—

R E L I O N ® 670 SERIES

Line differential protection RED670

Version 2.1 IEC
Commissioning manual
 Document ID: 1MRK 505 345-UEN
Issued: March 2019
Revision: B
Product version: 2.1

© Copyright 2016 ABB. All rights reserved

Copyright
This document and parts thereof must not be reproduced or copied without written
permission from ABB, and the contents thereof must not be imparted to a third party, nor
used for any unauthorized purpose.

The software and hardware described in this document is furnished under a license and may
be used or disclosed only in accordance with the terms of such license.

This product includes software developed by the OpenSSL Project for use in the OpenSSL
Toolkit. (http://www.openssl.org/) This product includes cryptographic software written/
developed by: Eric Young ([email protected]) and Tim Hudson ([email protected]).

Trademarks
ABB and Relion are registered trademarks of the ABB Group. All other brand or product names
mentioned in this document may be trademarks or registered trademarks of their respective
holders.

Warranty
Please inquire about the terms of warranty from your nearest ABB representative.
Disclaimer
The data, examples and diagrams in this manual are included solely for the concept or product
description and are not to be deemed as a statement of guaranteed properties. All persons
responsible for applying the equipment addressed in this manual must satisfy themselves that
each intended application is suitable and acceptable, including that any applicable safety or
other operational requirements are complied with. In particular, any risks in applications where
a system failure and/or product failure would create a risk for harm to property or persons
(including but not limited to personal injuries or death) shall be the sole responsibility of the
person or entity applying the equipment, and those so responsible are hereby requested to
ensure that all measures are taken to exclude or mitigate such risks.

This document has been carefully checked by ABB but deviations cannot be completely ruled
out. In case any errors are detected, the reader is kindly requested to notify the manufacturer.
Other than under explicit contractual commitments, in no event shall ABB be responsible or
liable for any loss or damage resulting from the use of this manual or the application of the
equipment.
Conformity
This product complies with the directive of the Council of the European Communities on the
approximation of the laws of the Member States relating to electromagnetic compatibility
(EMC Directive 2004/108/EC) and concerning electrical equipment for use within specified
voltage limits (Low-voltage directive 2006/95/EC). This conformity is the result of tests
conducted by ABB in accordance with the product standard EN 60255-26 for the EMC directive,
and with the product standards EN 60255-1 and EN 60255-27 for the low voltage directive. The
product is designed in accordance with the international standards of the IEC 60255 series.
 Table of contents

Table of contents

Section 1 Introduction....................................................................................................... 11
1.1 This manual........................................................................................................................................11
1.2 Intended audience............................................................................................................................ 11
1.3 Product documentation..................................................................................................................12
1.3.1 Product documentation set.......................................................................................................12
1.3.2 Document revision history......................................................................................................... 13
1.3.3 Related documents......................................................................................................................13
1.4 Document symbols and conventions...........................................................................................14
1.4.1 Symbols......................................................................................................................................... 14
1.4.2 Document conventions...............................................................................................................15
1.5 IEC61850 edition 1 / edition 2 mapping...................................................................................... 15

Section 2 Safety information........................................................................................... 23

2.1 Symbols on the product................................................................................................................. 23
2.2 Warnings............................................................................................................................................ 23
2.3 Caution signs.................................................................................................................................... 24
2.4 Note signs..........................................................................................................................................25

Section 3 Available functions........................................................................................... 27

3.1 Main protection functions..............................................................................................................27
3.2 Back-up protection functions....................................................................................................... 29
3.3 Control and monitoring functions................................................................................................ 31
3.4 Communication................................................................................................................................35
3.5 Basic IED functions..........................................................................................................................38

Section 4 Starting up.........................................................................................................41

4.1 Factory and site acceptance testing............................................................................................41
4.2 Commissioning checklist............................................................................................................... 41
4.3 Checking the power supply............................................................................................................42
4.4 Energizing the IED........................................................................................................................... 42
4.4.1 Checking the IED operation.......................................................................................................42
4.4.2 IED start-up sequence................................................................................................................ 42
4.5 Setting up communication between PCM600 and the IED.....................................................43
4.6 Writing an application configuration to the IED....................................................................... 48
4.7 Checking CT circuits........................................................................................................................48
4.8 Checking VT circuits........................................................................................................................49
4.9 Using the RTXP test switch........................................................................................................... 49
4.10 Checking the binary I/O circuits...................................................................................................50
4.10.1 Binary input circuits....................................................................................................................50
4.10.2 Binary output circuits................................................................................................................. 50
4.11 Checking optical connections....................................................................................................... 50

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Section 5 Configuring the IED and changing settings.................................................. 51

5.1 Overview.............................................................................................................................................51
5.2 Configuring analog CT inputs........................................................................................................51
5.3 Reconfiguring the IED..................................................................................................................... 52

Section 6 Establishing connection and verifying the SPA/IEC communication........53

6.1 Entering settings............................................................................................................................. 53
6.1.1 Entering SPA settings.................................................................................................................53
6.1.2 Entering IEC settings.................................................................................................................. 53
6.2 Verifying the communication........................................................................................................54
6.2.1 Verifying SPA communication.................................................................................................. 54
6.2.2 Verifying IEC communication................................................................................................... 54
6.3 fiber optic loop.................................................................................................................................54
6.4 Optical budget calculation for serial communication with SPA/IEC ................................... 55

Section 7 Establishing connection and verifying the LON communication............... 57

7.1 Communication via the rear ports ...............................................................................................57
7.1.1 LON communication................................................................................................................... 57
7.1.2 The LON Protocol........................................................................................................................ 58
7.1.3 Hardware and software modules.............................................................................................58
7.2 Optical budget calculation for serial communication with LON .......................................... 60

Section 8 Establishing connection and verifying the IEC 61850 communication..... 61

8.1 Overview.............................................................................................................................................61
8.2 Setting the station communication............................................................................................. 61
8.3 Verifying the communication........................................................................................................ 62

Section 9 Testing IED operation...................................................................................... 63

9.1 Preparing for test............................................................................................................................ 63
9.1.1 Requirements............................................................................................................................... 63
9.1.2 Preparing the IED to verify settings........................................................................................ 64
9.2 Activating the test mode................................................................................................................65
9.3 Preparing the connection to the test equipment..................................................................... 65
9.4 Connecting the test equipment to the IED................................................................................ 66
9.5 Releasing the function to be tested.............................................................................................67
9.6 Verifying analog primary and secondary measurement..........................................................68
9.7 Testing the protection functionality........................................................................................... 69
9.8 Forcing of binary I/O signals for testing.................................................................................... 69
9.8.1 Forcing concept...........................................................................................................................69
9.8.2 How to enable forcing................................................................................................................ 70
9.8.2.1 Enable forcing by using LHMI................................................................................................ 70
9.8.2.2 Enable forcing using TESTMODE function block...............................................................70
9.8.3 How to change binary input/output signals using forcing................................................ 70
9.8.3.1 Forcing by using LHMI.............................................................................................................70
9.8.3.2 Forcing by using PCM600....................................................................................................... 72
9.8.4 How to undo forcing changes and return the IED to normal operation...........................73
9.8.4.1 Undo forcing by using TestMode component................................................................... 74

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9.8.4.2 Undo forcing by using LHMI...................................................................................................74

9.8.4.3 Undo forcing by using PCM600.............................................................................................74

Section 10 Testing functionality by secondary injection............................................... 75

10.1 Testing disturbance report............................................................................................................75
10.1.1 Introduction.................................................................................................................................. 75
10.1.2 Disturbance report settings......................................................................................................75
10.1.3 Disturbance recorder (DR)......................................................................................................... 75
10.1.4 Event recorder (ER) and Event list (EL)................................................................................... 76
10.2 Identifying the function to test in the technical reference manual ...................................... 76
10.3 Differential protection.................................................................................................................... 76
10.3.1 High impedance differential protection HZPDIF ................................................................. 76
10.3.1.1 Verifying the settings.............................................................................................................. 77
10.3.1.2 Completing the test................................................................................................................. 77
10.3.2 Restricted earth-fault protection, low impedance REFPDIF .............................................. 77
10.3.2.1 Verifying the settings.............................................................................................................. 77
10.3.2.2 Completing the test.................................................................................................................78
10.3.3 Line differential protection L3CPDIF and L6CPDIF.............................................................. 78
10.3.3.1 Verifying the settings.............................................................................................................. 79
10.3.3.2 Completing the test.................................................................................................................79
10.3.4 Additional security logic for differential protection LDRGFC ........................................... 80
10.3.4.1 Verifying the settings..............................................................................................................80
10.3.4.2 Completing the test.................................................................................................................81
10.4 Impedance protection.....................................................................................................................81
10.4.1 Distance protection zones, quadrilateral characteristic ZMQPDIS...................................81
10.4.1.1 Measuring the operating limit of set values.......................................................................84
10.4.1.2 Measuring the operating time of distance protection zones.........................................85
10.4.1.3 Completing the test................................................................................................................ 85
10.4.2 Phase selection with load encroachment, quadrilateral characteristic FDPSPDIS .......85
10.4.2.1 Measuring the operating limit of set values.......................................................................87
10.4.2.2 Completing the test................................................................................................................ 88
10.4.3 Full scheme distance protection, mho characteristic ZMHPDIS....................................... 88
10.4.3.1 Phase-to-phase faults............................................................................................................. 89
10.4.3.2 Phase-to-earth faults.............................................................................................................. 89
10.4.4 Faulty phase identification with load encroachment FMPSPDIS ..................................... 90
10.4.5 Distance protection zones, quadrilateral characteristic, separate settings
ZMRPDIS........................................................................................................................................90
10.4.5.1 Measuring the operating limit of set values.......................................................................93
10.4.5.2 Measuring the operating time of distance protection zones.........................................94
10.4.6 Phase selection, quadrilateral characteristic with settable angle FRPSPDIS................. 94
10.4.6.1 Measuring the operating limit of set values.......................................................................96
10.4.6.2 Completing the test.................................................................................................................97
10.4.7 High speed distance protection zones, quadrilateral and mho characteristic
ZMFPDIS........................................................................................................................................ 97
10.4.7.1 Measuring the operating limit of set values.....................................................................100
10.4.7.2 Measuring the operating time of distance protection zones.......................................100
10.4.7.3 Completing the test............................................................................................................... 101

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10.4.8 High Speed distance for series compensated line zones, quadrilateral and mho
characteristic ZMFCPDIS .........................................................................................................101
10.4.8.1 Measuring the operating limit of set values.....................................................................104
10.4.8.2 Measuring the operating time of distance protection zones.......................................104
10.4.8.3 Completing the test...............................................................................................................105
10.4.9 Power swing detection ZMRPSB ........................................................................................... 105
10.4.9.1 Verifying the settings............................................................................................................106
10.4.9.2 Testing the power swing detection function ZMRPSB ..................................................107
10.4.9.3 Testing the tR1 timer............................................................................................................. 107
10.4.9.4 Testing the block input, interaction between FDPSPDIS or FRPSPDIS
and ZMRPSB ........................................................................................................................... 107
10.4.9.5 Completing the test.............................................................................................................. 108
10.4.10 Power swing logic PSLPSCH................................................................................................... 108
10.4.10.1 Testing the carrier send and trip signals.......................................................................... 108
10.4.10.2 Testing the influence of the residual overcurrent protection...................................... 109
10.4.10.3 Checking the underreaching zone...................................................................................... 109
10.4.10.4 Completing the test.............................................................................................................. 109
10.4.11 Pole slip protection PSPPPAM................................................................................................ 109
10.4.11.1 Verifying the settings............................................................................................................ 110
10.4.11.2 Completing the test............................................................................................................... 112
10.4.12 Out-of-step protection OOSPPAM......................................................................................... 112
10.4.12.1 Verifying the settings.............................................................................................................113
10.4.12.2 Test of point RE (RFwdR, XFwdX).............................................................................................116
10.4.12.3 Test of the boundary between zone 1 and zone 2, which is defined by the
parameter ReachZ1................................................................................................................ 120
10.4.12.4 Test of the point SE (RRvsR, XRvsX)........................................................................................123
10.4.13 Automatic switch onto fault logic ZCVPSOF........................................................................127
10.4.13.1 Activating ZCVPSOF externally............................................................................................128
10.4.13.2 Initiating ZCVPSOF automatically and setting mode to impedance...........................128
10.4.13.3 Initiating ZCVPSOF automatically and setting mode to UILevel ................................. 128
10.4.13.4 Completing the test...............................................................................................................128
10.4.14 Phase preference logic PPLPHIZ ............................................................................................128
10.4.14.1 Completing the test...............................................................................................................129
10.5 Current protection......................................................................................................................... 129
10.5.1 Instantaneous phase overcurrent protection 3-phase output PHPIOC ........................ 129
10.5.1.1 Measuring the operate limit of set values.........................................................................130
10.5.1.2 Completing the test...............................................................................................................130
10.5.2 Four step phase overcurrent protection 3-phase output OC4PTOC.............................. 130
10.5.2.1 Verifying the settings............................................................................................................ 130
10.5.2.2 Completing the test............................................................................................................... 131
10.5.3 Instantaneous residual overcurrent protection EFPIOC ................................................... 131
10.5.3.1 Measuring the operate limit of set values......................................................................... 131
10.5.3.2 Completing the test............................................................................................................... 132
10.5.4 Four step residual overcurrent protection, (Zero sequence or negative sequence
directionality) EF4PTOC .......................................................................................................... 132
10.5.4.1 Four step directional earth fault protection..................................................................... 132

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10.5.4.2 Four step non-directional earth fault protection.............................................................132

10.5.4.3 Completing the test............................................................................................................... 133
10.5.5 Four step negative sequence overcurrent protection NS4PTOC ....................................133
10.5.5.1 Completing the test...............................................................................................................134
10.5.6 Sensitive directional residual overcurrent and power protection SDEPSDE ................134
10.5.6.1 Measuring the operate and time limit for set values......................................................134
10.5.6.2 Completing the test...............................................................................................................138
10.5.7 Thermal overload protection, one time constant, Celsius/Fahrenheit
LCPTTR/LFPTTR.........................................................................................................................138
10.5.7.1 Measuring the operate and time limit of set values....................................................... 138
10.5.7.2 Completing the test...............................................................................................................139
10.5.8 Breaker failure protection, phase segregated activation and output CCRBRF............ 139
10.5.8.1 Checking the phase current operate value, IP>................................................................139
10.5.8.2 Checking the residual (earth fault) current operate value IN> set below IP>............ 139
10.5.8.3 Checking the re-trip and back-up times............................................................................140
10.5.8.4 Verifying the re-trip mode....................................................................................................140
10.5.8.5 Verifying the back-up trip mode......................................................................................... 140
10.5.8.6 Verifying instantaneous back-up trip at CB faulty condition........................................ 141
10.5.8.7 Verifying the case RetripMode = Contact..........................................................................141
10.5.8.8 Verifying the function mode Current&Contact................................................................ 142
10.5.8.9 Completing the test...............................................................................................................142
10.5.9 Stub protection STBPTOC....................................................................................................... 142
10.5.9.1 Measuring the operate limit of set values.........................................................................143
10.5.9.2 Completing the test...............................................................................................................143
10.5.10 Pole discordance protection CCPDSC................................................................................... 143
10.5.10.1 Verifying the settings............................................................................................................ 143
10.5.10.2 Completing the test.............................................................................................................. 144
10.5.11 Directional underpower protection GUPPDUP ...................................................................144
10.5.11.1 Verifying the settings............................................................................................................144
10.5.11.2 Completing the test...............................................................................................................146
10.5.12 Directional overpower protection GOPPDOP ..................................................................... 146
10.5.12.1 Verifying the settings............................................................................................................146
10.5.12.2 Completing the test...............................................................................................................146
10.5.13 Broken conductor check BRCPTOC .......................................................................................146
10.5.13.1 Measuring the operate and time limit of set values....................................................... 146
10.5.13.2 Completing the test...............................................................................................................147
10.5.14 Voltage-restrained time overcurrent protection VRPVOC................................................ 147
10.5.14.1 Verifying the settings............................................................................................................ 147
10.5.14.2 Completing the test...............................................................................................................150
10.6 Voltage protection.........................................................................................................................150
10.6.1 Two step undervoltage protection UV2PTUV .....................................................................150
10.6.1.1 Verifying the settings............................................................................................................150
10.6.1.2 Completing the test............................................................................................................... 151
10.6.2 Two step overvoltage protection OV2PTOV ........................................................................151
10.6.2.1 Verifying the settings............................................................................................................ 151
10.6.2.2 Extended testing.................................................................................................................... 152

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10.6.2.3 Completing the test...............................................................................................................152

10.6.3 Two step residual overvoltage protection ROV2PTOV ..................................................... 152
10.6.3.1 Verifying the settings............................................................................................................ 152
10.6.3.2 Completing the test...............................................................................................................153
10.6.4 Overexcitation protection OEXPVPH ....................................................................................153
10.6.4.1 Verifying the settings............................................................................................................ 153
10.6.4.2 Completing the test...............................................................................................................154
10.6.5 Voltage differential protection VDCPTOV ........................................................................... 154
10.6.5.1 Check of undervoltage levels............................................................................................... 154
10.6.5.2 Check of voltage differential trip and alarm levels..........................................................156
10.6.5.3 Check of trip and trip reset timers..................................................................................... 157
10.6.5.4 Final adjustment of compensation for VT ratio differences ........................................158
10.6.5.5 Completing the test...............................................................................................................158
10.6.6 Loss of voltage check LOVPTUV ............................................................................................ 158
10.6.6.1 Measuring the operate limit of set values.........................................................................158
10.6.6.2 Completing the test...............................................................................................................159
10.6.7 Radial feeder protection PAPGAPC........................................................................................ 159
10.6.7.1 Verifying the settings............................................................................................................ 159
10.6.7.2 Completing the test.............................................................................................................. 160
10.7 Frequency protection....................................................................................................................160
10.7.1 Underfrequency protection SAPTUF .................................................................................... 160
10.7.1.1 Verifying the settings............................................................................................................160
10.7.1.2 Completing the test............................................................................................................... 161
10.7.2 Overfrequency protection SAPTOF ....................................................................................... 161
10.7.2.1 Verifying the settings............................................................................................................ 161
10.7.2.2 Completing the test...............................................................................................................162
10.7.3 Rate-of-change frequency protection SAPFRC ...................................................................162
10.7.3.1 Verifying the settings............................................................................................................ 162
10.7.3.2 Completing the test...............................................................................................................163
10.8 Multipurpose protection.............................................................................................................. 163
10.8.1 General current and voltage protection CVGAPC............................................................... 163
10.8.1.1 Built-in overcurrent feature (non-directional).................................................................. 163
10.8.1.2 Overcurrent feature with current restraint.......................................................................164
10.8.1.3 Overcurrent feature with voltage restraint...................................................................... 164
10.8.1.4 Overcurrent feature with directionality.............................................................................164
10.8.1.5 Over/Undervoltage feature..................................................................................................165
10.8.1.6 Completing the test...............................................................................................................165
10.9 Secondary system supervision....................................................................................................165
10.9.1 Current circuit supervision CCSSPVC.................................................................................... 165
10.9.1.1 Verifying the settings............................................................................................................ 165
10.9.1.2 Completing the test...............................................................................................................166
10.9.2 Fuse failure supervision FUFSPVC......................................................................................... 166
10.9.2.1 Checking that the binary inputs and outputs operate as expected ........................... 166
10.9.2.2 Measuring the operate value for the negative sequence function ............................. 166
10.9.2.3 Measuring the operate value for the zero-sequence function ..................................... 167
10.9.2.4 Measuring the operate value for the dead line detection function............................. 168

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10.9.2.5 Checking the operation of the du/dt and di/dt based function .................................168
10.9.2.6 Completing the test...............................................................................................................169
10.9.3 Fuse failure supervision VDSPVC........................................................................................... 169
10.9.3.1 Completing the test...............................................................................................................170
10.10 Control..............................................................................................................................................170
10.10.1 Synchrocheck, energizing check, and synchronizing SESRSYN........................................170
10.10.1.1 Testing the synchronizing function.................................................................................... 171
10.10.1.2 Testing the synchrocheck check..........................................................................................172
10.10.1.3 Testing the energizing check............................................................................................... 174
10.10.1.4 Testing the voltage selection...............................................................................................175
10.10.1.5 Completing the test............................................................................................................... 177
10.10.2 Autorecloser for 1/2/3-phase operation SMBRREC ........................................................... 177
10.10.2.1 Preparation of the verification ........................................................................................... 179
10.10.2.2 Switching the autorecloser for 1/2/3-phase operation function to On and Off.......179
10.10.2.3 Verifying the autorecloser function SMBRREC ............................................................... 180
10.10.2.4 Checking the reclosing conditions .................................................................................... 180
10.10.2.5 Completing the test...............................................................................................................182
10.10.3 Apparatus control APC............................................................................................................. 182
10.10.4 Single command, 16 signals SINGLECMD............................................................................. 182
10.10.5 Interlocking................................................................................................................................. 182
10.11 Scheme communication............................................................................................................... 183
10.11.1 Scheme communication logic for distance or overcurrent protection ZCPSCH ......... 183
10.11.1.1 Testing permissive underreaching..................................................................................... 183
10.11.1.2 Testing permissive overreaching........................................................................................183
10.11.1.3 Testing blocking scheme......................................................................................................184
10.11.1.4 Testing delta blocking scheme........................................................................................... 184
10.11.1.5 Checking of unblocking logic...............................................................................................184
10.11.1.6 Completing the test...............................................................................................................185
10.11.2 Phase segregated scheme communication logic for distance or overcurrent
protection ZC1PPSCH .............................................................................................................. 185
10.11.2.1 Testing permissive underreaching..................................................................................... 185
10.11.2.2 Testing permissive overreaching........................................................................................185
10.11.2.3 Testing blocking scheme......................................................................................................186
10.11.2.4 Completing the test...............................................................................................................186
10.11.3 Current reversal and Weak-end infeed logic for distance protection 3-phase
ZCRWPSCH .................................................................................................................................186
10.11.3.1 Current reversal logic............................................................................................................ 186
10.11.3.2 Weak end infeed logic............................................................................................................187
10.11.3.3 Completing the test...............................................................................................................188
10.11.4 Local acceleration logic ZCLCPSCH.......................................................................................188
10.11.4.1 Verifying the settings............................................................................................................188
10.11.4.2 Completing the test...............................................................................................................188
10.11.5 Scheme communication logic for residual overcurrent protection ECPSCH ............... 188
10.11.5.1 Testing the directional comparison logic function.........................................................189
10.11.5.2 Completing the test.............................................................................................................. 190
10.11.6 Current reversal and weak-end infeed logic for residual overcurrent protection
ECRWPSCH .................................................................................................................................190

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10.11.6.1 Testing the current reversal logic.......................................................................................190

10.11.6.2 Testing the weak-end infeed logic..................................................................................... 190
10.11.6.3 Completing the test...............................................................................................................192
10.11.7 Direct transfer trip logic...........................................................................................................192
10.11.7.1 Low active power and power factor local criteria LAPPGAPC.......................................192
10.11.7.2 Compensated over- and undervoltage protection COUVGAPC....................................193
10.11.7.3 Sudden change in current variation SCCVPTOC.............................................................. 194
10.11.7.4 Carrier receive logic LCCRPTRC ..........................................................................................194
10.11.7.5 Negative sequence overvoltage protection LCNSPTOV................................................ 196
10.11.7.6 Zero sequence overvoltage protection LCZSPTOV.........................................................196
10.11.7.7 Negative sequence overcurrent protection LCNSPTOC.................................................197
10.11.7.8 Zero sequence overcurrent protection LCZSPTOC.........................................................198
10.11.7.9 Three phase overcurrent LCP3PTOC.................................................................................. 198
10.11.7.10 Three phase undercurrent LCP3PTUC................................................................................198
10.12 Logic................................................................................................................................................. 199
10.12.1 Tripping logic, common 3-phase output SMPPTRC .......................................................... 199
10.12.1.1 Three-phase operating mode.............................................................................................. 199
10.12.1.2 1ph/3ph operating mode..................................................................................................... 199
10.12.1.3 1ph/2ph/3ph operating mode............................................................................................200
10.12.1.4 Circuit breaker lockout..........................................................................................................201
10.12.1.5 Completing the test...............................................................................................................201
10.13 Monitoring.......................................................................................................................................202
10.13.1 Gas medium supervision SSIMG.............................................................................................202
10.13.1.1 Testing the liquid medium supervision for alarm and lock out conditions............... 202
10.13.1.2 Completing the test.............................................................................................................. 202
10.13.2 Liquid medium supervision SSIML.........................................................................................202
10.13.2.1 Testing the liquid medium supervision for alarm and lock out conditions............... 202
10.13.2.2 Completing the test.............................................................................................................. 203
10.13.3 Breaker monitoring SSCBR......................................................................................................203
10.13.3.1 Verifying the settings............................................................................................................203
10.13.3.2 Completing the test.............................................................................................................. 204
10.13.4 Event function EVENT.............................................................................................................. 204
10.13.5 Fault locator LMBRFLO............................................................................................................ 205
10.13.5.1 Measuring the operate limit................................................................................................ 205
10.13.5.2 Completing the test.............................................................................................................. 206
10.13.6 Limit counter L4UFCNT........................................................................................................... 206
10.13.6.1 Completing the test.............................................................................................................. 206
10.14 Metering.......................................................................................................................................... 207
10.14.1 Pulse-counter logic PCFCNT................................................................................................... 207
10.14.2 Function for energy calculation and demand handling ETPMMTR................................. 207
10.14.2.1 Verifying the settings............................................................................................................207
10.14.2.2 Completing the test.............................................................................................................. 208
10.15 Station communication................................................................................................................208
10.15.1 Multiple command and transmit MULTICMDRCV / MULTICMDSND.............................. 208
10.16 Remote communication...............................................................................................................208
10.16.1 Binary signal transfer BinSignReceive, BinSignTransm.................................................... 208

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10.17 Basic IED functions........................................................................................................................ 210

10.17.1 Parameter setting group handling SETGRPS.......................................................................210
10.17.1.1 Verifying the settings............................................................................................................ 210
10.17.1.2 Completing the test...............................................................................................................210
10.18 Exit test mode................................................................................................................................ 210

Section 11 Checking the directionality........................................................................... 211

11.1 Overview........................................................................................................................................... 211
11.2 Testing the directionality of the distance protection.............................................................211

Section 12 Commissioning and maintenance of the fault clearing system............... 213

12.1 Commissioning tests.................................................................................................................... 213
12.2 Periodic maintenance tests......................................................................................................... 213
12.2.1 Visual inspection........................................................................................................................214
12.2.2 Maintenance tests..................................................................................................................... 214
12.2.2.1 Preparation.............................................................................................................................. 214
12.2.2.2 Recording................................................................................................................................. 214
12.2.2.3 Secondary injection............................................................................................................... 214
12.2.2.4 Alarm test.................................................................................................................................215
12.2.2.5 Self supervision check........................................................................................................... 215
12.2.2.6 Trip circuit check.................................................................................................................... 215
12.2.2.7 Measurement of service currents........................................................................................215
12.2.2.8 Restoring..................................................................................................................................216

Section 13 Troubleshooting..............................................................................................217
13.1 Checking the self supervision signals........................................................................................ 217
13.1.1 Checking the self supervision function................................................................................. 217
13.1.1.1 Determine the cause of an internal failure........................................................................ 217
13.1.2 Self supervision HMI data.........................................................................................................217
13.1.2.1 General IED status.................................................................................................................. 217
13.2 Fault tracing.................................................................................................................................... 218
13.2.1 Internal fault indications.......................................................................................................... 218
13.2.2 Using front-connected PC........................................................................................................219
13.2.3 Diagnosing the IED status via the LHMI hint menu............................................................220
13.2.4 Hardware re-configuration......................................................................................................222
13.3 Repair instruction.......................................................................................................................... 223
13.4 Repair support................................................................................................................................224
13.5 Maintenance....................................................................................................................................224

Section 14 Glossary........................................................................................................... 225

9
Commissioning manual
10
1MRK 505 345-UEN B Section 1
Introduction

Section 1 Introduction

1.1 This manual GUID-AB423A30-13C2-46AF-B7FE-A73BB425EB5F v19

The commissioning manual contains instructions on how to commission the IED. The manual
can also be used by system engineers and maintenance personnel for assistance during the
testing phase. The manual provides procedures for the checking of external circuitry and
energizing the IED, parameter setting and configuration as well as verifying settings by
secondary injection. The manual describes the process of testing an IED in a substation which
is not in service. The chapters are organized in the chronological order in which the IED should
be commissioned. The relevant procedures may be followed also during the service and
maintenance activities.

1.2 Intended audience GUID-C9B8127F-5748-4BEA-9E4F-CC762FE28A3A v10

This manual addresses the personnel responsible for commissioning, maintenance and taking
the IED in and out of normal service.

The commissioning personnel must have a basic knowledge of handling electronic equipment.
The commissioning and maintenance personnel must be well experienced in using protection
equipment, test equipment, protection functions and the configured functional logics in the
IED.

11
Commissioning manual
Section 1 1MRK 505 345-UEN B
Introduction

1.3 Product documentation

1.3.1 Product documentation set GUID-3AA69EA6-F1D8-47C6-A8E6-562F29C67172 v15

Deinstalling & disposal

Planning & purchase

Decommissioning
Commissioning

Maintenance
Engineering

Operation
Installing
Engineering manual
Installation manual

Commissioning manual
Operation manual

Application manual

Technical manual

Communication
protocol manual
Cyber security
deployment guideline
IEC07000220-4-en.vsd
IEC07000220 V4 EN-US

Figure 1: The intended use of manuals throughout the product lifecycle

The engineering manual contains instructions on how to engineer the IEDs using the various
tools available within the PCM600 software. The manual provides instructions on how to set
up a PCM600 project and insert IEDs to the project structure. The manual also recommends a
sequence for the engineering of protection and control functions, LHMI functions as well as
communication engineering for IEC 60870-5-103, IEC 61850, DNP3, LON and SPA.

The installation manual contains instructions on how to install the IED. The manual provides
procedures for mechanical and electrical installation. The chapters are organized in the
chronological order in which the IED should be installed.

The commissioning manual contains instructions on how to commission the IED. The manual
can also be used by system engineers and maintenance personnel for assistance during the
testing phase. The manual provides procedures for the checking of external circuitry and
energizing the IED, parameter setting and configuration as well as verifying settings by
secondary injection. The manual describes the process of testing an IED in a substation which
is not in service. The chapters are organized in the chronological order in which the IED should
be commissioned. The relevant procedures may be followed also during the service and
maintenance activities.

The operation manual contains instructions on how to operate the IED once it has been
commissioned. The manual provides instructions for the monitoring, controlling and setting of
the IED. The manual also describes how to identify disturbances and how to view calculated
and measured power grid data to determine the cause of a fault.

12
Commissioning manual
1MRK 505 345-UEN B Section 1
Introduction

The application manual contains application descriptions and setting guidelines sorted per
function. The manual can be used to find out when and for what purpose a typical protection
function can be used. The manual can also provide assistance for calculating settings.

The technical manual contains operation principle descriptions, and lists function blocks, logic
diagrams, input and output signals, setting parameters and technical data, sorted per
function. The manual can be used as a technical reference during the engineering phase,
installation and commissioning phase, and during normal service.

The communication protocol manual describes the communication protocols supported by

the IED. The manual concentrates on the vendor-specific implementations.

The point list manual describes the outlook and properties of the data points specific to the
IED. The manual should be used in conjunction with the corresponding communication
protocol manual.

The cyber security deployment guideline describes the process for handling cyber security
when communicating with the IED. Certification, Authorization with role based access control,
and product engineering for cyber security related events are described and sorted by
function. The guideline can be used as a technical reference during the engineering phase,
installation and commissioning phase, and during normal service.

1.3.2 Document revision history GUID-C8027F8A-D3CB-41C1-B078-F9E59BB73A6C v2.1.1

Document revision/date History

January 2016 First Release
March 2019 Maintenance Release

1.3.3 Related documents GUID-94E8A5CA-BE1B-45AF-81E7-5A41D34EE112 v4

Documents related to RED670 Document numbers

Application manual 1MRK 505 343-UEN
Commissioning manual 1MRK 505 345-UEN
Product guide 1MRK 505 346-BEN
Technical manual 1MRK 505 308-UEN
Type test certificate 1MRK 505 346-TEN

670 series manuals Document numbers

Operation manual 1MRK 500 123-UEN
Engineering manual 1MRK 511 355-UEN
Installation manual 1MRK 514 024-UEN
Communication protocol manual, DNP3 1MRK 511 348-UUS
Communication protocol manual, IEC 60870-5-103 1MRK 511 351-UEN
Communication protocol manual, IEC 61850 Edition 1 1MRK 511 349-UEN
Communication protocol manual, IEC 61850 Edition 2 1MRK 511 350-UEN
Communication protocol manual, LON 1MRK 511 352-UEN
Communication protocol manual, SPA 1MRK 511 353-UEN
Point list manual, DNP3 1MRK 511 354-UUS
Accessories guide 1MRK 514 012-BEN
Table continues on next page

13
Commissioning manual
Section 1 1MRK 505 345-UEN B
Introduction

670 series manuals Document numbers

Cyber security deployment guideline 1MRK 511 356-UEN
Connection and Installation components 1MRK 513 003-BEN
Test system, COMBITEST 1MRK 512 001-BEN

1.4 Document symbols and conventions

1.4.1 Symbols GUID-2945B229-DAB0-4F15-8A0E-B9CF0C2C7B15 v12

The electrical warning icon indicates the presence of a hazard which could
result in electrical shock.

The warning icon indicates the presence of a hazard which could result in
personal injury.

The caution hot surface icon indicates important information or warning about
the temperature of product surfaces.

Class 1 Laser product. Take adequate measures to protect the eyes and do not
view directly with optical instruments.

The caution icon indicates important information or warning related to the

concept discussed in the text. It might indicate the presence of a hazard which
could result in corruption of software or damage to equipment or property.

The information icon alerts the reader of important facts and conditions.

The tip icon indicates advice on, for example, how to design your project or
how to use a certain function.

Although warning hazards are related to personal injury, it is necessary to understand that
under certain operational conditions, operation of damaged equipment may result in
degraded process performance leading to personal injury or death. It is important that the
user fully complies with all warning and cautionary notices.

14
Commissioning manual
1MRK 505 345-UEN B Section 1
Introduction

1.4.2 Document conventions GUID-96DFAB1A-98FE-4B26-8E90-F7CEB14B1AB6 v8

• Abbreviations and acronyms in this manual are spelled out in the glossary. The glossary
also contains definitions of important terms.
• Push button navigation in the LHMI menu structure is presented by using the push button
icons.
For example, to navigate between the options, use and .
• HMI menu paths are presented in bold.
For example, select Main menu/Settings.
• LHMI messages are shown in Courier font.
For example, to save the changes in non-volatile memory, select Yes and press .
• Parameter names are shown in italics.
For example, the function can be enabled and disabled with the Operation setting.
• Each function block symbol shows the available input/output signal.
• the character ^ in front of an input/output signal name indicates that the signal
name may be customized using the PCM600 software.
• the character * after an input signal name indicates that the signal must be
connected to another function block in the application configuration to achieve a
valid application configuration.
• Dimensions are provided both in inches and millimeters. If it is not specifically mentioned
then the dimension is in millimeters.

1.5 IEC61850 edition 1 / edition 2 mapping GUID-C5133366-7260-4C47-A975-7DBAB3A33A96 v2

Table 1: IEC61850 edition 1 / edition 2 mapping

Function block name Edition 1 logical nodes Edition 2 logical nodes
AEGPVOC AEGGAPC AEGPVOC
AGSAL AGSAL AGSAL
SECLLN0
ALMCALH ALMCALH ALMCALH
ALTIM ALTIM
ALTMS ALTMS
ALTRK ALTRK
BCZSPDIF BCZSPDIF BCZSPDIF
BCZTPDIF BCZTPDIF BCZTPDIF
BDCGAPC SWSGGIO BBCSWI
BDCGAPC
BRCPTOC BRCPTOC BRCPTOC
BRPTOC BRPTOC BRPTOC
BTIGAPC B16IFCVI BTIGAPC
BUSPTRC_B1 BUSPTRC BUSPTRC
BBSPLLN0
BUSPTRC_B2 BUSPTRC BUSPTRC
BUSPTRC_B3 BUSPTRC BUSPTRC
BUSPTRC_B4 BUSPTRC BUSPTRC
BUSPTRC_B5 BUSPTRC BUSPTRC
BUSPTRC_B6 BUSPTRC BUSPTRC
BUSPTRC_B7 BUSPTRC BUSPTRC
Table continues on next page

15
Commissioning manual
Section 1 1MRK 505 345-UEN B
Introduction

Function block name Edition 1 logical nodes Edition 2 logical nodes

BUSPTRC_B8 BUSPTRC BUSPTRC
BUSPTRC_B9 BUSPTRC BUSPTRC
BUSPTRC_B10 BUSPTRC BUSPTRC
BUSPTRC_B11 BUSPTRC BUSPTRC
BUSPTRC_B12 BUSPTRC BUSPTRC
BUSPTRC_B13 BUSPTRC BUSPTRC
BUSPTRC_B14 BUSPTRC BUSPTRC
BUSPTRC_B15 BUSPTRC BUSPTRC
BUSPTRC_B16 BUSPTRC BUSPTRC
BUSPTRC_B17 BUSPTRC BUSPTRC
BUSPTRC_B18 BUSPTRC BUSPTRC
BUSPTRC_B19 BUSPTRC BUSPTRC
BUSPTRC_B20 BUSPTRC BUSPTRC
BUSPTRC_B21 BUSPTRC BUSPTRC
BUSPTRC_B22 BUSPTRC BUSPTRC
BUSPTRC_B23 BUSPTRC BUSPTRC
BUSPTRC_B24 BUSPTRC BUSPTRC
BUTPTRC_B1 BUTPTRC BUTPTRC
BBTPLLN0
BUTPTRC_B2 BUTPTRC BUTPTRC
BUTPTRC_B3 BUTPTRC BUTPTRC
BUTPTRC_B4 BUTPTRC BUTPTRC
BUTPTRC_B5 BUTPTRC BUTPTRC
BUTPTRC_B6 BUTPTRC BUTPTRC
BUTPTRC_B7 BUTPTRC BUTPTRC
BUTPTRC_B8 BUTPTRC BUTPTRC
BZISGGIO BZISGGIO BZISGAPC
BZITGGIO BZITGGIO BZITGAPC
BZNSPDIF_A BZNSPDIF BZASGAPC
BZASPDIF
BZNSGAPC
BZNSPDIF
BZNSPDIF_B BZNSPDIF BZBSGAPC
BZBSPDIF
BZNSGAPC
BZNSPDIF
BZNTPDIF_A BZNTPDIF BZATGAPC
BZATPDIF
BZNTGAPC
BZNTPDIF
BZNTPDIF_B BZNTPDIF BZBTGAPC
BZBTPDIF
BZNTGAPC
BZNTPDIF
Table continues on next page

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Commissioning manual
1MRK 505 345-UEN B Section 1
Introduction

Function block name Edition 1 logical nodes Edition 2 logical nodes

CBPGAPC CBPLLN0 CBPMMXU
CBPMMXU CBPPTRC
CBPPTRC HOLPTOV
HOLPTOV HPH1PTOV
HPH1PTOV PH3PTOC
PH3PTUC PH3PTUC
PH3PTOC RP3PDOP
RP3PDOP
CCPDSC CCRPLD CCPDSC
CCRBRF CCRBRF CCRBRF
CCRWRBRF CCRWRBRF CCRWRBRF
CCSRBRF CCSRBRF CCSRBRF
CCSSPVC CCSRDIF CCSSPVC
CMMXU CMMXU CMMXU
CMSQI CMSQI CMSQI
COUVGAPC COUVLLN0 COUVPTOV
COUVPTOV COUVPTUV
COUVPTUV
CVGAPC GF2LLN0 GF2MMXN
GF2MMXN GF2PHAR
GF2PHAR GF2PTOV
GF2PTOV GF2PTUC
GF2PTUC GF2PTUV
GF2PTUV GF2PVOC
GF2PVOC PH1PTRC
PH1PTRC
CVMMXN CVMMXN CVMMXN
D2PTOC D2LLN0 D2PTOC
D2PTOC PH1PTRC
PH1PTRC
DPGAPC DPGGIO DPGAPC
DRPRDRE DRPRDRE DRPRDRE
ECPSCH ECPSCH ECPSCH
ECRWPSCH ECRWPSCH ECRWPSCH
EF2PTOC EF2LLN0 EF2PTRC
EF2PTRC EF2RDIR
EF2RDIR GEN2PHAR
GEN2PHAR PH1PTOC
PH1PTOC
EF4PTOC EF4LLN0 EF4PTRC
EF4PTRC EF4RDIR
EF4RDIR GEN4PHAR
GEN4PHAR PH1PTOC
PH1PTOC
EFPIOC EFPIOC EFPIOC
EFRWPIOC EFRWPIOC EFRWPIOC
ETPMMTR ETPMMTR ETPMMTR
FDPSPDIS FDPSPDIS FDPSPDIS
FMPSPDIS FMPSPDIS FMPSPDIS
FRPSPDIS FPSRPDIS FPSRPDIS
FTAQFVR FTAQFVR FTAQFVR
FUFSPVC SDDRFUF FUFSPVC
SDDSPVC
Table continues on next page

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Commissioning manual
Section 1 1MRK 505 345-UEN B
Introduction

Function block name Edition 1 logical nodes Edition 2 logical nodes

GENPDIF GENPDIF GENGAPC
GENPDIF
GENPHAR
GENPTRC
GOOSEBINRCV BINGREC
GOOSEDPRCV DPGREC
GOOSEINTLKRCV INTGREC
GOOSEINTRCV INTSGREC
GOOSEMVRCV MVGREC
GOOSESPRCV BINSGREC
GOOSEVCTRRCV VCTRGREC
GOPPDOP GOPPDOP GOPPDOP
PH1PTRC
GRPTTR GRPTTR GRPTTR
GSPTTR GSPTTR GSPTTR
GUPPDUP GUPPDUP GUPPDUP
PH1PTRC
HZPDIF HZPDIF HZPDIF
INDCALCH INDCALH INDCALH
ITBGAPC IB16FCVB ITBGAPC
L3CPDIF L3CPDIF L3CGAPC
L3CPDIF
L3CPHAR
L3CPTRC
L4UFCNT L4UFCNT L4UFCNT
L6CPDIF L6CPDIF L6CGAPC
L6CPDIF
L6CPHAR
L6CPTRC
LAPPGAPC LAPPLLN0 LAPPPDUP
LAPPPDUP LAPPPUPF
LAPPPUPF
LCCRPTRC LCCRPTRC LCCRPTRC
LCNSPTOC LCNSPTOC LCNSPTOC
LCNSPTOV LCNSPTOV LCNSPTOV
LCP3PTOC LCP3PTOC LCP3PTOC
LCP3PTUC LCP3PTUC LCP3PTUC
LCPTTR LCPTTR LCPTTR
LCZSPTOC LCZSPTOC LCZSPTOC
LCZSPTOV LCZSPTOV LCZSPTOV
LD0LLN0 LLN0
LDLPSCH LDLPDIF LDLPSCH
LDRGFC STSGGIO LDRGFC
LEXPDIS LEXPDIS LEXPDIS
LEXPTRC
LFPTTR LFPTTR LFPTTR
LMBRFLO LMBRFLO LMBRFLO
LOVPTUV LOVPTUV LOVPTUV
Table continues on next page

18
Commissioning manual
1MRK 505 345-UEN B Section 1
Introduction

Function block name Edition 1 logical nodes Edition 2 logical nodes

LPHD LPHD
LPTTR LPTTR LPTTR
LT3CPDIF LT3CPDIF LT3CGAPC
LT3CPDIF
LT3CPHAR
LT3CPTRC
LT6CPDIF LT6CPDIF LT6CGAPC
LT6CPDIF
LT6CPHAR
LT6CPTRC
MVGAPC MVGGIO MVGAPC
NS2PTOC NS2LLN0 NS2PTOC
NS2PTOC NS2PTRC
NS2PTRC
NS4PTOC EF4LLN0 EF4PTRC
EF4PTRC EF4RDIR
EF4RDIR PH1PTOC
GEN4PHAR
PH1PTOC
O2RWPTOV GEN2LLN0 O2RWPTOV
O2RWPTOV PH1PTRC
PH1PTRC
OC4PTOC OC4LLN0 GEN4PHAR
GEN4PHAR PH3PTOC
PH3PTOC PH3PTRC
PH3PTRC
OEXPVPH OEXPVPH OEXPVPH
OOSPPAM OOSPPAM OOSPPAM
OOSPTRC
OV2PTOV GEN2LLN0 OV2PTOV
OV2PTOV PH1PTRC
PH1PTRC
PAPGAPC PAPGAPC PAPGAPC
PCFCNT PCGGIO PCFCNT
PH4SPTOC GEN4PHAR GEN4PHAR
OCNDLLN0 PH1BPTOC
PH1BPTOC PH1PTRC
PH1PTRC
PHPIOC PHPIOC PHPIOC
PRPSTATUS RCHLCCH RCHLCCH
SCHLCCH
PSLPSCH ZMRPSL PSLPSCH
PSPPPAM PSPPPAM PSPPPAM
PSPPTRC
QCBAY QCBAY
QCRSV QCRSV QCRSV
REFPDIF REFPDIF REFPDIF
ROTIPHIZ ROTIPHIZ ROTIPHIZ
ROTIPTRC
ROV2PTOV GEN2LLN0 PH1PTRC
PH1PTRC ROV2PTOV
ROV2PTOV
SAPFRC SAPFRC SAPFRC
Table continues on next page

19
Commissioning manual
Section 1 1MRK 505 345-UEN B
Introduction

Function block name Edition 1 logical nodes Edition 2 logical nodes

SAPTOF SAPTOF SAPTOF
SAPTUF SAPTUF SAPTUF
SCCVPTOC SCCVPTOC SCCVPTOC
SCILO SCILO SCILO
SCSWI SCSWI SCSWI
SDEPSDE SDEPSDE SDEPSDE
SDEPTOC
SDEPTOV
SDEPTRC
SESRSYN RSY1LLN0 AUT1RSYN
AUT1RSYN MAN1RSYN
MAN1RSYN SYNRSYN
SYNRSYN
SINGLELCCH SCHLCCH
SLGAPC SLGGIO SLGAPC
SMBRREC SMBRREC SMBRREC
SMPPTRC SMPPTRC SMPPTRC
SP16GAPC SP16GGIO SP16GAPC
SPC8GAPC SPC8GGIO SPC8GAPC
SPGAPC SPGGIO SPGAPC
SSCBR SSCBR SSCBR
SSIMG SSIMG SSIMG
SSIML SSIML SSIML
STBPTOC STBPTOC BBPMSS
STBPTOC
STEFPHIZ STEFPHIZ STEFPHIZ
STTIPHIZ STTIPHIZ STTIPHIZ
SXCBR SXCBR SXCBR
SXSWI SXSWI SXSWI
T2WPDIF T2WPDIF T2WGAPC
T2WPDIF
T2WPHAR
T2WPTRC
T3WPDIF T3WPDIF T3WGAPC
T3WPDIF
T3WPHAR
T3WPTRC
TCLYLTC TCLYLTC TCLYLTC
TCSLTC
TCMYLTC TCMYLTC TCMYLTC
TEIGAPC TEIGGIO TEIGAPC
TEIGGIO
TEILGAPC TEILGGIO TEILGAPC
TMAGAPC TMAGGIO TMAGAPC
TPPIOC TPPIOC TPPIOC
TR1ATCC TR1ATCC TR1ATCC
TR8ATCC TR8ATCC TR8ATCC
TRPTTR TRPTTR TRPTTR
Table continues on next page

20
Commissioning manual
1MRK 505 345-UEN B Section 1
Introduction

Function block name Edition 1 logical nodes Edition 2 logical nodes

U2RWPTUV GEN2LLN0 PH1PTRC
PH1PTRC U2RWPTUV
U2RWPTUV
UV2PTUV GEN2LLN0 PH1PTRC
PH1PTRC UV2PTUV
UV2PTUV
VDCPTOV VDCPTOV VDCPTOV
VDSPVC VDRFUF VDSPVC
VMMXU VMMXU VMMXU
VMSQI VMSQI VMSQI
VNMMXU VNMMXU VNMMXU
VRPVOC VRLLN0 PH1PTRC
PH1PTRC PH1PTUV
PH1PTUV VRPVOC
VRPVOC
VSGAPC VSGGIO VSGAPC
WRNCALH WRNCALH WRNCALH
ZC1PPSCH ZPCPSCH ZPCPSCH
ZC1WPSCH ZPCWPSCH ZPCWPSCH
ZCLCPSCH ZCLCPLAL ZCLCPSCH
ZCPSCH ZCPSCH ZCPSCH
ZCRWPSCH ZCRWPSCH ZCRWPSCH
ZCVPSOF ZCVPSOF ZCVPSOF
ZGVPDIS ZGVLLN0 PH1PTRC
PH1PTRC ZGVPDIS
ZGVPDIS ZGVPTUV
ZGVPTUV
ZMCAPDIS ZMCAPDIS ZMCAPDIS
ZMCPDIS ZMCPDIS ZMCPDIS
ZMFCPDIS ZMFCLLN0 PSFPDIS
PSFPDIS ZMFPDIS
ZMFPDIS ZMFPTRC
ZMFPTRC ZMMMXU
ZMMMXU
ZMFPDIS ZMFLLN0 PSFPDIS
PSFPDIS PSFPDIS
ZMFPDIS ZMFPDIS
ZMFPTRC ZMFPTRC
ZMMMXU ZMMMXU
ZMHPDIS ZMHPDIS ZMHPDIS
ZMMAPDIS ZMMAPDIS ZMMAPDIS
ZMMPDIS ZMMPDIS ZMMPDIS
ZMQAPDIS ZMQAPDIS ZMQAPDIS
ZMQPDIS ZMQPDIS ZMQPDIS
ZMRAPDIS ZMRAPDIS ZMRAPDIS
ZMRPDIS ZMRPDIS ZMRPDIS
ZMRPSB ZMRPSB ZMRPSB
ZSMGAPC ZSMGAPC ZSMGAPC

21
Commissioning manual
22
1MRK 505 345-UEN B Section 2
Safety information

Section 2 Safety information

2.1 Symbols on the product GUID-E48F2EC3-6AB8-4ECF-A77E-F16CE45CA5FD v2

All warnings must be observed.

Read the entire manual before doing installation or any maintenance work on
the product. All warnings must be observed.

Class 1 Laser product. Take adequate measures to protect your eyes and do not
view directly with optical instruments.

Do not touch the unit in operation. The installation shall take into account the
worst case temperature.

2.2 Warnings IP1504-1 v2

Observe the warnings during all types of work related to the product.
GUID-C9B6638A-57E7-4E05-9A33-A60E359C54AF v1

Only electrically skilled persons with the proper authorization and knowledge of
any safety hazards are allowed to carry out the electrical installation.

M2366-2 v2

National and local electrical safety regulations must always be followed.

Working in a high voltage environment requires serious approach to avoid
human injuries and damage to equipment.

M2362-2 v1

Do not touch circuitry during operation. Potentially lethal voltages and currents
are present.

