Nanosurf

easyScan 2 AFM
Operating Instructions

for

SPM Control Software

Version 3.0
“NANOSURF” AND THE NANOSURF LOGO ARE TRADEMARKS OF NANOSURF AG,
REGISTERED AND/OR OTHERWISE PROTECTED IN VARIOUS COUNTRIES.
COPYRIGHT © JULY 2011, NANOSURF AG, SWITZERLAND.
OPERATING INSTRUCTIONS V3.0R1, BT02089-13.
Table of contents
 Table of contents
CHAPTER 1: The easyScan 2 AFM 11
1.1: Introduction.............................................................................................. 12
1.2: Components of the system ...................................................................... 13
1.2.1: Contents of the Tool Set .................................................................................14
1.3: Connectors, indicators and controls ....................................................... 15
1.3.1: The easyScan 2 AFM Scan Head ..................................................................15
1.3.2: The easyScan 2 Controller..............................................................................16

CHAPTER 2: Installing the easyScan 2 AFM 19

2.1: Installing the hardware............................................................................ 20
2.1.1: Installing the easyScan 2 controller ...........................................................20
2.1.2: Installing the AFM Video Camera................................................................21
2.1.3: Installing the Signal Module S......................................................................21
2.1.4: Installing the Signal Module A and its Connector Box........................22
2.1.5: Installing the easyScan 2 AFM Scan Head ...............................................22
2.2: Installing the SPM Control Software....................................................... 23
2.2.1: Preparations before installing ......................................................................23
2.2.2: Initiating the installation procedure ..........................................................24
2.2.3: Hardware recognition .....................................................................................25
2.2.4: Manual installation of the USB Video Adapter driver ..........................25

CHAPTER 3: Preparing for measurement 27

3.1: Introduction.............................................................................................. 28
3.2: Initializing the easyScan 2 Controller..................................................... 28
3.3: Installing the cantilever ........................................................................... 29
3.3.1: Selecting a cantilever ......................................................................................30
3.3.2: Inserting the cantilever in the Scan Head................................................31
3.4: Installing the sample................................................................................ 34
3.4.1: Preparing the sample ......................................................................................34
3.4.2: Nanosurf samples .............................................................................................34
3.4.3: Stand-alone measurements..........................................................................37
3.4.4: The Sample Stage .............................................................................................38
3.4.5: Mounting a sample ..........................................................................................38

CHAPTER 4: A first measurement 41

4.1: Introduction.............................................................................................. 42
4.2: Running the microscope simulation....................................................... 42
4.3: Preparing the instrument ........................................................................ 43
4.3.1: Entering and changing parameter values ...............................................43

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4.4: Approaching the sample ......................................................................... 44
4.4.1: Manual coarse approach................................................................................45
4.4.2: Manual approach using the motorized approach stage....................46
4.4.3: Automatic final approach ..............................................................................47
4.5: Starting a measurement .......................................................................... 49
4.6: Selecting a measurement area................................................................ 50
4.7: Storing the measurement........................................................................ 52
4.8: Creating a basic report............................................................................. 53
4.9: Further options......................................................................................... 53

CHAPTER 5: Improving measurement quality 55

5.1: Removing interfering signals.................................................................. 56
5.1.1: Mechanical vibrations .....................................................................................56
5.1.2: Electrical interference......................................................................................56
5.1.3: Infrared or other light sources......................................................................57
5.2: Adjusting the measurement plane ......................................................... 57
5.3: Judging tip quality ................................................................................... 60

CHAPTER 6: Operating modes 63

6.1: Introduction.............................................................................................. 64
6.2: Static Force mode ..................................................................................... 64
6.3: Dynamic Force mode................................................................................ 65
6.4: Phase Contrast mode ............................................................................... 65
6.5: Force Modulation mode........................................................................... 67
6.6: Spreading Resistance mode .................................................................... 68
6.7: Kelvin Probe Force Microscopy ............................................................... 69
6.7.1: Introduction........................................................................................................69
6.7.2: Operating principle..........................................................................................69
6.7.3: System requirements.......................................................................................70
6.7.4: Procedures...........................................................................................................72

CHAPTER 7: Finishing measurements 81

7.1: Finishing scanning ................................................................................... 82
7.2: Turning off the instrument ...................................................................... 82
7.3: Storing the instrument ............................................................................ 83

CHAPTER 8: Maintenance 85
8.1: Introduction.............................................................................................. 86
8.2: The easyScan 2 AFM Scan Head .............................................................. 86
8.3: The easyScan 2 controller........................................................................ 86

CHAPTER 9: Problems and solutions 87

9.1: Introduction.............................................................................................. 88

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 9.2: Software and driver problems ................................................................ 88
9.2.1: No connection to microscope......................................................................88
9.2.2: USB Port error.....................................................................................................88
9.2.3: Driver problems.................................................................................................89
9.3: AFM measurement problems .................................................................. 91
9.3.1: Probe Status light blinks red .........................................................................91
9.3.2: Automatic final approach fails .....................................................................92
9.3.3: Image quality suddenly deteriorates.........................................................92
9.4: Nanosurf support ..................................................................................... 93
9.4.1: Self help................................................................................................................93
9.4.2: Assistance ............................................................................................................94

CHAPTER 10: AFM theory 95

10.1: Scanning probe microscopy .................................................................... 96
10.2: The easyScan 2 AFM ................................................................................. 97

CHAPTER 11: Technical data 99

11.1: Introduction............................................................................................. 100
11.2: The easyScan 2 AFM Scan Heads............................................................ 100
11.2.1: Specifications and features ..........................................................................100
11.2.2: Dimensions ........................................................................................................101
11.3: The easyScan 2 Controller ...................................................................... 102
11.3.1: Hardware features and specifications ......................................................102
11.3.2: Software features and computer requirements ...................................102
11.4: Hardware modules and options............................................................. 104
11.4.1: AFM modules ....................................................................................................104
11.4.2: The Signal Modules.........................................................................................105
11.4.3: The AFM Video Module .................................................................................108
11.4.4: The Micrometer Translation Stage.............................................................108

CHAPTER 12: The SPM Control Software user interface 109

12.1: General concept and layout.................................................................... 110
12.2: The workspace ......................................................................................... 111
12.3: Operating windows................................................................................. 112
12.4: Document space ...................................................................................... 113
12.5: Panels ....................................................................................................... 114
12.6: Ribbon ...................................................................................................... 116
12.7: Status bar ................................................................................................. 117
12.8: View tab.................................................................................................... 118
12.8.1: Workspace group.............................................................................................118
12.8.2: Panels group......................................................................................................118
12.8.3: Window group ..................................................................................................119

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CHAPTER 13: Imaging 121
13.1: Introduction............................................................................................. 122
13.2: Imaging panel.......................................................................................... 123
13.3: The Imaging toolbar................................................................................ 127
13.4: Acquisition tab ........................................................................................ 128
13.4.1: Preparation group ...........................................................................................129
13.4.2: Approach group ...............................................................................................130
13.4.3: Imaging group ..................................................................................................131
13.4.4: Scripting group.................................................................................................132
13.5: Stage panel .............................................................................................. 133
13.5.1: Move Stage To dialog .....................................................................................134
13.6: Video panel .............................................................................................. 135
13.6.1: Analog video camera display ......................................................................136
13.6.2: Digital Video Camera display.......................................................................137
13.6.3: Illumination section ........................................................................................140
13.6.4: Digital Video Properties dialog ...................................................................140
13.7: Online panel............................................................................................. 142
13.7.1: Scan Position section......................................................................................142
13.7.2: Master Image section .....................................................................................143
13.7.3: Illumination section ........................................................................................144

CHAPTER 14: Spectroscopy 145

14.1: Introduction............................................................................................. 146
14.2: Spectroscopy panel................................................................................. 148
14.3: Spectroscopy toolbar.............................................................................. 149
14.4: Acquisition tab ........................................................................................ 150
14.4.1: Spectroscopy group........................................................................................150

CHAPTER 15: Lithography 151

15.1: Introduction............................................................................................. 152
15.2: Performing lithography.......................................................................... 153
15.3: Lithography panel................................................................................... 154
15.3.1: Layer Editor dialog...........................................................................................157
15.3.2: Object Editor dialog........................................................................................159
15.4: Acquisition tab ........................................................................................ 160
15.4.1: Lithography group ..........................................................................................160
15.5: Lithography toolbar................................................................................ 161
15.5.1: Vector Graphic Import dialog......................................................................163
15.5.2: Pixel Graphic Import dialog .........................................................................165
15.6: Lithography preview............................................................................... 168

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 CHAPTER 16: Working with documents 169
16.1: Introduction............................................................................................. 170
16.2: Data Info panel ........................................................................................ 170
16.2.1: Data Info toolbar ..............................................................................................171
16.3: Charts ....................................................................................................... 171
16.3.1: Working with multiple charts......................................................................173
16.3.2: Chart Properties dialog..................................................................................174
16.4: Gallery panel............................................................................................ 181
16.4.1: History File mask ..............................................................................................182
16.4.2: Image list.............................................................................................................182
16.4.3: Gallery toolbar ..................................................................................................182
16.4.4: Mask Editor dialog ...........................................................................................183
16.4.5: File Rename dialog ..........................................................................................185
16.5: Analysis tab.............................................................................................. 186
16.5.1: Measure group..................................................................................................187
16.5.2: Correction group..............................................................................................189
16.5.3: Roughness group.............................................................................................191
16.5.4: Filter group.........................................................................................................193
16.5.5: Tools group ........................................................................................................195
16.5.6: Report Group.....................................................................................................196
16.5.7: Scripting group.................................................................................................198
16.6: Tool panel................................................................................................. 198

CHAPTER 17: Advanced settings 201

17.1: About dialog ............................................................................................ 202
17.2: File menu.................................................................................................. 203
17.2.1: Options dialog ..................................................................................................206
17.3: Settings tab.............................................................................................. 212
17.3.1: Scan Head group..............................................................................................213
17.3.2: Hardware group ...............................................................................................213
17.4: Scan Head Selector dialog ...................................................................... 214
17.5: Scan Head Calibration Editor dialog...................................................... 215
17.5.1: Scan Axis .............................................................................................................215
17.5.2: I/O Signals...........................................................................................................216
17.6: Scan Axis Correction dialog.................................................................... 218
17.7: Scan Head Diagnosis dialog ................................................................... 218
17.7.1: Dialog for AFM scan heads ...........................................................................219
17.7.2: Dialog for STM scan head .............................................................................219
17.8: Controller Configuration dialog............................................................. 220

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17.9: SPM Parameters dialog........................................................................... 221
17.9.1: Imaging ...............................................................................................................222
17.9.2: Spectroscopy.....................................................................................................225
17.9.3: Lithography........................................................................................................228
17.9.4: Operating Mode...............................................................................................229
17.9.5: Approach ............................................................................................................231
17.9.6: Z-Controller........................................................................................................233
17.9.7: Signal Access .....................................................................................................235
17.10: User Signal Editor dialog........................................................................ 238
17.11: Vibration Frequency Search dialog ....................................................... 239
17.11.1: General concept ...............................................................................................239
17.11.2: Automated vibration frequency search...................................................240
17.11.3: Manual sweep controls..................................................................................241
17.11.4: Auto Frequency Config dialog ....................................................................243
17.12: Laser Alignment dialog .......................................................................... 244
17.13: Cantilever Browser dialog ...................................................................... 245
17.13.1: Cantilever Editor dialog .................................................................................247
17.14: ATS Stage and TSC 3000 driver configuration ...................................... 248
17.14.1: Stage Configuration dialog ..........................................................................250
17.14.2: The COM Port Configuration dialog..........................................................252

Quick reference 253

9
About this Manual
This manual is divided into two parts: The first part provides instructions on how to set up
and use your Nanosurf easyScan 2 AFM system. The second part is a reference for the
software that comes with the easyScan 2 AFM system. It applies to Nanosurf SPM Control
Software version 3.0. If you are using newer software versions, download the latest manual
from the Nanosurf support pages, or refer to the “What’s new in this version.pdf” file that is
installed in the Manuals subdirectory of the directory where the SPM Control Software is
installed.
The first part of the manual starts with Chapter 1: Introduction (page 12), which provides an
introduction to the easyScan 2 AFM system, and with Chapter 2: Installing the easyScan 2
AFM (page 19), which should be read when installing your system. Chapter 3: Preparing for
measurement (page 27) and Chapter 4: A first measurement (page 41) should be read by all
users, because they contain useful instructions for everyday measurements. The other
chapters provide more information for advanced or interested users.
The second part of the manual can be used as a reference for the SPM Control Software that
controls the AFM. It starts with Chapter 12: The SPM Control Software user interface (page
109) and ends with Chapter 17: Advanced settings (page 201). This part describes the
functions of all buttons, inputs, dialogs, and control panels of the SPM Control Software.
The final chapter of this manual, Quick reference (page 254), contains an index to the
software reference part of the manual for quick retrieval of the relevant information
locations.
For more information on the scripting interface of the software packages, refer to the on-
line help file easyScan 2 Script Programmers Manual that is installed together with the SPM
Control Software.
For more information on the optional Nanosurf Report software, refer to the on-line help
included with the Nanosurf Report software.
CHAPTER 1:

The easyScan 2 AFM

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0
 CHAPTER 1: THE EASYSCAN 2 AFM

1.1: Introduction
The Nanosurf easyScan 2 AFM system is an atomic force microscope that can measure the
topography and several other properties of a sample with nanometer resolution. These
measurements are performed, displayed, and evaluated using the SPM Control Software.
The easyScan 2 AFM system is a modular scanning probe system that can be upgraded to
obtain more measurement capabilities. The main parts of the basic system are the
easyScan 2 AFM Scan Head, the AFM Sample stage, the easyScan 2 Controller with AFM
Basic module, and the SPM Control Software.
The content of the system and the function of its major components are described in this
chapter. Detailed technical specifications and system features can be found in Chapter 11:
Technical data (page 99).
Several other Nanosurf products can be used in conjunction with the easyScan 2 AFM:
• AFM Dynamic Module: adds dynamic mode measurement capabilities for measuring
delicate samples.
• AFM Mode Extension Module: adds phase contrast, force modulation and current
measurement capabilities.
• AFM Video Module: allows observation of the approach on the computer screen. This is
useful when observation using the lenses is impractical.
• Signal Modules: allow monitoring signals (Module S) and creating custom operating
modes (Module A). Refer to Section 11.4.2: The Signal Modules (page 105) for more details.
• Nanosurf Micrometer Translation Stage: allows locating of a position on a sample with
micrometer accuracy. Should be used together with the Nanosurf easyScan 2 Sample
Stage.
• Nanosurf Report: software for simple automatic evaluation and report generation of
SPM measurements.
• Nanosurf Analysis: software for detailed analysis of SPM measurements.
• Scripting Interface: software for automating measurements. Refer to Section 13.4.4:
Scripting group (page 132) and the Programmer’s Manual for more details.
• Lithography Option: software for professional lithography applications. Refer to Chapter
15: Lithography (page 151) for more information.
• The Nanosurf isoStage: a highly compact active vibration isolation table, equipped with
a special easyScan 2 AFM Sample Stage (The isoStage Adapter Plate), and dedicated for
use with Nanosurf AFM scan heads.
• The Halcyonics_i4 Active Vibration Isolation Table: a larger and heavier active vibration
isolation solution, which features load adjustment.

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 COMPONENTS OF THE SYSTEM

1.2: Components of the system

This section describes the parts that may be delivered with an easyScan 2 AFM system. The
contents of delivery can vary from system to system, depending on which parts were
ordered. To find out which parts are included in your system, refer to the delivery note
shipped with your system. Some of the modules listed in the delivery note are built into the
controller. Their presence is indicated by the status lights on the top surface of the
controller when it is turned on (see Section 1.3.2: The easyScan 2 Controller (page 16)).

1 2 3

4 5 6 7

18
8 9 17

19

Figure 1-1: Components. The easyScan 2 AFM system

1. easyScan 2 Controller with a built-in AFM Basic Module, and optionally with built-in
AFM Dynamic Module, AFM Mode Extension Module, Video Module electronics and
Signal Module A or S electronics.
2. easyScan 2 AFM Scan Head(s) with AFM Video Camera (comes with AFM Video
Module).
3. Scan Head Case.
4. USB cable.
5. Mains cable.
6. Scan Head cable, connects the Scan Head to the easyScan 2 controller.
7. Video Camera cable (see item 2; comes with AFM Video Module).

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 CHAPTER 1: THE EASYSCAN 2 AFM

8. AFM Sample stage (option).

9. AFM Tool set (option). The items contained in the AFM Tool set are described in the
next section.
10. The easyScan 2 Installation CD (not shown): Contains software, calibration files, and
PDF files of all manuals.
11. A calibration certificate for each easyScan 2 AFM Scan Head (not shown).
12. This easyScan 2 AFM Operating Instructions manual (not shown).
13. AFM Extended Sample Kit (option; not shown), which comes with a set of 10 samples
and description of experiments.
14. Micrometer Translation Stage (option; not shown).
15. User's Guide; Translation Stage, Model 9064 (not shown; comes with Micrometer
Translation Stage).
16. Positioning Tool Set (not shown; comes with the Micrometer Translation Stage).
17. Break-out cable (comes with Signal Module S).
18. Connector box (comes with Signal Module A).
19. Two Signal Module cables (come with Signal Module A).
20. Scripting Interface certificate of purchase with Activation key printed on it (not shown;
comes with Scripting Interface).
21. Lithography Option certificate of purchase with Activation key printed on it (not
shown; comes with the Lithography Option).
22. Instrument Case (not shown).
The package may also contain easyScan 2 STM head(s) and modules for the STM, which are
described in the easyScan 2 STM Operating Instructions.
Please keep the original packaging material (at least until the end of the warranty period),
so that it may be used for transport at a later date, if necessary. For information on how to
store, transport, or send in the instrument for repairs, see Section 7.3: Storing the instrument
(page 83).

1.2.1: Contents of the Tool Set

The content of the Tool set depends on the modules and options included in your order. It
may contain any of the following items:
1. Ground cable.
2. Protection feet.
3. Cantilever tweezers: (103A CA).
4. Screwdriver, 2.3 mm.

14
 CONNECTORS, INDICATORS AND CONTROLS

1 2 3 8
4 7
5 6

9 10 11 12

Figure 1-2: Contents of the Tool set

5. Cantilever insertion tool (usually mounted in the DropStop).

6. DropStop.
7. Sample holder (comes as an option with the AFM Sample Stage).
8. Samples (option). Possible combinations are:
a. AFM Large Scan Sample Kit (Grid: 10 μm / 100 nm, CD ROM piece).
b. AFM High Resolution Sample Kit (Grid: 660 nm, Graphite (HOPG) sample on
sample support).
c. Two calibration samples (Calibration grid: 10 μm / 100 nm, Calibration grid:
660 nm).
9. AFM Calibration Samples Kit (option) with three calibration samples (Calibration grid:
10 μm / 100 nm, Calibration grid: 660 nm, Flatness sample).
10. Set of 10 Static mode cantilevers (option).
11. Set of 10 Dynamic mode cantilevers (option).
12. USB dongle for Nanosurf Report or Nanosurf Analysis software (option).

1.3: Connectors, indicators and controls

Use this section to find the location of the parts of the easyScan 2 AFM that are referred to
in this manual.

1.3.1: The easyScan 2 AFM Scan Head

The location of the scan head parts listed below is shown in Figure 1-3: Parts of the Scan
Head.

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 CHAPTER 1: THE EASYSCAN 2 AFM

Levelling Scan head Hole for cantilever

screws serial number insertion tool

Camera
connector

Ground Scan head cable Cantilever on

connector connector alignment chip

Figure 1-3: Parts of the Scan Head. Scan Head with video Camera.

Leveling screws
For coarse approach of the sample (Section 4.4.1: Manual coarse approach (page 45)), and
for aligning the plane of the scanner with the plane of the sample (Section 5.2: Adjusting the
measurement plane (page 57)).
Scan Head cable connector
For connecting the Scan Head cable that also connects to the easyScan 2 Controller.
Ground connector
For connecting a cable that puts the sample or the Sample Holder at the same ground
potential as the scan head.
Alignment chip and hole for cantilever insertion tool
Used for mounting the cantilever on the scan head (Section 3.3: Installing the cantilever
(page 29)).
Scan Head serial number
Shows what serial number and version of the scan head you have.

1.3.2: The easyScan 2 Controller

Status lights
All status lights on top of the controller will light up for one second when the power is
turned on.

16
 CONNECTORS, INDICATORS AND CONTROLS

Module lights
Scan Head lights
Probe Status light

Video Out
connector Video In
(optional) connector
(optional)
Signal Out
connector Signal In Scan head
(optional) connector cable connector
(optional)
Controller
Power Serial number
S/N: 23-05-001
switch
USB outputs
(to dongle)
USB power
light
Mains power USB input USB active
connector (from PC) light

Figure 1-4: The easyScan 2 controller

The Probe Status light

Indicates the status of the Z-feedback loop. The Probe Status light can be in any of the
following states:
– Red
The scanner is in its upper limit position. This occurs when the tip–sample interaction is
stronger than the Setpoint for some time. There is danger of damaging the tip due to an
interaction that is too strong.
– Orange/yellow
The scanner is in its lower limit position. This occurs when the tip–sample interaction is
weaker than the Setpoint for some time. The tip is probably not in contact with the
sample surface.
– Green
The scanner is not in a limit position, and the feedback loop is able to follow the sample
surface.
– Blinking green
The feedback loop has been turned off in the software.

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 CHAPTER 1: THE EASYSCAN 2 AFM

– Blinking red
There is no laser signal with which to do feedback: see Section 9.3.1: Probe Status light
blinks red (page 91) for possible causes and for more information on how to resolve this
situation).
The Scan Head lights
Indicate the Scan Head type that is connected to the instrument. The Scan Head lights blink
when no Scan Head can be detected, or when the controller has not been initialized yet.
The Module lights
Indicate the modules that are built in into the controller. The module lights blink when the
controller has not been initialized yet. During initialization, the module lights are turned on
one after the other.
The Video Out connector
An RCA/cinch connector that outputs a PAL video signal that can be connected to a video
monitor.

18
CHAPTER 2:

Installing the easyScan 2

AFM
0
0
 CHAPTER 2: INSTALLING THE EASYSCAN 2 AFM

2.1: Installing the hardware

IMPORTANT
• Make sure that the mains power connection is protected against excess voltage
surges.
• Place the instrument on a stable support in a location that has a low level of building
vibrations, acoustic noise, electrical fields, and air currents.

IMPORTANT
• Never touch the cantilever tips, the cantilevers (Figure 1-2: Contents of the Tool set
(page 15), item 10 and item 11), or any part of the Cantilever deflection detection
system (Figure 3-2: Cantilever deflection detection system (page 30)).
• Ensure that the surface to be measured is free of dust and possible residues.
• Always put the Scan Head it in the Scan Head Case during transport and storage (see
Figure 7-2: Scan Head storage).

2.1.1: Installing the easyScan 2 controller

1 Connect the USB Cable (Figure 1-1: Components (page 13), item 4) to the easyScan 2
Controller (item 1), but do not connect it to the computer yet.

IMPORTANT
If you inadvertently connected the USB Cable to both the easyScan 2 Controller and a
running computer, Windows will attempt to install drivers for the newly found
hardware. When this happens, do the following:
• Do NOT break off the installation!
• Insert the Software Installation CD (if the Software Installation program should start,
choose “Exit” first) and follow the steps described for the USB Video Adapter in Section
2.2.4: Manual installation of the USB Video Adapter driver (page 25) to let Windows
search for the necessary drivers on this CD.
• When this process has finished, disconnect the USB cable from the computer, finish
the remaining steps below, and then go through the Software Installation procedure
as described in Section 2.2: Installing the SPM Control Software (page 23).

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 INSTALLING THE HARDWARE

2 Connect the Scan Head Cable (item 6) to the easyScan 2 controller but not to the Scan
Head (item 2) yet.
3 Connect the easyScan 2 Controller to the mains power using the Mains Cable (item 5),
but do not turn on the controller yet.

Figure 2-1: Measurement setup. Complete easyScan 2 AFM system with Sample Stage, Micrometer
Translation Stage, AFM Video Module and Signal Module A.

2.1.2: Installing the AFM Video Camera

To install the AFM Video Camera:
> Connect the Video Camera cable (Figure 1-1: Components (page 13), item 7) to the
connector on the AFM Video Camera (Figure 1-1: Components (page 13), item 2) and to
the Video In connector on the Controller (Figure 1-4: The easyScan 2 controller (page
17)).
To upgrade a system without Video Camera:
1 Order the upgrade from your Nanosurf distributor.
2 Send in the Scan Head and the Controller for mounting of the Video Camera on the
Scan Head and installation of the Video Module inside the Controller.
3 After the Controller has been returned, you should install the drivers for the AFM Video
Module (Section 2.2: Installing the SPM Control Software).

2.1.3: Installing the Signal Module S

To install the Signal Module S:

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 CHAPTER 2: INSTALLING THE EASYSCAN 2 AFM

> Connect the Break-out cable (Figure 1-1: Components (page 13), item 17) to the Signal
Out connector on the Controller (Figure 1-4: The easyScan 2 controller (page 17)).
In case of an upgrade, the Controller must be sent in to your local Nanosurf distributor for
installing the Signal Module S electronics inside the Controller.

2.1.4: Installing the Signal Module A and its Connector Box

To install the Signal Module A:
1 Connect one Signal Module cable (Figure 1-1: Components (page 13), item 19) to the
Signal Out connector on the Controller and to the Output connector on the Signal
Module A.
2 Connect the other Signal Module cable to the Signal In connector on the Controller
and to the Input connector on the Signal Module A.
In case of an upgrade, the Controller must be sent in to your local Nanosurf distributor for
installing the Signal Module A electronics in the Controller.

2.1.5: Installing the easyScan 2 AFM Scan Head

! WARNING
LASER RADIATION (650nm)
DO NOT STARE INTO THE BEAM
OR VIEW DIRECTLY WITH OPTICAL
INSTRUMENTS (MAGNIFIERS)
CLASS 2M LASER PRODUCT

• Always close the DropStop before inspecting or mounting a cantilever, or before

inspecting the alignment chip, especially when using optical instruments (magnifiers)
for the inspection.
• Never remove the lens cover from the Scan Head (nor remove the built-in top view
and side view lenses from the lens cover itself ), as this would remove the optical filters
that block back-reflected laser radiation and protect your eyes from laser damage.

Older Scan heads may contain lasers with 850 nm wavelength infrared light, and lower
optical power. These lasers have class 1 rating, which does not require special protection,
even when viewing the laser radiation directly with optical instruments. The wavelength
and laser class are indicated next to the serial number on the scan head (see Figure 1-3: Parts
of the Scan Head (page 16)).

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 INSTALLING THE SPM CONTROL SOFTWARE

To mount the Scan Head

1 Attach the Scan Head cable (Figure 1-1: Components (page 13), item 6) to the Scan
Head (Figure 1-1: Components (page 13), item 2) using the screwdriver (Figure 1-2:
Contents of the Tool set (page 15), item 4).
The cable has a helix shape in order to isolate the Scan Head from vibrations of the
table it is standing on. Take care that it is lying loosely on the table to ensure proper
operation, and avoid stretching it.
2 Place the Scan Head onto the AFM Sample Stage.
It is recommended to cover the instrument in order to shield it from near-infrared light
from artificial light sources, since this light may cause noise in the cantilever deflection
detection system. The optional Nanosurf Scan Protector is optimized for this task, and
additionally protects against noise and electrical interferences. Refer to the Scan Protector
manual for instructions on how to set up and use the Scan Protector correctly.
If the vibration isolation of your table is insufficient for your measurement purposes, use an
active vibration isolation table such as the Nanosurf isoStage or the Halcyoncis_i4. Refer to
the respective manuals for installation instructions.

2.2: Installing the SPM Control Software

2.2.1: Preparations before installing

Before installation, the following steps need to be performed:
1 Make sure the computer to be used meets the minimal computer requirements, as
described in Chapter 11: Technical data under Computer requirements (page 103).
2 When the easyScan 2 controller is connected to the computer via the USB cable,
disconnect it by unplugging the USB cable from the computer.
The easyScan 2 controller should only be connected to the computer when the
controller software and driver installation is complete.
3 Turn on the computer and start Windows.
4 Log on to your computer with Administrator privileges.

IMPORTANT
Do not run any other programs while installing the easyScan 2 software.

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 CHAPTER 2: INSTALLING THE EASYSCAN 2 AFM

2.2.2: Initiating the installation procedure

To initiate the installation procedure:
1 Insert the easyScan 2 Installation CD into the CD drive of the computer.
In most cases, the Autorun CD Menu program will open automatically. Depending on
your Autoplay settings, however, it is also possible that the Autoplay window opens,
or that nothing happens at all. In these cases:
> Click “Run CD_Start.exe” in the Autoplay window, or manually open the easyScan
2 Installation CD and start the program “CD_Start.exe”.

IMPORTANT
The easyScan 2 Installation CD contains calibration information (.hed files) specific to
your instrument! Therefore, always store (a backup copy of ) the CD delivered with the
instrument in a safe place.

2 Click the “Install easyScan 2 Software” button.

The CD Menu program now launches the software setup program, which will start
installation of all components required to run the Nanosurf easyScan 2 software.
In Windows Vista/7, the User Account Control (UAC) dialog may pop up after clicking
the “Install easyScan 2 Software” button, displaying the text “An unidentified program
wants access to your computer”. If the name of the program being displayed is
“Setup.exe”:
> Click the “Allow” button.
After the software setup program has started:
1 Click “Next” in the “Welcome”, “Select Destination Folder”, and “Select Start Menu
Folder” windows that sequentially appear, accepting the default choices in all dialogs.
2 When the “Ready to install” window appears, click on the “Install” button.
The setup program now performs its tasks without any further user interaction.
Depending on the configuration of your computer, a reboot may be required at the
end of the software installation process. If this is the case, the setup program will
inform you of this, and will provide you with the opportunity to do so.
This completes the software installation procedure. Proceed with Section 2.2.3: Hardware
recognition to complete the setup process.

