mode Selects the parallel mode for capacitor and inductor tests
re Reference Selects the reference resistor for the MOA feedback loop
sm Serial Mode Selects the serial mode for capacitor and inductor tests.
wa Wait Specifies a wait interval, in seconds, between applying a stimulus and taking a
reading. This is useful to allow the source to settle when testing reactive devices.
wb Wideband This option selects the wideband characteristics of the MOA.
The following options are set from the Sense pane and Guard pane.
sa Sense A Directs the system to use the A bus to sense the source voltage being applied to
the component under test.
sb Sense B Directs the system to use the B bus to sense the detector voltage. The sense is
made at the I bus.
sl Sense L Directs the system to use the L bus to sense the guard point. Sense L can be
done inside the testhead without additional wiring in the fixture.

60 Board Test Insight

 Debugging Analog In-Circuit Tests

Techniques for Reducing Measurement Errors

The effects of other devices connected to the device under test can cause errors in
the basic measurement made using the S and I buses. Guarding using the G bus to
break parallel impedance paths around the device under test may also introduce
measurement errors. These errors, summarized in Table 7, cause the measured
value of the device under test to be higher than the actual value.
The addition of three more buses, A , B, and L, help overcome the measurement
problems. Each is paired with one of the basic measurement buses S, I, and G. The
A bus senses the source (S bus) directly at the device under test, the B bus senses
the detector (I bus) directly at the device under test, and the L bus senses the guard
(G bus) directly at the board under test.
Any combination of the additional buses may be needed for a measurement.
Table 7 describes cases where sensing could be used to reduce measurement
errors. Sensing is specified in the Sense pane.

Table 7 Measurement errors

Error Cause/Solution
Source vol tage error Is caused by the thermally induced offset voltages of relay contacts, impedances of the
measurement buses, and loading of the stimulus source by small parallel impedances on the
board under test.
Can be reduced by:·
• Sensing the source with the A bus. Sensing the source requires the en option.·
• Sensing the I bus with the B bus.
Current splitting Is caused by a small impedance path in parallel with the input to the MOA, and by an
apparent increase in the input impedance of the MOA when AC stimulus sources are used.
MOA input impedance increases as the frequency of the source is increased. A large value
reference resistor in the MOA feedback path also contributes to current splitting.
Can be reduced by:·
• placing the S and I buses such that maximum circuit impedance is between the I and G
buses
• using the B bus
• increasing the gain of the MOA by changing the bandwidth·
• lowering the frequency of the AC source
Guard offset error Is caused by the voltage drop across the impedance of the G bus. This voltage drop appears
as an offset voltage at the input terminals of the MOA. Guard offset error is sometimes called
guard gain.
Can be reduced by using the L bus. Specify this in the Guard pane.

Board Test Insight 61

Debugging Analog In-Circuit Tests

62 Board Test Insight

Auto Debug and Optimizer for
Analog Tests

AutoDebug for Analog Tests 64

Customizing AutoDebug Rules 66
Optimizer for Analog Tests 77
Auto Debug and Optimizer for Analog Tests

AutoDebug for Analog Tests

AutoDebug is designed to automatically debug unpowered analog in-circuit tests,
reducing the time it takes to get a new test debugged and into production.
AutoDebug uses predefined rules to debug and fine-tune the tests so that the board
will pass reliably in production. It runs the selected tests, captures measurement
data, evaluates the data, adds or deletes measurement options, and compiles the
tests. The modified tests are identified for review before saving changes.
To meet different test requirements, use the AutoDebug Rule Editor customize the
rules.
Before using AutoDebug, ensure that the values for variable
components on the known good board have been set.

How AutoDebug Works

A comprehensive rule set containing predefined rules is provided for each device
type. Each rule defines a number of actions to be taken in debugging a test.
During debugging, AutoDebug uses the rules in the active rule set to identify the
test options for the device. The rules are applied one at a time until the test passes.
When the test passes, stability testing is performed (if specified). The parameters
for a successfully debugged test are then updated and shown on the screen.
If AutoDebug is unable to pass the test, the test parameters that achieve the closest
possible results are used.

Example
Suppose AutoDebug is run on the following test, which failed due to an incorrect
re option: resistor 10k, 1.4, 1.4, re2, wb, ed, en

Applying the default rule for re causes AutoDebug to step through the re options,
starting with the options closest to the existing value. That is, re1 and re3 are
applied and tested before proceeding to re4 and re5.
As re5 is the first option that enables the test to pass, AutoDebug stops debugging
and updates the test with the new value:
resistor 10k, 1.4, 1.4, re5, wb, ed, en

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 Auto Debug and Optimizer for Analog Tests

AutoDebug Results
• All changes made by AutoDebug are highlighted on the screen for review.
• For successfully debugged tests, the Save Testsource option is automatically
selected. The word AutoDebug in the Save Testsource column indicates the
source of the changes.
• If AutoDebug fails to achieve the required results, the test is modified to
achieve the closest possible values. In such cases, the Save Testsource option
is not selected.
You should manually debug and modify such tests where necessary, before
saving to the test source files.

AutoDebug Log Files

AutoDebug generates two log files which can be found in log folder under the
current project folder.
• autodebug.log – Rules that were run, on which devices, and recommended
changes to device tests, if any.
• autodebugError.log – Log of failures and changes made to device tests in the
attempt to pass the tests.

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Auto Debug and Optimizer for Analog Tests

Customizing AutoDebug Rules

Use the Rule Editor to create or modify AutoDebug rules and rule sets. You can
create multiple rule sets for a device type, but only one rule set can be active.
AutoDebug uses the active rule set for debugging.
From the Tools menu, select AutoDebug > Analog > Rule Editor to display the Rule
Editor.

Figure 12 Rule Editor for analog tests

Rule set(s) for each device type

Active rule set is shown in bold Rule database

Parameters for the selected rule

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 Auto Debug and Optimizer for Analog Tests

Creating a New Rule

Follow these steps to create a new rule (see Figure 13).
1 Click New.
2 Enter a name and description (optional).
3 Select the device types this rule applies to.
4 Choose whether to apply the rule's actions to an existing test, or write a new
test.
5 Specify the requirements for stability testing (optional):
a To enable stability testing, select Turn On Stability Test.
b Specify the minimum CPK that must be met, and the number of times to run
the test.
6 Add action(s) to the rule:
a Select the action from Available Action and click the left arrow button.
b Specify the parameters, if any, for the selected action.
See AutoDebug Actions for a description of the actions and parameters and
how actions are combined in a rule.
7 Specify the offset if required.
8 Click Save to save the rule.

Board Test Insight 67

Auto Debug and Optimizer for Analog Tests

Figure 13 Create new rule

7
6

8
1

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 Auto Debug and Optimizer for Analog Tests

Creating a New Rule Set

Follow these steps to create a new rule set for a device type.
1 Create any new rules required (see Creating a New Rule).
2 Under Rule Set, select a device type and click New.
3 Enter a name and click the checkbox to save (Figure 13).
4 Add rules to the rule set:
a Make sure the new rule set is selected.
b Select a rule from the Rule Database and click Assign.
5 To change the order of the rules in the rule set, select a rule and use the
Up/Down buttons to move it.
6 To make this the active rule set, select it and click Active.