M2364-2 v1

Always use suitable isolated test pins when measuring signals in open circuitry.
Potentially lethal voltages and currents are present.

23
Commissioning manual
Section 2 1MRK 505 345-UEN B
Safety information

M2370-2 v1

Never connect or disconnect a wire and/or a connector to or from a IED during

normal operation. Hazardous voltages and currents are present that may be
lethal. Operation may be disrupted and IED and measuring circuitry may be
damaged.

GUID-BEDD698E-356C-4CF9-9DAE-64DB3CEADEAD v1

Dangerous voltages can occur on the connectors, even though the auxiliary
voltage has been disconnected.

M2369-2 v3

Always connect the IED to protective earth, regardless of the operating

conditions. This also applies to special occasions such as bench testing,
demonstrations and off-site configuration. This is class 1 equipment that shall
be earthed.

M2367-2 v1

Never disconnect the secondary connection of current transformer circuit

without short-circuiting the transformer’s secondary winding. Operating a
current transformer with the secondary winding open will cause a massive
potential build-up that may damage the transformer and may cause injuries to
humans.

M2372-2 v1

Never remove any screw from a powered IED or from a IED connected to
powered circuitry. Potentially lethal voltages and currents are present.

SEMOD168311-3 v1

Take adequate measures to protect the eyes. Never look into the laser beam.

GUID-11CCF92B-E9E7-409C-84D0-DFDEA1DCBE85 v1

The IED with accessories should be mounted in a cubicle in a restricted access

area within a power station, substation or industrial or retail environment.

2.3 Caution signs IP1503-1 v1

GUID-5D1412B8-8F9D-4D39-B6D1-60FB35797FD0 v1

Whenever changes are made in the IED, measures should be taken to avoid
inadvertent tripping.

GUID-F2A7BD77-80FB-48F0-AAE5-BE73DE520CC2 v1

The IED contains components which are sensitive to electrostatic discharge.

ESD precautions shall always be observed prior to touching components.

24
Commissioning manual
1MRK 505 345-UEN B Section 2
Safety information

M2695-2 v2

Always transport PCBs (modules) using certified conductive bags.

M2696-2 v1

Do not connect live wires to the IED. Internal circuitry may be damaged

M2697-2 v2

Always use a conductive wrist strap connected to protective earth when

replacing modules. Electrostatic discharge (ESD) may damage the module and
IED circuitry.

M2698-2 v2

Take care to avoid electrical shock during installation and commissioning.

M2693-2 v1

Changing the active setting group will inevitably change the IEDs operation. Be
careful and check regulations before making the change.

2.4 Note signs IP1497-1 v1

M19-2 v3

Observe the maximum allowed continuous current for the different current
transformer inputs of the IED. See technical data.

25
Commissioning manual
26
1MRK 505 345-UEN B Section 3
Available functions

Section 3 Available functions

3.1 Main protection functions GUID-66BAAD98-851D-4AAC-B386-B38B57718BD2 v12.1.1

Table 2: Example of quantities

2 = number of basic instances

0-3 = option quantities
3-A03 = optional function included in packages A03 (refer to ordering details)

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

Differential protection
HZPDIF 87 1Ph high impedance 0-3 3-A02 3-A02 3-A02 3-A02
differential protection
REFPDIF 87N Restricted earth fault 0–2
protection, low impedance
L3CPDIF 87L Line differential protection, 1 1 1
3 CT sets, 2–3 line ends
L6CPDIF 87L Line differential protection, 1 1-A04 1 1-A04 1
6 CT sets, 3–5 line ends
LT3CPDIF 87LT Line differential protection, 1 1-A05 1-A05
3 CT sets, with inzone
transformers, 2–3 line ends
LT6CPDIF 87LT Line differential protection, 1 1-A06 1-A06 1-A06 1-A06
6 CT sets, with inzone
transformers, 3–5 line ends
LDLPSCH 87L Line differential protection 1 1 1 1 1
logic
LDRGFC 11REL Additional security logic for 0-1
differential protection
Impedance protection
ZMQPDIS, 21 Distance protection zone, 0-5 1-B10 1-B10 1-B10 1-B10
ZMQAPDIS quadrilateral characteristic 3-B11 3-B11 3-B11 3-B11
ZDRDIR 21D Directional impedance 0-2 1-B11 1-B11 1-B11 1-B11
quadrilateral
ZMCPDIS, 21 Distance measuring zone, 0-5 3-B16 3-B16 3-B16 3-B16
ZMCAPDIS quadrilateral characteristic
for series compensated
lines
ZDSRDIR 21D Directional impedance 0-2 1-B16 1-B16 1-B16 1-B16
quadrilateral, including
series compensation
FDPSPDIS 21 Phase selection, 0-2 1-B11 1-B11 1-B11 1-B11
quadrilateral characteristic 1-B16 1-B16 1-B16 1-B16
with fixed angle
Table continues on next page

27
Commissioning manual
Section 3 1MRK 505 345-UEN B
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

ZMHPDIS 21 Fullscheme distance 0-5 4-B17 4-B17 4-B17 4-B17

protection, mho
characteristic
ZMMPDIS, 21 Fullscheme distance 0-5 4-B17 4-B17 4-B17 4-B17
ZMMAPDIS protection, quadrilateral for
earth faults
ZDMRDIR 21D Directional impedance 0-2 1-B17 1-B17 1-B17 1-B17
element for mho
characteristic
ZDARDIR Additional distance 0-2 1-B17 1-B17 1-B17 1-B17
protection directional
function for earth faults
ZSMGAPC Mho impedance supervision 0-1 1-B17 1-B17 1-B17 1-B17
logic
FMPSPDIS 21 Faulty phase identification 0-2 2-B17 2-B17 2-B17 2-B17
with load enchroachment
ZMRPDIS, 21 Distance protection zone, 0-5
ZMRAPDIS quadrilateral characteristic,
separate settings
FRPSPDIS 21 Phase selection, 0-2
quadrilateral characteristic
with fixed angle
ZMFPDIS 21 High speed distance 0–1 1–B28 1–B28 1–B28 1–B28
protection, quadrilateral
and mho - 6 zones
ZMFCPDIS 21 High speed distance 0–1 1-B29 1-B29 1-B29 1-B29
protection for series
compensated lines,
quadrilateral and mho - 6
zones
ZMRPSB 68 Power swing detection 0-1 1-B11 1-B11 1-B11 1-B11
1-B16 1-B16 1-B16 1-B16
PSLPSCH Power swing logic 0-1 1-B03 1-B03 1-B03 1-B03
PSPPPAM 78 Pole slip/out-of-step 0-1 1-B22 1-B22 1-B22 1-B22
protection
OOSPPAM 78 Out-of-step protection 0–1 1-B22 1-B22 1-B22 1-B22
ZCVPSOF Automatic switch onto fault 0-1 1-B11 1-B11 1-B11 1-B11
logic, voltage and current 1-B16 1-B16 1-B16 1-B16
based 1-B17 1-B17 1-B17 1-B17
PPLPHIZ Phase preference logic 0-1 1-B04

28
Commissioning manual
1MRK 505 345-UEN B Section 3
Available functions

3.2 Back-up protection functions GUID-A8D0852F-807F-4442-8730-E44808E194F0 v10

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

Current protection
PHPIOC 50 Instantaneous 0-3 1 1 1 1
phase overcurrent
protection
OC4PTOC 51_671) Four step phase 0-3 1 1 1 1
overcurrent
protection
EFPIOC 50N Instantaneous 0-1 1-C24 1-C24 1-C24 1-C24
residual overcurrent
protection
EF4PTOC 51N Four step residual 0-3 1-C24 1-C24 1-C24 1-C24
67N2) overcurrent
protection
NS4PTOC 46I2 Four step 0-2 1-C24 1-C24 1-C24 1-C24
directional negative
phase sequence
overcurrent
protection
SDEPSDE 67N Sensitive directional 0-1 1-C16 1-C16 1-C16 1-C16
residual overcurrent
and power
protection
LCPTTR 26 Thermal overload 0–2 1 1 1 1
protection, one time
constant, Celsius
LFPTTR 26 Thermal overload 0–2 1 1 1 1
protection, one time
constant, Fahrenheit
CCRBRF 50BF Breaker failure 0-2 1 2 1 2
protection
STBPTOC 50STB Stub protection 0-2 1-B11 1B 1-B11 1B
1-B11 1-B11
CCPDSC 52PD Pole discordance 0-2 1 2 1 2
protection
GUPPDUP 37 Directional 0-2 1-C17 1-C17 1-C17 1-C17
underpower
protection
GOPPDOP 32 Directional 0-2 1-C17 1-C17 1-C17 1-C17
overpower
protection
BRCPTOC 46 Broken conductor 1 1 1 1 1
check
VRPVOC 51V Voltage restrained 0-3
overcurrent
protection

Voltage protection
Table continues on next page

29
Commissioning manual
Section 3 1MRK 505 345-UEN B
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

UV2PTUV 27 Two step 0-2 1 1 1 1

undervoltage
protection
OV2PTOV 59 Two step 0-2 1 1 1 1
overvoltage
protection
ROV2PTOV 59N Two step residual 0-2 1 1 1 1
overvoltage
protection
OEXPVPH 24 Overexcitation 0-1 1-D03 1-D03 1-D03 1-D03
protection
VDCPTOV 60 Voltage differential 0-2 2 2 2 2
protection
LOVPTUV 27 Loss of voltage 1 1 1 1 1
check
PAPGAPC 27 Radial feeder 0–1
protection

Frequency protection
SAPTUF 81 Underfrequency 0-6 2-E02 2-E02 2-E02 2-E02
protection
SAPTOF 81 Overfrequency 0-6 2-E02 2-E02 2-E02 2-E02
protection
SAPFRC 81 Rate-of-change 0-2 2-E02 2-E02 2-E02 2-E02
frequency
protection

Multipurpose protection
CVGAPC General current and 0-4 4-F01 4-F01 4-F01 4-F01
voltage protection

General calculation
SMAIHPAC Multipurpose filter 0-6

1) 67 requires voltage
2) 67N requires voltage

30
Commissioning manual
1MRK 505 345-UEN B Section 3
Available functions

3.3 Control and monitoring functions GUID-E3777F16-0B76-4157-A3BF-0B6B978863DE v12

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670

Control
SESRSYN 25 Synchrocheck, 0-2 1 2 1 2
energizing check and
synchronizing
SMBRREC 79 Autorecloser 0-4 1 2 1 2
1-H04 2-H05 1-H04 2-H05
APC10 3 Apparatus control for 0-1 1-H27 1-H27
single bay, max 10
apparatuses (1CB) incl.
interlocking
APC15 3 Apparatus control for 0-1 1-H08 1-H08
single bay, max 15
apparatuses (2CBs) incl.
interlocking
QCBAY Apparatus control 1 1 1 1 1
LOCREM Handling of LRswitch 1 1 1 1 1
positions
LOCREMCTRL LHMI control of PSTO 1 1 1 1 1
SLGAPC Logic rotating switch for 15 15 15 15 15
function selection and
LHMI presentation
VSGAPC Selector mini switch 20 20 20 20 20
DPGAPC Generic communication 16 16 16 16 16
function for Double
Point indication
SPC8GAPC Single point generic 5 5 5 5 5
control 8 signals
AUTOBITS AutomationBits, 3 3 3 3 3
command function for
DNP3.0
SINGLECMD Single command, 16 4 4 4 4 4
signals
I103CMD Function commands for 1 1 1 1 1
IEC 60870-5-103
I103GENCMD Function commands 50 50 50 50 50
generic for IEC
60870-5-103
I103POSCMD IED commands with 50 50 50 50 50
position and select for
IEC 60870-5-103
I103POSCMDV IED direct commands 10 10 10 10 10
with position for IEC
60870-5-103
I103IEDCMD IED commands for IEC 1 1 1 1 1
60870-5-103
Table continues on next page

31
Commissioning manual
Section 3 1MRK 505 345-UEN B
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670

I103USRCMD Function commands 1 1 1 1 1

user defined for IEC
60870-5-103
Secondary
system
supervision
CCSSPVC 87 Current circuit 0-2 1 2 1 2
supervision
FUFSPVC Fuse failure supervision 0-3 3 3 3 3
VDSPVC 60 Fuse failure supervision 0-3 1-G03 1-G03 1-G03 1-G03
based on voltage
difference
Logic
SMPPTRC 94 Tripping logic 6 6 6 6 6
TMAGAPC Trip matrix logic 12 12 12 12 12
ALMCALH Logic for group alarm 5 5 5 5 5
WRNCALH Logic for group warning 5 5 5 5 5
INDCALH Logic for group 5 5 5 5 5
indication
AND, GATE, INV, Basic configurable logic 40-280 40-28 40-28 40-28 40-28
LLD, OR, blocks (see Table 3) 0 0 0 0
PULSETIMER,
RSMEMORY,
SRMEMORY,
TIMERSET, XOR
ANDQT, Configurable logic 0–1
INDCOMBSPQT, blocks Q/T (see Table 4)
INDEXTSPQT,
INVALIDQT,
INVERTERQT,
ORQT,
PULSETIMERQT,
RSMEMORYQT,
SRMEMORYQT,
TIMERSETQT,
XORQT
AND, GATE, INV, Extension logic package 0–1
LLD, OR, (see Table 5)
PULSETIMER,
SLGAPC,
SRMEMORY,
TIMERSET,
VSGAPC, XOR
FXDSIGN Fixed signal function 1 1 1 1 1
block
B16I Boolean 16 to Integer 18 18 18 18 18
conversion
BTIGAPC Boolean 16 to Integer 16 16 16 16 16
conversion with Logic
Node representation
IB16 Integer to Boolean 16 18 18 18 18 18
conversion
Table continues on next page

32
Commissioning manual
1MRK 505 345-UEN B Section 3
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670

ITBGAPC Integer to Boolean 16 16 16 16 16 16

conversion with Logic
Node representation
TEIGAPC Elapsed time integrator 12 12 12 12 12
with limit transgression
and overflow supervision
INTCOMP Comparator for integer 12 12 12 12 12
inputs
REALCOMP Comparator for real 12 12 12 12 12
inputs
Monitoring
CVMMXN, Measurements 6 6 6 6 6
VMMXU, CMSQI,
VMSQI, VNMMXU
CMMXU Measurements 10 10 10 10 10
AISVBAS Function block for 1 1 1 1 1
service value
presentation of
secondary analog inputs
EVENT Event function 20 20 20 20 20
DRPRDRE, Disturbance report 1 1 1 1 1
A1RADR-A4RADR,
B1RBDR-B8RBDR
SPGAPC Generic communication 64 64 64 64 64
function for Single Point
indication
SP16GAPC Generic communication 16 16 16 16 16
function for Single Point
indication 16 inputs
MVGAPC Generic communication 24 24 24 24 24
function for Measured
Value
BINSTATREP Logical signal status 3 3 3 3 3
report
RANGE_XP Measured value 66 66 66 66 66
expander block
SSIMG 63 Gas medium supervision 21 21 21 21 21
SSIML 71 Liquid medium 3 3 3 3 3
supervision
SSCBR Circuit breaker 0-6 3-M13 6-M15 3-M13 6-M15
monitoring
LMBRFLO Fault locator 1 1 1 1 1
I103MEAS Measurands for IEC 1 1 1 1 1
60870-5-103
I103MEASUSR Measurands user defined 3 3 3 3 3
signals for IEC
60870-5-103
I103AR Function status auto- 1 1 1 1 1
recloser for IEC
60870-5-103
Table continues on next page

33
Commissioning manual
Section 3 1MRK 505 345-UEN B
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670

I103EF Function status earth- 1 1 1 1 1

fault for IEC 60870-5-103
I103FLTPROT Function status fault 1 1 1 1 1
protection for IEC
60870-5-103
I103IED IED status for IEC 1 1 1 1 1
60870-5-103
I103SUPERV Supervison status for 1 1 1 1 1
IEC 60870-5-103
I103USRDEF Status for user defined 20 20 20 20 20
signals for IEC
60870-5-103
L4UFCNT Event counter with limit 30 30 30 30 30
supervision
TEILGAPC Running hour-meter 9 9 9 9 9
Metering
PCFCNT Pulse-counter logic 16 16 16 16 16
ETPMMTR Function for energy 6 6 6 6 6
calculation and demand
handling

Table 3: Total number of instances for basic configurable logic blocks

Basic configurable logic block Total number of instances
AND 280
GATE 40
INV 420
LLD 40
OR 289
PULSETIMER 40
RSMEMORY 40
SRMEMORY 40
TIMERSET 60
XOR 40

Table 4: Total number of instances for configurable logic blocks Q/T

Configurable logic blocks Q/T Total number of instances
ANDQT 120
INDCOMBSPQT 20
INDEXTSPQT 20
INVALIDQT 22
INVERTERQT 120
Table continues on next page

34
Commissioning manual
1MRK 505 345-UEN B Section 3
Available functions

Configurable logic blocks Q/T Total number of instances

ORQT 120
PULSETIMERQT 40
RSMEMORYQT 40
SRMEMORYQT 40
TIMERSETQT 40
XORQT 40

Table 5: Total number of instances for extended logic package

Extended configurable logic block Total number of instances
AND 180
GATE 49
INV 180
LLD 49
OR 180
PULSETIMER 59
SLGAPC 74
SRMEMORY 110
TIMERSET 49
VSGAPC 130
XOR 49

3.4 Communication GUID-5F144B53-B9A7-4173-80CF-CD4C84579CB5 v12

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)

RED670
(Customized)

Station communication
LONSPA, SPA SPA communication 1 1 1 1 1
protocol
ADE LON communication 1 1 1 1 1
protocol
HORZCOMM Network variables via 1 1 1 1 1
LON
PROTOCOL Operation selection 1 1 1 1 1
between SPA and IEC
60870-5-103 for SLM
RS485PROT Operation selection for 1 1 1 1 1
RS485
RS485GEN RS485 1 1 1 1 1
DNPGEN DNP3.0 1 1 1 1 1
communication
general protocol
Table continues on next page

35
Commissioning manual
Section 3 1MRK 505 345-UEN B
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

DNPGENTCP DNP3.0 1 1 1 1 1
communication
general TCP protocol
CHSERRS485 DNP3.0 for EIA-485 1 1 1 1 1
communication
protocol
CH1TCP, CH2TCP, DNP3.0 for TCP/IP 1 1 1 1 1
CH3TCP, CH4TCP communication
protocol
CHSEROPT DNP3.0 for TCP/IP and 1 1 1 1 1
EIA-485
communication
protocol
MST1TCP, DNP3.0 for serial 1 1 1 1 1
MST2TCP, communication
MST3TCP, protocol
MST4TCP
DNPFREC DNP3.0 fault records 1 1 1 1 1
for TCP/IP and EIA-485
communication
protocol
IEC 61850-8-1 Parameter setting 1 1 1 1 1
function for IEC 61850
GOOSEINTLKRCV Horizontal 59 59 59 59 59
communication via
GOOSE for interlocking
GOOSEBINRCV GOOSE binary receive 16 16 16 16 16
GOOSEDPRCV GOOSE function block 64 64 64 64 64
to receive a double
point value
GOOSEINTRCV GOOSE function block 32 32 32 32 32
to receive an integer
value
GOOSEMVRCV GOOSE function block 60 60 60 60 60
to receive a measurand
value
GOOSESPRCV GOOSE function block 64 64 64 64 64
to receive a single
point value
GOOSEVCTRRCV Horizontal
communication via
GOOSE for VCTR
GOOSEVCTRCONF GOOSE VCTR
configuration for send
and receive
MULTICMDRCV, Multiple command and 60/10 60/10 60/10 60/10 60/10
MULTICMDSND transmit
FRONT, LANABI, Ethernet configuration 1 1 1 1 1
LANAB, LANCDI, of links
LANCD
GATEWAY Ethernet configuration 1 1 1 1 1
of link one
Table continues on next page

36
Commissioning manual
1MRK 505 345-UEN B Section 3
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

OPTICAL103 IEC 60870-5-103 1 1 1 1 1

Optical serial
communication
RS485103 IEC 60870-5-103 serial 1 1 1 1 1
communication for
RS485
AGSAL Generic security 1 1 1 1 1
application component
LD0LLN0 IEC 61850 LD0 LLN0 1 1 1 1 1
SYSLLN0 IEC 61850 SYS LLN0 1 1 1 1 1
LPHD Physical device 1 1 1 1 1
information
PCMACCS IED Configuration 1 1 1 1 1
Protocol
SECALARM Component for 1 1 1 1 1
mapping security
events on protocols
such as DNP3 and
IEC103
FSTACCS Field service tool 1 1 1 1 1
FSTACCSNA access via SPA
protocol over ethernet
communication
ACTIVLOG Activity logging 1 1 1 1 1
parameters
ALTRK Service Tracking 1 1 1 1 1
SINGLELCCH Single ethernet port 1 1 1 1 1
link status
PRPSTATUS Dual ethernet port link 1 1 1 1 1
status
Process bus
communication IEC
61850-9-2 1)
PRP IEC 62439-3 parallel 0-1 1-P03 1-P03 1-P03 1-P03
redundancy protocol
Remote communication
Binary signal transfer 6/36 6/36 6/36 6/36 6/36
receive/transmit
Transmission of analog 1 1 1 1 1
data from LDCM
Receive binary status 6/3/3 6/3/3 6/3/3 6/3/3 6/3/3
from remote LDCM
Scheme communication
ZCPSCH 85 Scheme 0-1 1-B11 1-B11 1-B11 1-B11
communication logic 1-B16 1-B16 1-B16 1-B16
for distance or
overcurrent protection
Table continues on next page

37
Commissioning manual
Section 3 1MRK 505 345-UEN B
Available functions

IEC 61850 ANSI Function description Line Differential

RED670 (A32)

RED670 (B32)
RED670 (A31)

RED670 (B31)
RED670
(Customized)

ZC1PPSCH 85 Phase segregated 0-1 1-B05 1-B05

scheme
communication logic
for distance protection
ZCRWPSCH 85 Current reversal and 0-1 1-B11 1-B11 1-B11 1-B11
weak-end infeed logic 1-B16 1-B16 1-B16 1-B16
for distance protection
ZC1WPSCH 85 Current reversal and 0-1 1-B05 1-B05
weak-end infeed logic
for phase segregated
communication
ZCLCPSCH Local acceleration logic 0-1 1-B11 1-B11 1-B11 1-B11
ECPSCH 85 Scheme 0-1 1-C24 1-C24 1-C24 1-C24
communication logic
for residual
overcurrent protection
ECRWPSCH 85 Current reversal and 0-1 1-C24 1-C24 1-C24 1-C24
weak-end infeed logic
for residual
overcurrent protection
DTT Direct transfer trip 0-1

1) Only included for 9-2LE products

3.5 Basic IED functions GUID-C8F0E5D2-E305-4184-9627-F6B5864216CA v9

Table 6: Basic IED functions

IEC 61850 or function Description
name
INTERRSIG
SELFSUPEVLST Self supervision with internal event list
TIMESYNCHGEN Time synchronization module
BININPUT, Time synchronization
SYNCHCAN,
SYNCHGPS,
SYNCHCMPPS,
SYNCHLON,
SYNCHPPH,
SYNCHPPS, SNTP,
SYNCHSPA
TIMEZONE Time synchronization
DSTBEGIN, GPS time synchronization module
DSTENABLE, DSTEND
IRIG-B Time synchronization
SETGRPS Number of setting groups
ACTVGRP Parameter setting groups
TESTMODE Test mode functionality
CHNGLCK Change lock function
Table continues on next page

38
Commissioning manual
1MRK 505 345-UEN B Section 3
Available functions

IEC 61850 or function Description

name
SMBI Signal matrix for binary inputs
SMBO Signal matrix for binary outputs
SMMI Signal matrix for mA inputs
SMAI1 - SMAI12 Signal matrix for analog inputs
3PHSUM Summation block 3 phase
ATHSTAT Authority status
ATHCHCK Authority check
AUTHMAN Authority management
FTPACCS FTP access with password
SPACOMMMAP SPA communication mapping
SPATD Date and time via SPA protocol
DOSFRNT Denial of service, frame rate control for front port
DOSLANAB Denial of service, frame rate control for OEM port AB
DOSLANCD Denial of service, frame rate control for OEM port CD
DOSSCKT Denial of service, socket flow control
GBASVAL Global base values for settings
PRIMVAL Primary system values
ALTMS Time master supervision
ALTIM Time management
MSTSER DNP3.0 for serial communication protocol
PRODINF Product information
RUNTIME IED Runtime Comp
CAMCONFIG Central account management configuration
CAMSTATUS Central account management status
TOOLINF Tools Information component
SAFEFILECOPY Safe file copy function

Table 7: Local HMI functions

IEC 61850 or function ANSI Description
name
LHMICTRL Local HMI signals
LANGUAGE Local human machine language
SCREEN Local HMI Local human machine screen behavior
FNKEYTY1–FNKEYTY5 Parameter setting function for HMI in PCM600
FNKEYMD1–
FNKEYMD5
LEDGEN General LED indication part for LHMI
OPENCLOSE_LED LHMI LEDs for open and close keys
GRP1_LED1– Basic part for CP HW LED indication module
GRP1_LED15
GRP2_LED1–
GRP2_LED15
GRP3_LED1–
GRP3_LED15

39
Commissioning manual
40
1MRK 505 345-UEN B Section 4
Starting up

Section 4 Starting up

4.1 Factory and site acceptance testing GUID-38C2B5FA-9210-4D85-BA21-39CE98A1A84A v2

Testing the proper IED operation is carried out at different occasions, for example:

• Acceptance testing
• Commissioning testing
• Maintenance testing

This manual describes the workflow and the steps to carry out the commissioning testing.

Factory acceptance testing (FAT) is typically done to verify that the IED and its corresponding
configuration meet the requirements of the utility or industry. This test is the most complex
and in depth, as it is done to familiarize the user with a new product or to verify a new
configuration. The complexity of this testing depends on several factors, such as:

• New IED type

• New configuration
• Modified configuration

Site acceptance testing (SAT or commissioning testing) is typically done to verify that the
installed IED is correctly set and connected to the power system. SAT requires that the
acceptance testing has been performed and that the application configuration is verified.

Maintenance testing is a periodic verification that the IED is healthy and has correct settings,
depending on changes in the power system. There are also other types of maintenance
testing.

4.2 Commissioning checklist GUID-93D14E4E-5DDE-4D37-84A6-2DF0656AB73D v3

Before starting up commissioning at site, check that the following items are available.

• Single line diagram

• Protection block diagram
• Circuit diagram
• Setting list and configuration
• RJ-45 Ethernet cable (CAT 5)
• Three-phase test kit or other test equipment depending on the complexity of the
configuration and functions to be tested.
• PC with PCM600 installed along with the connectivity packages corresponding to the IEDs
to be tested.
• Administration rights on the PC, to set up IP addresses
• Product documentation (engineering manual, installation manual, commissioning manual,
operation manual, technical manual and communication protocol manual)

41
Commissioning manual
Section 4 1MRK 505 345-UEN B
Starting up

4.3 Checking the power supply M11725-2 v6

Do not insert anything else to the female connector but the corresponding
male connector. Inserting anything else (such as a measurement probe) may
damage the female connector and prevent a proper electrical contact between
the printed circuit board and the external wiring connected to the screw
terminal block.

Check that the auxiliary supply voltage remains within the permissible input voltage range
under all operating conditions. Check that the polarity is correct before energizing the IED.

4.4 Energizing the IED

4.4.1 Checking the IED operation M11726-2 v7

Check all connections to external circuitry to ensure correct installation, before energizing the
IED and carrying out the commissioning procedures.

Energize the power supply of the IED to start it up. Keep the DC power supply on until the Root
menu or the selected default screen is shown on the HMI before interrupting the DC power
supply again. The energization could be done in a number of ways, from energizing a whole
cubicle with many IEDs to energizing each single IED one by one.

If HW (i.e. I/O and/or communication boards etc.) have been changed (i.e. removed, replaced,
or added), the user should re-configure the IED by navigating in the local HMI menu to: Main
menu/Configuration/Reconfigure HW modules to activate the changed hardware modules in
order to enable the self-supervision function to detect possible hardware errors.

Check also the self-supervision function in Main menu/Diagnostics/IED status/General menu

in local HMI to verify that the IED operates properly.

Set the IED time if no time synchronization source is configured.

To ensure that the IED is according to the delivery and ordering specifications documents
delivered together with each IED, the user should also after start-up use the built in HMI to
check the IED's:

• Software version, Main menu/Diagnostics/IED status/Product identifiers.

• Serial number, Main menu/Diagnostics/IED status/Product identifiers.
• Installed modules and their ordering number, Main menu/Diagnostics/IED status/
Installed HW.

4.4.2 IED start-up sequence M11727-3 v11

When the IED is energized, the green LED starts flashing instantly. After approximately 55
seconds the window lights up and the window displays ‘IED Startup’. The main menu is
displayed and the upper row should indicate ‘Ready’ after about 90 seconds. A steady green
light indicates a successful startup.

42
Commissioning manual
1MRK 505 345-UEN B Section 4
Starting up

1 2 3
t (s)
0 t1 t2

xx04000310-1-en.vsd
IEC04000310 V2 EN-US

Figure 2: Typical IED start-up sequence

1 IED energized. Green LED instantly starts flashing

2 LCD lights up and "IED startup" is displayed
3 The main menu is displayed. A steady green light indicates a successful startup.

If the upper row in the window indicates ‘Fail’ instead of ‘Ready’ and the green LED flashes, an
internal failure in the IED has been detected. See section"Checking the self supervision
function" to investigate the fault.

4.5 Setting up communication between PCM600 and the

IED SEMOD58570-5 v12

The communication between the IED and PCM600 is independent of the communication
protocol used within the substation or to the NCC.

The communication media is always Ethernet and the used protocol is TCP/IP.

Each IED has an RJ-45 Ethernet interface connector on the front. The front Ethernet connector
shall be used for communication with PCM600.

When an Ethernet-based station protocol is used, PCM600 communication can use the same
Ethernet port and IP address.

To connect PCM600 to the IED, two basic variants must be considered.

• Direct point-to-point link between PCM600 and the IED front port. The front port can be
seen as a service port.
• Indirect link via a station LAN or from remote via a network.

The physical connection and the IP address must be configured in both cases to enable
communication.

The communication procedures are the same in both cases.

1. If needed, set the IP address for the IEDs.

2. Set up the PC or workstation for a direct link (point-to-point), or
3. Connect the PC or workstation to the LAN/WAN network.
4. Configure the IED IP addresses in the PCM600 project for each IED to match the IP
addresses of the physical IEDs.

Setting up IP addresses
The IP address and the corresponding communication subnetwork mask must be set via the
LHMI for each available Ethernet interface in the IED. Each Ethernet interface has a default
factory IP address when the IED is delivered. The IP adress and the subnetwork mask might
have to be reset when an additional Ethernet interface is installed or an interface is replaced.

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Section 4 1MRK 505 345-UEN B
Starting up

• The default IP address for the IED front port is 10.1.150.3 and the corresponding
subnetwork mask is 255.255.255.0, which can be set via the local HMI path Main menu/
Configuration/Communication/Ethernet configuration/FRONT:1.

Setting up the PC or workstation for point-to-point access to IEDs front

port
An ethernet cable (max 2 m length) with RJ-45 connectors is needed to connect two physical
Ethernet interfaces together without a hub, router, bridge or switch in between.

IED RJ-45
PCM600

Tx Tx
Rx Rx
IEC09000096-2-en.vsd
IEC09000096 V2 EN-US

Figure 3: Point-to-point link between IED and PCM600

The following description is an example valid for standard PCs using Microsoft Windows
operating system. The example is taken from a Laptop with one Ethernet interface.

Administrator rights are required to change the PC communication setup. It is

automatically detected that Tx signals from the IED are received on the Tx pin
on the PC. Thus, a straight (standard) Ethernet cable can be used.

1. Select Search programs and files in the Start menu in Windows.

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1MRK 505 345-UEN B Section 4
Starting up

IEC13000057-1-en.vsd
IEC13000057 V1 EN-US

Figure 4: Select: Search programs and files

2. Type View network connections and click on the View network connections icon.

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Section 4 1MRK 505 345-UEN B
Starting up

IEC13000058-1-en.vsd
IEC13000058 V1 EN-US

Figure 5: Click View network connections

3. Right-click and select Properties.

IEC13000059-1-en.vsd
IEC13000059 V1 EN-US

Figure 6: Right-click Local Area Connection and select Properties

4. Select the TCP/IPv4 protocol from the list of configured components using this
connection and click Properties.

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1MRK 505 345-UEN B Section 4
Starting up

IEC13000060-1-en.vsd
IEC13000060 V1 EN-US

Figure 7: Select the TCP/IPv4 protocol and open Properties

5. Select Use the following IP address and define IP address and Subnet mask if the front
port is used and if the IP address is not set to be obtained automatically by the IED, see
Figure 8. The IP address must be different from the IP address chosen for the IED.

IEC13000062-1-en.vsd
IEC13000062 V1 EN-US

Figure 8: Select: Use the following IP address

6. Use the ping command to verify connectivity with the IED.
7. Close all open windows and start PCM600.

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Section 4 1MRK 505 345-UEN B
Starting up

The PC and IED must belong to the same subnetwork for this set-up to work.

Setting up the PC to access the IED via a network

The same method is used as for connecting to the front port.

The PC and IED must belong to the same subnetwork for this set-up to work.

4.6 Writing an application configuration to the IED M11734-2 v6

When writing a configuration to the IED with PCM600, the IED is automatically set in
configuration mode. When the IED is set in configuration mode, all functions are blocked. The
red LED on the IED flashes, and the green LED is lit while the IED is in the configuration mode.

When the configuration is written and completed, the IED is automatically set into normal
mode. For further instructions please refer to the users manuals for PCM600.

4.7 Checking CT circuits M12182-2 v15

Check that the wiring is in strict accordance with the supplied connection
diagram.

The CTs must be connected in accordance with the circuit diagram provided with the IED, both
with regards to phases and polarity. The following tests shall be performed on every primary
CT connected to the IED:

• Primary injection test to verify the current ratio of the CT, the correct wiring up to the
protection IED and correct phase sequence connection (that is L1, L2, L3.)
• Polarity check to prove that the predicted direction of secondary current flow is correct
for a given direction of primary current flow. This is an essential test for the proper
operation of the differential function and directional protection functions.
• CT secondary loop resistance measurement to confirm that the current transformer
secondary loop DC resistance is within the specification for the connected protection
functions. When the measured loop resistance is near the calculated value for maximum
DC resistance, perform a complete burden test.
• CT excitation test in order to confirm that the current transformer is of the correct
accuracy rating and that there are no shorted turns in the current transformer windings.
Manufacturer's design curves must be available for the current transformer to compare
the actual results.
• Earthing check of the individual CT secondary circuits to verify that each three-phase set
of main CTs is properly connected to the station earth and only at one electrical point.
• Insulation resistance check.

While the CT primary is energized, the secondary circuit shall never be open
circuited because extremely dangerous high voltages may arise.

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1MRK 505 345-UEN B Section 4
Starting up

Both the primary and the secondary sides must be disconnected from the line
and the IED when plotting the excitation characteristics.

If the CT secondary circuit earth connection is removed without the current

transformer primary being de-energized, dangerous voltages may result in the
secondary CT circuits.

4.8 Checking VT circuits M11724-2 v10

Check that the wiring is in strict accordance with the supplied connection diagram.

Correct possible errors before continuing to test the circuitry.

Test the circuitry.

• Polarity check when applicable; this test is often omitted for CVTs
• VT circuit voltage measurement (primary injection test)
• Earthing check
• Phase relationship
• Insulation resistance check

The primary injection test verifies the VT ratio and the wiring all the way from the primary
system to the IED. Injection must be performed for each phase-to-neutral circuit.

While testing VT secondary circuit and associated secondary equipment, care

shall be exercised to isolate the VT from the circuit being tested to avoid
backcharging the VT from the secondary side.

4.9 Using the RTXP test switch GUID-F1E29C06-7FE8-44D8-AD5A-EE8990A2AA41 v5

The RTXP test switch is designed to provide the means of safe testing of the IED. This is
achieved by the electromechanical design of the test switch and test plug handle. When the
test plug handle is inserted, it first blocks the trip and alarm circuits then it short circuits the
CT secondary circuit and opens the VT secondary circuits making the IED available for
secondary injection.

When pulled out, the test handle is mechanically stopped in half withdrawn position. In this
position, the current and voltage enter the protection, but the alarm and trip circuits are still
isolated and the IED is in test mode. Before removing the test handle, check the measured
values in the IED.

Not until the test handle is completely removed, the trip and alarm circuits are restored for
operation.

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Section 4 1MRK 505 345-UEN B
Starting up

Verify that the contact sockets have been crimped correctly and that they are
fully inserted by tugging on the wires. Never do this with current circuits in
service.

Current circuit

1. Verify that the contacts are of current circuit type.

2. Verify that the short circuit jumpers are located in the correct slots.

Voltage circuit

1. Verify that the contacts are of voltage circuit type.

2. Check that no short circuit jumpers are located in the slots dedicated for voltage.

Trip and alarm circuits

1. Check that the correct types of contacts are used.

4.10 Checking the binary I/O circuits M11722-2 v3

Do not insert anything else to the female connector but the corresponding
male connector. Inserting anything else (such as a measurement probe) may
damage the female connector and prevent a proper electrical contact between
the printed circuit board and the external wiring connected to the screw
terminal block.

4.10.1 Binary input circuits M11722-4 v3

Preferably, disconnect the binary input connector from the binary input cards. Check all
connected signals so that both input level and polarity are in accordance with the IED
specifications.

4.10.2 Binary output circuits M11722-8 v3

Preferably, disconnect the binary output connector from the binary output cards. Check all
connected signals so that both load and polarity are in accordance with IED specifications.

4.11 Checking optical connections M16022-2 v7

Check that the Tx and Rx optical connections are correct.

An IED equipped with optical connections has an minimum space requirement

of 180 mm for plastic fiber cables and 275 mm for glass fiber cables. Check the
allowed minimum bending radius from the optical cable manufacturer.

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1MRK 505 345-UEN B Section 5
Configuring the IED and changing settings

Section 5 Configuring the IED and changing

settings

5.1 Overview M11730-2 v6

The customer specific values for each setting parameter and a configuration file have to be
available before the IED can be set and configured, if the IED is not delivered with a
configuration.

Use the configuration tools in PCM600 to verify that the IED has the expected configuration.

Each function included in the IED has several setting parameters, which have to be set in order
to make the IED behave as intended. A factory default value is provided for each
parameter.The Parameter Setting Tool in PCM600 is used when changing setting parameters.

All settings can be

• Entered manually through the local HMI.

• Written from a PC, either locally or remotely using PCM600. Front or rear port
communication has to be established before the settings can be written to the IED.

Make sure that the DC supply is not turned off when the IED saves the written
configuration.

The IED uses a FLASH disk for storing configuration data and process data like counters,
object states, Local/Remote switch position etc. Since FLASH memory is used, measures have
been taken in software to make sure that the FLASH disk is not worn out by too intensive
storing of data.

This means, that to be absolutely sure that all data have been saved to FLASH, it is necessary
to leave the IED with auxiliary power connected after all the commissioning is done (including
setting the Local/Remote switch to the desired position) for at least one hour after the last
commissioning action performed on the IED.

After that time has elapsed, it will be safe to turn the IED off, no data will be lost.

5.2 Configuring analog CT inputs M12312-6 v8

The analog input channels must be configured to get correct measurement results as well as
correct protection functionality. Because all protection algorithms in the IED utilize the
primary system quantities, it is extremely important to make sure that connected current
transformer settings are done properly. These data are calculated by the system engineer and
normally set by the commissioner from the local HMI or from PCM600.

The analog inputs on the transformer input module are dimensioned for either 1A or 5A. Each
transformer input module has a unique combination of current and voltage inputs. Make sure
the input current rating is correct and that it matches the order documentation.

The primary CT data are entered via the HMI menu under Main menu/Configurations/Analog
modules

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Section 5 1MRK 505 345-UEN B
Configuring the IED and changing settings

The following parameter shall be set for every current transformer connected to the IED:

Table 8: CT configuration
Parameter description Parameter name Range Default
Rated CT primary current in A CTPRIMn from 0 to 99999 3000
n = channel number

This parameter defines the primary rated current of the CT. For two set of CTs with ratio
1000/1 and 1000/5 this parameter is set to the same value of 1000 for both CT inputs. The
parameter CTStarPoint can be used in order to reverse the direction of the CT. This might be
necessary if two sets of CTs have different star point locations in relation to the protected
busbar.

For main CTs with 2A rated secondary current, it is recommended to connect the secondary
wiring to the 1A input.

Take the rated permissive overload values for the current inputs into
consideration.

5.3 Reconfiguring the IED M11728-2 v2

I/O modules configured with PCM600 (BIM, BOM or IOM) are supervised.

I/O modules that are not configured are not supervised.

Each logical I/O module has an error flag that indicates signal or module failure. The error flag
is also set when the physical I/O module of the correct type is not detected in the connected
slot.

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1MRK 505 345-UEN B Section 6
Establishing connection and verifying the SPA/IEC communication

Section 6 Establishing connection and

verifying the SPA/IEC
communication

6.1 Entering settings M11735-2 v1

If the IED is connected to a monitoring or control system via the rear SPA/IEC port, the
SPA/IEC port has to be set either for SPA or IEC use.

6.1.1 Entering SPA settings M11735-7 v4

The SPA/IEC port is located on the rear side of the IED. Two types of interfaces can be used:

• for plastic fibers with connector type HFBR

• for glass fibers with connectors type ST

When using the SPA protocol, the rear SPA/IEC port must be set for SPA use.

Procedure

1. Set the operation of the rear optical SPA/IEC port to “SPA”.

The operation of the rear SPA port can be found on the local HMI under Main menu/
Configuration/Communication/Station communication/Port configuration/SLM
optical serial port/PROTOCOL:1
When the setting is entered the IED restarts automatically. After the restart the SPA/IEC
port operates as a SPA port.
2. Set the slave number and baud rate for the rear SPA port
The slave number and baud rate can be found on the local HMI under Main menu/
Configuration/Communication/Station communication/SPA/SPA:1
Set the same slave number and baud rate as set in the SMS system for the IED.

6.1.2 Entering IEC settings M11735-32 v4

When using the IEC protocol, the rear SPA/IEC port must be set for IEC use.

Two types of interfaces can be used:

• for plastic fibers with connector type HFBR

• for glass fibers with connectors type ST

Procedure

1. Set the operation of the rear SPA/IEC port to “IEC”.

The operation of the rear SPA/IEC port can be found on the local HMI under Main menu/
Configuration/Communication/SLM configuration/Rear optical SPA-IEC-DNP port/
PROTOCOL:1

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Section 6 1MRK 505 345-UEN B
Establishing connection and verifying the SPA/IEC communication

When the setting is entered the IED restarts automatically. After the restart the selected
IEC port operates as an IEC port.
2. Set the slave number and baud rate for the rear IEC port.
The slave number and baud rate can be found on the local HMI under Main menu/
Configuration/Communication/SLM configuration/Rear optical SPA-IEC-DNP port/
IEC60870–5–103
Set the same slave number and baud rate as set in the IEC master system for the IED.

6.2 Verifying the communication M11735-77 v1

To verify that the rear communication with the SMS/SCS system is working, there are some
different methods. Choose one of the following.

6.2.1 Verifying SPA communication M11735-81 v4

Procedure

1. Use a SPA-emulator and send “RF” to the IED. The answer from the IED should be the type
and version of it, for example, “REL670 2.1...”.
2. Generate one binary event by activating a function, which is configured to an event block
where the used input is set to generate events on SPA. The configuration must be made
with the PCM600 software. Verify that the event is presented in the SMS/SCS system.

During the following tests of the different functions in the IED, verify that the events and
indications in the SMS/SCS system are as expected.

6.2.2 Verifying IEC communication M11735-91 v2

To verify that the IEC communication with the IEC master system is working, there are some
different methods. Choose one of the following.

Procedure

1. Check that the master system time-out for response from the IED, for example after a
setting change, is > 40 seconds.
2. Use a protocol analyzer and record the communication between the IED and the IEC
master. Check in the protocol analyzer’s log that the IED answers the master messages.
3. Generate one binary event by activating a function that is configured to an event block
where the used input is set to generate events on IEC. The configuration must be made
with the PCM600 software. Verify that the event is presented in the IEC master system.

During the following tests of the different functions in the IED, verify that the events and
indications in the IEC master system are as expected.

6.3 fiber optic loop M11905-3 v5

The SPA communication is mainly used for SMS. It can include different numerical IEDs with
remote communication possibilities. The fiber optic loop can contain < 20-30 IEDs depending
on requirements on response time. Connection to a personal computer (PC) can be made
directly (if the PC is located in the substation) or by telephone modem through a telephone
network with ITU (CCITT) characteristics.

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1MRK 505 345-UEN B Section 6
Establishing connection and verifying the SPA/IEC communication

Table 9: Max distances between IEDs/nodes

glass < 1000 m according to optical budget

plastic < 25 m (inside cubicle) according to optical budget

6.4 Optical budget calculation for serial communication

with SPA/IEC M11736-4 v2

Table 10: Example

Distance 1 km Distance 25 m
Glass Plastic
Maximum attenuation - 11 dB - 7 dB
4 dB/km multi mode: 820 nm - 62.5/125 um 4 dB -
0.16 dB/m plastic: 620 nm - 1mm - 4 dB
Margins for installation, aging, and so on 5 dB 1 dB
Losses in connection box, two contacts (0.5 dB/ 1 dB -
contact)
Losses in connection box, two contacts (1 dB/ - 2 dB
contact)
Margin for 2 repair splices (0.5 dB/splice) 1 dB -
Maximum total attenuation 11 dB 7 dB

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56
1MRK 505 345-UEN B Section 7
Establishing connection and verifying the LON communication

Section 7 Establishing connection and

verifying the LON communication

7.1 Communication via the rear ports M12196-2 v1

7.1.1 LON communication M12196-4 v4

LON communication is normally used in substation automation systems. Optical fiber is used
within the substation as the physical communication link.

The test can only be carried out when the whole communication system is installed. Thus, the
test is a system test and is not dealt with here.
M14804-3 v3

Station HSI Control Center

MicroSCADA

Gateway

Star coupler
RER 111

IED IED IED

IEC05000663-1-en.vsd
IEC05000663 V2 EN-US

Figure 9: Example of LON communication structure for a substation automation

system
An optical network can be used within the substation automation system. This enables
communication with the IEDs through the LON bus from the operator’s workplace, from the
control center and also from other IEDs via bay-to-bay horizontal communication.

The fiber optic LON bus is implemented using either glass core or plastic core fiber optic
cables.

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Section 7 1MRK 505 345-UEN B
Establishing connection and verifying the LON communication

Table 11: Specification of the fiber optic connectors

Glass fiber Plastic fiber
Cable connector ST-connector snap-in connector
Cable diameter 62.5/125 m 1 mm
Max. cable length 1000 m 10 m
Wavelength 820-900 nm 660 nm
Transmitted power -13 dBm (HFBR-1414) -13 dBm (HFBR-1521)
Receiver sensitivity -24 dBm (HFBR-2412) -20 dBm (HFBR-2521)

7.1.2 The LON Protocol M14804-32 v2

The LON protocol is specified in the LonTalkProtocol Specification Version 3 from Echelon
Corporation. This protocol is designed for communication in control networks and is a peer-
to-peer protocol where all the devices connected to the network can communicate with each
other directly. For more information of the bay-to-bay communication, refer to the section
Multiple command function.

7.1.3 Hardware and software modules M14804-35 v4

The hardware needed for applying LON communication depends on the application, but one
very central unit needed is the LON Star Coupler and optical fibers connecting the star coupler
to the IEDs. To interface the IEDs from the MicroSCADA with Classic Monitor, application
library LIB520 is required.

The HV Control 670 software module is included in the LIB520 high-voltage process package,
which is a part of the Application Software Library in MicroSCADA applications.

The HV Control 670 software module is used for control functions in the IEDs. The module
contains a process picture, dialogues and a tool to generate a process database for the
control application in MicroSCADA.

When using MicroSCADA Monitor Pro instead of the Classic Monitor, SA LIB is used together
with 670 series Object Type files.

The HV Control 670 software module and 670 series Object Type files are used
with both 650 and 670 series IEDs.

Use the LON Network Tool (LNT) to set the LON communication. This is a software tool
applied as one node on the LON bus. To communicate via LON, the IEDs need to know

• The node addresses of the other connected IEDs.

• The network variable selectors to be used.

This is organized by LNT.

The node address is transferred to LNT via the local HMI by setting the parameter
ServicePinMsg = Yes. The node address is sent to LNT via the LON bus, or LNT can scan the
network for new nodes.

The communication speed of the LON bus is set to the default of 1.25 Mbit/s. This can be
changed by LNT.

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Establishing connection and verifying the LON communication

M11888-3 v4
The setting parameters for the LON communication are set via the local HMI. Refer to the
technical manual for setting parameters specifications.

The path to LON settings in the local HMI is Main menu/Configuration/Communication/SLM

configuration/Rear optical LON port

If the LON communication from the IED stops, caused by setting of illegal communication
parameters (outside the setting range) or by another disturbance, it is possible to reset the
LON port of the IED.
M11643-1 v3
Path in the local HMI under Main menu/Configuration/Communication/SLM configuration/
Rear optical LON port

These parameters can only be set with the LON Network Tool (LNT).

Table 12: Setting parameters for the LON communication

Parameter Range Default Unit Parameter description
DomainID 0 0 - Domain identification number
SubnetID* 0 - 255 0 - Subnet identification number
Step: 1
NodeID* 0 - 127 0 - Node identification number
Step: 1
*Can be viewed in the local HMI

Path in the local HMI under Main menu/Congifuration/Communication/SLM configuration/

Rear optical LON port

These parameters can only be set with the LON Network Tool (LNT).

Table 13: LON node information parameters

Parameter Range Default Unit Parameter description
NeuronID* 0 - 12 Not loaded - Neuron hardware identification number in
hexadecimal code
Location 0-6 No value - Location of the node
*Can be viewed in the local HMI

Path in the local HMI under Main menu/Configuration/Communication/SLM configuration/

Rear optical LON port

Table 14: ADE Non group settings (basic)

Name Values (Range) Unit Step Default Description
Operation Off - - Off Operation
On
TimerClass Slow - - Slow Timer class
Normal
Fast

Path in the local HMI under Main menu/Configuration/Communication/SLM configuration/

Rear optical LON port

Table 15: LON commands

Command Command description
ServicePinMsg Command with confirmation. Transfers the node address to the LON Network Tool.

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Section 7 1MRK 505 345-UEN B
Establishing connection and verifying the LON communication

7.2 Optical budget calculation for serial communication

with LON M11737-4 v2

Table 16: Example

Distance 1 km Distance10 m
Glass Plastic
Maximum attenuation -11 dB - 7 dB
4 dB/km multi mode: 820 nm - 62.5/125 um 4 dB -
0.3 dB/m plastic: 620 nm - 1mm - 3 dB
Margins for installation, aging, and so on 5 dB 2 dB
Losses in connection box, two contacts (0.75 dB/contact) 1.5 dB -
Losses in connection box, two contacts (1dB/contact) - 2 dB
Margin for repair splices (0.5 dB/splice) 0.5 dB -
Maximum total attenuation 11 dB 7 dB

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1MRK 505 345-UEN B Section 8
Establishing connection and verifying the IEC 61850 communication

Section 8 Establishing connection and

verifying the IEC 61850
communication

8.1 Overview SEMOD172103-4 v6

The rear OEM ports are used for:

• process bus (IEC 61850-9-2LE) communication

• substation bus (IEC 61850-8-1) communication.