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 INSTALLING THE SPM CONTROL SOFTWARE

2.2.3: Hardware recognition

To initiate the automatic hardware recognition process for the devices present in your
easyScan 2 controller:
1 Power on the easyScan 2 controller.
2 Connect the easyScan 2 controller to the computer with the supplied USB cable (Figure
1-1: Components (page 13), item 4).
A popup balloon appears in the Windows notification area, stating that new hardware
devices have been found and drivers are being installed. Depending on the
configuration of your controller and computer, the detection process can take quite
some time (20 seconds or more). Please be patient! After successful automatic
installation, the popup balloon indicates that the installation has finished and that the
devices are now ready for use.
With some older easyScan 2 controllers, manual installation of the Video Adapter drivers
will be required. This is indicated by the appearance of the “Found new Hardware” window
during hardware recognition. The procedure to install the respective drivers manually
differs slightly between Windows 2000/XP and Windows Vista/7, and is detailed in Section
2.2.4: Manual installation of the USB Video Adapter driver. On controllers where manual
installation of the USB Video Adapter driver is required, Hardware recognition and Manual
installation of the USB Video Adapter driver should be repeated for each of the computer’s
USB ports. It is recommended to do this now while you are logged on with Administrator
privileges.
This completes the hardware recognition process and the entire setup process. If you wish
to use the Lithography features of the easyScan 2 software and want to design your own
vector graphics for import into the lithography module, you can opt to install the
LayoutEditor software by clicking the “Install CAD Program” button in the CD Menu
program. This will launch the LayoutEditor installation program, which will guide you
through the CAD program setup. Otherwise, you may exit now by clicking the “Exit” button.

2.2.4: Manual installation of the USB Video Adapter driver

If required for your controller, follow the operating-system-specific instructions below for
manual installation of the Video Adapter driver. If Section 2.2.3: Hardware recognition (page
25) was completed automatically, this section can be skipped.

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 CHAPTER 2: INSTALLING THE EASYSCAN 2 AFM

Windows Vista/7
To manually install the USB Video Adapter driver:
1 In the “Found New Hardware” dialog for an “Unknown Device”, click the “Locate and
install driver software (recommended)” button.
The User Account Control (UAC) dialog may pop up after pressing this button,
displaying the text “Windows needs your permission to continue” for a “Device driver
software installation”. If this is the case:
> Click the “Continue” button.
2 In the next dialog, which states “Windows couldn’t find driver software for your
device”, click the “Browse my computer for driver software (advanced)” button.
3 In the next dialog, “Browse” to your CD drive (usually D:) or manually type “D:\” (or the
corresponding drive letter) into the Path field. Make sure “include subfolders” is
checked. Then click the “Next” button.
Windows begins searching the specified path, and — since an unsigned driver is found
— a Windows Security window opens, stating that “Windows can’t verify the publisher
of this driver software”
4 In the Windows Security window, click the “Install this driver software anyway” button.
The Found New Hardware window now displays a “USB Video Adapter” and driver
installation will take place.
5 When Windows has finished installing the Video driver software, click “Close”.

Windows 2000/XP
To manually install the USB Video Adapter driver:
1 When the “Found New Hardware” dialog displays the text “Can Windows connect to
Windows Update to search for software?”, select “No, not this time” and click “Next”.
2 In the next dialog, select “Install automatically (recommended)” and click “Next”.
Windows now begins searching for the appropriate driver, and — since an unsigned
driver is found — a Warning window opens, stating that “The software that you are
trying to install for this hardware: USB Video Adapter has not passed Windows Logo
testing for compatibility with Windows XP”.
3 In the Warning window, click the “Continue anyway” button.
Under some circumstances a “Files Needed” window may pop up. If this is the case:
> “Browse” to the Installation CD’s “DriverVideo” folder and click “OK”.
4 When Windows has finished installing the Video driver, click “Finish”.

26
CHAPTER 3:

Preparing for
measurement
0
0
 CHAPTER 3: PREPARING FOR MEASUREMENT

3.1: Introduction
Once the system has been set up (see Chapter 2: Installing the easyScan 2 AFM (page 19)),
the instrument and the sample have to be prepared for measurement. The preparation
consists of three steps: Initializing the easyScan 2 Controller, Installing the cantilever, and
Installing the sample.

3.2: Initializing the easyScan 2 Controller

To initialize the easyScan 2 controller:
1 Make sure that the easyScan 2 controller is connected to the mains power and to the
USB port of the control computer.
2 Turn on the power of the easyScan 2 controller.
First all status lights on top of the controller briefly light up. Then the Scan Head lights
and the lights of the detected modules will start blinking, and all other status lights
turn off.
3 Start the SPM Control Software on the control computer.
The main program window appears, and all status lights are turned off. Now a Message
“Controller Startup in progress” is displayed on the computer screen, and the module
lights are turned on one after the other. When initialization is completed, a Message
“Starting System” is briefly displayed on the computer screen, and the Probe Status
light, the Scan Head status light of the detected scan head, and the Module lights of
the detected modules will light up. If no scan head is detected, both Scan Head Status
lights blink.
4 In the Preparation group of the Acquisition tab you will see the currently selected
Operating mode and Cantilever type.
5 Determine which operating mode you wish to use.
Refer to Chapter 6: Operating modes (page 66) for the properties of the modes
available.
To change the operating mode:

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 INSTALLING THE CANTILEVER

> Select the desired operating mode from the Operating mode drop-down menu
by clicking the currently selected operating mode:

6 Determine which cantilever type you wish to use.

The cantilever suited for your measurements will depend on Measurement
environment, the selected Operating mode and on your sample.
To change the cantilever type:
> Select the desired cantilever type from the Cantilever type drop-down menu by
clicking the currently selected cantilever type:

3.3: Installing the cantilever

To maximize ease of use, the easyScan 2 AFM is designed in such a way that the cantilever
can quickly be installed and removed without having to re-adjust the cantilever deflection
detection system. The quick cantilever installation is possible because the Scan Head
contains a self-alignment system. The alignment system consists of a structure in the
alignment chip and matching grooves in the back side of the cantilever chip. The alignment
system positions the cantilever with micrometer accuracy (see Figure 3-1: Cantilever, left).
This accuracy is only guaranteed when the cantilever and the mounting chip are absolutely
clean. Installation of the cantilever should therefore still be carried out with great care. The
quality of measurements depends strongly on the accuracy of the installation.

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 CHAPTER 3: PREPARING FOR MEASUREMENT

Figure 3-1: Cantilever. (Left) Alignment system. (Center) Cantilever chip viewed from the top. (Right)
Cantilever, 450 μm long, 50 μm wide with integrated tip.

Sample illumination Cantilever

Photodetector Laser
Alignment chip
Cantilever
holder spring
Hole for cantilever
insertion tool

Figure 3-2: Cantilever deflection detection system

3.3.1: Selecting a cantilever

It is very important that the cantilever type is suitable for the operating mode that is used.
Stiffer and shorter cantilevers (e.g. NCLR, Nanoworld or Tap190Al-G, BudgetSensors) are
generally used for the Dynamic operating mode. More flexible and longer cantilevers (e.g.
CONTR, Nanoworld or ContAl-G, BudgetSensors) are generally used for the Static operating
mode.
To change to a different cantilever type:
> In the Preparation group of the Acquisition tab, select the desired cantilever type from
the “Mounted cantilever” drop-down menu by clicking the currently selected
cantilever type.
The various usable types are listed in Section 11.2.1: Specifications and features (page 100),
under Compatible cantilevers.

30
 INSTALLING THE CANTILEVER

3.3.2: Inserting the cantilever in the Scan Head

! WARNING
LASER RADIATION (650nm)
DO NOT STARE INTO THE BEAM
OR VIEW DIRECTLY WITH OPTICAL
INSTRUMENTS (MAGNIFIERS)
CLASS 2M LASER PRODUCT

• Always close the DropStop before inspecting or mounting a cantilever, or before

inspecting the alignment chip, especially when using optical instruments (magnifiers)
for the inspection.
• Never remove the lens cover from the Scan Head (nor remove the built-in top view
and side view lenses from the lens cover itself ), as this would remove the optical filters
that block back-reflected laser radiation and protect your eyes from laser damage.

Older Scan heads may contain lasers with 850 nm wavelength infrared light, and lower
optical power. These lasers have class 1 rating, which does not require special protection,
even when viewing the laser radiation directly with optical instruments. The wavelength
and laser class are indicated next to the serial number on the scan head (see Figure 1-3: Parts
of the Scan Head (page 16)).

CAUTION
• Nothing should ever touch the cantilever.
• The Cantilever Holder Spring is very delicate. NEVER touch or pull on it! It will become
bent and unusable otherwise!
• Always close the DropStop before handling the cantilever. If you fail to do so, the
cantilever can fall into the Scan Head, causing malfunction of the microscope,
particularly of the scanner.
• If a cantilever has dropped into the Scan Head, and the microscope is malfunctioning,
contact your local support. Never open the Scan Head, because this will cause
damage to the scanner and the laser beam deflection detection system.

To remove the old cantilever:

1 Put the Scan Head upside-down on the table.

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 CHAPTER 3: PREPARING FOR MEASUREMENT

2 Remove the Cantilever Insertion Tool from the DropStop

3 Close the DropStop (see Figure 3-3: Closing the DropStop).
The laser beam is now blocked by the DropStop. As a consequence, the Probe Status
light on the easyScan 2 controller will now blink red.
4 Place the cantilever insertion tool (Figure 1-2: Contents of the Tool set (page 15), item 5)
into the hole behind the alignment chip (Figure 3-4: Mounting the cantilever, top left).
The Cantilever Holder Spring opens.
5 Use the Cantilever Tweezers (figure Figure 1-2: Contents of the Tool set (page 15), item
3) to remove the old cantilever from the instrument (Figure 3-4: Mounting the cantilever,
top right).

CAUTION
Always store and ship the Scan Head with a cantilever installed. Otherwise, the
cantilever holder spring may damage the alignment chip.

Figure 3-3: Closing the DropStop

To insert the new cantilever:
1 Take the new cantilever out of its box with the cantilever tweezers.
2 Place the cantilever carefully on the alignment chip in the Scan Head (Figure 3-4:
Mounting the cantilever, top right).
3 Verify that the cantilever does not move with respect to the Alignment Chip by
carefully tapping on it with the tweezers.
If the cantilever does move, it is probably not inserted correctly. Refer to Figure 3-5:
Cantilever Alignment for correct alignment and examples of incorrect alignment.
4 Gently pull the cantilever insertion tool out of the hole.
The Cantilever Holder Spring closes and holds the cantilever chip tightly in position
(Figure 3-4: Mounting the cantilever, bottom right).

32
 INSTALLING THE CANTILEVER

Figure 3-4: Mounting the cantilever. (top left) inserting the cantilever insertion tool, (top right)
inserting/removing the cantilever, (bottom right) correctly inserted cantilever.

Figure 3-5: Cantilever Alignment. (Left) correct: the mirrored environment shows a reflection that is
continuous over the cantilever and the alignment chip, and small triangular gaps can be seen between
the edges of the alignment chip and the corners of the cantilever chip, (center & right) incorrect: the
mirrored environment shows a reflection that is different on the cantilever and on the alignment chip,
and no nice triangular gaps can be discerned.

5 Remove the DropStop.

The laser beam is now unblocked, and the Probe Status light on the easyScan 2
controller should now stop blinking red. If this is not the case refer to Section 9.3.1:
Probe Status light blinks red (page 91).

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 CHAPTER 3: PREPARING FOR MEASUREMENT

3.4: Installing the sample

3.4.1: Preparing the sample

The easyScan 2 AFM can be used to examine any material with a surface roughness that
does not exceed the height range of the scanning tip. Nevertheless the choice and
preparation of the surface can influence the surface–tip interaction. Examples of
influencing factors are excess moisture, dust, grease or other contaminations of the sample
surface. Because of this, some samples need special preparation to clean their surface.
Generally, however, only clean your samples if this is absolutely required, and be sure to
clean very carefully in order not to harm the sample surface.
If the surface is dusty, try to measure on a clean area between the dust. Although it is
possible to blow away coarse particles with dry, oil-free air, small particles generally stick
quite strongly to the surface and cannot be easily removed this way. Also note that bottled,
pressurized air is generally dry, but pressurized air from an in-house supply is generally not.
In this case an oil filter should be installed. Blowing away dust by breath is not advisable,
because it too is not dry, and the risk of contaminating the sample even further is very high.
When the sample surface is contaminated with solid matter or substances that can be
dissolved, the surface should be cleaned with a solvent. Suitable solvents are distilled or
demineralized water, alcohol or acetone, depending on the nature of the contaminant. The
solvent should always be highly pure in order to prevent accumulation of impurities
contained within the solvent on the sample surface. When the sample is very dirty, it should
be cleaned several times to completely remove partially dissolved and redeposited
contaminants. Delicate samples, which would suffer from such a treatment, can
alternatively be cleaned in an ultrasonic bath.

3.4.2: Nanosurf samples

Nanosurf delivers various optional samples, which are usually packed in the AFM Tool Set.
These samples are briefly described here. Further samples are available in the AFM
Extended Sample Kit, which contains its own sample description.
All samples should be stored in their respective box. This way, it should not be necessary to
clean them. Cleaning of the samples is generally not advisable (unless indicated below),
because their surfaces are often rather delicate.

Grid: 10 μm / 100 nm
The Grid: 10 μm / 100 nm can be used for testing the XY-calibration of the 70 μm and
100 μm scanners, and for testing the Z-calibration. It is manufactured using standard silicon

34
 INSTALLING THE SAMPLE

100 nm

10 µm

Figure 3-6: Structure of Grid: 10 μm / 100 nm

microfabrication technology, which produces silicon oxide squares on a silicon substrate. It

has a period of 10 μm and a square height of approximately 100 nm.
Sample specifications:
Size: 5 mm × 5 mm
Material: Silicon oxide on silicon
Structure: Square array of square hills of silicon oxide hills on silicon.
Grid period: 10 μm
Approximate height: 100 nm

Calibrated values of period and height (with 3% accuracy) are printed on the package.
Certified Calibration grids are available as an option.

Grid: 660 nm
The Grid: 660 nm can be used to test the XY-calibration of the 10 μm scanner. Depending
on the grid version, it consists either of:
• Silicon oxide hills on a silicon substrate with a period of 660 nm and an unspecified
height. The approximate height is 149 nm,
• Holes in a silicon oxide layer with a period of 660 nm and an unspecified depth. At the
time of writing, the approximate depth is 60 nm.

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 CHAPTER 3: PREPARING FOR MEASUREMENT

Sample specifications:
Size: 5 mm × 5 mm
Material: Silicon oxide on silicon
Structure: Square array of holes or hills in the silicon oxide layer
660 nm. Calibrated value of period (with 3% accuracy) is printed on the
Period:
package. Certified Calibration grids are available as an option.

60 nm

660 nm

Figure 3-7: Structure of Grid: 660nm (version with holes)

Flatness sample
The Flatness sample is a polished silicon sample. It can be used for testing the Flatness of
the scanned plane.
Sample specifications:
Size: 5 mm × 5 mm
Material: Silicon
Thickness: Approx. 320 μm

CD-ROM piece
Sample for demonstrating the AFM imaging. The CD sample is a piece from a CD, without
any coating applied to it.
Sample specifications:
Material: Polycarbonate
Structure: 100 nm deep pits arranged in tracks that are spaced 1.6 μm apart.

Microstructure
Sample for demonstrating AFM imaging (no longer available). The microstructure is
approximately the negative of the Grid: 10μm / 100nm. It consists of holes in a silicon oxide

36
 INSTALLING THE SAMPLE

layer with an unspecified period and depth. The approximate period is 10 μm, the
approximate depth is 100 nm.

Graphite (HOPG) on sample support

This sample can be used for STM as well as AFM measurements. In high resolution AFM
measurements, the atomic steps of the graphite surface can be seen. Conductivity
variations can be observed in Spreading Resistance mode.
Sample specifications:
Size: 5 mm × 5 mm
Material: Highly Oriented Pyrolytic Graphite (HOPG)
Sample support: Magnetic Steel disc, galvanized with Nickel.

The surface of the graphite sample can be cleaned when it is very dirty or uneven. Due to
the layered structure of graphite this can easily be done using a piece of adhesive tape
(Figure 3-8: Cleaving graphite):
1 Put the sample on the table using a pair of tweezers.
2 Stick a piece of adhesive tape gently to the graphite and then pull it off again.
The topmost layer of the sample should stick to the tape.
3 Remove any loose flakes with the tweezers.
The graphite sample is now ready for use and should not be touched anymore.

Figure 3-8: Cleaving graphite

3.4.3: Stand-alone measurements

You can either use the instrument with a sample stage, or as a stand-alone instrument. The
sample stage offers vibration isolation, and a stable scan head mount. Therefore, only
operate the instrument as a stand-alone when the sample is too large for the sample stage.

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 CHAPTER 3: PREPARING FOR MEASUREMENT

For stand-alone measurements, put the Scan head directly on top of the sample. Protection
feet to be placed under the three alignment screws are provided to protect delicate
samples from being scratched (Figure 1-2: Contents of the Tool set (page 15), item 2).

3.4.4: The Sample Stage

The Sample Stage (Figure 1-1: Components (page 13), item 8) offers vibration isolation and
reproducible scan head placement (see Figure 3-9: The easyScan 2 AFM Scan Head on its
Sample Stage), and can be used to comfortably position a sample. An optional Micrometer
Translation Stage for XY-positioning can be mounted on the Sample Stage. The sample can
either be put directly on the sample stage, or mounted onto the Sample Holder (Figure 1-2:
Contents of the Tool set (page 15), item 7) before measurement (see Section 3.4.5: Mounting
a sample).

Figure 3-9: The easyScan 2 AFM Scan Head on its Sample Stage

3.4.5: Mounting a sample

Samples may either be placed directly onto the sample stage, or first mounted onto the
Sample Holder before being placed there.
To mount a sample onto the Sample Holder:
1 Put a double-sided adhesive tape on the frontside of a Post-it® note, so that it is on the
opposite side of the sticky part.
2 Cut off all parts of the note that do not have adhesive tape on it.
3 Fix the tape-side of the prepared note to the Sample Holder.

38
 INSTALLING THE SAMPLE

Figure 3-10: Sample mounted onto the Sample Holder

4 Put the sample on the sticky side of the Post-it® note, and press on it lightly.
The result should resemble Figure 3-10: Sample mounted onto the Sample Holder.
5 Remove the scan head and place the Sample Holder on top of the Sample plate.
It is recommended to always connect the Sample Holder to the ground connector on
the Scan Head using the ground cable.
6 Place the scan head back onto the Sample Stage, but be sure to keep a safe distance
between the cantilever and the sample surface. If necessary, adjust the tip–sample
distance via the leveling screws before placing back the scan head.

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 CHAPTER 3: PREPARING FOR MEASUREMENT

40
CHAPTER 4:

A first measurement
0
0
 CHAPTER 4: A FIRST MEASUREMENT

4.1: Introduction
In this chapter, step-by-step instructions are given to operate the microscope and to
perform a simple measurement. More detailed explanations of the software and of the
system can be found elsewhere in this manual.

4.2: Running the microscope simulation

The SPM Control Software can be started without having the microscope connected to
your computer in order to explore the easyScan 2 system (measurements and software)
without danger of damaging the instrument or the cantilever. In simulation mode, most
functions of the real microscope are emulated. The sample is replaced by a mathematical
description of a surface.
When the SPM Control Software is started without a microscope connected to your
computer, the following dialog appears:

> Click “OK”.

The status bar will now display the text “Simulation”.
You can also switch to simulation mode with the microscope connected:
> In the Hardware group of the Settings tab, click the “Simulation” button.
The “Simulation” button will now be highlighted and the status bar will display the text
“Simulation”.
To exit the microscope Simulation mode:
> In the Hardware group of the Settings tab, click the “Simulation” button again.
The highlighting of the “Simulation” button will now disappear, and the status bar will
display the text “Online”.

42
 PREPARING THE INSTRUMENT

4.3: Preparing the instrument

IMPORTANT
• Never touch the cantilever or the surface of the sample! Good results rely heavily on a
correct treatment of the tip and the sample.
• Avoid exposing the system to direct light while measuring. This could influence the
cantilever deflection detection system and reduce the quality of the measurement.

Prepare the instrument as follows (see Chapter 3: Preparing for measurement (page 27) for
more detailed instructions):
1 If you have the AFM Dynamic Module, install an NCLR type cantilever, otherwise install
a CONTR type cantilever.
2 Install one of the samples from the Nanosurf AFM Basic Sample Kit or Calibration
Sample Kit. Preferably, install the 10 μm Calibration grid when using a 70-μm or 110-
μm scan head, and the 660 nm Calibration grid when using a 10-μm scan head.
The measurement examples shown here were made with the 10 μm Calibration grid.
To make sure that the configuration is correct, do the following:
1 Open the menu item “File” >> “Parameters” >> “Load...”, and load the file “Default_EZ2-
AFM.par” from the directory that holds the default easyScan 2 configurations.
Usually this is “C:\Program Files\Nanosurf\Nansurf easyScan 2\Config”.
2 Open the menu item “File” >> “Chart Arrangement” >> “Load...”, and load the file
“Default_EZ2-AFM.chart” from the directory that holds the default easyScan 2
configurations.

4.3.1: Entering and changing parameter values

Parameter values can be found in the parameter sections of the Operating windows and in
special dialogs. Depending on your measurement or optimization thereof, you may from
time to time need to change or enter new values.
To change a parameter or enter a value:
1 Activate the parameter by clicking inside the (white) parameter edit box with the
mouse:

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 CHAPTER 4: A FIRST MEASUREMENT

2 In case of a drop-down menu selection list, change the selection using the mouse or
the up and down arrows on the keyboard. In case of a numerical value, use one of the
following methods:
• Use the up and down arrow keys on the keyboard to increase or decrease its value.
The new value is automatically used after one second.
• Click the arrow buttons next to the parameter value with the mouse pointer.
Normally, the parameter value is changed by a small amount (usually in the range of
1–10%). Some edit boxes are doubling or dividing the parameter value by two (e.g.
the “points/line” parameter). The new value is automatically used after one second.
• Enter the new value using the keyboard. The entered value is applied upon pressing
the “Enter” or “Return” key, or by activating another input. The entered value is
discarded upon pressing the “Esc” key. The unit prefix can be changed by typing one
of the following keyboard keys:
f = femto space bar = no prefix
p = pico k = kilo
n = nano M (shift-m) = mega
u = micro G (shift-g) = giga
m = milli T (shift-t) = tera
Examples: if the basic unit is Volts, type “m” to change to millivolts, type the space
bar for volts, type “u” for microvolts.
Sometimes the program will change an entered value to a slightly different value. This
happens when the desired value is outside the digitization range of the easyScan 2
controller, for example due to resolution or timing limits. In such cases, the desired
value is automatically changed to the nearest possible value.

4.4: Approaching the sample

To start measuring, the cantilever tip must come within a fraction of a nanometer of the
sample without touching it with too much force. To achieve this, a very careful and sensitive
approach of the cantilever is required. This delicate operation is carried out in three steps:
Manual coarse approach, Manual approach using the motorized approach stage, and the
Automatic final approach. The color of the Status light on the controller shows the current
status of the approach:
– Orange/yellow
Normal state during approach: the Z-scanner is fully extended toward the sample.
– Red
The approach has gone too far: the tip was driven into the sample, and the Z-scanner is
fully retracted from the sample. In this case, the tip is probably damaged and you will
have to install a new cantilever again.

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 APPROACHING THE SAMPLE

– Green
The approach has finished successfully: the Z-scanner is within the measuring range.
To prepare for the approach process:
> Select the Acquisition tab
The controls for positioning the cantilever with respect to the sample are located in the
Approach group.
During the approach steps described in the following sections, use the side view of the
cantilever to judge the distance between tip and sample surface:
> If the AFM Video Camera is installed, select “Side view” in the Video panel located in
the Info pane (see Section 13.6: Video panel (page 135)).
If the Video Camera is not installed, use the side view lens of the scan head to observe
the sample instead.

4.4.1: Manual coarse approach

In this step, the sample surface is brought within the range of the motorized approach
stage of the Scan Head.
To perform a manual coarse approach:
> Use the three leveling screws to lower the Scan head so that the cantilever is within 1–
2 mm of the sample (see Figure 1-3: Parts of the Scan Head (page 16)). Take care that the
Scan head remains parallel to the sample surface by approximately turning all screws
equally.
The side view should now look as shown in Figure 4-1: Side view of the cantilever after
manual coarse approach. When the sample is reflective, the mirror image of the
cantilever should be visible. When the sample is not reflective, the shadow of the
cantilever may be visible. If neither a mirror image nor a shadow is visible, change the
environment light until it is. You can use the cantilever as a ruler to judge distances in
the views of the integrated optics.

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 CHAPTER 4: A FIRST MEASUREMENT

Figure 4-1: Side view of the cantilever after manual coarse approach.

4.4.2: Manual approach using the motorized approach stage

In this step, the tip is brought as close to the sample surface as possible, without touching
it. The closer the two are together, the less time the automatic final approach takes.

1 Observe the distance between tip and sample in the side view of the integrated optics.

Figure 4-2: View of sample and cantilever after manual approach using the motorized approach
stage. (Left) side view, (Right) top view.

46
 APPROACHING THE SAMPLE

2 While observing the tip–sample distance, click and hold the “Advance” button in the
Approach group of the Acquisition tab until the tip is close enough to the sample:

The tip should not come closer to the sample than a few times the cantilever width
(Figure 4-2: View of sample and cantilever after manual approach using the motorized
approach stage, left).
Now that the sample is in focus, the top view image can be used to find a suitable location
to measure on. In top view, the sample is seen from a direction perpendicular to its surface
(see Figure 4-2: View of sample and cantilever after manual approach using the motorized
approach stage, right).
To use the top view:
1 If the AFM Video Camera is installed, select Top view in the Video panel (see Section
13.6: Video panel (page 135)). If the Video Camera is not installed, use the top view lens
to observe the sample instead.
2 If necessary, move the Sample Holder to find a suitable location that is free of dust
particles.

4.4.3: Automatic final approach

In this last step, the tip automatically approaches the sample until a given Setpoint is
reached. Before starting the automatic approach, select the desired operating mode and
cantilever type. To do this:
> In the Preparation group of the Acquisition tab, select an operating mode and
cantilever type that match the cantilever installed.
In Dynamic Force mode, the instrument will automatically determine the vibration
frequency to be used during imaging. To determine the optimal frequency, the controller
performs a coarse and a fine frequency sweep in which the cantilever vibration amplitude
(and — in Phase Contrast mode — also the phase) are recorded as a function of excitation

47
 CHAPTER 4: A FIRST MEASUREMENT

frequency. It is instructive to see both frequency sweep measurements in all detail at least
once. To do this, it is possible to manually perform the frequency sweeps:
1 In the Preparation group of the Acquisition tab, click the “Freq. Sweep” button:

The Vibration Frequency Search dialog now opens (see Section 17.11: Vibration
Frequency Search dialog (page 239) for details).
2 Click the “Auto frequency set” button.
The SPM Control Software now sets appropriate values for the coarse and fine sweeps
and performs these sweeps. The fine sweep will overwrite the data of the coarse
sweep in the charts displayed in the “Vibration frequency search” dialog. To see the
results of the individual sweeps:
> Press the “Coarse sweep” and “Fine sweep” buttons sequentially.
Before final approach of the sample, it is necessary to set the scanning and feedback
parameters of the control software to suitable initial values. The easiest way to do this is to
use the “Auto Set” wizard:
1 In the Preparation group of the Acquisition tab, click the “Auto Set” button:

A dialog will pop up, which will ask you some basic questions about your sample and
your measurement needs.
2 Answer the questions of the wizard to the best of your knowledge.
For descriptions of the features of standard Nanosurf samples refer to Section 3.4.2:
Nanosurf samples (page 34).
Now that the initial software settings have been given suitable values, you need to name
the measurement series (see Section 16.4.1: History File mask (page 182)). Each completed
measurement (scan/image) will be temporarily saved (automatically) in the History folder
under this name, with index numbers (or, optionally, date and time attributes) added to
identify the individual measurements. It is best to enter the measurement series’ name
now, since the control software will (by default) start measuring as soon as the final
approach is done. It is also strongly recommended to move all relevant measurements to a

48
 STARTING A MEASUREMENT

new folder when you are finished, since the files in the History folder will be overwritten
over time (see Max History Files (page 211)).
To set the measurement series name:
1 Activate the Gallery panel (see Section 16.4: Gallery panel (page 181)) in the Info pane.
2 Click the History tab at the top of the Gallery panel with the mouse.
3 In the entry box at the top of the panel, enter a name by hand or use the Mask Editor
dialog (see Section 16.4.4: Mask Editor dialog (page 183)) to create the name mask.
If no [INDEX] attribute is explicitly added to the name mask, it will be implicitly applied
to the end of the file name so that individual measurements can be stored and
distinguished.
The automated final approach can now be started. To do this:
1 In the Approach group of the Acquisition tab, click the “Approach” button:

The cantilever is moved towards the sample via the approach stage, with the Z-
Controller turned on. This movement continues until the Z-Controller error becomes
zero. From this point onward, the distance between sample and tip is maintained
automatically by the electronics. The probe status light changes to a constant green,
and a message “Approach done” appears:

2 Click the “OK” button.

If the automatic final approach fails, refer to Section 9.3: AFM measurement problems (page
91) for the next steps to take.

4.5: Starting a measurement

Now that the tip–sample interaction defined by Setpoint is established between tip and
sample, measurements can start. By default, the instrument is set to automatically start
measuring after the automatic approach. If this is not the case:

49
 CHAPTER 4: A FIRST MEASUREMENT

> Start measurements manually by clicking the “Start” button in the Imaging group of
the Acquisition tab:

Two representations of the ongoing measurement are drawn in the Imaging panel. One
representation is a color coded height image (Topography) called a Color map. The other is
a plot of height as a function of X* position called a Line graph. With the current settings,
the software automatically adjusts the contrast of the Color map, and height range of the
Line graph to the data that have been measured.
To judge the imaging quality, watch the displays until at least one fourth of the
measurement has been completed.

IMPORTANT
Measurements on the micrometer/nanometer scale are very sensitive to environment
influences. Direct light or fast movements — causing air flow and temperature
variations near the Scan Head — can influence and disturb the measurement.

When a measurement contains large disturbances, or no two scan lines are similar, stop
measuring and reduce or eliminate the disturbances. To do this:
> Click the “Stop” button in the Imaging group of the Acquisition tab and follow the
instructions in Chapter 9: Problems and solutions (page 87):

4.6: Selecting a measurement area

If you were able to prepare your measurement so that the scan line in the Line graph
reproduces stably, the color map graph should look similar to the one shown below after
the measurement has finished.
To zoom in to an interesting part of the measurement:
1 Activate the color map graph by clicking on it.

