SiC
Silicon Carbide Diode
5 t h Generation thinQ! T M
650V SiC Schottky Diode
IDH12G65C5
Final Datasheet
Rev. 2.2, 2012-12-10
Power Management & Multimarket
5th Generation thinQ!™ SiC Schottky Diode IDH12G65C5
1 Description
ThinQ!™ Generation 5 represents Infineon leading edge technology for the SiC
Schottky Barrier diodes. The Infineon proprietary diffusion soldering process,
already introduced with G3 is now combined with a new, more compact design and
thin-wafer technology. The result is a new family of products showing improved
efficiency over all load conditions, resulting from both the improved thermal
characteristics and a lower figure of merit (Qc x Vf).
The new thinQ!™ Generation 5 has been designed to complement our 650V
CoolMOS™ families: this ensures meeting the most stringent application 1
2
requirements in this voltage range.
Features
Revolutionary semiconductor material - Silicon Carbide
Benchmark switching behavior
No reverse recovery/ No forward recovery
Temperature independent switching behavior
High surge current capability
Pb-free lead plating; RoHS compliant
Qualified according to JEDEC1) for target applications
Breakdown voltage tested at 27 mA2)
Optimized for high temperature operation
Benefits
System efficiency improvement over Si diodes
System cost / size savings due to reduced cooling requirements
Enabling higher frequency / increased power density solutions
Higher system reliability due to lower operating temperatures
Reduced EMI
Applications
Switch mode power supply
Power factor correction
Solar inverter
Uninterruptible power supply
Table 1 Key Performance Parameters
Parameter Value Unit
VDC 650 V
QC; VR=400V 18 nC
EC; VR=400V 4.1 µJ
IF @ TC < 140°C 12 A
Table 2 Pin Definition
Pin 1 Pin 2 Pin 3
C A n.a.
Type / ordering Code Package Marking Related links
IDH12G65C5 PG-TO220-2 D1265C5 www.infineon.com/sic
1) J-STD20 and JESD22
2) All devices tested under avalanche conditions for a time periode of 10ms
Final Data Sheet 2 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Table of contents
Table of Contents
1 Description.......................................................................................................................................... 2
2 Maximum ratings ................................................................................................................................ 4
3 Thermal characteristics ..................................................................................................................... 4
4 Electrical characteristics ................................................................................................................... 5
5 Electrical characteristics diagrams .................................................................................................. 6
6 Simplified Forward Characteristics Model ...................................................................................... 8
7 Package outlines ................................................................................................................................ 9
8 Revision History ............................................................................................................................... 10
Final Data Sheet 3 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Maximum ratings
2 Maximum ratings
Table 3 Maximum ratings
Parameter Symbol Values Unit Note/Test Condition
Min. Typ. Max.
Continuous forward current IF – – 12 TC < 140°C, D=1
Surge non-repetitive forward current, IF,SM – – 97 TC = 25°C, tp=10 ms
sine halfwave A
– – 83 TC = 150°C, tp=10 ms
Non-repetitive peak forward current IF,max – – 505 TC = 25°C, tp=10 µs
i²t value ∫ i²dt – – 47 A²s TC = 25°C, tp=10 ms
– – 35 TC = 150°C, tp=10 ms
Repetitive peak reverse voltage VRRM – – 650 V Tj = 25°C
Diode dv/dt ruggedness dv/dt – – 100 V/ns VR=0..480 V
Power dissipation Ptot – – 104 W TC = 25°C
Operating and storage temperature Tj;Tstg -55 – 175 °C
Mounting torque – – 70 Ncm M3 screws
3 Thermal characteristics
Table 4 Thermal characteristics TO-220-2
Parameter Symbol Values Unit Note/Test Condition
Min. Typ. Max.
Thermal resistance, junction-case RthJC – 0.9 1.5
Thermal resistance, junction- RthJA K/W leaded
ambient – – 62
Soldering temperature, Tsold 1.6mm (0.063 in.) from
– – 260 °C
wavesoldering only allowed at leads case for 10 s
Final Data Sheet 4 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Electrical characteristics
4 Electrical characteristics
Table 5 Static characteristics
Parameter Symbol Values Unit Note/Test Condition
Min. Typ. Max.