For IEC 61850-8-1 redundant communication, both rear OEM ports are utilized. In this case IEC
61850-9-2LE communication can not be used.

IEC 61850-9-2LE process bus communication is not supported in the IED.

8.2 Setting the station communication SEMOD172108-3 v10

To enable IEC 61850 communication the corresponding OEM ports must be activated. The rear
OEM port AB and CD is used for IEC 61850-8-1 communication. The rear OEM port CD is used
for IEC 61850-9-2LE communication. For IEC 61850-8-1 redundant communication, both OEM
port AB and CD are used exclusively.

IEC 61850-9-2LE communication can only be used on OEM rear port X311:C, D.

To enable IEC 61850 station communication:

1. Enable IEC 61850-8-1 (substation bus) communication for port AB.

1.1. Set values for the rear ports AB.
Navigate to: Main menu/Configuration/Communication/Ethernet configuration/
LANAB:1
Set values for Mode, IPAddress and IPMask. Mode must be set to Normal.
Check that the correct IP address is assigned to the port.
1.2. Enable IEC 61850-8-1 communication.
Navigate to: Main menu/Configuration/Communication/Station communication/
IEC61850-8-1/IEC61850–8–1:1
Set Operation to On , PortSelGOOSE and PortSelMMS to the port used (for example
LANAB).
2. Enable redundant IEC 61850-8-1 communication for port AB and CD
2.1. Enable redundant communication.

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Establishing connection and verifying the IEC 61850 communication

Navigate to: Main menu/Configuration/Communication/Ethernet configuration/

PRP:1
Set values for Operation, IPAddress and IPMask. Operation must be set to On.
The IED will restart after confirmation. Menu items LANAB:1 and LANCD:1 are
hidden in local HMI after restart but are visible in PST where the values for
parameter Mode is set to Duo.
3. Enable IEC 61850-9-2LE (process bus) communication for port CD.
3.1. Set values for the rear port CD.
Navigate to: Main menu/Configuration/Communication/Ethernet configuration/
LANCD:1
Set values for Mode, IPAddress and IPMask. Mode must be set to IEC9-2.

There are no settings needed for the IEC 61850-9-2LE communication in the local HMI branch
Station communication. Make sure that the optical fibers are connected correctly.
Communication is enabled whenever the merging unit starts sending data.

8.3 Verifying the communication SEMOD172108-24 v8

To verify that the communication is working a test/analyzing tool, for example ITT600, can be used.

Verifying redundant IEC 61850-8-1 communication

Ensure that the IED receives IEC 61850-8-1 data on both port AB and CD. Browse in the local
HMI to Main menu/Diagnostics/Communication/Redundant PRP and check that both signals
LAN-A-STATUS and LAN-B-STATUS are shown as Ok. Remove the optical connection to one of
the ports AB or CD. Verify that either signal LAN-A-STATUS or LAN-B-STATUS (depending on
which connection that was removed) are shown as Error and the that other signal is shown as
Ok. Be sure to re-connect the removed connection after completed verification.

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1MRK 505 345-UEN B Section 9
Testing IED operation

Section 9 Testing IED operation

9.1 Preparing for test IP336-1 v1

9.1.1 Requirements M11740-2 v8

IED test requirements:

• Calculated settings
• Application configuration diagram
• Signal matrix (SMT) configuration
• Terminal connection diagram
• Technical manual
• Three-phase test equipment
• Process bus, IEC61850-9-2LE, MU test simulator, if IEC 61850-9-2LE process bus
communication is used.
• PCM600

The setting and configuration of the IED must be completed before the testing can start.

The terminal diagram, available in the technical reference manual, is a general diagram of the
IED.

Note that the same diagram is not always applicable to each specific delivery
(especially for the configuration of all the binary inputs and outputs).

Therefore, before testing, check that the available terminal diagram corresponds to the IED.

The technical manual contains application and functionality summaries, function blocks, logic
diagrams, input and output signals, setting parameters and technical data sorted per
function.

The test equipment should be able to provide a three-phase supply of voltages and currents.
The magnitude of voltage and current as well as the phase angle between voltage and current
must be variable. The voltages and currents from the test equipment must be obtained from
the same source and they must have minimal harmonic content. If the test equipment cannot
indicate the phase angle, a separate phase-angle measuring instrument is necessary.

Prepare the IED for test before testing a particular function. Consider the logic diagram of the
tested protection function when performing the test. All included functions in the IED are
tested according to the corresponding test instructions in this chapter. The functions can be
tested in any order according to user preferences. Only the functions that are used (Operation
is set to On) should be tested.

The response from a test can be viewed in different ways:

• Binary outputs signals

• Service values on the local HMI (logical signals or phasors)
• A PC with PCM600 application configuration software in work online mode

All setting groups that are used should be tested.

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This IED is designed for a maximum continuous current of four times the rated
current.

All references to CT and VT must be interpreted as analog values received from

merging units (MU) via IEC 61850-9-2LE communication protocol, analog values
received from the transformer input module, or analog values received from
the LDCM.

When using a MU test simulator, make sure it is set to the correct SVID and that
the system frequency is set to the same as in the IED.

Please observe the measuring accuracy of the IED, the test equipment and the
angular accuracy for both of them.

Please consider the configured logic from the function block to the output
contacts when measuring the operate time.

After intense testing, it is important that the IED is not immediately restarted,
which might cause a faulty trip due to flash memory restrictions. Some time
must pass before the IED is restarted. For more information about the flash
memory, refer to section “Configuring the IED and changing settings”.

9.1.2 Preparing the IED to verify settings M11741-2 v11

If a test switch is included, start preparation by making the necessary connections to the test
switch. This means connecting the test equipment according to a specific and designated IED
terminal diagram.

Put the IED into the test mode to facilitate the test of individual functions and prevent
unwanted operation caused by other functions. The busbar differential protection is not
included in the test mode and is not prevented to operate during the test operations. The test
switch should then be connected to the IED.

Verify that analog input signals from the analog input module are measured and recorded
correctly by injecting currents and voltages required by the specific IED.

To make testing even more effective, use PCM600. PCM600 includes the Signal monitoring
tool, which is useful in reading the individual currents and voltages, their amplitudes and
phase angles. In addition, PCM600 contains the Disturbance handling tool. The content of
reports generated by the Disturbance handling tool can be configured which makes the work
more efficient. For example, the tool may be configured to only show time tagged events and
to exclude analog information and so on.

Check the disturbance report settings to ensure that the indications are correct.

For information about the functions to test, for example signal or parameter names, see the
technical manual. The correct initiation of the disturbance recorder is made on start and/or

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release or trip from a function. Also check that the wanted recordings of analog (real and
calculated) and binary signals are achieved.

Parameters can be entered into different setting groups. Make sure to test
functions for the same parameter setting group. If needed, repeat the tests for
all different setting groups used. The difference between testing the first
parameter setting group and the remaining is that there is no need for testing
the connections.

During testing, observe that the right testing method, that corresponds to the actual
parameters set in the activated parameter setting group, is used.

Set and configure the function(s) before testing. Most functions are highly flexible and permit
a choice of functional and tripping modes. The various modes are checked at the factory as
part of the design verification. In certain cases, only modes with a high probability of coming
into operation need to be checked when commissioned to verify the configuration and
settings.

9.2 Activating the test mode M11412-2 v12

Put the IED into the test mode before testing. The test mode blocks all protection functions
and some of the control functions in the IED, and the individual functions to be tested can be
unblocked to prevent unwanted operation caused by other functions. In this way, it is possible
to test slower back-up measuring functions without the interference from faster measuring
functions. The test switch should then be connected to the IED.Test mode is indicated when
the yellow StartLED flashes.

It is important that the IED function to be tested is put into test mode, even if the MU is
sending data marked as "test". The IED will interpret these data as valid if it is not in test
mode.

1. Browse to the TestMode menu and press E.

The TestMode menu is found on the local HMI under Main menu/Test/IED test mode/
TestMode
2. Use the up and down arrows to choose On and press E.
3. Press the left arrow to exit the menu.
The dialog box Save changes appears.
4. Choose Yes, press E and exit the menu.
The yellow startLED above the LCD will start flashing when the IED is in test mode.

9.3 Preparing the connection to the test equipment M11743-2 v8

The IED can be equipped with a test switch of type RTXP8, RTXP18 or RTXP24. The test switch
and its associated test plug handle (RTXH8, RTXH18 or RTXH24) are a part of the COMBITEST
system, which provides secure and convenient testing of the IED.

When using the COMBITEST, preparations for testing are automatically carried out in the
proper sequence, that is, for example, blocking of tripping circuits, short circuiting of CTs,
opening of voltage circuits, making IED terminals available for secondary injection. Terminals 1
and 8, 1 and 18 as well as 1 and 12 of the test switches RTXP8, RTXP18 and RTXP24 respectively
are not disconnected as they supply DC power to the protection IED.

The RTXH test-plug handle leads may be connected to any type of test equipment or
instrument. When a number of protection IEDs of the same type are tested, the test-plug

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Testing IED operation

handle only needs to be moved from the test switch of one protection IED to the test switch of
the other, without altering the previous connections.

Use COMBITEST test system to prevent unwanted tripping when the handle is withdrawn,
since latches on the handle secure it in the half withdrawn position. In this position, all
voltages and currents are restored and any re-energizing transients are given a chance to
decay before the trip circuits are restored. When the latches are released, the handle can be
completely withdrawn from the test switch, restoring the trip circuits to the protection IED.

If a test switch is not used, perform measurement according to the provided circuit diagrams.

Never disconnect the secondary connection of a current transformer circuit

without first short-circuiting the transformer's secondary winding. Operating a
current transformer with the secondary winding open will cause a massive
potential build up that may damage the transformer and cause personal injury.

9.4 Connecting the test equipment to the IED M11744-2 v7

Connect the test equipment according to the IED specific connection diagram and the needed
input and output signals for the function under test. An example of a connection is shown in
figure 10.

Connect the current and voltage terminals. Pay attention to the current polarity. Make sure
that the connection of input and output current terminals and the connection of the residual
current conductor is correct. Check that the input and output logical signals in the logic
diagram for the function under test are connected to the corresponding binary inputs and
outputs of the IED under test.

The MU test equipment must be connected to the CD port on the OEM module
when process bus IEC61850-9-2LE communication is used.

To ensure correct results, make sure that the IED as well as the test equipment
are properly earthed before testing.

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IL1 IL1
IL2 IL2
IL3 IL3
IN IN (I4,I5)

Test equipment
UL1 UL1
UL2

IED
UL2
UL3 UL3
UN UN
UN (U4,U5)
TRIP L1
TRIP L2
TRIP L3

IEC 61850
IEC09000652-1-en.vsd
IEC09000652 V1 EN-US

Figure 10: Connection example of the test equipment to the IED when test equipment is
connected to the transformer input module

9.5 Releasing the function to be tested M11413-2 v6

Release or unblock the function to be tested. This is done to ensure that only the function or
the chain of functions to be tested are in operation and that other functions are prevented
from operating. Release the tested function(s) by setting the corresponding Blocked
parameter under Function test modes to No in the local HMI.

When testing a function in this blocking feature, remember that not only the actual function
must be activated, but the whole sequence of interconnected functions (from measuring
inputs to binary output contacts), including logic must be activated. Before starting a new test
mode session, scroll through every function to ensure that only the function to be tested (and
the interconnected ones) have the parameters Blocked and eventually EvDisable set to No and
Yes respectively. Remember that a function is also blocked if the BLOCK input signal on the
corresponding function block is active, which depends on the configuration. Ensure that the
logical status of the BLOCK input signal is equal to 0 for the function to be tested. Event
function blocks can also be individually blocked to ensure that no events are reported to a
remote station during the test. This is done by setting the parameter EvDisable to Yes.

Any function is blocked if the corresponding setting in the local HMI under Main
menu/Test/Function test modes menu remains On, that is, the parameter
Blocked is set to Yes and the parameter TestMode under Main menu/Test/IED
test mode remains active. All functions that were blocked or released in a
previous test mode session, that is, the parameter Test mode is set to On, are
reset when a new test mode session is started.

Procedure

1. Click the Function test modes menu.

The Function test modes menu is located in the local HMI under Main menu/Test/
Function test modes.
2. Browse to the function instance that needs to be released.
3. Set parameter Blocked for the selected function to No.

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9.6 Verifying analog primary and secondary measurement M11745-2 v13

Verify that the connections are correct and that measuring and scaling is done correctly. This
is done by injecting current and voltage to the IED.

Besides verifying analog input values from the merging unit via the IEC/UCA 61850-9-2LE
process bus, analog values from the transformer input module can be verified as follows.

Apply input signals as needed according to the actual hardware and the
application configuration.

1. Inject a symmetrical three-phase voltage and current at rated value.

2. Compare the injected value with the measured values.
The voltage and current phasor menu in the local HMI is located under Main menu/
Measurements/Analog primary values and Main menu/Measurements/Analog
secondary values.
3. Compare the frequency reading with the set frequency and the direction of the power.
The frequency and active power are located under Main menu/Measurements/
Monitoring/ServiceValues(MMXN)/CVMMXN:x. Then navigate to the bottom of the list
to find the frequency.
4. Inject an unsymmetrical three-phase voltage and current, to verify that phases are
correctly connected.

If some setting deviates, check the analog input settings under

Main menu/Configuration/Analog modules

If the IEC/UCA 61850-9-2LE communication is interrupted during current

injection, the report tool in PCM600 will display the current that was injected
before the interruption.

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IEC10000032-1-en.vsd
IEC10000032 V1 EN-US

Figure 11: PCM600 report tool display after communication interruption

9.7 Testing the protection functionality GUID-125B6F28-D3E5-4535-9CD6-6C056B79F496 v2

Each protection function must be tested individually by secondary injection.

• Verify operating levels (trip) and timers.

• Verify alarm and blocking signals.
• Use the disturbance handling tool in PCM600 to evaluate that the protection function has
received the correct data and responded correctly (signaling and timing).
• Use the event viewer tool in PCM600 to check that only expected events have occurred.

9.8 Forcing of binary I/O signals for testing

9.8.1 Forcing concept GUID-3FD8C676-10E5-432A-8CD5-4643299AD794 v1

Forcing of binary inputs and outputs is a convenient way to test wiring in substations as well
as testing configuration logic in the IEDs. Basically it means that all binary inputs and outputs
on the IED I/O modules (BOM, BIM, IOM & SOM) can be set to a value (i.e active or not-active),
selected by the user, while the IED is in test mode. For inputs, this is true regardless of the
actual signal voltage present on the input. For outputs, any output relay can be forced to be
active or not, regardless of the current requested state of the output in the IED logic
configuration.

Be observant that forcing of binary inputs and outputs on an IED, with

inappropriate setup, can result in potential danger.

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9.8.2 How to enable forcing GUID-50280F59-A98C-4E48-AB6D-2B4C138943DD v1

To enable forcing, the IED must first be put into IED test mode. While the IED is not in test
mode, the LHMI/PCM600 menus that relate to forcing will not have any effect on the input/
output status due to safety reasons.

9.8.2.1 Enable forcing by using LHMI GUID-41F7C636-75BC-42EF-A955-4BD9E347619E v1

1. Enable IED Testmode by setting IEDTestMode to On under Main menu/Test/IED test

mode TESTMODE:1.

IEC15000029 V1 EN-US

2. Exit back to the root menu.

3. Select Yes in the save dialogue box.
Once the IED is in test mode the yellow Start LED starts to blink.

9.8.2.2 Enable forcing using TESTMODE function block GUID-DD17B7D6-516F-4561-9D30-906B968EAFE0 v1

• Use the TESTMODE function block, appropriately configured in PCM600/ACT.

It may be convenient to control the input on mentioned component from, for example, an LHMI
function key or similar during commissioning to quickly and easily enter IED test mode.

9.8.3 How to change binary input/output signals using forcing GUID-7DF9FAF1-68B1-49AF-9DE4-2A8D6F6FAEFE v1

Once the IED is in IED test mode, the LHMI/PCM600 menus can be used to control input/
output signals freely.

9.8.3.1 Forcing by using LHMI GUID-D885671F-79E5-4B75-8777-B59E44F6FCFC v1

Editing a signal value directly GUID-E0C115BE-3AD1-48C7-BA2D-29857CD3D3ED v1

• Edit the input/output value directly to select the desired logical level, by doing following:
1. Select the value line of the desired signal, see figure 12.
2. Press the Enter key to edit the value.

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IEC15000021 V1 EN-US

Figure 12: Value line of the desired signal

3. Use the up/down arrows on the LHMI to change the signal value or the appropriate
menu in PCM600.
The status of the signal changes automatically to Forced (i.e. there is no need to set
the status to Forced manually).

On the LHMI, these edit changes have immediate effect. This means that the
value changes directly when the up/down arrow is pressed (i.e. there is no need
to press the Enter key to effectuate the change).

When navigating away from a LHMI forcing menu for an I/O board, the user is prompted to
either leave the signals forced, or to revert all of them back to the unforced state.

IEC15000022 V1 EN-US

It is possible to power-cycle the IED in this state without losing the forcing
states and values. This means that once a signal is forced, and the IED remains
in IED test mode, the input or output will appear “frozen” at the value selected
by the user, even if the IED is switched off and back on again.

Freezing a signal value without changing it GUID-FD76AAC1-7098-47D3-A3A1-6ACDF509ED91 v1

• Set the status of a signal to Forced, in the forcing menu that corresponds to the I/O card
in question. See example of LHMI menu in figure 13

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IEC15000020 V1 EN-US

Figure 13: Example of LHMI menu using BIM3

The signal “freezes” and will not change value even if, for example, a binary input signal voltage
changes level, or if a binary output is activated as the result of a protection function block
activating.

9.8.3.2 Forcing by using PCM600 GUID-E9D0DAE6-7A86-4FF9-943E-42039015D05B v1

In PCM600 the concept is a bit different compared to LHMI. The forcing is accomplished by
entering a forcing session. Within such a session, multiple signals on multiple I/O boards may
be edited and changed at the same time and has no effect on the IED. Once the user is
satisfied with the forcing setup, then all the changes can be effectuated simultaneously
towards the IED, potentially changing inputs and outputs on multiple I/O boards at the same
time. It is also possible to abort this operation (described in step 6 below) and to undo all
forcing.

1. Right click on the IED in the plant structure and select Signal Monitoring.
2. Click on the List View tab.
3. Click Forcing Session in the menu IED/Start Forcing.

IEC15000023 V1 EN-US

4. Click Start editing signal value for forcing on the tool bar.

IEC15000024 V1 EN-US

The Signal Monitoring menu changes and indicates the forcing values that can be edited.

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IEC15000025 V1 EN-US

5. Select and edit the values.

6. Click Acknowledge and send.

IEC15000026 V1 EN-US

This commits the values to the IED and exits the editing session.
7. Click Cancel to abort the changes and revert back to actual IED values.

IEC15000032 V1 EN-US

Regardless if the forcing changes are commited or canceled, the forcing is still
active.

To force more signals, click the button Start editing signal value for forcing again.

9.8.4 How to undo forcing changes and return the IED to normal
operation GUID-00E2BAD8-A29E-4B9D-80E6-E12F59E019BD v1

Regardless of which input/output signals have been forced, all forced signals will return to
their normal states immediately when the IED is taken out of test mode.

When the forcing is removed by exiting from IED test mode, both input and
output signals may change values. This means that logic input signals may
activate functions in the IED and that output relays may change state, which
can be potentially dangerous.

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9.8.4.1 Undo forcing by using TestMode component GUID-CA5CCA57-DFFF-4362-AC1D-08738D2BA45F v1

• If the IED test mode was entered through the test mode function block:
1. Deactivate the control input on that block.

This immediately undoes all forcing, regardless of how it was accomplished and disabled
all the way to force signals.

9.8.4.2 Undo forcing by using LHMI GUID-55199606-E70D-49B1-885D-251700FB562B v1

• If the IED test mode was enabled to using the LHMI:

1. Set IEDTestMode to Off in the LHMI menu.
2. Exit from the menu and click Yes in the Save dialogue box.

This immediately undoes all forcing, regardless of how it was accomplished and disabled.

9.8.4.3 Undo forcing by using PCM600 GUID-CE7FD186-99FC-41C8-910F-894A57037777 v1

1. Uncheck Forcing Session under the menu IED.

IEC15000031 V1 EN-US

2. Click Yes in the confirmation dialogue box.

PCM600 will revert all forced signals back to unforced and the real signal values will
immediately take effect again.

This may change both binary input values and output relay states and will undo
any forcing done by using the LHMI.
If the IED is left in test mode, then it is still possible to perform new forcing
operations, both from LHMI and from PCM600

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Testing functionality by secondary injection

Section 10 Testing functionality by secondary

injection

10.1 Testing disturbance report

10.1.1 Introduction M17101-2 v6

The following sub-functions are included in the disturbance report function:

• Disturbance recorder
• Event list
• Event recorder
• Fault locator
• Trip value recorder
• Indications

If the disturbance report is set on, then its sub-functions are also set up and so it is not
possible to only switch these sub-functions off. The disturbance report function is switched
off (parameter Operation = Off) in PCM600 or the local HMI under Main menu/Settings/IED
Settings/Monitoring/Disturbance report/DRPRDRE:1.

10.1.2 Disturbance report settings M11746-2 v6

When the IED is in test mode, the disturbance report can be made active or inactive. If the
disturbance recorder is turned on during test mode, recordings will be made. When test mode
is switched off all recordings made during the test session are cleared.

Setting OpModeTest for the control of the disturbance recorder during test mode are located
on the local HMI under Main menu/Settings/IED Settings/Monitoring/Disturbance report/
DRPRDRE:1.

10.1.3 Disturbance recorder (DR) M11750-2 v6

A Manual Trig can be started at any time. This results in a recording of the actual values from
all recorded channels.

The Manual Trig can be started in two ways:

1. From the local HMI under Main menu/Disturbance records.

1.1. Enter on the row at the bottom of the HMI called Manual trig.
A new recording begins. The view is updated if you leave the menu and return.
1.2. Navigate to General information or to Trip values to obtain more detailed
information.
2. Open the Disturbance handling tool for the IED in the plant structure in PCM600.
2.1. Right-click and select Execute manual Trig in the window Available recordings in IED.
2.2. Read the required recordings from the IED.
2.3. Refresh the window Recordings and select a recording.
2.4. Right-click and select Create Report or Open With to export the recordings to any
disturbance analyzing tool that can handle Comtrade formatted files.

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Evaluation of the results from the disturbance recording function requires access to a PC
either permanently connected to the IED or temporarily connected to the Ethernet port (RJ-45)
on the front. The PCM600 software package must be installed in the PC.

Disturbance upload can be performed by the use of PCM600 or by any third party tool with IEC
61850 protocol. Reports can automatically be generated from PCM600. Disturbance files can
be analyzed by any tool reading Comtrade formatted disturbance files.

It could be useful to have a printer for hard copies. The correct start criteria and behavior of
the disturbance recording function can be checked when IED protective functions are tested.

When the IED is brought into normal service it is recommended to delete all recordings, made
during commissioning to avoid confusion in future fault analysis.

All recordings in the IED can be deleted in two ways:

1. in the local HMI under Main menu/Clear/Reset disturbances, or

2. in the Disturbance handling tool in PCM600 by selecting Delete all recordings in the IED...
in the window Available Recordings in IED.

10.1.4 Event recorder (ER) and Event list (EL) M12645-2 v6

The result from the event recorder and event list can be viewed on the local HMI or, after
upload, in PCM600 as follows:

1. on the local HMI under Main menu/Events, or in more details via

2. the Event Viewer in PCM600.
The internal FIFO register of all events will appear when the event viewer is launched.

When the IED is brought into normal service it is recommended to delete all events resulting
from commissioning tests to avoid confusion in future fault analysis. All events in the IED can
be cleared in the local HMI under Main Menu//Clear/Clear internal event list or Main menu/
Clear/Clear process event list. It is not possible to clear the event lists from PCM600.

When testing binary inputs, the event list (EL) might be used instead. No uploading or
analyzing of registrations is then needed since the event list keeps running, independent of
start of disturbance registration.

10.2 Identifying the function to test in the technical

reference manual M11748-2 v4

Use the technical manual to identify function blocks, logic diagrams, input and output signals,
setting parameters and technical data.

10.3 Differential protection IP10805-1 v1

10.3.1 High impedance differential protection HZPDIF SEMOD55257-42 v3

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

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10.3.1.1 Verifying the settings SEMOD55257-46 v5

1. Connect single-phase or three-phase test set to inject the operating voltage. The
injection is done across the measuring branch.

The required trip and alarm voltage, as well as the used stabilizing
resistance value must be set in the function. Note as well that used CT
input in the IED must have ratio set as 1:1. This is essential for the
measurement of the expected value. Normally a slightly higher operating
value is no problem as the sensitivity is not influenced much.

2. Increase the voltage and make note of the operate value U>Trip. This is done by manual
testing and without trip of the test set.
3. Connect the trip contact to the test set to stop the test set for measurement of trip
times below.
4. Reduce the voltage slowly and make note of the reset value. The reset value must be high
for this function.
5. Check the operating time by injecting a voltage corresponding to 1.2 ˣ U>Trip level. Make
note of the measured trip time.
6. If required, verify the trip time at another voltage. Normally 2 ˣ U>Trip is selected.
7. If used, measure the alarm level operating value. Increase the voltage and make note of
the operate value U>Alarm. This is done with manual test and without trip of the test set.
8. Measure the operating time on the alarm output by connecting the stop of the test set to
an output from tAlarm. Inject a voltage 1.2 ˣ U>Alarm and measure the alarm time.
9. Check that trip and alarm outputs operate according to the configuration logic.
10. Finally check that start and alarm information is stored in the event menu and if a serial
connection to the SA is available verify that the correct and only the required signals are
presented on the local HMI and on the SCADA system.

Information on how to use the event menu is found in the operator's manual.

10.3.1.2 Completing the test SEMOD55257-73 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.3.2 Restricted earth-fault protection, low impedance REFPDIF SEMOD55252-82 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.3.2.1 Verifying the settings SEMOD55252-86 v10

1. Connect the test set for single-phase current injection to the protection terminals
connected to the CT in the power transformer neutral-to-earth circuit.
2. Increase the injection current and note the operating value of the protection function.
3. Check that all trip and start contacts operate according to the configuration logic.
4. Decrease the current slowly from operate value and note the reset value.
5. Connect the timer and set the current to ten times the value of the IDMin setting.

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6. Switch on the current and note the operate time.

7. Connect the test set to terminal L1 and neutral of the three-phase current input
configured to REFPDIF. Also inject a current higher than half the Idmin setting in the
neutral-to-earth circuit with the same phase angle and with polarity corresponding to an
internal fault.
8. Increase the current injected in L1, and note the operate value. Decrease the current
slowly and note the reset value.
9. Inject current into terminals L2 and L3 in the same way as in step 7 above and note the
operate and reset values.
10. Inject a current equal to 10% of rated current into terminal L1.
11. Inject a current in the neutral-to-earth circuit with the same phase angle and with polarity
corresponding to an external fault.
12. Increase the current to five times the operating value and check that the protection does
not operate.
13. Finally check that trip information is stored in the event and disturbance recorder.

10.3.2.2 Completing the test SEMOD55252-118 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.3.3 Line differential protection L3CPDIF and L6CPDIF SEMOD56264-55 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The test of the line differential protection is done with the different IEDs geographically
separated from each other. It is important to note that local actions, in one IED, may cause
operation in remotely located IEDs. In the test of the line differential function actions must be
done in all involved IEDs.

When the protection at one end is activated to Test mode, this information is
automatically sent to remote end IEDs through the LineDiffLogic function block
and the remote functions are then also blocked automatically.

Before test the trip signal to the circuit breaker must be blocked, for example by applying the
COMBITEST test switch.

Line differential protection must be set in test mode. This involves switching the IED to Test
mode and the functions involved in the test. For the Differential protection there are settings
to Test mode and also the activation of the local function with setting "Release local".
Remember also for example the trip function block deblocking to be able to measure trip
times. In the test mode the injected current is communicated to the remote IEDs and sent
back to the IED under test. The echoed current is switched in phase so that current in phase L1
is returned in phase L2, current in phase L2 is returned in phase L3 and current in phase L3 is
returned in phase L1. The amplitude of the returned current can be set separately as a ratio of
the injected current.

Take a line with three IEDs, for example, set the return current from each remote IED to be
50% of the injected current. Inject a current Iinjected, L1 in phase L1 to get the following
differential and bias currents:

Phase L1:

IDiff L1 = IBiasL1 = I injected , L1

EQUATION1458 V1 EN-US

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1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

Phase L2:

IDiff L 2 = IBiasL 2 = I injected , L1 ×1Ð240°

EQUATION1459 V1 EN-US

Phase L3:

IDiffL3 = IBiasL3 = 0
EQUATION1460 V2 EN-US

10.3.3.1 Verifying the settings SEMOD56264-69 v4

Procedure

1. Block the trip signal from all involved IEDs with local operation released. See below.
2. Set Test mode to On for the Line differential function for test.
3. Release the local function with setting ReleaseLocal in local HMI under: Main menu/Test/
Line differential test/LineDiffLogic
4. Set the factor of the return currents to 1/(number of current IEDs = 1).
5. Inject a current in phase L1 and increase the current until the function operates for
phases L1 and L2.
The injected operate current must correspond to the set IdMin. The service values for
IDiffL1, IBiasL1, IDiffL2 and IBiasL2 must be equal to the injected current.
6. Repeat step 4 by current injection in phases L2 and L3.
7. Inject a symmetrical three-phase current, and increase the current until operation is
achieved in all three phases.
The injected operate current must correspond to the set IdMin. The service values for
IDiffL1, IBiasL1, IDiffL2, IBiasL3, IDiffL3 and IBiasL3 must be equal to the injected current.
8. Read the transmission delay.
9. Measure the operating time by injection of a single-phase current in phase 1.
The injected current must be 4 times the operating current. The time measurement is
stopped by the trip output.
Note that tripping times at this loop test includes sending the local currents to remote
side and with a factor sending them back. This means that tripping times are virtually
double to the times achieved at a real fault or at bench testing.
10. Check the negative sequence fault discriminator by injecting a three-phase current with
changed phase sequence: switch phases L1 and L2. The injected current will now be seen
as a pure negative-sequence current where the phase angle between the local negative-
sequence current and the remote negative-sequence currents will be 120°.
With the current above IMinNegSeq, the signal external fault (EXTFAULT) must apply. No
trip must be generated.
11. Disconnect the test equipment and reconnect the current transformers.
12. Read and check the service values of the three-phase current.
13. Switch off the test mode and the release local.
14. With a through load current (maximum current of line ends) of minimum 20% of IBase the
current IDiff and IBias are read in all phases.
IDiff must be less than 10% of the maximum line end current and IBias must be equal to
the largest line end current.

10.3.3.2 Completing the test SEMOD56264-104 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

79
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Testing functionality by secondary injection

After finishing a loop test with line in service and before leaving test mode,
the setting ReleaseLocal in local HMI under: Main menu/Test/Line differential
test/LineDiffLogic must be set to BlockAll. If not, the load current might
cause incorrect operation of the differential function at restarts of the line
differential protection IED.

10.3.4 Additional security logic for differential protection LDRGFC GUID-0E064528-0E70-4FA1-87C7-581DADC1EB55 v2

10.3.4.1 Verifying the settings GUID-D9F626D4-4038-416F-888E-D3DB5047E79A v1

Prepare the IED for verification of settings outlined in section 1 “Overview” and section 2
“Preparing for test” in this chapter.

Current variation local criteria GUID-804E13B6-DC31-487B-A582-7886B1EF3EB7 v2

Procedure

1. Set Operation to On.

2. Connect the test set for three phase current injection to the appropriate IED terminals.
3. Inject symmetrical phase currents equal to half the rated current
4. Increase the injected current in phase L1 slowly by more than the set ICV>. No signal shall
be activated.
5. Decrease the injected current in phase L1 to half the rated current.
6. Increase the injected current in phase L1 in a step by more than the set ICV>. Start shall
be activated.

Undervoltage criteria GUID-57075848-249D-4F53-AB4D-A0DF2A04AC7C v2

Procedure

1. Connect the test set for three phase current injection and three phase voltage to the
appropriate IED terminals.
2. Inject symmetrical phase voltages equal to the rated voltage.
3. Decrease the injected voltage in phase L1 and note the operated value (start value) of the
function.
4. Increase the voltage slowly and note the reset value.
5. Connect a trip output contact to a timer.
6. Reduce the injected voltage stepwise to 90 % of the operate level, and check the time
delay.
7. Repeat points 3– 6 for phases L2 and L3.
8. Inject symmetrical phase voltages equal to the rated voltage.
9. Decrease the injected phase-phase voltage L1-L2 and note the operated value (start
value) of the function.
10. Increase the voltage slowly and note the reset value.
11. Connect a trip output contact to a timer.
12. Reduce the injected voltage stepwise to 90 % of the operate level, and check the time
delay.
13. Repeat points 9 – 12 for phases L2-L3 and L3-L1.

Zero sequence overcurrent criteria GUID-27C0852A-008D-4107-8346-AB6A85043B7E v2

Procedure

80
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Testing functionality by secondary injection

1. Connect the test set for three phase voltage injection (L1, L2, L3) or residual voltage
injection (N) to the appropriate IED terminals. This is dependent on how the IED is fed
from the CT .
2. Increase the injected zero sequence current and note the operate value (start value) of
the studied step of the function.
3. Decrease the current slowly and note the reset value.
4. Connect a trip output contact to a timer.
5. Set the injected current to 200 % of the operate level of the tested stage, switch on the
current and check the time delay.

Low current criteria GUID-64C0F94F-5DC8-476C-B8B5-2B80F2B42692 v2

Procedure

1. Connect the test set for three phase current injection to the appropriate IED terminals.
2. Inject a symmetrical three phase current larger than the set value IUC<
3. Decrease the injected current in phase L1 and note the operate value (start value) of the
studied step of the function.
4. Increase the current slowly and note the reset value.
5. Connect a trip output contact to a timer.
6. Decrease the injected current stepwise to 50 % of the operate level and check the time
delay.
7. Repeat steps 3 – 6 for phases L2 and L3.

10.3.4.2 Completing the test GUID-BE74F565-7465-4300-B2A6-D99CE8844147 v2

Continue to test another function or end the test by changing the test mode setting to off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4 Impedance protection SEMOD53525-1 v2

10.4.1 Distance protection zones, quadrilateral characteristic

ZMQPDIS GUID-AF589812-9034-4DA4-B081-E3ACBA947058 v9

Prepare the IED for verification of settings outlined in section "Requirements" and section
"Preparing for test" in this chapter.

Measure operating characteristics during constant current conditions. Keep the measured
current as close as possible to its rated value or lower. But make sure it is higher than the set
minimum operating current.

Ensure that the maximum continuous current to the IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

The test procedure has to take into consideration that the shaped load encroachment
characteristic is active. It is therefore necessary to check the setting. To verify the settings
with the shaped load encroachment characteristic the test should be carried out according to
figures 14 and 15 and tables 17 and 18. In cases where the load encroachment characteristic is
activated tests according to the adjusted figures should be carried out.

To verify the settings for the operating points according to the following fault types should be
tested:

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Testing functionality by secondary injection

• One phase-to-phase fault

• One phase-to-earth fault

The shape of the operating characteristic depends on the values of the setting parameters.

The figures illustrating the characteristic for the distance protection function
can be used for settings with and without load encroachment. The solid lines
designate the diagram applicable when the load current compensation is
active. The solid line and all test points except 13 are valid for this case.
When the load current compensation is inactive, the dotted lines and test point
13 are valid. Test points 5, 6, and 7 are not valid for this measurement.

1 2

80%
11 3

50%
X1 10 4
12
120° D
a 5 A rgL
6 b=
R (Ohm/phase)
7 13
9 c 20°
8
40% of RLdFw
80% of RLdFw
0.5 x RFPP

IEC05000368-3-en
IEC05000368 V3 EN-US

Figure 14: Distance protection characteristic with test points for phase-to-phase
measurements

Table 17: Test points for phase-to-phase loops L1-L2 (Ohm/Loop)

Test point Reach Set value Comments
1 X X1set

R 0
2 X X1set

R R1set

3 X 0.8 x X1set

R 0.8 x R1set+ RFPP/2

4 X 0.5 x X1set

R 0.5 x R1set+ RFPP/2

5 X 0.85 x RFPP x tan (ArgRLd) ArgLd = angle for the maximal load transfer
R 0.85 x RFPP
6 X RLdFw x tan (ArgLd)
R RLdFw
Table continues on next page

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Testing functionality by secondary injection

Test point Reach Set value Comments

7 X 0
R RLdFw
8 X –0.2143 x RFPP/2 Exact: 0.8 x RFPP/2 (ArgDir=20°)
R 0.8 x RFPP/2
9 X –0.4 x RLdFw x tan(ArgDir=20°)
R 0.4 x RLdFw
10 X 0.5 x X1set Exact –0.5 x R1set x tan(ArgNegRes=30°)

R –0.23 x X1set

11 X 0.8 x X1set Exact –0.5 x R1set x tan(ArgNegRes=30°)

R –0.37 x X1 set

12 X 0.5 x X1set

R 0.5 x R1set

13 X 0 Only used when RLdFw > 0.5 x RFPP

R 0.5 x RFPP

Table 17 is used in conjunction with figure 14.

1 2

80%
11 3

50%
X1+XN 10 4
12
120° 5 LD
a Arg
6 b=
R (Ohm/loop)
7 13
9 20°
8
c

40% of RLdFw

80% of RLdFw
alt. 80% of
RFPE
RFPE (Load
encroachment)
IEC05000369-3-en.vsd
IEC05000369 V3 EN-US

Figure 15: Distance protection characteristic with test points for phase-to-earth
measurements
Table 18 is used in conjunction with figure 15.

Table 18: Test points for phase-to-earth L3-E (Ohm/Loop)

Test point Reach Value Comments
1 X (2 x X1set+X0set)/3

R 0
2 X (2 x X1set+ X0set)/3

R 2 x R1set+ R0set)/3

Table continues on next page

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Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

Test point Reach Value Comments

3 X 0.8 x (2 x X1set+ X0set)/3

R 0.8 x (2 x R1set+ R0set)/3

+RFPEset

4 X 0.5 x (2 x X1set+ R0set)/3

R 0.5 x (2 x R1set+R0set)/3 +
RFPEset

5 X 0.85 x RFPEset x tan(ArgLdset) ArgLd = angle for the maximal load transfer

R 0.85 x RFPE
6 X RLdFwset x tan(ArgLdSet)
R RLdFwset

7 X 0
R RLdFwset

8 X –0.1072 x RLdFwset Exact: 0.4 x RFPE x tan (ArgDir=20°)

R 0.4 x RLdFwset

9 X –0.8 x RLdFwset x
tan(ArgDir=20°)
R 0.8 x RLdFwset

10 X 0.17 x (2 x X1set + X0 set) Exact: 0.5 x (2 x X1set X0 set)/3

R -0.36 x (2 x X1set + X0set) Exact: 0.5 x (2X1set + X0set)/(3 x

tan(AgNegDir=30°)
11 X 0.27 x (2 x X1set+X0set) Exact: 0.8 x (2 x X1set + X0set)/3

R –0.57 x (2 x X1set + X0set) Exact: 0.8 x (2X1set + X0set)/(3 x

tan(AgNegDir=30°)
12 X 0.5 x (2 x X1set + X0set)/3

R 0.5 x (2 x R1set + R0set)/3

13 X 0 Only used when RLdFw > RFPE

R RFPE

10.4.1.1 Measuring the operating limit of set values M14944-126 v8

Procedure:

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition and slowly decrease the measured impedance to find the
operating value of the phase-to-phase fault for zone 1 according to test point 1 in
figure 14 and table 17. Compare the result of the measurement with the set value.
3. Repeat steps 1 to 2 to find the operating value for test points 2, 3 in table 17.
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.
4. Repeat steps 1 to 3 to find the operating value for the phase-to-earth fault L3–E
according to figure 15 and table 18.

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Test points 8, 9. 10 and 11 are intended to test the directional lines of

impedance protection. Since directionality is a common function for all 5
measuring zones, it is only necessary to test points 8, 9. 10 and 11 once in
the forward direction in order to test the accuracy of directionality
(directional angles). Directional functionality testing (trip inside, no-trip
outside) should always be made for all impedance zones set with
directionality (forward or reverse).

10.4.1.2 Measuring the operating time of distance protection zones M14944-154 v6

Procedure:

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition to find the operating time for the phase-to-phase fault
according to test point 12 in figure 14 and table 17 for zone 1. Compare the result of the
measurement with the setting t1PP.
3. Repeat steps 1 to 2 to find the operating time for the phase-to-earth fault according to
test point 12 in figure 15 and table 18. Compare the result of the measurement with the
setting t1PE.
4. Repeat steps 1 to 3 to find the operating time for all other used measuring zones.
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.

10.4.1.3 Completing the test M14944-167 v3

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.2 Phase selection with load encroachment, quadrilateral

characteristic FDPSPDIS M13906-3 v9

Prepare the IED for verification of settings outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The phase selectors operate on the same measuring principles as the impedance measuring
zones. So it is necessary to follow the same principles as for distance protection, when
performing the secondary injection tests.

Measure operating characteristics during constant current conditions. Keep the measured
current as close as possible to the rated value of its associated input transformer, or lower.
But ensure that it is higher than the set minimum operating current.

Ensure that the maximum continuous current to the IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

To verify the settings the operating points according to figures 16 and 17 should be tested. See
also tables 19 and 20 for information.

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Testing functionality by secondary injection

X ( W / loop)

4 85% 3

( X 1 + XN ) 5

ArgNegRes 60°
2 R ( W / loop)
7
6

50% of RLdFw

RFFwPE IEC09000734-4-en.vsd

IEC09000734 V4 EN-US

Figure 16: Operating characteristic for phase selection function, forward direction
single-phase faults

Table 19: Test points for phase-to-earth loop L3-E (Ohm/loop)

Test point Reach Value Comments
1 X [X1+XN] XN=(X0-X1)/3
R 0
2 X 0
R RLdFw When RLdFW < RFFwPE
R RFFwPE When RLdFwPE > RFFwPE
3 X 0.85·[X1+XN] R≈0.491·(X1+XN)+RFFwPE
R 0.85·[X1+XN]·1/tan(60°)+RFFwPE
4 X 0.85·[X1+XN] Can be limited by RFFwPE
R -0.85·[X1+XN]·
tan (AngNegRes-90°)
5 X RFFwPE·tan (ArgLd) Only when RLdFw < RFFwPE
R RFFwPE
6 X -0.5·RLdFw·tan (ArgDir)
R 0.5·RLdFw

Table 19 is used together with figure 16.

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Testing functionality by secondary injection

X ( W / phase)

4 85% 3

X1 ArgLd

5
ArgNegRes
60°
2
R ( W / phase)
6 7
ArgDir

50% RLdFw

0.5·RFFwPP IEC09000735-3-en.vsd

IEC09000735 V3 EN-US

Figure 17: Operating characteristic for phase selection function, forward direction
phase-to-phase faults

Table 20: Test points for phase-to-phase loops L1–L2 (Ohm/phase)

Test point Reach Value Comments
1 X X1
R 0
2 X 0
R RLdFw When RLdFw < 0,5·RFFwPP
R 0,5·RFFwPP When RLdFw > 0,5·RFFwPP
3 X 0.85·X1 R=0.491·X1+0.5 RFFwPP
R 0.85·X1·1/tan(60°)+0.5 RFFwPP
4 X 0.85·X1 Can be limited by RFFwPP
R -0.85·X1·tan (AngNegRes-90°)
5 X 0.5·RFFwPP·tan (ArgLd) Only when RLdFW < RFFwPP
R 0.5·RFFwPP
6 X -0.5·RLdFw·tan (ArgDir)
R 0.5·RLdFw

Table 20 is used together with figure 17.

10.4.2.1 Measuring the operating limit of set values M13906-73 v6

Procedure:

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Testing functionality by secondary injection

1. Supply the IED with healthy conditions for at least two seconds.
2. Apply the fault condition and slowly decrease the measured impedance to find the
operate value for of the phase-to-earth loop L3, test point 1, according to figure 16.
Compare the result of the measurement with the expected value according to table 19.
The corresponding binary signals that inform about the operation of the phase selection
measuring elements are available in the local HMI under
Main menu/Test/Function status/Impedance Protection/PhaseSelection(PDIS, 21)/
FDPSPDIS:x.
3. Repeat steps 1 to 2 to find the operate values for the remaining test points according to
figure 16 and table 19.

When the load encroachment characteristic is deliberately set very high in

order not to have an influence, then the test points 2 and 5 can be
replaced by test point 7.

4. Repeat steps 1 to 3 to find the operate value for the phase-to-phase fault in L1 — L2
according to figure 17 and table 20.

10.4.2.2 Completing the test M13906-301 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.3 Full scheme distance protection, mho characteristic ZMHPDIS M14944-3 v10

Prepare the IED for verification of settings outlined in section "Requirements" and section
"Preparing for test" in this chapter.

Consider releasing of the zone to be tested by setting the phase selector FMPSPDIS to On .

The programming of the autorecloser function SMBRREC determines if three-phase or single-

phase trip is initiated as result of the test.

Keep the current constant when measuring operating characteristics. Keep the current as
close as possible to its rated value or lower. But make sure it is higher than the set minimum
operating current.

Ensure that the maximum continuous current in an IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

To verify the mho characteristic, at least two points should be tested.

In the following, three test points are proposed. The mho characteristic always goes through
the origin, which automatically gives a fourth point for the characteristic.

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Testing functionality by secondary injection

10.4.3.1 Phase-to-phase faults M14944-292 v8

X 1
ZPP

3 2
50%

ZAngPP R Ohm/phase

IEC07000009-4-en.vsd
IEC07000009 V4 EN-US

Figure 18: Proposed test points for phase-to-phase fault

Table 21: Test points for phase-to-phase (ohms / phase)

Test reach Value Comments
points
1 X ZPP · sin(ZAngPP)
R ZPP · sin(ZAngPP)
2 X 0,5· (ZPP· sin(ZAngPP)
R 0,5·ZPP + ΔR = 0,5·ZPP·(1+cos(ZAngPP))
3 X 0,5·ZPP·sin(ZAngPP)
R 0,5·ZPP - ΔR = 0,5·ZPP(1-cos(ZAngPP))

Change the magnitude and angle of phase-to-phase voltage to achieve impedances at test
points 1, 2 and 3. For each test point, observe that the output signals, START, STLx and STPP
are activated where x refers to the actual phase to be tested. After the timer tPP for the actual
zone has elapsed, also the signals TRIP, TRPP and TRx shall be activated.

10.4.3.2 Phase-to-earth faults M14944-393 v7

For simplicity, the same test points as for phase-to-phase faults are proposed, but
considering new impedance values.

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Testing functionality by secondary injection

50%

ZAngPE R
Ohm/loop

IEC07000010-4-en.vsd
IEC07000010 V4 EN-US

Figure 19: Proposed test points for phase-to-earth faults

Table 22: Test points for phase-to-earth loops L1-L2 (Ohm/Loop)

Test Reach Value Comments
points
1 X ZPE · sin(ZAngPE)
R ZPE · cos(ZAngPE)
2 X 0,5·ZPE · sin(ZAngPE)
R 0,5·ZPE + ΔR = 0,5·ZPE · (1 - cos(ZAngPE))
3 X 0,5·ZPE·sin(ZangPE)
R 0,5·ZPE - ΔR = 0,5·ZPE · (1 - cos(ZAngPE))

Check also in the same way as for phase-to-earth fault for each test point that the output
signals STPE, are activated where x refers to the actual phase to be tested. After the timer tPE
for the zone has elapsed, also the signals TRIP, TRPE and TRx shall be activated.

10.4.4 Faulty phase identification with load encroachment FMPSPDIS GUID-79761A97-A99A-4788-94A5-341308DF6E45 v3

There is no specific test routine for this function. The function is tested in conjunction with
other impedance (mho) functions.

10.4.5 Distance protection zones, quadrilateral characteristic,

separate settings ZMRPDIS GUID-A35C2DED-70A6-4E96-864D-3A6C1147B350 v3

Prepare the IED for verification of settings as outlined in section "Preparing for test" in this
chapter.

Consider releasing Zone 1 with the Phase selection with load encroachment, quadrilateral
characteristic (FRPSDPIS). If the autorecloser is not released and in service, trip will always be
three phase.

Measure operating characteristics during constant current conditions. Keep the measured
current as close as possible to its rated value or lower. But make sure it is higher than 30% of
the rated current.

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Ensure that the maximum continuous current in an IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

The test procedure has to take into consideration that the shaped load encroachment
characteristic is active. It is therefore necessary to check the setting. To verify the settings
with the shaped load encroachment characteristic the test should be carried out according to
figures 20 and 21 and tables 23 and 24. In cases where the load encroachment characteristic is
activated tests according to the adjusted figures should be carried out.

To verify the settings for the operating points according to the following fault types should be
tested:

• One phase-to-phase fault

• One phase-to-earth fault

The shape of the operating characteristic depends on the values of the setting parameters.

The figures illustrating the characteristic for the distance protection function
can be used for settings with and without load encroachment. The solid lines
designate the diagram applicable when the load current compensation is
active. The solid line and all test points except 13 are valid for this case.
When the load current compensation is inactive, the dotted lines and test point
13 are valid. Test points 5, 6, and 7 are not valid for this measurement.

1 2

80%
11 3

50%
X1 10 4
12
120° LD
a 5 Arg
6 b=
R (Ohm/phase)
7 13
9 c 20°
8
40% of RLdFw
80% of RLdFw
0.5 x RFPP

IEC05000368-3-en
IEC05000368 V3 EN-US

Figure 20: Distance protection characteristic with test points for phase-to-phase
measurements
Table 23 is used in conjunction with figure 20.

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Testing functionality by secondary injection

1 2

80%
11 3

50%
X1+XN 10 4
12
5 D
a
120°
A rgL
6 b=
R (Ohm/loop)
7 13
9 20°
8

c
40% of RLdFw

80% of RLdFw
alt. 80% of
RFPE
RFPE (Load
encroachment)
IEC05000369-3-en.vsd
IEC05000369 V3 EN-US

Figure 21: Distance protection characteristic with test points for phase-to-earth
measurements
Table 24 is used in conjunction with figure 21.