50
 SELECTING A MEASUREMENT AREA

Figure 4-3: Zooming in on an overview measurement

2 Click the “Zoom” button in the Chart bar:

The mouse pointer becomes pen-shaped when moving over the color map.
3 Click on one corner of the region to be selected using the left mouse button, and keep
the button pressed.
4 Drag the mouse to the other corner of the region.
The size and the position of the square are shown in the Tool results panel of the Info
pane.
5 Release the mouse button when the size of the square covers approximately one
period of the grid.
6 Confirm the selection by double clicking the color map graph using the left mouse
button. Now the selection is enlarged to the whole display size. You can abort the
zoom function by clicking the “Zoom” button again.
The microscope will now start measuring a single grid period. Once the measurement is
completed, you should get an image such as the one in Figure 4-4: Zoomed measurement,
left. The depression in the sample surface to the sides of the structure is due to the LineFit
data filter used. To remove it, click on “LineFit” and select the data filter “Raw Data” from the
drop-down menu. The chart will now look like Figure 4-4: Zoomed measurement, right.

51
 CHAPTER 4: A FIRST MEASUREMENT

Figure 4-4: Zoomed measurement. (Left) with line subtraction, (Right) without line subtraction.

4.7: Storing the measurement

By default, each completed measurement is temporarily stored (automatically) on your
computer so that it can be used later. Additionally, you can also take snapshots of
measurements still in progress. To do this:
> Click the “Capture” button in the Chart bar:

The current measurement is immediately stored and will show up in the History page
of the Gallery panel, together with all other finished/stored measurements (see Section
16.4: Gallery panel (page 181) for details). In addition, the captured document will
remain open in the Document space of the SPM Control Software.
Measurement documents in the temporary History folder should always be moved to a
new location for permanent storage when you are done measuring. For details on how to
do this, see Save as (page 182). Measurement documents thus permanently stored can
always be loaded with the SPM Control Software or the optional Nanosurf Report or
Nanosurf Analysis software packages for later viewing, analysis, and printing. A brief
introduction on how to create a basic report using the Report software is given in the next
section. For more detailed information on starting and using the Report software, see
Section 22.2: Creating a report (page 452), or refer to the Nanosurf Report online help.

52
 CREATING A BASIC REPORT

4.8: Creating a basic report

The optional Nanosurf Report software can be used to evaluating the measurement, and
to create visually appealing reports. Here, we will just start the software and create a basic
report.
To create a basic report of a completed measurement:
1 Open a measurement from the Gallery panel.
2 In the Report group of the Analysis tab, click the “Report” button.

The Nanosurf Report software will now launch, import the currently open
measurement, and evaluate the data using the default template.

IMPORTANT
After a fresh installation of the Report software, the Report software has to be run at least
once before it can be automatically started from within the SPM Control Software. To run
the Report software for the first time, select it from the Microsoft Windows “Start” menu.

4.9: Further options

From this point on, there are several things that can be done. Please refer to the respective
chapters for detailed instructions:
• Performing a new measurement on another sample by repeating the instructions given
in Chapter 3: Introduction and Chapter 4: A first measurement with the new sample.
• Improving measurement quality, as described in Chapter 5: Improving measurement
quality (page 55).
• Performing a different type of measurement by choosing a different operating mode, as
described in Chapter 6: Operating modes (page 66).
• Finishing measurements, turning off the instrument, and/or storing the instrument, as
described in Chapter 7: Finishing measurements (page 81).

53
 CHAPTER 4: A FIRST MEASUREMENT

54
CHAPTER 5:

Improving measurement
quality
0
0
 CHAPTER 5: IMPROVING MEASUREMENT QUALITY

5.1: Removing interfering signals

Interfering signals can be recognized because they have a fixed frequency, usually a
multiple of the local mains frequency (50 or 60 Hz) throughout the image. Thus, they are
manifested by straight lines that run throughout the entire image.
Possible interference sources are:
• Mechanical vibrations from machines or heavy transformers in direct vicinity (e.g.
pumps).
• Electrical interference (in the electronics, or in electrical forces of the tip–sample
interaction).
• Infrared or other light sources (light bulbs, sample illumination in an inverted microscope).

5.1.1: Mechanical vibrations

Measure the frequency of the vibrations to find out if the interference is due to mechanical
vibrations. Such vibrations have a frequency that is (a multiple of ) the rotation frequency
of the source. This frequency is usually not a multiple of the local mains frequency, and may
change slightly over time. Try the following to find out if the interfering signal is due to
mechanical vibrations:
1 If possible, turn off all rotating machines (i.e. pumps) in the room.
2 Change the vibration isolation by putting the Scan Head directly on the table, instead
of on the Sample stage.
To reduce the influence of these vibrations, either improve the isolation of these machines,
or improve the isolation of the instrument by using a vibration isolation table (e.g. the
optional TS-150 active vibration isolation table).

5.1.2: Electrical interference

Electrical interference may be caused by interference in the electronics, or by electrostatic
forces acting between the tip and the sample. Try the following in order to reduce the
influence of electrical interference:
1 Connect the instrument to the mains power supply using sockets with line filters and
surge protection.
2 Connect the sample, the sample support, or the Sample Holder, or the Sample Stage
to the ground connector on the Scan Head using the ground cable (Figure 1-2:
Contents of the Tool set (page 15), item 1).

56
 ADJUSTING THE MEASUREMENT PLANE

3 Remove interfering electromagnetic field sources, such cathode ray tube displays,
loudspeakers, …

5.1.3: Infrared or other light sources

Infrared and other light sources can influence the cantilever deflection detection system.
This problem is especially severe when measuring in the Static Force mode. Try the
following in order to reduce the influence of infrared light sources:
1 Turn off the light.
2 Shield the instrument from external light sources.
3 When using the instrument with an inverted microscope, use filters that filter out
infrared light.

5.2: Adjusting the measurement plane

Ideally, the sample surface and the XY-plane of the scanner run parallel to each other. In
most cases, however, the sample plane is tilted with respect to the XY-plane of the scanner.
In this case, the sample cross section in the X* measurement direction has a certain slope.
The Line graph chart in Figure 5-1: Maladjusted slope is an example.
This slope depends on the direction of the X* direction and therefore on the rotation of the
measurement, as shown in Figure 5-2: Sample and measurement orientation before slope
adjustment.
This slope is undesirable for several reasons:
• It makes it difficult to see small details on the sample surface, because the Average, Plane
fit, or higher order filters cannot be used properly.
• The Z-Controller functions less accurately, because it continuously has to compensate for
the sample slope.
Ideally, the XY-plane of the scanner has already been correctly aligned with the sample
plane using the three leveling screws on the Scan Head. This alignment can, however, not
easily be performed once the automatic approach has been done, as this would damage
the tip. After approach, the measurement plane should therefore be adjusted
electronically. This can be done automatically or manually. Both procedures are described
below.

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 CHAPTER 5: IMPROVING MEASUREMENT QUALITY

Figure 5-1: Maladjusted slope. Measurement with improperly set X*-slope.

'Rotation'
angle
Measurement plane
'Y-Slope'
angle Y* X*
Image area

'X-Slope' angle
Y
X Scanner XY-plane
Z, Z*
Figure 5-2: Sample and measurement orientation before slope adjustment

58
 ADJUSTING THE MEASUREMENT PLANE

Figure 5-3: Adjusted slope. Measurement with properly set X*-slope.

To automatically adjust the measurement plane once:

1 In the Parameters section of the Imaging panel, click the “More” button:

The SPM Parameter dialog will now open (see Section 17.9: SPM Parameters dialog
(page 221) for details). This dialog contains all possible parameters and settings that
influence the behavior of your Nanosurf easyScan 2 AFM system.

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 CHAPTER 5: IMPROVING MEASUREMENT QUALITY

2 Make sure that “Imaging” is selected in the SPM Parameter dialog:

3 Click the “Adjust slope” button:

The SPM Control Software will automatically perform a slope determination

procedure similar to the manual procedure described below and will enter the slope
angles into the X- and Y-Slope parameters.

IMPORTANT
If the sample surface contains large jumps or steps in height, the line fitting procedure
used to determine the slope in X- and Y-direction may not deliver the best possible
results. In such cases it is recommended to perform a manual slope adjustment as
described below.

To automatically adjust the measurement plane before each measurement:

> Check the “Auto set” checkbox next to the “Adjust slope” button.
To manually adjust the measurement plane:
1 Measure the slope for X in the Line graph using the angle tool (see Measure Angle
(page 189)).
Use a single click instead of dragging the first line to create a horizontal line and
measure the angle relative to the X*-Axis.
2 Enter the result of the angle determination as X-Slope (see Imaging options (page 223))
and fine-tune its value until the X-axis of the scan line lies parallel to the X-axis of the
sample.
3 Set Rotation to 90° to scan along the Y-direction of the scanner.
4 If the scan line in Y-direction is not horizontal, perform the same procedure as
described for correction of the slope in X but now for Y.
5 Reset “Rotation” to 0°.
The scanner scans in X-direction again.

5.3: Judging tip quality

When all prerequisites for measurement are optimal, the measurement quality mainly
depends on the quality of the tip. A good tip quality is essential for high quality images and
high resolution.

60
 JUDGING TIP QUALITY

When the image quality deteriorates dramatically during a previously good measurement,
the tip has most probably picked up some material from the sample. As a result, the image
in the color map charts consist of uncorrelated lines or the image appear blurred (see
Chapter 5: Measurement containing tip artifacts). In such cases:
> Follow the suggestions in Section 9.3.3: Image quality suddenly deteriorates (page 92).
If these do not help, the cantilever should be replaced.
When all peaks in the image have the same, usually triangular shape, the sharp end of the
tip may have broken off. The measured structure reflects the shape of the tip rather than
that of the sample and is called a tip artefact. In such cases:
> Replace the cantilever.

Figure 5-4: Measurement containing tip artifacts

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 CHAPTER 5: IMPROVING MEASUREMENT QUALITY

62
CHAPTER 6:

Operating modes
 CHAPTER 6: OPERATING MODES

6.1: Introduction
This chapter instructs you on how to use the Static Force mode, Dynamic Force mode, Phase
Contrast mode, Force Modulation mode, and Spreading Resistance mode. If you are unfamiliar
with Atomic Force Microscopy techniques, it is recommended to first read Chapter 10: AFM
theory (page 95).The amount of available modes depends on the Scan head and the
available modules built into the easyScan 2 controller. The modules required to be able to
use a certain operating mode are listed in Table 6-1: Operating modes and required modules.
If additional hardware is required, it will be discussed in the respective section explaining
the measurement mode.

Operating mode Required modules

Static Force AFM Basic
Dynamic Force AFM Basic, AFM Dynamic
Phase Contrast AFM Basic, AFM Dynamic, AFM Mode Extension
Force Modulation AFM Basic, AFM Dynamic, AFM Mode Extension
Spreading Resistance AFM Basic, AFM Mode Extension
Kelvin Probe Force AFM Basic, AFM Dynamic, Signal Module A
Table 6-1: Operating modes and required modules

6.2: Static Force mode

In the Static Force mode, the “static” deflection of the cantilever is used as the error signal
for the Z-Controller. The Setpoint in Newton is calculated by multiplying the deflection with
the spring constant of the selected cantilever. In order to minimize tip/sample wear, the
force Setpoint should be made as small as possible. In some cases, even a negative Setpoint
(i.e. an adhesive force) may work, but when the tip momentarily loses contact with the
sample due to some disturbance, the Z-Controller will always fully retract the cantilever
from the sample. Moreover, working in this range may cause image artifacts due to
instabilities in the tip–sample contact.
Both the Force Modulation mode and the Spreading Resistance mode are an extension of
the Static Force mode.
The procedure for a first Static Force mode measurement is almost identical to the
procedure described for the Dynamic Force mode in Chapter 4: A first measurement (page
41). In contrast to the description given there, however, do the following:
1 Select a cantilever suitable for static force mode (e.g. CONTR).
2 Install the cantilever as described in Section 3.3: Installing the cantilever (page 29).
3 Select this cantilever type in the Preparation group of the Acquisition tab.

64
 DYNAMIC FORCE MODE

4 Select the Static Force mode in this group as well.

5 Set the force Setpoint in the Z-Controller section of the Imaging window.
For a more detailed description of the parameters that can be set, refer to Section 17.9.4:
Operating Mode (page 229).

6.3: Dynamic Force mode

In the Dynamic Force mode, changes in the dynamic behavior of the cantilever are
detected by measuring changes in its vibration amplitude when it is excited with a
sinusoidal signal with a frequency close to the free resonance frequency of the cantilever.
When the cantilever tip comes close to the sample surface, this vibration amplitude will
generally go down. Thus the Setpoint is the percentage of the vibration amplitude that
remains when the cantilever is close to the sample surface compared to the vibration
amplitude when the cantilever is far away from the surface. A small percentage means a big
reduction, and a large percentage means a small reduction. To minimize tip/sample wear,
the Setpoint should be set as large as possible. However, when the Set-point becomes too
large, the Z-Controller may not be able to optimally follow the sample surface, and artifacts
may occur due to instabilities in the cantilever vibration.
The procedure for a first Dynamic Force mode measurement is described for the Dynamic
Force mode in Chapter 4: A first measurement (page 41). For more information on how the
vibration amplitude and frequency are set, refer to Section 17.9.4: Operating Mode (page
229) and Section 17.11: Vibration Frequency Search dialog (page 239).

6.4: Phase Contrast mode

The Phase Contrast mode is an extension of the Dynamic Force mode. Therefore, the same
cantilevers can be used as for Dynamic force mode. In addition to the vibration amplitude,
the phase shift between the cantilever vibration and a reference signal is measured. This
phase shift changes when the resonance characteristic of the cantilever changes due to
changes in the tip–sample interaction. Thus, the Phase contrast mode can be used to
produce material contrast when there is a significant difference in the tip sample
interaction of these materials. This section gives a brief description of how to operate the
easyScan 2 AFM in phase contrast mode. For a more detailed description of the parameters
that can be, refer to section Section 17.9.4: Operating Mode (page 229).
The phase contrast mode can also be used to do Magnetic and Electrostatic Force
Microscopy. For more information on how to do Magnetic Force Microscopy, refer to
technical note TN00031 Magnetic Force Microscopy, which can be downloaded from the
support section of the Nanosurf web site at www.nanosurf.com.

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 CHAPTER 6: OPERATING MODES

Phase measurement
In Phase contrast mode, the phase of the measured cantilever vibration is compared to the
phase of a reference sine wave. The phase comparison is performed by multiplying the
measured vibration signal with the reference. The measured phase, φmeasured , is the output
of this multiplication, and is related to the actual phase shift between the measured
vibration and the excitation sine wave, φactual , according to the following equation:

φmeasured = 90° sin ( φactual – φreference ) ,

where φreference is a reference phase that can be set by the user. This has two important
consequences:
1. The measured phase shift lies between –90° and +90°; phase shifts outside this range
are folded back into the –90° to +90° range. The measurement does not distinguish
between phase φ and phase φ + 180°.
2. The phase shift measurement becomes less sensitive when the phase approaches
+90° and –90°.
Note that the phase of the cantilever vibration changes by 180° symmetrically around its
resonance frequency. This phase shift only fits into the –90° to +90° range when the
reference phase is set in such a way that it is zero at the resonance frequency. However, the
operating frequency is generally set to be different from the resonance frequency. In such
cases, the reference phase is automatically set so that the phase shift is zero at the
operating frequency. Thus, part of the frequency spectrum of the phase shift will be folded
back into the –90° to +90° range (Figure 6-5: Phase shift folded back).

Figure 6-5: Phase shift folded back. Frequency spectrum with phase shift folded back over the +90°
limit.

Operating the easyScan 2 AFM in Phase Contrast mode

To operate the easyScan 2 AFM in Phase Contrast mode:

66
 FORCE MODULATION MODE

> Select the Phase Contrast mode in the Preparation group of the Acquisition tab.
A new Color map and line chart for the phase data will automatically be added to the
chart area. If necessary, you can increase the size of the measurement pane to make
room for the new charts.
After approach, the reference phase is usually set automatically in such a way that the
average phase shift lies in the center of the measurement range. To re-adjust the phase
shift:
Click the “Freq. Sweep” button in the Preparation group of the Acquisition tab.
If you do not want the reference phase to be set automatically:
1 Open the SPM Parameter dialog by clicking the “More” button in the Mode Properties
section of the Imaging window.
2 Uncheck the reference phase “Auto set” checkbox.
3 Enter the reference phase manually using the “Reference phase” input box.

6.5: Force Modulation mode

The Force Modulation mode is an extension of the Static force mode. The static force acting
on the cantilever is still used to produce a topography image of the sample.
Simultaneously, the cantilever is excited and the resulting vibration amplitude measured.
The vibration amplitude depends on the drive amplitude, the stiffness of the cantilever
and, most importantly, the stiffness of the tip–sample contact. Thus, the force modulation
mode can be used to produce material contrast when there is a significant difference in the
stiffness of the tip–sample contact of these materials. This section gives a brief description
of how to operate the easyScan 2 AFM in force modulation mode. For a more detailed
description of the parameters that you can set, refer to Section 17.9.4: Operating Mode (page
229).
To operate the easyScan 2 AFM in the Force Modulation mode:
1 Select a cantilever that has a spring constant that is suitable for the sample stiffness
that you expect.
Good results were obtained with LFMR-type cantilevers. The FMR type cantilever,
which is explicitly sold for Force Modulation mode measurements, cannot be used due
to its insufficient width.
2 Install the cantilever as described in Section 3.3: Installing the cantilever (page 29).
3 In the Preparation group of the Acquisition tab, select the Force Modulation operating
mode.
4 In the Z-Controller section of the Imaging window, verify the force Setpoint.

67
 CHAPTER 6: OPERATING MODES

5 In the Preparation group of the Acquisition tab, click the “Freq. seep” button.
6 Click the “Auto frequency set” button to measure the frequency characteristic of the
cantilever.
7 Make a note of the cantilever resonance frequency from the sweep chart and set
“Vibration frequency” to this value.
8 Set “Vibration amplitude” to the desired modulation amplitude.
9 Increase the vibration amplitude if no proper Force Modulation signal can be
measured.

6.6: Spreading Resistance mode

The Spreading Resistance mode is an extension of the static force mode. The static force
acting on the cantilever is used to produce a topography image of the sample.
Simultaneously, changes in the spreading resistance from the cantilever tip to a ground
contact on a sample can be imaged by measuring changes in tip current while a fixed
voltage is applied to the tip. This section gives a brief description of how to operate the
easyScan 2 AFM in Spreading Resistance mode. For a more detailed description of the
parameters that you can set, refer to Section 17.9.4: Operating Mode (page 229).
To operate the easyScan 2 AFM in the Spreading Resistance mode:
1 Electrically connect the sample to the Ground connector on the easyScan 2 AFM Scan
Head (Figure 1-3: Parts of the Scan Head (page 16)) via a 100 kOhm resistor in order to
prevent damage to the tip due to an excessive current.
For best results, the sample should be electrically isolated except for the connection
mentioned above.
2 Select a suitable cantilever:
• CDT-NCLR should be used for samples where a high force is needed to penetrate a
surface oxide layer.
• CONT-PtIr cantilevers can be used on delicate samples. The applied voltage should
be small, because high currents may cause the conducting layer on the tip to
evaporate. Also, applied forces should be very small to prevent damage to the
conducting layer.
• NCL-PtIr cantilevers could be used in combination with non-contact topography
measurements, but damage to the tip is likely.

IMPORTANT
• Standard CONTR cantilevers cannot be used due to the surface oxide on the tip, and
the semiconducting contact between the tip and the sample.

68
 KELVIN PROBE FORCE MICROSCOPY

IMPORTANT
• EFM cantilevers cannot be used for static force mode measurements, due to their
insufficient width.

3 Install the cantilever as described in Section 3.3: Installing the cantilever (page 29).
4 In the Preparation group of the Acquisition tab, select the Spreading Resistance
operating mode.
5 In the Z-Controller section of the Imaging window, verify the Setpoint.
6 In the Mode Properties section, set the Tip voltage to your requirements.

6.7: Kelvin Probe Force Microscopy

6.7.1: Introduction
Kelvin Probe Force Microscopy (KPFM) is an extension of AFM. The technique was first
published in 1991 by Nonnenmacher and co-workers. Using KPFM, images can be recorded
that contain information on the local work function or local contact potential difference
between tip and sample.

6.7.2: Operating principle

KPFM uses the mechanical response of a cantilever to a voltage difference between tip and
sample. The voltage difference consists of two parts: an alternating current (AC) voltage
and a direct current (DC) voltage. The mechanical response to the AC voltage depends on
the DC voltage and becomes zero when there is no contact potential difference between
the tip and surface. During normal dynamic mode imaging, a second feedback loop adjusts
the DC voltage to minimize the mechanical response to the AC voltage. The DC voltage that
needs to be applied to achieve this situation is therefore a measure for the local contact
potential of the surface.
The AC voltage is applied at a frequency different from the normal cantilever oscillation,
which normally is at or close to the cantilever resonance frequency. By going to a frequency
well below its resonance, the mechanical response of the cantilever will be in phase with
the AC voltage. To increase the mechanical response of the cantilever, the AC voltage can
also be applied at the next higher resonance frequency of the cantilever.
On Nanosurf AFMs, the KPFM signal and topography data can be recorded in a single scan.
Although all current Nanosurf AFMs (Nanite systems with SPM S200 controller, as well as all
easyScan 2 AFM systems with AFM Dynamic Module) are in principle capable of performing

69
 CHAPTER 6: OPERATING MODES

KPFM, the FlexAFM has demonstrated best KPFM performance and is therefore the
instrument of choice for this type of measurement.

6.7.3: System requirements

Overview
System: Nanite easyScan 2
All easyScan 2 controllers
Controller SPM S200 equipped with AFM
Dynamic Module
All beam deflection
Scan Head AFM or FlexAFM
(B-type) scan heads
Signal Module A Version 6 or newer Version 6 or newer
Lock-in amplifier Yes Yes
Conductive with alignment Conductive with alignment
structures structures
Cantilevers
and suited for and suited for
dynamic operation dynamic operation
Table 6-2: Components and modules required to perform KPFM.
For KPFM experiments, beam deflection-type scan heads equipped with conductive
cantilevers (for example commercially available EFM cantilevers) are required.
An excitation source is required to provide the AC signal. In addition, a signal detection
source that can filter out mechanical movements of the cantilever at the frequency of the
modulation needs to be used. Both excitation and frequency-selective detection can be
accomplished using a Lock-in amplifier.

Hardware setup
The KPFM setup for Nanosurf AFMs will schematically look as depicted in Figure 6-6: KPFM
connection schematics. The User Controller 1 of the SPM Control Software is used as PID
controller to regulate the applied DC voltage. Signal Module A is used for communication
between the AFM and the Lock-in amplifier.
Three cables are required to connect the Signal Module A (featuring BNC connectors) to the
Lock-in amplifier (depending on the model used, most likely also equipped with BNC
connectors).
The reference output of the Lock-in amplifier is used to generate the AC voltage. This wire
is connected to the cantilever via the “Tip Voltage” connector on the input side of Signal
Module A.

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 KELVIN PROBE FORCE MICROSCOPY

Detector

Lock In
Cantilever

Signal Amplitude Reference

in out (X) out
Tip
voltage
Sample

User Input Tip Scan Resistor

Input in Head
Ground
Deflection out KPFM CP Image
PC
Output Topography Image
Signal Module A Controller
Figure 6-6: KPFM connection schematics.

The mechanical response of the cantilever is measured on the cantilever deflection

channel by connecting “Current or Deflection” on the output side of Signal Module A to the
“Signal in” of the Lock-in amplifier.
The X-channel output of the Lock-in is connected to the User 1 connector on the input side
of Signal Module A (see the last sentence of the Lock-in settings section for an explanation
as to why the X-channel is used).
If the alternating voltage is applied to the cantilever, the sample has to be grounded.
Nanosurf can supply thin cables that can be inserted into the ground connector of the scan
head. A resistor between sample and ground can help prevent short circuits occurring
between tip and sample.

Alternative setup
Instead of applying the alternating voltage to the cantilever tip, it can also be applied to the
sample support. In this case the ground connection has to be removed from the sample
support and needs to be replaced by a direct connection to the “Reference out” connector

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of the Lock-in amplifier, which in turn should no longer be connected to “Tip Voltage” of
Signal Module A.

6.7.4: Procedures
Lock-in settings
There are several approaches for selecting the reference frequency of the Lock-in:
– AC frequency below the resonance frequency of the cantilever
At these low frequencies, the cantilever is in a forced oscillation and the mechanical
response of the cantilever and the excitation are almost at the same phase or close to the
opposite phase (depending on whether the forces between tip and surface are attractive
or repulsive).
– AC frequency at a higher oscillation mode of the cantilever
In these situations, the cantilever oscillation is self-amplifying.
Note that in both cases, the frequency that can be applied to the tip is limited by a filter
present in the “Tip Voltage” channel of Signal Module A. The maximum frequency that can
be applied depends on the version number of your Signal Module A.
To identify the installed Signal Module A version number:
1 In the upper right corner of the control software window, just beneath the Window’s
Close button, click the “About” button:

2 Locate the “Signal Module A” entry in the list of installed modules.

In case of Signal Module A version 6 or newer:
> Set the excitation frequency applied to the cantilever tip to 15 kHz.
In case of lower Signal Module A version numbers:
> Either apply a 1 kHz excitation frequency to the tip, or apply 15 kHz to the sample
instead of the tip (see Alternative setup (page 71)).
In the AFM controller, the amplitude response of the cantilever to the applied AC voltage is
kept minimal by variation of a DC voltage. The relation between the surface potential and
the DC voltage required to obtain this minimal mechanical response is best understood,
and this situation is therefore aimed at. Since the amplitude signal is always positive
(independent of the sign of the force), it cannot be used to obtain opposite feedback
responses for the attractive or repulsive forces. Therefore:
> Set the output of the Lock-in amplifier to “XY” instead of to “Amplitude and Phase”.
The X-channel incorporates both sign and magnitude of the deviation.

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 KELVIN PROBE FORCE MICROSCOPY

Software settings
Before KPFM imaging can start, the control software must be adjusted to allow application
of a voltage to the tip, and the phase settings of the Lock-in amplifier must be optimized.
There is a Wizard that can automatically prepare the software and some of the settings for
you (see More (page 129)), but it is suggested to go through the manual procedure at least
once so that you know what to adjust and optimize when you really do use the wizard.
To allow tip voltages to be set:
1 In the “Hardware” group of the “Settings” tab, select the “Signal Access” button:

2 In the SP Parameter dialog, which now opens with the Signal Access page, select
“Voltage Source Output” as Tip Signal mode in the Signal Module Config section (see
Figure 6-7: Activating Voltage Source Output).

Figure 6-7: Activating Voltage Source Output

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To optimize the phase settings on the lock-in amplifier:

1 Approach the sample in Dynamic Force mode with a suitable cantilever.
2 In the Mode Properties section of the Imaging window, set “Tip Voltage” to +3 V (see
Figure 6-8: Adjusting Tip Voltage).
3 Adjust the phase on the Lock-in amplifier until the X-channel signal is maximally
positive and the Y-channel signal is close to zero.
4 Return the “Tip Voltage” setting to 0 V.

Figure 6-8: Adjusting Tip Voltage

Further optimization can optionally be carried out as outlined below (see also Figure 6-11:
Tip Voltage Spectroscopy). This procedure will additionally give an indication of the signal
variations that are to be expected in the imaging experiment.
To further optimize the phase settings of the Lock-in amplifier, perform the following steps
while approached:
1 In the Signal Access page of the SPM Parameter dialog, select “Enable Input 1”.
2 Configure User Input 1 and User Output 1 (see Figure 6-9: Configuration of User Input 1
and User Output 1) by clicking the respective “Config” buttons.
For correct voltage display, you will need to apply the conversion that the Lock-in
amplifier produces (see Example below).

Example
• If the X-channels output has a range equal to ±10 V, the sensitivity range of the lock-
in amplifier can be inserted directly into the Calibration section of the User Signal
Editor for User Input 1 (see Figure 6-9: Configuration of User Input 1 and User Output 1,
left, which shows the calibration settings for a ±10 mV sensitivity range).
• If the X-channel output has a range different from ±10 V, the sensitivity range that
would be equivalent to ±10 V should be entered. Thus, a ±10 mV sensitivity range on
a ±2.5 V output range would correspond to a ±40 mV sensitivity range on a ±10 V
output range.

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 KELVIN PROBE FORCE MICROSCOPY

Figure 6-9: Configuration of User Input 1 and User Output 1. (Left) Suggested name and
calibration settings for User Input 1; see example above. (Right) Suggested name and calibration
settings for User Output 1.

3 Make sure that “Enable Feedback Loop” in the User Controller section of the SPM
Parameter dialog is unchecked.
4 Open the Spectroscopy window (see Figure 6-11: Tip Voltage Spectroscopy) by clicking
the Spectroscopy tab at the bottom of the Measurement pane.
5 In the Parameters section of the Spectroscopy window, click the “More” button.
The SPM Parameter dialog will open on the Spectroscopy page.
6 Set all parameters and settings to the ones shown in Figure 6-10: Spectroscopy
parameters
7 Select User Input 1 (or the name assigned to it) to be displayed in the Line graph chart
(see Figure 6-10: Spectroscopy parameters).
8 Adjust the phase on the Lock-in amplifier until the maximum slope is observed.

KPFM Imaging
After proper adjustment of the phase, imaging can start (see Figure 6-12: KPFM imaging). On
Nanosurf AFMs, the KPFM signal and sample topography can be recorded simultaneously
in a single scan. To operate the FlexAFM in simultaneous KPFM mode:
1 In the Mode Properties section of the Imaging window, make sure that “Tip Voltage” is
set to 0 V.
2 Set all Signal Access parameters and settings to the ones shown in Figure 6-7:
Activating Voltage Source Output (page 73).