Changes you make to a rule set are saved automatically.

Active vs Inactive Rule Set

AutoDebug will use the rule set marked as Active for debugging. The active rule
sets for each device type are shown in bold.
To make any rule set active, select it and click Active.
To skip a device type when running AutoDebug, select the active rule set for that
device type and click the Inactive button.

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Auto Debug and Optimizer for Analog Tests

Figure 14 Create new rule set

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 Auto Debug and Optimizer for Analog Tests

AutoDebug Actions
A rule can contain more than one action; a rule can also be merged with an existing
test during AutoDebug (when Merge with Existing Test is selected). The following
describes how the actions are combined.
• When you combine two iterative actions, AutoDebug tests all possible
permutations of the two sets of values.
• If you combine a single condition action with an iterative action, the option is
enabled for all iterations.
If you wish to test both conditions (on and off) with the iterative action, create
two rules, one with the action included and one without. For example, creating
a rule with Amplitude and Extra Digit tests the specified Amplitude settings
with Extra Digit enabled. You must create then a second rule containing the
same Amplitude settings but without the Extra Digit option.
• When Merge with Existing Test is specified for the rule, the actions in the rule
are added to the test.
In the case of single condition options such as Extra Digit, the option is enabled
in the test. If the test did not contain the option, it is added; if the test already
contained the option, there is, in effect, no change to the test.

Table 8 List of Actions

Action Description
A Bus Sense On S Bus Directs the system to use the A bus to sense the source voltage being applied to the component
under test. The sense is made at the S bus.
Amplitude Sets the amplitude of the source voltage.
Parameters:
• Range – Sets the test boundaries
• Step resolution – The incremental value to use in stepping through the range defined.
ASRU Range Specifies the ASRU gain range.
Autodebug Guards Sets guarding on for the device. Using the guard information generated during test
development and the one-away guard information from the board file, AutoDebug runs tests on
the board and selects the optimal guards. You can choose to include or exclude the system
commented guards.
B Bus Sense On I Bus Directs the system to use the B bus to sense the detector voltage. The sense is made at the I
bus.

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Auto Debug and Optimizer for Analog Tests

Table 8 List of Actions (continued)

Action Description
Change Test Limits Changes the upper or lower test limit based on the measured value, if it falls within the
acceptable range. See Change test limits.
Parameters:
• Lower limit, upper limit – Defines the limits of the working range.
• Offset – The offset to be added to or deleted from the measured value to obtain the new
upper or lower limit.
Change Test Value Changes the test value to the measured value, if it falls within the acceptable range. See Change
test value.
Parameters:
• Lower limit, upper limit – Defines the working range.
Change Threshold Changes the threshold based on the measured value, if it falls within the acceptable range. See
Change threshold.
Parameters:
• Limit – Defines the upper limit of the working range.
• Offset – The offset to be added to the measured value to obtain the new threshold value.
Current Change Specifies the change in DC current to use when testing npn or pnp transistors.
Parameters:
• Range – Sets the test boundaries
• Step resolution – The incremental value to use in stepping through the range defined.
Current Compliance Specifies the current limit when testing components in the MOA input (constant voltage
configuration). This protects the component under test and the MOA from damage due to
excessive current during testing. Predefined values are approximately 35 ma and 150 ma.
DC Current Specifies the DC source current. It is used in transistor testing to provide a DC bias; in diode
testing to provide a known DC current; and in capacitor testing to specify the DC charging
current.
Predefined steps are 10 mA to 100 mA, in increments of 10 mA for transistors and diodes. For
capacitors, they are 100 mA to 1 mA, in decrements of 10 mA.
DC Offset Used to select a DC offset voltage for an AC source.
Parameters:
• Range – Sets the test boundaries
• Step resolution – Sets the increment for each iteration in the search for the optimal value.
Detector Wait Causes the detector to wait the specified interval between measurements when enhancement is
used.
Parameters:
• Range – Sets the test boundaries
• Step resolution – The incremental value to use in stepping through the range defined.
Enhancement Directs the system to perform an enhanced component test. That is, additional measurements
are made to improve accuracy.

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 Auto Debug and Optimizer for Analog Tests

Table 8 List of Actions (continued)

Action Description
Extra Digit Directs the system to integrate the measurement over a complete line cycle. It can be used
when additional accuracy is required.
Fil ter Directs the system to take a specified number of readings during a component test and output
the average as the test result. This helps reduce the effects of system noise.
Parameters:
• Range – Sets the test boundaries
• Step resolution – The incremental value to use in stepping through the range defined.
Frequency Sets the frequency of the AC source in Hz. Predefined values are 128, 1024, and 8192.
Interval Sets the interval value between samples when testing capacitors in DC mode.
Parameters:
• Range – Sets the test boundaries
• Step resolution – The incremental value to use in stepping through the range defined.
L Bus Sense on G Bus Directs the system to use the L bus to sense the guard point. Sense L can be done inside the
testhead without additional wiring in the fixture.
Opposite Causes the expected result of a test to be reversed. The jumper and switch tests pass if the
measured resistance is less than or equal to the specified threshold. When this option is
included, the tests pass if the measured resistance is greater than the specified threshold.
Parallel Model Selects the parallel model for capacitor and inductor tests.
Reference Element Selects the reference resistor for the MOA feedback loop. Predefined values are 10, 100, 1K,
10K, 100K, and 1M.
Swap S and I Swaps the Source (S) and Input (I) buses.
Vol tage Compliance Sets the source voltage limit when testing components in the MOA feedback (constant current
configuration). This protects the component under test and the MOA from damage due to
excessive voltage during testing.
Parameters:
• Range – Sets the test boundaries
• Step resolution – The incremental value to use in stepping through the range defined.
Wait Specifies a wait interval between applying a stimulus and taking a reading. This allows the
source to settle when testing reactive devices. The wait is invoked before and after making the
measurement.
Parameters:
• Range – Sets the test boundaries
• Step resolution – Sets the increment for each iteration in the search for the optimal value.
Wideband Selects the wideband characteristics of the MOA.

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Auto Debug and Optimizer for Analog Tests

Test Value, Limits and Threshold

Three actions adjust the test value, threshold, and test limits based on the test
results. You set limits that define a working range for AutoDebug, that is, if the
measured value falls within this acceptable range, AutoDebug will adjust the test
values. If the measured value falls outside this range, AutoDebug will not adjust the
test values but will flag the test as a failure.
When applying these actions, ensure that you do not set parameters that allow
AutoDebug to change the values too far and pass boards that should fail.
The following examples illustrate how these actions are applied.

Change test value

This action changes the test value to the measured value, if it falls within the
acceptable range.
Suppose a resistor test is as follows:
resistor 100, 5, 5, re2, wb, ar100m

A Change Test Value rule, with both lower and upper limits set to 20%, is applied.
This defines a working range of 80 to 120 (20% from the expected value of 100).
The test is run and fails when the measured value is 90, outside the tolerance limits
of 95 to 105.
However, the measured value is within the acceptable range defined by the rule,
therefore AutoDebug modifies the test statement. The new test will be:
resistor 90, 5, 5, re2, wb, ar100m

At the same time, a new on-failure message is added, which states that the BOM
value is 100.