Table 23: Test points for phase-to-phase loops L1-L2 (Ohm/Loop)

Test point Reach Set value Comments
1 X X1set

R 0
2 X X1set

R R1set

3 X 0.8 x X1set

R 0.8 x R1set+ RFPP/2

4 X 0.5 x X1set

R 0.5 x R1set+ RFPP/2

5 X 0.85 x RFPP x tan (ArgRLd) ArgRLd = angle for the maximal load transfer
R 0.85 x RFPP
6 X RLdFw x tan (ArgLd)
R RLdFw
7 X RLdFw x tan (ArgLd)
R 0
8 X –0.2143 x RFPP/2 Exact: 0.8 x RFPP/2 (ArgDir)
R 0.8 x RFPP/2
9 X –0.4 x RLdFw x tan(ArgDir)
R 0.4 x RLdFw
10 X 0.5 x X1set Exact –0.5 x R1set x tan(ArgNegRes-90)

R –0.23 x X1set

11 X 0.8 x X1set Exact –0.5 x R1set x tan(ArgNegRes-90)

R –0.37 x X1 set

Table continues on next page

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Testing functionality by secondary injection

Test point Reach Set value Comments

12 X 0.5 x X1set

R 0.5 x R1set

13 X 0 Only used when OperationLdCmp setting is 0

(Off)
R 0.5 x RFPP

Table 24: Test points for phase-to-earth L3-E (Ohm/Loop)

Test point Reach Value Comments
1 X (2 x X1set+X0set)/3

R 0
2 X (2 x X1set+ X0set)/3

R 2 x R1set+ R0set)/3

3 X 0.8 x (2 x X1set+ X0set)/3

R 0.8 x (2 x R1set+ R0set)/3

+RFPEset

4 X 0.5 x (2 x X1set+ R0set)/3

R 0.5 x (2 x R1set+R0set)/3 +
RFPEset

5 X 0.85 x RFPEset x tan(ArgLdset) ArgLd = angle for the maximal load transfer.

R 0.85 x RFPE
6 X RLdFwset x tan(ArgLdSet)
R RLdFwset

7 X 0
R RLdFwset

8 X –02143 x RLdFwset Exact: 0.8 x RFPE x tan (ArgDir)

R 0.8 x RLdFwset

9 X –0.8 x RLdFwset x tan(ArgDir)

R 0.8 x RLdFwset

10 X 0.17 x (2 x X1set + X0 set) Exact: 0.5 x (2 x X1set X0 set)/3

R -0.36 x (2 x X1set + X0set) Exact: 0.5 x (2X1set + X0set)/(3 x tan(AgNegDir90)

11 X 0.27 x (2 x X1set+X0set) Exact: 0.8 x (2 x X1set + X0set)/3

R –0.57 x (2 x X1set + X0set) Exact: 0.8 x (2X1set + X0set)/(3 x tan(AngNegDir

90))
12 X 0.5 x (2 x X1set + X0set)/3

R 0.5 x (2 x R1set + R0set)/3

13 X 0
R RFPE

10.4.5.1 Measuring the operating limit of set values GUID-02EE80DB-CE52-49F0-99C4-14FD84766009 v3

Procedure:

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Testing functionality by secondary injection

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition and slowly decrease the measured impedance to find the
operating value of the phase-to-phase fault for zone 1 according to test point 1 in
figure 20 and table 23. Compare the result of the measurement with the set value.
3. Repeat steps 1 to 2 to find the operating value for test points 2, 3 in table23.
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.
4. Repeat steps 1 to 3 above to find the operating value for the phase-to-earth fault L3-E
according to figure 21 and table 24.

Test points 8, 9, 10 and 11 are intended to test the directional lines of

impedance protection. Since directionality is a common function for all 5
measuring zones, it is only necessary to test points 8, 9, 10 and 11 once, in
the forward direction in order to test the accuracy of directionality
(directional angles). Directional functionality testing (trip inside, no-trip
outside) should always be made for all impedance zones set with
directionality (forward or reverse).

10.4.5.2 Measuring the operating time of distance protection zones GUID-9AEFB83B-A343-4965-BB41-59062CC0DB5F v3

Procedure:

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition to find the operating time for the phase-to-phase fault
according to test point 10 in figure 20 and table 23 for zone 1. Compare the result of the
measurement with the setting tPP.
3. Repeat steps 1 to 2 to find the operating time for the phase-to-earth fault according to
test point 10 in figure 21 and table 24. Compare the result of the measurement with the
setting tPE.
4. Repeat steps 1 to 2 to find the operating time for all other used measuring zones.
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.

10.4.6 Phase selection, quadrilateral characteristic with settable

angle FRPSPDIS GUID-701C863B-40C6-42D7-A0C8-ECEB084B1165 v4

Prepare the IED for verification of settings as outlined in section "Preparing for test" in this
chapter.

The phase selectors operate on the same measuring principles as the impedance measuring
zones. So it is necessary to follow the same principles as for distance protection, when
performing the secondary injection tests.

Measure operating characteristics during constant current conditions. Keep the measured
current as close as possible to the rated value of its associated input transformer, or lower.
But ensure that it is higher than 30% of the rated current.

Ensure that the maximum continuous current of an IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

To verify the settings the operating points according to figures 22 and 23 should be tested.
See also tables 25 and 26 for information.

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Testing functionality by secondary injection

X ( W / loop)

4 85% 3

( X 1 + XN ) 5

ArgNegRes 60°
2 R ( W / loop)
7
6

50% of RLdFw

RFFwPE IEC09000734-4-en.vsd

IEC09000734 V4 EN-US

Figure 22: Operating characteristic for phase selection function, forward direction
single-phase faults

X ( W / phase)

4 85% 3

X1 ArgLd

5
ArgNegRes
60°
2
R ( W / phase)
6 7
ArgDir

50% RLdFw

0.5·RFFwPP IEC09000735-3-en.vsd

IEC09000735 V3 EN-US

Figure 23: Operating characteristic for phase selection function, forward direction
phase-to-phase faults

Table 25: Test points for phase-to-earth loop L3-E (Ohm/loop)

Test point Value Comments
1 X [X1+XN] XN=(X0-X1)/3
R 0
2 X 0
R RLdFw
Table continues on next page

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Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

Test point Value Comments

3 X 0.85·[X1+XN] R≈0.491·(X1+XN)+RFFwPE
R 0.85·[X1+XN]·1/tan(60°)+RFFwPE
4 X 0.85·[X1+XN]
R -0.85·[X1+XN]·
tan (AngNegRes-90°)
5 X RFFwPE·tan (ArgLd)
R RFFwPE
6 X -0.5·RLdFw·tan (ArgDir)
R 0.5·RLdFw

The table showing test points for phase-to-earth loops is used together with figure 22.

Table 26: Test points for phase-to-phase loops L1–L2

Test point Value Comments
1 X X1
R 0
2 X 0
R RLdFw
3 X 0.85·X1 R=0.491·X1+0.5 RFFwPP
R 0.85·X1·1/tan(60°)+0.5 RFFwPP
4 X 0.85·X1
R -0.85·X1·tan (AngNegRes-90°)
5 X 0.5·RFFwPP·tan (ArgLd)
R 0.5·RFFwPP
6 X -0.5·RLdFw·tan (ArgDir)
R 0.5·RLdFw

The table showing test points for phase-to-phase loops is used together with figure 23.

10.4.6.1 Measuring the operating limit of set values GUID-B1B7DEB6-7BC3-4A90-8D8F-E4E69B434AFA v3

Procedure:

1. Supply the IED with healthy conditions for at least two seconds.
2. Apply the fault condition and slowly decrease the measured impedance to find the
operate value for of the phase-to-earth loop L3, test point 1, according to figure 22.
Compare the result of the measurement with the expected value according to table 25.
The corresponding binary signals that inform about the operation of the phase selection
measuring elements are available in the local HMI under
Main menu/Test/Function status/Impedance Protection/PhaseSelection(PDIS, 21)/
FRPSPDIS:x .
3. Repeat steps 1 to 2 to find the operate values for the remaining test points according to
figure 22 and table 25.

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Testing functionality by secondary injection

When the load encroachment characteristic is deliberately set very high in

order not to have an influence, then the test points 2 and 5 can be
replaced by test point 7.

4. Repeat steps 1 to 3 to find the operate value for the phase-to-phase fault in L1 — L2
according to figure 23 and table 26.

10.4.6.2 Completing the test M13906-301 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.7 High speed distance protection zones, quadrilateral and mho

characteristic ZMFPDIS GUID-DF1650F4-EC3E-402B-BE26-EF2EF1034237 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Measure operating characteristics during constant current conditions. Keep the measured
current as close as possible to its rated value or lower. But make sure it is higher than the set
minimum operating current.

Ensure that the maximum continuous current to the IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

The test procedure has to take into consideration that the shaped load encroachment
characteristic is active. It is therefore necessary to check the setting. To verify the settings
with the shaped load encroachment characteristic the test should be carried out according to
figures 24 and 25 and tables 27 and 28. In cases where the load encroachment characteristic is
activated tests according to the adjusted figures should be carried out.

To verify the settings for the operating points according to the following fault types should be
tested:

• One phase-to-phase fault

• One phase-to-earth fault

The shape of the operating characteristic depends on the values of the setting parameters.

The figures illustrating the characteristic for the distance protection function
can be used for settings with and without load encroachment. The solid lines
designate the diagram applicable when the load current compensation is
active. The solid line and all test points except 13 are valid for this case.
When the load current compensation is inactive, the dotted lines and test point
13 are valid. Test points 5, 6, and 7 are not valid for this measurement.

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Testing functionality by secondary injection

1 2

80%
11 3

50%
X1 10 4
12
120° D
a 5 A rgL
6 b=
R (Ohm/phase)
7 13
9 c 20°
8
40% of RLdFw
80% of RLdFw
0.5 x RFPP

IEC05000368-3-en
IEC05000368 V3 EN-US

Figure 24: Distance protection characteristic with test points for phase-to-phase
measurements

Table 27: Test points for phase-to-phase loops L1-L2 (Ohm/Loop)

Test point Reach Set value Comments
1 X X1set

R 0
2 X X1set

R R1set

3 X 0.8 x X1set

R 0.8 x R1set+ RFPP/2

4 X 0.5 x X1set

R 0.5 x R1set+ RFPP/2

5 X 0.85 x RFPP x tan (ArgLd) ArgLd = angle for the maximal load transfer
R 0.85 x RFPP
6 X RLdFw x tan (ArgLd)
R RLdFw
7 X 0
R RLdFw
8 X –0.2143 x RFPP/2 Exact: 0.8 x RFPP/2 (ArgDir=20°)
R 0.8 x RFPP/2
9 X –0.4 x RLdFw x tan(ArgDir=20°)
R 0.4 x RLdFw
10 X 0.5 x X1set Exact –0.5 x R1set x tan(ArgNegRes=30°)

R –0.23 x X1set

11 X 0.8 x X1set Exact –0.5 x R1set x tan(ArgNegRes=30°)

R –0.37 x X1 set

Table continues on next page

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Testing functionality by secondary injection

Test point Reach Set value Comments

12 X 0.5 x X1set

R 0.5 x R1set

13 X 0
R 0.5 x RFPP

Table 27 is used in conjunction with figure 24.

1 2

80%
11 3

50%
X1+XN 10 4
12
5 D
a
120°
A rgL
6 b=
R (Ohm/loop)
7 13
9 20°
8
c

40% of RLdFw

80% of RLdFw
alt. 80% of
RFPE
RFPE (Load
encroachment)
IEC05000369-3-en.vsd
IEC05000369 V3 EN-US

Figure 25: Distance protection characteristic with test points for phase-to-earth
measurements
Table 28 is used in conjunction with figure 25.

Table 28: Test points for phase-to-earth L3-E (Ohm/Loop)

Test point Reach Value Comments
1 X (2 x X1set+X0set)/3

R 0
2 X (2 x X1set+ X0set)/3

R 2 x R1set+ R0set)/3

3 X 0.8 x (2 x X1set+ X0set)/3

R 0.8 x (2 x R1set+ R0set)/3

+RFPEset

4 X 0.5 x (2 x X1set+ R0set)/3

R 0.5 x (2 x R1set+R0set)/3 +
RFPEset

5 X 0.85 x RFPEset x tan(ArgLdset) ArgLd = angle for the maximal load transfer

R 0.85 x RFPE
6 X RLdFwset x tan(ArgLdSet)
R RLdFwset

Table continues on next page

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Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

Test point Reach Value Comments

7 X 0
R RLdFwset

8 X –02143 x RLdFwset Exact: 0.8 x RFPE x tan (ArgDir=20°)

R 0.8 x RLdFwset

9 X –0.8 x RLdFwset x
tan(ArgDir=20°)
–0.8 x RLdFwdset x
tan(ArgDir=20°)
R 0.8 x RLdFwset

10 X 0.17 x (2 x X1set + X0 set) Exact: 0.5 x (2 x X1set X0 set)/3

R -0.36 x (2 x X1set + X0set) Exact: 0.5 x (2X1set + X0set)/(3 x

tan(AgNegDir=30°)
11 X 0.27 x (2 x X1set+X0set) Exact: 0.8 x (2 x X1set + X0set)/3

R –0.57 x (2 x X1set + X0set) Exact: 0.8 x (2X1set + X0set)/(3 x

tan(AgNegDir=30°)
12 X 0.5 x (2 x X1set + X0set)/3

R 0.5 x (2 x R1set + R0set)/3

13 X 0
R RFPE

10.4.7.1 Measuring the operating limit of set values GUID-3FA4B640-38E7-406E-8FCC-8DEDABB024C4 v4

Procedure:

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition and slowly decrease the measured impedance to find the
operating value of the phase-to-phase fault for zone 1 according to test point 1 in figure
24 and table 27. Compare the result of the measurement with the set value.
3. Repeat steps 1 to 2 to find the operating value for test points 2, 3 in table 27
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.
4. Repeat steps 1 to 3 to find the operating value for the phase-to-earth fault L3-E according
to figure 25 and table 28.

Test points 8, 9, 10 and 11 are intended to test the directional lines of

impedance protection. Since directionality is a common function for all six
measuring zones, it is only necessary to test 8, 9, 10 and 11 once, in the
forward direction in order to test the accuracy of directionality
(directional angles). Directional functionality testing (trip inside, no-trip
outside) should always be made for all impedance zones set with
directionality (forward or reverse).

10.4.7.2 Measuring the operating time of distance protection zones GUID-BB93C603-F43E-40CB-8EFA-3B0F280C011D v5

Procedure:

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Testing functionality by secondary injection

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition to find the operating time for the phase-to-phase fault
according to test point 12 in figure 24 and table 27 for zone 1. Compare the result of the
measurement to the setting tPPZ1.
3. Repeat steps 1 to 2 to find the operating time for the phase-to-earth fault according to
test point 12 in figure 25 and table 28. Compare the result of the measurement to the
setting tPEZ1.
4. Repeat steps 1 to 2 to find the operating time for all other used measuring zones.
The zones that are not tested have to be blocked and the zone that is tested has to be
released.

10.4.7.3 Completing the test GUID-60C5389E-B021-45BB-8CB3-E21348CF50EF v2

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.8 High Speed distance for series compensated line zones,

quadrilateral and mho characteristic ZMFCPDIS GUID-EE954483-7157-4EA2-A5DD-537DF6864BC2 v3

Prepare the IED for verification of settings outlined in section "Requirements" and section
"Preparing for test" in this chapter.

Measure operating characteristics during constant current conditions. Keep the measured
current as close as possible to its rated value or lower. But make sure it is higher than the set
minimum operating current.

Ensure that the maximum continuous current to the IED does not exceed four times its rated
value, if the measurement of the operating characteristics runs under constant voltage
conditions.

The test procedure has to take into consideration that the shaped load encroachment
characteristic is active. It is therefore necessary to check the setting. To verify the settings
with the shaped load encroachment characteristic the test should be carried out according to
figures 26 and 27 and tables 29 and 30. In cases where the load encroachment characteristic is
activated tests according to the adjusted figures should be carried out.

To verify the settings for the operating points according to the following fault types should be
tested:
• One phase-to-phase fault
• One phase-to-earth fault

The shape of the operating characteristic depends on the values of the setting parameters.

The figures illustrating the characteristic for the distance protection function
can be used for settings with and without load encroachment. The solid lines
designate the diagram applicable when the load current compensation is
active. The solid line and all test points except 13 are valid for this case.
When the load current compensation is inactive, the dotted lines and test point
13 are valid. Test points 5, 6, and 7 are not valid for this measurement.

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Testing functionality by secondary injection

1 2

80%
11 3

50%
X1 10 4
12
120° D
a 5 A rgL
6 b=
R (Ohm/phase)
7 13
9 c 20°
8
40% of RLdFw
80% of RLdFw
0.5 x RFPP

IEC05000368-3-en
IEC05000368 V3 EN-US

Figure 26: Distance protection characteristic with test points for phase-to-phase
measurements

Table 29: Test points for phase-to-phase loops L1-L2 (Ohm/Loop)

Test point Reach Set value Comments
1 X X1set

R 0
2 X X1set

R R1set

3 X 0.8 x X1set

R 0.8 x R1set+ RFPP/2

4 X 0.5 x X1set

R 0.5 x R1set+ RFPP/2

5 X 0.85 x RFPP x tan (ArgLd) ArgLd = angle for the maximal load transfer
R 0.85 x RFPP
6 X RLdFw x tan (ArgLd)
R RLdFw
7 X RLdFw x tan (ArgLd)
R 0
8 X –0.2143 x RFPP/2 Exact: 0.8 x RFPP/2 (ArgDir=20°)
R 0.8 x RFPP/2
9 X –0.4 x RLdFw x tan(ArgDir=20°)
R 0.4 x RLdFw
10 X 0.5 x X1set Exact –0.5 x R1set x tan(ArgNegRes=30°)

R –0.23 x X1set

11 X 0.8 x X1set Exact –0.5 x R1set x tan(ArgNegRes=30°)

R –0.37 x X1 set

Table continues on next page

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Testing functionality by secondary injection

Test point Reach Set value Comments

12 X 0.5 x X1set

R 0.5 x R1set

13 X 0
R 0.5 x RFPP

Table 29 is used in conjunction with figure 26.

1 2

80%
11 3

50%
X1+XN 10 4
12
5 D
a
120°
A rgL
6 b=
R (Ohm/loop)
7 13
9 20°
8
c

40% of RLdFw

80% of RLdFw
alt. 80% of
RFPE
RFPE (Load
encroachment)
IEC05000369-3-en.vsd
IEC05000369 V3 EN-US

Figure 27: Distance protection characteristic with test points for phase-to-earth
measurements
Table 30 is used in conjunction with figure 27.

Table 30: Test points for phase-to-earth L3-E (Ohm/Loop)

Test point Reach Value Comments
1 X (2 x X1set+X0set)/3

R 0
2 X (2 x X1set+ X0set)/3

R 2 x R1set+ R0set)/3

3 X 0.8 x (2 x X1set+ X0set)/3

R 0.8 x (2 x R1set+ R0set)/3

+RFPEset

4 X 0.5 x (2 x X1set+ R0set)/3

R 0.5 x (2 x R1set+R0set)/3 +
RFPEset

5 X 0.85 x RFPEset x tan(ArgLdset) ArgLd = angle for the maximal load transfer

R 0.85 x RFPE
6 X RLdFwset x tan(ArgLdSet)
R RLdFwset

Table continues on next page

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Testing functionality by secondary injection

Test point Reach Value Comments

7 X 0
R RLdFwset

8 X –02143 x RLdFwset Exact: 0.8 x RFPE x tan (ArgDir=20°)

R 0.8 x RLdFwset

9 X –0.8 x RLdFwset x
tan(ArgDir=20°)
R 0.8 x RLdFwset

10 X 0.17 x (2 x X1set + X0 set) Exact: 0.5 x (2 x X1set X0 set)/3

R -0.36 x (2 x X1set + X0set) Exact: 0.5 x (2X1set + X0set)/(3 x

tan(AgNegDir=30°)
11 X 0.27 x (2 x X1set+X0set) Exact: 0.8 x (2 x X1set + X0set)/3

R –0.57 x (2 x X1set + X0set) Exact: 0.8 x (2X1set + X0set)/(3 x

tan(AgNegDir=30°)
12 X 0.5 x (2 x X1set + X0set)/3

R 0.5 x (2 x R1set + R0set)/3

13 X 0
R RFPE

10.4.8.1 Measuring the operating limit of set values GUID-24FEBCE7-3409-4204-AA15-A1E0A1605866 v3

Procedure:

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition and slowly decrease the measured impedance to find the
operating value of the phase-to-phase fault for zone 1 according to test point 1 in
figure 26 and table 29. Compare the result of the measurement with the set value.
3. Repeat steps 1 to 2 to find the operating value for test points 2, 3 in table 29.
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.
4. Repeat steps 1 to 3 to find the operating value for the phase-to-earth fault L3-E according
to figure 27 and table 30.

Test points 8, 9, 10 and 11 are intended to test the directional lines of

impedance protection. Since directionality is a common function for all six
measuring zones, it is only necessary to test points 8, 9, 10 and 11 once, in
the forward direction in order to test the accuracy of directionality
(directional angles). Directional functionality testing (trip inside, no-trip
outside) should always be made for all impedance zones set with
directionality (forward or reverse).

10.4.8.2 Measuring the operating time of distance protection zones GUID-70AEC42A-9BC7-445A-AE21-2CEC0C3A79DC v3

Procedure:

104
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Testing functionality by secondary injection

1. Subject the IED to healthy normal load conditions for at least two seconds.
2. Apply the fault condition to find the operating time for the phase-to-phase fault
according to test point 10 in figure 26 and table 29 for zone 1. Compare the result of the
measurement with the setting t1PP.
3. Repeat steps 1 to 2 to find the operating time for the phase-to-earth fault according to
test point 10 in figure 27 and table 30. Compare the result of the measurement with the
setting t1PE.
4. Repeat steps 1 to 2 to find the operating time for all other used measuring zones.
Observe that the zones that are not tested have to be blocked and the zone that is tested
has to be released.

10.4.8.3 Completing the test GUID-7FA2EA27-B6E2-48AB-8D53-22425E322FFA v1

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.9 Power swing detection ZMRPSB M13888-2 v9

The aim is to verify that the settings of the Power swing detection function ZMRPSB is
according to the setting table and to verify that ZMRPSB operates as expected.

Prepare the IED for verification of settings outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Before starting this process, all impedance measuring zones shall be set and in operation. Test
the outer resistive boarder in forward and reverse direction, RLdOutFw and RLdOutRv and the
inner reactive boarder in forward and reverse direction X1InFw and X1InRv. See figure 28.

The corresponding resistive border for the inner resistive boundary and outer resistive
boundary is calculated automatically from the setting of kLdRFw and kLdRRv.

The inner zone of ZMRPSB must cover all zones by at least 10% margin.

The test is mainly divided into two parts, one which aim is to verify that the settings are in
accordance to the selectivity plan and a second part to verify the operation of ZMRPSB. The
proposed test points for validation of the settings are numbered according to figure 28

Test of the interactions or combinations that are not configured are not considered in this
instruction.

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Testing functionality by secondary injection

X1OutFw X ZL
X1InFw

RLdOutRv j j
2
1 R

RLdInRv RLdOutFw
RLdInFw

X1InRv
4

X1OutRv
IEC09000226_1_en.vsd
IEC09000226 V1 EN-US

Figure 28: Operating principle and characteristic of the power swing detection function
(settings parameters in italic)

Where:
RLdInFw = RLdOutFw · kLdRFw
RLdInRv = RLdOutRv · kLdRRv
X1OutFw = X1InFw + (RLdOutFw - RLdInFw)
X1OutRv = X1InRv + (RLdOutFw - RLdInFw)

10.4.9.1 Verifying the settings M13888-11 v6

Preconditions

The following output signal shall be configured to binary output available: ZOUT, measured
impedance within outer impedance boundary.

1. Keep the measured current as close as possible to its rated value or lower. Keep it
constant during the test, but ensure that it is higher than the set minimum operating
current.
2. Ensure that the maximum continuous current to the IED does not exceed four times its
rated value, if the measurement of the operating characteristics runs under constant
voltage conditions.
3. Make the necessary connections and settings of the test equipment for test of point 1
according to figure 28.

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4. Decrease the measured three-phase impedance slowly and observe the operation value
for the signal ZOUT.
5. Compare the operation value with the set value.
6. Do the necessary change of the setting of the test equipment and repeat step 4 and step
5 for point 2, 3 and 4 according to figure 28.

10.4.9.2 Testing the power swing detection function ZMRPSB M13888-27 v6

Preconditions

The following output signals shall be configured to binary outputs: ZOUT, measured
impedance within outer impedance boundary, ZIN, measured impedance within inner
impedance boundary and START, power swing detection.

1. Slowly decrease the measured impedance in all three phases until the START signal gets
activated.
2. Increase the measured voltages to their rated values.
3. Decrease instantaneously voltages in all three phases to the values, which are
approximately 20% lower than the voltage that gives the set value R1LIn at the
predefined test current.
4. The START signal must not appear.
5. Increase the measured voltages to their rated values.

10.4.9.3 Testing the tR1 timer M13888-47 v8

Preconditions

• The input I0CHECK, residual current (3I0) detection used to inhibit the start output must
be configured to the output signal STPE on the FDPSPDIS or FRPSPDIS function.
• The input BLKI02, block inhibit of the start output for subsequent residual current
detection is connected to FALSE.

1. Program the test equipment for a single-phase to earth fault and energize FDPSPDIS or
FRPSDIS and check that the input BLOCK on the power swing detection function ZMRPSB
is activated.
2. Make a test sequence so that a single-phase to earth fault occurs after that the trajectory
of the impedance has passed the outer and inner boundary of ZMRPSB during power
swing. Use the result from test of ZMRPSB above to determine when the fault shall be
applied. The earth-fault must be activated before tR1 has elapsed.
3. Start the sequence and observe that the START signal will not be activated.

10.4.9.4 Testing the block input, interaction between FDPSPDIS or FRPSPDIS and
ZMRPSB M13888-73 v7

Precondition

The BLOCK input is configured and connected to STPE output on the FDPSPDIS or FRPSPDIS
function.

1. Make a test sequence so that a single phase-to-earth-fault occurs after that the
trajectory of the impedance has passed the outer boundary but not the inner boundary
of the power swing detection function ZMRPSB. Use the result from test of ZMRPSB
above to instance when the fault shall be applied.
2. Start the test sequence by continuously reducing the voltage and observe that the
output signal ZOUT may come, but not START.

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If the input I0CHECK is configured (connected to output signal STPE on FDPSPDIS or

FRPSPDIS, the test of inhibit of ZMRPSB at earth-fault during power swing can be done in
the same way as for test of tR1. The inhibit of ZMRPSB shall be instantaneous if the input
TRSP is activated at the same time as the input I0CHECK during power swing.

10.4.9.5 Completing the test M13888-99 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.10 Power swing logic PSLPSCH M14946-2 v4

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

Most readily available test equipment does not permit simulation of power-swing conditions
and the simultaneous occurrence of different faults with controlled fault impedance. For this
reason it is necessary to enable the logic by connecting the STPSD input signal to some other
functional signal, which is used for testing purposes.

Make sure that the existing configuration permits monitoring of the CS, TRIP signals on the
binary outputs of the IED. If not, configure connections to unused binary outputs, for test
purposes.

10.4.10.1 Testing the carrier send and trip signals M14946-8 v3

Procedure

1. Set the operation of all distance zones, which are supposed to be blocked by the
operation of ZMRPSB, to Off.
2. Configure the STPSD functional inputs to the TRIP output of the underreaching power-
swing zone, if the underreaching communication scheme is used.
3. Start instantaneously any kind of fault within the underreaching power-swing zone and
check, that:
• The CS signal appears after the time delay, which is equal to the sum of set time
delays for the underreaching zone tnPP or tnPE (dependent on the type of fault)
and for the carrier send security timer tCS. Also add the usual operate time for the
underreaching zone (approximately 30ms).
• The TRIP signal appears after the time delay, which is equal to the sum of set time
delays for the underreaching zone tnPP or tnPE (dependent on the type of fault)
and for the trip security timer tTrip. Also add the usual operate time for the
underreaching zone (approximately 30ms).
4. Simulate the receiving of the carrier signal so that the functional input signal CR becomes
a logical one.
5. Configure the STPSD input to connect to the output START of the carrier accelerating
zone (Power-swing overreaching zone).
6. Initiate any kind of fault within the carrier accelerating zone and check that the TRIP
signal appears after the time, which is equal to the time delay set on the trip timer tTrip.
Also consider the (average) operate time of the carrier acceleration zone (approximately
30ms).

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10.4.10.2 Testing the influence of the residual overcurrent protection M14946-28 v5

Additionally connect the IED according to the test instructions for the four step residual
overcurrent protection function EF4PTOC, if the Power swing logic (PSLPSCH) is configured in
a way that is controlled by this protection.

Procedure

1. Initiate a single phase-to-earth fault within both power-swing zones.

Make sure that none of CS or TRIP output signals appear after the time delays tCS and
tTrip.
BLKZMUR must appear together with the fault and must remain active until the fault has
been switched off plus the time delay, as set on the tBlkTr timer.
2. Initiate a phase-to-phase fault within the operating area of both power-swing zones.
Make sure that CS and TRIP output signals appear after the time delays tCS.
3. Switch the operation of the zone 1 distance protection function on and fulfill all the
conditions for single-pole autoreclosing.
4. Simulate a single phase-to-earth fault within the reach of zone 1 and both power-swing
zones.
The fault should cause a single-pole tripping with the normal operating time of zone 1.
5. Repeat the fault within the dead time of single-pole autoreclosing.
Make sure, that PSLPSCH generates a BLKZMUR signal and no CS and TRIP.

10.4.10.3 Checking the underreaching zone M14946-49 v3

Procedure

1. Set the operation of all normal distance protection zones to On.

2. Simulate a fault without fault resistance in the middle of distance protection zone 1.
Make sure that the trip appears within the operate time for the distance protection zone
1 and no BLKZMOR output signal appears.
3. Switch off the fault and prepare a new fault without fault resistance within the normal
distance protection zone 2 operate area, but outside the zone 1 operate area.
4. Switch on the fault and move it into the zone 1 operate area with a time delay longer than
the time set on the tDZ timer and faster than the time set on timer tZL.
5. Observe the operate time, which must be equal to the operate time of zone 1, after the
measured impedance enters its operate area.
No delayed operation of zone 1 must be observed.
6. Configure the STPSD functional input to connect to the START functional output and
repeat the previous fault.
Fast trip, caused by the operation of zone 1 must appear with a time delay, which is equal
to the set time delay on the timer tZL plus zone 1 normal operate time. Also, observe the
BLKZMOR functional output signal, which must appear for a short time.
7. Be sure to establish the original configuration of the IED and the original settings of all
setting parameters.

10.4.10.4 Completing the test M14946-70 v2

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.11 Pole slip protection PSPPPAM SEMOD175096-3 v2

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

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Testing functionality by secondary injection

10.4.11.1 Verifying the settings SEMOD175096-7 v3

It is assumed that setting of the pole slip protection function PSPPPAM is done according to
impedances as seen in figure 29 and figure 30.

The test is done by means of injection of three-phase current and three-phase voltage from a
modern test device. This test device shall be able to give voltage and current with the
possibility to change voltage and current amplitude and the angle between the injected
voltage and current. The parameter setting shall be according to the real application chosen
values.

Procedure

1. Feed the IED with current and voltage corresponding to a normal operation point
Injected voltage U equal to base voltage (UBase) and the injected current I equal to half
the base current (IBase). The angle between the voltage and current shall be 0°.
2. With maintained amplitude of the injected voltage the current amplitude and angle is
changed to a value ZC/2.
This is done with a speed so that the final impedance is reached after 1 second. As the
injected voltage is higher than 0.92 UBase no START signal should be activated.
3. With reduced amplitude of the injected voltage to 0.8 UBase the current amplitude and
angle is changed to a value ZC/2.
This is done with a speed so that the final impedance is reached after 1 second. As the
injected voltage is lower than 0.92 UBase the START signal should be activated.
4. With reduced amplitude of the injected voltage to 0.8 UBase the current amplitude and
angle is changed via ZC/2 to a value corresponding to half IBase and 180° between the
injected current and voltage.
This is done with a speed so that the final impedance is reached after 1 second. As the
injected voltage is lower than 0.92 UBase the START signal should be activated. In
addition to this the signal ZONE1 should be activated.
5. Set N1Limit to 1 and repeat step 4.
Now the signals TRIP1 and TRIP should be activated.
6. With reduced amplitude of the injected voltage to 0.8 UBase the current amplitude and
angle is changed via ZC + (ZA – ZC)/2 to a value corresponding to half IBase and 180°
between the injected current and voltage.
This is done with a speed so that the final impedance is reached after 1s. As the injected
voltage is lower than 0.92 UBase the START signal should be activated. In addition to this
the signal ZONE2 should be activated.
7. Set N2Limit to 1 and repeat step 6.
Now the signals TRIP2 and TRIP should be activated.

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Testing functionality by secondary injection

Zone 1 Zone 2

EB X’d XT EA
ZS

IED
B A

jX

ZA
Pole slip
impedance
movement
Zone 2
ZC
TripAngle Zone 1
WarnAngle
f
R

ZB

IEC07000099_2_en.vsd
IEC07000099 V2 EN-US

Figure 29: Setting of the pole slip protection PSPPPAM

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Testing functionality by secondary injection

Imin > 0.10 IBase

Umax < 0.92 UBase AND

AND START
0.2 £ f(Ucos) £ 8Hz

d ³ StartAngle

AND ZONE1
Z cross line ZA - ZC

AND ZONE2
Z cross line ZC - ZB

Counter
aa³b
N1Limit b AND TRIP1

d £ TripAngle OR TRIP

Counter
a a³b
N2Limit b AND TRIP2

IEC07000100_2_en.vsd
IEC07000100 V2 EN-US

Figure 30: Logic diagram of the pole slip protection PSPPPAM

10.4.11.2 Completing the test SEMOD175096-39 v2

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.12 Out-of-step protection OOSPPAM GUID-BF2F7D4C-F579-4EBD-9AFC-7C03296BD5D4 v7

The out-of-step protection OOSPPAM function in the IED can be used for both generator
protection and as well for line protection applications.

The main purpose of the OOSPPAM function is to detect, evaluate, and take the required
action during pole slipping occurrences in the power system.

The OOSPPAM function detects pole slip conditions and trips the generator as fast as
possible, after the first pole-slip if the center of oscillation is found to be in zone 1, which
normally includes the generator and its step-up power transformer. If the center of oscillation
is found to be further out in the power system, in zone 2, more than one pole-slip is usually
allowed before the generator-transformer unit is disconnected. A parameter setting is
available to take into account the circuit breaker opening time. If there are several out-of-step
relays in the power system, then the one which finds the center of oscillation in its zone 1
should operate first.

Two current channels I3P1 and I3P2 are available in OOSPPAM function to allow the direct
connection of two groups of three-phase currents; that may be needed for very powerful
generators, with stator windings split into two groups per phase, when each group is
equipped with current transformers. The protection function performs a simple summation of
the currents of the two channels I3P1 and I3P2.

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10.4.12.1 Verifying the settings GUID-708C4033-3111-481F-9868-FF207C18C9F9 v1

The test of the out-of-step protection function is made to verify that the trip is issued if the
following events happen.

• the impedance, seen by the function, enters the lens characteristic from one side and
leaves it from the opposite side
• the trip is issued according to the settings TripAngle and tBreaker

The tripping zone needs to be detected and confirmed. The test may be performed by taking
into account the following key points that are shown in Figure 31:

• the point RE (RE = Receiving End)

• the intersection between the line segment SE-RE and the X-line, which is defined through
the setting ReachZ1
• the point SE (SE = Sending End)

I = I(50 Hz) + I(49.5 Hz)

IEC10000141 V2 EN-US

Figure 31: Trajectory of the impedance Z(R, X) for the injected current with two
components: a 50 Hz component and a 49.5 Hz current component
The test of the out-of-step protection function requires the injection of the analog quantities
for a quite long time. The rating of the analogue channels is considered in order to avoid any
hardware damage. The test current is lower than the continuous permissive overload current
Iovrl of the protection current channels of the transformer module.

If the rated secondary current Irs of the analog channel is 1 A, then the maximum current test Its
is

I ts ≤ I ovrl = 4 × I rs = 4 A
EQUATION14041 V1 EN-US (Equation 1)

If the CT of the generator has ratio 9000/1 A, then in primary values

I rp 9000
I t ≤ I ovrl , p = I ovrl × = 4× = 36000 A
I rs 1
EQUATION14042 V1 EN-US (Equation 2)

Reference is made to the numerical values of the example, explained in the “Setting guidelines”
of the Application Manual. A test current equal to 2.5 time the base current of the generator is
chosen; this choice is related to the selected test voltage that is applied while testing the point
SE and RE.

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Testing functionality by secondary injection

I t = 2.5 × I Base = 2.5 × 8367 = 20918 A

EQUATION14043 V1 EN-US (Equation 3)

The parameter ReachZ1 defines the boundary between zone 1 and zone 2; it is expressed in
percent of the parameter ForwardX. If the setting of ReachZ1 = 12%, then corresponding
primary value of the reactance is

ReachZ 1 ForwardX 12 59.33

X RZ 1 = × × ZBase = × × 0.9522 = 0.0068Ω
100 100 100 100
EQUATION14044 V1 EN-US (Equation 4)

The calculation of the test voltage, that is related to ReachZ1, is based on the impedance ZRZ1
that has imaginary part XRZ1 and real part RRZ1 :

Re achZ 1 ForwardR 12 8.19

RRZ 1 = × × ZBase = × × 0.9522 = 0.009Ω
100 100 100 100
EQUATION14045 V1 EN-US (Equation 5)

The magnitude of the impedance ZRZ1 is:

Z RZ 1 = RRZ 1 + X RZ 1 = 0.009 + 0.068 = 0.069 W

2 2 2 2

EQUATION14046 V1 EN-US (Equation 6)

Hence the reference voltage of the test of the boundary between zone 1 and zone 2 is

Vt ,RZ 1 = Z RZ 1 × I t = 0.069 × 20918 = 1435V

EQUATION14047 V1 EN-US (Equation 7)

If the test voltage is lower than Vt,RZ1 (or in opposition), then the test is related to the zone 1; if
the test voltage is higher than Vt,RZ1, then the test is related to the zone 2.

Considering the resistances and reactances which are related to the settings (ForwardR,
ForwardX) and (ReverseR, ReverseX):

ForwardR 8.19
RFwdR = × ZBase = × 0.9522 = 0.078 Ω
100 100
EQUATION14048 V1 EN-US (Equation 8)

ForwardX 59.33
X FwdX = × ZBase = × 0.9522 = 0.565 Ω
100 100
EQUATION14049 V1 EN-US (Equation 9)

ReverseR 0.29
RRvsR = × ZBase = × 0.9522 = 0.003Ω
100 100
EQUATION14050 V1 EN-US (Equation 10)

ReverseR 29.6
X RvsX = × ZBase = × 0.9522 = 0.282 Ω
100 100
EQUATION14051 V1 EN-US (Equation 11)

and the voltages that are related to them:

Vt ,FwdZ = Z FwdZ × I t = R 2 FwdR + X 2 FwdX × I t = 0.0782 + 0.5652 × 20918 = 0.570

0 × 20918 = 11931V
EQUATION14052 V1 EN-US (Equation 12)

Vt ,RvsZ = Z RvsZ × I t = R 2 RvsR + X 2 RvsX × I t = 0.0032 + 0.2822 × 20918 = 0.282

2 × 20918 = 5899V
EQUATION14053 V1 EN-US (Equation 13)

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Testing functionality by secondary injection

The previous calculations are in primary values. They are transferred to secondary values to
perform injections by a test set. Primary values are transferred to secondary values by taking
into account the CT ratio and the VT ratio (respectively 9000/1 A and 13.8/0.1 kV in the
example).

The magnitude of the secondary voltages, that are related to the points RE and SE of the R-X
plane, needs to be checked.

RE (RFwdR, XFwdX):

VVT ,s 0.1
Vt ,FwdZs = Vt ,FwdZ × = 11931 × = 86.45V
VVT , p 13.8
EQUATION14054 V1 EN-US (Equation 14)

SE (RRvsR, XRvsX):

VVT ,s 0.1
Vt ,RvsZs = Vt ,RvsZ × = 5899 × = 42.75V
VVT , p 13.8
EQUATION14055 V1 EN-US (Equation 15)

The tests, which are described in this section, may require voltages that have magnitude equal
to 110% of the previous values. The continuous permissive overload voltage of the protection
voltage channels of the TRM module is 420 V; so the previous voltages may be applied to the
analog channels of the IED continuously. Limitations may be related to the available test set;
the current It was calculated by using a factor 2.5 (instead of the maximum value 4) in order to
reduce the magnitude of the test voltage for the points RE and SE.

Test sets usually do not have a feature to simulate a real network during a power swing and
apply the related analog quantities at the terminal of the generator. The scope of the present
test is not a simulation of a real network. Voltages and currents are supplied in order to
measure an impedance that changes in the time and traverses the plane R-X and, in particular,
the area inside the lens characteristic. The test may be performed by applying:

• Symmetric three-phase voltage at 50 Hz. The magnitude depends on the point of the
characteristic that needs to be verified. The following three main points of the line
segment SE-RE need to be checked:
• the point RE (RFwdR, XFwdX)
• a point which is related to the parameter ReachZ1 (boundary between zone 1 and
zone 2)
• the point SE (RRvsR, XRvsX)

The phase angle of the test voltages is equal to:

• arctan (ForwardX/ForwardR) for tests in the quadrant 1 and 2 of the R-X plane
• arctan (ReverseX/ReverseR) -180° for tests in the quadrant 3 and 4 of the R-X plane

• Symmetric three-phase current, where the current is the summation of two currents that
have the same magnitude, but different frequencies.

It 20918
I 50 = I tf = = = 10459 A
2 2
GUID-F02E8D18-FF87-45BE-8142-E8FA19F6966B V1 EN-US (Equation 16)

The first current I50 has frequency 50 Hz, magnitude 10459 A (that is, 1.162 A secondary)
and phase angle 0º.
The second current Itf has magnitude 10459 A (that is, 1.162 A secondary), phase angle
180º (at the starting time of the test) and frequency:

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Testing functionality by secondary injection

• 49.5 Hz for the test as generator in the quadrant 1 and 2 of the R-X plane
• 50.5 Hz for the test as generator in the quadrant 3 and 4 of the R-X plane

When the trajectory of the impedance, that is seen by the protection function,
traverses the lens characteristic then a pole slipping is detected. The present
procedure avoids tests of points of the line SE-RE that are too close to the R-
axis because in that case the voltage is close to zero and, therefore, the
impedance may approach a not defined quantity 0/0.

The accuracy of the impedance reach is ±2% of the base impedance; that is
considered while evaluating the test results.

For the test as motor the frequency current may have 50.5 Hz in the quadrant 1
and 2 of the R-X plane and 49.5 Hz in the quadrant 3 and 4.

Verifying the settings by secondary injection GUID-1752CE04-7C0F-4D37-9602-B22D8096DD2D v1

It is advised to connect the analog output channels of the function block OOSPPAM to the
internal disturbance recorder (and in particular to the function block A4RADR) in order to
perform a better analysis of the tests.

If the device is in test mode, the recording of the disturbances are enabled by the setting in
Main menu/Settings/IED Settings/Monitoring/Disturbance report/DisturbanceReport/
DRPRDRE:1: set the parameter OpModeTest to On.

1. Check the Application Configuration: verify that hardware voltage and current channels of
the IED are properly connected to SMAI function blocks, and that the proper analog
outputs of SMAI’s are connected to the analog inputs of the function block OOSPPAM.
2. Connect three-phase voltage channels of the test set to the appropriate IED terminals.
3. Connect in parallel two groups of three-phase currents of the test set to the appropriate
IED terminals.
4. Connect the appropriate trip output of the IED to the input channel of the test set that
monitors the trip.
5. Go to Main menu/Settings/IED Settings/Impedance protection/OutOfStep(78,Ucos)/
OOSPPAM(78,Ucos):1, and make sure that the function is enabled, that is, Operation is set
to On.

10.4.12.2 Test of point RE (RFwdR, XFwdX)

GUID-911D370F-8767-4D6C-9621-8663DD26006C v1

The trajectory of the impedance does not enter the lens characteristic. GUID-5C5E9BEB-AA60-474E-ACEC-B972ACFE6FA2 v1

Preliminary steady state test at 50 Hz GUID-8F95CCCC-3282-48E8-9F5E-3F3E77CCCAAE v1

• Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/

OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block
OOSPPAM.
• Apply the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,FwdZ × = 1.1 × 11931 × = 95.1V
VVT , p 13.8
EQUATION14057 V1 EN-US (Equation 17)

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 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 18)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 19)

∠I50s=0°
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 20)

∠Itfs=0°
frequency of Itfs = 50 Hz

• Check that the service values (VOLTAGE, CURRENT, R(%), X(%)) are according to the
injected quantities and that ROTORANG is close to 0 rad.
For this particular injection the service values are:
• VOLTAGE = 13.12 kV
• CURRENT = 20918 A
• R = 9.01%
• X = 65.27%
• ROTORANG = 0.04 rad

Note that these values identify a point outside the lens characteristic, even if it is close to the
point RE. Neither START nor TRIP is issued.

Execution of the dynamic test GUID-0B73C849-107D-40DC-80BB-31CD441BF69A v1

The test may be performed by using two states of a sequence tool that is a basic feature of
test sets.

• State 1: pre-test condition.

Steady voltage and current are applied in order to get a steady high impedance. This is a
point in the plane R-X that is far away from the lens characteristic. Define the following
three-phase symmetrical quantities (the phase angle is related to phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,FwdZ × = 1.1 × 11931 × = 95.1V
VVT , p 13.8
EQUATION14057 V1 EN-US (Equation 21)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 22)

frequency of Vts = 50 Hz
I50s=0 A
Itfs=0 A

• State 2: main test step.

Define the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

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Testing functionality by secondary injection

VVT ,s 0.1
Vts = 1.1 × Vt ,FwdZ × = 1.1 × 11931 × = 95.1V
VVT , p 13.8
EQUATION14057 V1 EN-US (Equation 23)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 24)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 25)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 26)

∠Itfs = 180º
frequency of Itfs = 49.5 Hz

Expected result: the protection function does not issue either start or trip.

The trajectory of the impedance traverses the lens characteristic in zone 2 GUID-9F0FE404-6D83-4308-9FE4-13259CE7D07A v1

Preliminary steady state test at 50 Hz GUID-700F4EA1-B7D9-4B77-829A-433BB67C8A01 v1

• Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/

OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block
OOSPPAM.
• Apply the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,FwdZ × = 0.9 × 11931 × = 77.81V
VVT , p 13.8
EQUATION14063 V1 EN-US (Equation 27)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 28)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 29)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 30)

∠Itfs = 0º

118
Commissioning manual
1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

frequency of Itf = 50 Hz

• Check that the service values (VOLTAGE, CURRENT, R(%), X(%) ) are according to the
injected quantities and that ROTORANG is close to 3.14 rad. For this particular injection
the service values are:
• VOLTAGE = 10.74 kV
• CURRENT = 20918 A
• R = 7.37%
• X = 53.40%
• ROTORANG = -3.09 rad

Note that these values identify a point inside the lens characteristic, in the zone 2, that is
close to the point RE. The START is issued, but no TRIP is performed.

Execution of the dynamic test GUID-028D7D67-B61A-4A7F-9978-4A0A41231B04 v1

The test may be performed by using two states of a sequence tool that is a basic feature of
test sets.

• State 1: pre-test condition.

Steady voltage and current are applied in order to get a steady high impedance, that is, a
point in the plane R-X which is far away from the lens characteristic. Define the following
three-phase symmetrical quantities (the phase angle is related to phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,FwdZ × = 0.9 × 11931 × = 77.81V
VVT , p 13.8
EQUATION14063 V1 EN-US (Equation 31)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 32)

frequency of Vts = 50 Hz
I50s = 0 A
Itfs = 0 A

• State 2: main test step.

Define the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,FwdZ × = 0.9 × 11931 × = 77.81V
VVT , p 13.8
EQUATION14063 V1 EN-US (Equation 33)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 34)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 35)

∠I50s = 0º
frequency of I50s = 50 Hz

119
Commissioning manual
Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 36)

∠Itfs = 180º
frequency of Itfs = 49.5 Hz

Expected result: start of the protection function and trip in zone 2, when trip conditions are
fulfilled.

10.4.12.3 Test of the boundary between zone 1 and zone 2, which is defined by the
parameter ReachZ1 GUID-BE180E07-7D4B-4842-81FB-244DE8897430 v1

The trajectory of the impedance traverses the lens characteristic in zone 2GUID-17F6AC8D-1F57-4245-A61D-776D469DD153 v1

Preliminary steady state test at 50 Hz GUID-3D42E43D-873E-4271-9AAF-3B2789FF3B17 v1

• Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/

OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block
OOSPPAM.
• Apply the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,RZ 1 × = 1.1 × 1435 × = 11.44V
VVT , p 13.8
EQUATION14065 V1 EN-US (Equation 37)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 38)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 39)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 40)

∠Itfs = 0º
frequency of Itfs = 50 Hz

• Check that the service values (VOLTAGE, CURRENT, R(%), X(%)) are according to the
injected quantities and that ROTORANG is close to 3.14 rad. For this particular injection
the service values are:
• VOLTAGE = 1.58 kV
• CURRENT = 20918 A
• R = 1.08%
• X = 7.85%
• ROTORANG = -3.04 rad

120
Commissioning manual
1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

Note that these values identify a point inside the lens characteristic, in the Zone 2, that is close
to the boundary between zone 1 and zone 2. The START is issued, but no TRIP is performed.

Execution of the dynamic test GUID-53964189-42E4-4C4B-BFCD-64888BA938EF v1

The test may be performed by using two states of a sequence tool that is a basic feature of
test sets.

• State 1: pre-test condition.

Steady voltage and current are applied in order to get a steady high impedance, that is a
point in the plane R-X that is far away from the lens characteristic. Define the following
three-phase symmetrical quantities (the phase angle is related to phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,RZ 1 × = 1.1 × 1435 × = 11.44V
VVT , p 13.8
EQUATION14065 V1 EN-US (Equation 41)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 42)

frequency of Vt= 50 Hz.

I50s = 0 A
Itfs = 0 A

• State 2: main test step.

Define the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,RZ 1 × = 1.1 × 1435 × = 11.44V
VVT , p 13.8
EQUATION14065 V1 EN-US (Equation 43)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 44)

frequency of Vt = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 45)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 46)

∠Itfs = 180º
frequency of Itfs = 49.5 Hz

Expected result: start of the protection function and trip in zone 2 when trip conditions
are fulfilled.

121
Commissioning manual
Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

The trajectory of the impedance traverses the lens characteristic in zone 1 GUID-12F82DD8-A4CE-48C9-944B-0CF3B3F6C9F9 v1

Preliminary steady state test at 50 Hz GUID-AA953F5F-2389-4F05-8BBD-D8DC9AF3B0E4 v1

• Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/

OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block
OOSPPAM.
• Apply the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,RZ 1 × = 0.9 × 1435 × = 9.36V
VVT , p 13.8
EQUATION14066 V1 EN-US (Equation 47)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 48)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 49)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 50)

∠Itfs = 0º
frequency of Itf = 50 Hz

• Check that the service values (VOLTAGE, CURRENT, R(%), X(%)) are according to the
injected quantities and that ROTORANG is close to 3.14 rad. For this particular injection
the service values are:
• VOLTAGE = 1.29 kV
• CURRENT = 20918 A
• R = 0.89%
• X=6.42%
• ROTORANG = -3.04 rad

Note that these values identify a point inside the lens characteristic in zone 1, that is close
to the boundary between zone 1 and zone 2. The START is issued, but no TRIP is
performed.