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 CHAPTER 6: OPERATING MODES

Figure 6-10: Spectroscopy parameters

3 Configure User Output 1 (see Figure 6-9: Configuration of User Input 1 and User Output
1, right).
4 In the User Controller section of Signal Access page of the SPM Parameter dialog, check
or uncheck the “Inverted Feedback” option (see also Figure 6-7: Activating Voltage
Source Output (page 73)).
The correct setting depends on the settings and type of Lock-in amplifier. If set
incorrectly, the feedback responds in the wrong direction and the output voltage will
go to its maximum or minimum value. When this happens:
> Change the status of the “Inverted Feedback” check box.

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 KELVIN PROBE FORCE MICROSCOPY

Figure 6-11: Tip Voltage Spectroscopy. The phase optimization procedure. The “Tip voltage” setting
(Mode Properties section of the Imaging window) is ignored during running of the voltage ramps. In
the example shown here, a sequence of 8 curves was recorded to allow an easy comparison between
the individual curves.

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 CHAPTER 6: OPERATING MODES

Figure 6-12: KPFM imaging. Settings during measurement.

Tip:
If signals are not as expected, the applied voltage can be checked with a multimeter. The
tip voltage specified in the software should be directly measurable on the cantilever
chip or spring. One test lead of the multimeter is pressed gently onto the cantilever chip,
while the other is connected to the ground.

CAUTION
The test lead on the cantilever chip must be put on with great care, as excessive force on
the chip will cause damage to the cantilever holder, optical unit or approach
mechanism!

Tip
Upon request, a parameter file for KPFM measurements can be obtained from
Nanosurf’s Support department.

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 KELVIN PROBE FORCE MICROSCOPY

Figure 6-13: KPFM measurement. Topography (left) and KPFM signal (right) of local charges that
were placed on an insulating (oxide) surface layer in a “Swiss cross” pattern. Image courtesy: Marcin
Kisiel, Thilo Glatzel and students of the Nanocurriculum of the University of Basel.

KPFM Wizard
As mentioned earlier, a KPFM wizard exists, which can set many of the parameters and
settings for you, although the optimization processes described above will remain to be
performed. To start the wizard:
1 In the Preparation group of the Acquisition tab, Select “KPFM” from the drop-down
menu of the “More” button:

The wizard dialog will open.

2 Follow the instructions of the wizard.

Alternative measurement procedure

As an alternative to the simultaneous measurement procedure described above, a sample
can also be scanned twice: once for topography and a second time in constant height
mode for the contact potential image (see also technical note TN00031 – MFM). Although
the quantitative determination of the local work function can potentially be enhanced by
constant height measurements, it has two main disadvantages:

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1. The same scan area must be scanned twice, thereby consuming more time.
2. A lateral mismatch between the topography and KPFM images may occur as a result
of drift or vertical movement.
These disadvantages do not occur during simultaneous collection of the topography and
surface potential data. In addition, the lateral resolution of the KPFM signal is improved
when recording all data in parallel, because the tip and sample can be kept at a smaller
distance throughout the experiment. Nanosurf therefore recommends the simultaneous
measurement procedure for KPFM.

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CHAPTER 7:

Finishing measurements
0
0
 CHAPTER 7: FINISHING MEASUREMENTS

7.1: Finishing scanning

Once you are done measuring:
1 In the Imaging group of the Acquisition tab, click the “Stop” button to stop measuring.
2 Open the positioning window.
3 If the AFM Video Camera is installed, activate “Side view” in the Video panel (see
Section 13.6: Video panel (page 135)).
If the Video Camera is not installed, use the side view lens of the scan head to observe
the sample instead.
4 Retract the cantilever to a safe distance from the sample by clicking and holding the
“Retract” button in the Approach group of the Acquisition tab until the tip–sample
distance is at least as large as shown in Figure 7-1: Side view of the cantilever after
retracting or by clicking the “Home” button and waiting for the automatic full
withdrawal process to finish.

Figure 7-1: Side view of the cantilever after retracting. Minimal distance required for safe removal
of the scan head and sample.

5 Remove the scan head from the sample stage.

6 Remove the sample or sample holder from the sample stage.

7.2: Turning off the instrument

To turn off the instrument:
1 Finish as described in Section 7.1: Finishing scanning
2 Select the measurements that you want to keep in the History page of the Gallery
panel and save them in a new folder (see Save as (page 182)).

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 STORING THE INSTRUMENT

3 Exit the SPM Control Software.

4 Turn off the power switch on the controller (see Figure 1-4: The easyScan 2 controller
(page 17) for its location).
5 Store the Scan head in the Scan head case.

IMPORTANT
Always store the scan head with a(n old) cantilever installed. This will prevent dust from
gathering on the alignment chip, and will protect the alignment chip against damage.

7.3: Storing the instrument

If you are not using the instrument for an extended period of time, if you have to transport
it, or if you send it in for repairs, put the instrument in the original packaging material or
instrument case.
1 Turn off the instrument as described in Section 7.2: Turning off the instrument, and
remove all cables.
2 Leave the cantilever in the scan head, or replace it with an old one.
3 Put the Scan Head in its Scan Head Case (see Figure 7-2: Scan Head storage).

Figure 7-2: Scan Head storage. The easyScan 2 AFM Scan Head stored in its Scan Head case.

4 Pack all components in the original Nanosurf packaging material or instrument case,
as shown in Figure 7-3: Packing.

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IMPORTANT
Before transport, always put the Scan Head in the Scan Head case. Make sure the Scan
Head is locked in tight. Put the instrument in the original Nanosurf packaging material
or instrument case.

Figure 7-3: Packing. The easyScan 2 AFM system packed in the Instrument Case.

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CHAPTER 8:

Maintenance
0
0
 CHAPTER 8: MAINTENANCE

8.1: Introduction
To ensure fault-free operation of the microscope, the maintenance instructions below have
to be observed.

8.2: The easyScan 2 AFM Scan Head

It is important to keep the open parts of the scan head clean. Therefore, always store the
scan head in a dust-free and dry environment when it is not in use. If exposed to moisture
(high humidity) over a prolonged period, corrosion will occur.
To clean the alignment chip when it has become dirty:
> Blow away dust using dry, oil-free air or use a soft brush.

CAUTION
When using a (compressed gas) air duster to clean the alignment chip on the easyScan
2 AFM Scan Head, be sure to place the DropStop and to only gently blow over the
alignment chip rather than fully onto it. A failure to do so will results in strong air
currents inside the scan head that could damage sensitive wires belonging to the scan
head electronics!

8.3: The easyScan 2 controller

To clean the case and the controls of the controller:
> Use a soft cloth, lightly moistened with a mild detergent solution. Do not use any
abrasive pads or solvents like alcohol or spirits.

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CHAPTER 9:

Problems and solutions

0
0
 CHAPTER 9: PROBLEMS AND SOLUTIONS

9.1: Introduction
The problems described here can occur during normal operation of the microscope. If the
suggested course of action does not solve the problem, or the problem is not described
here, refer to Section 9.4: Nanosurf support (page 93).

9.2: Software and driver problems

9.2.1: No connection to microscope

This error message appears when the easyScan 2 software is waiting for an answer from the
controller. Most likely, the easyScan 2 is not connected to the mains power, or it is not
turned on. In this case the status lights on the top of the controller are off. To fix this
problem:
> Check the connections and the power switch.

9.2.2: USB Port error

The USB serial converter is not available. The USB cable is not properly connected. In this
case the USB power light on the easyScan 2 controller rear panel) does not light up (Figure
1-4: The easyScan 2 controller (page 17)). To fix this problem:
1 Check if the a second copy of the easyScan 2 is already running and occupying the USB
port.
2 Check that the USB cable is properly connected.

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 SOFTWARE AND DRIVER PROBLEMS

If this does not solve the problem, check if there is a driver problem with the USB Serial
port/USB Serial converter drivers, as described in the next section.

9.2.3: Driver problems

If you have trouble connecting to the controller, or if the video image in the positioning
window is not available, it is possible that one of the drivers of your instrument is causing
problems, for example because the installation did not work, or the installation of some
other hardware is in conflict with the drivers of the easyScan 2. In order to solve driver
problems:
1 Check for driver updates on the Nanosurf Support web site.
2 Insert the installation CD for your instrument.
3 Log in with Administrator priviliges.
The device manager can then be opened to view and correct any driver problems:
1 Open the windows menu “Start” >> “Control Panel”.
The control panel now opens.
2 Select “Large icons” or “Small iconcs” if “View by” is set to “Categories”.
3 Double-click the “Device Manager” icon.
The device manager now opens.
When the device manager opens and your controller is connected to your computer, you
may see the drivers shown in Figure 9-1: Device manager (information may vary depending
on the configuration of your system).
If there are problems with any of these drivers, or a wrong driver is installed, you can try to
do the following to fix this:
1 Double click on the driver.
Properties dialog for the device now opens.
2 Select the “Driver”-tab.
3 Click the “Update Driver”-button
Windows will now ask you where to look for the driver.
4 Instruct windows to manually search for the driver files on the Installation CD.

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 CHAPTER 9: PROBLEMS AND SOLUTIONS

Nanosurf Analysis (SPIP) dongle

Framemaker grabber driver

for Video Module v1

USB to Serial converter (part 1)

Framemaker grabber driver

for Video Module v2 (part 1)

Nanosurf Report dongle

USB Hub

Framemaker grabber driver

for Video Module v2 (part 2)

USB to Serial converter (part 2)

Figure 9-1: Device manager. The drivers that may be installed on your system when your controller
is connected to the computer.

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 AFM MEASUREMENT PROBLEMS

9.3: AFM measurement problems

9.3.1: Probe Status light blinks red

This light will blink red when an insufficient amount of light reaches the detector of the
cantilever deflection detection system. This can either be due to the DropStop still being
closed or to a misaligned cantilever chip.
If the dropStop is still present:
> Remove it.
To check for a misaligned cantilever:
1 Remove the Scan Head from the stage.
2 Make sure that the cantilever is lying perfectly in the alignment chip (for details, see
Figure 3-5: Cantilever Alignment (page 33)).
If the cantilever is not well-aligned, there may be dust between the cantilever and
alignment chip. To correct this:
A Remove the cantilever as described in Section 3.3: Installing the cantilever (page
29).
B Blow away dust from the alignment chip and the back side of the cantilever using
dry, oil-free air. Mount the cantilever again.
For further details on the status of the laser detection system, open the Scan Head
Diagnostics dialog:
1 In the Scan Head group of the Settings tab, click the “Diagnostics” button:

The Scan Head Diagnostics dialog now opens.

2 Check the laser efficiency and position on the photodiode detector.
In some rare cases, the blinking of the Probe Status light may be caused by light from
external sources reaching the photodiode detector. If this is the case:
> Turn off/down the external light source, or shield the scan head from its influence.

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9.3.2: Automatic final approach fails

If the automatic approach fails, the Setpoint may either be too high, or the distance
between tip and sample is larger than the maximum automatic approach range of the scan
head. To solve these issues, try the procedures below (if necessary, try each and/or both
procedures repeatedly until the automatic final approach is successful).
To check for a low Setpoint, repeat the approach as follows:
1 In the Approach group of the Acquisition tab, click the “Home” button to fully retract
the cantilever.
2 Decrease the Setpoint by 5-10% (see Z-Controller section (page 125)) and Section 4.3.1:
Entering and changing parameter values (page 43) for details on how to do this).
3 Repeat the automatic final approach as described in Section 4.4.3: Automatic final
approach (page 47).
To check for a large tip–sample distance, repeat the approach as follows:
1 In the Approach group of the Acquisition tab, click the “Home” button to fully retract
the cantilever.
2 While watching the side view of the cantilever, manually approach a bit further by
turning the Leveling Screws counterclockwise (see Section 4.4.1: Manual coarse
approach (page 45)).
3 Repeat the automatic final approach as described in Section 4.4.3: Automatic final
approach (page 47).
If both of these procedures do not solve the problem, check the status of the cantilever
deflection detection system (Section 17.7: Scan Head Diagnosis dialog (page 218)) or try
installing another cantilever.

9.3.3: Image quality suddenly deteriorates

Tip picks up material
When a scan line suddenly starts reproducing badly, the tip may have picked up some
particles.
To get rid of these particles, follow the procedure below until the image quality improves:
1 Continue measuring for a while (1–2 images), as the tip may eventually lose these
particles again.
2 In the Approach group of the Acquisition tab, click the “Withdraw” button to retract
the cantilever, and then perform a new approach.

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 NANOSURF SUPPORT

3 Try to induce changes in the tip end:

A While measuring, increase the force “Setpoint”, or decrease the amplitude
“Setpoint” in the Z-Controller section of the Imaging window.
B Restore the Setpoint to its old value when the contrast improves, or if nothing
happens after scanning several lines.
4 Change the cantilever if no improvement occurs after following the steps above.

Setpoint drift
When part of the scan line in the Line graph is drawn red, the tip has moved to its maximum
or minimum Z-position. This should also be visible in the range display on the right hand
side of the graph. The tip will move to its maximum Z-position when it has lost contact with
the sample. To correct this:
1 In the Static Force based modes, increase the force Setpoint, in the Dynamic Force
based modes, reduce the amplitude Setpoint.
2 If this does not help, retract and re-approach the tip.

9.4: Nanosurf support

9.4.1: Self help

The fastest way to solve a problem is often to solve it yourself. If the previously suggested
actions did not help, or the problem is not described here, refer to the Nanosurf support
pages:
1 Open www.nanosurf.com.
2 Click on “Support”.
3 Enter the login and password combination that you received upon registering.
4 Select the easyScan 2 link.
5 If the problem is software related, try to upgrade to the latest version and/or read the
“SPM Software Version History” to see if the problem was solved. For the solution to
other problems, refer to the Frequently Asked Questions (FAQ).
If your instrument has not been registered yet, you will first have to register to receive a
password.

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9.4.2: Assistance
If the standard solutions are not sufficient, contact your local distributor for help. In order
to resolve the problem as fast as possible, please provide as much information as possible,
such as:
• A detailed description of what happened before the problem occurred. For example:
“When I click the ‘Approach’ button, then quickly click abort, the controller will not react
to anything I do anymore. This only happens when measuring in Dynamic Force Mode.”
• If an error message was displayed: The exact text of the message, or at least the start of
the message.
• The serial number of your scan head and/or controller.
• A description of the computer hardware and software on which the control software is
running: computer brand, type (laptop or desktop), operating system, software version
etc.
• Original Nanosurf image data (.nid) files that show the problem, rather than bitmap
screen shots, because these files contain all the settings that were used to make them.
• Parameter (.par) files with the instrument settings that were used when the problem
occurred.
• Script files, if the problem occurs during the operation of a script.

IMPORANT
Sending “.vbs” scripts by e-mail often does not work, because these files are usually
blocked as a security measure. To successfully e-mail a script, you may either:
• Add the script text to the body of the e-mail.
• Change the extension of the script file to “.txt” and attach it to the e-mail.
• Compress the script file to a “.zip” archive and attach it to the e-mail.

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CHAPTER 10:

AFM theory
0
0
 CHAPTER 10: AFM THEORY

10.1: Scanning probe microscopy

The easyScan 2 AFM is an atomic force microscope, which is part of the family of scanning
probe microscopes. With the first scanning probe microscope, the scanning tunneling
microscope (STM), it became possible to look into the fascinating world of atoms. The STM
was developed by Gerd Binnig and Heinrich Rohrer in the early ’80s at the IBM research
laboratory in Rüschlikon, Switzerland. For this revolutionary innovation, Binnig and Rohrer
were awarded the Nobel prize in Physics in 1986.
However, the STM technique is restricted to electrically conducting surfaces. An extension
of this technique, called the Atomic Force Microscopy (AFM), was developed by Gerd
Binnig, Calvin Quate and Christoph Gerber. The AFM also allowed insulating materials to be
analyzed. Both the AFM and the STM microscopy techniques work without optical focusing
elements. Instead, a small sharp probing tip is scanned very closely across the sample
surface. The distance between the tip and the sample surface is so small that atomic-range
forces act between them. In an AFM, a tip is attached to the end of a cantilever in order to
measure these forces. The force acting on the tip can then be determined by detecting the
deflection of this cantilever (see Figure 10-1: Cantilever).

Figure 10-1: Cantilever. 228 μm long micro-fabricated silicon cantilever with integrated tip.

The measurement of the cantilever deflection can be used to control the tip–surface
distance on an atomic scale. Thus, enormous resolution can be achieved, so that even the
atomic arrangement of surfaces can be probed. This measurement is a so-called static
operating mode, in which the static deflection of the cantilever is used. Generally, the
forces acting on the tip will cause it to snap onto the sample, which result in an effective,
nanometer-range flattening of the tip, and friction and stiction between the tip and the
sample.
To circumvent the aforementioned problems, the so-called Dynamic force microscopy
modes can be used, as was pointed out by the AFM inventors. In these modes, the
cantilever vibrates during the operation. In the dynamic modes, changes in the free

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 THE EASYSCAN 2 AFM

resonance frequency and the damping of the cantilever vibration caused by the forces
between the tip and the cantilever can be measured and used to regulate the tip–sample
distance.
To achieve atomic resolution, ultra-clean and flat surfaces prepared in highly sophisticated
vacuum systems are needed. Nevertheless, measurements in air can give useful results for
many technically relevant surfaces. In this manual, the use of the dynamic modes in air on
such surfaces is described.

10.2: The easyScan 2 AFM

The easyScan 2 AFM is an AFM that can be used in both static and dynamic operating
modes. The AFM cantilever is a microfabricated cantilever with an integrated tip mounted
on a cantilever holder chip.
When the sensor tip comes in contact with the sample, a repulsive force that increases with
decreasing tip–sample distance acts on it. In the static force operating mode, the bend of
the cantilever, due to the force acting on its tip, is measured using a cantilever deflection
detection system.

Control
electronics

Figure 10-2: SPM system. Cantilever with deflection detection system scanning the sample. The
sample is visualized on a computer with installed scan software, which also directs the scan itself.

In dynamic operating modes, the cantilever is excited using a piezo element. This piezo is
oscillated with a fixed amplitude at an operating frequency close to the free resonance
frequency of the cantilever. The repulsive force acting on the tip will increase the resonance
frequency of the cantilever. This will cause the vibration amplitude of the cantilever to
decrease. The vibration of the cantilever is also detected using the cantilever deflection
detection system.

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 CHAPTER 10: AFM THEORY

The measured laser beam deflection or cantilever vibration amplitude can now be used as
an input for a feedback loop that keeps the tip–sample interaction constant by changing
the tip height. The output of this feedback loop thus corresponds to the local sample
height.
An image of the surface is made by scanning over the sample surface in the X and Y
direction. The sample structure image is now obtained by recording the output of the
height control loop as a function of the tip position. The direction of the X- and Y-axes of
the scanner is shown in Figure 10-3: Scanner coordinate system. The scanner axes may not
be the same as the measurement axes, when the measurement is rotated, or the
measurement plane is tilted. Therefore, the image X- and Y-axes are denoted by an asterisk
to avoid confusion (i.e. X*, Y*).

Figure 10-3: Scanner coordinate system

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CHAPTER 11:

Technical data
0
0
0
 CHAPTER 11: TECHNICAL DATA

11.1: Introduction
The specifications given in this chapter represent typical values of the Nanosurf easyScan
2 AFM system. The exact specifications of all components belonging to your system are
given on the calibration certificate delivered with the instrument.

11.2: The easyScan 2 AFM Scan Heads

11.2.1: Specifications and features

Scan Head specifications
AFM Scan Head: 10 μm 70 μm 110 μm
Maximum Scan range (1) 10 μm 70 μm 110 μm
Maximum Z-range 2 μm 14 μm 22 μm
Drive resolution Z (2) 0.027 nm 0.21 nm 0.34 nm
Drive resolution XY (2) 0.15 nm 1.1 nm 1.7 nm
XY-Linearity Mean Error <0.6% <1.2% <0.6%
Z measurement noise level 0.07 nm 0.6 nm 0.4 nm
(RMS, Static Mode) (max 0.2 nm) (max 0.8 nm) (max 0.55 nm)
Z measurement noise level 0.04 nm 0.5 nm 0.3 nm
(RMS, Dynamic Mode) (max 0.07 nm) (max 0.8 nm) (max 0.55 nm)
(1) Manufacturing tolerances are ±15% for 10 μm and 70 μm heads, ±10% for 110 μm Scan Heads. The exact
values are given on the calibration certificate delivered with the instrument.
(2) Calculated by dividing the maximum range by 16 bits

Scan Head features

Design: Tripod stand alone
Sample size: Unlimited
Automatic approach range: 4.5 mm
Maximum approach speed: 0.12 mm/s
Alignment of cantilever: Automatic adjustment
Electrical connection to tip: Available
Scan Head size / weight: 97×89×51 mm / 550 g
Sample observation optics: Dual lens system (top/side view)
Optical magnification: top view: 12× side view: 10×

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 THE EASYSCAN 2 AFM SCAN HEADS

Field of view: top view: 4×4 mm side view: 5×3 mm

White LEDs, sideway illumination, adjustable
Sample illumination:
brightness

Compatible cantilevers
Cantilevers used in conjunction with the easyScan 2 AFM should have the following
properties:
• Grooves that are compatible with the alignment chip used by Applied Nanostructures,
BudgetSensors, NanoSensors, NanoWorld, and VISTAprobes.
• A nominal length of 225 μm or more, and a width of 40 μm or more.
• A coating on the backside of the cantilever that reflects (infra)red light.

11.2.2: Dimensions
10.5

2.1
44
24

24.5
9.5

2.6
43.4

37.6
85.5

18.8
37.1
42.1

10
32.6 32.6
75.1

Figure 11-1: The Nanosurf easyScan 2 AFM Scan Head. All dimensions in mm.

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11.3: The easyScan 2 Controller

11.3.1: Hardware features and specifications

The easyScan 2 Controller electronics

Controller size / weight: 470×120×80 mm / 2.4 kg
Power supply: 90–240 V AC, 50/60 Hz, 100 W
USB 2.0 (Appr. controller serial number 23-06-030 and
Computer interface:
higher)
Integrated USB hub: 2 Ports (100 mA max)
Scan generator: 16 bit D/A converter for all axes
Scan drive signals: ±10 V, no high voltage
Scan speed: Up to 60 ms/line at 128 data points/line
16 bit A/D converters, up to five signals depending on
Measurement channels:
mode.
Scan area and data points: Individual width/height, up to 2048×2048
Scan image rotation: 0–360°
Sample tilt compensation: Hardware X/Y-slope compensation
Single point measurement or multiple measurements
Spectroscopy modes:
along a vector
Spectroscopy data points: Up to 65535
Spectroscopy averaging: Up to 1024 times
Table 11-1: General features and specifications of the easyScan 2 controller electronics.

11.3.2: Software features and computer requirements

Nanosurf SPM Control Software
Simultaneous display of
Line graph, Color map, 3D view, …
data in charts types:
User profiles: Customizable display and parameter settings
Online processing functions: Mean fit, Polynomial fit, Derived data, …
Quick evaluation functions: distance, angle, cross section, roughness, …
Data export: TIFF, PNG, BMP, ASCII, CSV, …

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Nanosurf easyScan 2 Scripting Interface

Automating measurement tasks, custom evaluation
Applications: functions, using third party measurement equipment,
…
Windows Scripting Host: Visual Basic Script, Java
Included control software:
Script, …
COM compatible languages: LabView, MathLab,
Remote control by:
Visual Basic, Delphi, C++, …

The Scripting Interface has to be purchased separately for easyScan 2 systems.

Lithography can also be performed via the scripting interface, but is more easily performed
via the Lithography Window of the control software, or (when more advanced options are
required) by purchasing the Lithography Option.

Computer requirements
For a detailed description of computer hardware requirements and supported operating
systems, see Nanosurf technical note “TN00477 — Computer requirements for Nanosurf
Products”. The technical note can be downloaded from the Support section of the Nanosurf
website by all registered users.

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11.4: Hardware modules and options

11.4.1: AFM modules

AFM Basic Module (1)

Static Force (Contact): Constant Force
Imaging modes:
(Topography), Constant Height (Deflection)
Spectroscopy modes: Force-Distance, Force-Tip voltage
Tip voltage: ±10 V in 5 mV steps
(1) The AFM Basic Module is required for using AFM Scan Heads.

Table 11-2: Features and specifications of the AFM Basic Module

AFM Dynamic Module (1)

Static Force (Contact): Constant Force
Imaging modes:
(Topography), Constant Height (Deflection)
Spectroscopy modes: Force-Distance, Force-Tip voltage
Tip voltage: ±10 V in 5 mV steps
Dynamic Force (Intermittent Contact, etc.):
Additional imaging modes: Constant Amplitude (Topography), Constant
Height (Amplitude)
Additional spectroscopy modes: Amplitude-Distance
Dynamic frequency range: 15–500 kHz
Dynamic frequency resolution: < 0.1 Hz
(1) The AFM Basic Module is required for using the AFM Dynamic Module.

Table 11-3: Features and specifications of the AFM Dynamic Module

AFM Mode Extension Module (1)

Phase Contrast, Force Modulation, Spreading
Additional imaging modes:
Resistance
Phase-Distance, Current-Voltage, Current-
Additional spectroscopy modes:
Distance etc.
Phase contrast range: ± 90°
Phase contrast resolution: < 0.05°
Phase reference range: 0–360°
Tip current measurement: ± 100 μA (3 nA resolution)
Table 11-4: Features and specifications of the AFM Dynamic Module

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AFM Mode Extension Module (1)

(1) The AFM Basic Module is required for using the AFM Mode Extension Module. The AFM Dynamic Module
is required for some of the modes offered by the AFM Mode Extension Module (see Table 6-1: Operating
modes and required modules (page 64)).

Table 11-4: Features and specifications of the AFM Dynamic Module

11.4.2: The Signal Modules

The Signal Modules consist of electronic modules that are built into the easyScan 2
controller as well as of a Break-Out Connector that is externally attached to the controller.
The Signal Modules can be used for monitoring signals (Signal Module S) and for adding
functionality to the easyScan 2 system (Signal Module A). Signal Module A includes all the
monitoring functions of Signal Module S. For information on installing the Signal Modules,
refer to Section 2.1: Installing the hardware (page 20).

Signal Module S
Signal Module S can be used for monitoring signals from the AFM with external
instruments, such as Volt-meters, oscilloscopes or spectrum analyzers. The signals are
available on nine BNC connectors that are labelled with their signal names. The signal
names and their function are listed in the table Table 11-5: Monitor signals (page 106).
The calibration of the monitor signals can be found by looking up the signal calibration in
the Scan Head Calibration Dialog, reached via the menu “Options” >> “Config Scan Head...”.
The magnitude of the physical signal can be calculated from the Monitor Signal voltage
using the formula:

MonitorSignalVoltage
PhysicalSignal [ Unit ] = ----------------------------------------------------------- ⋅ Maximum + Offset
10 [ V ]

In addition to the monitor voltages, +15V and –15V voltage sources are available for driving
small home-made electronics. The voltages are available on a three-pole mini-DIN
connector. The pin-out of this connector is shown in Figure 11-2: Voltage source connector
(page 108).

Signal Module A
Signal Module A can be used to add functionality (custom operating modes) to the
easyScan 2 system, in addition to the applications of Signal Module S. The signals are
available on twenty-one BNC connectors that are labelled with their signal names. The
signal names and their function are listed in Table 11-5: Monitor signals and Table 11-6:
Custom operating mode signals.

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Signal name Function

X-Position command of the Scanner. Is affected by Image X-Pos and
X-Axis
the Imaging Area Rotation.
Y-Position command of the Scanner. Is affected by Image X-Pos and
Y-Axis
the Imaging Area Rotation.
Z-Position command of the Scanner. Is affected by the Z-Controller
Z-Axis
output, Ref. Z-Plane, X- and Y-Slope.
Tip Voltage The voltage applied to the tip.
Approach The voltage that determines the speed of the approach motor.
The oscillating voltage that is applied to the piezo that excites the
Excitation
cantilever vibration.
The raw cantilever deflection signal. Contains both the static
Deflection
cantilever deflection and the cantilever vibration.
Amplitude The measured cantilever vibration amplitude.
The measured cantilever vibration phase. The phase is affected by
Phase the Reference Phase Mode Property setting of the Phase Contrast
Mode.
Table 11-5: Monitor signals
The sum of the modulation inputs and the output value (for example of X-Axis) should not
exceed the –10V to +10V range. The Excitation signal should not exceed the –5V to +5V
range.
In addition, –15V and +15V voltage sources are available for driving small home-made
electronics. The voltages are available on the same type of three-pole mini-DIN connector
that is used in the Signal Module S. The pin-out of this connector is shown in Figure 11-2:
Voltage source connector.

Signal name Function

An output that can be used to synchronize external equipment with
the easyScan 2 controller. This feature can be controlled with the
scripting interface. For more information, refer to the Script
Sync
Programmers Manual, topic “Object Reference” >> “Class Scan” >>
“SyncOutMode” and “Object Reference” >> “Class Spec” >>
“SyncOutMode”
An analog output that can be used to drive external instruments
User 1 Output using the controller. The User output can be used for special
spectroscopy measurements.
Table 11-6: Custom operating mode signals.

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Signal name Function

An analog output that can be used to drive external instruments
User 2 Output using the controller. The User output can be used for special
spectroscopy measurements.
The Input voltage is added to the X-Position command of the
X-Axis Input
scanner.
The Input voltage is added to the Y-Position command of the
Y-Axis Input
scanner.
The Input voltage is added to the Z-Position command of the
scanner. If the Z-Controller is turned on, it will try to compensate
Z-Axis Input
this voltage, as a result of which the Input voltage will be added to
the topography measurement.
The input voltage is either added to the Tip-voltage set in the
control software, or this Input connector has a direct electrical
Tip Voltage
connection to the tip. The second option will be described in more
detail in a future manual version (refer to the Nanosurf website).
The input voltage is either added to the normal Excitation voltage,
or only the Excitation Input signal is passed on to the Cantilever
Excitation Input
Excitation piezo. The second option will be described in more detail
in a future manual version (refer to the Nanosurf website).
An analog input that can be used to record the signal from external
User 1 Input
instruments in Imaging and Spectroscopy measurements.
An analog input that can be used to record the signal from external
User 2 Input
instruments in Imaging and Spectroscopy measurements.
A connector that can be used for accessing signals that are not
Aux 1 otherwise available. Contact your local distributor if you need to use
this connector.
A connector that can be used for accessing signals that are not
Aux 2 otherwise available. Contact your local distributor if you need to use
this connector.
Table 11-6: Custom operating mode signals.