DC blocking voltage VDC 650 – – IR= 0.19 mA, Tj=25°C
Diode forward voltage VF – 1.5 1.7 V IF= 12 A, Tj=25°C
– 1.8 2.1 IF= 12 A, Tj=150°C
Reverse current IR – 0.65 190 VR=650 V, Tj=25°C
– 0.16 68 µA VR=600 V, Tj=25°C
– 2.4 1350 VR=650 V, Tj=150°C
Table 6 AC characteristics
Parameter Symbol Values Unit Note/Test Condition
Min. Typ. Max.
Total capacitive charge Qc VR=400 V, di/dt=200A/µs,
– 18 nC
IF≤IF,MAX, Tj=150°C
Total Capacitance C – 360 – VR=1 V, f=1 MHz
– 48 – pF VR=300 V, f=1 MHz
– 47 – VR=600 V, f=1 MHz
Final Data Sheet 5 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Electrical characteristics diagrams
5 Electrical characteristics diagrams
Table 7
Power dissipation Diode forward current
120
120 0.1
0.3
100
100 0.5
0.7
1
80 80
Ptot[W]
IF[A]
60 60
40 40
20 20
0 0
25 50 75 100 125 150 175 25 50 75 100 125 150 175
TC[°C] TC[°C]
Ptot=f(TC); RthJC,max IF=f(TC); Tj≤175°C; RthJC,max; parameter D=duty cycle
Table 8
Typical forward characteristics Typical forward characteristics in surge current
120
-55°C
25°C
20 100
-55°C
100°C
80 25°C
15
150°C 100°C
IF [A]
IF [A]
60
10 175°C
40
5
20 150°C
175°C
0
0
0 0.5 1 1.5 2 2.5 3
0 1 2 3 4 5 6
VF [V] VF [V]
IF=f(VF); tp=200 µs; parameter: Tj IF=f(VF); tp=200 µs; parameter: Tj
Final Data Sheet 6 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Electrical characteristics diagrams
Table 9
Typ. capacitance charge vs. current slope1) Typ. reverse current vs. reverse voltage
1.E-5
20
18
16 1.E-6
14
12
QC[nC]
175°C
1.E-7
IR [A]
10
8
150°C
6
1.E-8
4
100°C
2 -55°C
25°C
0 1.E-9
100 300 500 700 900 100 200 300 400 500 600
dIF/dt [A/µs] VR [V]
QC=f(diF/dt); Tj=150°C; VR=400 V; IF≤IF,max IR=f(VR); parameter: Tj
1) Only capacitive charge, guaranteed by design.
Table 10
Max. transient thermal impedance Typ. capacitance vs. reverse voltage
500
450
1 400
350
0.5 300
Zth,jc [K/W]
0.2 250
C [pF]
0.1
0.1 200
0.05
0.02 150
0.01
single pulse 100
50
0.01 0
1.E-06 1.E-03 1.E+00 0 1 10 100 1000
tp [s] VR [V]
Zth,jc=f(tP); parameter: D=tP/T C=f(VR); Tj=25°C; f=1 MHz
Final Data Sheet 7 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Electrical characteristics diagrams
Table 11
Typ. capacitance stored energy
12
10
6
EC [µJ]
0
0 200 400 600
VR [V]
EC=f(VR)
6 Simplified Forward Characteristics Model
Table 12
Equivalent forward current curve Mathematical Equation
V F VTH RDIFF I F
VTH T j 0.001 T j 1.04 V
RDIFF T j 1.07 10-6 T j 1.07 10- 4 T j 0.039
2
IF [A]
1/R
diff
V
th
VF [V]
VF=f(IF) Tj in °C; -55°C < Tj < 175°C; IF < 24 A
Final Data Sheet 8 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Package outlines
7 Package outlines
Figure 1 Outlines TO-220, dimensions in mm/inches
Final Data Sheet 9 Rev. 2.2, 2012-12-10
5th Generation thinQ!TM SiC Schottky Diode
IDH12G65C5
Revision History
8 Revision History
5th Generation thinQ!TM SiC Schottky Diode
Revision History: 2012-09-10, Rev. 2.2
Previous Revision:
Revision Subjects (major changes since last version)
2.0 Release of the final datasheet.
2.1 Reverse current values, maximum diode forward voltage.
2.2 Reverse current values, tested avalanche current, simplified calculation model
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[email protected]Edition 2012-12-10
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2012 Infineon Technologies AG
All Rights Reserved.
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Final Data Sheet 10 Rev. 2.2, 2012-12-10
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