Execution of the dynamic test GUID-98707DB3-9A1A-4458-9704-25F8FCB94B79 v1

The test may be performed by using two states of a sequence tool that is a basic feature of
test sets.

• State 1: pre-test condition.

Steady voltage and current are applied in order to get a steady high impedance, that is a
point in the plane R-X which is far away from the lens characteristic. Define the following
three-phase symmetrical quantities (the phase angle is related to phase L1):

122
Commissioning manual
1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

VVT ,s 0.1
Vts = 0.9 × Vt ,RZ 1 × = 0.9 × 1435 × = 9.36V
VVT , p 13.8
EQUATION14066 V1 EN-US (Equation 51)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 52)

frequency of Vts = 50 Hz
I50s = 0 A
Itfs = 0 A

• State 2: main test step.

Define the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,RZ 1 × = 0.9 × 1435 × = 9.36V
VVT , p 13.8
EQUATION14066 V1 EN-US (Equation 53)

 ForwardX   59.33 
∠Vts = arctan   = arctan   = 82..14°
 ForwardR   8.19 
EQUATION14058 V1 EN-US (Equation 54)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 55)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 56)

∠Itfs = 180º
frequency of Itfs = 49.5 Hz

Expected result: start of the protection function and trip in zone 1 when trip conditions
are fulfilled.

10.4.12.4 Test of the point SE (RRvsR, XRvsX)

GUID-335F54E6-52DE-4BF1-A34B-0C2DB8059CC1 v1

The trajectory of the impedance traverses the lens characteristic in zone 1 GUID-2DD20D2E-6188-4631-A584-5E68B212E011 v1

Preliminary steady state test at 50 Hz GUID-7BCF3D7B-1B84-46D4-B9E3-066894A878E8 v1

• Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/

OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block
OOSPPAM.
• Apply the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

123
Commissioning manual
Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

VVT ,s 0.1
Vts = 0.9 × Vt ,RvsZ × = 0.9 × 5899 × = 38.47V
VVT , p 13.8
EQUATION14067 V1 EN-US (Equation 57)

ÐVts = arctan ç
æ ReverseX ö - 180° = arctan æ 29.60 ö - 180° = -90.56°
÷ ç ÷
è ReverseR ø è 0.29 ø
EQUATION14068 V1 EN-US (Equation 58)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 59)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 60)

∠Itfs = 0º
frequency of Itf = 50 Hz

• Check that the service values (VOLTAGE, CURRENT, R(%), X(%)) are according to the
injected quantities and that ROTORANG is close to 3.14 rad. For this particular injection
the service values are:
• VOLTAGE = 5.31 kV
• CURRENT = 20918 A
• R = -0.26%
• X = -26.65%
• ROTORANG = -3.06 rad

Note that these values identify a point inside the lens characteristic in zone 1 that is close
to the point SE. The START is issued, but no TRIP is performed.

Execution of the dynamic test GUID-FF6DCD5B-96AA-4255-8740-B85C8C7148F5 v1

The test may be performed by using two states of a sequence tool that is a basic feature of
test sets.

• State 1: pre-test condition.

Steady voltage and current are applied in order to get a steady high impedance, that is a
point in the plane R-X which is far away from the lens characteristic. Define the following
three-phase symmetrical quantities (the phase angle is related to phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,RvsZ × = 0.9 × 5899 × = 38.47V
VVT , p 13.8
EQUATION14067 V1 EN-US (Equation 61)

ÐVts = arctan ç
æ ReverseX ö - 180° = arctan æ 29.60 ö - 180° = -90.56°
÷ ç ÷
è ReverseR ø è 0.29 ø
EQUATION14068 V1 EN-US (Equation 62)

frequency of Vts = 50 Hz
I50s = 0 A
Itfs = 0 A

124
Commissioning manual
1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

• State 2: main test step.

Define the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 0.9 × Vt ,RvsZ × = 0.9 × 5899 × = 38.47V
VVT , p 13.8
EQUATION14067 V1 EN-US (Equation 63)

ÐVts = arctan ç
æ ReverseX ö - 180° = arctan æ 29.60 ö - 180° = -90.56°
÷ ç ÷
è ReverseR ø è 0.29 ø
EQUATION14068 V1 EN-US (Equation 64)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 65)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 66)

∠Itfs = 180º
frequency of Itfs = 50.5 Hz

Expected result: start of the protection function and trip in zone 1 when trip conditions
are fulfilled.

The trajectory of the impedance does not enter the lens characteristic GUID-189FECED-12A7-4A41-BCCF-D93C0FF9FA41 v1

Preliminary steady state test at 50 Hz GUID-448D5357-6CC2-438E-83CA-25FD381B7DFF v1

• Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/

OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block
OOSPPAM.
• Apply the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,RvsZ × = 1.1 × 5899 × = 47.02V
VVT , p 13.8
EQUATION14069 V1 EN-US (Equation 67)

ÐVts = arctan ç
æ ReverseX ö - 180° = arctan æ 29.60 ö - 180° = -90.56°
÷ ç ÷
è ReverseR ø è 0.29 ø
EQUATION14068 V1 EN-US (Equation 68)

frequency of Vts = 50 Hz

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 69)

∠I50s = 0º
frequency of I50s = 50 Hz

125
Commissioning manual
Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 70)

∠Itfs = 0º
frequency of Itf = 50 Hz

• Check that the service values (VOLTAGE, CURRENT, R(%), X(%)) are according to the
injected quantities and that ROTORANG is close to 0 rad. For this particular injection the
service values are:
• VOLTAGE= 6.49 kV
• CURRENT= 20918 A
• R= –0.32%
• X=–32.57%
• ROTORANG= 0.08 rad

Note that these values identify a point outside the lens characteristic, even if it is close to
the point SE. Neither START nor TRIP is issued.

Execution of the dynamic test GUID-31EF4F76-8FC8-4952-896C-B3A8A5FD635A v1

The test may be performed by using two states of a sequence tool that is a basic feature of
test sets.

• State 1: pre-test condition.

Steady voltage and current are applied in order to get a steady high impedance, that is, a
point in the plane R-X which is far away from the lens characteristic. Define the following
three-phase symmetrical quantities (the phase angle is related to phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,RvsZ × = 1.1 × 5899 × = 47.02V
VVT , p 13.8
EQUATION14069 V1 EN-US (Equation 71)

ÐVts = arctan ç
æ ReverseX ö - 180° = arctan æ 29.60 ö - 180° = -90.56°
÷ ç ÷
è ReverseR ø è 0.29 ø
EQUATION14068 V1 EN-US (Equation 72)

frequency of Vts = 50 Hz
I50s = 0 A
Itfs = 0 A

• State 2: main test step.

Define the following three-phase symmetrical quantities (the phase angle is related to
phase L1):

VVT ,s 0.1
Vts = 1.1 × Vt ,RvsZ × = 1.1 × 5899 × = 47.02V
VVT , p 13.8
EQUATION14069 V1 EN-US (Equation 73)

ÐVts = arctan ç
æ ReverseX ö - 180° = arctan æ 29.60 ö - 180° = -90.56°
÷ ç ÷
è ReverseR ø è 0.29 ø
EQUATION14068 V1 EN-US (Equation 74)

frequency of Vts = 50 Hz

126
Commissioning manual
1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

I CTs 1
I 50 s = I 50 × = 10459 × = 1.162 A
I CTp 9000
EQUATION14059 V1 EN-US (Equation 75)

∠I50s = 0º
frequency of I50s = 50 Hz

I CTs 1
It fs = Itf × = 10459 × = 1.162 A
I CTp 9000
EQUATION14062 V1 EN-US (Equation 76)

∠Itfs = 180º
frequency of Itfs = 50.5 Hz

Expected result: the protection function does not issue either start or trip.

GUID-7C9F1163-0186-41DA-9D5F-DDA589323B9F v1
After each test it is possible to download and study the related disturbance recording.

COMMON TRIP COMMAND (trip)

2
1
0
TRIPZ1 (tripZone1)
1
0
-1
TRIPZ2 (tripZone2)
2
1
0
START (start)
2
1
0
GENMODE (generatorMode)
2
1
0
MOTMODE (motorMode)
1
0
-1
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
time in seconds →

IEC10000142-1-en.vsd
IEC10000142 V1 EN-US

Figure 32: Boolean output signals for the injected current with two components: a 50 Hz
current component and a 49.5 Hz current component

10.4.13 Automatic switch onto fault logic ZCVPSOF M13850-2 v8

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The automatic switch onto fault logic function ZCVPSOF is checked using secondary injection
tests together with the Scheme communication logic for distance or overcurrent protection
function and with the dead line detection function (DLD), which is embedded in ZCVPSOF.

127
Commissioning manual
Section 10 1MRK 505 345-UEN B
Testing functionality by secondary injection

ZCVPSOF is activated either by the external input BC, or by the internal DLD. FUFSPVC is done
with a pre-fault condition where the phase voltages and currents are at zero. A reverse three-
phase fault with zero impedance and a three-phase fault with an impedance corresponding to
the whole line is applied. This fault shall cause an instantaneous trip and result in a TRIP
indication.

10.4.13.1 Activating ZCVPSOF externally M13850-14 v7

1. Activate the switch onto fault BC input.

During normal operating conditions, the BC input is de-energized.
2. Set AutoInitMode to DLD disabled and Mode to Impedance.
3. Apply a three-phase fault condition corresponding to a fault at approximately 45% of the
line or with impedance at 50% of the used zone setting and current greater than 30% of
IBase.
The ZACC input is activated.
4. Check that the TRIP output, external signals and indication are obtained.

10.4.13.2 Initiating ZCVPSOF automatically and setting mode to impedance M13850-27 v7

1. Deactivate the switch onto fault BC input.

2. Set the current and voltage inputs to lower than IPh< and UPh< for at least one second.
3. Set AutoInitMode to Voltage and Mode to Impedance.
4. Apply a three-phase fault condition corresponding to a fault at approximately 45% of the
line or with impedance at 50% of the used zone setting and current greater than 30% of
IBase.Apply a two-phase fault condition corresponding to a fault at approximately 45%
of the line or with impedance at 50% of the used zone setting and current greater than
30% of IBase.
The ZACC input is activated.
5. Check that the correct TRIP output, external signals and indication are obtained.

10.4.13.3 Initiating ZCVPSOF automatically and setting mode to UILevel GUID-E83E1B3D-026C-48DB-BB9B-43C6597DE5DB v4

1. Deactivate the switch onto fault BC input.

2. Set the current and voltage inputs to lower than IPh< and UPh< for at least one second.
3. Set AutoInitMode to Voltage and Mode to UILevel.
4. Apply the three-phase currents in such a way that the magnitudes are greater than IPh<
and the three-phase voltages in such a way that the magnitudes and lower than UPh< at
least for the duration of the tDuration setting.
5. Check that the correct TRIP output, external signals and indication are obtained.

10.4.13.4 Completing the test M13850-41 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.4.14 Phase preference logic PPLPHIZ GUID-BD8EE7A0-710D-49C8-9B56-CB908BAF2C59 v7

Prepare the IED for verification of settings outlined in section "Requirements" and section
"Preparing for test" in this chapter.

The Phase preference logic function PPLPHIZ is tested with a three-phase testing equipment
for distance protections. PPLPHIZ is tested in co-operation with the Distance protection zone,

128
Commissioning manual
1MRK 505 345-UEN B Section 10
Testing functionality by secondary injection

quadrilateral characteristic function ZMQPDIS. The distance protection and the phase
preference logic shall be set to values according to the real set values to be used. The test is
made by means of injection of voltage and current where the amplitude of both current and
voltage and the phase angle between the voltage and current can be controlled.

During the test the following binary signals (outputs) shall be monitored:

• Trip signal from distance protection

• Start signal from phase preference logic

1. Connect the test set for injection of voltage and current.

2. Inject voltages and currents corresponding to a phase-to-phase to earth fault within zone
1 of the distance protection function. In the test one of the current inputs (one of the
faulted phases) is disconnected. The remaining current is the fault current out on the
protected line. All combinations of two phase-to-earth faults with one phase current are
tested. The result shall be according to table 31. It should be checked that the fault will
give phase-to-phase voltage, phase-to-earth voltage, zero-sequence voltage and phase
current so that the conditions set for the logic are fulfilled.

Table 31: Operation at different combinations of faults and operation mode

OperMode Fault type/Faulted phase current to the IED
L1L2N/IL1 L1L2N/IL2 L2L3N/IL2 L2L3N/IL3 L3L3N/IL1 L3L1N/IL3
No Filter Trip Trip Trip Trip Trip Trip
No Pref Trip Trip Trip Trip Trip Trip
1231c Trip No Trip Trip No Trip No Trip Trip
1321c No Trip Trip No Trip Trip Trip No Trip
123a Trip No Trip Trip No Trip Trip No Trip
132a Trip No Trip No Trip Trip Trip No Trip
213a No Trip Trip Trip No Trip Trip No Trip
231a No Trip Trip Trip No Trip No Trip Trip
312a Trip No Trip No Trip Trip No Trip Trip
321a No Trip Trip No Trip Trip No Trip Trip

10.4.14.1 Completing the test GUID-8BD66BC8-AAC3-41C4-B819-B159361688D2 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5 Current protection SEMOD53531-1 v1

10.5.1 Instantaneous phase overcurrent protection 3-phase output

PHPIOC M11754-3 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

To verify the settings the following fault type should be tested:

• Phase-to-earth fault

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Testing functionality by secondary injection

Ensure that the maximum continuous current, supplied from the current source used for the
test of the IED, does not exceed four times the rated current value of the IED.

10.5.1.1 Measuring the operate limit of set values M11754-11 v6

1. Inject a phase current into the IED with an initial value below that of the setting.
2. Set the operation mode to 1 out of 3.
3. Increase the injected current in the Ln phase until the TRL (n=1–3) signal appears.
4. Switch the fault current off.

Observe: Do not exceed the maximum permitted overloading of the

current circuits in the IED.

5. Compare the measured operating current with the set value.

6. Set the operation mode to 2 out of 3 and inject current into one of the phases. Check - no
operation.

10.5.1.2 Completing the test M11754-24 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.2 Four step phase overcurrent protection 3-phase output

OC4PTOC SEMOD56287-67 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.2.1 Verifying the settings SEMOD56287-72 v9

Verification of the non-directional phase overcurrent function is done as

instructed below, without applying any polarizing voltage.

1. Connect the test set for current injection to the appropriate IED phases.
If there is any configuration logic that is used to enable or block any of the four available
overcurrent steps, make sure that the step under test is enabled (for example, end fault
protection).
If 1 out of 3 currents for operation is chosen: Connect the injection current to phases L1
and neutral.
If 2 out of 3 currents for operation is chosen: Connect the injection current into phase L1
and out from phase L2.
If 3 out of 3 currents for operation is chosen: Connect the symmetrical three-phase
injection current into phases L1, L2 and L3.
2. Connect the test set for the appropriate three-phase voltage injection to the IED phases
L1, L2 and L3. The protection shall be fed with a symmetrical three-phase voltage.
3. Block higher set stages when testing lower set stages by following the procedure
described below:

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Testing functionality by secondary injection

3.1. Set the injected polarizing voltage slightly larger than the set minimum polarizing
voltage (default is 5% of UBase) and set the injection current to lag the appropriate
voltage by an angle of about 80° if forward directional function is selected.
If 1 out of 3 currents for operation is chosen: The voltage angle of phase L1 is the
reference.
If 2 out of 3 currents for operation is chosen: The voltage angle of phase L1 – the
voltage angle of L2 is the reference.
If 3 out of 3 currents for operation is chosen: The voltage angle of phase L1 is the
reference.
If reverse directional function is selected, set the injection current to lag the
polarizing voltage by an angle equal to 260° (equal to 80° + 180°).
3.2. Increase the injected current, note the operate value of the tested step of the
function and compare it to the set value.
3.3. Decrease the current slowly, note the reset value and compare it to the reset ratio
95%.
4. If the test has been performed by injection of current in phase L1, repeat the test,
injecting current into phases L2 and L3 with polarizing voltage connected to phases L2,
respectively L3 (1 out of 3 currents for operation).
5. If the test has been performed by injection of current in phases L1 – L2, repeat the test,
injecting current into phases L2 – L3 and L3 – L1 with the appropriate phase angle of
injected currents.
6. Connect a trip output contact to a timer.
7. Set the injected current to 200% of the operate level of the tested stage, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current for txMin.
8. Check that all operate and start contacts operate according to the configuration (signal
matrixes).
9. Reverse the direction of the injected current and check that the protection does not
operate.
10. If 2 out of 3 or 3 out of 3 currents for operation is chosen: Check that the function will not
operate with current in one phase only.
11. Repeat the above described tests for the higher set stages.
12. Check that start and trip information is stored in the event menu.

10.5.2.2 Completing the test SEMOD56287-118 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.3 Instantaneous residual overcurrent protection EFPIOC SEMOD52967-3 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

To verify the settings the following fault type should be tested:

• Phase-to-earth fault

Ensure that the maximum continuous current, supplied from the current source used for the
test of the IED, does not exceed four times the rated current value of the IED.

10.5.3.1 Measuring the operate limit of set values SEMOD52967-11 v8

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Testing functionality by secondary injection

1. Inject a phase current into the IED with an initial value below that of the setting.
2. Increase the injected current in the Ln or in the neutral (summated current input) phase
until the TRIP signal appears.
3. Switch the fault current off.
Observe to not exceed the maximum permitted overloading of the current circuits in the
IED.
4. Compare the measured operating current with the set value.

10.5.3.2 Completing the test SEMOD52967-24 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.4 Four step residual overcurrent protection, (Zero sequence or

negative sequence directionality) EF4PTOC SEMOD53296-3 v8

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.4.1 Four step directional earth fault protection SEMOD53296-208 v6

1. Connect the test set for single current injection to the appropriate IED terminals.
Connect the injection current to terminals L1 and neutral.
2. Set the injected polarizing voltage slightly larger than the set minimum polarizing voltage
(default 5% of Ur) and set the injection current to lag the voltage by an angle equal to the
set reference characteristic angle (AngleRCA), if the forward directional function is
selected.
If reverse directional function is selected, set the injection current to lag the polarizing
voltage by an angle equal to RCA+ 180°.
3. Increase the injected current and note the value at which the studied step of the function
operates.
4. Decrease the current slowly and note the reset value.
5. If the test has been performed by injection of current in phase L1, repeat the test,
injecting current into terminals L2 and L3 with a polarizing voltage connected to
terminals L2, respectively L3.
6. Block lower set steps when testing higher set steps according to the instructions that
follow.
7. Connect a trip output contact to a timer.
8. Set the injected current to 200% of the operate level of the tested step, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current for txMin.
9. Check that all operate and start contacts operate according to the configuration (signal
matrixes)
10. Reverse the direction of the injected current and check that the step does not operate.
11. Check that the protection does not operate when the polarizing voltage is zero.
12. Repeat the above described tests for the higher set steps.
13. Finally, check that start and trip information is stored in the event menu.

10.5.4.2 Four step non-directional earth fault protection SEMOD53296-202 v4

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Testing functionality by secondary injection

1. Do as described in "Four step directional earth fault protection", but without applying
any polarizing voltage.

10.5.4.3 Completing the test SEMOD53296-122 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.5 Four step negative sequence overcurrent protection NS4PTOC GUID-EB1A8DFD-5BAC-4024-ADA2-D9BE7A2B50A0 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
GUID-F7AA2194-4D1C-4475-8853-C7D064912614 v4

When inverse time overcurrent characteristic is selected, the operate time of

the stage will be the sum of the inverse time delay and the set definite time
delay. Thus, if only the inverse time delay is required, it is important to set the
definite time delay for that stage to zero.

GUID-F973601F-BC67-4E4F-A4CA-BE6253E2FB92 v3
Procedure

1. Connect the test set for injection of three-phase currents and voltages to the
appropriate CT and VT inputs of the IED.
2. Inject pure negative sequence current, that is, phase currents with exactly same
magnitude, reversed sequence and exactly 120° phase displaced into the IED with an
initial value below negative sequence current pickup level. No output signals should be
activated. Check under NS4PTOC function Service Values that correct I2 magnitude is
measured by the function.
3. Set the injected negative sequence polarizing voltage slightly larger than the set
minimum polarizing voltage (default 5 % of Ub) and set the injection current to lag the
voltage by an angle equal to the set reference characteristic angle (180° - AngleRCA) if the
forward directional function is selected.
If reverse directional function is selected, set the injection current to lag the polarizing
voltage by an angle equal to RCA.
4. Increase the injected current and note the value at which the studied step of the function
operates.
5. Decrease the current slowly and note the reset value.
6. Block lower set steps when testing higher set steps according to the instructions that
follow.
7. Connect a trip output contact to a timer.
8. Set the injected current to 200% of the operate level of the tested step, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current in order to test parameter txmin.
9. Check that all operate and start contacts operate according to the configuration (signal
matrixes)
10. Reverse the direction of the injected current and check that the step does not operate.
11. Check that the protection does not operate when the polarizing voltage is zero.
12. Repeat the above-described tests for the higher set steps.
13. Finally, check that start and trip information is stored in the event menu.

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Testing functionality by secondary injection

10.5.5.1 Completing the test SEMOD53296-122 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.6 Sensitive directional residual overcurrent and power

protection SDEPSDE SEMOD175060-3 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

IED test set IED

NI NI

L1U U1
L2U U2
L3U U3

NU NU

TRIP

IEC09000021-2-en.vsd
IEC09000021 V2 EN-US

Figure 33: Principle connection of the test set

Values of the logical signals belonging to the sensitive directional residual overcurrent and
power protection are available on the local HMI under Main menu/Test/Function status/
Current protection/SensDirResOvCurr(67N,IN>)/SDEPSDE(67N,IN>):x

10.5.6.1 Measuring the operate and time limit for set values SEMOD175060-12 v2

Operation mode 3I0 · cosφ

SEMOD175060-34 v9
Procedure

1. Set the polarizing voltage to 1.2 · UNRel> and set the phase angle between voltage and
current to the set characteristic angle (RCADir). Note that the the current lagging the
voltage.
Take setting RCAComp into consideration if not equal to 0.
2. Inject current until the function picks up, and make sure that the operate current of the
set directional element is equal to the INcosPhi> setting.

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Testing functionality by secondary injection

The I Dir (3I0 · cosφ) function activates the START and STDIRIN output.
3. Assume that φ´ is the phase angle between injected voltage (3U0) and current (3I0) i.e. φ
´ = RCADir-φ. Change φ´ to for example 45 degrees. Increase the injected current until
the function operates.
4. Compare the result with the set value and make sure that the new injected 3I0 · cos φ is
equal to the setting INcosPhi>..
Take the set characteristic into consideration, see Figure 34 and Figure 35.
5. Measure the operate time of the timer by injecting a current two times the set INcosPhi>
value and the polarizing voltage 1.2 · UNRel>.

kSN × Sref
Tinv =
3I 0 test × 3U 0 test × cos (j )
IECEQUATION2402 V2 EN-US (Equation 77)

6. Compare the result with the expected value.

The expected value depends on whether definite or inverse time was selected.
7. Set the polarizing voltage to zero and increase until the boolean output signal UNREL is
activated, which is visible in the Application Configuration in PCM600 when the IED is in
online mode. Compare the voltage with the set value UNRel> .
8. Continue to test another function or complete the test by setting the test mode to Off.

RCADir = 0o

3I0
Operate area

j
-3U0 = Uref
3I0 × cos j

ROADir

IEC06000650_2_en.vsd
IEC06000650 V2 EN-US

Figure 34: Characteristic with ROADir restriction

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Testing functionality by secondary injection

RCADir = 0º

Operate area

-3U0 =Uref

Instrument
transformer
angle error 
RCAcomp
Characteristic after
angle compensation

3I0 (prim) 3I0 (to prot)

IEC06000651-3-en.vsd

IEC06000651 V3 EN-US

Figure 35: Explanation of RCAcomp

Operation mode 3I0 · 3U0 · cos φ

SEMOD175060-76 v8

1. Set the polarizing voltage to 1.2 · UNRel> and set the phase angle between voltage and
current to the set characteristic angle (RCADir). Note that the current lagging the voltage.
2. Inject current until the function picks up, and make sure that the operate power is equal
to the SN> setting for the set directional element.
Note that for operation, both the injected current and voltage must be greater than the
set values INRel> and UNRel> respectively.
The function activates the START and STDIRIN outputs.
3. Assume that φ´ is the phase angle between injected voltage (3U0) and current (3I0) i.e. φ
´ = RCADir-φ. Change φ´ to for example 45 degrees. Increase the injected current until
the function operates.
4. Compare the result with the set value and make sure that the new injected 3I0 · 3U0 · cos
φ is equal to the setting SN>. Take the set characteristic into consideration, see figure 34
and figure 35.
5. Measure the operate time of the timer by injecting 1.2 · UNRel> and a current to get two
times the set SN> operate value.

Tinv = kSN × Sref / 3 I 0 test × 3U 0 test × cos (j )

IECEQUATION2403 V1 EN-US (Equation 78)

6. Compare the result with the expected value.

The expected value depends on whether definite or inverse time was selected.
7. Continue to test another function or complete the test by setting the test mode to Off.

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Testing functionality by secondary injection

Operation mode 3I0 and φ

SEMOD175060-87 v8

1. Set the polarizing voltage to 1.2 · UNRel> and set the phase angle between voltage and
current to the set characteristic angle (RCADir). Note that the current lagging the voltage.
2. Inject current until the function picks up, and make sure that the operate current is equal
to the INDir> setting for the set directional element.

Note that for operation, both the injected current and voltage must be
greater than the set values INRel> and UNRel> respectively.

The function activates the START and STDIRIN output.

3. Measure with angles j around RCADir +/- ROADir.
4. Compare the result with the set values, refer to figure 36 for example characteristic.
5. Measure the operate time of the timer by injecting a current to get two times the set
SN_> operate value.

Tinv = kSN × Sref / 3 I 0 test × 3U 0 test × cos (j )

IECEQUATION2403 V1 EN-US (Equation 79)

6. Compare the result with the expected value.

The expected value depends on whether definite or inverse time was selected.
7. Continue to test another function or complete the test by setting the test mode to Off.
RCADir = 0º

ROADir = 80º

Operate area

3I0

-3U0

IEC06000652-3-en.vsd
IEC06000652 V3 EN-US

Figure 36: Example characteristic

Non-directional earth fault current protection SEMOD175060-117 v10

Procedure

1. Measure that the operate current is equal to the INNonDir> setting.

The function activates the START and STDIRIN output.
2. Measure the operate time of the timer by injecting a current of 200% of the operate
value.
3. Compare the result with the expected value.

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Testing functionality by secondary injection

The expected value depends on whether definite time tINNonDir or inverse time was
selected.
4. Continue to test another function or complete the test by setting the test mode to Off.

Residual overvoltage release and protection SEMOD175060-131 v6

Procedure

1. Measure that the operate voltage is equal to the UN> setting.

The function activates the START and STUN signals.
2. Measure the operate time by injecting a voltage 1.2 times set UN> operate value.
3. Compare the result with the set tUN operate value.
4. Inject a voltage 0.8 · UNRel> and a current high enough to operate the directional
function at the chosen angle.
5. Increase the voltage until the directional function is released.
6. Compare the measured value with the set UNRel> operate value.

10.5.6.2 Completing the test SEMOD175060-148 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.7 Thermal overload protection, one time constant, Celsius/

Fahrenheit LCPTTR/LFPTTR M14950-2 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Check that the input logical signal BLOCK is logical zero and that on the local HMI, the logical
signal TRIP, START and ALARM are equal to logical zero.

10.5.7.1 Measuring the operate and time limit of set values M14950-8 v3

Testing the protection without external temperature compensation (NonComp) M14950-10 v10

1. Quickly set the measured current (fault current) in one phase to about 300% of IRef (to
minimise the trip time), and switch the current off.
2. Reset the thermal memory on the local HMI under Main menu/Reset/Reset
temperature/ThermalOverload1TimeConst(PTTR,26)/LFPTTR:x, Main menu/Reset/
Reset temperature/ThermalOverload1TimeConst(PTTR,26)/LCPTTR:x,
3. Switch the fault current on and take note of the temperature, available on the local HMI
under Main menu/Test/Function status/Current protection/
ThermOverLoad1TimeConst(PTTR,26)/LFPTTR:x/TEMP, Main menu/Test/Function
status/Current protection/ThermOverLoad1TimeConst(PTTR,26)/LCPTTR:x/TEMP,
4. Check the time until the actual temperature TEMP has reached the AlarmTemp level
during injection.
Monitor the signal ALARM until it appears on the corresponding binary output or on the
local HMI.
5. Measure the LCPTTR/LFPTTRprotection trip time.
Use the TRIP signal from the configured binary output to stop the timer.
6. Take the TEMP readings.
Compare with the setting of TripTemp.
7. Activate the BLOCK binary input.
The signals ALARM, START and TRIP should disappear.
8. Reset the BLOCK binary input.

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Testing functionality by secondary injection

9. Check the reset limit (TdReset).

Monitor the signal START until it disappears on the corresponding binary output or on
the local HMI, take the TEMP readings and compare with the setting of ReclTemp.
10. Compare the measured trip time with the setting according to the formula.
11. Reset the thermal memory.
12. Continue to test another function or end the test by changing the test mode setting to
Off.

10.5.7.2 Completing the test M14950-48 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.8 Breaker failure protection, phase segregated activation and

output CCRBRF M12104-2 v11

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The Breaker failure protection, 3-phase activation and output function CCRBRF should
normally be tested in conjunction with some other function that provides a start signal. An
external START signal can also be used.

To verify the settings in the most common back-up trip mode 1 out of 3, it is sufficient to test
phase-to-earth faults.

At mode 2 out of 4 the phase current setting, IP> can be checked by single-phase injection
where the return current is connected to the summated current input. The value of residual
(earth fault) current IN set lower than IP> is easiest checked in back-up trip mode 1 out of 4.

10.5.8.1 Checking the phase current operate value, IP> M12104-23 v12

The check of the IP> current level is best made in FunctionMode = Current and BuTripMode = 1
out of 3 or 2 out of 4.

1. Apply the fault condition, including START of CCRBRF, with a current below the set IP>.
2. Repeat the fault condition and increase the current in steps until a trip occurs.
3. Compare the result with the set IP>.

Note! If No CBPos Check or Retrip off is set, only back-up trip can be used to
check set IP>.

10.5.8.2 Checking the residual (earth fault) current operate value IN> set below
IP> M12104-80 v9

Check the low set IN> current where setting FunctionMode = Current and setting BuTripMode
= 1 out of 4

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Testing functionality by secondary injection

1. Apply the fault condition, including START of CCRBRF, with a current just below set IN>.
2. Repeat the fault condition and increase the current in steps until trip appears.
3. Compare the result with the set IN>.
4. Disconnect AC and START input signals.

10.5.8.3 Checking the re-trip and back-up times M12104-93 v10

The check of the set times can be made in connection with the check of operate values above.

Choose the applicable function and trip mode, such as FunctionMode = Current and
RetripMode = CB Pos Check .

1. Apply the fault condition, including start of CCRBRF, well above the set current value.
Measure the time from START of CCRBRF.
2. Check the re-trip t1 and back-up trip times t2 and t3.
In applicable cases, the back-up trip for multi-phase start t2MPh and back-up trip 2, t2
and t3 can also be checked. To check t2MPh, a two-phase or three-phase start shall be
applied.

10.5.8.4 Verifying the re-trip mode M12104-36 v6

Choose the mode below, which corresponds to the actual case.

In the cases below it is assumed that FunctionMode = Current is selected.

Checking the case without re-trip, RetripMode = Retrip Off M12104-107 v6

1. Set RetripMode = Retrip Off.

2. Apply the fault condition, including start of CCRBRF, well above the set current value.
3. Verify that no re-trip, but back-up trip is achieved after set time.

Checking the re-trip with current check, RetripMode = CB Pos Check M12104-48 v6

1. Set RetripMode = CB Pos Check.

2. Apply the fault condition, including start of CCRBRF, well above the set current value.
3. Verify that re-trip is achieved after set time t1 and back-up trip after time t2
4. Apply the fault condition, including the start of CCRBRF, with the current below the set
current value.
5. Verify that no re-trip, and no back-up trip is obtained.

Checking re-trip without current check M12104-58 v8

1. Set RetripMode = No CBPos Check.

2. Apply the fault condition, including start of CCRBRF, well above the set current value.
3. Verify that re-trip is achieved after the set time t1, and the back-up trip after time t2.
4. Apply the fault condition, including start of CCRBRF, with current below set current value.
5. Verify that re-trip is achieved after set time t1, but no back-up trip is obtained.

10.5.8.5 Verifying the back-up trip mode M12104-146 v5

In the cases below it is assumed that FunctionMode = Current is selected.

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Checking that back-up tripping is not achieved at normal CB tripping M12104-150 v7

Use the actual tripping modes. The case below applies to re-trip with current check.

1. Apply the fault condition, including start of CCRBRF, with phase current well above set
value IP>.
2. Interrupt the current, with a margin before back-up trip time, t2. It may be made at issue
of re-trip command.
3. Check that re-trip is achieved, if selected, but no back-up trip is obtained.

The normal mode BuTripMode = 1 out of 3 should have been verified in the tests above. In
applicable cases the modes 1 out of 4 and 2 out of 4 can be checked. Choose the mode below,
which corresponds to the actual case.

Checking the case BuTripMode = 1 out of 4 M12104-165 v6

It is assumed that the earth-fault current setting IN> is below phase current setting IP>.

1. Set BuTripMode = 1 out of 4.

2. Apply the fault condition, including start of CCRBRF, with one-phase current below set
IP> but above IN>. The residual earth-fault should then be above set IN>.
3. Verify that back-up trip is achieved after set time. If selected, re-trip should also appear.
4. Disconnect AC and START input signals.

Checking the case BuTripMode = 2 out of 4 M12104-179 v7

The earth-fault current setting IN> may be equal to or below phase-current setting IP>.

1. Set BuTripMode = 2 out of 4.

2. Apply the fault condition, including start of CCRBRF, with one-phase current above set
IP> and residual (earth fault) above set IN>.
3. Verify that back-up trip is achieved after set time. If selected, re-trip should also appear.
4. Apply the fault condition, including start of CCRBRF, with at least one-phase current
below set IP> and residual (earth fault) above set IN>. The current may be arranged by
feeding three- (or two-) phase currents with equal phase angle (I0-component) below IP>,
but of such value that the residual (earth fault) current (3I0) will be above set value IN>.
5. Verify that back-up trip is not achieved.
6. Disconnect AC and START input signals.

10.5.8.6 Verifying instantaneous back-up trip at CB faulty condition M12104-197 v6

Applies in a case where a signal from CB supervision function regarding CB being faulty and
unable to trip is connected to input CBFLT.

1. Repeat the check of back-up trip time. Disconnect current and START input signals.
2. Activate the input CBFLT. The output CBALARM (CB faulty alarm) should appear after set
time tCBAlarm. Keep the input activated.
3. Apply the fault condition, including start of CCRBRF, with current above set current value.
4. Verify that back-up trip is obtained without intentional delay, for example within 20ms
from application of start.

10.5.8.7 Verifying the case RetripMode = Contact M12104-213 v9

It is assumed that re-trip without current check is selected, RetripMode = Contact.

1. Set FunctionMode = Contact

2. Apply input signal for CB closed to relevant input or inputs CBCLDL1, CBCLD2 or CBCDL3.
3. Apply the input signal, or signals for the start of CCRBRF.

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4. Verify that phase selection re-trip and back-up trip are achieved after set times.
5. Disconnect the start signal(s). Keep the CB closed signal(s).
6. Apply input signal(s), for start of CCRBRF.
7.
8. Arrange disconnection of CB closed signal(s) well before set back-up trip time t2.
9. Verify that back-up trip is not achieved.

10.5.8.8 Verifying the function mode Current&Contact M12104-237 v5

To be made only when FunctionMode = Current&Contact is selected. It is suggested to make

the tests in one phase only, or at three-phase trip applications for just three-phase tripping.

Checking the case with fault current above set value IP> M12104-241 v6
The operation shall be as in FunctionMode = Current.

1. Set FunctionMode = Current&Contact.

2. Leave the inputs for CB close inactivated. These signals should not influence.
3. Apply the fault condition, including the start of CCRBRF, with the current above the set
IP> value.
4. Check that the re-trip, if selected, and back-up trip commands are achieved.

Checking the case with fault current below set value I>BlkCont M12104-281 v9
The case shall simulate a case where the fault current is very low and operation will depend on
CB position signal from CB auxiliary contact. It is suggested that re-trip without current check
is used, setting RetripMode = No CBPos Check.

1. Set FunctionMode = Current&Contact.

2. Apply input signal for CB closed to the relevant input or inputs CBCLDL1 (2 or 3).
3. Apply the fault condition with input signal(s) for start of CCRBRF. The value of current
should be below the set value I>BlkCont.
4. Verify that phase selection re-trip (if selected) and back-up trip are achieved after set
times. Failure to trip is simulated by keeping the signal(s) CB closed activated.
5. Disconnect the input signal and the START signal(s). Keep the CB closed signal(s).
6. Apply the fault and the start again. The value of current should be below the set value
I>BlkCont.
7. Arrange disconnection of BC closed signal(s) well before set back-up trip time t2. It
simulates a correct CB tripping.
8. Verify that back-up trip is not achieved. Re-trip can appear for example, due to selection
“Re-trip without current check”.

10.5.8.9 Completing the test M12104-72 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.9 Stub protection STBPTOC M14922-2 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Logical signals for STBPTOC protection are available on the local HMI underMain menu/
Settings/Setting group N/Current protection/Stub(PTOC,50STB)/STBPTOC:x

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10.5.9.1 Measuring the operate limit of set values M14922-6 v8

1. Check that the input logical signals BLOCK and RELEASE and the output logical signal
TRIP are all logical zero.
2. Activate the input RELEASE on the STBPTOC function block
3. For a short while inject a current (fault current) in one phase to about 110% of the set
operating current, and switch the current off.
Observe to not exceed the maximum permitted overloading of the current circuits in the
IED.
4. Switch the fault current on and measure the operating time of STBPTOC.
Use the TRIP signal from the configured binary output to stop the timer. The operation
should be instantaneously.
5. Activate the input BLOCK on the STBPTOC function block.
6. Switch on the fault current (110% of the setting).
No TRIP signal should appear.
7. Switch off the fault current.
8. For a short while inject a current (fault current) in same phase to about 90% of the set
operating current, and switch the current off.
9. Switch the fault current on.
No TRIP signal should appear.
10. Switch off the fault current.
11. Reset the RELEASE binary input.
12. Switch the fault current on.
No TRIP signal should appear.
13. Switch the fault current off.

10.5.9.2 Completing the test M14922-50 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.10 Pole discordance protection CCPDSC SEMOD55625-59 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.10.1 Verifying the settings SEMOD55625-63 v8

1. External detection logic, Contact function selection = ContSel setting equals CCPDSC
signal from CB. Activate the EXTPDIND binary input, and measure the operating time of
CCPDSC.
Use the TRIP signal from the configured binary output to stop the timer.
2. Compare the measured time with the set value tTrip.
3. Reset the EXTPDIND input.
4. Activate the BLKDBYAR binary input.
This test should be performed together with Autorecloser SMBRREC.
5. Activate the EXTPDIND binary input.
No TRIP signal should appear.
6. Reset both BLKDBYAR and EXTPDIND binary inputs.
7. Activate the BLOCK binary input.
8. Activate EXTPDIND binary input.
NO TRIP signal should appear.
9. Reset both BLOCK and EXTPDIND binary inputs.

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10. If Internal detection logic Contact function selection = ContSel setting equals Pole
position from auxiliary contacts. Then set inputs POLE1OPN...POLE3CL in a status that
activates the pole discordance logic and repeats step 2 to step 6.
11. Unsymmetrical current detection with CB monitoring: Set measured current in one phase
to 110% of current release level. Activate CLOSECMD and measure the operating time of
the CCPDSC protection.
Use the TRIP signal from the configured binary output to stop the timer.
12. Deactivate the CLOSECMD: Set measured current in one phase to 90% of Current Release
level. Activate CLOSECMD.
NO TRIP signal should appear.
13. Repeat the previous two steps using OPENCMD instead of CLOSECMD. Asymmetry
current detection with CB monitoring: Set all three currents to 110% of Current Release
level. Activate CLOSECMD.
NO TRIP signal should appear due to symmetrical condition.
14. Deactivate the CLOSECMD. Decrease one current with 120% of the current unsymmetrical
level compared to the other two phases. Activate CLOSECMD and measure the operating
time of the CCPDSC protection.
Use the TRIP signal from the configured binary output to stop the timer.
15. Deactivate the CLOSECMD. Decrease one current with 80% of the current unsymmetrical
level compared to the other two phases. Activate CLOSECMD.
NO TRIP signal should appear.

10.5.10.2 Completing the test SEMOD55625-106 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.11 Directional underpower protection GUPPDUP SEMOD175027-3 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.11.1 Verifying the settings SEMOD175027-7 v7

The underpower protection shall be set to values according to the real set values to be used.

The test is made by means of injection of voltage and current where the amplitude of both
current and voltage and the phase angle between the voltage and current can be controlled.
During the test, the analog outputs of active and reactive power shall be monitored.

1. Connect the test set for injection of voltage and current corresponding to the mode to
be used in the application. If a three-phase test set is available this could be used for all
the modes. If a single-phase current/voltage test set is available the test set should be
connected to a selected input for one-phase current and voltage.

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Table 32: Calculation modes

Set value: Mode Formula used for complex power calculation
L1, L2, L3
S = U L1 × I L1* + U L 2 × I L 2* + U L 3 × I L 3*
EQUATION1697 V1 EN-US (Equation 80)

Arone
S = U L1L 2 × I L1* - U L 2 L 3 × I L 3*
EQUATION1698 V1 EN-US (Equation 81)

PosSeq
S = 3 × U PosSeq × I PosSeq*
EQUATION1699 V1 EN-US (Equation 82)

L1L2
S = U L1L 2 × ( I L1* - I L 2* )
EQUATION1700 V1 EN-US (Equation 83)

L2L3
S = U L 2 L 3 × ( I L 2* - I L 3* )
EQUATION1701 V1 EN-US (Equation 84)

L3L1
S = U L 3 L1 × ( I L 3* - I L1* )
EQUATION1702 V1 EN-US (Equation 85)

L1
S = 3 × U L1 × I L1*
EQUATION1703 V1 EN-US (Equation 86)

L2
S = 3 × U L 2 × I L 2*
EQUATION1704 V1 EN-US (Equation 87)

L3
S = 3 × U L 3 × I L 3*
EQUATION1705 V1 EN-US (Equation 88)

2. Adjust the injected current and voltage to the set values in % of IBase and UBase
(converted to secondary current and voltage). The angle between the injected current
and voltage shall be set equal to the set direction Angle1, angle for stage 1 (equal to 0° for
low forward power protection and equal to 180° for reverse power protection). Check
that the monitored active power is equal to 100% of rated power and that the reactive
power is equal to 0% of rated power.
3. Change the angle between the injected current and voltage to Angle1 + 90°. Check that
the monitored active power is equal to 0% of rated power and that the reactive power is
equal to 100% of rated power.
4. Change the angle between the injected current and voltage back to 0°. Decrease the
current slowly until the START1 signal, start of stage 1, is activated.
5. Increase the current to 100% of IBase.
6. Switch the current off and measure the time for activation of TRIP1, trip of stage 1.
7. If a second stage is used, repeat steps 2 to 6 for the second stage.

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10.5.11.2 Completing the test SEMOD175027-15 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.12 Directional overpower protection GOPPDOP SEMOD175058-3 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.12.1 Verifying the settings SEMOD175058-7 v6

The overpower protection shall be set to values according to the real set values to be used. The
test is made by means of injection of voltage and current where the amplitude of both current
and voltage and the phase angle between the voltage and current can be controlled. During the
test the analog outputs of active and reactive power shall be monitored.

1. Connect the test set for injection of voltage and current corresponding to the mode to
be used in the application. If a three phase test set is available this could be used for all
the modes. If a single phase current/voltage test set is available the test set should be
connected to a selected input for one phase current and voltage.
2. Adjust the injected current and voltage to the set rated values in % of IBase and UBase
(converted to secondary current and voltage). The angle between the injected current
and voltage shall be set equal to the set direction Angle1, angle for stage 1 (equal to 0° for
low forward power protection and equal to 180° for reverse power protection). Check
that the monitored active power is equal to 100% of rated power and that the reactive
power is equal to 0% of rated power.
3. Change the angle between the injected current and voltage to Angle1 + 90°. Check that
the monitored active power is equal to 0% of rated power and that the reactive power is
equal to 100% of rated power.
4. Change the angle between the injected current and voltage back to Angle1 value. Increase
the current slowly from 0 until the START1 signal, start of stage 1, is activated. Check the
injected power and compare it to the set value Power1, power setting for stage 1 in % of
Sbase.
5. Increase the current to 100% of IBase and switch the current off.
6. Switch the current on and measure the time for activation of TRIP1, trip of stage 1.
7. If a second stage is used, repeat steps 2 to 6 for the second stage.

10.5.12.2 Completing the test SEMOD175058-66 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.13 Broken conductor check BRCPTOC SEMOD175021-3 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.13.1 Measuring the operate and time limit of set values SEMOD175021-7 v6

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1. Check that the input logical signal BLOCK to the BRCPTOC function block is logical zero
and note on the local HMI that the output signal TRIP from the BRCPTOC function block is
equal to the logical 0.
2. Set the measured current (fault current) in one phase to about 110% of the set operating
current IP>.
Observe to not exceed the maximum permitted overloading of the current circuits in the
terminal.
3. Switch on the fault current and measure the operating time of BRCPTOC.
TRIP is controlled by Gate 13 in the configuration.
Use the TRIP signal from the configured binary output to stop the timer.
4. Compare the measured time with the set value tOper.
5. Activate the BLOCK binary input.
6. Switch on the fault current (110% of the setting) and wait longer than the set value tOper.
No TRIP signal should appear.
7. Switch off the fault current.
8. Set the measured current (fault current) in same phase to about 90% of the set operating
current IP>. Switch off the current.
9. Switch on the fault current and wait longer than the set value tOper.
No TRIP signal should appear.
10. Switch off the fault current.

10.5.13.2 Completing the test SEMOD175021-42 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.5.14 Voltage-restrained time overcurrent protection VRPVOC GUID-764DA61A-D987-4358-867A-DA43ADDC6E57 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.5.14.1 Verifying the settings GUID-3A2B7FF5-330E-4A0D-AB74-EBAE6258C176 v1

Verifying settings by secondary injection GUID-39632D30-A8D8-417D-985C-8F886106783E v4

1. Connect the test set for three-phase current injection and three-phase voltage injection
to the appropriate IED terminals.
2. Go to Main menu/Settings/IED Settings/Current protection/VoltageRestOverCurr
( 51V,2(I>/U<))/VRPVOC (51V,2(I>/U<)):1/General and make sure that the function is
enabled, that is, Operation is set to On.
3. The test of the function may be performed by injecting restrain voltage and increasing
the injected current(s). Note the value at which the START and STOC signals are set.

In the following equations, restrain voltage is the magnitude of the

minimum phase-to-phase voltage in secondary volts.

The set operate value in secondary amperes is calculated according to the following
equations:
First part of the characteristic (Restrain voltage ≤ 25% of UBase):

StartCurr CT sec VDepFact

× IBase × ×
100 CTprim 100
IECEQUATION2432 V1 EN-US (Equation 89)

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Second part of the characteristic (25% of UBase ≤ Restrain voltage ≤ UHighLimit/

100*UBase), valid when setting parameter VDepMode = Slope:
  StartCurr CT sec   VDepFact  
 × IBase ×  × 1 −  
  100 CTprim   100  
×  RestrainVoltage −
25
× UBase ×
VT sec    StartCurr
+ × IBase ×
CT sec VDepFact 
×
 
 (UHighLimit − 25) × UBase × VT sec  100 VTprim    100 CTprim 100 
 
 100 VTprim 
IECEQUATION2433 V1 EN-US (Equation 90)

Third part of the characteristic (UHighLimit/100*UBase ≤ Restrain voltage):

StartCurr CT sec
× IBase ×
100 CTprim
IECEQUATION2434 V1 EN-US (Equation 91)

Example (rated secondary current = 1A):

CT ratio 10 000/1A
VT ratio 10 kV/100 V
StartCurr 100%
VDepFact 25%
UHighLimit 100%
IBase 10 000 A
10 kV

A test for each section of the characteristic of the function VRPVOC may be performed;
that may be achieved by applying the following voltages:
First section of the characteristic:
If VDepMode = Slope, the minimum measured phase-to-phase voltage is lower than
0,25*UBase; if VDepMode = Step, the minimum measured phase-to-phase voltage is
lower than UHighLimit/100*UBase:
• UL1: Ampl = 10 / √3; Angle = 0°
• UL2: Ampl = 10 / √3; Angle = 240°
• UL3: Ampl = 100 / √3; Angle = 120°

Second section of the characteristic only:

If VDepMode = Slope, the minimum measured phase-to-phase voltage is between
0,25*UBase and UHighLimit/100*UBase:
• UL1: Ampl = 50 / √3; Angle = 0°
• UL2: Ampl = 50 / √3; Angle = 240°
• UL3: Ampl = 100 / √3; Angle = 120°

Last section of the characteristic:

If VDepMode = either Slope or Step, the minimum measured phase-to-phase voltage is
higher than UHighLimit/100*UBase:
• UL1: Ampl = 105/ √3; Angle = 0°
• UL2: Ampl = 105/ √3; Angle = 240°
• UL3: Ampl = 105 / √3; Angle = 120°
4. Inject the voltages that are related to the first part of the characteristic, and then slowly
increase the phase current IL1 from 0.0 A up to the value the function operates. The
START and STOC signals must be activated when the amplitude of the phase current IL1
is slightly above 0.25 A on the secondary side. The corresponding trip signals TROC and
TRIP will be activated after the pre-set time delay has expired.
5. Decrease the current IL1 slowly and note the reset value.

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6. Repeat steps 4 and 5 applying voltages that are related to the second and the last
section of the characteristic; the function operates when IL1 is slightly higher than: 0.5 A
in the second section; 1A in the last section.
7. Connect the trip output contact to the input channel of the test set in order to stop the
injection and measure the trip time.
8. If definite time delay is used for the overcurrent step, set the setting Characterist = IEC
Def. Time. Apply the voltages related to the last part of the characteristic and inject a
current IL1 200% higher than the set operation level, and check the definite time delay for
trip (the signals TROC and TRIP of the protection function VRPVOC are active in trip
condition).
9. If inverse time delay is used for the overcurrent step, the parameter setting Characterist
shall be properly set; we can refer, for example, to the setting IEC Very inv.; If the IEC Very
inverse time characteristic is selected, the trip signals TROC and TRIP will operate after a
time defined by the equation:

13.5 * k
t [s] =
 I 
  −1
 StartCurr 
IECEQUATION2435 V1 EN-US (Equation 92)

where:
t Operate time in seconds
I Measured value (for example, phase current)
StartCurr Set operate value

This means that if the measured phase current jumps from 0 to 2 times the set operate
level and time multiplier k is set to 1.0 s (default value), then the TROC and TRIP signals
will operate after a time delay equal to 13.5 s ± tolerance.
Taking into account the above explanation, inject the voltages related to the last part of
the characteristic and inject a current IL1 200% higher than the set operation level, and
check the trip time delay.