Using the User Inputs and Outputs

The User Inputs and Outputs can be accessed through the Operating mode panel. Each
signal can be calibrated with the User Signal Editor, which is accessed by clicking the
corresponding “Config” button. This Section is only available in the Advanced user
interface level. Refer to Section 17.10: User Signal Editor dialog (page 238) for a more detailed
explanation.

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1: +15V 2: GND

3: -15V
Figure 11-2: Voltage source connector. Connector as seen from outside.

Various other User Input and Output settings can be configured in the Signal Access page
of the SPM Parameter dialog. Refer to Section 17.9.7: Signal Access (page 235) for details on
how to change them.

11.4.3: The AFM Video Module

Camera system: Dual video (top/side view)

Camera resolution: 352 × 288
Magnification: Top: 100× / Side: 70×
Field of view: Top: 3.2 × 2.7 mm / Side: 4.1 × 3.4 mm
Video display: In control software
Analog video output: PAL Video-S
Video output: Version 2 video cameras: constant

11.4.4: The Micrometer Translation Stage

Micrometer Translation Stage Specifications (stage only)

13 mm in each direction
Travel (XY)
(6.5 mm from center to all sides)
Repositioning precision Better than 5 μm
Straight line accuracy Better than 2 μm
Z-stiffness (load displacement) 0.16 μm/N at corners of the stage
Weight 1.050 kg

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The SPM Control

Software user interface
0
0
 CHAPTER 12: THE SPM CONTROL SOFTWARE USER INTERFACE

12.1: General concept and layout

The SPM Control Software provides all functions to operate the microscope during imaging
of surfaces and more advanced operating modes. It also provides data analysis functions
for post-processing of measurement data.

1 2 3

Figure 12-1: The main window in “Normal” workspace mode

The main SPM Control Software window (also referred to as workspace) consists of five
major areas:
1. The Measurement pane on the left. This area contains the so-called Operating
windows, which are used to acquire and display ongoing measurement data.
2. The Document space in the middle. This area is used for displaying and analyzing
previously stored measurement documents.
3. The Info pane on the right. This area contains several stacked Panels and is used to
group a diverse array of functionality and information.
4. The Ribbon at the top. This area is used to access all action functions.
5. The Status bar at the bottom. This area is used to display additional information.

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12.2: The workspace

With the Nanosurf SPM Control Software, measurement of newly acquired data and
analysis of already stored data (in multiple documents) can be performed in parallel, since
these tasks are partly performed in different areas of the workspace. It may however require
a high resolution monitor (or multiple monitors) to make this process efficient. To offer the
same functionality on systems with a limited resolution, the user can switch between a
“Normal” (Figure 12-1: The main window in “Normal” workspace mode) and a “Document”
mode (Figure 12-2: The main window in “Document” workspace mode). See also Section
12.8.1: Workspace group (page 118).

Figure 12-2: The main window in “Document” workspace mode

In “Normal” mode, the emphasis lies on the Measurement and Info panes. The inside
border of the two panes can be dragged by the mouse to adjust their individual widths to
your needs. Document space on the other hand is rather limited (see Figure 12-1: The main
window in “Normal” workspace mode). This mode is most suited for measurements.
In “Document” mode, the Document space is maximized while the Measurement and Info
panes are minimized to the left and right side of the main window, respectively (see Figure
12-2: The main window in “Document” workspace mode). The various window and panel
titles are shown in tabs so that you can still open them when needed. A click or a mouse-
over on one of these tabs will cause the respective window or panel to slide out

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automatically, so that you can work on it. It will automatically minimize again when you are
done. This mode is most suited for analyzing stored measurement data.

12.3: Operating windows

Operating windows are used to perform specific operations with the microscope. The
Operating windows are grouped together in the Measurement pane and can be accessed
by clicking the respective tab. The operations themselves are usually controlled using the
action buttons of the Ribbon.

Figure 12-3: Elements of Operating windows. Shown here is the Imaging window, with the
Parameter area (Imaging panel) on the left, the Chart area on the right, and the Chart bar on top.
Clicking the tabs at the bottom of the Measurement pane switches between the Operating windows.

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 DOCUMENT SPACE

The Operating windows are:

• The Imaging window; used for generating images of a sample (for details see Chapter 13:
Imaging (page 121)).
• Spectroscopy window; used for measuring various “A as a function of B” curves at certain
sample locations, such as force-distance curves or current-voltage curves (for details see
Chapter 14: Introduction (page 146)).
• Lithography window; used for performing Lithography on the current scan area (for
details see Chapter 15: Lithography (page 151)).
All Operating windows contain three distinct elements, which are described in Figure 12-3:
Elements of Operating windows and in the next chapters:
1. The “Parameter area”, where the main parameters influencing the current
measurement are grouped into different sections.
2. The “Chart area”, where one or more charts, showing different aspects/signals of the
current measurement, are being displayed.
3. The “Chart toolbar”, where several functions that directly influence the current
measurement (or display of it) are located.

12.4: Document space

In the document space, stored measurements can be displayed for evaluation and analysis.
Each measurement is contained within its own document window. These windows can be
arranged in document space to your liking.

Figure 12-4: Example of a measurement document window

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By default, all measurements are temporarily stored (automatically) during imaging and
spectroscopy. They can be opened at all times from the Gallery panel (see Section 16.4:
Gallery panel (page 181)), but should be moved to a new folder for permanent storage as
soon as you have finished measuring (see Save as (page 182)).
Everything related to documents is described in more detail in Chapter 16: Working with
documents (page 169).

12.5: Panels
In the panels of the Info pane, the control software provides additional information that
can be useful to the user. These panels are normally docked to the Info pane and are
stacked to save space. The panels have several features, however, that allow you to arrange
them in a way that is most efficient for your application (see Figure 12-5: Arranging panels).

Figure 12-5: Arranging panels. (Left) Stacked panels. (Center) Separated panel that is docked to a
stack. (Right) Panels that are minimized in “Document” mode.

To separate a panel and dock it individually to the side of/below another panel that is
already docked to this window, drag its title bar to the desired position using the mouse
cursor.
To add a control panel to a stack, drag either its title bar or its label to either the title bar or
labels of the stack. To remove a panel from a stack, drag its label away from the stack.
When panels are stacked, their title labels are displayed on the bottom of the Info pane. To
move a control panel to the top of the stack, click its tab.
With the “pin” button ( ) in the tile bar of the individual panel or the Info pane, the auto
hide feature is controlled. If “unpinned”, the panel or the Info pane minimizes to the right

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 PANELS

border of the main window and only the panel titles are visible (similar to the “Documents”
workspace mode, but now only for the panel/Info pane and not for the Measurement area).
A mouse hover over (or click on) a title tab will slide this panel into view.
It is possible to scroll the content of a control panel up and down, when it is too small to
display all the parameters it contains. To do this, move the mouse cursor over an area where
it changes to a four pointed arrow. Then, drag the content up and down with the mouse.

Tool
The Tool panel contains the results of the various analysis tools available to you during and
after measurement, displays the current mouse position during selections, and displays the
size of those selections (e.g. during zooming). The Tool panel is described in more detail in
Section 16.6: Tool panel (page 198).

Gallery
The Gallery panel displays a list of stored measurements for quick opening (viewing and
analysis). A File Browser is also integrated for general file management tasks. The Gallery
panel is described in more detail in Section 16.4: Gallery panel (page 181).

Help

The Help Panel provides quick access to PDF versions of the user manuals belonging to
your system, to relevant application notes and technical notes, and to online sources of
information (direct links to the Nanosurf website).

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Online
The Online Panel provides you with an overview of the current scan range within the
maximum range the scanner is capable of (Scan Position section), a “Master image” that
can be used as a reference for multiple zoomed scans on different points of interest (Master
Image section) and a simple illumination control (Illumination section). The Online panel is
described in more detail in Section 13.7: Online panel (page 142).

Video
The Video panel with its top and side view of cantilever and sample is particularly useful
during sample positioning and approach (see also Section 4.4: Approaching the sample
(page 44)). The elements and usage of the Video panel is described in Section 13.6: Video
panel (page 135).

Stage
The Stage panel can be used to control the automated translation stages (ATS A100 or ATS
C301), but is only available when the Translation Stage software is installed. The Stage
panel is explained in Section 13.5: Stage panel (page 133).

12.6: Ribbon
The Ribbon provides access to all major actions and commands by grouping them
according to their usage.

Figure 12-6: The Ribbon.

The File menu

The File menu contains commands to open, save and print measurements. Other files such
as those containing parameter settings or chart properties can be loaded or saved here as
well. The file menu also provides data export functions. General program settings are
configured through the Options dialog, which is opened by clicking the “Options” button
of the File menu. The File menu is described in Section 17.2: File menu (page 203).

The Acquisition tab

Guides you through the measurement process. There are groups of buttons for
measurement preparation, sample approach and the measurement itself. The Acquisition

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 STATUS BAR

tab displays different buttons for each of the Measurement windows (Imaging,
Spectroscopy and Lithography) and is therefore described in their respective Chapters.

The Analysis tab

Contains measurement data functions for extracting information from your measurements
(e.g. “step height” or “roughness”). It also provides functions to permanently modify your
image data (e.g. “backplane removal” or “noise filtering”. All of these functions are
described in Section 16.5: Analysis tab (page 186).

The Settings tab

Contains functions to configure the microscope controller hardware and calibrating the
scan head. It is described in Section 17.3: Settings tab (page 212)

The View tab

Provides access to the workspace modes “Normal” and “Documents” (see Section 12.4:
Document space and Section 12.8.1: Workspace group), the Panels of the Info pane, and
Document window arrangement options. Since it has a great impact on the overall look of
the user interface of the SPM Control Software, it is described below (see Section 12.8: View
tab).

12.7: Status bar

1 2 3 4 5 6 7
Figure 12-7: The Status bar. Numbers in this figure correspond to those in the list below.
The status bar displays relevant microscope information and the loaded settings (see Figure
12-7: The Status bar). It contains the following elements:
1. Help text information about the current menu button or latest error messages
2. Status signal of the Z-feedback controller (red: in upper limit positions; orange: in
lower limit position; green: tip in normal feedback contact with sample).
3. Software status: “Online” or “Simulation” (depends on the presence or absence of a
scan head, or on user choice).
4. Currently loaded file (“.chart”) used for chart settings.
5. Currently loaded file (“.par”) used for parameter settings.
6. Currently loaded scan head calibration file (“.hed”).
7. Buttons to access the Workspace “Normal” and “Document” view.

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12.8: View tab

12.8.1: Workspace group

The workspace group in the view tab gives you the ability to switch between the two
workspace modes “Normal” and “Documents”. To switch, click on either of the buttons, or
on the corresponding smaller buttons ( ) on the right-hand side of the status bar (see
also Section 12.7: Status bar). With these you don't even need to switch to the view tab while
measuring.

Normal
The optimal workspace choice during measurements.

Documents
The best choice for viewing or analysis of stored documents (see Chapter 16: Working with
documents (page 169)).

12.8.2: Panels group

The buttons of the Panels group have the same function as the tabs at the bottom of the
Info pane (i.e., to bring the respective panel to the top of Info pane). If the panel was
undocked from the Info pane (see Section 12.5: Panels) and subsequently closed (i.e., no
longer visible as panel or tab), it will re-appear by pressing its button in the Panels group.

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 VIEW TAB

IMPORTANT
The “Video” and “Stage” buttons are only available when the appropriate hardware is
present.

12.8.3: Window group

The window group provides you with tools to arrange open measurement documents in
different ways or quickly close them all.

Cascade
Open document windows are stacked on top of each other and slightly offset with respect
to each other so that individual windows can be easily accessed. Width and position of the
windows is optimized by the control software.

Tile H.
Tiles the open document windows horizontally, so that individual measurements can be
easily compared. Width of the document windows is maximized. Height is evenly
distributed over the available document space.

Tile V.
Tiles the open document windows vertically, so that individual measurements can be easily
compared. Height of the document windows is maximized. Width is evenly distributed
over the available document space.

Close all
Closes all open document windows. If unsaved data exists, you will be asked to save it.

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CHAPTER 13:

Imaging
0
0
 CHAPTER 13: IMAGING

13.1: Introduction
Imaging measurements of the sample are controlled using the Imaging window. This
chapter describes all elements of the Imaging window in detail. For procedures describing
a basic measurements, refer to Chapter 4: A first measurement (page 41). For details on how
to use the charts see Section 16.3: Charts (page 171). For advanced imaging settings see
(Section 17.9.1: Imaging (page 222).
The Imaging window is contained within the Measurement pane and can be opened by
clicking the Imaging tab. The largest part of the Imaging window consists of a number of
charts that display the data from the ongoing measurement: the Chart area. The imaging
window can display as many charts as required. Scroll bars will appear automatically as
soon as the content is larger than the window can accommodate. By default, two charts
groups are displayed: 2 color maps of the sample and their corresponding line graphs.
Usually, these show Topography on the left and another measurement signal on the right
(e.g. Deflection), depending on the current operating mode. For more information on
adding and changing charts, which basically works the same for charts in Operating
windows and in stored measurements documents, see Chapter 16: Working with documents
(page 169).
The Parameter area on the left side of the Imaging window, the so-called Imaging panel, is
organized in 3 sections: the “Parameters”, “Z-Controller” and “Mode Properties” section.
These sections are an integral part of the Imaging window and represent the most
commonly used parameters for the currently selected operating mode. Possible
parameters in these sections are described in Section 13.2: Imaging panel. Advanced
parameters can be accessed via the “More” button in each section, which will open the SPM
Parameter dialog on the respective page (see Section 17.9: SPM Parameters dialog (page
221)).
At the top, the Imaging window contains a toolbar with commands to control the imaging
process: the Imaging toolbar. It is described in Section 13.3: The Imaging toolbar.
Apart from the necessary settings, several actions have to be performed before being able
to image a sample. These are accessed via the Acquisition tab of the Ribbon, the elements
of which are described in detail in Section 13.4: Acquisition tab.
Before and during imaging, several panels of the Info pane provide additional information
for your reference. The relevant panels are explained in Section 13.6: Video panel and Section
13.7: Online panel. A description of the other panels is found elsewhere in this manual.
Please refer to the Quick reference (page 300) to locate them.

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 IMAGING PANEL

Figure 13-1: The Imaging window

13.2: Imaging panel

The imaging settings use two coordinate systems: the Scanner coordinate system and the
Measurement image coordinate system. To separate the two systems, the image axes are
denoted by an asterisk (i.e. X*, Y*). The relation between the two coordinate systems is
determined by various parameters in the imaging panel. The effect of these parameters is
illustrated in Figure 13-2: Coordinate systems. In the SPM Control Software, a ‘live’
schematically illustration is displayed for the active imaging settings in the Scan Position
section of the Online panel of the Info pane (see Section 13.7: Online panel).

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'Rotation'
angle
Measurement plane
'Y-Slope'
angle Y* X*
Image area

'X-Slope' angle
Y
X Scanner XY-plane
Z, Z*
Figure 13-2: Coordinate systems

Imaging Parameter section

Image size
Defines the image size in both the X* and Y* direction. The size is doubled or halved when
the arrows next to the edit box are used.
Time / Line
The time needed to acquire a single data line. The time needed for the entire image is
displayed in the status bar.
Points / Line
The number of measured data points per line. It also sets the number of lines to the same
value.
Rotation
The angle between the X-direction of the scanner and the X* direction of the measurement
(Figure 15-2: Coordinate systems).
“More” button
Opens up the SPM Parameter dialog on the “Imaging” page for more advanced parameters
(see Section 17.9.1: Imaging (page 222)).

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 IMAGING PANEL

Z-Controller section

During imaging, the tip–sample interaction is kept constant through the Z-Controller. The
Z-Controller is a standard PID controller as is shown in Figure 13-3: Z-Controller.

P-Gain

I-Gain
Error
Control Signal Error
Range +
(Tip Current, +
Signal +
Deflection, dt Topography
Amplitude, ...) - 1..16x
+
D-Gain

Set point d
dt

Figure 13-3: Z-Controller

Setpoint
The working point for the Z-Controller. Depending on the operating mode, this is the
tunneling current (STM mode), cantilever deflection (static force mode) or relative
cantilever vibration amplitude (dynamic force mode). In the later case, the set amplitude is
relative to the operating amplitude, set in the Mode Properties Section. For example, when
a Setpoint of 70% is used, the Z-Controller will move the tip closer to the sample until the
vibration amplitude has decreased to 70% of the vibration amplitude far away from the
sample.
P-Gain
The strength of the Z-Controller reaction that is proportional to the error signal. Increasing
the P-Gain decreases the error signal.

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I-Gain
The strength of the Z-Controller reaction that is proportional to the integral of the error
signal. Increasing the I-Gain decreases the error signal over time. It is the least sensitive to
noise, and usually the dominant contributor to the topography measurement.
D-Gain
The strength of the Z-Controller reaction that is proportional to the derivative of the error
signal. Increasing the D-Gain decreases fast changes in the error signal, but also amplifies
high frequency noise.
“More” button
Opens the SPM Parameter dialog on the “Z-controller” page for more advanced parameters
(see Section 17.9.6: Z-Controller (page 233)).

Mode Properties section

Tip Voltage
This parameter defines the potential to be applied to the tip. The voltage that can be used
lies between -10V and +10V.

IMPORTANT
With the STM scan head the sample is automatically connected to the ground of the
instrument. With AFM scan heads the sample has to be electrically connected to the
instrument’s chassis ground for accurate measurements.

Free vibration amplitude

The desired reference amplitude of the cantilever vibration. The cantilever vibrates at this
amplitude when it is far away from the sample. The excitation strength is adjusted so that
this vibration amplitude is reached.
“More” Button
Opens up the SPM Parameter dialog on the “Operating Mode” page for more advanced
parameters (see Section 17.9.4: Operating Mode (page 229).

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13.3: The Imaging toolbar

“Auto chart” button

Using this button, the control software displays all meaningful charts for the currently
selected operating mode. The actual number of charts varies depending on the mode.
“Plus” and “Minus” buttons
With these buttons you can add and remove chart groups, respectively, but not more than
minimally makes sense. There will always be a chart group left. Conversely, you can't add
more chart groups than the Auto tool would display. You can however still remove or add
charts manually (See 13.7 Working with charts)
“Clear old chart data” (eraser) button
Deletes chart data from a previous measurement. Old chart data can be deleted at all times,
regardless of whether a measurement is running or not.
Zoom
Selects an area that is to be measured in more detail. The size and area of the selected zoom
area is displayed in the Tool Results panel.
The zoom area is defined by two opposite corners of the area. Pressing the left mouse
button at the first corner and holding it down while moving the mouse pointer to the other
corner will create a zoom area of user-defined size. Alternatively, an area that has a third of
the current measurement size and a center at the current mouse pointer position is defined
with a single mouse click at the desired zoom position.
The area defined by the marker can be resized by dragging one of its corners, or moved to
a new position by dragging its center point.
To accept the new zoom area:
> Double-click the chart with the left mouse button, or click the “Zoom” button in the
Tool Results panel.
This action modifies the parameters “Image size”, “Image offset X” and “Image offset Y”
in the Imaging page of the SPM Parameters dialog accordingly (see Section 17.9.1:
Imaging (page 222)).
To abort the zoom function
> Click Zoom again, or use the right mouse button to select “Abort” in the context menu.
Move
The “Move” button moves the position of the imaged area. An interesting corner can thus
be moved to the center of the measurement. The Tool Results panel numerically displays
the change in position.

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Figure 13-4: Zooming. (Left) The Zoom tool area marker. (Right) The Zoom tool information in the
Tool panel of the Info pane.

The change in position is indicated by an arrow. The start of the arrow is defined by the
mouse cursor position where the left mouse button is pressed; the end of the arrow by the
position where the button is released. With a single click of the left mouse button an arrow
ending in the center of the measurement is drawn. The direction of the arrow can be
adjusted by dragging its end markers. It can be moved by dragging the center marker.
The image is moved by double clicking, or clicking the “Move” button in the Tool Results
panel. To abort the Move function, click the Move-Button again or click the right mouse
button and select “Abort” in the context menu.
Full
The Full button returns the parameters Scan range to the largest possible values, and “X-
Offset” and “Y-Offset” to zero (see Section 17.9.1: Imaging (page 222)).
Capture
With the “Capture” button, you can immediately copy the current measurement to the
History page of the Gallery panel without waiting for the scan to be completed (see also
Section 16.4: Gallery panel (page 181)). It is stored as a new document and remains open in
the Document space of the SPM Control Software.

13.4: Acquisition tab

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13.4.1: Preparation group

Auto set
The “Auto set” button opens the Parameter preparation wizard. This wizard sets the
measurement parameters to reasonable values, based on the sample feature size and
desired imaging quality that you enter:

More
Additional preparation wizards to help setting up certain operating modes are found here.
Currently, only the KPFM Wizard is available:

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Environment
This drop-down box allows the selection of either “Air” or “Liquid” as measurement
environment. Depending on mounted scan head, certain options may or may not be
available.
Operating Mode
This drop-down box allows the selection of the Operating mode used for measuring (see
Chapter 6: Operating modes (page 63)). Depending on the installed controller modules and
the mounted scan head, certain options may or may not be available.
Cantilever Selector
This drop-down box allows the selection of the mounted cantilever. For more details see
Section 3.3.1: Selecting a cantilever (page 30). Depending on your scan head, certain options
may or may not be available. The entry “Cantilever Browser…” opens the Cantilever
Browser dialog, which allows you to edit existing or define new cantilever types (see Section
17.13: Cantilever Browser dialog (page 245))
Freq. Sweep
This button opens the Vibration Frequency Search dialog. In this dialog, amplitude versus
frequency plots can be measured and the operating frequency for dynamic modes can be
set manually. In “Air” environment, setting of the vibration frequency is normally
performed fully automatically, without user intervention. In “Liquid” environment, the
Vibration Frequency Search dialog opens after the control software determined a suitable
vibration frequency. You need to fine adjust and confirm the selected resonance frequency
prior to approach. For more details about this dialog see Section 17.11: Vibration Frequency
Search dialog (page 239).
Laser Align
This button opens the Laser Align dialog. In this dialog, laser power and the current
position of the laser beam on the detector are monitored. It is used to check for good
detector and laser alignment. With FlexAFM scan heads it guides the user to manually
adjust these positions if required or desired (see FlexAFM Laser and detector alignment).
Launcher icon
More advanced settings are available through the “Dialog Launcher” icon ( at the bottom
right corner of the Preparation group), which opens up the SPM Parameter dialog on the
Operating Mode page (see Section 17.9.4: Operating Mode (page 229)).

13.4.2: Approach group

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Home
Increases the tip–sample distance to its maximum value to ensure that the maximum
motorized approach range is available during final automatic approach.
Retract
Increases the tip–sample distance at maximum speed until the button is released.
Advance
Decreases the tip–sample distance at maximum speed until the button is released.
Approach
Starts the automatic approach. During automatic approach, the tip–sample distance is
decreased until the Setpoint (set in the Z-Controller section) is reached, or until the
maximum number of approach steps is reached (see Section 17.9.5: Approach (page 231)).
Withdraw
Increases the tip–sample distance with approach speed settings.
Launcher icon
More advanced settings are available through the “Dialog Launcher” icon ( at the bottom
right corner of the Preparation group), which opens up the SPM Parameter dialog on the
Approach page (see Section 17.9.5: Approach (page 231)).

13.4.3: Imaging group

Start
Clicking “Start” starts a measurement and changes the button to “Stop”. Clicking “Stop”
aborts the measurement as soon as the current scan line is finished.
Finish
Selecting “Finish” will set the “Finish” flag, which will not abort the measurement directly,
but will do so when the measurement is finished. Deselecting (i.e., clicking it again) will
disable the “Finish” flag so that the measurement will no longer stop automatically when it
is finished. The “Finish” button is highlighted when it is flagged.
Up / Down
Starts a single measurement or restarts an ongoing measurement from the selected
scanning direction. With the “Up” button the image is scanned from bottom to top. With
the “Down” button it is scanned from top to bottom.

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Launcher icon
More advanced settings are available through the “Dialog Launcher” icon ( at the bottom
right corner of the Preparation group), which opens up the SPM Parameter dialog on the
Imaging page (see Section 17.9.1: Imaging (page 222)).

13.4.4: Scripting group

The Scripting Interface is an optional component for creating user defined scripts (software
components) to add new features or automating tasks. For details, see “Help Panel” >>
“Manuals” >> “Script Programmer’s Manual”.

Important:
The Scripting Interface is a purchase option and has to be activated using the Access
Codes page (see Access Code (page 212) of the Options dialog).

The “Script” button

This button opens the Script Editor Dialog. In this Dialog, a script source code can be
Loaded, Edited, Saved and Run directly.
The “Script” button drop-down menu
Accessed by clicking the arrow head at the bottom part of the “Script” button. In this drop-
down list, scripts from the standard scripting directory are displayed and can be started by
selecting the corresponding menu item. The menu item's name is equal to the script’s
name without the script extension (*.vbs) and is sorted alphabetically. The standard
directory is configured through the Scripting Acquisition and Analysis file paths (accessed
via “File” >> “Options” >> “Scripting” (see Scripting (page 209)).
At the bottom of the drop-down menu, the “Run from File…” menu item is displayed. It
allows selection and execution of a script file anywhere on your harddisk (or other storage
media). With the selection of this menu item, a File Open dialog is displayed and a script file
can be manually selected. This script file is executed directly after “Open” is selected.

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13.5: Stage panel

This panel is only available to Nanosurf AFM systems when the Translation Stage Software
is installed on the computer that contains the SPM Control Software (usually with Nanite
systems). The Stage panel allows moving of the translation stage in the same way as the
corresponding panel in the Batch manager is operated.

Stage Position section

The upper part of the Stage Position section displays the current position of the translation
stage in coordinates relative to the zero point of the translation stage, or in coordinates
relative to a previously set zero point. On start-up, the coordinates are shown relative to the
start up position, until the reference position of the stage has been found (e.g. after clicking
the “Search” button).

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Absolute
Clicking the “Absolute” button ( ) (re)sets the zero point of this axis’ coordinate display to
the absolute zero point of the translation stage. The Stage Position coordinates (X,Y,Z) now
display the absolute position of the stage.
Relative
Clicking the “Relative” button ( ) sets the zero point of this axis’ coordinate display to the
current position. The Stage Position coordinates (X,Y,Z) now display the position of the
stage relative to the position where the “Relative” button was last clicked.
Search
Clicking the “Search” button ( ) starts a search for the reference position of the
translation stage. The reference position can be different from the zero point of the stage.

Manual Move section

Move To
Clicking the “Move To” button ( ) opens the Move Stage To dialog (see Section
13.5.1: Move Stage To dialog).
Arrow buttons
Move the translation stage in the direction of the arrow for as long as the button is clicked
and held.
Speed
The speed with which the translation stage moves.

13.5.1: Move Stage To dialog

CAUTION
It is recommended to always keep the approach stage in the upper limit position. When
repeatedly moving to the same position, it is possible that the tip will crash into the
sample if the approach stage is in a lower position than it was before.

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This dialog is only available to Nanosurf Nanite AFM systems with an automated translation
stage attached and the corresponding software installed. It is used to move the translation
stage to a specific destination position. It is opened by clicking the “Move To” button in the
Manual Move section of the Stage panel (see Manual Move section (page 134)).
X/Y/Z
The (X, Y, Z) coordinate of the destination position.
Move relative to current position
When checked, the (X,Y,Z) coordinates are interpreted relative to the current position.
When not checked, the coordinates are interpreted as a position relative to the absolute
zero point of the translation stage. This checkbox is only enabled when the reference
position has been found (e.g. after clicking the “Search” button in the Stage Position
section of the Stage panel).
Move
Clicking the “Move” button ( ) moves the translation stage to the destination
position entered by the user (see above).

13.6: Video panel

The Video panel displays the available video signals. Each of the graphical sections used for
this contains a toolbar with control options to adjust the display properties of the
respective video signal. The settings for each of these controls is stored independently for
each video signal (i.e. different setting can be set for both top and side view).

INFO
If your system is not equipped with a Video Camera or the SPM Controller is not
equipped with a Video Module, this Panel will not be available.

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13.6.1: Analog video camera display

If your system is equipped with analog cameras and the analog video module (e.g. in case
of the easyScan 2 AFM or Nanite B), only one camera view can be displayed at any given
time.

Figure 13-5: Analog video signal in the Video panel. (Left) Top view. (Right) Side view.

Analog Video Camera toolbar

Show Window
The “Show Window” button ( ) allows you to switch between display of the video signal
in a section of the Video panel and display of the video signal in a separate window (see
Figure 13-6: Free floating video window).

Figure 13-6: Free floating video window

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 VIDEO PANEL

Switch view
The “Switch View” button ( ) allows you to switch between the two analog video
cameras. Either the Top view signal or the Side view signal is displayed.
Brightness
The “Brightness” slider ( ) regulates the brightness of the video display.
Contrast
The “Contrast” slider ( ) regulates the contrast of the video display.
Save As...
The “Save As...” button ( ) allows you to save the current video image as a JPG file.
Copy
The “Copy” button ( ) allows you to copies the current video image to the Windows
Clipboard for “pasting” into other applications.

13.6.2: Digital Video Camera display

If your system is equipped with a digital USB camera (e.g. for FlexAFM scan heads), two
camera views can be displayed simultaneously and more video controls are available when
compared to the analog camera options. The digital video cameras support digital Zoom
and Focus adjustment via additional toolbar buttons, and an anti-moiré and a high-
resolution mode are available too (see below).

Figure 13-7: Digital video signal in the Video panel. (Left) Top view. (Right) Side view.

Digital Video Camera toolbar

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In addition to the options available for analog cameras (see Analog Video Camera toolbar),
the following options exist:
Zoom + / Zoom –
The “Zoom” buttons ( ) allow you to zoom in or out digitally (by binning of pixels). The
zoom area is always in the center of the image. The number of pixels displayed is kept
constant. Therefore, the video rate is independent of the zoom factor. The current zoom
factor is displayed in an overlay at the bottom of the video image.
Focus up / Focus down
The “Focus” buttons ( ) adjust the focus of the current camera view. Motors in the
respective camera physically adjust lenses to change the focus plane.
Gain slider
The “Gain” slider ( ) regulates the amount of gain applied to the video signal.
Anti-Moiré Button

The “Anti-Moiré” button ensures that the ratio between the number of camera pixels and
video display pixels is always a whole number. This prevents moiré patterns from occurring
in the video image. The moiré effect is mostly visible on samples with regular structures like
grids or lines if this option is not enabled.
When the Anti-Moiré mode is active, the button is highlighted. Clicking the highlighted
button will deactivate the Anti-Moiré mode and will cancel the button’s highlighting.