Figure 15 Example of Change Test Value rule

1. Original test: 100, 5, 5 Pass
95 100 105

2. Change Test Value rule Acceptable range

defines acceptable range
80 100 120

3. Measured value: 90 90

4. Modified test: 90, 5, 5 Pass

85 90 95

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 Auto Debug and Optimizer for Analog Tests

Change threshold
This action changes the threshold based on the measured value, if it falls within the
acceptable range.
Take the example of a jumper with the threshold set at 10 ohms. The Change
Threshold rule defines the working range as up to 15 ohms (10 ohms plus 50% of
10 ohms).
The test is run and fails when the measured value is 14 ohms, which exceeds the
original threshold. However, the measured value is within the acceptable range
defined by the rule, therefore AutoDebug modifies the threshold, setting it to the
measured value plus the offset. That is, 14 ohms plus 10% of 10 ohms, giving a new
threshold of 15 ohms.

Change test limits

This action changes the test limit based on the measured value and offset
parameter.
Suppose a resistor test is as follows:
resistor 100, 10, 10, re2, wb, ar100m

A Change Test Limits rule, with all parameters set to 10%, is applied. This defines
a working range of 81 to 119, calculated as follows:
a Test statement: 10% of the expected value of 100 is 10, giving a lower test
limit of 90.
b Rule: 10% of the lower test limit is 9; 90 less 9 gives 81 as the lower end of
the AutoDebug working range.
c The same value (9) is added to the upper test limit (110) to give 119 as the
upper end of the AutoDebug working range.
The test is run and fails when the measured value is 85, outside the test limits of 90
to 110.
However, the measured value is within the acceptable range defined by the rule,
therefore AutoDebug modifies the test statement. The new test is as follows:
resistor 100, 24, 10, re2, wb, ar100m

The value for the lower test limit is calculated as follows:

a Measured value (85) less the offset value (9) gives a new lower limit of 76.
b The difference between the expected value (100) and 76 is 24; this amount is
expressed as a percentage of the expected value in the test statement.

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Auto Debug and Optimizer for Analog Tests

Figure 16 Example of Change Test Limits rule

1. Original test: 100, 10, 10 Pass
90 100 110

2. Change Test Value rule Acceptable range

defines acceptable range
81 100 119

3. Measured value: 85 85

4. Modified test: 100, 24, 10 Pass

76 100 110

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 Auto Debug and Optimizer for Analog Tests

Optimizer for Analog Tests

The Auto Optimizer is designed to automatically evaluate and fine-tune analog
in-circuit tests in order to improve throughput.
Auto Optimizer runs the analog tests and determines which of the passing tests use
complex measurement options. Auto Optimizer then attempts to minimize the use
of such measurement options and ensure that the modified tests will pass reliably
in production. If the modified test passes stability testing, Auto Optimizer sets the
ASRU range for the test and presents the optimization results.
The test engineer can customize the parameters for stability testing, and review the
modified tests before saving changes to the test source files.
Auto Optimizer does not work with ControlXT Cards.

Customizing the Optimizer

From the Tools menu, select Optimizer > Analog > Optimizer Rule Editor to display
the Rule Editor. The parameters are described in Table 9.

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Auto Debug and Optimizer for Analog Tests

Table 9 Optimizer Rule Editor

Item Description
Stability Test CPK - The minimum CPK (process capability index). The CPK for the test is calculated after a
predefined number of runs, and the value must be greater than or equal to the minimum CPK for
the test to be considered stable.
During stability testing, you can allow the Optimizer to adjust the test limits or test value based
on the test results.
Change Test Limits Specify whether the Optimizer should adjust the test limits.
• Change Test Limits – Defines the limits of the working range.
The Optimizer changes the upper or lower test limit based on the measured value, if it falls
within this range.
• Widen Test Limits – The percentages used to calculate the new upper or lower test limit.
New lower limit = measured value - (specified percentage x measured value)
New upper limit = measured value + (specified percentage x measured value)
For tests with threshold values, the upper limit is used as the threshold.
Change Test Value Specify whether the Optimizer should change the test value. It will set the test value to the
measured value, if it falls within the working range.
• Lower limit, Upper limit – Defines the working range.

78 Board Test Insight

Debugging VTEP/TestJet
Tests

VTEP/TestJet Tests 80
Debug VTEP/TestJet Tests 83
AutoDebug for VTEP/TestJet 85
Debugging VTEP/TestJet Tests

VTEP/TestJet Tests
Vectorless Test EP (VTEP) or TestJet tests for manufacturing defects such as open
connections, missing devices, and improperly positioned (skewed) devices. Either
VTEP or TestJet tests are developed, depending on your hardware.
In the Test Explorer, click TestJet/VTEP to view the test list.

Figure 17 VTEP/TestJet tests

Pin table

Table 6-1 Pin table

Column Description
Pin No. Pin number
Low Limit, High Limit
Throughput Ad justment The options are on the drop-down list are:
• <blank> – Throughput adjustment 0
• Throughput Adjustment – Throughput adjustment 1
• iVTEP – Throughput adjustment 2
• VTEP Enhanced Guarding – Throughput adjustment 4
Measured Value Measured value

80 Board Test Insight

 Debugging VTEP/TestJet Tests

Table 6-1 Pin table (continued)

Column Description
Test Resul t Status of the pin test
Threshold Low, Values that determine whether the test passes or fails
Threshold High
Commented Comments out the pin
Std Dev Standard deviation of multiple runs
Mean Mean value of multiple runs
CPK CPK value of multiple runs
Remark Lets you add comments on the test

Chart
The chart plots the high and low thresholds for each device. Run N Times will
update the chart showing the maximum, minimum, and average measurement for
each pin.
You can adjust the display by changing the maximum value on the Y-axis (enter the
value and click Reload Chart).

Board Test Insight 81

Debugging VTEP/TestJet Tests

TestJet Macros
These macros were developed for TestJet and have not been updated for VTEP.
The recommendations they give may be worth considering for VTEP, but they have
not been validated against the better performance characteristics of VTEP.

Table 7 TestJet macros

Macro Description
Close Ad just - With Board Close Adjust checks for the effect of close probes.
Close Ad just - Without Board The macros measure and compare values with and without the board. The report
Close Ad just - Calculate Resul ts generated gives recommendations for manual adjustments to some of the low
thresholds to account for bottom side devices being close to probes in the fixture
and measuring extra capacitance even if a pin is open.
Missing Ad just - Blank Missing Adjust determines if the test detects missing devices.
Missing Ad just - Loaded The macros measure and compare the difference between a loaded and a blank
Missing Ad just - Calculate Resul ts board. The report generated gives recommendations for manual adjustments to
some of the high thresholds to make sure the test fails if the device is missing. A
sensor plate directly touching the bare board usually measures higher than normal
readings when the device is missing.