If tDef_OC is set to a value different from 0 s, then this time delay is

added to the one that is defined by the IDMT characteristic.

10. Check the start and operate information that are stored in the event menu.
11. The previous step 8 or 9 may be repeated also for the first and second section of the
characteristic.
12. Supply the IED with symmetric three-phase voltages at their rated values. Go to Main
menu/Settings/IED Settings/Current protection/VoltageRestOverCurr(51V,2(I>/U<))/
VRPVOC(51V,2(I>/U<)):1/Undervoltage and set the setting Operation_UV = On to
activate the undervoltage stage.
13. Slowly decrease the voltage in two phases simultaneously, until the STUV and START
signals appear.
14. Note the operate value. The set operate value in secondary volts is calculated according
to the following equation:

StartVolt UBase VT sec

× ×
100 3 VTprim
IECEQUATION2436 V1 EN-US (Equation 93)

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If the VRPVOC function is used as an overcurrent protection with

undervoltage seal-in, it is necessary to first inject sufficient current to
activate the STOC signal before the under-voltage step is allowed to
operate. In order to achieve that, apply symmetric three-phase voltages at
their rated value and then inject a current IL1 that is 200% higher than the
set operation level. Then slowly decrease the voltage in two phases
simultaneously, until the STUV and START signals appear.

15. Increase slowly the applied voltages of the previous two phases and note the reset value.
16. Check that the trip output of the relay is connected to the input channel of the test in
order to stop the injection and measure the trip time.
17. Inject symmetric three-phase voltages at their rated value and check that the STUV and
START signals reset as well as the trip signals of the function block (TRIP and TRUV).
18. Instantaneously decrease the voltage in two phases simultaneously to a value 20% lower
than the set operate value (take into account the previous note if VRPVOC is configured
in ACT with the undervoltage seal-in feature).
19. Measure the definite time delay for the TRUV and TRIP signals and compare it with the
set value tDef_UV.
20. Check that start and operate information is stored in the event menu.

10.5.14.2 Completing the test GUID-8A33AACE-7B89-4981-A872-78044BB1FD0D v2

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6 Voltage protection SEMOD53540-1 v1

10.6.1 Two step undervoltage protection UV2PTUV M13796-2 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.6.1.1 Verifying the settings M13796-9 v3

Verification of START value and time delay to operate for Step 1 M13796-29 v9

1. Check that the IED settings are appropriate, especially the START value, the definite time
delay and the 1 out of 3 operation mode.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the voltage in one of the phases, until the START signal appears.
4. Note the operate value and compare it with the set value.

The operate value in secondary volts is calculated according to the

following equations:

For phase-to-earth measurement:

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U1 < UBase VT sec

× ×
100 3 VTprim
IECEQUATION2430 V1 EN-US (Equation 94)

For phase-to-phase measurement:

U1 < VT sec
× UBase ×
100 VTprim
IECEQUATION2431 V1 EN-US (Equation 95)
5. Increase the measured voltage to rated load conditions.
6. Check that the START signal resets.
7. Instantaneously decrease the voltage in one phase to a value about 20% lower than the
measured operate value.
8. Measure the time delay for the TRIP signal, and compare it with the set value.
9. Check the inverse time delay by injecting a voltage corresponding to 0.8 × U1<.

For example, if the inverse time curve A is selected, the trip signals TR1
and TRIP operate after a time corresponding to the equation:

k1
t (s ) =
 U 
 1 − U1 < 
 
IECEQUATION2428 V1 EN-US (Equation 96)

where:
t(s) Operate time in seconds
k1 Settable time multiplier of the function for step 1
U Measured voltage
U1< Set start voltage for step 1

For example, if the measured voltage jumps from the rated value to 0.8 times the set
start voltage level and time multiplier k1 is set to 0.05 s (default value), then the TR1 and
TRIP signals operate at a time equal to 0.250 s ± tolerance.
10. The test above can be repeated to check the inverse time characteristic at different
voltage levels.
11. Repeat the above-described steps for Step 2 of the function.

Extended testing M13796-35 v8

The tests above can be repeated for 2 out of 3 and for 3 out of 3 operation mode.

10.6.1.2 Completing the test M13796-25 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6.2 Two step overvoltage protection OV2PTOV M13806-2 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.6.2.1 Verifying the settings M13806-9 v2

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Verification of single-phase voltage and time delay to operate for Step 1 M13806-50 v8

1. Apply single-phase voltage below the set value U1>.

2. Slowly increase the voltage until the ST1 signal appears.
3. Note the operate value and compare it with the set value U1>.

The operate value in secondary volts is calculated according to the

following equations:

For phase-to-earth measurement:

U1 > UBase VT sec

× ×
100 3 VTprim
IECEQUATION2426 V1 EN-US (Equation 97)

For phase-to-phase measurement:

U1 > VT sec
× UBase ×
100 VTprim
IECEQUATION2427 V1 EN-US (Equation 98)
4. Decrease the voltage slowly and note the reset value.
5. Set and apply about 20% higher voltage than the measured operate value for one phase.
6. Measure the time delay for the TR1 signal and compare it with the set value.
7. Check the inverse time delay by injecting a voltage corresponding to 1.2 × U1>.
8. Repeat the test to check the inverse time characteristic at different over-voltage levels.
9. Repeat the above-described steps for Step 2 of the function.

10.6.2.2 Extended testing GUID-BE4B4A36-CCEE-4020-B7DC-6A83A43D11F5 v2

1. The tests above can be repeated for 2 out of 3 and for 3 out of 3 operation mode.

10.6.2.3 Completing the test M13806-43 v6

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6.3 Two step residual overvoltage protection ROV2PTOV SEMOD54358-3 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.6.3.1 Verifying the settings SEMOD54358-35 v10

1. Apply a single-phase voltage either to a single-phase voltage input or to a residual

voltage input with the start value below the set value U1>.
2. Slowly increase the value until ST1 appears.
3. Note the operate value and compare it with the set value.
4. Decrease the voltage slowly and note the reset value.
5. Set and apply a 20% higher voltage than the measured operate value for one phase.

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Testing functionality by secondary injection

6. Measure the time delay for the TR1 signal and compare it with the set value.
7. Check the inverse time delay by injecting a voltage corresponding to 1.2 × U1>.

For example, if the inverse time curve A is selected, the trip signals TR1
and TRIP operate after a time corresponding to the equation:

k1
t (s ) =
 U 
 U1 > − 1
 
IECEQUATION2429 V1 EN-US (Equation 99)

where:
t(s) Operate time in seconds
k1 Settable time multiplier of the function for step 1
U Measured voltage
U1> Set start voltage for step 1
8. Repeat the test for Step 2 of the function.

10.6.3.2 Completing the test SEMOD54358-38 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6.4 Overexcitation protection OEXPVPH M6583-45 v5

Prepare the IED for verification of settings outlined in section

"Requirements" and section "Preparing for test" in this chapter.

10.6.4.1
Verifying the settings
M6583-49 v4

1. Enable function.
2. Connect a symmetrical three-phase voltage input from the test set to the appropriate
connection terminals of the overexcitation protection OEXPVPH is configured for a three-
phase voltage input.
A single-phase injection voltage is applied if the function is configured for a phase-to-
phase voltage input.
OEXPVPH is conveniently tested using rated frequency for the injection voltage and
increasing the injection voltage to get the desired overexcitation level.
3. Connect the alarm contact to the timer and set the time delay tAlarm temporarily to zero.
4. Increase the voltage and note the operate value V/Hz>.
5. Reduce the voltage slowly and note the reset value.
6. Set the alarm time delay to the correct value according to the setting plan and check the
time delay, injecting a voltage corresponding to 1.2 · V/Hz>.
7. Connect a trip output contact to the timer and temporarily set the time delay tMin to
0.5s.
8. Increase the voltage and note the V/Hz>> operate value
9. Reduce the voltage slowly and note the reset value.
10. Set the time delay to the correct value according to the setting plan and check the time
delay tMin, injecting a voltage corresponding to 1.2 · V/Hz>>.
11. Check that trip and alarm contacts operate according to the configuration logic.

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12. Set the cooling time constant temporarily to min value (1min.) to quickly lower the
thermal content.
13. Wait for a period equal to 6 times Tcooling switch 20 minutes on a voltage 1.15 · V/Hz>
and check the inverse operate time.
Wait until the thermal memory is emptied, set the cooling time constant according to the
setting plan and check another point on the inverse time curve injecting a voltage 1.3 · V/
Hz>.
14. Finally check that START and TRIP information is stored in the event menu.

10.6.4.2 Completing the test M6583-85 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6.5 Voltage differential protection VDCPTOV SEMOD175258-3 v2

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

10.6.5.1 Check of undervoltage levels SEMOD175258-71 v2

This test is relevant if the setting BlkDiffAtULow = Yes.

Check of U1Low SEMOD175258-75 v3

Procedure

1. Connect voltages to the IED according to valid connection diagram and figure 37.
2. Apply voltage higher than the highest set value of UDTrip, U1Low and U2Low to the U1
three-phase inputs and to one phase of the U2 inputs according to figure 37.
The voltage differential START signal is set.

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Testing functionality by secondary injection

UL1 UL1

IED TEST SET

UL2 UL2 1

UL3 UL3

IED
UN UN

UL1
UL2 2

UL3

IEC07000106-1-en.vsd
IEC07000106 V2 EN-US

Figure 37: Connection of the test set to the IED for test of U1 block level

where:
1 is three-phase voltage group1 (U1)
2 is three-phase voltage group2 (U2)

3. Decrease slowly the voltage in phase UL1 of the test set until the START signal resets.
4. Check U1 blocking level by comparing the voltage level at reset with the set undervoltage
blocking U1Low.
5. Repeat steps 2 to 4 to check U1Low for the other phases.

The connections to U1 must be shifted to test another phase. (UL1 to UL2,

UL2 to UL3, UL3 to UL1)

Check of U2Low SEMOD175258-91 v3

Procedure

1. Connect voltages to the IED according to valid connection diagram and figure 38.

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UL1 UL1

IED TEST SET

UL2 UL2 1

UL3 UL3

IED
UN UN

UL1
UL2 2

UL3

IEC07000107-1-en.vsd
IEC07000107 V2 EN-US

Figure 38: Connection of the test set to the IED for test of U2 block level

where:
1 is three-phase voltage group1 (U1)
2 is three-phase voltage group2 (U2)

2. Apply voltage higher than the highest set value of UDTrip, U1Low and U2Low to the U1
three-phase inputs and to one phase of the U2 inputs according to figure 38.
The voltage differential START signal is set.
3. Decrease slowly the voltage in phase UL3 of the test set until the START signal resets.
4. Check U2 blocking level by comparing the voltage level at reset with the set undervoltage
blocking U2Low.

10.6.5.2 Check of voltage differential trip and alarm levels SEMOD175258-104 v3

Procedure

1. Connect voltages to the IED according to valid connection diagram and figure 39.

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UL1 UL1

IED TEST SET

UL2 UL2 1

UL3 UL3

IED
UN UN

UL1
UL2 2

UL3

IEC07000108-1-en.vsd
IEC07000108 V2 EN-US

Figure 39: Connection of the test set to the IED for test of alarm levels, trip levels
and trip timer

where:
1 is three-phase voltage group1 (U1)
2 is three-phase voltage group2 (U2)

2. Apply 1.2 · Ur (rated voltage) to the U1 and U2 inputs.

3. Decrease slowly the voltage of in phase UL1 of the test set until the ALARM signal is
activated.

The ALARM signal is delayed with timer tAlarm

4. Check the alarm operation level by comparing the differential voltage level at ALARM with
the set alarm level UDAlarm.
5. Continue to slowly decrease the voltage until START signal is activated.
6. Check the differential voltage operation level by comparing the differential voltage level
at START with the set trip level UDTrip.
7. Repeat steps 1 to 6 to check the other phases.
Observe that the connections to U1 must be shifted to test another phase. (UL1 to UL2,
UL2 to UL3, UL3 to UL1)

10.6.5.3 Check of trip and trip reset timers SEMOD175258-124 v2

Procdure

1. Connect voltages to the IED according to valid connection diagram and figure 39.
2. Set Ur (rated voltage) to the U1 inputs and increase U2 voltage until differential voltage is
1.5 · operating level (UDTrip).
3. Switch on the test set. Measure the time from activation of the START signal until TRIP
signal is activated.

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4. Check the measured time by comparing it to the set trip time tTrip.
5. Increase the voltage until START signal resets. Measure the time from reset of START
signal to reset of TRIP signal.
6. Check the measured time by comparing it to the set trip reset time tReset.

10.6.5.4 Final adjustment of compensation for VT ratio differences SEMOD175258-183 v2

Procedure

1. With the protection in test mode, view the differential voltage service values in each
phase on the local HMI under Main menu/Test/Function status/Voltage protection/
VoltageDiff(PTOV,60)/VDCPTOV:x.

The IED voltage inputs should be connected to the VTs according to valid
connection diagram.

2. Record the differential voltages.

3. Calculate the compensation factor RFLx for each phase.
For information about calculation of the compensation factor, see the application
manual.
4. Set the compensation factors on the local HMI under Main menu/Settings/Settings
group N/Voltage protection/VoltageDiff(PTOV,60)/VDCPTOV:x
5. Check that the differential voltages are close to zero.

10.6.5.5 Completing the test SEMOD175258-208 v2

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6.6 Loss of voltage check LOVPTUV SEMOD175023-3 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.6.6.1 Measuring the operate limit of set values SEMOD175023-7 v7

1. Check that the input logical signals BLOCK, CBOPEN and VTSU are logical zero.
2. Supply a three-phase rated voltage in all three phases and note on the local HMI that the
TRIP logical signal is equal to the logical 0.
3. Switch off the voltage in all three phases.
After set tTrip time a TRIP signal appears on the corresponding binary output or on the
local HMI.

Note that TRIP at this time is a pulse signal, duration should be according
to set tPulse.

4. Inject the measured voltages at rated values for at least set tRestore time.
5. Activate the CBOPEN binary input.
6. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
7. Inject the measured voltages at rated values for at least set tRestore time.

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8. Activate the VTSU binary input.

9. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
10. Reset the VTSU binary input.
11. Inject the measured voltages at rated values for at least set tRestore time.
12. Activate the BLOCK binary input.
13. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
14. Reset the BLOCK binary input.

10.6.6.2 Completing the test SEMOD175023-47 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.6.7 Radial feeder protection PAPGAPC GUID-1A9BA2F9-7AFB-4C27-B851-55E0E9DC4D03 v1

The Signal Monitoring tool in PCM600 shows the service values that are available on the Local
HMI as well.

10.6.7.1 Verifying the settings GUID-302BE312-2BF8-48C9-9914-A96F16984980 v1

Values of the logical signals for PAPGAPC are available on the local HMI under: Main menu/
Tests/Function status/Voltage protection/RadialFeeder(27, U<)/PAPGAPC(27, U<):1

Test for fast fault clearing

• Connect the test set for the injection of three phase voltages and currents to the
appropriate terminals of the IED.
• Enable the fast fault clearance by setting FastOperation to TRUE, and also connect the
inputs BLKDLFLT to TRUE and FUSEFAIL to FALSE.
• Also assume circuit breaker is in closed position, that is CBCLOSED is high, prior to fault
occurrence.
• Create a single phase fault on phase L1 such that phase L1 voltage is lower than UPhSel<
times quadrature phase to phase voltage and set Tau to default value.
• Activate carrier receive CR signal.
• Check that TRIP, TRL1, ARST and ARSTL1 are generated with the conditions described.
• Check that activated trip signals and start signals are blocked by enabling BLKTR and
BLKST.
• Check that all activated signals are disabled by BLOCK input.
• If required, perform creating faults on the remaining phases in the similar way.

Test of delayed fault clearing for single pole tripping

• Connect the test set for the injection of three phase voltages and currents to the
appropriate terminals of the IED.
• Enable the delayed fault clearance for single pole tripping by setting Del1phOp to 1Ph
(On), Del3PhOp to FALSE (Off) and also connect the inputs BLKDLFLT and FUSEFAIL to
FALSE.
• Also assume circuit breaker is in closed position, that is input CBCLD is high, prior to fault
occurrence.
• Create a single phase fault on phase L1 such that phase L1 voltage is lower than UPhSel<
times quadrature phase to phase voltage and set Tau to default value and also inject the
residual current such that it exceeds set IN> value.
• Check that output TRIN is activated after a set delay of tResCurr if ResCurrOper is set to
high.

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• Check that TRIP and TRL1 are generated with the conditions described after a set delay
time of t1Ph and the outputs ARST and ARSTL1 are also activated. .
• Check that activated trip signals and start signals are blocked by enabling BLKTR and
BLKST.
• Check that all activated signals are disabled by BLOCK input.
• If required, perform creating faults on the remaining phases in the similar way.

Test of delayed fault clearing for three pole tripping

• Connect the test set for the injection of three phase voltages and currents to the
appropriate terminals of the IED.
• Enable the delayed fault clearance for three pole tripping by setting Del3phOp to TRUE
(On), Del1PhOp to 3Ph (Off) and also connect the inputs BLKDLFLT and FUSEFAIL to
FALSE.
• Also assume circuit breaker is in closed position, that is, the input CBCLOSED is high prior
to fault occurrence.
• Create a L2L3 fault such that their phase voltage magnitudes are lower than UPhSel<
times corresponding quadrature phase to phase voltage and set Tau to default value.
• Check that TRIP, TRL1, TRL2 and TRL3 are generated after the set delay time of t3Ph and
ARST, ARST3PH, ARSTL1, ARSTL2 and ARSTL3 are also activated.
• Check that activated trip signals and start signals are blocked by enabling BLKTR and
BLKST.
• Check that all activated signals are disabled by BLOCK input.

10.6.7.2 Completing the test GUID-4AFACF9B-9CA8-4960-9806-316FFCFEDEC0 v1

Continue to test another function or end the testing by setting the parameter TestMode to Off
under: Main menu/Tests/IED test mode/TESTMODE:1

Restore connections and settings to their original values if they were changed for testing
purposes.

10.7 Frequency protection SEMOD53547-1 v1

10.7.1 Underfrequency protection SAPTUF M16289-2 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.7.1.1 Verifying the settings M16289-15 v3

Verification of START value and time delay to operate M16289-17 v6

1. Check that the IED settings are appropriate, for example the START value and the time
delay.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the frequency of the applied voltage, until the START signal appears.
4. Note the operate value and compare it with the set value.
5. Increase the frequency until rated operating levels are reached.

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6. Check that the START signal resets.

7. Instantaneously decrease the frequency of the applied voltage to a value about 1% lower
than the operate value (a step change more than 2% will increase the time delay).
8. Measure the time delay of the TRIP signal, and compare it with the set value. Note that
the measured time consists of the set value for time delay plus minimum operate time of
the start function (80 - 90 ms).

Extended testing M16289-31 v5

1. The test above can be repeated to check the time to reset.

2. The tests above can be repeated to test the frequency dependent inverse time
characteristic.

Verification of the low voltage magnitude blocking M16289-39 v7

1. Check that the IED settings are appropriate, for example the StartFrequency, UMin , and
the tDelay.
2. Supply the IED with three-phase voltages at rated values.
3. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal
appears.
4. Note the voltage magnitude value and compare it with the set value UMin.
5. Slowly decrease the frequency of the applied voltage, to a value below StartFrequency.
6. Check that the START signal does not appear.
7. Wait for a time corresponding to tDelay, make sure that the TRIP signal does not appear.

10.7.1.2 Completing the test M16289-57 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.7.2 Overfrequency protection SAPTOF M16290-2 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.7.2.1 Verifying the settings M16290-12 v2

Verification of START value and time delay to operate M16290-14 v5

1. Check that the settings in the IED are appropriate, for example the START value and the
time delay.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly increase the frequency of the applied voltage, until the START signal appears.
4. Note the operate value and compare it with the set value.
5. Decrease the frequency to rated operating conditions.
6. Check that the START signal resets.
7. Instantaneously increase the frequency of the applied voltage to a value about 1% lower
than the operate value (a step change more than 2% will increase the time delay).
8. Measure the time delay for the TRIP signal, and compare it with the set value. Note that
the measured time consists of the set value for time delay plus minimum operate time of
the start function (80 - 90 ms).

Extended testing M16290-28 v4

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1. The test above can be repeated to check the time to reset.

Verification of the low voltage magnitude blocking M16290-34 v5

1. Check that the settings in the IED are appropriate, for example the StartFrequency, UMin,
and the tDelay.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal
appears.
4. Note the voltage magnitude value and compare it with the set value, UMin.
5. Slowly increase the frequency of the applied voltage, to a value above StartFrequency.
6. Check that the START signal does not appear.
7. Wait for a time corresponding to tDelay, make sure that the TRIP signal does not appear.

10.7.2.2 Completing the test M16290-52 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.7.3 Rate-of-change frequency protection SAPFRC M16256-2 v6

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

10.7.3.1 Verifying the settings M16256-8 v1

Verification of START value and time delay to operate M16256-10 v5

1. Check that the settings in the IED are appropriate, especially the START value and the
definite time delay. Set StartFreqGrad, to a rather small negative value.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the frequency of the applied voltage, with an increasing rate-of-change
that finally exceeds the setting of StartFreqGrad, and check that the START signal
appears.
4. Note the operate value and compare it with the set value.
5. Increase the frequency to rated operating conditions, and zero rate-of-change.
6. Check that the START signal resets.
7. Instantaneously decrease the frequency of the applied voltage to a value about 20%
lower than the nominal value.
8. Measure the time delay for the TRIP signal, and compare it with the set value.

Extended testing M16256-29 v4

1. The test above can be repeated to check a positive setting of StartFreqGrad.

2. The tests above can be repeated to check the time to reset.
3. The tests above can be repeated to test the RESTORE signal, when the frequency
recovers from a low value.

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10.7.3.2 Completing the test M16256-39 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.8 Multipurpose protection SEMOD53552-1 v1

10.8.1 General current and voltage protection CVGAPC SEMOD56488-3 v3

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

One of the new facilities within the general current and voltage protection function CVGAPC is
that the value, which is processed and used for evaluation in the function, can be chosen in
many different ways by the setting parameters CurrentInput and VoltageInput.

These setting parameters decide what kind of preprocessing the connected three-phase CT
and VT inputs shall be subjected to. That is, for example, single-phase quantities, phase-to-
phase quantities, positive sequence quantities, negative sequence quantities, maximum
quantity from the three-phase group, minimum quantity from the three-phase group,
difference between maximum and minimum quantities (unbalance) can be derived and then
used in the function.

Due to the versatile possibilities of CVGAPC itself, but also the possibilities of logic
combinations in the application configuration of outputs from more than one CVGAPC
function block, it is hardly possible to define a fully covering general commissioning test.

10.8.1.1 Built-in overcurrent feature (non-directional) SEMOD56488-9 v5

Procedure

1. Go to Main menu/Test/Function test modes/Multipurpose protection/

GeneralCurrentVoltage(GAPC)/CVGAPC:x and make sure that CVGAPC to be tested is
unblocked and other functions that might disturb the evaluation of the test are blocked.
2. Connect the test set for injection of three-phase currents to the appropriate current
terminals of the IED.
3. Inject current(s) in a way that relevant measured current (according to setting parameter
CurrentInput) is created from the test set. Increase the current(s) until the low set stage
operates and check against the set operate value.
4. Decrease the current slowly and check the reset value.
5. Block high set stage if the injection current will activate the high set stage when testing
the low set stage according to below.
6. Connect a TRIP output contact to the timer.
7. Set the current to 200% of the operate value of low set stage, switch on the current and
check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current at tMin.
8. Check that TRIP and START contacts operate according to the configuration logic.
9. Release the blocking of the high set stage and check the operate and reset value and the
time delay for the high set stage in the same way as for the low set stage.
10. Finally check that START and TRIP information is stored in the event menu.

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Information on how to use the event menu is found in the operator's

manual.

10.8.1.2 Overcurrent feature with current restraint SEMOD56488-35 v3

The current restraining value has also to be measured or calculated and the influence on the
operation has to be calculated when the testing of the operate value is done.

Procedure

1. Operate value measurement

The current restraining value has also to be measured or calculated and the influence on
the operation has to be calculated when the testing of the operate value is done.

10.8.1.3 Overcurrent feature with voltage restraint SEMOD56488-44 v5

Procedure

1. Connect the test set for injection of three-phase currents and three-phase voltages to
the appropriate current and voltage terminals of the IED.
2. Inject current(s) and voltage(s) in a way that relevant measured (according to setting
parameter CurrentInput and VoltageInput) currents and voltages are created from the
test set.
Overall check in principal as above (non-directional overcurrent feature)
3. Operate value measurement
The relevant voltage restraining value (according to setting parameter VoltageInput) has
also to be injected from the test set and the influence on the operate value has to be
calculated when testing of the operate value is done.
4. Operate time measurement
Definite times may be tested as above (non-directional overcurrent feature). For inverse
time characteristics the START value (to which the overcurrent ratio has to be calculated)
is the actual pickup value as got with actual restraining from the voltage restraining
quantity.

10.8.1.4 Overcurrent feature with directionality SEMOD56488-60 v5

Please note that the directional characteristic can be set in two different ways either just
dependent on the angle between current and polarizing voltage (setting parameter
DirPrinc_OC1 or DirPrinc_OC2 set to or in a way that the operate value also is dependent on the
angle between current and polarizing voltage according to the I · cos(F) law (setting
parameter DirPrinc_OC1 or DirPrinc_OC2 set to I · cos(F). This has to be known if a more
detailed measurement of the directional characteristic is made, than the one described below.

Procedure

1. Connect the test set for injection of three-phase currents and three-phase voltages to
the appropriate current and voltage terminals of the IED.
2. Inject current(s) and voltage(s) in a way that relevant measured (according to setting
parameter CurrentInput and VoltageInput) currents and voltages are created from the
test set.
3. Set the relevant measuring quantity current to lag or lead (lag for negative RCA angle and
lead for positive RCA angle) the relevant polarizing quantity voltage by an angle equal to
the set IED characteristic angle (rca-dir) when forward directional feature is selected and
the CTstarpoint configuration parameter is set to ToObject.

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If reverse directional feature is selected or CTstarpoint configuration parameter is set to

FromObject, the angle between current and polarizing voltage shall be set equal to rca-
dir+180°.
4. Overall check in principal as above (non-directional overcurrent feature)
5. Reverse the direction of the injection current and check that the protection does not
operate.
6. Check with low polarization voltage that the feature becomes non-directional, blocked or
with memory according to the setting.

10.8.1.5 Over/Undervoltage feature SEMOD56488-83 v2

Procedure

1. Connect the test set for injection three-phase voltages to the appropriate voltage
terminals of the IED.
2. Inject voltage(s) in a way that relevant measured (according to setting parameter
VoltageInput) voltages are created from the test set.
3. Overall check in principal as above (non-directional overcurrent feature) and
correspondingly for the undervoltage feature.

10.8.1.6 Completing the test SEMOD56488-99 v2

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.9 Secondary system supervision SEMOD53556-1 v1

10.9.1 Current circuit supervision CCSSPVC M12917-25 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The Current circuit supervision function CCSSPVC is conveniently tested with the same three-
phase test set as used when testing the measuring functions in the IED.

The condition for this procedure is that the setting of IMinOp is lower than the setting of
Ip>Block.

10.9.1.1 Verifying the settings M12917-31 v7

1. Check the input circuits and the operate value of the IMinOp current level detector by
injecting current, one phase at a time.
2. Check the phase current blocking function for all three phases by injecting current, one
phase at a time. The output signals shall reset with a delay of 1 second when the current
exceeds 1.5 · IBase.
3. Inject a current 0.1 · IBase to the reference current input I5.
4. Increase slowly the current in one of the phases current input and check that FAIL output
is obtained when the current is about 0.9 · IBase.

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10.9.1.2 Completing the test M12917-43 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.9.2 Fuse failure supervision FUFSPVC M1405-2 v8

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The verification is divided in two main parts. The first part is common to all fuse failure
supervision options, and checks that binary inputs and outputs operate as expected according
to actual configuration. In the second part the relevant set operate values are measured.

10.9.2.1 Checking that the binary inputs and outputs operate as expected M1405-9 v8

1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Connect the nominal dc voltage to the DISCPOS binary input.
• The signal BLKU should appear with almost no time delay.
• The signals BLKZ and 3PH should not appear on the IED.
• Only the distance protection function can operate.
• Undervoltage-dependent functions must not operate.
3. Disconnect the dc voltage from the DISCPOS binary input terminal.
4. Connect the nominal dc voltage to the MCBOP binary input.
• The BLKUand BLKZ signals should appear without any time delay.
• All undervoltage-dependent functions must be blocked.
5. Disconnect the dc voltage from the MCBOP binary input terminal.
6. Disconnect one of the phase voltages and observe the logical output signals on the
binary outputs of the IED.
BLKU and BLKZ signals should appear simultaneously wether the BLKU and BLKZ reset
depends on the setting SealIn “on” or “off”. If “on” no reset, if “off” reset.
7. After more than 5 seconds disconnect the remaining two-phase voltages and all three
currents.
• There should be no change in the high status of the output signals BLKU and BLKZ.
• The signal 3PH will appear.
8. Establish normal voltage and current operating conditions simultaneously and observe
the corresponding output signals.
They should change to logical 0 as follows:
• Signal 3PH after about 25ms
• Signal BLKU after about 50ms
• Signal BLKZ after about 200ms

10.9.2.2 Measuring the operate value for the negative sequence function M1405-46 v11

Measure the operate value for the negative sequence function, if included in the IED.

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1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Slowly decrease the measured voltage in one phase until the BLKU signal appears.
3. Record the measured voltage and calculate the corresponding negative-sequence voltage
according to the equation (observe that the voltages in the equation are phasors):

3 ⋅ U 2 = U L1 + a 2 ⋅ U L2 + a ⋅ U L3
EQUATION707 V2 EN-US (Equation 100)

Where:
are the measured phase voltages
UL1 , U L2 and U L3
IEC00000275 V1 EN-US

2 ×p
j 3
a = 1× e 3
= -0,. 5 + j
2
IECEQUATION00022 V2 EN-US

4. Compare the result with the set value of the negative-sequence operating voltage
(consider that the set value 3U2> is in percentage of the base voltage UBase).
5. Repeat steps 1 and 2. Then slowly increase the measured current in one phase until the
BLKU signal disappears.
6. Record the measured current and calculate the corresponding negative-sequence current
according to the equation (observe that the currents in the equation are phasors):

3 × I 2 = I L1 + a × I L 2 + a × I L 3
2

IECEQUATION00021 V1 EN-US (Equation 103)

Where:
are the measured phase currents
I L1 , I L 2 and I L 3
IECEQUATION00020 V1 EN-US

2 ×p
j 3
a = 1× e 3
= -0,. 5 + j
2
IECEQUATION00022 V2 EN-US

7. Compare the result with the set value of the negative-sequence operating current.
Consider that the set value 3I2< is in percentage of the base current IBase.

10.9.2.3 Measuring the operate value for the zero-sequence function M1405-72 v10

Measure the operate value for the zero-sequence function, if included in the IED.

1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Slowly decrease the measured voltage in one phase until the BLKU signal appears.
3. Record the measured voltage and calculate the corresponding zero-sequence voltage
according to the equation (observe that the voltages in the equation are phasors):

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3 × U0 = U L1 + UL2 + U L3
IEC00000276 V1 EN-US (Equation 106)

Where:

UL1 , U L 2 and U L3
are the measured phase voltages
IEC00000275 V1 EN-US

4. Compare the result with the set value of the zero-sequence operating voltage (consider
that the set value 3U0> is in percentage of the base voltage.)
5. Repeat steps 1 and 2. Then slowly increase the measured current in one phase until the
BLKU signal disappears.
6. Record the measured current and calculate the corresponding zero-sequence current
according to the equation (observe that the currents in the equation are phasors):

3 × I 0 = I L1 + I L2 + I L3
IECEQUATION00019 V1 EN-US (Equation 108)

Where:
are the measured phase currents
I L1 , I L 2 and I L 3
IECEQUATION00020 V1 EN-US

7. Compare the result with the set value of the zero-sequence operate current. Consider
that the set value 3I0< is in percentage of the base current IBase.

10.9.2.4 Measuring the operate value for the dead line detection function GUID-4ABF1FD4-F6D3-4109-AFE5-552875E558A0 v4

1. Apply three-phase voltages with their rated value and zero currents.
2. Decrease the measured voltage in one phase until the DLD1PH signal appears.
3. This is the point at which the dead line condition is detected. Check the value of the
decreased voltage with the set value UDLD< (UDLD< is in percentage of the base voltage
UBase).
4. Apply three-phase currents with their rated value and zero voltages.
5. Decrease the measured current in one phase until the DLD1PH signal appears.
6. This is the point at which the dead line condition is detected. Check the value of the
decreased current with the set value IDLD< (IDLD< is in percentage of the base current
IBase).

10.9.2.5 Checking the operation of the du/dt and di/dt based function M1405-96 v11

Check the operation of the du/dt and di/dt based function if included in the IED.

1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Change the voltages and currents in all three phases simultaneously.
The voltage change must be higher than the set value DU> and the current change must
be lower than the set value DI<.
• The BLKU and BLKZ signals appear without any time delay. The BLKZ signal will be
activated only if the internal deadline detection is not activated at the same time.
• 3PH should appear after 5 seconds, if the remaining voltage levels are lower than
the set UDLD< of the dead line detection function.
3. Apply normal conditions as in step 1.

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The BLKU, BLKZ and 3PH signals should reset, if activated, see step 1 and 2.
4. Change the voltages and currents in all three phases simultaneously.
The voltage change must be higher than the set value DU> and the current change must
be higher than the set value DI<.
The BLKU, BLKZ and 3PH signals should not appear.
5. Repeat step 2.
6. Connect the nominal voltages in all three phases and feed a current below the operate
level in all three phases.
7. Keep the current constant. Disconnect the voltage in all three phases simultaneously.
The BLKU, BLKZ and 3PH signals should not appear.
8. Change the magnitude of the voltage and current for phase 1 to a value higher than the
set value DU> and DI<.
9. Check that the start output signals STDUL1 and STDIL1 and the general start signals
STDU or STDI are activated.
10. Check that the start output signals for the current and voltage phases 2 and 3 are
activated by changing the magnitude of the voltage and current for phases 2 and 3.

10.9.2.6 Completing the test M1405-130 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.9.3 Fuse failure supervision VDSPVC GUID-DCCD4C4A-8335-43BA-A2B2-9994380985B0 v2

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

GUID-004BFFE4-B1C1-4C0E-8D7A-ABE7B566AB28 v2

Checking the operation of binary input and output

1. Simulate normal operation conditions with three-phase voltage on the main fuse group
and the pilot fuse group. Ensure the values are equal to their rated values.
2. Disconnect one of the phase voltage from the main fuse group or the pilot fuse group.
Observe the binary outputs of the IED. The MAINFUF or the PILOTFUF signals are
simultaneously activated. Only the output circuit related to the open phase will be active
i.e either MAINFUF or PILOTFUF.
3. Establish a normal voltage operating condition and observe the corresponding output
signals. MAINFUF or PILOTFUF should change to 0 in about 27 ms.
4. Set normal conditions as mentioned in step 1.
5. Enable the BLOCK binary input and repeat step 2. MAINFUF or PILOTFUF should not
appear.

Checking the operation of MAINFUF and PILOTFUF

1. Simulate normal operation conditions with three-phase voltage on the main fuse group
and the pilot fuse group. Ensure the values are equal to their rated values.
2. Decrease one of the three-phase voltages on main fuse group or pilot fuse group. The
voltage change must be greater than the set value for Ud>MainBlock or Ud>PilotAlarm.
MAINFUF or PILOTFUF signals are activated without any time delay.
3. Set normal conditions as mentioned in step 1. MAINFUF or PILOTFUF signals should reset.
4. Set SealIn to On, UD>MainBlock to 20% of UBase and USealIn to 70% of UBase.
5. Apply three-phase voltages with the value slightly below USealIn level.
6. Decrease one of the three-phase voltages on main fuse group. The voltage change must
be greater than the set value for Ud>MainBlock. MAINFUF signal is activated.

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7. After more than 5 seconds increase the measured voltage back to the value slightly below
USealIn level. MAINFUF signal should not reset.
8. Slowly increase measured voltage to the value slightly above USealIn until MAINFUF signal
resets.
9. Record the measured voltage and compare with the set value USealIn.

10.9.3.1 Completing the test GUID-38A57549-E6BF-46CB-ADFB-79305684EB67 v1

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.10 Control SEMOD53560-1 v1

10.10.1 Synchrocheck, energizing check, and synchronizing SESRSYN M2377-3 v11

This section contains instructions on how to test the synchrocheck, energizing check, and
synchronizing function SESRSYN for single, double and 1½ breaker arrangements.

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

At commissioning and periodical checks, the functions shall be tested with the used settings.
To test a specific function, it might be necessary to change some setting parameters, for
example:

• AutoEnerg = Off/DLLB/DBLL/Both
• ManEnerg = Off
• Operation = Off/On
• Activation of the voltage selection function if applicable

The tests explained in the test procedures below describe the settings, which can be used as
references during testing before the final settings are specified. After testing, restore the
equipment to the normal or desired settings.

A secondary injection test set with the possibility to alter the phase angle and amplitude of
the voltage is needed. The test set must also be able to generate different frequencies on
different outputs.

The description below applies for a system with a nominal frequency of 50 Hz

but can be directly applicable to 60 Hz. SESRSYN can be set to use different
phases, phase to earth or phase to phase. Use the set voltages instead of what
is indicated below.

Figure 40 shows the general test connection principle, which can be used during testing. This
description describes the test of the version intended for one bay.

Figure 41 shows the general test connection for a 1½ breaker diameter with one-phase voltage
connected to the line side.

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IED

Test UMeasure
U-Bus
equipment U3PBB1 Ph/N
N Ph/Ph

Input Phase
L1,L2,L3
L12,L23,L31

UMeasure
U-Line
U3PLN1 Ph/N
Ph/Ph
UL1
UL2
Input Phase
UL3
L1,L2,L3
N
N L12,L23,L31

IEC05000480-4-en.vsd
IEC05000480 V4 EN-US

Figure 40: General test connection with three-phase voltage connected to the line side

IED

Test U-Bus1
equipment U3PBB1 UMeasure
Ph/N
N Ph/Ph
U-Bus2
U3PBB2
Input Phase
N L1,L2,L3
U-Line2
U3PLN2 L12,L23,L31
N

UMeasure
Ph/N
U-Line1 Ph/Ph
U3PLN1
Input Phase
L1,L2,L3
L12,L23,L31

N N

IEC05000481-5-en.vsd
IEC05000481 V5 EN-US

Figure 41: General test connection for a 1½ breaker diameter with one-phase voltage
connected to the line side

10.10.1.1 Testing the synchronizing function M2377-21 v8

The voltage inputs used are:

UP3LN1 UL1, UL2 or UL3 line 1 voltage inputs on the IED

UP3BB1 Bus1 voltage input on the IED

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Testing the frequency difference M2377-116 v10

The frequency difference test should verify that operation is achieved when the frequency
difference between bus and line is less than set value of FreqDiffMaxand above set value of
FreqDiffMin. The test procedure below will depend on the settings used. Input STARTSYN
must be activated during the test.

FreqDiffMax = 50.2 Hz

FreqDiffMin = 50.01 Hz

tBreaker = 0.080 s

1. Apply voltages
1.1. U-Line = 100% UBaseLine and f-Line = 50.0 Hz
1.2. U-Bus = 100% UBaseBus and f-Bus = 50.15Hz
2. Check that a closing pulse is submitted at a closing angle equal to calculated phase angle
value from the formula below. Modern test sets will evaluate this automatically.
Closing Angle = |( (fBus– fLine) * tBreaker * 360 degrees) |
fBus= Bus frequency
fLine= Line frequency
tBreaker = Set closing time of the breaker
3. Repeat with
3.1. U-Bus = 100% UBaseBus and f-bus = 50.25 Hz, to verify that the function does not
operate when frequency difference is above limit.
4. Verify that the closing command is not issued when the frequency difference is less than
the set value FreqDiffMin.

10.10.1.2 Testing the synchrocheck check M2377-132 v8

During the test of SESRSYN for a single bay arrangement, these voltage inputs are used:

U-Line UL1, UL2 or UL3 line 1 voltage input on the IED according to the connection in
SMT
U-Bus Bus voltage input on the IED according to the connection in SMT

Testing the voltage difference M2377-194 v8

Set the voltage difference to 0.15 p.u. on the local HMI, and the test should check that
operation is achieved when the voltage difference UDiffSC is lower than 0.15 p.u.

The settings used in the test shall be final settings. The test shall be adapted to site setting
values instead of values in the example below.

Test with no voltage difference between the inputs.

Test with a voltage difference higher than the set UDiffSC.

1. Apply voltages U-Line (for example) = 80% GblBaseSelLine and U-Bus = 80%
GblBaseSelBusGblBaseSelBus with the same phase-angle and frequency.
2. Check that the AUTOSYOK and MANSYOK outputs are activated.
3. The test can be repeated with different voltage values to verify that the function
operates within the set UDiffSC. Check with both U-Line and U-Bus respectively lower
than the other.
4. Increase the U-Bus to 110% GblBaseSelBus, and the U-Line = 90% GblBaseSelLine and
also the opposite condition.
5. Check that the two outputs for manual and auto synchronism are not activated.

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Testing the phase angle difference M2377-215 v8

The phase angle differences PhaseDiffM and PhaseDiffA respectively are set to their final
settings and the test should verify that operation is achieved when the phase angle difference
is lower than this value both leading and lagging.

Test with no voltage difference.

1. Apply voltages U-Line (for example) = 100% GblBaseSelLine and U-Bus = 100%
GblBaseSelBus, with a phase difference equal to 0 degrees and a frequency difference
lower than FreqDiffA and FreqDiffM.
2. Check that the AUTOSYOK and MANSYOK outputs are activated.
The test can be repeated with other phase difference values to verify that the function
operates for values lower than the set ones, PhaseDiffM and PhaseDiffA. By changing the
phase angle on the voltage connected to U-Bus, between ± dφ degrees, the user can
check that the two outputs are activated for a phase difference lower than the set value.
It should not operate for other values. See figure 42.

U-Bus

No operation
+dj
U-Line operation
-dj

U-Bus

en05000551.vsd
IEC05000551 V1 EN-US

Figure 42: Test of phase difference

3. Change the phase angle between +dφ and -dφ and verify that the two outputs are
activated for phase differences between these values but not for phase differences
outside, see figure 42.

Testing the frequency difference M2377-232 v9

The frequency difference test should verify that operation is achieved when the FreqDiffA and
FreqDiffM frequency difference is lower than the set value for manual and auto synchronizing
check, FreqDiffA and FreqDiffM respectively and that operation is blocked when the frequency
difference is greater.

Test with frequency difference = 0 mHz

Test with a frequency difference outside the set limits for manual and auto synchronizing
check respectively.

1. Apply voltages U-Line equal to 100% GblBaseSelLine and U-Bus equal to 100%
GblBaseSelBus, with a frequency difference equal to 0 mHz and a phase difference lower
than the set value.
2. Check that the AUTOSYOK and MANSYOK outputs are activated.
3. Apply voltage to the U-Line equal to 100% GblBaseSelLine with a frequency equal to 50
Hz and voltage U-Bus equal to 100% GblBaseSelBus, with a frequency outside the set
limit.
4. Check that the two outputs are not activated. The test can be repeated with different
frequency values to verify that the function operates for values lower than the set ones. If
a modern test set is used, the frequency can be changed continuously.

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Testing the reference voltage M2377-249 v5

1. Use the same basic test connection as in figure 40.

The voltage difference between the voltage connected to U-Bus and U-Line should be 0%,
so that the AUTOSYOK and MANSYOK outputs are activated first.
2. Change the U-Line voltage connection to U-Line2 without changing the setting on the
local HMI. Check that the two outputs are not activated.

10.10.1.3 Testing the energizing check M2377-262 v6

During the test of the energizing check function for a single bay arrangement, these voltage
inputs are used:

U-Line UL1, UL2 or UL3 line1 voltage inputs on the IED

U-Bus Bus voltage input on the IED

General M2377-271 v6
When testing the energizing check function for the applicable bus, arrangement shall be done
for the energizing check functions. The voltage is selected by activation of different inputs in
the voltage selection logic.

Live voltage level is fixed to 80% UBase and dead voltage level to fixed 40% UBase.

The test shall be performed according to the settings for the station. Test the alternatives
below that are applicable.

Testing the dead line live bus (DLLB) M2377-276 v7

The test should verify that the energizing check function operates for a low voltage on the U-
Line and for a high voltage on the U-Bus. This corresponds to the energizing of a dead line to a
live bus.

1. Apply a single-phase voltage 100% GblBaseSelBus to the U-Bus, and a single-phase

voltage 30% GblBaseSelLine to the U-Line.
2. Check that the AUTOENOK and MANENOK outputs are activated after set tAutoEnerg
respectively tManEnerg.
3. Increase the U-Line to 60% GblBaseSelLine and U-Bus to be equal to 100%
GblBaseSelBus. The outputs should not be activated.
4. The test can be repeated with different values on the U-Bus and the U-Line.

Testing the dead bus live line (DBLL) M2377-289 v8

The test should verify that the energizing check function operates for a low voltage on the U-
Bus and for a high voltage on the U-Line. This corresponds to an energizing of a dead bus to a
live line.

1. Verify the settings AutoEnerg or ManEnerg to be DBLL.

2. Apply a single-phase voltage of 30% GblBaseSelBus to the U-Bus and a single-phase
voltage of 100% GblBaseSelLine to the U-Line.
3. Check that the AUTOENOK and MANENOK outputs are activated after set tAutoEnerg
respectively tManEnerg.
4. Decrease the U-Line to 60% GblBaseSelLine and keep the U-Bus equal to 30%
GblBaseSelBus. The outputs should not be activated.
5. The test can be repeated with different values on the U-Bus and the U-Line.

Testing both directions (DLLB or DBLL) M2377-306 v7

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1. Verify the local HMI settings AutoEnerg or ManEnerg to be Both.

2. Apply a single-phase voltage of 30% GblBaseSelLine to the U-Line and a single-phase
voltage of 100% GblBaseSelBus to the U-Bus.
3. Check that the AUTOENOK and MANENOK outputs are activated after set tAutoEnerg
respectively tManEnerg.
4. Change the connection so that the U-Line is equal to100% GblBaseSelLine and the U-Bus
is equal to 30% GblBaseSelBus. The outputs should still be activated.
5. The test can be repeated with different values on the U-Bus and the U-Line.

Testing the dead bus dead line (DBDL) M2377-323 v8

The test should verify that the energizing check function operates for a low voltage on both
the U-Bus and the U-Line, that is, closing of the breaker in a non-energized system. Test is valid
only when this function is used.

1. Verify the local HMI setting AutoEnerg to be Off and ManEnerg to be DBLL.
2. Set the parameter ManEnergDBDL to On.
3. Apply a single-phase voltage of 30% GblBaseSelBus to the U-Bus and a single-phase
voltage of 30% GblBaseSelLine to the U-Line.
4. Check that the MANENOK output is activated after set tManEnerg.
5. Increase the U-Bus to 80% GblBaseSelBus and keep the U-Line equal to 30%
GblBaseSelLine. The outputs should not be activated.
6. Repeat the test with ManEnerg set to DLLB with different values on the U-Bus and the U-
Line voltage.

10.10.1.4 Testing the voltage selection M2377-342 v2

Testing the voltage selection for single CB arrangements M2377-473 v7

This test should verify that the correct voltage is selected for the measurement in the
SESRSYN function used in a double-bus arrangement. Apply a single-phase voltage of 100%
GblBaseSelLine to the U-Line and a single-phase voltage of 100% GblBaseSelBus to the U-Bus.

If the UB1/2OK inputs for the fuse failure are used, they must be activated, during tests below.
Also verify that deactivation prevents operation and gives an alarm.

1. Connect the signals above to binary inputs and binary outputs.

2. Connect the voltage inputs to the analog inputs used for each bus or line depending of
the type of busbar arrangement and verify that correct output signals are generated.

Testing the voltage selection for double breaker M2377-691 v6

This test should verify that correct voltage is selected for the measurement in the SESRSYN
function used for a diameter in a One-and-a-half breaker arrangement. Apply a single-phase
voltage of 100% GblBaseSelLine to the U-Line and a single-phase voltage of 100%
GblBaseSelBus to the U-Bus. Verify that correct output signals are generated.

1. Connect the analog signals to the voltage inputs, in pair of two for U1 and U2. (Inputs
U3PBB1, U3PBB2, U3PLN1, U3PLN2)
2. Activate the binary signals according to the used alternative. Verify the measuring
voltage on the synchronizing check function SESRSYN. Normally it can be good to verify
synchronizing check with the same voltages and phase angles on both voltages. The
voltages should be verified to be available when selected and not available when another
input is activated so connect only one voltage transformer reference at each time.
3. Record the voltage selection tests in a matrix table showing read values and AUTOSYOK/
MANSYOK signals to document the test performed.

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Testing the voltage selection for 1 1/2 CB arrangements GUID-12E7DA63-FE04-4C83-9BA6-34818C510DB8 v4

At test of the SESRSYN function for a 1½ CB diameter the following alternative voltage inputs
can be used for the three SESRSYN (SESRSYN 1, SESRSYN 2, SESRSYN 3) functions. These three
SESRSYN functions can either be in one, two or three different IEDs. Table 33 describes the
scenario when SESRSYN 1, SESRSYN 2 and SESRSYN 3 all are in the same IED. If SESRSYN 3 is in
another IED, WA1 will be considered as WA2 and LINE2 as LINE1. The voltage is selected by
activation of different inputs in the voltage selection logic as shown in table 33 and figure 43.

Table 33: Voltage selection logic

SESRSYN CBConfig Section to Activated Activated Activated Activated Indication
setting be B1QCLD B2QCLD LN1QCLD LN2QCLD from
synchroniz input on input on input on input on SESRSYN
ed IED from IED from IED from IED from on IED
SESRSYN 1 1 ½ bus CB WA1 – LINE1_QB B1SEL,
(Operates on LINE1 9 LN1SEL
WA1_QA1)
WA1 – TIE_QA1 LINE2_QB B1SEL,
LINE2 9 LN2SEL
WA1 – TIE_QA1 WA2_QA1 B1SEL,
WA2 B2SEL
SESRSYN 2 Tie CB LINE1 – LINE1_QB LINE2_QB LN1SEL,
(Operates on LINE2 9 9 LN2SEL
TIE_QA1)
WA1 – WA1_QA1 LINE2_QB B1SEL,
LINE2 9 LN2SEL
WA2 – WA2_QA1 LINE1_QB B2SEL,
LINE1 9 LN1SEL
WA1 – WA1_QA1 WA2_QA1 B1SEL,
WA2 B2SEL
SESRSYN 3 1 ½ bus WA2 – LINE2_QB B2SEL,
(Operates on alt. CB LINE2 9 LN2SEL
WA2_QA1) (mirrored)
WA2 – TIE_QA1 LINE1_QB B2SEL,
LINE1 9 LN1SEL
WA2 – TIE_QA1 WA1_QA1 B1SEL,
WA1 B2SEL

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WA1

WA2

WA1_QA1 WA2_QA1
(SESRSYN 1) (SESRSYN 3)

TIE_QA1
(SESRSYN 2)

LINE1_QB9 LINE2_QB9

LINE1 LINE2
IEC11000274-3-en.vsd
IEC11000274 V3 EN-US

Figure 43: Objects used in the voltage selection logic

10.10.1.5 Completing the test M2377-1042 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.10.2 Autorecloser for 1/2/3-phase operation SMBRREC M12400-2 v10

Verification of the Autorecloser for 1/2/3-phase operation function SMBRREC for single-phase,
two-phase or three-phase reclosing attempts can be considered to consist of two parts.