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High-Resolution Mode Button

The “High-Resolution Mode” button If this mode is activated, the video display shows all
camera pixels on the display one-to-one. No Zoom is available in this mode. If the video
display’s pixel size is lower than the camera’s, scroll bars are automatically shown on the
borders of the video display. This mode is only useful in a large separate window (e.g. on a
second LCD monitor) when you need to see a sample in full detail.
When the High Resolution mode is active, the button is highlighted. Clicking the
highlighted button will deactivate the High-Resolution mode and will cancel the button’s
highlighting.

IMPORTANT
In high-resolution mode the amount of (video pixel) data that needs to be transferred
over the USB connection is huge. As a result, the video frame rate typically drops below
5 Hz and a high-performance PC is required to keep the system stable.

Pause Button
If the “Pause” button ( ) is activated the video image update is stopped and the frozen
image (last frame received) is shown continuously. A second click on this button restarts
the real time video display.
Video Properties Button
A click on this button opens the Digital Video Properties Dialog. See the next section
(Section 13.6.4: Digital Video Properties dialog) for details.

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13.6.3: Illumination section

The Illumination section of the Video panel contains an Illumination slider that controls the
intensity of the sample illumination LED. It may be used to adjust the amount of light on
the sample, thereby optimizing the video image.
If you have an analog camera installed in your system, the illumination settings will depend
on the selected camera view (top or side view) and will be stored individually.
In case you have a digital camera in your system, where top and side view are shown
simultaneously, only one illumination setting is used.
If no camera is installed, the Video panel will not be accessible, and the Illumination slider
will therefore be present in the Online panel (see Section 13.7.3: Illumination section).

13.6.4: Digital Video Properties dialog

The Digital Video Properties dialog can be accessed via the Video Display toolbar or the
video display’s context menu. The properties accessible through this dialog directly
influence the respective camera's behavior at the camera driver level.

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Image
Exposure time
Adjusts the exposure time (time to record one image frame) for the respective video
camera. Changing this setting allows the camera to cope with very bright or very dark
sample illumination conditions, or to fine-tune the predefined illumination condition
ranges (see Range below).
Range
Allows the selection of different illumination ranges (levels) for quick adjustment of the
video camera to the current sample illumination conditions. Lower level numbers are
suitable for lower illumination conditions.
Gain
Identical to the “Gain” slider in Digital Video Camera toolbar (page 137), which adjusts the
amount of gain applied to the video signal.
Auto Levels
When checked, this option automatically adjusts the camera data to fill the dynamic range
of the Video display (similar to the “Auto set” option for the Chart data range (see Section
16.3.2: Chart Properties dialog (page 174)). Using this option will automatically give you a
good quality image. You will find that changing the other image parameters while this
option is checked (within limits) hardly has an effect on the video display anymore.

Color adjustment
Red ratio
Adjusts the relative amount of red color information in the RGB color mix for each pixel. Not
available for the (monochrome) side view.
Green ratio
Adjusts the relative amount of green color information in the RGB color mix for each pixel.
Not available for the (monochrome) side view.
Blue ratio
Adjusts the relative amount of blue color information in the RGB color mix for each pixel.
Not available for the (monochrome) side view.
Gamma
Adjusts the midpoint of the video image’s dynamic range. Adjusting this setting can be
beneficial for images that show too low or too high contrast. In such cases, increase or
decrease the gamma setting, respectively.

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Video dark image correction

At higher gains levels, digital cameras tend to exhibit differences in intensity for individual
image pixels, making some pixels stand out unfavorably from the rest. Applying the Video
dark image correction (on by default) will remove any such pixels from the video display.
This is done by using a so-called “dark image” as a reference. The SPM Control Software will
attempt to record this dark image the first time it is started with the FlexAFM Video Camera
attached. This process is silent. If successful, the “Apply correction” checkbox (see below)
will be available in the Video Display Properties dialog. If the ambient light is too high,
however, the process will fail, and the “Apply correction” checkbox will be grayed out. To
activate the checkbox, it will be necessary to record the dark image manually by clicking
the “Record dark image” button. If the light levels are still too high, you will be advised to
cover the instrument or darken the room.
Apply correction
Applies the dark image correction.
Record dark image
Records the dark image for video correction. Each time this button is clicked, the previous
dark image reference will be overwritten.

13.7: Online panel

The Online Panel displays scan area information and various other data.

13.7.1: Scan Position section

The Scan Position section displays information about the maximum scan head scan area,
the current measurement area and the tip position.
The left side of the section shows the maximum scan range of the scan head (outer square
and numbers) and the currently set image size (inner square). The dotted bars to the left

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and right of the inner square represent the “Overscan” area (see Overscan in Section 17.9.1:
Imaging (page 222)).
The red line in the inner square represents the currently measured scan line during
imaging. The two arrows represent the orientation of the axes of the image coordinate
system. The small dot in the center of the image square represents the Offset and Rotation
point (see Image offset X/Y and Rotation in Section 17.9.1: Imaging (page 222)).
The dotted bar on the right side of the Scan Position section represents the maximum Z-
range (bar and numbers), the used range for the current measurement (gray box) and the
actual Z-position (average of the current scan line) of the tip (red line).

13.7.2: Master Image section

The Master Image section displays a topography measurement, which can be used as a
reference for comparison with other measurements, or as an overview image for multiple
(zoomed) measurements on several points of interest. The Master Image section starts out
blank. A reference image has to be loaded manually. When this is done, a box with a black
outline will show the current measurement area inside the reference/overview image.
Load
The Load button captures the actual topography image of the active Measurement Tab
into the Master Image Section.
Zoom
A click to this tool activates the Zoom Tool in the Master Image chart area to select a new
scan area size and position (within the loaded image). After selecting the Zoom button the
user draws a zoom frame in the chart area. To select the new scan area, double-click within
the selection area. A right mouse click aborts the zoom operation.

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13.7.3: Illumination section

With the Illumination slider the intensity of the sample illumination LED is controlled. This
slider is only present in the Online panel when no video camera is present in your system.
When a camera is present, this slider automatically moves to the Video panel (see Section
13.6.3: Illumination section).

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CHAPTER 14:

Spectroscopy
0
0
 CHAPTER 14: SPECTROSCOPY

14.1: Introduction

Figure 14-1: Spectroscopy window

Spectroscopic measurements are performed in the Spectroscopy window, which is opened
by clicking the Spectroscopy tab in the Measurement pane. In a spectroscopic
measurement, the input channels are measured as a function of a modulated parameter.
This modulated parameter can be the Z-distance to the sample, the tip voltage, or a User
output channel (when Signal Module A is installed). The measured parameter can be any
available input channel. Examples of a spectroscopic measurement are force/distance
curves in the AFM static force mode, amplitude/voltage curves in the AFM dynamic mode,
or current/voltage curves with the STM.

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IMPORTANT
AFM users must electrically connect the sample to the ground connector on the scan
head to apply a tip–sample voltage difference.

The accuracy of the spectroscopic measurements can be increased by averaging the

measurement results of several consecutive modulations. A spectroscopic measurement
sequence consists of a number of spectroscopic measurements of the same type,
measured along a user defined line in the XY-plane. A point measurement is made if the
number of points is one.
The measurement sequence is carried out as follows:
1. Move the tip to the start of the line with active Z-control.
2. Switch off the Z-Controller (depending on parameter selection).
3. Record a spectroscopic measurement.
4. Turn on the Z-Controller again.
5. Move the tip to the next point on the line in the XY-plane. Steps 2–5 are repeated for
all points on the line.
The Spectroscopy window contains the Spectroscopy toolbar, with commands that control
the spectroscopy processes, and the Spectroscopy panel (parameter area), with
parameters that determine how the spectroscopy measurement is performed.
The Spectroscopy tab also contains a number of charts that display the data from a
previous imaging measurement and the data from the ongoing spectroscopic
measurement. The Spectroscopy tab can display as many charts as the size of the window
can accommodate. It is recommended to display at least two charts, one Color map of a
previous Topography measurement of the area where the spectroscopy measurement is
performed, and one Line graph of the current spectroscopy measurement. For more
information on adding and changing charts see Section 16.3: Charts (page 171).

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14.2: Spectroscopy panel

Parameters section

Modulated output
This parameter defines the signal used to drive the spectroscopy (X-Axis). All possible
signals are recorded while this modulation output signal is changing its value from “Start
value” to “End value” (Y-Axis). The number of available modulated outputs depends on the
scan head and the number of installed modules. Possible values are: “Z-Axis”, “Tip Potential”
and the names of the User Outputs.
Start value / End value
The range over which the Modulated output is changed. The “Spec Forward” data is
measured from the Start to the End value, the “Spec backward” data is measured in the
opposite direction. The “Spec forward” data is always measured before the “Spec
backward” data. For spectroscopy as a function of distance (Z-axis modulation), more
negative values are further away from the sample whereas more positive values go towards
(or even into) the sample.
Modulation time
The time used to change the Modulated output from the Start to the End value.
Data points
The number of data points measured while the Modulation output changes from Start to
End value. The data points are equally distributed over the modulation range.
Averages
The number of times the modulation is repeated to obtain an averaged spectroscopic
measurement. The measurement results of aborted modulations are discarded during
averaging.
“More” button
Opens up the SPM Parameter dialog on the “Spectroscopy” page for more advanced
parameter settings (see Section 17.9.2: Spectroscopy (page 225)).

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Position section

The Position parameters can be used to define a sequence of spectroscopy measurements

on positions that are evenly distributed on a line.
Sequence Points
The number of Spectroscopy measurements to be performed in the sequence. If Sequence
points is set to one (1), a single point spectroscopy is performed. If Sequence value is two
or more, a line spectroscopy is performed. The spectroscopic measurements positions that
are equally distributed over the line defined by “X/Y-Pos from” and “X/Y-Pos to”.
X-Pos from / Y-Pos from
The XY-coordinates of the measured point in a spectroscopy measurement. Sets the XY-
coordinates of the starting point of the line in a spectroscopy measurement sequence.
X-Pos to / Y-Pos to
The XY-coordinates of the end-point of the line in a spectroscopy measurement sequence.
The from and to coordinates are more conveniently chosen using the point and line tools
in the Spectroscopy toolbar.

14.3: Spectroscopy toolbar

Point
Activates the single point spectroscopy mode. It defines the position of the spectroscopy
measurement by mouse. Click in the topography Color Map chart at the position where the
spectroscopy measurement should take place. A small black dot appears at this position.
The positions coordinate is transferred to the “X/Y-Pos From” parameters in the Position
section. The value in “Sequence” defines the number of spectroscopy measurements
measured at these point.
Line
Activates the line spectroscopy mode. Defines the start and end position of the
spectroscopy measurement by mouse. Click and hold the left mouse button in the
topography Color Map chart at the position where the spectroscopy measurement should
start. Move the mouse to the end position and release the left mouse button. A line is

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drawn between these two points. The positions coordinate is transferred to the “X/Y-Pos
From” and X/Y-Pos To” parameters in the Position section. The value in “Sequence” defines
the number of spectroscopy measurements measured along these line.
Load
Fills the Topography Color Map chart in the Spectroscopy window with the current
measurement of the Imaging window. Selection of “point” or “line” measurement position
can be done in this chart.
Capture
A click on “Capture” saves the current spectroscopy measurement data to the History page
of the Gallery panel, even when the measurement(s) have not been completed yet. The
spectroscopy data are stored as a new document and remain open in the Document space
of the SPM software.

14.4: Acquisition tab

During spectroscopy, all groups of the Acquisition tab are identical to those during imaging
of the sample, with exception of the Imaging group, which is replaced by the Spectroscopy
group.

14.4.1: Spectroscopy group

Start
Clicking “Start” starts a spectroscopy measurement sequence and changes the button to
“Stop” until the measurement sequence is finished. Clicking “Stop” aborts the
measurement sequence as soon as the current modulation period is finished.
Launcher icon
More advanced settings are available through the “Dialog Launcher” icon ( at the bottom
right corner of the Spectroscopy group), which opens up the SPM Parameter dialog on the
Spectroscopy page (see Section 17.9.2: Spectroscopy (page 225).

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Lithography
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15.1: Introduction

Figure 15-2: Lithography window

In the context of Scanning Probe Microscopy (SPM), Lithography is the process of
modifying a sample surface with the goal of creating a pattern on that surface with the SPM
tip. In the Nanosurf SPM software, this is accomplished in the Lithography window. The
Lithography window is opened by clicking the Lithography tab in the Measurement pane.
The Lithography window contains the Lithography toolbar, with commands that control
lithography-related processes, and the Lithography panel, with parameters that determine
how the Lithography is performed.

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By default, the Lithography window also contains the Lithography Preview display (see
Section 15.6: Lithography preview (page 168)) and a Color map chart of the current
Topography measurement. The Lithography window can however display more charts,
should this be desirable. For more information on adding and changing charts, see Section
16.3.1: Working with multiple charts (page 173).

IMPORTANT
Lithography of objects drawn by hand and direct manipulation of the tip is available as
standard. Issuing of lithography commands through the Scripting Interface requires a
license for the Scripting Interface. Import of vector or pixel graphics files to be used as
patterns in the lithography process requires the licensed Lithography Option. For
information on how to activate the scripting interface or the Lithography Option, refer
to Access Code (page 212).

15.2: Performing lithography

Lithography can be performed provided that suitable samples, tips, and lithography
parameters are used. Depending on the operating mode and operating parameters used
during the Lithography process, the surface modifications fall into two distinct categories:
1. Mechanical surface modification through “scratching”, “indenting” (both Static Force
mode), or through “hammering” (Dynamic Force mode). This type of modification
require higher tip-sample interactions then normally used during imaging to
mechanically transfer the desired pattern into the sample surface. The width and
depth of the scratches or indentations made mainly depend on the force exerted on
the cantilever tip and on the tip’s shape.
2. Electrochemical surface modification through voltage-dependent surface reactions.
This type of modification requires a voltage difference between sample and tip, and
will add molecules to the surface (e.g. through oxidation). The width and height of the
oxidative surface modifications depend on the relative humidity of the ambient air, on
the strength of the electric field, and on the tip speed.
A typical lithography process is performed as follows:
1. The sample surface is imaged to identify an area that is suitable for transfer of a
pattern. Suitable areas should preferentially be flat and dust-free.
2. The Lithography window is opened and the “Load” button of the Lithography toolbar
is clicked to import the imaged sample surface.
3. A pattern that was previously designed is imported. Suitable sources for patterns can
either be (multi-layered) vector graphics files (GDS II, DXF, CIF, OAS, OASIS) or (multi-
color/grayscale) pixel graphics files (BMP, DIB, GIF, TIFF, PNG, JPEG). After import of a

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vector or pixel graphics file, the pattern is referred to as a “Lithography object” in the
Lithography window.

IMPORTANT
• In case of vector-based objects, multiple lithography objects may be present (e.g.
through sequential import) and used for lithography. In case of pixel-based objects,
only one pixel-based object can be present at any given time (other objects will be
deleted upon import).
• A separate CAD program called “LayoutEditor” is included on the installation CD to
create suitable GDS vector graphics (Newest version of LayoutEditor; http://
layout.sourceforge.net). Pixel graphics files can be created or edited in any pixel-
based image editor like the Windows Paint.
• As an alternative to designing the lithography pattern in a vector or pixel graphics file
and then importing it into the lithography software, a freehand drawing mode is
available in the Lithography window.

4. The imported object is positioned and scaled to fit the target area.
5. The Lithography sequence is executed.
6. The sample surface is re-imaged to view the Lithography results.

Tip
As alternatives to step 3–5, you can also use the Direct Tip Manipulation or Free Drawing
modes.

15.3: Lithography panel

Parameters section

Lithography operating mode

Used to select the operating mode during lithography operation:. The following options
are available:
– Static Force

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– Dynamic Force
– STM (STM only)
Inactive pen mode
Action to be performed when the tip is moving from one end point to a new start point, in
case the end point and start point are not the same. The following options are available:
– Lift up tip
Only lift the tip (upper position of the Z-actuator of the scan head). No feedback will be
performed by the Z-Controller during travel to the new start point.
– Standard operating mode
Switch the Z-Controller operating mode back to the one selected in the “Operating
Mode Panel” during imaging. All values such as Tip speed, Tip voltage, Setpoint etc. will
temporarily chance back to the values used for imaging. The Z-Controller will be active
during travel to the new start point.
“More” button
Opens up the SPM Parameters dialog on the “Lithography” page (see 1Section 17.9.3:
Lithography (page 228)).

Lithography Layers section

Layer list
Lists all layers that are present in the objects shown in the Lithography Objects list. Layer 0
is always present, even if no lithography objects exists, and may be used to set the default
Lithography parameter values (see Parameters (page 166) in Section 15.5.2: Pixel Graphic
Import dialog for details).
Edit
Edit will open the Layer Editor dialog to edit the selected layer.
Copy
Copy will open the Layer Editor dialog (see Section 15.3.1: Layer Editor dialog) to edit the
selected layer before copying it. When changes have been made (if any) and the “OK”
button is clicked, a new layer is generated.

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IMPORTANT
Upon creation of a new layer, the layer number will be incremented to the next available
layer number. If a total of 256 layers is reached, no more layers can be added.

Delete
Used to delete a layer. Delete will open a warning dialog to confirm the deletion of the
selected layer.

IMPORTANT
Only layers currently not assigned to any object can be deleted.

Load
Load a predefined layer list “.lld”. Layers that are needed to display the current objects that
are not part of the loaded list will be created.
Save
Save all the layers to a layer list file “.lld”.

Lithography Objects section

Contains a list of all available Lithography objects. Objects may be selected or deselected
by checking or unchecking the checkbox. If the object is unchecked it will not be used for
a lithography session.
Edit
Edit will open the Object Editor dialog to edit the selected object (see Section 15.3.2: Object
Editor dialog (page 159)).
Copy
Copy will open the Object Editor dialog to edit the selected object before copying it.
Delete
Delete will delete the selected object. A warning dialog will appear for confirmation of this
action.

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15.3.1: Layer Editor dialog

The Layer Editor sets the controller parameter values to be used during lithography.

Layer
Layer
Displays the selected layer’s number.
Name
Displays and allows editing of the selected layer’s name.
Color
Allows selection of the layer color for display of the layer elements in the Topography chart
of the Lithography window.

Common parameters
Tip speed
Determines the drawing speed during lithography,

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Tip voltage
Determines the voltage set to the tip during oxidative Lithography.

STM parameters
Setpoint
Used to set the tunnelling current Setpoint of the Z-Controller during STM Lithography.

Static Force parameters

Setpoint
Used to set the force Setpoint of a lithography sequence performed in the Static Force AFM
mode.

Dynamic Force parameters

Setpoint
Used to set the amplitude Setpoint of a lithography sequence performed in Dynamic Force
AFM mode.
Free vibration amplitude
Used to set the Free vibration amplitude of a lithography sequence performed in Dynamic
Mode
“Default” button
Loads the default Lithography parameter values.

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15.3.2: Object Editor dialog

Preview
Graphical area that provides a preview of the selected Lithography object. The red cross (if
visible) indicates the origin position of the object.

Object
Name
The name that is used to describe the object. Default names are generated during import,
based on the GDS II object names, or on the pixel graphic filename, but may be edited here
afterwards.

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Size
Width/Height
Displays the width and the height of the object.
Scale factor
The factor by which the object can be scaled. If the scale factor is changed, the width and
the height will be automatically recalculated. Scale factor 1 represents the original size.

Position
X-Pos/Y-Pos
The X-Pos and the Y-Pos may be used to move the object within the space of the
topography map.
Move to Center
Moves the origin on the selected object back to the center of the topography map.

15.4: Acquisition tab

During Lithography, all groups of the Acquisition tab are identical to those during imaging
of the sample, with the exception of the Imaging group, which is replaced by the
Lithography group.

15.4.1: Lithography group

Start
Starts the lithography sequence and changes to “Stop” until the lithography sequence is
finished. Clicking “Stop” aborts the sequence.
Rescan
Starts a single image measurement and changes to “Stop” until a full image has been
scanned. The image is scanned from the bottom to top. Clicking “Stop” aborts the
measurement.

IMPORTANT
When performing imaging from within the Lithography window, be sure to set valid
imaging parameters in the Imaging and Z-Controller sections of the Imaging panel.

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Launcher icon
The Lithography parameters can also be accessed through the “Dialog Launcher” icon (
at the bottom right corner of the Lithography group), which opens up the SPM Parameter
dialog on the Lithography page (see Section 17.9.2: Spectroscopy (page 225).

15.5: Lithography toolbar

Manipulate
Starts the direct tip manipulation mode. It is now possible to control the movement of the
tip by moving the mouse around the topography color map chart. When the left mouse
button is held down, Lithography will be performed with the lithography operating mode
set in Lithography panel, and with the parameters set in Layer 0 (the Tip speed setting is
ignored). When the left mouse button is released, the tip will go to the inactive pen mode
set in the Lithography panel, and will not move until the left mouse button is pressed again.
Dragging the mouse slowly will produce smoother lines than dragging it fast.
Draw
Starts the free hand drawing mode. A shape can now be drawn in the topography color
map chart by clicking and holding the left mouse button. A shape can only consist of a
single line. Repeating the above will erase the previous drawing. Double clicking the
drawing will save it to the Lithography Object list. The drawn shape can be executed by a
click on “Start” in the Acquisition tab.
Import vector
Opens an “Open File” dialog to import a GDS II vector graphic file (extension “.gds”). Other
formats (DXF, OAS, OASIS, CIF) can be converted to GDS II using the external program
LayoutEditor (provided on installation CD).

IMPORTANT
• Since the Lithography software only supports a subset of the GDS II file format, an
error message will appear when a file containing non-supported elements is loaded.
• To avoid most load error messages, the vector graphics project should be fully
flattened before saving it as a GDS II file. LayoutEditor and most other CAD programs
provide some form of flattening functionality. Refer to the manual or (online) help of
your CAD program for details.

For more information on the available import options after selecting a valid GDS II file, refer
to Section 15.5.1: Vector Graphic Import dialog.

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Import bitmap
Opens a “Open File” dialog for importing a BMP, DIB, GIF, TIFF, PNG, or JPEG pixel graphics
file.

IMPORTANT
The Lithography software supports files with 256 pixels or less in width and height.

For more information on the available import options after selecting a valid pixel graphics
file, refer to Section 15.5.2: Pixel Graphic Import dialog.
Load
Loads the Topography image from the Imaging window into the Lithography Topography
chart.
Capture
This button captures the measurement currently displayed in the “Lithography window” to
the History page of the Gallery panel. If clicked during a measurement, a copy is generated
as soon as the measurement in progress is finished. The capture process is cancelled by
clicking second time. The captured measurement is stored as a new document and remains
open in the Document space of the SPM Control Software.

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15.5.1: Vector Graphic Import dialog

The Vector Graphic Import dialog appears after clicking the “Import Vector” button and
selecting a valid GDS II file. It can be used to select the object (cell) of the GDS II file to
import. Size and origin of the resulting lithography object can be set during import using
the Size and Origin fields (see description below), or after import using the Object Editor
(see Section 17.3.2: The Object Editor dialog (page 191) for details).

Available objects (cells)

Contains a list with all valid objects (cells) of the selected GDS II file. Selecting an object will
results in the respective object being displayed in the preview area of the Vector Graphic
Import dialog, and will cause the selected object to be imported when the “OK” button is
clicked. Objects can only be imported one at a time. Clicking the “Cancel” button will abort
the import process.

Preview
A graphical area that displays the selected object in the available objects list (see above).
The red cross (if visible) indicates the position of the object's origin.

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Size
Width / Height
Displays width and height of the selected object (cell).
Scale factor
The factor by which the selected object (cell) will be scaled. A scale factor of 1 corresponds
to the original object size. If the scale factor is changed manually, the object's width and
height will be recalculated and displayed automatically.

Origin
X-Offset / Y-Offset
The X-Offset and the Y-Offset of the origin of the selected object (cell).
Set origin to center
When enabled, the origin of the object (cell) will be set to the center of the rectangle that
encloses the object. When disabled, the origin will remain at the position that is defined in
the object.

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15.5.2: Pixel Graphic Import dialog

The Pixel Graphic Import dialog appears after clicking and selecting a supported pixel
graphics file, and can be used to specify how such a file is converted to a lithography object.
All images are first converted to an 8-bit grayscale (256 levels). Each set of pixels with the
same grayscale value will correspond to a separate layer in the resulting lithography object.
Layers will only be generated for those grayscale values that are actually occupied. In
addition, the number of layers can be reduced upon import (see Simplify to (page 186)).
For each layer, individual lithography parameters can be set. One of these lithography
parameters can be automatically varied upon import, by using the grayscale values of the
imported pixel graphics file to define the selected parameter's range (see Parameters
below). All parameters can of course always be modified manually after import (see Section
17.3.1: The Layer Editor dialog (page 188)).

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Preview
Graphical area that displays the selected pixel graphics file and information about the file.

Size
Width / Height
The width and the height of the lithography object resulting from the Pixel Graphic import.
The default settings for width and height are taken from the dimensions of the current
color topography map of the Lithography window. The pixel graphic is automatically
resized to fit into the area defined by these dimensions while maintain its aspect ratio. It is
at this point however possible to change the automatically calculated size manually. If the
width is changed manually, the height is recalculated to keep the aspect ratio. If the height
is changed manually, the width is not recalculated.

Origin
X-Offset / Y-Offset
By default the origin is in the center of the pixel graphic. By manually changing X-Offset and
Y-Offset, the origin may be moved to a different position.

Parameters
This area allows selection of the lithography parameter that will be automatically varied,
based on the different grayscale values of the imported pixel graphics file. The parameter
values for the black and white pixels of the imported pixel graphic can be set, after which
the parameter values corresponding to any in-between grayscale values are interpolated.

IMPORTANT
Since it is only possible to select one automatically adjusted lithography parameter per
import, the other parameters must be set elsewhere. This is achieved by setting the
Layer 0 parameters before import. The values entered here will be used as default values
for all imported layers, except for the parameter that was explicitly selected in the Pixel
Graphics Import dialog.

All values and settings in the parameters section are stored when the dialog is closed. They
will be automatically used the next time the dialog is opened.
From the drop-down list box, one of the following parameters may be selected for
automatic calculation:
– Tip speed
– Tip voltage
– STM Setpoint

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– Static Force Setpoint

– Dynamic Force Setpoint
– Dynamic Force Amplitude
Black / White
Used to enter the parameter values for black and white pixel values, which form the basis
for the interpolation of the in-between color/grayscale pixel values.

Example
Setting the automatically adjusted Lithography parameter to “Static Force Setpoint”,
and Black (layer 0) and White (layer 3) to 25 μN and 10 μN, respectively, will result in:
• Layer 0 (black pixel layer) having a Static Force Setpoint of 25 μN
• Layer 1 (gray pixel layer 1) having a Static Force Setpoint of 20 μN
• Layer 2 (gray pixel layer 2) having a Static Force Setpoint of 15 μN
• Layer 3 (white pixel layer) having a Static Force Setpoint of 10 μN.

Simplify to
Select the number of layers the imported pixel graphics file should be simplified to.
Selecting the number of layers to be identical to the number of grayscale values in the pixel
graphics file will results in no simplification taking place. In all other cases, simplifications
are performed through binning of layers.

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15.6: Lithography preview

Figure 15-3: Lithography preview. (Left) Before the Lithography sequence has been started. (Right)
While the Lithography sequence is running.
The Lithography Topography chart is the only chart present in the Chart area of the
Lithography window (Figure 15-3: Lithography preview, left). It displays the topography
image of the sample surface to be used for lithography (after the Topography information
has been loaded via the “Load” button of the Lithography toolbar (see Load (page 156)) and
the superimposed preview images of the Lithography objects (when these have been
loaded and selected; see Import vector or Import bitmap (page 162)).
Before running a lithography sequence, a box with the size and content of the selected
lithography object is superimposed on the surface map. When selecting the center of the
box with the mouse, the corresponding object can be moved around the scan area to
reposition it. The new object location (X-Pos and Y-Pos) is however only transferred to the
object's properties (as displayed in the Lithography Objects list, and graphically shown on
the Topography chart) when the selection box is double-clicked after repositioning. If it is
not, any changes made are not implemented. Position of an object (and in addition its size)
can also be modified by editing the respective parameters for the selected object inside the
Lithography Object Editor dialog (see Section 15.3.2: Object Editor dialog (page 159)).
When a lithography sequence is started, the selection box will disappear, while a red circle
and a darker red trace line will be drawn on the Lithography object preview to provide a
live progress report on the Lithography drawing process (see Figure 15-3: Lithography
preview (page 168), right). After a lithography sequence has been completed, the red line
and circle will remain visible until a new lithography sequence is started.

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Working with documents

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16.1: Introduction
When working with the Nanosurf SPM Control Software, all finished measurements (a full
image was recorded) will be temporarily stored according to the file name mask you
specified in the Gallery panel (see Section 16.4: Gallery panel). These measurement
documents can be opened and displayed in the document area of the SPM Control
Software’s workspace (see Section 12.1: General concept and layout (page 110) and Section
12.4: Document space (page 113)). It is strongly recommended to permanently store
relevant documents to a new folder (see Save as (page 182) in Section 16.4.3: Gallery
toolbar).

Figure 16-1: Measurement document. Typical measurement window with the Data Info panel
expanded (see Figure 12-4: Example of a measurement document window (page 113) for a window with
a minimized Data Info panel).

Charts and the Data Info panel together display all available measurement information.

16.2: Data Info panel

The Data Info panel (minimized by default, but expanded upon hovering of the mouse
cursor over the Data Info tab on the right side of the measurement document window)
displays measurement settings and the hardware used during the measurement. Its
content is self-explanatory and will therefore not be discussed in this manual.

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Just like the panels of the Info pane, the Data Info panel can be “pinned” and “unpinned”
to disable or enable the Auto-hide function of the panel (see Section 12.5: Panels (page
114)). It cannot be undocked from the document window, however.
The Data Info panel also contains a small toolbar, which allows you to customize the
presentation of the data and offers ways to export it.