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 Debugging VTEP/TestJet Tests

Debug VTEP/TestJet Tests

Use AutoDebug to debug VTEP/TestJet tests. If necessary, you can customize the
parameters used for debugging. See Parameters for AutoDebug which describes
the parameters and the calculations performed by AutoDebug.
Note the following when debugging with AutoDebug:
• Every time AutoDebug runs, it rewrites the selected devices and pins. It does
not provide any mechanism to mark a device as permanent.
• AutoDebug writes comments into the test file when it runs. It is important that
you do not edit these comments. Some of them are used to communicate to
the next run of AutoDebug. Modifying these comments can corrupt the
information and cause incorrect behavior with AutoDebug.
To debug VTEP tests,
1 Select the test from the Test list.
2 Select the device(s) from the Device list and right-click to select Run
AutoDebug or Run iVTEP.
If Run iVTEP is selected, the test is run a second time. Pins that were unreliable
during the first AutoDebug run are re-tested using iVTEP. (See Run iVTEP.)

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Debugging VTEP/TestJet Tests

AutoDebug Undo Options

Right-click in the Tests list or Device list to see the following options.

• Undo Last AutoDebug will undo the last AutoDebug operation (run AutoDebug,
restore test, or restore device).
• Restore Original Test reverts to the original test file. This discards any learned
limits, and recovers any pins commented out by AutoDebug.
• Restore Selected Device(s) reverts to the original device(s).

84 Board Test Insight

 Debugging VTEP/TestJet Tests

AutoDebug for VTEP/TestJet

The AutoDebug utility for VTEP/TestJet tests attempts to set limits so that the
board will pass reliably in production. During AutoDebug, tests are run,
measurements taken and evaluated, new tests written and compiled. Ten readings
are taken for each pin during this process. AutoDebug will set limits for each pin
and comments out pins which do not meet the acceptance criteria (minimum CPK).
After the first time AutoDebug is run on a test, the old limits are taken into account
when setting new limits. This allows debugging across multiple known good boards
and fixtures. If a new limit is calculated outside the old limit, the new limit is used.
If the old limit is outside the new limit, the old limit is kept. The old limit represents
previous AutoDebug runs on other boards. If the old limit is outside the newly
calculated one, it means that there is another board which needs the limit set wider
and AutoDebug should not bring it in closer.
Ideally, AutoDebug should be run on several known good boards with devices from
different manufacturers’ lots and across each fixture if more than one is being built.
This will take into account the fixture-to-fixture and board-to-board variations.
Realistically, you may have only one fixture and board available. In this case, run
AutoDebug again on the same board after opening and closing the fixture. This will
help simulate any variations due to mechanical inconsistencies in sensor plate
alignment in the fixture. After this, AutoDebug can be run again after the board is
in production. This may be the only way to cover all fixtures. Boards from a
production run will also tend to have new lots of devices loaded.

Run iVTEP
This option runs AutoDebug on the selected devices. Any pins commented out by
AutoDebug are then re-tested using the iVTEP technique.
It makes a backup of the test, runs the test, evaluates the results to calculate the
new thresholds, and applies a CPK analysis. Pins that read below a minimum CPK
then have throughput adjustment 2 added and thresholds set to 1 and 10. This
turns on the iVTEP measurement for those pins.
The test is compiled and run a second time and only those pins are analyzed. Those
that are less than the minimum CPK are commented, the test is compiled for a final
time.
Do not change the threshold values when using this option.

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Debugging VTEP/TestJet Tests

Parameters for AutoDebug

During debugging, AutoDebug takes 10 readings for each pin and calculates a
mean and standard deviation. It determines limits for each pin using two separate
calculations, and chooses the limit that is more conservative (wider). These two
calculations are done using a user formula and an internal formula.
First, the limits are set using the user parameters (described in Table 8). Then,
internal limits are calculated using the performance parameters of the VTEP or
TestJet software and hardware, standard deviation, and minimum CPK. The internal
method provides a certain minimum margin between the mean and the limits that
are set. This keeps AutoDebug from writing limits that are closer than the
measurement capability no matter what user parameters are set.
Generally, the user parameters tend to control the limits for higher valued pins,
while the internal parameters tend to control very low values.
The parameters you can set are described in Table 8. To restore the parameters to
the default values, click Reset Defaults.

Table 8 User parameters

Column Description
LowestLowLimit Controls the lowest limit set. No limit will be set lower than the LowestLowLimit.
MinCpk Determines when pins are commented out of the test.
After the limits are calculated, the Cpk for each pin is also calculated as follows:
mean - closest limit
Cpk =
3*standard deviation

Any pin whose Cpk falls below this value will be commented out.
Note: The Cpk is calculated using the mean and standard deviation from the set of 10
readings taken when AutoDebug is run on this test. It is not a Cpk across all boards that have
run through AutoDebug.
HiPercent, HiMinOffset Parameters used in calculating the high limit. The formula is as follows:
HiLimit = mean + max ((mean*HiPercent), HiMinOffset)
LowPercent, Parameters used in calculating the low limit. The formula is as follows:
LowMinOffset LowLimit = mean - max ((mean*LowPercent), LowMinOffset)

86 Board Test Insight

Debugging Polarity Check &
Connect Check Tests

Debug Polarity Check Tests 88

Debug Connect Check Tests 89
Debugging Polarity Check & Connect Check Tests

Debug Polarity Check Tests

To debug Polarity Check tests,
1 In the Test Explorer, select Polarity Check.
2 Select the test from the Test list.
3 Select the device(s) from the Device list and select Run N Times from the
toolbar.
On completion, the chart plots the measurements for the devices.
4 Determine the marginal and failing devices. You can comment out, adjust the
threshold, or change the negative pin for those devices.

5 Save changes when done.

Refer to Using Pushbutton Debug in the i3070 help for suggestions on debugging
Polarity Check tests.

88 Board Test Insight

 Debugging Polarity Check & Connect Check Tests

Debug Connect Check Tests

To debug Connect Check tests,
1 In the Test Explorer, select Connect Check.
2 Do the following:
a From the Tools menu, select Learn > On.
b Select and run the tests.

c From the Tools menu, select Learn > Off before running the tests again.
d Repeat the tests with a few more boards to check test stability.
3 To make any adjustments, right-click the test and select Open Test Source.
4 Save changes and repeat step 2.
Refer to Using Pushbutton Debug in the i3070 help for suggestions on debugging
Connect Check tests.

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Debugging Polarity Check & Connect Check Tests

90 Board Test Insight

Debugging Powered Tests

Power the Board 92

Debug Digital Tests 93
Debug Boundary-Scan Tests 106
Debug Cover-Extend Tests 111
Debug Analog Powered Tests 113
Debug Mixed Tests 114
Debugging Powered Tests

Power the Board

1 Turn on the DUT power supplies by clicking Power Supplies On on the toolbar.
This executes the testplan’s Setup_Power_Supplies subroutine.
2 Make sure the power supplies are not in current limit.

92 Board Test Insight

 Debugging Powered Tests

Debug Digital Tests

Digital debugging allows you to:
• Examine the logic states of the circuit being tested, using different display
formats.
• Make adjustments to test parameters and re-execute a digital in-circuit test
without having to recompile the test.
• Save the debug data to a .csv file so that you can examine the data elsewhere
(use the Export button).
• Save the debug data to continue debugging at a later time (use the Generate
Backpatch/Get Backpatch options).