• One part to verify the internal logic and timing of the function
• One part to verify its interaction with the protection system

This section deals with verification of SMBRREC itself. However, it is practical to start
SMBRREC by activating a protection function, for example, by secondary injection tests.

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The purpose of verification before commissioning is to check that entered selections, setting
parameters and configuration render the intended result. The function is flexible with many
options and facilities. At commissioning only the selections and settings intended for use are
verified. If one chooses to reduce some time settings in order to speed up verification, be
careful to set the parameters at intended operational values at the end of the verification
procedure. One such parameter is the tReclaim time that must be timed out before a new test
sequence can be performed.

The verification test is performed together with protection and trip functions. Figure 44
illustrates a suggested testing arrangement, where the circuit-breaker (CB) is simulated by an

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Testing functionality by secondary injection

external bi-stable relay (BR), for example a relay type RXMVB2 or RXMD or Breaker Simulator of
ABB. The following manual switches are used:

• Switch or push-button to close (SC)

• Switch or push-button to trip (ST)
• Switch for CB ready condition (SRY)

If no bi-stable relay or breaker simulator is available, replace it with two self-reset auxiliary
relays and use a self-holding connection.

Use a secondary injection IED test set to operate the protection function. The test set shall be
switched off when a trip signal is given or when the BR comes to open position to simulate real
conditions.

The CB simulation can be made more elaborate, including simulation of the operating gear
condition, CBREADY of either the type ready for a Close-Open (CO) cycle, or the type ready for
an Open-Close -Open (OCO) cycle.

The CB condition CBREADY of a type, CO, shall be high (true) until a closing operation is
performed. It then goes low (false) for a recharging time of about 5 - 10s. After that it is high
again.

A CB condition CBREADY of a type, OCO shall be high (true) before and during tripping (Start
reclosing). During tripping it goes low for a recharging time, for example, 10s. It may thus be
low at the instant of reclosing. After each Open or Close operation it may need a recharging
period before it goes high again.

In the example of CB simulation arrangement, the CBREADY condition is simulated by a

manual switch, SRY.

Information and material for the verification:

• Protection or control unit, IED, configured and with settings entered.

• Configuration diagram for the IED
• Terminal diagram for the IED, or plant circuit diagram including the IED
• Technical reference manual for the IED
• IED test set for secondary injection
• Means to indicate, measure and record operation and times, for example an event
recording facility
• A bi-stable relay (BR) or two auxiliary relays to simulate a CB
• Two push-buttons (SC, ST) to operate the BR and a change-over switch (SRY) to simulate
CBREADY
• Possibly a switch simulation the synchronizing check SESRSYN condition

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IED

CLOSE CB

BR

SC
Trip

ST

CB POS

SRY
CB READY

To test
set

+ -
IEC04000202-1-
en.vsd
IEC04000202 V2 EN-US

Figure 44: Simulating the CB operation by a bi-stable relay/breaker simulator and

manual switches

10.10.2.1 Preparation of the verification M12400-40 v7

1. Check the function settings on the local HMI under Main menu/Settings/Setting group
N/Control/Autorecloser79,5(0–>1)/SMBRREC:x
If any timer settings are reduced to speed up or facilitate the testing, they shall be set to
normal after testing. A temporary label on the IED can be a reminder to restore normal
settings after which a verification test should be performed.
2. Decide if a synchronizing check function SESRSYN shall be included in the test.
If SESRSYN as an internal function or external device is not operated by the injection,
input signal SYNC must be connected as a permanent high signal or controlled by a
switch.
3. Read and make notes of the reclosing operation counters on the local HMI under Main
menu/Test/Function status/Control/AutoRecloser79,5(0–>1)/SMBRREC:x
Possibly reset the counters to Zero. Counters are reset in the reset menu.
4. Make arrangements for the simulation of the CB, for example as in figure 44.
5. Make arrangements for indication, recording and time measurements.
The signals for CBPOS, START, CLOSECB, READY and other relevant signals should
preferably be arranged for event recording with time tagging. If that is not possible,
other means of time measurement and recording should be arranged.

10.10.2.2 Switching the autorecloser for 1/2/3-phase operation function to On and

Off M12400-79 v8

1. Set the Operation setting to Off and check the state.

2. Set the Operation setting to On and check the state, including SETON and READY.

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The CB should be closed and ready.

3. If external control inputs OFF/ON are used, check that they work. Set ExternalCtrl = On
and use the control inputs to switch On and Off, and check the state of the function.

10.10.2.3 Verifying the autorecloser function SMBRREC M12400-91 v11

Select the test cases to be run according to what is applicable to the particular application. It
can be, for example,

• three-phase single-shot reclosing

• two-shot reclosing
• single-phase and three-phase single-shot reclosing

Below, a case with single-phase and three-phase single-shot reclosing is described.

1. Set Operation = On.

2. If the synchronizing check SESRSYN is not to be operated, ensure that the signal SYNC
input is activated. If SESRSYN is to be included, ensure that it is supplied with the
appropriate AC quantities.
3. Simulate CB closed position by closing switch SC to make the BR relay start.
4. Simulate CBREADY by closing the switch SRY, and leave it closed.
5. Inject AC quantities to give a trip, for example, a one-phase trip, to the BR and to the
START input.
Observe and preferably record the operation. The BR relay shall trip and reclose (start).
After reclosing, the SRY switch can be opened for about 5s and then closed again.
The autoreclosing open time and the sequence should be checked, for example in the
event recording. Check also the operation indications (disturbance report) and the
operation counters on the local HMI under Main menu/Test/Function status/Control/
AutoRecloser79,5(0–>1)/SMBRREC:x
Should the operation not be as expected, this should be investigated. It could be caused
by an inappropriate setting or missing condition such as CBREADY.
6. Repeat the sequence by simulating a permanent fault.
Shortly after the reclosing shot, a new fault is applied. If a single-shot reclosing program
is selected, there shall be one reclosing operation and then blocking of SMBRREC for the
set Reclaim time.
Before a new reclosing sequence can be run, the CBREADY and CBPOS (CB closed) must
be set manually.
7. Repeat the sequence by simulating a three-phase transient and permanent faults, and
other applicable cases, such as signal to STARTHS and high-speed reclosing.
If just single-phase reclosing is selected, FirstShot = 1ph, a check can be run to make sure
that a three-phase trip does not result in any reclosing. Other similar cases can be
checked as required.

10.10.2.4 Checking the reclosing conditions M12400-123 v4

When checking the influence of a releasing condition it is suggested to first run a sequence
with the condition fulfilled. When the condition signal is removed, and a new sequence is run, it
indicates that the result was due to the changed condition. In case of a blocking signal the
procedure should be similar. Start without the blocking or inhibit signal, and then run a
sequence with the blocking or inhibit signal added.

Checking the influence of the INHIBIT signal M12400-129 v4

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1. Check that the autorecloser function SMBRREC is operative, for example, by making a
reclosing shot without the INHIBIT signal.
2. Apply a fault and thereby a START signal. At the same time, or during the open time,
apply a signal to the input INHIBIT.
3. Check that the reclosing sequence is interrupted and no reclosing takes place.

Check closing onto a fault M12400-137 v4

1. Check that the autorecloser function SMBRREC is operative, for example by making a
reclosing shot.
Keep the CBREADY signal high.
2. Set the breaker simulating relay BR in Open position.
3. Close the BR relay and apply immediately a fault and thereby a START signal.
4. Check that no reclosing takes place.

Checking the influence of CB not ready for reclosing M12400-149 v4

1. Check that the autorecloser function SMBRREC is operative, for example by making a
reclosing shot.
Keep the CB simulator BR closed. Remove the CBREADY signal by opening SRY.
2. Apply a fault and thereby a START signal.
3. Check that no reclosing takes place.

Checking the influence of synchronizing check (at three-phase reclosing) M12400-161 v9

1. Check that the autorecloser function SMBRREC is operative, for example, by making a
three-phase reclosing shot with the SESRSYN synchronizing check condition.
Set the SESRSYN function to Off to eliminate the signal connected to input signal SYNC.
2. Apply a fault causing three-phase trip and thereby a START and a TR3P signal.
3. Wait for the tSync time-out limit.
Check that no reclosing is made.

Checking the response when autoreclosing is Off M12400-173 v6

Procedure

1. Check that the autorecloser function SMBRREC is operative, for example by making a
reclosing shot.
Set the autoreclosing operation to Off, for example by external control.
The output READY shall be low, and PREP3P shall be high.
2. Apply a single phase fault and thereby a START signal.
3. Check that a definitive three phase trip and no reclosing takes place.

Testing autoreclosing in a multi-breaker arrangement M12400-185 v6

The usual arrangement is to have an autorecloser function SMBRREC per circuit-breaker. They
can be in different CB related IEDs or in a common IED.

• A master SMBRREC function is set with Priority = High.

• A slave SMBRREC function is set with Priority = Low.

See the application manual for an illustration of typical interconnections.

The two functions can be checked individually by carefully applying START, WAIT, and INHIBIT
signals.

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It is also possible to verify the two functions together by using CB simulating equipment for
two CB circuits. There should be interconnections from the master to the slave function,
WFMASTER - WAIT, and UNSUCCL - INHIBIT, as shown in the illustration referred to above.

Restoring equipment M12400-190 v5

After the tests, restore the equipment to normal or desired state. Check the following items in
particular:

1. Check the operation counters.

Reset the counters to zero, if that is the user's preference. The counter reset function is
found on the local HMI under Main menu/Reset/Reset counters/AutoRecloser79,5(0–
>1)/SMBRREC:x
2. Restore settings that may have been modified for the tests back to normal.
3. Disconnect the test switch, CB simulating arrangement and test circuits.
Reconnect any links or connection terminals, which may have been opened for the tests.
4. Reset indications, alarms and disturbance recordings.
Clearing of the disturbance report can be done via the Disturbance Handling in PCM600
or the local HMI.

10.10.2.5 Completing the test M12400-218 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.10.3 Apparatus control APC M13385-2 v4

The apparatus control function consists of four types of function blocks, which are connected
in a delivery-specific way between bays and to the station level. For that reason, test the total
function in a system, that is, either in a complete delivery system as an acceptance test (FAT/
SAT) or as parts of that system.

If a block/unblock command is sent from remote to function, while the IED is

shut down, this command will not be recognized after the start up, thus the
command that was sent prior to the shut down is used. In such cases, where
there is a mismatch, the user is advised to make a complete cycle of block/
unblock operations to align the statuses.

10.10.4 Single command, 16 signals SINGLECMD SEMOD172444-5 v3

For the single command function block, it is necessary to configure the output signal to
corresponding binary output of the IED. The operation of the single command function
(SINGLECMD) is then checked from the local HMI by applying the commands with Mode = Off,
Steady or Pulse, and by observing the logic statuses of the corresponding binary output.
Command control functions included in the operation of different built-in functions must be
tested at the same time as their corresponding functions.

10.10.5 Interlocking M11755-2 v8

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

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Values of the logical signals are available on the local HMI under Main menu/Tests/Function
status/Control/Apparatus control/Interlocking. The Signal Monitoring in PCM600 shows the
same signals that are available on the local HMI.

The interlocking function consists of a bay-level part and a station-level part. The interlocking
is delivery specific and is realized by bay-to-bay communication over the station bus. For that
reason, test the function in a system, that is, either in a complete delivery system as an
acceptance test (FAT/SAT) or as parts of that system.

10.11 Scheme communication SEMOD53569-1 v1

10.11.1 Scheme communication logic for distance or overcurrent

protection ZCPSCH M13868-2 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Check the scheme logic during the secondary injection test of the impedance or overcurrent
protection functions.

Activation of the different zones verifies that the CS signal is issued from the intended zones.
The CS signal from the independent tripping zone must have a tSendMin minimum time.

Check the tripping function by activating the CR and CRG inputs with the overreaching zone
used to achieve the CACC signal.

It is sufficient to activate the zones with only one type of fault with the secondary injection.

10.11.1.1 Testing permissive underreaching M13868-10 v4

1. Activate the receive (CR) signal in the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the permissive zone.
4. Check that correct trip outputs, external signals, and indications are obtained for the
actual type of fault generated.
5. Check that other zones operate according to their zone timers and that the send (CS)
signal is obtained only for the zone configured to generate the actual signal.
6. Deactivate the receive (CR) signal in the IED.
7. Check that the trip time complies with the zone timers and that correct trip outputs,
external signals, and indications are obtained for the actual type of fault generated.

10.11.1.2 Testing permissive overreaching M13868-28 v4

1. Activate the receive (CR) signal in the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the permissive zone.
4. Check that correct trip outputs, external signals, and indication are obtained for the
actual type of fault generated.
5. Check that the other zones operate according to their zone timer and that the send (CS)
signal is obtained only for the zones that are configured to give the actual signal. Also the
zone connected to CS underreach is giving CS in this mode.
6. Deactivate the IED receive (CR) signal.

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7. Apply healthy normal load conditions to the IED for at least two seconds.
8. Apply a fault condition within the permissive zone.
9. Check that trip time complies with the zone timers and that correct trip outputs, external
signals, and indications are obtained for the actual type of fault generated.

10.11.1.3 Testing blocking scheme M13868-50 v5

1. Deactivate the receive (CR) signal of the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the forward directed zone used for scheme communication
tripping.
4. Check that correct trip outputs and external signals are obtained for the type of fault
generated and that the operate time complies with the tCoord timer (plus relay
measuring time).
5. Check that the other zones operate according to their zone times and that a send (CS)
signal is only obtained for the reverse zone.
6. Activate the IED receive (CR) signal.
7. Apply a fault condition in the forward directed zone used for scheme communication
tripping.
8. Check that the no trip from scheme communication occurs.
9. Check that the trip time from the forward directed zone used for scheme communication
tripping complies with the zone timer and that correct trip outputs, external signals, and
indications are obtained for the actual type of fault generated.

10.11.1.4 Testing delta blocking scheme GUID-D5FF46AF-0C5A-4AD4-8F2C-09EC17B681F1 v2

1. Deactivate the receive (CR) signal of the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the forward directed zone used for scheme communication
tripping.
4. Check that correct trip outputs and external signals are obtained for the type of fault
generated and that the operate time complies with the tCoord timer (plus relay
measuring time).
5. Check that the other zones operate according to their zone times and that a send (CS)
signal is only obtained for the reverse zone.
6. Check that for a forward fault, carrier send (CS) signal is first obtained from the delta
based fault inception detection (as it is not directional) , and immediately inhibited by
the forward zone.
7. Activate the IED receive (CR) signal.
8. Apply a fault condition in the forward directed zone used for scheme communication
tripping.
9. Check that the no trip from scheme communication occurs.
10. Check that the trip time from the forward directed zone used for scheme communication
tripping complies with the zone timer and that correct trip outputs, external signals, and
indications are obtained for the actual type of fault generated.

10.11.1.5 Checking of unblocking logic M13868-72 v4

Check the unblocking function (if the function is required) when checking the communication
scheme.

Command function with continuous unblocking (Unblock = 1) M13868-76 v6

Procedure

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1. Activate the guard input signal (CRG) of the IED.

2. Using the scheme selected, check that a signal accelerated trip (TRIP) is obtained when
the guard signal is deactivated.

10.11.1.6 Completing the test M13868-84 v6

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.2 Phase segregated scheme communication logic for distance or

overcurrent protection ZC1PPSCH GUID-33B76F26-DEEF-46C3-A66F-A8713B50E413 v1

Prepare the IED for verification of settings outlined in section "Requirements" and section
"Preparing for test" in this chapter.

Check the scheme logic during the secondary injection test of the impedance protection
functions.

Activating of the different zones and phases verifies that the CSLx signal are issued from the
intended zones. The CSLx signal from the independent tripping zone must have a tSendMin
minimum time.

Check the tripping function by activating the CRLx inputs with the overreaching zone used to
achieve the CACCLx signals.

It is sufficient to activate the zones with all types of fault with the secondary injection.

10.11.2.1 Testing permissive underreaching GUID-F8C6F099-5C88-466A-8C00-7211981B03B9 v1

1. Activate the receive (CRLx) signal in the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the permissive zone.
4. Check that correct trip outputs, external signals, and indications are obtained for all the
actual types of fault generated.
5. Check that other zones operate according to their zone timers and that the send (CSLx)
signal is obtained only for the zone and phase configured to generate the actual signal.
6. Deactivate the receive (CRLx) signal in the IED.
7. Check that the trip time complies with the zone timers and that correct trip outputs,
external signals, and indications are obtained for the actual type of fault generated.

10.11.2.2 Testing permissive overreaching GUID-379F42E5-ABA9-4C43-9EE8-B0A5609371C8 v1

1. Activate the receive (CRLx) signal in the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the permissive zone.
4. Check that correct trip outputs, external signals, and indication are obtained for the all
actual types of fault generated.
5. Check that the other zones operate according to their zone timer and that the send
(CSLx) signal is obtained only for the zones and phases that are configured to give the
actual signal. Also the zone connected to CSLx underreach is giving CSLx in this mode.
6. Deactivate the IED receive (CRLx) signal.

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7. Apply healthy normal load conditions to the IED for at least two seconds.
8. Apply a fault condition within the permissive zone.
9. Check that trip time complies with the zone timers and that correct trip outputs, external
signals, and indications are obtained for the actual type of fault generated.

10.11.2.3 Testing blocking scheme GUID-4FAA2F15-BB34-456D-A7F2-E79245371CBD v1

1. Deactivate the receive (CRLx) signal of the IED.

2. Apply healthy normal load conditions to the IED for at least two seconds.
3. Apply a fault condition within the forward directed zone used for scheme communication
tripping.
4. Check that correct trip outputs and external signals are obtained for the type of fault
generated and that the operate time complies with the tCoord timer (plus relay
measuring time).
5. Check that the other zones operate according to their zone times and that a send (CSLx)
signal is only obtained for the reverse zone.
6. Activate the IED receive (CRLx) signal.
7. Apply a fault condition in the forward directed zone used for scheme communication
tripping.
8. Check that the no trip from scheme communication occurs.
9. Check that the trip time from the forward directed zone used for scheme communication
tripping complies with the zone timer and that correct trip outputs, external signals, and
indications are obtained for the actual type of fault generated.

10.11.2.4 Completing the test M13868-84 v6

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.3 Current reversal and Weak-end infeed logic for distance

protection 3-phase ZCRWPSCH M14947-2 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Values of the logical signals for ZCRWPSCH are available on the local HMI under Main menu/
Tests/Function status / Scheme communication / ZCRWPSCH(85) /ZCRWPSCH:1.

The Signal Monitoring in PCM600 shows signals that are available on the Local HMI.

The current reversal logic and the weak-end infeed functions are tested during the secondary-
injection test of the impedance or overcurrent protection zones together with the scheme
communication logic for the distance protection function ZCPSCH.

10.11.3.1 Current reversal logic M14947-8 v3

It is possible to check the delay of the CS send signal with tDelayRev by changing from a
reverse to a forward fault.

By continuously activating the CR input and changing from a reverse to a forward fault, the
delay tDelayRev can be checked.

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Checking of current reversal M14947-13 v8

The reverse zone timer must not operate before the forward zone fault is
applied. The user might need to block the reverse zone timer setting during
testing of current reversal.

The forward zone timer must be set longer than the tDelayRev set value.

1. Activate the receive (CRL) signal.

2. Set the healthy condition to an impedance at 50% of the reach of the reverse zone
connected to IRV.
3. After the start condition is obtained for reverse zone, apply a fault at 50% of the reach of
the forward zone connected to WEIBLK2.
4. Check that correct trip outputs and external signals are obtained for the type of fault
generated. The operation time should be about the tDelayRev setting longer than the
carrier accelerated trip (TRIP) recorded for the permissive overreach scheme
communication.
5. Restore the forward and reverse zone timer to its original setting.

10.11.3.2 Weak end infeed logic M14947-37 v2

Weak-end infeed logic at permissive overreach schemes M14947-39 v5

1. Check the blocking of the echo with the injection of a CRL signal >40ms after a reverse
fault is applied.
2. Measure the duration of the echoed CS signal by applying a CRL receive signal.
3. Check the trip functions and the voltage level for trip by reducing a phase voltage and
applying a CRL receive signal.

Testing conditions M14947-52 v7

Only one type of fault is sufficient, with the current reversal and weak-end infeed logic for
distance protection function ZCRWPSCH. Apply three faults (one in each phase). For phase L1-
N fault, set these parameters:

Table 34: Phase L1-N parameter values

Phase I (Amps) Phase-angle V (Volts) Phase-angle
(Deg) (Deg)
L1 0 0 Set less than UPN< 0
L2 0 240 63 240
L3 0 120 63 120

If wanted, change all settings cyclically for other faults (L2-N and L3-N).

The setting parameter WEI is set to Echo & Trip.

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1. Apply input signals according Table 34.

2. Activate the receive (CR) signal.
3. After the IED has operated, turn off the input signals.
4. Check that trip, send signal, and indication are obtained.

The ECHO output gives only a 200 ms pulse.

10.11.3.3 Completing the test M14947-105 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.4 Local acceleration logic ZCLCPSCH M11758-32 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The logic is checked during the secondary injection test of the impedance measuring zones.

10.11.4.1 Verifying the settings M11758-37 v4

1. Provide the IED with conditions equivalent to normal load for at least two seconds.
2. Deactivate the conditions for accelerated function.
3. Apply a phase-to-earth fault at 100% of line impedance.
4. Check that the fault is tripped with the second zone time delay.
5. Provide the IED with conditions equivalent to normal load for at least two seconds.
6. Activate the condition for accelerated function either by the autorecloser or by the loss-
of-load.
7. Apply a phase-to-earth fault at 100% of line impedance.
8. Check that the fault is tripped instantaneously.

10.11.4.2 Completing the test M11758-57 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.5 Scheme communication logic for residual overcurrent

protection ECPSCH M13926-2 v5

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

Before testing the communication logic for residual overcurrent protection function ECPSCH,
the four step residual overcurrent protection function EF4PTOC has to be tested according to
the corresponding instruction. Once this is done, continue with the instructions below.

If the current reversal and weak-end infeed logic for earth-fault protection is included, proceed
with the testing according to the corresponding instruction after the testing the

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communication logic for residual overcurrent protection. The current reversal and weak-end-
infeed functions shall be tested together with the permissive scheme.

10.11.5.1 Testing the directional comparison logic function M13926-7 v2

Blocking scheme M13926-9 v5

1. Inject the polarizing voltage 3U0 at 5% of UBase (EF4PTOC) where the current is lagging
the voltage by 65°.
2. Inject current (65° lagging the voltage) in one phase at about 110% of the set operating
current, and switch the current off with the switch.
3. Switch the fault current on and measure the operating time of the communication logic.
Use the TRIP signal from the configured binary output to stop the timer.
4. Compare the measured time with the set value tCoord.
5. Activate the CR binary input.
6. Check that the CRL output is activated when the CR input is activated.
7. Switch the fault current on (110% of the set operating current) and wait longer than the
set value tCoord.

No TRIP signal should appear.

8. Switch the fault current off.

9. Reset the CR binary input.
10. Activate the BLOCK digital input.
11. Switch the fault current on (110% of the set operating current) and wait for a period
longer than the set value tCoord.

No TRIP signal should appear.

12. Switch the fault current and the polarizing voltage off.
13. Reset the BLOCK digital input.

Permissive scheme M13926-42 v7

1. Inject the polarizing voltage 3U0, which is 5% of UBase (EF4PTOC) where the current is
lagging the voltage by 65°.
2. Inject current (65° lagging the voltage) into one phase at about 110% of the set operating
current, and switch the current off with the switch.
3. Switch the fault current on, (110% of the set operating current) and wait longer than the
set value tCoord.

No TRIP signal should appear, and the CS binary output should be

activated.

4. Switch the fault current off.

5. Activate the CR binary input.
6. Switch the fault current on (110% of the set operating current) and measure the
operating time of the ECPSCH logic.
Use the TRIP signal from the configured binary output to stop the timer.
7. Compare the measured time with the setting for tCoord.
8. Activate the BLOCK digital input.

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9. Switch the fault current on (110% of the set operating current) and wait for a period
longer than the set value tCoord.

No TRIP signal should appear.

10. Switch the fault current and the polarizing voltage off.
11. Reset the CR binary input and the BLOCK digital input.

10.11.5.2 Completing the test M13926-71 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.6 Current reversal and weak-end infeed logic for residual

overcurrent protection ECRWPSCH M13936-2 v7

Prepare the IED for verification of settings as outlined in the section

"Requirements" and section "Preparing for test" in this chapter.

Values of the logical signals for ECRWPSCH are available on the Local HMI under Main menu/
Tests/Function status/Scheme communication/ECRWPSCH(85)/ECRWPSCH:1.

The Signal Monitoring in PCM600 shows service values that are available on the Local HMI as
well.

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

First, test the four step residual overcurrent protection function EF4PTOC and then the
current reversal and weak-end infeed logic according to the corresponding instructions. Then
continue with the instructions below.

10.11.6.1 Testing the current reversal logic M13936-9 v7

1. Inject the polarizing voltage 3U0 to 5% of UBase and the phase angle between voltage
and current to 155°, the current leads the voltage.
2. Inject current (180° — AngleRCA) in one phase to about 110% of the set operating current
of the four step residual overcurrent protection (IN>Dir).
3. Check that the IRVL output is activated in the disturbance recorder after the set time
tPickUpRev.
4. Abruptly reverse the current to AngleRCA setting lagging the voltage, to operate the
forward directional element.
5. Check that the IRVL output still is activated after the reversal with a time delay that
complies with the setting tDelayRev.
6. Switch off the polarizing voltage and the current.

10.11.6.2 Testing the weak-end infeed logic M13936-25 v2

If setting WEI = Echo M13936-27 v8

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1. Inject the polarizing voltage 3U0 to (180° — AngleRCA) of UBase and the phase angle
between voltage and current to 155°, the current leads the voltage.
2. Inject current (180° — AngleRCA) in one phase to about 110% of the setting operating
current (IN>Dir).
3. Activate the CRL binary input.

No ECHO and CS should appear.

4. Abruptly reverse the current to the setting of AngleRCA setup lagging the voltage, to
operate the forward directional element.

No ECHO and CS should appear.

5. Switch off the current and check that the ECHO and CS appear on the corresponding
binary output during 200ms after resetting the directional element.
6. Switch off the CRL binary input.
7. Activate the BLOCK binary input.
8. Activate the CRL binary input.

No ECHO and CS should appear.

9. Switch off the polarizing voltage and reset the BLOCK and CRL binary input.

If setting WEI = Echo & Trip M13936-52 v11

1. Inject the polarizing voltage 3U0 to about 90% of the setting (3U0>) operating voltage.
2. Activate the CRL binary input.

No ECHO, CS and TRWEI outputs should appear.

3. Increase the injected voltage to about 110% of the setting (3U0) operating voltage.
4. Activate the CRL binary input.
5. Check that the ECHO, CS and TRWEI appear on the corresponding binary output or on the
local HMI.
6. Reset the CRL binary input.
7. Activate the BLOCK binary input.
8. Activate the CRL binary input.

No ECHO, CS and TRWEI outputs should appear.

9. Reset the CRL and BLOCK binary input.

10. Inject the polarizing voltage 3U0 to about 110% of the setting (3U0>) and adjust the
phase angle between the voltage and current to (180°- AnglRCA) setting, the current
leads the voltage.
11. Inject current in one phase to about 110% of the set operate current (IN>Dir ).
12. Activate the CRL binary input.

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No ECHO and TRWEI should appear.

13. Abruptly reverse the current to 65° lagging the voltage to operate the forward directional
element.

No ECHO and TRWEI should appear.

14. Switch the current off and check that the ECHO, CS and TRWEI appear on the
corresponding binary output during 200ms after resetting the directional element. If
EF4PTOC also operates in forward direction, CS should be obtained.
15. Switch the polarizing voltage off and reset the CRL binary input.

10.11.6.3 Completing the test M13936-90 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7 Direct transfer trip logic GUID-F6AE5927-D93F-4CAD-A6C6-445720C806D8 v1

10.11.7.1 Low active power and power factor local criteria LAPPGAPC GUID-5F73C74C-3BA1-4DF0-8D04-CE1416AF727D v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Connect the test set for three-phase current injection and three-phase voltage to the
appropriate IED terminals.
2. Inject symmetrical phase voltages equal to the rated voltage.
3. Decrease the injected current in phase L1 and note the operated value (start value) of the
studied step of the function. This current shall have the same phase angle as the injected

P =U ×I
phase voltage. The active power for operation is calculated as: ph ph
(single-
phase active power).
4. Increase the current slowly and note the reset value.
5. Connect a trip output contact to a timer.
6. Set the injected current to 50% of the operate level in the tested stage. Switch on the
current and check the time delay.
7. Check that all trip and start contacts operate according to the configuration (signal
matrices).
8. Finally check that start and trip information is stored in the event memory. Repeat steps
3 – 6 for phases L2 and L3.
9. Inject symmetrical phase voltages and phase currents in all three phases, equal to SBase
(rated voltage and current).
10. Increase the phase angle between the injected phase voltages and phase current, and

note the operate value φ. The corresponding power factor is equal to pf = cos j .
11. Decrease the phase angle and note the reset value.

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12. Set the phase angle of the injected current slightly higher than the operate value. Switch
on the current and check the time delay.
13. Check that all trip and start contacts operate according to the configuration (signal
matrices).
14. Finally check that start and trip information is stored in the event memory.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7.2 Compensated over- and undervoltage protection COUVGAPC GUID-ED8BE791-A0E7-45E0-AEA7-045CD7497D64 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Set OperationOV to On.

2. Connect the test set for three-phase current injection and three-phase voltage to the
appropriate IED terminals.
3. Inject symmetrical phase voltages equal to the rated voltage.
4. Decrease the injected voltage in phase L1 and note the operated value (start value) of the
function.
5. Increase the voltage slowly and note the reset value.
6. Connect a trip output contact to a timer.
7. Reduce the injected voltage stepwise to 90% of the operate level, and check the time
delay.
8. Check that all trip and start contacts operate according to the configuration (signal
matrices).
9. Finally, check that start and trip information is stored in the event menu. Repeat steps 4 –
9 for phases L2 and L3.
If voltage compensation will be used, do the following steps:
10. Set EnShuntReactor to On and activate input signal SWIPOS.
11. Check that the line impedance (R1 and X1) and reactor impedance (Xc) are set to the
correct values.
12. Inject symmetrical phase voltages equal to the rated voltage.
13. Increase the injected current (same phase angle as the injected voltage) in phase L1 from
zero and note the operated value (start value) of the function. Check that this value is

æ U injected U injected ö
U = U injected - ç I injected - j + j ÷ × ( RL + jX L )
equal to: è xy
X cp
X ø
14. Repeat step 13 for phases L2 and L3.
15. Set OperationOV to On.
16. Connect the test set for three-phase current injection and three-phase voltage to the
appropriate IED terminals.
17. Inject symmetrical phase voltages equal to the rated voltage.
18. Increase the injected voltage in phase L1 and note the operated value (start value) of the
function.
19. Decrease the voltage slowly and note the reset value.
20. Connect a trip output contact to a timer.
21. Increase stepwise the injected voltage to 110% of the operate level, and check the time
delay.
22. Check that all trip and start contacts operate according to the configuration (signal
matrices).
23. Finally check that start and trip information is stored in the event memory. Repeat steps
17 – 22 for phases L2 and L3.
If voltage compensation will be used do the following steps:
24. Set EnShuntReactorto On and activate input signal SWIPOS.

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25. Check that the line impedance (R1 and X1) and reactor impedance (Xc) are set to the
correct values.
26. Inject symmetrical phase voltages equal to 120% of the rated voltage.
27. Increase the injected current (same phase angle as the injected voltage) in phase L1 from
zero and note the operated value (start value) of the function. Check that this value is

æ U injected U injected ö
U = U injected - ç I injected - j + j ÷ × ( RL + jX L )
equal to: è X xy X cp ø
Completing the test
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7.3 Sudden change in current variation SCCVPTOC GUID-5494DF56-449D-49BE-B75D-9C667E890E16 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Set Operation to On.

2. Connect the test set for three-phase current injection to the appropriate IED terminals.
3. Inject symmetrical phase currents equal to half the rated current.
4. Increase the injected current in phase L1 slowly by more than the set I>. No signal shall be
activated.
5. Decrease the injected current in phase L1 to half the rated current.
6. Increase the injected current in phase L1 in a step by more than the set I>. Start and trip
signal shall be activated.

10.11.7.4 Carrier receive logic LCCRPTRC GUID-16B24935-A9F4-427C-9B8D-71B25DE000E2 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Set Operation to On.

2. Select OpMode according to the application: If two carrier channels are used and high
security shall be used set OpMode = 2 Out Of 2, otherwise 1 Out Of 2.
3. Connect switchable binary signal/s CR1 and CR2 to the binary input/s to be used for the
carrier receive (CR) signal/s.
4. Connect switchable binary signal/s to the binary input to be used for the local check
signal. If three pole trip is used only one LOCTR is used. If single pole trip is used in
addition the phase selective signals LOCTRL1, LOCTRL2and LOCTRL3 are connected.
5. Connect switchable binary signal/s to the binary input to be used for the communication
supervision signal/s CHERR1 and CHERR2.
If OpMode = 2 Out Of 2:
6. Activate input and check output signals according to table 35 and 36.

Table 35: Activate input signals if OpMode = 2 Out Of 2

INPut
CR1 X X X X X X
CHERR1 X
CR2 X X X X X
CHERR2 X
Table continues on next page

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INPut
LOCTR X X X
LOCTRL1 X
LOCTRL2 X
LOCTRL3 X

Table 36: Activate output signals if OpMode = 2 Out Of 2

OUTPut
Non X X
TRIP X X X X X
TRL1 X
TRL2 X
TRL3 X
7. Connect the trip output to a timer.
8. Have inputs CR1and CR2 activated. Start the timer from activation of input LOCTR and
stop the timer from TRIP output.
9. Check the trip time.
If OpMode = 1 Out Of 2:
10. Activate input and check output signals according to table 37 and 38.

Table 37: Activate input signals if OpMode = 1 Out Of 2

INPut
CR1 X X X X X
CHERR1 X
CR2 X X X X X X
CHERR2
LOCTR X X X
LOCTRL1 X X
LOCTRL2 X X
LOCTRL3 X X

Table 38: Activate output signals if OpMode = 1 Out Of 2

OUTPut
Non X
TRIP X X X X X X X X X
TRL1 X X
TRL2 X X
TRL3 X X
11. Connect the trip output to a timer.
12. Have inputs CR1 and CR2 activated. Start the timer from activation from activation of
input LOCTR and stop the timer from TRIP output.
13. Check the trip time.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

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Testing functionality by secondary injection

10.11.7.5 Negative sequence overvoltage protection LCNSPTOV GUID-BEF622E8-E133-4346-98D4-EC0732878937 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

UL1 UL1

UL2 UL2

UL3 UL3

IED
IED TEST SET

IEC10000014-1-en.vsd
IEC10000014 V1 EN-US

Figure 45: Connection of test equipment

1. Connect the test set for three-phase voltage injection to the appropriate IED terminals as
shown in Figure 45
2. Increase the injected voltage and note the operated value (start value) of the studied
step of the function.
3. Decrease the voltage slowly and note the reset value.
4. Connect a trip output contact to a timer.
5. Set the injected voltage to 110% of the operate level of the tested stage. Switch on the
current and check the time delay.
6. Check that all trip and start contacts operate according to the configuration (signal
matrices).
7. Finally check that start and trip information is stored in the event memory.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7.6 Zero sequence overvoltage protection LCZSPTOV GUID-6289688A-6F66-4173-9F49-A67D3E311513 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Connect the test set for three-phase voltage injection (L1, L2, L3) or residual voltage
injection (N) to the appropriate IED terminals. This depends on how the IED is fed from
the VT.
2. Increase the injected zero sequence voltage and note the operated value (start value) of
the studied step of the function.
3. Decrease the voltage slowly and note the reset value.
4. Connect a trip output contact to a timer.

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5. Set the injected voltage to 110% of the operate level in the tested stage, switch on the
current and check the time delay.
6. Check that all trip and start contacts operate according to the configuration (signal
matrices).
7. Finally check that start and trip information is stored in the event memory.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7.7 Negative sequence overcurrent protection LCNSPTOC GUID-46AA65BF-07F0-4E2B-B00F-D3B2057093DB v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

IL 1 IL 1

IL 2
IL 2

IL 3
IL 3

IED
IED TEST SET

IEC10000013-1-en.vsd
IEC10000013 V1 EN-US

Figure 46: Connection of test equipment to the IED

1. Connect the test set for three-phase current injection to the appropriate IED terminals as
shown in Figure 46
2. Increase the injected current and note the operated value (start value) of the studied step
of the function.
3. Decrease the current slowly and note the reset value.
4. Connect a trip output contact to a timer.
5. Set the injected current to 200% of the operate level of the tested stage. Switch on the
current and check the time delay.
6. Check that all trip and start contacts operate according to the configuration (signal
matrices).
7. Finally check that start and trip information is stored in the event memory.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

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Testing functionality by secondary injection

10.11.7.8 Zero sequence overcurrent protection LCZSPTOC GUID-DF48CC20-7275-4543-84D1-0856A946520A v2

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Connect the test set for three-phase voltage injection (L1, L2, L3or residual voltage
injection (N) to the appropriate IED terminals. This is dependent on how the IED is fed
from the CT.
2. Increase the injected zero-sequence current and note the operated value (start value) of
the studied step of the function.
3. Decrease the current slowly and note the reset value.
4. Connect a trip output contact to a timer.
5. Set the injected current to 200% of the operate level of the tested stage. Switch on the
current and check the time delay.
6. Check that all trip and start contacts operate according to the configuration (signal
matrices).
7. Finally check that start and trip information is stored in the event memory.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7.9 Three phase overcurrent LCP3PTOC GUID-3F003AB6-4B2F-4C70-AE84-B04E98A067DE v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Connect the test set for three-phase current injection to the appropriate IED terminals.
2. Increase the injected current in phase L1 and note the operated value (start value) of the
studied step of the function.
3. Decrease the current slowly and note the reset value.
4. Connect a trip output contact to a timer.
5. Set the injected current to 200% of the operate level of the tested stage. Switch on the
current and check the time delay.
6. Check that all trip and start contacts operate according to the configuration (signal
matrices).
7. Finally check that start and trip information is stored in the event memory.
8. Repeat steps 2 – 7 for phases L2 and L3.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.11.7.10 Three phase undercurrent LCP3PTUC GUID-8C3BA5FB-5878-4B87-BDF0-5DCDF72870B4 v1

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

1. Connect the test set for three-phase current injection to the appropriate IED terminals.
2. Inject a symmetrical three-phase current larger than the set value I<.
3. Decrease the injected current in phase L1 and note the operated value (start value) of the
studied step of the function.
4. Increase the current slowly and note the reset value.
5. Connect a trip output contact to a timer.

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6. Decrease the injected current step-wise to 50% of the operate level and check the time
delay.
7. Check that all trip and start contacts operate according to the configuration (signal
matrices).
8. Finally check that start and trip information is stored in the event memory.
9. Repeat steps 2 – 7 for phases L2 and L3.

Completing the test

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.12 Logic SEMOD53577-1 v1

10.12.1 Tripping logic, common 3-phase output SMPPTRC SEMOD54375-102 v8

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

This function is functionality tested together with other protection functions (line differential
protection,earth-fault overcurrent protection, and so on) within the IED. It is recommended
that the function is tested together with the autorecloser function, when built into the IED or
when a separate external unit is used for reclosing purposes. The instances of SMPPTRC are
identical except for the name of the function block SMPPTRC. The testing is preferably done in
conjunction with the protection system and autoreclosing function.

10.12.1.1 Three-phase operating mode SEMOD54375-106 v8

1. Check that AutoLock and TripLockout are both set to Off.

2. Initiate a three-phase fault.
An adequate time interval between the faults should be considered, to overcome a
reclaim time caused by the possible activation of the Autorecloser function SMBRREC.
The function must issue a three-phase trip in all cases, when trip is initiated by any
protection or some other built-in or external function. The following functional output
signals must always appear simultaneously: TRIP, TRL1, TRL2, TRL3 and TR3P.

10.12.1.2 1ph/3ph operating mode SEMOD54375-116 v4

In addition to various other tests, the following tests should be performed. They depend on
the complete configuration of an IED:

Procedure

1. Make sure that TripLockout and AutoLock are both set to Off.
2. Initiate different single-phase-to-earth faults one at a time.
Single-phase tripping will only be allowed when an autoreclose attempt will follow. The
autorecloser function SMBRREC has the functionality such as the long trip time, CB ready
and so on, which can prevent a proper single-phase tripping and autoreclose. To by-pass
this problem the fault initiation should be with a test set and with the autoreclose in full
service with a test set connected to the distance protection function. Consider using an
adequate time interval between faults, to overcome a reclaim time of which is activated
by SMBRREC. Only a single-phase trip should occur for each separate fault and only one

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Testing functionality by secondary injection

of the trip outputs (TRLn) should be activated at a time. Functional outputs TRIP and
TR1P should be active during each fault. No other outputs should be active.
3. Initiate different phase-to-phase and three-phase faults.
Consider using an adequate time interval between faults, to overcome a reclaim time,
which is activated by SMBRREC. A three-phase trip should occur for each separate fault
and all of the trips. Functional outputs TRIP, all TRLn and TR3P should be active at each
fault.

No other outputs should be active.

4. Initiate a single phase-to-earth fault and switch it off immediately when the trip signal is
issued for the corresponding phase. Initiate the same fault once again within the reclaim
time of the used SMBRREC.
A single-phase fault shall be given at the first fault. A three-phase trip must be initiated
for the second fault. Check that the corresponding trip signals appear after both faults.
Functional outputs TRIP, TRLn and TR1P should be active during first fault. No other
outputs should be active. Functional outputs TRIP, all TRLn and TR3P should be active
during second fault.
5. Initiate a single phase-to-earth fault and switch it off immediately when the trip signal is
issued for the corresponding phase. Initiate the second single phase-to-earth fault in one
of the remaining phases within the time interval, shorter than tEvolvingFault (default
setting 2.0s) and shorter than the dead-time of SMBRREC, when included in the
protection scheme.
Check that the second trip is a three-phase trip and that a three-phase autoreclosing
attempt is given after the three-phase dead time. Functional outputs TRIP, TRLn and
TR1P should be active during the first fault. No other outputs should be active. Functional
outputs TRIP, all TRLn and TR3P should be active during second fault.

10.12.1.3 1ph/2ph/3ph operating mode SEMOD54375-143 v4

In addition to other tests, the following tests, which depend on the complete configuration of
an IED, should be carried out.

Procedure

1. Make sure that AutoLock and TripLockout are both set to Off.
2. Initiate different single-phase-to-earth faults one at a time.
Take an adequate time interval between faults into consideration, to overcome a reclaim
time, which is activated by the autorecloser function SMBRREC. Only a single-phase trip
should occur for each separate fault and only one of the trip outputs (TRLn) should be
activated at a time. Functional outputs TRIP and TR1P should be active at each fault. No
other outputs should be active.
3. Initiate different phase-to-phase faults one at a time.
Take an adequate time interval between faults into consideration, to overcome a reclaim
time which is activated by SMBRREC. Only a two-phase trip should occur for each
separate fault and only corresponding two trip outputs (TRLn) should be activated at a
time. Functional outputs TRIP and TR2P should be active at each fault. No other outputs
should be active.
4. Initiate a three-phase fault.
Take an adequate time interval between faults into consideration, to overcome a reclaim
time, which may be activated by SMBRREC. Only a three-phase trip should occur for the
fault and all trip outputs (TRLn) should be activated at the same time. Functional outputs
TRIP and TR3P should be active at each fault. No other outputs should be active.
5. Initiate a single phase-to-earth fault and switch it off immediately when the trip signal is
issued for the corresponding phase. Initiate the same fault once again within the reclaim
time of the used SMBRREC.

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A single-phase fault shall be given at the first fault. A three-phase trip must be initiated
for the second fault. Check that the corresponding trip signals appear after both faults.
Functional outputs TRIP, TRLn and TR1P should be active during first fault. No other
outputs should be active. Functional outputs TRIP, all TRLn and TR3P should be active
during second fault.
6. Initiate a single phase-to-earth fault and switch it off immediately when the trip signal is
generated for the corresponding phase. Initiate the second single-phase-to-earth fault in
one of the remaining phases within the time interval, shorter than tEvolvingFault (default
setting 2.0s) and shorter than the dead-time of SMBRREC, when included in the
protection scheme.
Check that the second trip is a three-phase trip and that a three-phase autoreclosing
attempt is given after the three-phase dead time. Functional outputs TRIP, TRLn and
TR1P should be active during first fault. No other outputs should be active. Functional
outputs TRIP, all TRLn and TR3P should be active during second fault.
7. Initiate a phase-to-phase fault and switch it off immediately when the trip signal is
issued for the corresponding two phases. Initiate a second phase-to-phase fault between
two other phases within the time interval, shorter thantEvolvingFault (default setting
2.0s).
Check, that the output signals, issued for the first fault, correspond to a two- trip for
included phases. The output signals generated by the second fault must correspond to
the three-phase tripping action.

10.12.1.4 Circuit breaker lockout SEMOD54375-170 v10

The following tests should be carried out when the built-in lockout function is used in addition
to possible other tests, which depends on the complete configuration of an IED.

1. Check that AutoLock and TripLockout are both set to Off.

2. Activate shortly the set lockout (SETLKOUT) signal in the IED.
3. Check that the circuit breaker lockout (CLLKOUT) signal is set.
4. Activate shortly thereafter, the reset lockout (RSTLKOUT) signal in the IED.
5. Check that the circuit breaker lockout (CLLKOUT) signal is reset.
6. Initiate a three-phase fault.
A three-phase trip should occur and all trip outputs TRL1, TRL2, TRL3 should be activated.
Functional outputs TRIP and TR3P should be active at each fault. The output CLLKOUT
should not be set.
7. Activate the automatic lockout function, set AutoLock = On and repeat.
Besides the TRIP outputs, CLLKOUT should be set.
8. Reset the lockout signal by activating the reset lockout (RSTLKOUT) signal.
9. Activate the trip signal lockout function, set TripLockout = On and repeat.
All trip outputs (TRL1, TRL2, TRL3) and functional outputs TRIP and TR3P must be active
and stay active after each fault, CLLKOUT should be set.
10. Reset the lockout.
All functional outputs should reset.
11. Deactivate the TRIP signal lockout function, set TripLockout = Off and the automatic
lockout function, set AutoLock = Off.

10.12.1.5 Completing the test SEMOD54375-203 v6

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

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10.13 Monitoring SEMOD53581-1 v1

10.13.1 Gas medium supervision SSIMG GUID-0A83B4D5-51FF-43CB-8DC7-AFCEA2BC7B69 v1

Prepare the IED for verification of settings as outlined in section "Testing the liquid medium
supervision for alarm and lock out conditions" and section "Completing the test" in this
chapter.

Check that the input logical signal BLOCK is logical zero and that on the local HMI, the logical
signals PRES_ALM, PRES_LO, TEMP_ALM and TEMP_LO are equal to logical zero.

10.13.1.1 Testing the liquid medium supervision for alarm and lock out conditions GUID-768DAAC8-F89D-4401-B86D-9B26FD7224F6 v1

1. Connect binary inputs to consider gas pressure and gas density to initiate the alarms.
2. Consider the analogue pressure input PRESSURE to initiate the alarms.
3. Gas pressure lock out input can be used to set PRES_LO signal, check the signal status in
local HMI under Main menu/Test/Function status/Monitoring/Gas medium supervision
SSIMG/PRES_LO
4. Reduce the pressure level input below PresAlmLimit, check for PRES_ALM signal status in
local HMI under Main menu/Test/Function status/Monitoring/Gas medium supervision
SSIMG/PRES_ALM
5. Activate BLOCK binary input, the signals PRES_ALM, PRES_LO should disappear.
6. Reset the BLOCK binary input.
7. Check for reset lock out input RESET_LO to reset PRES_LO lock out signal.
8. Conduct these steps for temperature input as well to detect and reset TEMP_ALM and
TEMP_LO signals.
9. Continue to test another function or end the test by changing the TestMode setting to
off.

10.13.1.2 Completing the test GUID-DD08C598-A35C-4300-9555-A0877F7DC511 v1

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.13.2 Liquid medium supervision SSIML GUID-6426FDDA-B949-4FE7-BF42-B52014A9344B v1

Prepare the IED for verification of settings as outlined in section "Liquid medium supervision
SSIML" and section "Completing the test" in this chapter.

Check that the input logical signal BLOCK is logical zero and that on the local HMI, the logical
signals LVL_ALM, LVL_LO, TEMP_ALM and TEMP_LO are equal to logical zero.

10.13.2.1 Testing the liquid medium supervision for alarm and lock out conditions GUID-C1F1E6CA-9512-4358-A4E7-84CC3698D156 v1

1. Connect the binary inputs to consider liquid level to initiate the alarms.
2. Consider the analogue level input LEVEL to initiate the alarms.
3. Liquid level lock out input can be used to set LVL_LO signal, check the signal status in
local HMI under Main menu/Test/Function status/Monitoring/Liquid medium
supervision SSIML/LVL_LO
4. Reduce the liquid level input below LevelAlmLimit, check for LVL_ALM signal status in
local HMI under Main menu/Test/Function status/Monitoring/Liquid medium
supervision SSIML/LVL_ALM

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5. Activate BLOCK binary input, the signals LVL_ALM, LVL_LO should disappear.
6. Reset the BLOCK binary input.
7. Check for reset lock out input RESET_LO to reset the LVL_LO lock out signal.
8. Conduct these steps for temperature input as well to detect and reset TEMP_ALM and
TEMP_LO signals.
9. Continue to test another function or end the test by changing the TestMode setting to
Off.

10.13.2.2 Completing the test GUID-1A0D8AF0-4C48-45E8-B31D-96734ED1A4D2 v1

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.13.3 Breaker monitoring SSCBR GUID-10D26C82-79FF-4EAD-AE4A-2F2DBE965087 v2

Prepare the IED for verification of settings outlined in section “Testing the IED operation”.

The Signal Monitoring tool in PCM600 shows the service values that are available on the Local
HMI as well.

