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Microsoft - I - O Tests (Device Fundamentals)

The document describes two I/O tests that are part of the Device Fundamentals tests in Windows: the Device I/O test and the Simple I/O stress test with I/O process termination. The Device I/O test performs basic I/O testing on devices, while the Simple I/O stress test performs I/O testing in a separate process and terminates the I/O process after a specified period and number of test cycles. Both tests can be configured using parameters like test cycles, I/O period, and I/O type.

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51 views3 pages

Microsoft - I - O Tests (Device Fundamentals)

The document describes two I/O tests that are part of the Device Fundamentals tests in Windows: the Device I/O test and the Simple I/O stress test with I/O process termination. The Device I/O test performs basic I/O testing on devices, while the Simple I/O stress test performs I/O testing in a separate process and terminates the I/O process after a specified period and number of test cycles. Both tests can be configured using parameters like test cycles, I/O period, and I/O type.

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10/22/21, 3:01 PM I/O Tests (Device Fundamentals) - Windows drivers | Microsoft Docs

I/O Tests (Device Fundamentals)


12/08/2020 • 2 minutes to read •

In this article
I/O tests
Related topics

The Device Fundamentals I/O tests perform basic I/O testing on the specified devices.

I/O tests
Test Description

Device I/O This test performs basic I/O testing on


devices.

Test binary: Devfund_Device_IO.wsc

Test method: DeviceIO

Parameters: - see Device Fundamentals Test


Parameters

DQ

TestCycles

IOPeriod

IOType

https://docs.microsoft.com/en-us/windows-hardware/drivers/devtest/i-o-tests--device-fundamentals- 1/3
10/22/21, 3:01 PM I/O Tests (Device Fundamentals) - Windows drivers | Microsoft Docs

Test Description

Simple I/O stress test with I/O process This test performs simple I/O testing on
termination devices in a separate process and terminates
the I/O process after the specified I/O period
and test cycles.

Test binary:
Devfund_SimpleIoStress_TermIoProc.wsc

Test method: SimpleIOStress_TermIoProc

Parameters: - see Device Fundamentals Test


Parameters

DQ

TestCycles

IOPeriod

Related topics
How to How to test a driver at runtime using Visual Studio

How to select and configure the Device Fundamentals tests

Device Fundamentals Tests

Device Fundamentals Test Parameters

Provided WDTF Simple I/O plug-ins

How to test a driver at runtime from a Command Prompt

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