Figure 18 Digital In-Circuit Test List

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Debugging Powered Tests

Digital Debug Workflow

1 In the Test Explorer, select Digital In-Circuit (Figure 18).
2 Select all the tests and click Run on the toolbar. Use Run N Times or Run Till
Fail if necessary to check test stability.

3 In the Test List, double-click a failing device to debug.

4 Debug the selected device from the Debug pane (Figure 18):
a Click Start Debug.
b Click Run to run the test and review the results.
c Make adjustments in the Debug pane; use the waveform information to help
debug the test.
– Debug Pane
– Waveform Pane
– Test Source
d Run again to fine-tune if needed.
e Click Stop Debug when done.
– Only one device can be debugged at a time.
– Any changes that you make are used for debugging only;
they are not saved to the test source.

f Save the changes as follows:

– Click Display Adjustments to display the changes in the Output Panel.
– Copy the commands from the Output Panel and paste into the test
source.
– Click Save to save and compile the test.

94 Board Test Insight

 Debugging Powered Tests

Debug Pane
The following tables provide brief descriptions of the test options and parameters
in the Debug Pane. For more information about digital testing, see Digital Testing
in the i3070 online help.

Figure 19 Debug Pane for device

Table 9 Device table

Column Description
Pin, Node Device pins and associated nodes.
Pin Type Inputs, outputs, or bidirectional.
Test Resul t Indicates if the test passed or failed.
Input Defaul t Input default for each pin, 0, 1, or X.
Drive Low, Drive High Adjust driver voltages.
Receive Low, Receive Adjust receiver voltages.
High
Slew Rate Set the slew rate, which determines the rise time of the driven pulses.
Terminator Select this option to connect the RC networks in the receiver circuits,
to enhance high-speed signal quality.

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Debugging Powered Tests

Table 9 Device table (continued)

Column Description
Ad vanced Options
Receiver Offset(a), Change the offset on the indicated receiver. Keep the offsets the same
Receiver Offset(b) for two receivers on the same pin where possible.
Driver Offset(a), Change the offset on the indicated driver. Keep the offsets the same
Driver Offset(b) for two drivers on the same pin where possible.
Probe Offset(a), Change the offset on the indicated probe channel.
Probe Offset(b)
Set Driver State To Modify the driver state on an input or bidirectional node or pin, for one
or more machine vectors.
Click in the cell and click the down arrow icon to select a setting from
the dropdown list, then click Set.
Set Receiver State To Modify the receiver state on an input or bidirectional node or pin, for
one or more machine vectors.
Click in the cell and click the down arrow icon to select a setting from
the dropdown list, then click Set.
Other Settings
Family The family establishes the parameter values for all pins in the VCL test.
Vector Cycle Lets you temporarily change the timing of the vectors.
Receive Delay

Table 10 Action buttons

Action Description
Display Ad justments Lists changes to the test parameters made during debugging.
Remove Adjustments Cancels all changes made.
Debug Status Lists debug resources and other information about the test being
debugged. The list is sent to the current printer is device.
This does not include information about the cause of failure.
Diagnose Faul ts Diagnose failing tests by automatically changing the parmeters and
running the tests several times to check test stability. The list is sent to
the current printer is device.
Diagnose Faul ts: Diagnose faults and provides more detailed information.
Verbose

96 Board Test Insight

 Debugging Powered Tests

Table 10 Action buttons

Action Description
Generate Backpatch Save debug data to a backpatch file named <test path>.bp. This
will contain the same information as the Display Adjustments
function.
Get Backpatch Retrieve debug data from the backpatch file.
Display Probe Setup Sends probe setup details to the current printer is device.

Table 11 Other test options

Parameter Description
Probe/Others
Probe Offset(a), Changes the offset on the indicated probe channel.
Probe Offset(b) The offset (-30 ns to 100 ns) from the event on which the activity is to occur.
A value cannot be used if it would place two transitions (state changes) on the same pin
closer than 50 ns, or if the transition would then occur in the next vector.
Probe Receive High/Low Programs the probe to set the specified values.
Set Probe to Node or Pin Programs the probe to set the same values as those currently set on the receiver pin selected
in the pins table. If you need to look at the actual signals on a driver, you must program the
probe to a receiver’s values.
If the values on the pin changes, note that the probe values do not update automatically. You
will need to set them again.
Data to Node/Pin Connect debug port (data) to the node/pin selected in the pins table.
Clock to Node Connect debug port (clock) to the node/pin selected in the pins table.
Verify Faul ts Simulates fault conditions on nodes and runs the test. Only one fault on one node is
simulated for each run of the test. If the test fails, the fault was found; if the test passes, the
fault was not found. The test results are sent to the current printer is device.
Display Setups Sends pin channel setup details to the current printer is device (whether the channel is
driving or receiving, events (FCLKs) in the machine vectors, offsets, high and low driver or
receiver voltages).
Add/Remove
Add Driver/Receiver on Assign resource to a node for a VCL test.
Node • Note that the node must have a fixture wire connected to the resource being added.
• The resource is added for the current debug session only.
• If you decide to permanently add the resouce, you must assign them in the VCL test. Use
the Generate Backpath function to save the changes to a file as a checklist when editing
the VCL test.
• All the digital debug functions apply to the added resources.

Board Test Insight 97

Debugging Powered Tests

Table 11 Other test options (continued)

Parameter Description
Add Sync At Adds a sync pulse at the specified vector.
Expand Homingloop At Displays all homingloop machine vectors including the piped vectors for each pass through
the homingloop. Specify the machine vector number of the last piped vector for the
homingloop you are expanding.
Without this function digital debug displays only the first pass through the loop.
Add Driver/Receiver Add a driver or receiver.
Add/Delete Vector Add or delete a vector.
Timing
Select Edge Falling, Temporarily changes the trigger edge of the external clock used to synchronize the test
Select Edge Rising timing.
Events Every Internal Specify the time between events (i.e., temporarily change the period of the reference clock).
DUT Clock Specify the period of the DUT clock.
Learn test Time Executes a VCL test the specified number of times and reports the time required for the test
to run.
Vector Timing Modifies the position of the data strobes within the specified machine vector.
Ports Connect debug port (sync, clock or data) to a resource.
Clock to Event Clock Connects clock to an event clock (TCLK).
Clock to Timing Clock Connects clock to a timing clock (FCLK).
Clock to Vector Clock Connects clock to a vector clock (SCLK).
Sync to Debug Sync Connects sync to debug port (sync).
Sync to Program Sync Connects sync to the program sync (sync setup in a VCL test).
Sync to Vector Clock Connects sync to a vector clock (SCLK).
Remove Sync Cancels the sync setting.

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 Debugging Powered Tests

Waveform Pane
Use the Waveform display to help debug the test. The display options (shown in
Figure 20) are described in Table 12.
If you make changes and save the tests in the Debug pane, click Display Refresh
to update the waveform display.
If you click Display Failure, a new waveform is added to the previous display.