16.2.1: Data Info toolbar

Categorized
The “Categorized” button ( ) will group the data entries for the measurement document
by category. This is the default display method of the Data Info panel.
Alphabetical
The “Alphabetical” button ( ) will sort the data entries for the measurement document
alphabetically.
Save
The “Save” button ( ) will save the information in the Data Info panel to file. Possible
formats are text (.TXT) and comma separated values (.CSV) files.
Copy to Clipboard
The “Copy to Clipboard” button ( ) will copy the entries of the Data Info panel to the
Windows clipboard for easy pasting into other applications.

16.3: Charts
Charts provide a graphical display of the measured data. Charts occur in Measurement
document windows, in Operating windows, and in various other windows and dialogs. You
can adjust them to your needs and liking. How to do this is explained in this section. This
information is valid for charts in stored measurement documents as well as for ongoing
measurements in one of the Operating windows (Imaging, Spectroscopy, and Lithography).
A Chart consists of a graphical representation of the measured data itself and elements that
provide additional information. There are three basic chart types: Line graph, color map
and 3D view (see Figure 16-2: Elements of a chart, items 1–3).

Chart titles
The title elements of each chart display the signal name and the background line filtering
type that are used. A click on each of these titles opens a drop-down menu with other
possible signals or filters:

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1 2 3
5 4

6
7

Figure 16-2: Elements of a chart. (1) Line graph. (2) Color map. (3) 3D view. (4) Data Info panel (see
Section 16.2: Data Info panel). (5) Color scale for data Z-range. (6) Data range indicator, with scan head
Z-range as dotted box, data Z-range as solid gray box and current scan line height as red line. (7) Line
selection arrow. (8) “Chart Properties” button.

Changing the titles will change the content of the chart.

Color scales
The Color scale (Figure 16-2: Elements of a chart, item 5) shows which measured signal level
is mapped to which color. The color mapping can be changed using the Color Palette
dialog (see Section Color Palette (page 208)) .

Data range indicator

The Data range indicator (Figure 16-2: Elements of a chart, item 6) shows the Z-range of the
scan head and of the values occupied by the measured data, and the current scan line
height.
Hovering with the mouse cursor over the Color scale or Data range indicator of a color map
chart opens a height histogram graph and two range selectors:

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This histogram displays the current height distribution of the measurement data and the
used color range. With the top and bottom range selectors, the color bar range can be
adjusted to the actual height distribution of the measurement data. Changing these range
settings changes the “Center” and “Span” parameters of the Chart Properties dialog (see
Section 16.3.2: Chart Properties dialog) and immediately updates the color display of the
data in the chart.

Line selection arrow

With the Line selection arrow (Figure 16-2: Elements of a chart, item 7) the shown data line
on line charts displaying the same signal can be changed by holding down the left mouse
button over the arrow and move the mouse up or down.

Chart properties
The “Chart Properties” button ( ; Figure 16-2: Elements of a chart, item 8) opens the Chart
properties dialog. This dialog is the center of all chart parameters and is described in more
detail in section Section 16.3.2: Chart Properties dialog.
Most chart settings can also be accessed from a context menu, which is opened by right-
clicking a chart.

16.3.1: Working with multiple charts

In some windows, multiple charts can be displayed and configured by the user at anytime
(e.g. in the Imaging window or a Document window). The same signal can be displayed in
different styles (e.g Line Graph and Color map) and / or multiple signals can be shown side
by side (e.g. Topography and Phase Signal).
Adding or removing a chart, or setting chart parameters is all performed in the Chart
Properties dialog (see Section 16.3.2: Chart Properties dialog). When opened, the settings
displayed in the Chart Properties dialog refer to the currently selected chart. This (active)

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chart is indicated by a thin blue line around the chart area. A chart is activated by clicking
on it with the mouse cursor anywhere in the chart area.
Arrangement of the charts is performed automatically by the control software based on
the size of the window and based on the order in which the charts were generated/added.
If the window is to small to display all charts, scrollbars are displayed at the border of the
window.
Short cuts to add and remove charts are found in the chart context menu. Select “Create
new chart” or “Delete current chart” from the menu list. It is also possible to use the “Insert”
or “Delete” key of your computer’s keyboard for this task.

16.3.2: Chart Properties dialog

The Charts Properties dialog is used to set all chart properties that influence data display
by the respective chart. It may be kept open at all times if many parameters have to be set
for different charts.
Some parameters are chart type specific. They are therefore displayed at the bottom of the
Chart Properties dialog in a separate group.

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Add chart
The “Add Chart” button ( ) creates a copy of the currently selected or active chart and
adds it to the active window in last position.

Remove chart
The “Remove Chart” button ( ) removes the currently active chart.

Previous chart
The “Previous Chart” button ( ) activates the previous chart and updates the
parameters displayed in the Chart Properties dialog to those of that chart.

Next chart
The “Next Chart” button ( ) activates the next chart and updates the parameters
displayed in the Chart Properties dialog to those of that chart.

Chart parameters

Type
Selects the chart type to be used for display of the measurement data:
– Line graph
Data is displayed as a line plot. Points outside the range of the scanner are displayed in
red. The line being displayed is selected by dragging the Line selection arrow in a Color
map (see Line selection arrow (page 173)). In ongoing measurements (e.g. during
imaging) the position of the Line selection arrow is updated automatically and
corresponds to the last measured scan line (but even here it is possible to select a
different line for view in a line graph by dragging/holding the Line selection arrow in a
different location).
– Color map
Z-height data is encoded using a color scale and displayed 2-dimensionally.

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– 3D view
Data is shown in a 3-dimensional representation in parallel perspective. Color
information (such as implemented in the Color map) is maintained.
Signal
Selects the input channel (signal data) to be used for the chart. The available signals
depend on the operating mode (selected or used) and the status of the User inputs.
Filter
Selects the line filter method. The control software applies this filter to the measured data
before displaying it (see Figure 16-3: Data filter types). No modification of the original
measurement data occurs (selecting another filter is always possible). Available data filters
are:
– Raw data
No data processing.
– Mean fit
Calculates the mean value of each line of data points and subtracts this number from the
raw measurement data for each data point of that line.
– Line fit
Calculates the first order least squares fit (mean value and slope) for each line of data
points and subtracts the fitted values from the raw measurement data for each data
point of that line.
– Derived data
Calculates the difference between two consecutive data points (derivative) and displays
this instead of the raw image data.
– Parabola fit
Calculates the second order least squares fit for each line of data points and subtracts the
fitted values from the raw measurement data for each data point of that line.
– Polynomial fit
Calculates the fourth order least squares fit for each line of data points and subtracts the
fitted values from the raw measurement data for each data point of that line.
Display size
The size of the chart in pixels.
Show Axis
When checked (default), the axis labels, color and range scales, and titles are displayed
alongside the graph. When unchecked, they are hidden.
Keep Aspect ratio
When checked, the axis in the color map are drawn in their correct size-relation (according
to their value and unit). When unchecked (default), the size of the display is always a square
and data pixels are stretched if necessary.

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Figure 16-3: Data filter types. The same measurement data displayed using the available filters. A
defective area on a calibration grid is shown here to illustrate the effect of the filters.

Chart data range

Span
The span that corresponds to the chart’s displayed Z-range. Increasing Span decreases
feature contrast and vice-versa. The current span is displayed next to the color scale in color
maps, or can be inferred from the Z-axis labels in Line graphs and 3D views.
Center
The signal value that corresponds to the center of the “Span” parameter.
Auto set
When checked, the chart’s Z-range is automatically set to optimally match the
measurement data. During measurements, the Span and Center parameters will be
updated continuously (i.e., the chart adapts to the available data).

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Set button
Clicking this button starts the optimization of the Z-range manually. Mostly used when
“Auto set” is off.

Line graph options

Show reverse line

When checked, the reverse scan data is drawn in gray (see Figure 16-4: Show reverse line
option. It allows comparison of the forward and reverse measurements data. Whether or
not this data is available depends on the measurement mode used during the acquisition
of the data (see Measurement mode (page 224).

Figure 16-4: Show reverse line option. (Left) Reverse line disabled. (Right) Reverse line enabled.

18.2 Color map options

Shading
When checked, the color map creates the impression of a 3-dimensional surface which is
lighted from the left. This is achieved by combining the topography with its derivative. The
number of pixels in the edit box defines the amplification of the derivative add on.
Smooth pixel
When checked, the screen edge rendering of individual data pixels is smoothed with their
neighboring pixels. Alternative data pixels are drawn as individual squares. This smoothing
shows the most effect when the display size is larger that the number of measured of data
points (e.g. a 256×256 measurement displayed at 512×512 pixels).

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Figure 16-5: Shading option. (Left) Shading disabled. (Right) Five-pixel shading enabled.

3D View options

Pos X, Pos Y
Defines the center position of the 3D plot inside the chart area.
Rotation
Defines the z-axis rotation of the 3D plot relative to the view point.
Tilt
Defines the off-plane angle of the 3D plot.
Z-Scale
Defines a Z-axis ‘stretch’ factor. Use this e.g. to enlarge surface details.
Zoom
Defines the magnification of the 3D plot.

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Light Rot
Defines the rotation angle of the light source relative to the Z-axis (360°)
Light Tilt
Defines the off-plane angle of the light source. The lowest value (0°) corresponds to
“sunset” lighting, the highest value (90°) corresponds to mid-day lighting at the equator.
Default
The “Default” button resets all 3D parameters to their default values.
Keyboard and Mouse short cuts
Always click and hold the left mouse button on the 3D view chart while moving around the
mouse to change the 3D view. The surface is reduced in feature complexity once the left
mouse button is pressed to speed up redrawing on the screen. The surface will return to full
detail once the mouse button is released.
Press the following additional keys/buttons to determine which chart property is changed:
– Surface rotation
Mouse left/right
– Surface tilt
Mouse up/down.
– Size displayed surface
“Ctrl”- key + mouse up/down
– Surface position
“Shift”-key + mouse up/down/left/right
– Z-scale magnification
Left mouse button + right mouse button + mouse up/down
– Light source direction
“Shift” + ”Ctrl”-key + mouse left/right
– Light source height
“Shift” + ”Ctrl”-key + mouse up/down

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16.4: Gallery panel

The Gallery Panel displays lists of thumbnails representing previous measurements for
quick access to those documents. It contains two pages: the “History” page, with the
temporarily (automatically) stored measurements (for details on how to change the default
History folder and the maximum number of files to be stored see Gallery Settings (page
211)) and the “File Browser” page with measurements from a user-selected directory (e.g.
containing older measurements that were previously moved there). The various elements
of the Gallery panel are described in the next sections.

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16.4.1: History File mask

The temporary (automatic) storage of new measurements uses a File mask to create new
file names each time a new measurement has to be saved. This mask can contain normal
text, but also special variables like index number or date and time stamps. You may enter a
new mask directly into the edit field in the History page, select an old mask from the drop-
down menu, or define a new mask with the help of the Mask Editor dialog (see Section
16.4.4: Mask Editor dialog), which is opened by clicking the “Mask Editor” button next to the
edit box.

16.4.2: Image list

In the Image list the stored measurement are shown. Each measurement is displayed as a
thumbnail image of the measurement, together with some information about the
measurement and measurement document.
The following mouse operations are possible inside the image list:
– Double-click
Opens the respective measurement in the document space.
– Single left mouse click
Selects the respective measurement and removes all other selections.
– “Ctrl” key + left mouse click
Adds individual selections to the current selections.
– “Shift” key + left mouse click
Selects all measurements from the last selection to the new selection.

16.4.3: Gallery toolbar

The Gallery toolbar is present in both the “History” and “File Browser” pages. It performs
similar functions in both pages.
Save as
Selected measurements can be saved to a new location with this button.
If only a single measurement is selected a standard Windows “Save” Dialog is shown. Here
you select the new location and the new file name.
If multiple measurements are selected a “Folder” dialog is shown, which allows you to
select (or create) the folder that all selected files are to be copied to. It is strongly

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recommended to do this for files in temporary storage of the History folder that you want
to keep, because they may be overwritten as soon as the maximum number of files in the
History folder is reached (see Section Gallery Settings (page 211)
Rename
Single or multiple measurements can be renamed by clicking the “Rename” button. It will
open the File Rename dialog (see Section 16.4.5: File Rename dialog), which allows you to
specify a mask for the new file names.
Delete
Single or multiple measurements can be deleted by clicking this button.

16.4.4: Mask Editor dialog

The Mask Editor dialog assists you in the creation of file name masks.

History mask
Filename
A file name mask is the template that is used to generate the file names for documents that
are temporarily stored (automatically) during measurement. A file mask consists of
standard text entered by the user and of variables for software-generated text or numbers
(either specified by the user or added automatically).
Mask variables
Mask variables can be entered as specific words surrounded by square brackets. The
following variables are defined in the SPM Control Software:
– [INDEX]
This variable represents a number that is automatically incremented each time a new
filename is created. The index number is 5 digits in length and filled with zeros for
missing digits. The next index number that will be used is shown in the “Next Index” field.

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– [TIME]
This variable represents the actual time of file name creation. It is formatted with two
digit numbers for the hours, minutes and seconds (HHMMSS). This time format is used
regardless of the Regional Settings of the Windows operating system.
– [DATE]
This variable represents the date of the day the file was created (i.e., the day the
measurement was performed). It contains four digit numbers for the year and two digit
numbers for month and day (YYYYMMDD). This date format is used regardless of the
Regional Settings of the Windows operating system.
To quickly insert a Mask variable at the current cursor position in the mask edit box, click
the corresponding button.
Next Index
This entry field defines the next index number to be used. By default this value is identical
to the highest number present in the History files, increased by one.

IMPORTANT
If no Mask variable is used, an index is automatically added to the text string defined in
the filename mask.

Preview
The filename that will be used for the next measurement document to be saved (as
specified by your entries) is shown here.

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16.4.5: File Rename dialog

The File Rename dialog is used to rename (or move) multiple files using a Rename mask
(see below). The dialog is opened by clicking the “Rename” button in the Gallery panel. To
rename a file or multiple files, the Rename mask can be defined here following the same
principles as for the History mask. A preview of the new filenames is shown in the preview
section.

Rename mask
See History mask (page 183).

Preview
Source Filename
The left column of the Preview section shows the original filename(s).
Target Filename
The right column of the preview section shows what the filename(s) will be after pressing
the “Rename” button.

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Refresh
This button updates the preview list.
Rename
This button renames the selected files.

IMPORTANT
If no unique filename(s) would result from the specified Rename mask, an index is
automatically added to the files. If this still does not result in unique filenames, the text
“Copy of” is added to each filename as often as is required to make it unique.

Cancel
This button closes the dialog without renaming the files.

16.5: Analysis tab

Measurement data can of course not only be displayed in charts, it can be analyzed as well.
The control software has several tools that allow quick numerical evaluation and
modification of chart data in Operating or document windows. These tools are accessible
through the various groups of the Analysis tab.

All of these tools can also be used while a measurement is still being acquired.
To use a quick evaluation tool:
1 Click on the chart that you want to evaluate to activate it.
2 Select the desired tool using one of the following approaches:
• Click on one of the tool buttons in the Analysis tab.
• Select the tool from the Chart’s context menu (right-click on the chart).
3 Define the evaluation. The procedure to define the evaluation is different for each tool.
Details can be found in the tool-specific instructions below.
When a tool has been selected, the Tool panel (see Section 16.6: Tool panel) moves to the
top of the panel stack of the Info pane.

IMPORTANT
Depending on the selected chart type, some tools may be unavailable.

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To stop using a tool:

> Select another tool, select the same tool a second time, or select “Abort” in the Chart’s
context menu.

Tip
For more elaborate evaluations, the optional Nanosurf Analysis or Nanosurf Report
software can be used.

16.5.1: Measure group

Measure Length

Calculates the distance and signal difference between two points. Graphically, a line with
arrowheads on each end represents the selection marker. The line is defined by drawing a
line on the measurement chart. The first point is positioned by moving the mouse cursor
to the desired location and clicking and holding the left mouse button. The second point
is positioned when the mouse button is released. When the mouse is not moved between
clicking and releasing, an line parallel to the X*-axis is drawn.
The direction and length of the selection marker can be adjusted by dragging the end
markers. The line can be moved as a whole by dragging the center marker.
The Tool status section of the Tool panel displays the calculated “Length”, “DeltaZ”, “Width”
and “Height”. This data will also be stored in the “Tool” data category of the Data Info panel

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(see Section 16.2: Data Info panel) for the respective measurement document as long as the
tool is active when the document is stored. For more information on the data in the Tool
status section (see Tool status section (page 199)).
Measure Distance

Calculates the distance between two parallel lines. The parallel lines are defined by drawing
them in the chart. The first point of the first line is defined by the mouse cursor position
where the left mouse button is clicked, the second point by the position where the button
is released. When the mouse is not moved between clicking and releasing, a line parallel to
the X*­axis is drawn. After releasing the mouse button, a second parallel line sticks to the
mouse cursor, that is released by clicking its desired position. The direction of the parallel
lines can be adjusted by dragging their end markers; they can be moved by dragging the
center marker.
The Tool status section of the Tool panel displays the calculated distance. The distance
value only depends on the cursor positions, it does not on depend the displayed data
values. The distance data will also be stored in the “Tool” data category of the Data Info
panel (see Section 16.2: Data Info panel) for the respective measurement document as long
as the tool is active when the document is stored. For more information on the data in the
Tool status section (see Tool status section (page 199)).

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Measure Angle

Calculates the angle between two lines. In Line graph-type displays, this tool can only be
used when the chart displays data that has the unit “meters”.
The two lines are defined by drawing them in the chart. The first point of the first line is
defined by the mouse cursor position where the left mouse button is clicked, the second
point by the position where the button is released. When the mouse is not moved between
clicking and releasing, a line parallel to the X*-axis is drawn. After releasing the mouse
button, the end of the second line sticks to the mouse pointer. The end is released by
clicking its desired position. The angle can be changed by dragging the line end point
markers or the corner mark; it can be moved by dragging the line center markers.
The Tool status section of the Tool panel displays the calculated angle. This data will also be
stored in the “Tool” data category of the Data Info panel (see Section 16.2: Data Info panel)
for the respective measurement document as long as the tool is active when the document
is stored. For more information on the data in the Tool status section (see Tool status section
(page 199)).

16.5.2: Correction group

In contrast to the evaluation tools of the Measure and Roughness groups, the tools of the
Correction group (and also those of the Filter group (see Filter group (page 193)) actually
change measurement data. This is done in a copy of the original measurement document,
though, so you won’t lose any data and will always be able to access the original
measurement data in addition to the corrected or filtered data.

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Correct Background
Removes the effect of an ill-aligned scan plane when the line filter options (see Filter (page
176)) do not give satisfactory results. This may be the case when the scan lines in different
parts of the measurement have a different average height. An example of such a
measurement is shown in Figure 16-6: Correct Background.

Figure 16-6: Correct Background. (Left) Uncorrected image; the end points of the selection marker
have been moved to points that should have the same height. (Right) Corrected image.

To use the tool, select three points that should be on the same height. This is done in the
same way as with the angle tool (see Measure Angle (page 339)). The selected points
become the end points of the selection marker.
After clicking the “Execute” button in the Tool status section of the Tool panel, a copy of the
original measurement document is made and the plane that is defined by the selection
maker is subtracted from the measurement data in the newly created document. To get
useful results, the Data filter option for the corrected image in the new document will be
automatically set to “Raw data”.
Correct scan line levels
Removes the effect of drift when the line filter options (see Filter (page 176)) do not give
satisfactory results. This may occur when the scan lines in different parts of the
measurement have a different average height. An example of such a measurement is
shown in Figure 16-7: Correct scan line levels.
To use the tool, draw a line through points that should have the same height in the same
way as with the Measure Length tool.
After clicking the “Execute” button in the Tool status section of the Tool panel, a copy of the
original measurement document is made and the average level of each scan line in the
newly created document is adjusted so that all points along the drawn line have the same

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Figure 16-7: Correct scan line levels. (Left) Uncorrected image with a selection marker through
points that should be at the same height. (Right) Corrected image

height. To get useful results, the Data filter option for the corrected image in the new
document will be automatically set to “Raw data”.

16.5.3: Roughness group

Calculate Line Roughness

Calculates several roughness parameters from the data at points along a selected line. The
line is selected in the same way as with the Measure length tool (see Measure Length (page
187).

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The Tool status section of the Tool panel displays the calculated “Length” and “DeltaZ” of
the selected area.
The Tool result section displays the roughness values that are calculated from the data
according to the following formulas:

The Roughness Average, Sa The Mean Value, Sm The Root Mean Square, Sq
N-1 N-1 N-1
Sa = 1 | z( x l ) | Sm =
1
z( x l ) Sq =
1
( z( x l )) 2
N l =0 N l =0 N l =0

The Valley depth, Sv The Peak Height, Sp The Peak-Valley Height, Sy

Sv = lowest value Sp = highest value Sy = Sp- Sv

The roughness values depend on the line filter option (see Filter (page 176)) that is applied
to the chart, because they are calculated from the filtered data.
Clicking the “Store” button in the Tool result section stores the roughness values in the
“Roughness” data category of the Data Info panel for the active measurement document.
Calculate Area Roughness
Calculates several roughness parameters from the data points in a selected area.
The area is selected in the same way as with the Cut out Area tool.
The Tool status section of the Tool Results panel displays the calculated Size or Width and
Height of the selected area. For more information on the Tool status section, see The Tool
status section (page 207).
The Tool result section displays the roughness values that are calculated from the data
according to the following formulas:

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The Roughness Average, Sa The Mean Value, Sm The Root Mean Square, Sq
M-1 N-1 M-1 N-1
Sa = 1 1 1 M-1 N-1
| z( x k , y l ) | Sm = z( x k , y l ) Sq = ( z( x k , y l )) 2
MN k = 0 l =0 MN k = 0 l =0 MN k =0 l =0

The Valley depth, Sv The Peak Height, Sp The Peak-Valley Height, Sy

Sv = lowest value Sp = highest value Sy = Sp- Sv

The roughness values depend on the Data filter that is applied to the chart, because they
values are calculated from the filtered data. More information on data filters is provided in
Section 18.2: The Chart bar under Data filter (page 199).
Clicking the “Store” button in the Tool result section stores the roughness values in the
“Roughness” data category of the Data Info panel for the active measurement document.

Tip
The Area Roughness tool can be used to determine the mean height difference between
two plateaus with more accuracy than with the “Measure Distance” tool. To determine
the mean height difference, select an area on each plateau, and calculate the difference
between their Sm-values.

16.5.4: Filter group

Glitch Filter
The Glitch Filter removes the effect of small defects in the image such as single short
glitches in the scan. Compared to the Noise Filter (see below), it has the advantage of not
reducing resolution on step edges. The glitch filter is implemented as a Median filter on a
3×3 pixel matrix.
To apply the filter, activate the color map chart that is to be filtered, then click the “Glitch
Filter” button. A new Measurement document with the filtered data is created.
Noise Filter
The Noise filter removes high frequency noise from the image, but applying the filter will
also decrease the resolution of the image. The Noise Filter is implemented as a convolution
with a 3×3 pixel Gaussian kernel function.

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Figure 16-8: Glitch Filter. (Left) Unfiltered image with some glitches where the tip lost contact with
the sample. (Right) Corrected image.

Figure 16-9: Noise Filter. (Left) Noisy (unfiltered) image of an AFM measurement on HOPG. (Right)
Filtered image

To apply the filter, activate the color map chart that is to be filtered, then click the “Noise
Filter” button in the Tools bar. A new measurement document with the filtered data is
created.

Tip
• Filters are especially useful for improving the appearance of 3D views.
• Applying filters may changes the result of the other tools. This may result in incorrect
results, e.g. when evaluating sample roughness.

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16.5.5: Tools group

Create Cross-Section
Creates a new measurement document containing a line cross-section of a Color map or
Line View display.
The line is defined by drawing a selection arrow. The arrow points toward the forward
direction of the line. The start of the arrow is defined by the mouse cursor position where
the left mouse button is clicked, the end of the arrow by the position where the button is
released. When the mouse is not moved between clicking and releasing, an arrow ending
in the center of the measurement is drawn. The direction of the arrow can be adjusted by
dragging its end markers; it can be moved by dragging the center marker.

Double-clicking the graph, or clicking the “Cut out line”-button in the Tool status section of
the Tool panel creates a new document that contains the line section.
The Tool chart section of the Tool Results panel displays a preview chart of the selected line.
The Tool status section of the Tool Results panel displays the calculated “Length” and
“DeltaZ” of the selected line. For more information on the data in the Tool status section
(see Tool status section (page 199)).
Cut Out Area
Creates a new measurement document containing a subsection of an existing
measurement.

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One corner of the area is defined by the mouse cursor position where the left mouse button
is clicked, the opposite corner by the position where the button is released. When the
mouse is not moved between clicking and releasing, an area is defined that has a size of
33% of the current measurement, and is centered on the clicked location.

Once an area is defined, it can be resized by dragging one of its corners, and moved as a
whole by dragging its center point.
Pressing the “Shift” key while dragging a corner defines a non-square (i.e. rectangular) area.
Double-clicking the graph, or clicking the “Cut out area” button in the Tool Results panel
creates a new measurement document that contains the selected area.
The Tool status section of the Tool Results panel displays the calculated “Size” or “Width”
and “Height” of the selected area. For more information on the data in the Tool status
section (see Tool status section (page 199)).

16.5.6: Report Group

The Nanosurf Report software offers a powerful and extensive set of analysis functions.
Complex analyses can be created interactively, and then displayed and printed in visually
appealing reports. These reports can then be used as templates to consistently apply the
same analysis to other measurements.

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Report
The “Report” button starts the Report software (if installed) from within the SPM Control
Software:
When a measurement is opened by the Report software, it will import all measurement
channels that are displayed in the current measurement document. By default, a Basic
Report is generated. Other Report styles can be chosen from the “Report” button’s drop-
down-menu:

This drop-down menu lists templates stored in a template folder. The Menu Item's name is
equal to the template name without the extension (*.mnt) and is sorted alphabetically. This
standard directory is configured by the Report Template File path (see Reporting (page
210)).

IMPORTANT
After a fresh installation of the Report software, the Report software has to be run at
least one time before you can automatically start it from the SPM Control Software. To
run the Report software for the first time, select it from the Windows “Start” menu.

New Report
An empty report is opened.
Add Measurement
The currently active measurement is added to the currently opened report.
Apply Template
Opens a dialog that allows you to select a template that is applied to the currently active
measurement. If selected, a menu item the template is applied to the current selected
measurement Document.

IMPORTANT
If you do not save the measurement in the control software, but only save the report, the
data in measurement channels that were not displayed is lost.

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IMPORTANT
A measurement document should only display those channels that are used in a
template. When a template is applied to a measurement document that displays
different, or a different number of measurement channels than the template uses, the
results may not be correct.

16.5.7: Scripting group

Please refer to Section 13.4.4: Scripting group (page 132).

16.6: Tool panel

The Tool panel of the Info pane displays varying information, which depends on the tool
currently selected in the Analysis tab.

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Cursor Position section

This section is always visible. It displays the mouse cursor position in the physical units of
the selected chart.

Tool status section

This sections appears when a tool is being used. It displays the evaluation result of the
currently active tool.
The tools that require drawing a selection marker to define the evaluation have some
common parameters that are described here. The other parameters are described in the
sections that describe the respective tool (see above).
Length
The length of the selection marker in the plane of the chart. “Length” is related to the
evaluation results “Width” and “Height” (see below) according to the formula:

2 2
Length = Width + Height
th
ng
Le

Height

Width
In a Color map chart, length is calculated in the XY-Plane. In a Line graph chart, length is
calculated in the XZ-Plane.
“Length” is not displayed when “Width” and “Height” are of different physical units (e.g. in
Amplitude Spectroscopy, where the X-Axis is given in [m] and the Z-Axis in [V]).
Width, Height
The “Width” and “Height” of the measurement tool in the chart, calculated in the chart
plane.

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DeltaZ
The difference between the “Z-Pos” values at both ends of the selection marker.
In a Color map chart, “DeltaZ” is the difference in the (filtered) sample height between the
start and the end point.

IMPORTANT
The calculated values of “Length”, “Width” and “Height” only depend on the cursor
positions, they do not depend on the displayed data values.

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Advanced settings
0
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17.1: About dialog

The About dialog displays information that may be useful for diagnostics when you have
problems with your instrument. The About dialog is opened by clicking the “Information”
button on the upper right corner of the program window, just below the “close window”
button:

The About dialog contains the following information:

• The version number of the control software.
• The serial number of the controller (when the microscope simulation is active, the serial
number “0xx-00-000” is displayed).
• The version number of the firmware that is running on the controller.
• The version number of all modules built into the controller.
• The version number of all installed software options.
• Contact information for getting more support.

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17.2: File menu

The File menu is accessed by clicking the blue File tab at the left side of the Ribbon. It
provides access to mostly software related settings and options, but also to functionality
such as opening, storing and printing of measurements. The latter function can also be
performed using the Quick Access toolbar, in which these commands are present by
default:

Open
Launches a system “File open” dialog for opening Nanosurf “.nid” or “.ezd” (easyScan 1) files.
It is possible to select more than one file at the same time by using the “Shift” and/or “Ctrl”
keys.
Selected files will open in measurement windows, which contains a chart area and a data
info panel. There is no Imaging toolbar like there is for ongoing measurements in the
Imaging window. You can however still customize the charts through a context menu,
which opens through a right-click. The data info Panel displays all significant parameters
were used for the measurement. For more information on Measurement document
functionality, see Chapter 16: Working with documents (page 169).

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Save / Save as...

Save a measurement document in Nanosurf image data format (file extension “.nid”). The
same dialog is opened for both menu items.

Export current chart / document as...