Values of the logical signals belong to the breaker monitoring are available on the local HMI
under: Main menu/Test/Function status/Monitoring/BreakerMonitoring/SSCBR:x

10.13.3.1 Verifying the settings GUID-962A344D-5F8D-49A6-B3AC-29C7FEED0A3D v4

1. Connect the test set for the injection of a three-phase current to the appropriate current
terminals of the IED.
2. If current need to be injected for a particular test, it should be done in the phase selected
by the PhSel parameter.
3. Follow the sequence for positioning the auxiliary contacts before testing:

POSCLOSE 0 1 0
POSOPEN 0 0 1
4. Test of CB contact travel time
4.1. Test the set timing defined by OpenTimeCorr, CloseTimeCorr, tTrOpenAlm and
tTrCloseAlm.
4.2. Change the status of the auxiliary contacts such that travel time to open TTRVOP
and travel time to close TTRVCL exceed the respective set values (tTrOpenAlm and
tTrCloseAlm). The measured travel time for opening and closing is shown on TTRVOP
and TTRVCL respectively.
4.3. Check that TRVTOPAL and TRVTCLAL are activated.
5. Test of CB status
5.1. Test the set current level defined by AccStopCurr.
5.2. Check the CLOSEPOS output by changing the POSOPEN to 0 and POSCLOSE to 1.
5.3. Check the OPENPOS output by changing the POSOPEN to 1 and POSCLOSE to 0 and
also inject the current in the selected phase slightly lower and higher than
AccStopCurr set value. Only for a current lower than set AccStopCurr should activate
the output POSOPEN.
5.4. Check the circuit breaker is in INVDPOS if auxiliary contacts read same value or CB is
open and inject the current in selected phase more than AccStopCurr set value.
6. Test of remaining life of CB

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6.1. Test the set timing defined byRatedOperCurr, RatedFltCurr, OperNoRated,

OperNoFault, DirCoef, CBLifeAlmLevel.
6.2. Vary the phase current in the selected phase from below rated operated current,
RatedOperCurr to above rated fault current, RatedFltCurr of a breaker.
6.3. The remaining life of CB output CBLIFEPH is estimated when the CB is changed from
closed to open position. Check that the output CBLIFEPH is decreased with a value
that corresponds to the injected current.
6.4. CBLIFEAL is activated as soon as CBLIFEPH is below the set CBLifeAlmLevel value.
7. Test of accumulated energy
7.1. Test the actual set values defined by AccSelCal to Aux Contact, ContTrCorr and
AlmAccCurrPwr.
7.2. Inject phase current in the selected phase such that its value is greater than set
AccStopCurr value.
7.3. When the breaker goes to open position, accumulated energy IPOWPH is calculated.
The calculated value can be seen on the output IPOWPH.
7.4. Alarm signal IPOWALPH appears when IPOWPH is greater than set AlmAccCurrPwr
value.
7.5. Lockout signal IPOWLOPH appears if IPOWPH exceeds further to the threshold value
LOAccCurrPwr.
7.6. Calculation of accumulated energy IPOWPH is stopped when injected current is lower
than set AccStopCurr value.
8. Test of CB operation cycles
8.1. Test the actual set values defined by OperAlmLevel and OperLOLevel.
8.2. The operation counter, NOOPER is updated for every close-open sequence of the
breaker by changing the position of auxiliary contacts POSCLOSE and POSOPEN.
8.3. OPERALM is activated when NOOPER value exceeds the set OperAlmLevel value. The
actual value can be read on the output NOOPER.
8.4. OPERLO is activated when NOOPER value exceeds the set OperLOLevel value.
9. Test of CB spring charge monitoring
9.1. Test the actual set value defined by SpChAlmTime.
9.2. Enable SPRCHRST input. Also activate SPRCHRD after a time greater than set time
SpChAlmTime.
9.3. At this condition, SPCHALM is activated.
10. Test of CB gas pressure indication
10.1. Test the actual set value defined bytDGasPresAlm and tDGasPresLO.
10.2. The output GPRESALM is activated after a time greater than set time of
tDGasPresAlm value if the input PRESALM is enabled.
10.3. The output GPRESLO is activated after a set time of tDGasPresLO value if the input
PRESLO is enabled.

10.13.3.2 Completing the test GUID-0A16206F-690E-46EF-86F4-5A89E0BF640B v3

1. Continue to test another function or end the test by changing the Test mode setting to
Off.
2. Restore connections and settings to their original values if they were changed for testing
purposes.

10.13.4 Event function EVENT M11751-2 v4

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

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During testing, the IED can be set when in test mode from PST. The functionality of the event
reporting during test mode is set in the Parameter Setting tool in PCM600.

• Use event masks

• Report no events
• Report all events

In test mode, individual event blocks can be blocked from PCM600.

10.13.5 Fault locator LMBRFLO M14955-2 v7

Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.

The Fault locator function LMBRFLO depends on other functions to work properly, that is,
phase selection information from distance protection function and analog information
supplied by the trip value recorder function. Check that proper binary start and phase
selection signals are connected and voltage and current signals are configured (parameter
settings).

The result is displayed on the local HMI or via PCM600. Distances to faults for the last 100
recorded disturbances can be found on the local HMI under Main menu/Disturbance Records/
Disturbance #n(n = 1–100)/General Information

If PCM600 is used, the result is displayed on the recording list after upload, including loop
selection information.

Table 39: Test settings

Parameter Condition
I Higher than 30% Ir

Healthy conditions U = 63,5 V, I = 0 A & ZF = 0°

Impedance |Z| Test point
Note:

• Zx£ (X0 + 2 · X1)/3 For single-phase faults

• Zx£ X1 For three and two phase faults
• Zx£ (X0 + 2 · X1 XM)/3 For single-phase fault with mutual zero-
sequence current

Impedance angle ZF Test angle

• ZF arctan[(X0 + 2 · X1) / (R0 + 2R1)] For single-phase faults

• ZF arctan(X1/R1) For two-phase faults

10.13.5.1 Measuring the operate limit M14955-48 v5

1. Set the test point (|Z| fault impedance and ZF impedance phase angle ) for a condition
that meets the requirements in table 39.
2. Subject the IED to healthy normal load conditions for at least two seconds.
3. Apply a fault condition.
Check that the distance-to-fault value displayed on the HMI complies with equations 110,
111 and 112

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Testing functionality by secondary injection

Z
p = ------x- × 100
X1
EQUATION123 V1 EN-US (Equation 110)

in % for two- and three-phase faults

3 × Zx
p= × 100
X0 + 2 × X1
EQUATION124 V1 EN-US (Equation 111)

in % for single-phase-to-earth faults

3 × Zx
p = --------------------------------------------- × 100
X0 + 2 × X1 ± XM
EQUATION125 V1 EN-US (Equation 112)

in % for single-phase-to-earth faults with mutual zero sequence current.

Where:
p = the expected value of a distance to fault in percent
Zx = set test point on the test set

X0 = set zero-sequence reactance of a line

X1 = set positive-sequence reactance of a line
XM = set mutual zero-sequence impedance of a line

10.13.5.2 Completing the test M14955-84 v6

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.13.6 Limit counter L4UFCNT GUID-7EBDC372-3407-4577-8B9A-6AB1758A1F34 v1

The Limit counter function L4UFCNT can be tested by connecting a binary input to the counter
and applying pulses to the counter. The speed of the pulses must not exceed the cycle time of
the function. Normally the counter will be tested when testing the function that the counter is
connected to, such as the trip function. When the function is configured, test it together with
the function that operates it. Trig the function and check that the counter result corresponds
to the number of operations.

10.13.6.1 Completing the test GUID-325F040B-BADC-4281-B965-9B7D6BFA3E15 v1

Continue to test another function or end the test by changing the Test mode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

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10.14 Metering SEMOD53588-1 v1

10.14.1 Pulse-counter logic PCFCNT M13405-2 v7

The test of the Pulse-counter logic function PCFCNT requires the Parameter Setting tool in
PCM600 or an appropriate connection to the local HMI with the necessary functionality. A
known number of pulses with different frequencies are connected to the pulse counter input.
The test should be performed with settings Operation = On or Operation = Off and the
function blocked or unblocked. The pulse counter value is then checked in PCM600 or on the
local HMI.

10.14.2 Function for energy calculation and demand handling

ETPMMTR GUID-4FC03017-93BD-4B30-A874-487BF89971D5 v1

Prepare the IED for verification of settings as outlined in section ”Overview “ and
section ”Preparing for test“ in this chapter.

10.14.2.1 Verifying the settings GUID-F8F0D384-BC70-48CA-817E-EB9BFBD68A54 v2

Common test equipment can be used to determine the injection of current and voltage and
time measurement.

Verification of EAFACC & ERFACC output

1. Connect the test set for injection of three-phase currents and three phase voltage to the
appropriate current and voltage terminals of the IED.
2. Ensure the instantaneous values of active and reactive power from CVMMXN function
block are connected to ETPMMTR function block active and reactive power inputs.
3. Enable the EnaAcc setting and set tEnergy as 1 minute.
4. Activate the STARTACC input and supply the IED with three phase currents and voltages at
their rated value.
5. Check that the ACCINPRG signal appears continuously.
6. Note the EAFACC and ERFACCvalue after 1 minute and compare it with calculated energy
value.
7. Similarly check after each 1 minute whether the calculated integrated energy value and
EAFACC and ERFACC outputs are matching.
8. After some time (multiple of minute) remove the current and voltage input from CVMMXN
function block.
9. Check the EAFACC and ERFACC output in the next 1 minute cycle for the retaining the same
value.
10. Activate STOPACC input after some time and supply the IED with same current and
voltage.
11. Check that the ACCINPRG signal disappears immediately and EAFACC and ERFACC outputs
also stop updating.
12. Similarly the testing can be done for EAFACC and ERFACC outputs by changing the power
inputs directions through direction settings.

Verification of MAXPAFD & MAXPRFD outputs

1. Repeat the above test steps 1 to 2.

2. Set tEnergy setting as 1 minute and supply the IED with three phase currents and voltages
at their rated value till 1 minute.
3. Check the MAXPAFD and MAXPRFD outputs after 1 minute and compare it with last 1 minute
average power values.
4. Increase either three phase current or voltage above the last 1 minute value.

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5. After 1 minute check the MAXPAFD and MAXPRFD whether it is showing the last 1 minute
average power value as maximum.
6. Next 1 minute cycle reduce the current or voltage below previous value.
7. Check after 1 minute whether the MAXPAFD and MAXPRFD outputs are retaining the old
maximum value.
8. Similarly the testing can be done for MAXPAFD and MAXPRFD outputs by changing the
power inputs directions through direction settings.

Verification of EAFALM & ERFALM outputs

1. Repeat the above test steps 1 to 2.

2. Set tEnergy setting as 1 minute and supply the IED with three phase currents and voltages
at their rated value till 1 minute.
3. Ensure that the active and reactive energy values are less than the EALim and ERLim
setting default values respectively.
4. Check that EAFALM and ERFALM are low.
5. Increase the supply currents or voltage in next 1 minute cycle such that the active or
reactive energy values are greater than the EALim and ERLim setting default values
respectively.
6. Check that EAFALM and ERFALM are high after 1 minute.
7. Similarly the testing can be done for EARALM and ERRALM outputs by changing the power
inputs directions through direction settings.

10.14.2.2 Completing the test M13906-301 v5

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.15 Station communication SEMOD53595-1 v1

10.15.1 Multiple command and transmit MULTICMDRCV /

MULTICMDSND SEMOD172432-5 v3

The multiple command and transmit function (MULTICMDRCV / MULTICMDSND) is only

applicable for horizontal communication.

Test of the multiple command function block and multiple transmit is recommended to be
performed in a system, that is, either in a complete delivery system as an acceptance test
(FAT/SAT) or as parts of that system, because the command function blocks are connected in
a delivery-specific way between bays and the station level and transmit.

Command and transmit function blocks included in the operation of different built-in
functions must be tested at the same time as their corresponding functions.

10.16 Remote communication SEMOD53601-1 v1

10.16.1 Binary signal transfer BinSignReceive, BinSignTransm M14951-2 v5

Prepare the IED for verification of settings as outlined in section "Preparing the IED to verify
settings".

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Testing functionality by secondary injection

To perform a test of Binary signal transfer function (BinSignReceive/BinSignTransm), the

hardware (LDCM) and binary input and output signals to transfer must be configured as
required by the application.

There are two types of internal self supervision of BinSignReceive/BinSignTransm

• The I/O-circuit board is supervised as an I/O module. For example it generates FAIL if the
board is not inserted. I/O-modules not configured are not supervised.
• The communication is supervised and the signal COMFAIL is generated if a
communication error is detected.

Status for inputs and outputs as well as self-supervision status are available from the local
HMI under

• Self-supervision status: Main menu/Diagnostics/Internal events

• Status for inputs and outputs: Main menu/Test/Function status, browse to the function
group of interest.
• Remote communication related signals: Main menu/Test/Function status/
Communication/Remote communication

Test the correct functionality by simulating different kind of faults. Also check that sent and
received data is correctly transmitted and read.

A test connection is shown in figure 47. A binary input signal (BI) at End1 is configured to be
transferred through the communication link to End2. At End2 the received signal is configured
to control a binary output (BO). Check at End2 that the BI signal is received and the BO
operates.

Repeat the test for all the signals configured to be transmitted over the communication link.

IEC07000188 V1 EN-US

Figure 47: Test of RTC with I/O

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Testing functionality by secondary injection

10.17 Basic IED functions SEMOD52026-1 v1

10.17.1 Parameter setting group handling SETGRPS M11369-2 v3

Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.

10.17.1.1 Verifying the settings M11369-4 v4

1. Check the configuration of binary inputs that control the selection of the active setting
group.
2. Browse to the ActiveGroup menu to achieve information about the active setting group.
The ActiveGroup menu is located on the local HMI underMain menu/Test/Function
status/Setting groups/ActiveGroup
3. Connect the appropriate dc voltage to the corresponding binary input of the IED and
observe the information presented on the local HMI.
The displayed information must always correspond to the activated input.
4. Check that the corresponding output indicates the active group.
Operating procedures for the PC aided methods of changing the active setting groups
are described in the corresponding PCM600 documents and instructions for the
operators within the SCS are included in the SCS documentation.

10.17.1.2 Completing the test M11369-39 v4

Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.

10.18 Exit test mode SEMOD53244-3 v4

The following procedure is used to return to normal operation.

After exiting the IED test mode, make sure that the MU is returned to normal
mode.

1. Navigate to the test mode folder.

2. Change the On setting to Off. Press the 'E' key and the left arrow key.
3. Answer YES, press the 'E' key and exit the menus.

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1MRK 505 345-UEN B Section 11
Checking the directionality

Section 11 Checking the directionality

11.1 Overview GUID-7E504488-F341-477A-953A-EB0B262911EB v2

Before starting this process, all individual devices that are involved in the fault clearance
process of the protected object must have been individually tested and must be set in
operation. The circuit breaker must be ready for an open-close-open cycle.

The directional test is performed when the protected object is energized and a certain amount
of load current is available. It is also necessary to know the flow of the load current (import or
export, i.e. forward or reverse) by help of the indication from an external instrument (energy-
meter, or SCADA information).

The design of the test procedure depends on the type of protection function to be tested.
Some items that can be used as guidelines are the following.

11.2 Testing the directionality of the distance protection GUID-EB5380B2-6086-4814-8890-102E55A79C82 v4

The test is performed by looking at the information given by the High speed distance
protection ZMFPDIS, ZMFCPDIS or the directional function ZDRDIR or ZDMRDIR whichever is
used.

Procedure:

1. Make sure that all control and protection functions that belong to the object that are
going to be energized have been tested and are set to be in operation
2. Make sure that the primary load current fulfills the following conditions (by using an
external equipment):
• The magnitude of the primary load current must be higher than the minimum
operating current set for the directional elements in the IED. In case of default
settings this means:
• load current > 5% of base current
• Otherwise the settings IMinOpPE and IMinOpPP for ZDRDIR or ZDMRDIR are
available under the HMI menu: Main menu/Settings/IED Settings/
Impedance protection/DirectionalImpedance

The primary load impedance must have an angle (PHI) between the setting angles for the
directional lines. In case of default settings this means:
• for forward (exported) load: -15 deg < PHI < 115 deg
• for reverse (imported) load: 165 deg < PHI < 295 deg

The settings for forward load: - ArgDir < PHI < ArgNegRes and the settings for reverse
load: 180 deg - ArgDir < PHI < 180 deg + ArgNegRes included in the directional functions
ZDRDIR or ZDMRDIR are available under the HMI menu:
• Main menu/Settings/IED Settings/Impedance protection/DirectionalImpedance
3. The directionality of the load current is shown by the High speed distance protection
ZMFPDIS or ZMFCPDIS under the HMI menu: Main menu/Test/Function status/
Impedance protection/HighSpeedDistance or by the directional function ZDRDIR or
ZDMRDIR and it is available under the HMI menu: Main menu/Test/Function status/
Impedance protection/DirectionalImpedance
The following will be shown if the load current flows in forward (exporting) direction:

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Checking the directionality

• L1Dir = Forward
• L2Dir = Forward
• L3Dir = Forward

The following will be shown if the load current flows in the reverse direction (importing):
• L1Dir = Reverse
• L2Dir = Reverse
• L3Dir = Reverse

Compare this result with the information given by the external equipment, it must be the
same. If the direction of the three phases is not the same, this is a sign of incorrect
connection of the voltage or current transformers serving the distance protection
function. It is also possible that there is a wrong setting for the earthing point for one or
more of the CTs serving distance protection (the setting name is: CTStarPoint available
under the HMI menu:Main menu/Configuration/Analog modules).
If the directional function shows forward when it should show reverse (or vice-versa) for
all the three phases, this probably means a wrong connection of CTs and/or VTs serving
the distance protection, or it can mean a wrong setting of earthing point (the setting
name is : CTStarPoint) for all the three CTs, or it could mean a wrong setting for the pre-
processing blocks (3PhaseAnalogGroup under the HMI menu: Main menu/Configuration/
Analog modules) connected to the CTs/VTs and serving the distance protection (verify
that no wrong negation has been set; the setting name is: Negation).
If the directional function shows “No direction” for all the three phases it can mean that
the load current is below the minimum operating current or that the load impedance has
an angle which is outside the above given valid angles for determining forward or reverse
direction.
If the directional function shows “No direction” for only some of the three phases, this
probably means a wrong CTs/VTs connection.
4. The measured impedance information is available under the same menu. These values are
not affected by the minimum operating current setting of ZDRDIR or ZDMRDIR and the
measured values are shown any time the load current is higher than 3% of the base
current:
• L1R
• L1X
• L2R
• L2X
• L3R
• L3X

The measured impedance information can still be used to determine the direction of the
load. A positive resistance measured in all phases indicates a forward (exporting) resistive
load (active power), while a negative sign indicates a reverse (importing) resistive load
(active power). Usually it is enough to look at the resistive values to get information of the
load direction, that must anyway be compared with the indication given by external
equipment measuring the same power flow.

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1MRK 505 345-UEN B Section 12
Commissioning and maintenance of the fault clearing system

Section 12 Commissioning and maintenance of

the fault clearing system

12.1 Commissioning tests SEMOD56513-5 v4

During commissioning all protection functions shall be verified with the setting values used at
each plant. The commissioning tests must include verification of all circuits by green-lining the
circuit diagrams and the configuration diagrams for the used functions.

Further, the settings for protection functions are tested and recorded carefully as outlined for
the future periodic maintenance tests.

The final testing includes primary verification of all directional functions where load currents is
checked on the local HMI and in PCM600. The amplitudes and angles of all currents and
voltages should be checked and the symmetry verified.

Directional functions have information about the measured direction and, for example,
measured impedance. These values must be checked and verified as correct with the export or
import of power available.

Finally, final trip tests must be performed. This involves activation of protection functions or
tripping outputs with the circuit breaker closed and the tripping of the breaker verified. When
several breakers are involved, each breaker must be checked individually and it must be
verified that the other involved breakers are not tripped at the same time.

12.2 Periodic maintenance tests SEMOD56517-1 v1

SEMOD56520-5 v4
The periodicity of all tests depends on several factors, for example the importance of the
installation, environmental conditions, simple or complex equipment, static or
electromechanical IEDs, and so on.

The normal maintenance praxis of the user should be followed. However, ABB's
recommendation is as follows:

Every second to third year

• Visual inspection of all equipment.

• Removal of dust on ventilation louvres and IEDs if necessary.
• Periodic maintenance test for protection IEDs of object where no redundant protections
are provided.

Every four to six years

• Periodic maintenance test for protection IEDs of objects with redundant protection
system.

First maintenance test should always be carried out after the first half year of
service.

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When protection IEDs are combined with built-in control, the test interval can
be increased drastically, up to for instance 15 years, because the IED
continuously reads service values, operates the breakers, and so on.

12.2.1 Visual inspection SEMOD56525-5 v3

Prior to testing, the protection IEDs should be inspected to detect any visible damage that
may have occurred (for example, dirt or moisture deposits, overheating).

Make sure that all IEDs are equipped with covers.

12.2.2 Maintenance tests SEMOD56534-1 v1

SEMOD56528-5 v5
To be made after the first half year of service, then with the cycle as proposed above and after
any suspected maloperation or change of the IED setting.

Testing of protection IEDs shall preferably be made with the primary circuit de-energized. The
IED cannot protect the circuit during testing. Trained personnel may test one IED at a time on
live circuits where redundant protection is installed and de-energization of the primary circuit
is not allowed.

ABB protection IEDs are preferably tested by aid of components from the COMBITEST testing
system described in information B03-9510 E. Main components are RTXP 8/18/24 test switch
usually located to the left in each protection IED and RTXH 8/18/24 test handle, which is
inserted in test switch at secondary testing. All necessary operations such as opening of trip
circuits, short-circuiting of current circuits and opening of voltage circuits are automatically
performed in the right order to allow for simple and safe secondary testing even with the
object in service.

12.2.2.1 Preparation SEMOD56528-10 v2

Before starting maintenance testing, the test engineers should scrutinize applicable circuit
diagrams and have the following documentation available:

• Test instructions for protection IEDs to be tested

• Test records from previous commissioning and maintenance tests
• List of valid settings
• Blank test records to fill in measured values

12.2.2.2 Recording SEMOD56528-14 v2

It is of utmost importance to carefully record the test results. Special test sheets covering the
frequency of test, date of test and achieved test values should be used. IED setting list and
protocols from previous tests should be available and all results should be compared for
differences. At component failures, spare equipment is used and set to the requested value. A
note of the exchange is made and the new measured values are recorded. Test records for
several years of testing should be stored in a common file for a station, or a part of a station,
to give a simple overview of the period of testing and achieved test values. These test records
are valuable when analysis of service disturbances shall be done.

12.2.2.3 Secondary injection SEMOD56528-17 v2

The periodic maintenance test is done by secondary injection from a portable test set. Each
protection shall be tested according to the secondary injection test information for the

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specific protection IED. Only the setting values adopted shall be checked for each protection
function. If the discrepancy between obtained value and requested set value is too big the
setting should be adjusted, the new value recorded and a note should be made in the test
record.

12.2.2.4 Alarm test SEMOD56528-20 v4

When inserting the test handle the alarm and event signalling is normally blocked. This is done
in the IED by setting the event reporting to Off during the test. This can be done when the test
handle is inserted or the IED is set to test mode from the local HMI. At the end of the
secondary injection test it should be checked that the event and alarm signalling is correct by
activating the events and performing some selected tests.

12.2.2.5 Self supervision check SEMOD56528-23 v4

Once secondary testing has been completed, it should be checked that no self-supervision
signals are activated continuously or sporadically. Especially check the time synchronization
system, GPS or other, and communication signals, both station communication and remote
communication.

12.2.2.6 Trip circuit check SEMOD56528-26 v5

When the protection IED undergoes an operational check, a tripping pulse is normally obtained
on one or more of the output contacts and preferably on the test switch. The healthy circuit is
of utmost importance for the protection operation. If the circuit is not provided with a
continuous trip-circuit supervision, it is possible to check that circuit is really closed when the
test-plug handle has been removed by using a high-ohmic voltmeter and measuring between
the plus and the trip output on the panel. The measurement is then done through the trip coil
of the circuit breaker and therefore the complete trip circuit is checked.

Note that the breaker must be closed.

Please observe that the test system does not provide built-in security during
this test. If the instrument should be set on Amp instead of Volts, the circuit
breaker naturally is tripped, therefore, great care is necessary.

Trip circuit from trip IEDs to circuit breaker is often supervised by trip-circuit supervision. It
can then be checked that a circuit is healthy by opening tripping output terminals in the
cubicle. When the terminal is opened, an alarm shall be achieved on the signal system after a
delay of some seconds.

Remember to close the circuit directly after the test and tighten the terminal
carefully.

12.2.2.7 Measurement of service currents SEMOD56528-30 v4

After a maintenance test it is recommended to measure the service currents and service
voltages recorded by the protection IED. The service values are checked on the local HMI or in
PCM600. Ensure that the correct values and angles between voltages and currents are

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recorded. Also check the direction of directional functions such as Distance and directional
overcurrent functions.

For transformer differential protection, the achieved differential current value is dependent on
the tap changer position and can vary between less than 1% up to perhaps 10% of rated
current. For line differential functions, the capacitive charging currents can normally be
recorded as a differential current.

The zero-sequence current to earth-fault protection IEDs should be measured. The current
amounts normally very small but normally it is possible to see if the current circuit is "alive".

The neutral-point voltage to an earth-fault protection IED is checked. The voltage is normally
0.1 to 1V secondary. However, voltage can be considerably higher due to harmonics. Normally a
CVT secondary can have around 2.5 - 3% third-harmonic voltage.

12.2.2.8 Restoring SEMOD56528-36 v2

Maintenance is very important to improve the availability of the protection system by

detecting failures before the protection is required to operate. There is however little point in
testing healthy equipment and then putting it back into service with an open terminal, with a
removed fuse or open miniature circuit breaker with an open connection, wrong setting, and
so on.

Thus a list should be prepared of all items disturbed during test so that all can be put back into
service quickly and without overlooking something. It should be put back into service item by
item and signed by the responsible engineer.

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Section 13 Troubleshooting

13.1 Checking the self supervision signals IP1474-1 v1

13.1.1 Checking the self supervision function IP1473-1 v1

13.1.1.1 Determine the cause of an internal failure M11657-2 v1

This procedure describes how to navigate the menus in order to find the cause of an internal
failure when indicated by the flashing green LED on the HMI module.

Procedure

1. Display the general diagnostics menu.

Navigate the menus to:
Diagnostics/IED status/General
2. Scroll the supervision values to identify the reason for the failure.
Use the arrow buttons to scroll between values.

13.1.2 Self supervision HMI data IP1472-1 v1

13.1.2.1 General IED status GUID-A84F3903-8A70-47D6-8613-AD7FF8BA3AEC v1

The following table shows the general IED status signals.

M11656-1 v2

Table 40: Signals from the General menu in the diagnostics tree.
Indicated result Possible reason Proposed action
Internal fail Off No problem detected. None.
Internal fail On A failure has occurred. Check the rest of the indicated results to find the fault.
Internal warning Off No problem detected. None.
Internal warning On A warning has been Check the rest of the indicated results to find the fault.
issued.
Time synch Ready No problem detected. None.
Time synch Fail No time Check the synchronization source for problems.
synchronization. If the problem persists, contact your ABB representative
for service.
Real time clock Ready No problem detected. None.
Real time clock Fail The real time clock has Set the clock.
been reset.
ADC-module OK No problem detected. None.
ADC-module Fail The AD conversion Contact your ABB representative for service.
module has failed.
(Protocol name) Ready No problem detected. None.
Table continues on next page

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Indicated result Possible reason Proposed action

(Protocol name) Fail Protocol has failed.
(I/O module name) No problem detected. None.
Ready
(I/O module name) I/O modules has failed. Check that the I/O module has been configured and
Fail connected to the IOP1- block.
If the problem persists, contact your ABB representative
for service.

13.2 Fault tracing IP8765-1 v1

13.2.1 Internal fault indications M11763-2 v7

If an internal fault has occurred, the local HMI displays information under Main menu/
Diagnostics/IED status/General

Under the Diagnostics menus, indications of a possible internal failure (serious fault) or
internal warning (minor problem) are listed.

Indications regarding the faulty unit are outlined in table 41.

Table 41: Self-supervision signals on the local HMI

HMI Signal Name: Status Description
INT Fail OFF / ON This signal will be active if one or
more of the following internal signals
are active; INT--LMDERROR, INT--
WATCHDOG, INT--APPERROR, INT--
RTEERROR, or any of the HW
dependent signals
INT Warning OFF / ON This signal will be active if one or
more of the following internal signals
are active; INT--RTCERROR, INT--
IEC61850ERROR, INT--
TIMESYNCHERROR
ADMnn READY / FAIL Analog input module n failed. Signal
activation will reset the IED
BIMnn READY / FAIL BIM error. Binary input module Error
status. Signal activation will reset the
IED
BOMn READY / FAIL BOM error. Binary output module
Error status.
IOMn READY / FAIL IOM-error. Input/Output Module Error
status.
MIMn READY / FAIL mA input module MIM1 failed. Signal
activation will reset the IED
RTC READY / FAIL This signal will be active when there is
a hardware error with the real time
clock.
Time Sync READY / FAIL This signal will be active when the
source of the time synchronization is
lost, or when the time system has to
make a time reset.
Table continues on next page

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HMI Signal Name: Status Description

Application READY / FAIL This signal will be active if one or
more of the application threads are
not in the state that Runtime Engine
expects. The states can be CREATED,
INITIALIZED, RUNNING, etc.
RTE READY / FAIL This signal will be active if the
Runtime Engine failed to do some
actions with the application threads.
The actions can be loading of settings
or parameters for components,
changing of setting groups, loading or
unloading of application threads.
IEC61850 READY / FAIL This signal will be active if the IEC
61850 stack did not succeed in some
actions like reading IEC 61850
configuration, startup etc.
LMD READY / FAIL LON network interface, MIP/DPS, is in
an unrecoverable error state.
LDCMxxx READY / FAIL Line Differential Communication Error
status
OEM READY / FAIL Optical Ethernet Module error status

Also the internal signals, such as INT--FAIL and INT--WARNING can be connected to binary
output contacts for signalling to a control room.

In the IED Status - Information, the present information from the self-supervision function can
be viewed. Indications of failure or warnings for each hardware module are provided, as well as
information about the external time synchronization and the internal clock. All according to
table 41. Loss of time synchronization can be considered as a warning only. The IED has full
functionality without time synchronization.

When settings are changed in the IED, the protection and control applications restart in order
to take effect of the changes. During restart, internal events get generated and Runtime App
error will be displayed. These events are only indications and will be for short duration during
the restart.

IED will not be operational during applications restart.

13.2.2 Using front-connected PC M11763-203 v4

When an internal fault has occurred, extensive information about the fault can be retrieved
from the list of internal events available in the SMS part:

TRM-STAT TermStatus - Internal Events

The list of internal events provides valuable information, which can be used during
commissioning and fault tracing.

The internal events are time tagged with a resolution of 1ms and stored in a list. The list can
store up to 40 events. The list is based on the FIFO principle, when it is full, the oldest event is
overwritten. The list cannot be cleared and its content cannot be erased.

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The internal events in this list not only refer to faults in the IED, but also to other activities,
such as change of settings, clearing of disturbance reports, and loss of external time
synchronization.

The information can only be retrieved from the Parameter Setting software package. The PC
can be connected either to the port at the front or at the rear of the IED.

These events are logged as internal events.

Table 42: Events available for the internal event list in the IED
Event message: Description Generating signal:
INT--FAIL Off Internal fail status INT--FAIL (reset event)
INT--FAIL INT--FAIL (set event)
INT--WARNING Off Internal warning status lNT--WARNING (reset event)
INT--WARNING lNT--WARNING (set event)
IOn--Error Off In/Out module No. n status IOn--Error (reset event)
IOn--Error IOn--Error (set event)
ADMn-Error Off Analog/Digital module No. n ADMn-Error (reset event)
status
ADMn-Error ADMn-Error (set event)
MIM1-Error Off mA-input module status MIM1-Error (reset event)
MIM1-Error MIM1-Error (set event)
INT--RTC Off Real Time Clock (RTC) status INT--RTC (reset event)
INT--RTC INT--RTC (set event)
INT--TSYNC Off External time synchronization INT--TSYNC (reset event)
status
INT--TSYNC INT--TSYNC (set event)
INT--SETCHGD Any settings in IED changed
DRPC-CLEARED All disturbances in
Disturbance report cleared

The events in the internal event list are time tagged with a resolution of 1ms.

This means that, when using the PC for fault tracing, it provides information on the:

• Module that should be changed.

• Sequence of faults, if more than one unit is faulty.
• Exact time when the fault occurred.

13.2.3 Diagnosing the IED status via the LHMI hint menu GUID-7E8503E9-441B-487A-9CD7-B43463D1CAE5 v3

In order to help the user, there is an LHMI page labeled ‘Hints’. This page is located under Main
menu/Diagnostics/IED status/Hints. For each activated hint there is a headline. From the
headline view, an explanation page can be entered, giving the user more information and hints
about the particular topic.

For example, if there is a configuration to use IEC 61850 9–2 analog data, but no data arrives
on the access point, then the IED will use substituted data and most protection functions will
be blocked. This condition will be indicated with a sub-menu under Hints, where details about
this condition are shown. The Hint menu is a way to assist the user in troubleshooting.

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The Hint menu is currently only available in English. All the entries are in English,
regardless of which language is selected.

The supported list of hints are as follows:

Table 43: Hint menu

Headline Explanation
Incorrect setting of SyncLostMode There are two explanations possible:

SyncLostMode is set to Block, no time source is

configured to achieve the required accuracy. Unless a
high accuracy time source is selected, the function
dependent on high time accuracy will be blocked.
SyncLostMode is set to BlockOnLostUTC, but there is
no UTC capable synch source (GPS, IRIG-B) used.
Unless a UTC capable time source is selected, the
function dependent on high time accuracy will be
blocked.
Sampled value substituted <Access Point><Hardware Module Identifier><svID>
Where the Hardware Module Identifier is the same as
given in PCM600, e.g. AP1: MU1_9201 svID:
<ABB_MU0101>
Time diff: IED vs Sampled value <Access Point><Hardware Module Identifier><svID>
Where the Hardware Module Identifier is the same as
given in PCM600, e.g. AP1: MU1_9201 svID:
<ABB_MU0101>
Frequency diff: IED vs Sampled value <Access Point><Hardware Module Identifier><svID>
Where the Hardware Module Identifier is the same as
given in PCM600, e.g. AP1: MU1_9201 svID:
<ABB_MU0101>
Wrong cycle time for PMU report Wrong cycle time on SMAI or 3PHSUM block
connected to Phasor Report block. The SMAI or
3PHSUM block should have the same cycle time as
that of Phasor Report.
PMU not connected to 3ph output The PMU phasor report input(s) must be connected
to the 3ph output of SMAI or 3PHSU.
Invalid value set for PMU Parameters There are two explanations possible:

Check if the following parameters are set correctly on

PMUREPORT: ReportRate or SvcClass or parameter
PRIMVAL:1.FrequencySel is not set as 50Hz / 60Hz.
Check if the following parameters are set correctly on
PMUREPORT: ReportRate or SvcClass or RptTimetag
or parameter PRIMVAL:1.FrequencySel is not set as
50Hz / 60Hz.
Invalid phase angle reference The selected PhaseAngleRef corresponds to an
analog channel that is not configured. Please
configure a valid reference channel.
GOOSE is configured on a disabled port At least one of the access points configured for
GOOSE is disabled. The port can be disabled either
through changing the access point operation to off
or by unchecking the GOOSE protocol from the
access point in the Ethernet configuration in PCM600
or LHMI.
Please enable GOOSE on access points: AP_FRONT,
AP_1
Table continues on next page

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Headline Explanation
LDCM not running the application image <slot number> is running the factory image instead
of the application image. The factory image is older
and does not contain the latest updates and fixes.
Please reboot the IED. If the problem persists update
the LDCM firmware or replace the board.
LDCM version is not accepted <device name> firmware version <version string> is
not accepted. The minimum accepted version is
<version string>.
Please update the LDCM firmware or replace the
board.
OEM not running the application image OEM in slot <slot number> is running the factory
image instead of the application image. The factory
image is older and does not contain the latest
updates and fixes.
Please reboot the IED. If the problem persists, update
the OEM firmware or replace the board.
SFP unplugged from the slot SFP has been unplugged from the slot
Please check the connection.
Corresponding hardware(s) is set to fail.
SFP replaced with other type Configured and the detected SFP(s) are different.
Corresponding hardware(s) is set to fail.
Please restart IED and consider Reconfigure HW
modules to get updated hardware list.
Non ABB vendor SFP detected Non ABB vendor SFP detected.
Corresponding hardware(s) is set to fail. Please use
ABB approved SFP’s.

13.2.4 Hardware re-configuration GUID-334C5D8B-F383-4CDE-9850-659ED6B405DC v1

When adding, removing or moving a hardware modules in an IED ( for example, I/O modules,
communication modules or time synchronization modules) a set of procedures must be
followed.

Adding a new module in to an IED

Procedure:

1. Switch the IED off and insert the new module.

2. Switch the IED on, wait for it to start, and then perform a HW reconfig.
3. Perform a license update in PCM600.

The new module is now available in PCM600 and is ready to be configured.

Removing a module from an IED

Procedure:

1. Remove all existing configuration for the module in PCM, and write that configuration to
the IED.
2. Switch the IED off and remove the HW module.
3. Switch the IED on, wait for it to start, and then perform a HW reconfig.
4. Perform a license update in PCM 600.

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If any configuration that makes the module needed remains, then the HW
reconfig will not remove the module.
The module will still be needed. An error indication for the module will appear, if
the module is physically removed from the IED and the IED is restarted with
some part of the configuration still requiring the module.

Moving a module in an IED from one position to another

Procedure:

1. Remove all existing configuration for the module in PCM, and write that configuration to
the IED.
2. Switch the IED off and move the HW module.
3. Switch the IED on, wait for it to start, and then perform a HW reconfig.
4. Perform a license update in PCM600.

The new module is now available in PCM600 at the new position and is ready to be configured.

13.3 Repair instruction IP8767-1 v1

M11764-2 v2

Never disconnect the secondary connection of a current transformer circuit

without short-circuiting the transformer’s secondary winding. Operating a
current transformer with the secondary winding open will cause a massive
potential build up that may damage the transformer and may cause injuries to
humans.

Never connect or disconnect a wire and/or a connector to or from a IED during

normal service. Hazardous voltages and currents are present that may be
lethal. Operation may be disrupted and IED and measuring circuitry may be
damaged.

M11764-10 v1
An alternative is to open the IED and send only the faulty circuit board to ABB for repair. When
a printed circuit board is sent to ABB, it must always be placed in a metallic, ESD-proof,
protection bag. The user can also purchase separate replacement modules.

Strictly follow the company and country safety regulations.

M11766-4 v2
Most electronic components are sensitive to electrostatic discharge and latent damage may
occur. Please observe usual procedures for handling electronics and also use an ESD wrist
strap. A semi-conducting layer must be placed on the workbench and connected to earth.

Disassemble and reassemble the IED accordingly:

1. Switch off the dc supply.

2. Short-circuit the current transformers and disconnect all current and voltage connections
from the IED.
3. Disconnect all signal wires by removing the female connectors.
4. Disconnect the optical fibers.
5. Unscrew the main back plate of the IED.
6. If the transformer module is to be changed:

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• Remove the IED from the panel if necessary.

• Remove the rear plate of the IED.
• Remove the front plate.
• Remove the screws of the transformer input module, both front and rear.
7. Pull out the faulty module.
8. Check that the new module has a correct identity number.
9. Check that the springs on the card rail are connected to the corresponding metallic area
on the circuit board when the new module is inserted.
10. Reassemble the IED.

If the IED has been calibrated with the system inputs, the calibration procedure must be
performed again to maintain the total system accuracy.

13.4 Repair support M11768-3 v3

If an IED needs to be repaired, the whole IED must be removed and sent to an ABB Logistic
Center. Before returning the material, an inquiry must be sent to the ABB Logistic Center.

e-mail: [email protected]

13.5 Maintenance M11769-3 v2

The IED is self-supervised. No special maintenance is required.

Instructions from the power network company and other maintenance directives valid for
maintenance of the power system must be followed.

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Section 14 Glossary M14893-1 v18

AC Alternating current
ACC Actual channel
ACT Application configuration tool within PCM600
A/D converter Analog-to-digital converter
ADBS Amplitude deadband supervision
ADM Analog digital conversion module, with time synchronization
AI Analog input
ANSI American National Standards Institute
AR Autoreclosing
ASCT Auxiliary summation current transformer
ASD Adaptive signal detection
ASDU Application service data unit
AWG American Wire Gauge standard
BBP Busbar protection
BFOC/2,5 Bayonet fiber optic connector
BFP Breaker failure protection
BI Binary input
BIM Binary input module
BOM Binary output module
BOS Binary outputs status
BR External bistable relay
BS British Standards
BSR Binary signal transfer function, receiver blocks
BST Binary signal transfer function, transmit blocks
C37.94 IEEE/ANSI protocol used when sending binary signals between IEDs
CAN Controller Area Network. ISO standard (ISO 11898) for serial
communication
CB Circuit breaker
CBM Combined backplane module
CCITT Consultative Committee for International Telegraph and Telephony. A
United Nations-sponsored standards body within the International
Telecommunications Union.
CCM CAN carrier module
CCVT Capacitive Coupled Voltage Transformer
Class C Protection Current Transformer class as per IEEE/ ANSI
CMPPS Combined megapulses per second
CMT Communication Management tool in PCM600

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CO cycle Close-open cycle

Codirectional Way of transmitting G.703 over a balanced line. Involves two twisted
pairs making it possible to transmit information in both directions
COM Command
COMTRADE Standard Common Format for Transient Data Exchange format for
Disturbance recorder according to IEEE/ANSI C37.111, 1999 / IEC
60255-24
Contra-directional Way of transmitting G.703 over a balanced line. Involves four twisted
pairs, two of which are used for transmitting data in both directions
and two for transmitting clock signals
COT Cause of transmission
CPU Central processing unit
CR Carrier receive
CRC Cyclic redundancy check
CROB Control relay output block
CS Carrier send
CT Current transformer
CU Communication unit
CVT or CCVT Capacitive voltage transformer
DAR Delayed autoreclosing
DARPA Defense Advanced Research Projects Agency (The US developer of the
TCP/IP protocol etc.)
DBDL Dead bus dead line
DBLL Dead bus live line
DC Direct current
DFC Data flow control
DFT Discrete Fourier transform
DHCP Dynamic Host Configuration Protocol
DIP-switch Small switch mounted on a printed circuit board
DI Digital input
DLLB Dead line live bus
DNP Distributed Network Protocol as per IEEE Std 1815-2012
DR Disturbance recorder
DRAM Dynamic random access memory
DRH Disturbance report handler
DSP Digital signal processor
DTT Direct transfer trip scheme
ECT Ethernet configuration tool
EHV network Extra high voltage network
EIA Electronic Industries Association
EMC Electromagnetic compatibility
EMF Electromotive force

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EMI Electromagnetic interference

EnFP End fault protection
EPA Enhanced performance architecture
ESD Electrostatic discharge
F-SMA Type of optical fiber connector
FAN Fault number
FCB Flow control bit; Frame count bit
FOX 20 Modular 20 channel telecommunication system for speech, data and
protection signals
FOX 512/515 Access multiplexer
FOX 6Plus Compact time-division multiplexer for the transmission of up to seven
duplex channels of digital data over optical fibers
FPN Flexible product naming
FTP File Transfer Protocol
FUN Function type
G.703 Electrical and functional description for digital lines used by local
telephone companies. Can be transported over balanced and
unbalanced lines
GCM Communication interface module with carrier of GPS receiver module
GDE Graphical display editor within PCM600
GI General interrogation command
GIS Gas-insulated switchgear
GOOSE Generic object-oriented substation event
GPS Global positioning system
GSAL Generic security application
GSE Generic substation event
HDLC protocol High-level data link control, protocol based on the HDLC standard
HFBR connector type Plastic fiber connector
HLV circuit Hazardous Live Voltage according to IEC60255-27
HMI Human-machine interface
HSAR High speed autoreclosing
HSR High-availability Seamless Redundancy
HV High-voltage
HVDC High-voltage direct current
IDBS Integrating deadband supervision
IEC International Electrical Committee
IEC 60044-6 IEC Standard, Instrument transformers – Part 6: Requirements for
protective current transformers for transient performance
IEC 60870-5-103 Communication standard for protection equipment. A serial master/
slave protocol for point-to-point communication
IEC 61850 Substation automation communication standard
IEC 61850–8–1 Communication protocol standard

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IEEE Institute of Electrical and Electronics Engineers

IEEE 802.12 A network technology standard that provides 100 Mbits/s on twisted-
pair or optical fiber cable
IEEE P1386.1 PCI Mezzanine Card (PMC) standard for local bus modules. References
the CMC (IEEE P1386, also known as Common Mezzanine Card)
standard for the mechanics and the PCI specifications from the PCI SIG
(Special Interest Group) for the electrical EMF (Electromotive force).
IEEE 1686 Standard for Substation Intelligent Electronic Devices (IEDs) Cyber
Security Capabilities
IED Intelligent electronic device
IET600 Integrated engineering tool
I-GIS Intelligent gas-insulated switchgear
IOM Binary input/output module
Instance When several occurrences of the same function are available in the IED,
they are referred to as instances of that function. One instance of a
function is identical to another of the same kind but has a different
number in the IED user interfaces. The word "instance" is sometimes
defined as an item of information that is representative of a type. In
the same way an instance of a function in the IED is representative of a
type of function.
IP 1. Internet protocol. The network layer for the TCP/IP protocol suite
widely used on Ethernet networks. IP is a connectionless, best-effort
packet-switching protocol. It provides packet routing, fragmentation
and reassembly through the data link layer.
2. Ingression protection, according to IEC 60529
IP 20 Ingression protection, according to IEC 60529, level 20
IP 40 Ingression protection, according to IEC 60529, level 40
IP 54 Ingression protection, according to IEC 60529, level 54
IRF Internal failure signal
IRIG-B: InterRange Instrumentation Group Time code format B, standard 200
ITU International Telecommunications Union
LAN Local area network
LIB 520 High-voltage software module
LCD Liquid crystal display
LDCM Line data communication module
LDD Local detection device
LED Light-emitting diode
LNT LON network tool
LON Local operating network
MCB Miniature circuit breaker
MCM Mezzanine carrier module
MIM Milli-ampere module
MPM Main processing module
MVAL Value of measurement
MVB Multifunction vehicle bus. Standardized serial bus originally developed
for use in trains.

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NCC National Control Centre

NOF Number of grid faults
NUM Numerical module
OCO cycle Open-close-open cycle
OCP Overcurrent protection
OEM Optical Ethernet module
OLTC On-load tap changer
OTEV Disturbance data recording initiated by other event than start/pick-up
OV Overvoltage
Overreach A term used to describe how the relay behaves during a fault condition.
For example, a distance relay is overreaching when the impedance
presented to it is smaller than the apparent impedance to the fault
applied to the balance point, that is, the set reach. The relay “sees” the
fault but perhaps it should not have seen it.
PCI Peripheral component interconnect, a local data bus
PCM Pulse code modulation
PCM600 Protection and control IED manager
PC-MIP Mezzanine card standard
PELV circuit Protected Extra-Low Voltage circuit type according to IEC60255-27
PMC PCI Mezzanine card
POR Permissive overreach
POTT Permissive overreach transfer trip
Process bus Bus or LAN used at the process level, that is, in near proximity to the
measured and/or controlled components
PRP Parallel redundancy protocol
PSM Power supply module
PST Parameter setting tool within PCM600
PTP Precision time protocol
PT ratio Potential transformer or voltage transformer ratio
PUTT Permissive underreach transfer trip
RASC Synchrocheck relay, COMBIFLEX
RCA Relay characteristic angle
RISC Reduced instruction set computer
RMS value Root mean square value
RS422 A balanced serial interface for the transmission of digital data in point-
to-point connections
RS485 Serial link according to EIA standard RS485
RTC Real-time clock
RTU Remote terminal unit
SA Substation Automation
SBO Select-before-operate
SC Switch or push button to close

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Glossary

SCL Short circuit location

SCS Station control system
SCADA Supervision, control and data acquisition
SCT System configuration tool according to standard IEC 61850
SDU Service data unit
SELV circuit Safety Extra-Low Voltage circuit type according to IEC60255-27
SFP Small form-factor pluggable (abbreviation)
Optical Ethernet port (explanation)

SLM Serial communication module.

SMA connector Subminiature version A, A threaded connector with constant
impedance.
SMT Signal matrix tool within PCM600
SMS Station monitoring system
SNTP Simple network time protocol – is used to synchronize computer clocks
on local area networks. This reduces the requirement to have accurate
hardware clocks in every embedded system in a network. Each
embedded node can instead synchronize with a remote clock,
providing the required accuracy.
SOF Status of fault
SPA Strömberg Protection Acquisition (SPA), a serial master/slave protocol
for point-to-point and ring communication.
SRY Switch for CB ready condition
ST Switch or push button to trip
Starpoint Neutral point of transformer or generator
SVC Static VAr compensation
TC Trip coil
TCS Trip circuit supervision
TCP Transmission control protocol. The most common transport layer
protocol used on Ethernet and the Internet.
TCP/IP Transmission control protocol over Internet Protocol. The de facto
standard Ethernet protocols incorporated into 4.2BSD Unix. TCP/IP
was developed by DARPA for Internet working and encompasses both
network layer and transport layer protocols. While TCP and IP specify
two protocols at specific protocol layers, TCP/IP is often used to refer
to the entire US Department of Defense protocol suite based upon
these, including Telnet, FTP, UDP and RDP.
TEF Time delayed earth-fault protection function
TLS Transport Layer Security
TM Transmit (disturbance data)
TNC connector Threaded Neill-Concelman, a threaded constant impedance version of a
BNC connector
TP Trip (recorded fault)
TPZ, TPY, TPX, TPS Current transformer class according to IEC

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TRM Transformer Module. This module transforms currents and voltages

taken from the process into levels suitable for further signal
processing.
TYP Type identification
UMT User management tool
Underreach A term used to describe how the relay behaves during a fault condition.
For example, a distance relay is underreaching when the impedance
presented to it is greater than the apparent impedance to the fault
applied to the balance point, that is, the set reach. The relay does not
“see” the fault but perhaps it should have seen it. See also Overreach.
UTC Coordinated Universal Time. A coordinated time scale, maintained by
the Bureau International des Poids et Mesures (BIPM), which forms the
basis of a coordinated dissemination of standard frequencies and time
signals. UTC is derived from International Atomic Time (TAI) by the
addition of a whole number of "leap seconds" to synchronize it with
Universal Time 1 (UT1), thus allowing for the eccentricity of the Earth's
orbit, the rotational axis tilt (23.5 degrees), but still showing the Earth's
irregular rotation, on which UT1 is based. The Coordinated Universal
Time is expressed using a 24-hour clock, and uses the Gregorian
calendar. It is used for aeroplane and ship navigation, where it is also
sometimes known by the military name, "Zulu time." "Zulu" in the
phonetic alphabet stands for "Z", which stands for longitude zero.
UV Undervoltage
WEI Weak end infeed logic
VT Voltage transformer
X.21 A digital signalling interface primarily used for telecom equipment
3IO Three times zero-sequence current.Often referred to as the residual or
the earth-fault current
3UO Three times the zero sequence voltage. Often referred to as the
residual voltage or the neutral point voltage

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Phone +46 (0) 21 32 50 00
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1MRK 505 345-UEN

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