Figure 20 Waveform
5 3 9 1 2 7

6 4

Table 12 Waveform display

Option Description See Example

1 Display Failure Show failures in the waveform. Figure 20
Next Failure Display the next failure.
2 Display Start When the test has a large number of vectors, you can specify the first vector Figure 21
to display.
3 Display Graphics, 1 Choose the type of display from the drop-down list: waveforms (graphics), Figure 22,
Display States, node states, or node states combined into hexadecimal (hex). Figure 23,
Display Hex 2 Then click Display Waveform to update the display. Figure 24

4 Show binary states 1 Click the down arrow and select Track Ball Info. Figure 25
2 Move the cursor to any vector to display binary states at that vector.
5 Expected, Actual, 1 Choose the data to display by clicking in the checkboxes. Figure 26
Vector 2 Then click Display Waveform to update the display.
Include Vector to show the drive/receive status on the waveform.

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Debugging Powered Tests

Table 12 Waveform display

Option Description See Example

6 Show next/previous Select an item from the list followed by the next/previous icon.
vector, driver, or
receiver
7 Show marker Enter the vector number to display a marker at that vector. Figure 27
8 Synchronize Arrange the Waveform and Test Source panes side-by-side. Click on the Figure 28
test source and waveform to see the corresponding line in the test source.
waveform
9 Display Probe Lets you use the guided probe on a node or pin to display actual waveforms.
1 Click Display Probe and enter a probe name.
2 Touch the guide probe to the node/pin and click Start to display the
waveform.

Figure 21 Start display at specified vector

Start at specified
vector

Figure 22 Display graphics (waveform)

100 Board Test Insight

 Debugging Powered Tests

Figure 23 Display states

Figure 24 Display hex

Figure 25 Show binary states for vector

Board Test Insight 101

Debugging Powered Tests

Figure 26 Choose data (Expected, Actual, Vector)

Figure 27 Show marker at vector

102 Board Test Insight

 Debugging Powered Tests

Figure 28 Synchronize waveform and test source display

Board Test Insight 103

Debugging Powered Tests

Types of Waveform Displays

Graphics Display
The vectors displayed are machine vectors; they are numbered along the top, and
the number of the first vector in the display (the start vector) is shown at the
upperleft. Piped vectors, if any, are identified by the letter P.
Vector 0 (not visible in the example) is shown as an asterisk because it is not an
actual vector. In the display, it indicates the initial conditions (X or Z) which exist
when the test starts and before the first vector is executed.
The displayed waveforms are numbered on the left side of the display, and identified
by pin, or node, and the type of data collected for that node: actual, expected, or
failed.
Colors are used in the waveforms to denote the different types of data:
• Green for actual states. That is, states that have been received by a system
receiver or by the probe.
• White for expected driver and receiver states read from the test.
• Red for failed states. The expected level of a failed state will be displayed.

States Display
The states display contains the same information as the graphics display except
that the states are shown as logic 1’s, 0’s and X’s.

Hex Display
Hex display is useful for looking at groups of bus lines, such as address lines whose
states change in a counting sequence.
This display shows basically the same information as the states display except that
every four lines are combined into one line. For each vector, the states on the four
lines are combined to form a hexadecimal digit, with the top state being the most
significant bit of that digit. For example, if the four states, from top to bottom, are
0100, then the digit 4 is displayed. If the states are 1011, a B is displayed. An X is
displayed if any one of the four combined states is an X.
When the lines are combined, all four lines assume the same type as the first (top)
line in the group. For instance, if the first line was displaying expected data, then all
four lines will now show expected data.

104 Board Test Insight

 Debugging Powered Tests

Test Source
• Select Test Source to open the test source for editing.
• You can locate a particular vector, unit or subroutine by selecting it from the
Outline drop-down list.
• Right-click in the Test Source pane to display a context menu with editing
functions.
• When you make changes, clicking Save will save and compile the test. This also
stops the debugging.
To continue debug with the updated test source, click Start Debug again in the
Debug pane.

Board Test Insight 105

Debugging Powered Tests

Debug Boundary-Scan Tests

1 In the Test Explorer, select Boundary Scan (Figure 29).
2 Select all the tests and click Run on the toolbar. Use Run N Times or Run Till
Fail if necessary to check test stability.
3 In the Test List, double-click a device to debug.

Figure 29 Boundary scan tests

4 Click Start Debug.

The following debug data and analysis are similar to digital test debugging.
Refer to these topics for details:
• Debug Pane
• Waveform Pane
• Test Source
See the following for boundary scan:
• Frame Debugger
• ITL

106 Board Test Insight

 Debugging Powered Tests

Figure 30 Debug boundary scan device

Board Test Insight 107

Debugging Powered Tests

Frame Debugger
Since boundary scan tests are serial in nature, a failure introduced at a given vector
may not be detected until hundreds of vectors later. The Frame Debugger
addresses this challenge by graphically displaying predicted and actual information
in parallel for each frame cell.
The Frame Debugger is based on the concepts of frames and frame cells. The
boundary registers of each device in a boundary scan chain are connected together,
and a pattern of data in this chain is known as a frame. Each cell in the chain is a
chain cell, and the chain cells on the interconnect nodes are known as frame cells.
When the data in a frame cell varies from what is expected for the frame, the frame
cell is said to fail for that frame. In the Expected/Actual column (Figure 31), each
bit represents a frame. Chain cells that fail one or more frames will have two lines
displayed in red in the column: predicted values on the first line and actual values
on the second.

Figure 31 Frame Debugger for boundary scan

108 Board Test Insight

 Debugging Powered Tests

ITL
The ITL (InterconnectPlus Test Language) pane show the high-level requirements
for the boundary scan tests for your devices, written by the software. On the ITL
pane, expand the sections to view or edit the settings.

Figure 32 ITL pane for boundary scan

General Information

Column Description
Test Inputs Only When selected, tests only the inputs on bidirectional pins.
Checkerboard • Without this option, the default test patterns drive and receive
all ones and all zeros.
• When selected, it alters the test patterns to a checkerboard
pattern in which there is a mix of ones and zeros at one test
vector and the inverse at the next test vector.
Ground Bounce Suppression When selected, this option suppresses the ground bounce effect.

Click TPG Warning to view any warning messages (from test generation).

Board Test Insight 109

Debugging Powered Tests

Device List
Lists the devices to be tested.

Column Description
TAP Only If selected, indicates that the device will be tested as TAP only
because of a compliance problem.
Otherwise, full boundary scan test capability is employed.
Disable Indicates whether boundary scan disabling is required.
Ignore Instruction Indicates whether to ignore the contents of the specified register
Ignore DeviceID during boundary scan testing.
Ignore Bypass

Insert Source
Sequence of routines or bit patterns (PCF format only) that configure the boundary
scan device to put it into a particular test mode.

Disable Information
If more than one device has to be preconditioned at a time, and their disabling
methods conflict, the software is not able to do the preconditioning. In such cases,
you may need to edit the disable information in this section.

VCL Pass-Through Statements

VCL statements allowed in the ITL code to let information pass directly into VCL
without being changed by the ITL compiler. The supported statements are:
set ref on vector cycle
set load on receive delay
set slew rate on set driver offset on
set terminator on set receiver offset on

Node List
Lists the nodes in this test. If there are any failure nodes after testing, you can
comment out all the failed nodes.

110 Board Test Insight

 Debugging Powered Tests

Debug Cover-Extend Tests

To debug Cover-Extend tests, you can simply comment out failing and intermittent
pins, or adjust the test thresholds. The quick way to debug a Cover-Extend test is
to use the AutoDebug utility.
1 In the Test Explorer, select Cover Extend.
2 In the Test List, double-click a device to debug.

3 Click Run AutoDebug.

AutoDebug sets limits for each pin and comments out any pins which do not
meet the acceptance criteria (minimum CPK). Pins are commented by setting
the high and low limits to -1.
When AutoDebug finishes, the test is ready to run.

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Debugging Powered Tests

Debug Pane for Cover Extend

• Undo AutoDebug will undo the last AutoDebug operation.

• Restore Original Test reverts to the original test file. This discards any learned
limits, and recovers any pins commented out by AutoDebug.
• Compile Test - No Signal runs the test without stimulus.
• Compile Test - Standard runs the test normally, with stimulus..
The following debug data and analysis are similar to digital test debugging. Refer
to these topics for details:
• Debug Pane
• Test Source
Cover Extend tests also include the following:
• PVL – The PVL file is only generated during the first AutoDebug run.
• Chart – The chart plots the high and low thresholds for each device. Run N
Times will update the chart showing the maximum, minimum, and average
measurement for each pin.
• ITL – See ITL (boundary scan).

112 Board Test Insight

 Debugging Powered Tests

Debug Analog Powered Tests

1 In the Test Explorer, select Analog Powered.

2 Select all the tests and click Run on the toolbar.

3 In the Test List, double-click a device to debug. Adjust the high and low limits
and re-test.

4 Run N Times and review the histogram results. If needed, edit the Test Source.

Board Test Insight 113

Debugging Powered Tests

Debug Mixed Tests

1 In the Test Explorer, select Mixed.

2 Select all the tests and click Run on the toolbar.

3 In the Test List, double-click a device to debug.
The mixed test debug window shows the analog and digital debug panes
side-by-side.
4 Click Start Debug to begin debugging.
For details, see Debug Analog In-Circuit Tests and Debug Digital Tests.

114 Board Test Insight

 Debugging Powered Tests

When debugging a mixed test, you can track the continue analog/continue
digital statements in the test source display. For example, click on continue
analog in the Digital Test Source (yellow marker) to jump to the corresponding line
in the Analog Test Source display (green marker) .

Board Test Insight 115

Debugging Powered Tests

116 Board Test Insight

Debugging the Testplan

Features of the Testplan Editor 118

Debug the Testplan 120
Testplan Variables 123
Debugging the Testplan

Features of the Testplan Editor

The Testplan editor displays the testplan with line numbers and syntax
higlighlighting for easy reference.
• Color settings for the testplan can be changed from Tools > Settings > Editor
Settings.
• Statements in the testplan are numbered. Click or near the line numbers
to expand or collapse sections respectively.
• Locate a subroutine in the testplan by selecting it from the Subroutine List.
• Click on a word to highlight all occurrences of that word in the file.
• As you type in the testplan, possible matches (commands and variables) will be
suggested. Double-click on a suggestion to select it.

Figure 33 Testplan

Active Testplan
When a project is opened, the testplan is Active, as indicated at the top-left corner.
If you subsequently open any other testplans, they will be Inactive and the status
cannot be changed.

118 Board Test Insight

 Debugging the Testplan

Right-click in the testplan to display a context menu. Besides the common editing
functions, the context menu provides the following:
• Comment Line(s) – Comment out the current line.
You can select several lines before right-clicking and selecting the function.
• Add Watch – Right-click on a variable and select Add Watch to add the
variable to the Watch list. The variable(s) added will be monitored during test
execution.
• Add Breakpoint – Sets a breakpoint at the current line. Test execution will
pause at the breakpoint.
• Add Bookmark – Bookmarks the current line.
• Find All References – Right-click on a variable or other item and select Find All
References to list all references to that item.

Board Test Insight 119

Debugging the Testplan

Debug the Testplan

The following testplan debug functions are provided on the toolbar.

Step Into
Debug Step Over
Step Out

Set breakpoints in the testplan to pause execution where debugging is required,

then use the testplan Step controls to step through the commands line by line, or
skip to the next subroutine as needed.
Ensure that no powered test is being debugged before you
start debugging the testplan.

1 Set the breakpoints in the testplan by clicking to the left of the line number.

2 To specify any variables to monitor during the debug, right-click on the variable
in the testplan and select Add Watch.
3 Click Debug on the toolbar.
The testplan is run and execution will pause at the first breakpoint.
4 Scenario 1: Debug subroutine using testplan step controls
a At the breakpoint, click the Step Into button to jump to the subroutine.
– Click the Step Into button to execute the test steps one at a time.
(Use Step Over if you want to skip a test step.)
– Click the Step Out button to exit the subroutine and return to the line
after the subroutine call.

120 Board Test Insight

 Debugging the Testplan

b Check these panes for useful information during debug:

– Call Stack shows where the call was made and the current line in the
subroutine.
– Watch shows the variables and how their values change. See Example:
Variable Watch.
5 Scenario 2: Debug test from Test List
This applies to tests that are stable when run from the test editor, but become
unstable when running from the testplan, possibly affected by other tests that
have been run earlier. In such cases, set breakpoints to allow you to debug the
test from the test editor.
a From the Test Explorer, select the test type, and select the test in question
for debugging.
– See the previous chapters on debugging the different test types.)
– Also see Example: Passing Test Parameters on passing values between
the testplan and the device test.
b Return to the testplan when the test is running properly.
6 Click Debug to continue execution to the next breakpoint.
7 When debugging is completed, click the Stop button.
8 Edit the testplan and debug again if required.
9 Click Run to start normal testplan execution.

Board Test Insight 121

Debugging the Testplan

Example: Variable Watch

Monitor variables from the Watch pane. In this example, Pslimit appears when the
breakpoint is reached, allowing you to monitor the value after powering up the
board under test. In case the board is not able to power up successfully, you will be
able to tell which power supply is in current limit from this variable.

Example: Passing Test Parameters

When the test requires a value from the testplan before test execution or has to
return some values after execution, Test Parameters are used.
For example, if a test is used to program the board serial number into an IC on the
board, the board serial number is scanned in by operator at the beginning of the
testplan execution and passed into the test when the test is executed.
If a breakpoint is set in the testplan for debugging this test, the value of the variable
from the testplan is passed into the corresponding variable in the test when you
click Start Debug in the test editor. (The name of the variable can be seen in the
Test Parameter column in the test list.)
Where required, you can:
• Change the variable in the Test Parameter column; the new variable name must
match the variable from the testplan.
• Add a variable in the test source for data capture; the variable name can be
different from the testplan, but the type must be the same.

122 Board Test Insight

 Debugging the Testplan

Testplan Variables
This pane provides quick access to the testplan variables described in Table 13.
These are optional test features that can be enabled for production testing. If you
make changes, click Save to save the settings.

Table 13 Optional test features

Variable Description
QSTATS_Mode • Off – Set datalogging off.
• No_Histo – Logs failing data and disables random sampling.
• Histo – Logs failing data and enables the random sampling of
data from 10% (the default) of the analog components that pass.
This enables Pushbutton Q-STATS to produce histograms that are
statistically meaningful.
Chek_Point_Mode CHEK-POINT determines if the board under test is making contact
with the fixture.
• Off – Set CHEK-POINT off.
• Pretest – Set CHEK-POINT to be executed every time.
• Failures – Execute CHEK-POINT on failed devices only.
Using_IYET Enable Intelligent Yield Enhancement Test (IYET).
IYET_Report_On Enable IYET reporting.
Report_Printer$ Specify where to send reports.
Testrev$ Revision number for the testplan.

Board Test Insight 123

Debugging the Testplan

Table 13 Optional test features (continued)

Variable Description
Serial_Length Length of the board ID number (for barcode scanning).
IYET_Preshorts_Attempts IYET re-tests only failing tests, unlike standard testing. This sets the
number of re-test attempts for preshorts. Only the last re-test result
will be logged.

124 Board Test Insight

Production Testing

Production Workflow 126

Before using Board Test Insight as the Operator interface, close any i3070
applications that are running.
Production Testing

Production Workflow
The following is a sample workflow for using Board Test Insight on the i3070
Series 5 In-Circuit Test System during production.
1 Click Open Project to load the project (board directory).
2 Click Acquire Testhead.
3 Place a test fixture on the testhead and click Fixture Lock.
4 Click Run.

5 Click Start (F1) or tap the footswitch.

6 Scan the board serial number and click OK.
The status will now show Running.
7 Place the board on the fixture and click Start (F1) or tap the footswitch.
When the test is completed, the board is automatically released and the test
status shown.

126 Board Test Insight

 Production Testing

A Fail status will be accompanied by details in the Repair Ticket pane.

Board Test Insight 127

Production Testing

If Autofile has been set up

1 Place a test fixture on the testhead and click Auto Load on the toolbar.
The project (board directory) is automatically loaded.
2 Click Start (F1).
Testing can now begin as described in the earlier example.

128 Board Test Insight

Appendix

BT-Basic Command Line 130

Appendix

BT-Basic Command Line

The BT-Basic command line is found in the Output Panel. The syntax is checked
when you execute commands and any errors will be highlighted.

You can use the Prev and Next buttons to recall executed commands.

Table 14 Keyboard shortcuts for BT-Basic command line

Shortcut Description
Enter Execute command
Up or F3 Previous command
Down or F2 Next command
F10 Clear text
F11 Clear text from cursor
F12 Clear output messages

130 Board Test Insight

 Appendix

Supported BT-Basic Commands

Table 15 BT-Basic commands in Board Test Insight

Supported Presently Not Supported
abort
abs
acknowledge all failures
acknowledge digital failures
acs
and
append
asn
assign to
atn
autoadjust
autofile
auxconnect
auxdisconnect
basic
baseline create on all
baseline delete on all
baseline disable
baseline enable
baseline login
baseline logout
baseline password
baseline save
baseline update
baseline verify
beep
binand
bincmp
bineor
binior
bit
bni
board consultant
board graphics
board graphics display board
board graphics display panel
board graphics end
board graphics highlight
board graphics highlight board
board graphics highlight clear
board graphics highlight device
board graphics highlight nodes
board number is
board placement
board placement on

Board Test Insight 131

Appendix

Table 15 BT-Basic commands in Board Test Insight (continued)

Supported Presently Not Supported
board version is
boardfailed
bsdl
btgetenv$
bti
buffer$
buffered reporting
bvi$
call
cat
cd
cfps
check board
check boardxy
chr$
clear
clear failures
clear nrun
compile
dutfailed
control
copy over/copy to
copy to
cos
cover extend print level is
cover extend supplies mapped to
cover extend supplies unmapped
from
cps
create ascii
create dir
crt$
datetime$
debug
debug board
def
def fn
dfps
dim
div
dllcall
dllload
dllunload
dps
dround
dutfailed
else
end

132 Board Test Insight

 Appendix

Table 15 BT-Basic commands in Board Test Insight (continued)

Supported Presently Not Supported
end if
end loop
enter
errl
errm$
errmlong$
errn
execute
exit if
exor
exp
extract version
fabon
fail device
faoff
faon
fboff
fbon
fcdon
fcoff
fcon
fdoff
fdon
find library
find pins
find testjet probes
find vtep probes
first pass yield
fixture consultant
fixture lock
fixture tooling
fixture unlock
fn
fnend
for
generate debug macros
generate testjet probe
generate vtep probe
get
global
goto
gpconnect
gpdisconnect
grade tests
hti
if
ignore all failures
ignore digital failures

Board Test Insight 133

Appendix

Table 15 BT-Basic commands in Board Test Insight (continued)

Supported Presently Not Supported
input
input prompt
input using
int
ipg
ipg from
ipg on
itb$
ith$
itl
ito$
keyboard is
learn
learn capacitance
learn test time
learning
len
lgt
link
list object
list source
list tests
list versions
lli$
load
load board
local
localizable
log
log clear
log clear for retest
log devices
log devices off
log is
log level is
log out
log using
loop
looptest
lwc$
merge
mod
module pin assignment
msec
msi
msi$
next
not

134 Board Test Insight

 Appendix

Table 15 BT-Basic commands in Board Test Insight (continued)

Supported Presently Not Supported
nrun
num
object checking
off error
on
on error
operator
option bit
or
oti
panelfailed
partforms
pause
pi
pins
polarity print level is
pos
powered
ppoll
prepowered
prerun
print
print level
print using
printer is
probe
probe report
probe selection
probe selection on
program monitor
pslimit
pwd
qfps
qstats
question
quick report
randomize
remote
rename
report
report clear
report fault syndrome
report is
report level is
report out
report using
re-save
re-store

Board Test Insight 135

Appendix

Table 15 BT-Basic commands in Board Test Insight (continued)

Supported Presently Not Supported
return
revision$
rli$
rnd
rotate
rpmc
rps
run
safeguard
save
save failures
scanworks connect
scanworks debug
scanworks disconnect
scanworks reset
scratch board
select boards on panel
send
setup test editor
sgn
shift
shorts
sin
softkey
softkey clear
softkeys
softkeys clear
special
sps
sqr
status
step
stop
store
tab
tan
test
test consultant
test cont
test monitor
test scanworks
testhead cleanup
testhead configuration
testhead is
testhead power
testhead status
testjet print level is
testorder

136 Board Test Insight

 Appendix

Table 15 BT-Basic commands in Board Test Insight (continued)

Supported Presently Not Supported
testplan generation
th$
then
time$
to
tolerance margin
topology device count
topology device data$
topology device pin count
topology device pin data$
topology get device pins
topology get devices
topology get internal devices
topology get node connections
topology get nodes
topology get parent devices
topology internal device count
topology node connection count
topology node count
topology node data$
topology parent device count
translate faults
trim$
triml$
trimr$
unlink
unpowered
upc$
vacuum well
val
val$
verify
verify device coverage
verify testjet
verify vtep
view test results
vtep print level is
wait
yes

Board Test Insight 137

This information is subject to change
without notice.
© 2015, 2017-2018 Keysight Technologies
Edition 2, April 2018
www.keysight.com