Exports either the active chart or the whole active measurement document for use in other
programs or image-processing software. Available data types for documents are tagged
image file format (.tif ), portable network graphics (.png), Windows bitmap (.bmp), 16 bit
data file (.dat), and plot file (.plt). For Charts, additional available data types are comma
separated z values (.csv), and (X,Y,Z)­points (.csv).
When the data is exported using the function “Export” >> “Current document as...”, every
Chart in the measurement document is stored in the export file consecutively. In the binary
format, the blocks of data from each Chart are stored directly one behind the other. In the
“ASCII” text format the blocks of data for each Chart are separated by two empty lines.
Tagged image file format (.tif), portable network graphics (.png), and Windows
bitmap (.bmp)
All of these image file formats are suitable for inclusion of images in electronic documents,
e.g. in Word, PowerPoint or image-processing software. The exact image as seen on the
computer screen will be saved in the exported file (similar to a screenshot of the respective
chart).
Data file 16Bit (.dat)
A binary data file that can be processed in data processing software. This “binary” data
format only contains the measured data. The data is stored consecutively, line by line
upwards, as 16-bit values (–32768 to +32767). Before being stored, the data is processed
using the settings chosen in the Correction and Filter groups of the Analysis tab (see Section
16.5: Analysis tab (page 186) for details).
Plotfile ASCII (.plt)
This is an “ASCII” text format which contains the measured data as well as a small header
with a description of the scan. A plotfile can be used for detailed data analysis by various
mathematical software packages such as MathLab, or for plotting by software such as
GnuPlot. Before being stored, the data is processed using the settings chosen in the
Correction and Filter groups of the Analysis tab (see Section 16.5: Analysis tab (page 186) for
details).
If “Line graph” is selected as “Display” in the “Chart bar”, only the visualized lines will be
stored. Each data point is stored as a pair of floating point numbers on a separate line. The
number pairs are separated by a blank character (SPACE).
If any other chart type is selected, all measured values are stored. All values in a data line
are stored on a separate line in the text file. An empty line is inserted after every data line.

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The data lines are stored from the bottom to the top. A small header at the beginning of the
first data line contains the names of the channel and frame, as well as X-, Y-, and Z-ranges
with their physical units.
Comma separated z values (.csv)
This format stores all the measured data in a chart, as a matrix of floating point numbers in
ASCII format separated by a “comma” and “SPACE” character. This enables easy data
exchange with commonly used spread sheet and database applications.
(X, Y, Z)-Points (.csv)
This format stores the coordinates of all measured points in a chart as a list of floating point
number pairs. For Line graphs, only X and Z points are exported.

Print / Print preview...

Prints the currently selected measurement document together with the values shown in
the Data Info panel.

Parameters
All measurement parameters are stored in a configuration file with the extension “.par”.
When the SPM Control Software is started, default values are loaded from a file that is
selected in the Controller Configuration Dialog (Section 17.8: Controller Configuration
dialog). Functions for storing and retrieving parameters are accessed via the application
button.
Save
Saves the parameters to the currently selected parameter file. The name of this file is
indicated in the status bar at the bottom of the main window.
Save as...
Saves the parameters under a new file name.
Load
Loads a previously saved parameter file.

Chart Arrangement
The chart arrangement of the Imaging and Spectroscopy windows is stored in a
configuration file with the extension “.chart”. When the SPM Control Software is started, a
default arrangement is loaded from a file that is selected in the Controller Configuration
dialog (Section 17.8: Controller Configuration dialog). Functions for storing and retrieving
the chart arrangement are accessed via the application button.
Save
Saves the chart arrangement to the currently selected chart file. The name of this file is
indicated in the status bar at the bottom of the main window.

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Save as...
Saves the chart arrangement under a new file name.
Load
Loads a previously saved chart file.

Options
The “Options” button opens the Options dialog (see Section 17.2.1: Options dialog), which
configures various general control software settings.

Exit
With exit you can close the SPM Control Software. If you exit the program while still having
unsaved data, you will be asked to save it.

17.2.1: Options dialog

Customize

Allows changes to the content of the Quick Access toolbar (see File menu (page 203)). This
process is very similar to that in the Microsoft Office applications and is therefore not
explained in this manual. You are free to try it out and can always use the “Reset” button to
reload standard settings.

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User Interface

Language
Specifies the SPM Control Software language.
Save workspace on exit
When checked, the workspace settings are automatically saved to the system registry
when the control software is closed (see also Parameters and Chart Arrangement (page
205)).

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Color Palette

The color palette dialog is reached via the menu item “Options” >> “Config Color palette...”.
The color palette is used to map the display range of the measured values to a color. Three
different palette types are available:
– Black&White
The color map is a linear gray scale.
– Color
The color selection uses the HSB-color model where the color (H) is set in ° value. The
color is selected by entering a number or by clicking a color in the color bar.
– Look Up Table
A user definable palette (with max 256 color entries) can be selected. This palette is
stored in a “.lut” file that contains an ASCII table with RGB color values. A different look up
table can be selected by clicking the “Browse...” button.

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Scripting

Allows you to set the search paths for the Acquisition and Analysis scripts that are displayed
in the Scripting group of the Acquisition tab and Analysis tab, respectively.
Scripts can be organized in subdirectories inside each of the “Script” directories, which are
displayed as submenus in the control software. These submenus are displayed before
individual scripts in the Script drop-down menu.

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Reporting

Used to configure the behavior of the “Report” button in the Report group of the Analysis
tab.
Apply the following template
When enabled, automatically applies the template specified in the box below. You can
search for a template using the “Browse” button.
Display templates in the following directory
As with the Stridulating paths (see Scripting (page 209)), the content of the specified
directory is displayed as choices in the Report drop-down menu.

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Gallery Settings

History files
Sets the directory where the temporarily (automatically) stored measurements (which are
listed in the Gallery panel of the Info pane) are stored.
Max History Files
Sets the maximum number of files to keep in the above directory. When the maximum is
reached, the oldest measurement is deleted from disk to allow the latest measurement to
be saved.

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Access Code

Used to enter the access code for software modules, such as the Scripting Interface and the
Lithography Option...”

IMPORTANT
If you receive the warning “To change access codes you need Windows administrator
rights”, please restart the control software with the “Run as Administrator...” option from
the Windows Explorer context menu.

17.3: Settings tab

Provides access to many hardware related settings.

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17.3.1: Scan Head group

Calibration
This button opens the Scan Head Selector dialog to load, save or edit a scan head
calibration file. For more details, see Section 17.4: Scan Head Selector dialog (page 214).
Diagnosis
This button opens the Scan Head Diagnosis dialog where the actual health state of the scan
head can be seen. For more details, see Section 17.7: Scan Head Diagnosis dialog (page 218).

17.3.2: Hardware group

Controller
Opens the Controller Configuration dialog where different hardware related settings can
be defined. It defines communications port, video driver settings, start up parameter and
others. For more details, see Section 17.8: Controller Configuration dialog (page 220).
Signal Access
Opens the SPM Parameter dialog on the Signal Access page (see Section 17.9.7: Signal
Access (page 235)).
Simulation
Check or uncheck the Simulation button to enter or exit the control software’s microscope
simulation mode. Once the simulation mode is active, the status bar of the control software
displays the text “Simulation”. Otherwise, this field displays the text “Online”.
In microscope simulation mode, many functions of the microscope are performed on a
mathematically generated surface. Thus, software functionality and acquisition
procedures can be practised without danger of harming the instrument.

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17.4: Scan Head Selector dialog

The Scan Head Selector dialog is used to load, save or edit scan head calibration files. These
files store all calibration values specific to a certain scan head. The Scan Head selector
dialog is opened via the “Calibration” button in the Scan Head group of the Settings tab.
The configuration of each scan head is stored in a file with a filename that corresponds to
the serial-number of that particular scan head and with the extension “.hed” (e.g. “10-11-
584.hed” for an easyScan 2 AFM scan head). The currently loaded scan head calibration file
is displayed in the status bar.

Tip:
The specific scan head calibration file(s) for each customer is automatically copied and
selected as default during the installation of the control software from the installation
CD. It can be found in the “Calibrations” sub directory of your installation path.

IMPORTANT:
When you change a scan head, you have to load the correct configuration file too. If you
do not, scan ranges and other important calibration settings are incorrect and the scan
head may not operate properly.

Load...
Loads a different scan head calibration file.
Save as...
Saves the current scan head calibration file with a different name.
Edit...
Edit the currently loaded scan head calibration file using the Scan Head Calibration Editor
dialog (see Section 17.5: Scan Head Calibration Editor dialog). Always save a backup copy of
the original scan head calibration files by clicking 'Save As...' first.

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17.5: Scan Head Calibration Editor dialog

Through this dialog, the calibration of all standard Inputs and Outputs can be configured
individually for a particular Scan Head. The configuration of the User Inputs and User
Outputs is located in a different dialog (Section 17.10: User Signal Editor dialog (page 238).

CAUTION!
Changes to these settings should be performed with great care. False settings can lead
to false interpretation of the data and incorrect operation of the controller.

17.5.1: Scan Axis

Maximum scan ranges

X/Y/Z-Axis Range
The calibration values of each of the scanner axes. The calibration values are given as the
maximum motion range of the scanner (Overscan is set to 0% and X/Y Angle set to 90° and
the Axis Orthogonality Rotation of 0° [or a multiply of 90°]).
Set
The “Set” buttons open the Scan Axis Correction dialog (see next section).

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Axis Orthogonality
The X- and Y-Axes of the scanner are generally not perfectly orthogonal, and their
orientation with respect to the AFM housing may vary. The controller corrects these errors
by adding/subtracting some of the X scanner command signal to the Y scanner command
signal and vice versa.
X/Y Angle
The angle between then the X- and Y-axis of the scanner hardware. The control software
uses this value to correct the scan command signals such that the scan axes are orthogonal.
Rotation
The angle between the X-axis of the scanner and the X-axis of the microscope body (see
Figure 10-3: Scanner coordinate system (page 98)). The control software uses this value to
correct the scan command signals in such a way that the scan axis is parallel to the X-axis
of the microscope body.

Tip
With this value, the alignment of the scanner's 0° Rotation and another system’s
coordinate system may be calibrated (e.g. images scanned with the LensAFM or Nanite
AFM and optical images by external video cameras of optical profilometers or Nano-
Indenters).

17.5.2: I/O Signals

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Maximum input signal values

Deflection
The calibration of the cantilever deflection signal. This calibration value is used to convert
the AFM Detector Signal or the STM preamplifier signal (both in Volts) to physical units.

IMPORTANT
This value has been pre-configured by Nanosurf for Static Force Mode operating mode
with CONTR Cantilever and a Laser Spot at 225 μm. If other Cantilevers are used, or if the
laser spot has been adjusted manually in case of a FlexAFM scan head, a recalibration of
this value has to be performed. If not, the Set Point in [N] may be incorrect.

Amplitude (AFM only)

The calibration value of the cantilever vibration amplitude signal.
Phase (AFM only)
The calibration value of the cantilever vibration phase shift signal.
Tip current (AFM only)
The calibration value of the controllers internal Tip current preamplifier sensitivity.

Maximum output signal values

Tip Potential
The calibration value of the Tip voltage setting.
Excitation (AFM only)
The calibration value of the Amplitude of the signal that is used to excite the cantilever in
dynamic force operating modes.

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17.6: Scan Axis Correction dialog

This dialog can be used to correct the scan range by entering a correction factor based on
a measured distance and a known real distance.
This correction factor could for example be determined by evaluating the height
information in a measurement of a calibration grid with known properties.

Scan axis correction

Correction coefficient
The scan range is multiplied with this number when the “Set” button is clicked.

17.7: Scan Head Diagnosis dialog

The Scan Head Diagnosis dialog displays the current status of the scan head. It is opened
by clicking the “Diagnosis” button in Scan Head group of the Settings tab.

Tip
The Scan Head Diagnostics dialog cannot be accessed once the tip has been
approached to the sample. In this case, retract the tip first.

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17.7.1: Dialog for AFM scan heads

Approach stage status

Status about the motorized approach stage is shown here.

Laser Status
Status about the laser / detector system is shown here.
If the Status light on the SPM controller is blinking red, more detailed information about the
failure is displayed here (see also Section 9.3.1: Probe Status light blinks red (page 91)).

17.7.2: Dialog for STM scan head

Information about the preamplifier that is present in the STM scan head is displayed here.
The offset current is a leakage current that is measured by the preamplifier when it is not in
contact with the sample.

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Note
The offset current is not only a measured value, but is also used as a compensating value
during measurement. Therefore, even high values are not problematic for measuring at
low tunnelling current.

17.8: Controller Configuration dialog

With this dialog some controller hardware related settings can be configured. On a
correctly installed system, it should not be necessary to change these settings manually.
The Controller configuration dialog is opened via Controller” button in the Hardware group
of the Settings tab.

Start configuration
The parameter and chart arrangement files that are loaded when the SPM Control Software
starts. Each Windows user has his/her own set of these two files a personal “Local Settings”
directory. Therefore, each windows user can configure the control software to his/her own
personal preferences without any consequences for other users.

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USB Connection
The SPM controller uses a virtual serial port that is connected to the USB port. The number
of this virtual serial port should be the same as the one shown in your the windows device
manager dialog. Activate “Auto detect” to let the control software search for the right COM
port at each program start. This is highly recommended, because Windows assigns
individual COM port numbers to different USB connectors. With auto detect, you will be
able to plug in the USB cable to different ports.

Tip
If the port number is set to “No Controller (Simulation only)” and “Auto Detect” is
switched off, the control software will always start in Simulation mode. This could be
useful if the software will be used mainly for analysis and is installed on a PC without
microscope hardware.

Video Signal
Allows the selection of the video device driver used to handle the video camera of the SPM
controller or scan head. Activate “Auto detect” to let the control software search for the
right device driver. The control software then automatically selects the correct device
driver for different scan heads if available. If a video device is found, the Video Panel will
automatically be present in the Info pane.
Select “No video” in the list if you wish to completely suppress the video display.

Microscope Firmware
Here the currently used firmware version of the controller is shown.
In case of a standard software update (downloaded from the Nanosurf homepage) manual
update of new firmware is normally not necessary since it is performed automatically at the
start of the updated SPM Control Software. Automatic firmware update is always
performed each time a different (older or newer!) software version is started since last time.
Click the “Update” button to install individual firmware updates you received from
Nanosurf support.

17.9: SPM Parameters dialog

This SPM Parameter dialog contains many advanced parameters for measuring. It can stay
open during all operations to provide the advanced user with a permanent and detailed
control over all measurement parameters.
The dialog is organized in several (sub-)pages:
• Imaging

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• Spectroscopy
• Lithography
• Operating Mode
• Approach
• Z-Controller
• Signal Access
These pages are described in more detail in the next sections.

17.9.1: Imaging

Image parameter
Image size
The image size in X*-direction and the image size in Y*-direction. When the Check-box is
active, the image Height is always identical to the Image width.
Measurements
The number of measured data points and data lines in an image. When the Check-box is
active, the number of Lines is always equal to the number of Points / Line.

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Time / Line
The time needed to acquire a data line. The time needed for the entire image is displayed
in the status bar.
Rotation
The angle between the X-direction of the scanner and the X* direction of the measurement
(Figure 15-2: Coordinate systems).

Imaging options
Overscan
The “Overscan” determines how much the effective scan range is increased relative to the
image width. This will eliminate edge effects caused by the reversal of the scanning motion
by not recording or displaying them in the measurement image. Disadvantages of using
Overscan are that the maximum scan range is reduced, the tip moves slightly faster over
the sample with the same “Time/Line” setting, and the tip may hit large features outside the
measured image.
Ref. Z-Plane
The height of the reference plane. This height reference is used when the Z-Controller
output is cleared, and when the Z-position is not modulated relative to the current surface
position during spectroscopy measurements.
The reference plane for the image can be aligned to the surface of the sample using the
slope parameters (see Figure 5-2: Sample and measurement orientation before slope
adjustment (page 58) or Figure 13-2: Coordinate systems (page 124)).
Image offset X/Y
The center position of the measured area.
Slope X
A positive value rotates the image plane around the Y-axis counterclockwise.
Slope Y
A positive value rotates the image plane around the X-axis counterclockwise.
The center position of the measured area can be changed by typing its position as well as
by using the Move tool in the Imaging toolbar. The zero position corresponds to the center
position of the scanner.
Adjust slope
The “Adjust slope” button will cause the control software to set appropriate values for X-
and Y-slope by performing two single line scans (one in X- and one in Y-direction) and
determining the respective slopes via line fitting, thus electronically compensating for
these measurement plane slopes (see Section 5.2: Adjusting the measurement plane (page
57) for details).

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Auto slope
Automatically performs the same action as the “Adjust slope” button does. It adjusts the
slopes with each new “Start” of imaging.

Imaging modes
Scan mode
This parameter defines how the images are acquired and displayed:
– Continuous
The acquisition direction is reversed after each scan: from bottom to top and vice versa.
– Cont.Up
The acquisition direction is always from bottom to top.
– Cont.Down
The acquisition direction is always from top to bottom.
Measurement mode
This parameter defines how each imaging line is acquired and stored:
– Forward
During forward scan only (left to right in the image).
– Backward
During backward scan only (right to left in the image).
– Forw.&Backw.
During both forward and backward scan.

Const. Height mode

When the Constant Height imaging mode is enabled, the Z-Controller is turned off during
the scan (as a consequence, the Probe Status light will blink green). Instead, the scanner
scans along a straight line, that should be parallel to the surface. The slope of the line is
defined by the X- and Y-Slope parameters. These parameters should be set as described in
Section 5.2: Adjusting the measurement plane (page 57). The height of the line is determined
at the start of each scan line: First the Z-Controller is turned on. Once the tip position is
stable, the Z-Controller is turned off and the tip is moved away from the sample by the
distance set by the parameter Rel. Tip-Pos.
The Constant Height Imaging mode is mainly useful for EFM and MFM measurements. For
more information on how to do Magnetic Force Microscopy, refer to technical note
“TN00031 — Operating Nanosurf AFMs in MFM mode” which can be found in the
“Technote” section of the Help panel.

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Rel. Tip-Pos
This parameter defines the distance by which the Tip is moved towards the sample from
the position that corresponds to the Setpoint. A negative setting will move the tip away
from the sample.

Chart automation
Auto. clear old chart data
Automatically clear the chart data from a measurement when a measurement is restarted
(either when a scan is restarted manually, or when a previous scan has finished and
measurement recommences as determined by the scan mode (see Scan mode (page 224).
Auto chart settings
Automatically adjusts the Z-Range of all Charts to encompass the measurement data. The
Z-Range will also be automatically updated during measurements.

17.9.2: Spectroscopy

Modulated parameter
Modulated output
This parameter defines the signal used to drive the spectroscopy (X-Axis). All possible
signals are recorded while this modulation output signal is changing its value from “Start

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value” to “End value” (Y-Axis). The number of available modulated outputs depends on the
scan head and the number of installed controller modules. Possible values are: “Z-Axis”, “Tip
Potential” and the names of the User Outputs.
Start value / End value
The range over which the Modulated output is changed.
The “Spec Forward” data is measured from the Start to the End value, the “Spec backward”
data is measured in the opposite direction. The “Spec forward” data is always measured
before the “Spec backward” data. For spectroscopy as a function of distance (Z-axis
modulation), more negative values are further away from the sample whereas more
positive values go towards (or even into) the sample.
Relative to current value
When checked, the Start and the End values are added to the value the modulated output
had before starting the modulation:
• When the Tip Potential is modulated, the current value is the Tip voltage set in the Z-
Controller panel.
• When the Z-Axis is modulated, the current value is the sample surface height, as
measured using the Z-Controller output. Otherwise, the measurement Z-position is
given by the value of the Ref. Z-Plane in the Imaging Panel.
Modulation time
The time used to change the Modulated output from the Start to the End value.
Sequence Points
The number of Spectroscopy Measurements to be made in the sequence. If Sequence
points is set to one (1), a single point spectroscopy is performed. If Sequence value is two
or more, a line spectroscopy is performed. The spectroscopic measurements positions that
are equally distributed over the line defined by “X/Y-Pos from” and “X/Y-Pos to”.
X-Pos from / Y-Pos from
The XY-coordinates of the measured point in a spectroscopy measurement. Sets the XY-
coordinates of the starting point of the line in a spectroscopy measurement sequence.
X-Pos to / Y-Pos to
The XY-coordinates of the end-point of the line in a spectroscopy measurement sequence.
The from and to coordinates are more conveniently chosen using the point and line tools
in the Spectroscopy toolbar.

Measurement parameter
Data points
The number of data points measured while the Modulation output changes from Start to
End value. The data points are equally distributed over the modulation range.

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Averages
The number of times the modulation is repeated to obtain an averaged spectroscopic
measurement. The measurement results of aborted modulations are discarded during
averaging.
Keep Z-Controller active
When checked, the Z-Controller will continue to change the Z-position to keep the tip–
sample interaction constant. This option is not available when the Modulated output is set
to the Z-Axis. This setting can for example be used to measure tip current as a function of
applied voltage while keeping the tip–sample force constant.

Input range check

In order to prevent tip damage due to too high tip–sample interaction, the settings below
“Input range check” define a safe range of tip–sample interaction. When the interaction
signal (Deflection in static modes, Amplitude in dynamic modes, Current in STM mode)
leaves this safety range, the measurement is aborted. When a spectroscopy measurement
has been aborted, a warning dialog is displayed. The number of aborts that occurred in a
measurement is reported in the Data Info panel (see Section 16.2: Data Info panel (page
170)) as: “ModAborted = <number of aborts>”.
Abort action
Action to be performed when the measurement is aborted. Possible options are:
– No range check
Will never abort the measurement. The tip is not protected against damage due to too
high tip-sample interaction. This is the default setting.
– Abort modulation
Aborts the current modulation and continues with the next until the number of
modulations in “Averages” is reached.
– Abort measurement
Aborts the spectroscopy measurement for the current point and continues with the next
point of the line, if a line spectroscopy is being performed.
– Abort sequence
Aborts the entire spectroscopy measurement sequence (cancels all “Averages” and
points).
Max / Min input value
The Minimum/maximum value that the feedback signal is allowed to have.

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17.9.3: Lithography

Lithography modes
Lithography operating mode
Used to select the operating mode during lithography operation. The following options are
available:
– Static Force
– Dynamic Force
– STM (STM only)
Inactive pen mode
Action to be performed when the tip is moving from one end point to a new start point, in
case the end point and start point are not the same. The following options are available:
– Lift up tip
Only lift the tip (upper position of the Z-actuator of the scan head). No feedback will be
performed by the Z-Controller during travel to the new start point.
– Standard operating mode
Switch the Z-Controller operating mode back to the one selected in the “Operating
Mode Panel” during imaging. All values such as Tip speed, Tip voltage, Setpoint etc. will

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temporarily chance back to the values used for imaging. The Z-Controller will be active
during travel to the new start point.

17.9.4: Operating Mode

Dynamic mode parameter

Free vibration amplitude
The desired reference amplitude of the cantilever vibration. The cantilever vibrates at this
amplitude when it is far away from the sample. The excitation strength is adjusted so that
this vibration amplitude is reached.
Vibration frequency
The frequency at which the cantilever vibrates during the measurement. This frequency
can be set automatically as described at the start of this section. When “Auto set” is
enabled, the Vibration frequency is automatically set. Immediately at activation and each
time an approach is started. When “Auto set” is disabled, the frequency can be set manually,
either by directly changing its value in the control box, or by using the Vibration Frequency
Determination dialog (see Section 17.11: Vibration Frequency Search dialog (page 239)).
Reference Phase
The reference phase for the detected cantilever vibration. Changing the reference phase
changes the offset of the phase signal. The phase reference can be automatically set so that

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the phase signal is zero. When “Auto set” is enabled the phase reference is automatically set
after finishing the approach.

Force Modulation Parameter

Excitation amplitude
The amplitude of the sensor excitation during a force modulation mode measurement.
Excitation frequency
The frequency of the sensor excitation during a force modulation mode measurement.

Tip Parameter
Tip Voltage
This parameter defines the potential to be applied to the tip. The voltage that can be used
lies between -10V and +10V.

Info:
With the STM scan head the sample is automatically connected to the ground of the
instrument. With AFM scan heads the sample has to be electrically connected to the
instrument chassis ground for accurate measurements.

STM Tip cleaning pulse

A short voltage pulse applied to the STM tip to remove material picked up by the tip during
measurements. The voltage pulse is approximately 5 V in height and 100 ms in duration. It
can be used to clean a dirty STM tip (see).

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17.9.5: Approach

Approach parameter
Approach Mode
For STM scan heads no selection is possible (approach is always performed step-by-step
through the stick-slip motion of the STM approach stage).
For AFM scan heads, two approach options are available for AFM:
– Continuous approach
Approach with continuous slow motorized stage movement until surface contact point
is reached. Z-Axis stays at Tip-Position during approach. This is the default approach
method, and was the only method available in the Nanosurf SPM Control Software
before version 3.
– Step-By-Step approach
Approach is performed by moving the motorized stage quickly over a distance that is
less than the scanner’s Z-range. During the movement of the motorized stage, the tip is
fully retracted. When the motorized movement is finished, the scanner extends the tip
along the Z-axis to probe for the sample surface. The approach is considered done when
the Setpoint (defined in the Z-Controller page of the SPM Parameter dialog, or in the Z-
Controller section of the Imaging panel of the Imaging window) has been reached. If it is

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not reached within the Z-range of the scanner, the tip is again fully retracted and the next
motorized step is performed. This process of ‘step-and-probe’ is repeated until the
Setpoint has been reached (and approach is done). This approach method is considered
to be more ‘gentle’ to tip and sample and should be considered for very sharp tips and/
or very soft samples. In general, it does however take more time than Continuous
approach.
Max. Slope
This parameter defines the speed of extending the z-axis. This parameter is only available
in Step-By-Step approach mode. Slower speeds help to preserve sharp tips.
Max. Steps
This parameter defines the maximal duration of an automatic approach:
• In Continuous approach mode it defines the maximum time.
• In Step-By-Step approach mode it defines the maximum number of cycles.
Move Speed
This parameter defines the move speed during automatic approach and withdraw:
• In Continuous Approach mode this value should be small. If the approach is too fast, the
tip or the sample surface can be damaged. On the other hand, the motor will not move
when the move speed is too small.
• In Step-By-Step Approach mode should be around full speed. Lower values help to stop
in the z-range of the scanner. On the other hand the approach time increases.

Approach done options

Auto. Start imaging
When selected, the system automatically starts imaging after a successful approach.
Scanning automatically stops the approach motor is moved.
Auto. Reload parameter
When selected, the control software reloads the default startup parameter file for each
approach.

Tip-Position
This value determines the Z-Position of the scanner when the approach motor stops. When
the Tip-Position is changed when the tip is already approached to the sample, the motor
will move the approach stage so, that the Z-Position of the tip becomes equal to the set Z-
Position. When a high resolution scanner is used, the Tip-Position before approach is set to
approximately +500 nm (advanced) by default. This compensates for the residual motion
of the approach stage that occurs after the approach motor has stopped.

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17.9.6: Z-Controller

Feedback loop parameter

Setpoint
The working point for the Z-Controller. Depending on the operating mode, this is the
tunneling current (STM mode), cantilever deflection (Static Force mode) or relative
cantilever vibration amplitude (Dynamic Force mode). In the later case, the set amplitude
is relative to the operating amplitude, set in the Mode Properties Section. For example,
when a Setpoint of 70% is used, the Z-Controller will move the tip closer to the sample until
the vibration amplitude has decreased to 70% of the vibration amplitude far away from the
sample.
P-Gain
The strength of the Z-Controller reaction that is proportional to the error signal. Increasing
the P-Gain decreases the error signal.
I-Gain
The strength of the Z-Controller reaction that is proportional to the integral of the error
signal. Increasing the I-Gain decreases the error signal over time. It is the least sensitive to
noise, and usually the dominant contributor to the topography measurement.

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D-Gain
The strength of the Z-Controller reaction that is proportional to the derivative of the error
signal. Increasing the D-Gain decreases fast changes in the error signal, but also amplifies
high frequency noise.

Z-Controller options
Z-Feedback Mode
The following modes are available:
– Free Running
The Z-Controller is active.
– Freeze Position
The Z-Controller is not active, the scanner remains in its current Z-position.
– Stop and Clear
The Z-Controller is not active, the scanner is moved to the “Ref. Z Plane”, set in the
Imaging page of the SPM Parameter dialog. The Probe Status Light will blink green as
long as the Z-Controller is deactivated.

CAUTION
The tip may be damaged when the Z-Controller is not active during scanning. This will
happen when Ref. Z Plane is much lower than the current position of the tip, or when
the scan range contains large height differences.

Z-Feedback algorithm
The following algorithms are available:
– Standard PID
A standard PID controller is used for Z-Feedback.
– Adaptive PID
A standard PID controller is used for Z-feedback. In addition, the bandwidth of the
Topography measurement is adapted to the number of measured points per second. The
adaptive PID controller thus reduces noise in the measurement. However, topography
changes that happen faster than the time between two measured points are also lost.
This makes it more difficult to detect vibrations due to instability of the feedback loop.
These vibrations remain visible in the Current, Amplitude, or Deflection signal, however,
so always monitor these signals when optimizing Z-Controller settings, especially when
using the Adaptive PID.
Error Range
The range of the error signal used to control the Z-Position. The error signal is the difference
between the signal used for topography feedback and the current Setpoint. When the
value of “Error Range” is reduced, the resolution of the error signal is increased.

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17.9.7: Signal Access

When the Signal Module A is installed, the Signal Access Page allows several parameters to
be configured.

User Input Parameter

Enable User Input 1 / 2
When checked, the data from the selected User Input(s) is measured and stored during all
acquisition processes (e.g imaging or spectroscopy). See also Section 11.4.2: The Signal
Modules (page 105).
Config
The “Config” button opens the User Signal Editor dialog (see Section 17.10: User Signal Editor
dialog (page 238)) to set the signal's name, range and unit.

User Output Parameter

User Output 1 / 2
Sets the static output value of the selected user output(s).

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Config
The “Config” button opens the User Signal Editor dialog (see Section 17.10: User Signal Editor
dialog (page 238)) to set the signal's name, range and unit.

User Controller
Enable Feedback loop
Activates an auxiliary feedback loop controller. This feedback loop controller uses the User
Input 1 as its signal input and drives the User Output 1 with it control value. It can be used
for custom measurements in all modes; Static as well as Dynamic mode (See “Help panel”
>> “AppNotes” >> “AN00031 — KPFM Operating Mode”).
Setpoint
Defines the Setpoint of the feedback controller. The controller keeps the User Input Signal
1 at this value.
I-Gain
Defines the I-Gain of the feedback controller.
Add output to Tip voltage
When checked, adds the feedback controller's output voltage to the Tip voltage output.
Inverted Feedback
Inverts the direction of the feedback response. Depending on the experiment to be
controlled, the feedback may have to increase or decrease its output value to force the User
Input signal to reach the Set Point.

Tip
If the overall gain of the experimental setup from its input to its output is positive,
feedback has to be non-inverted. If it has a negative gain, feedback has to be inverted.

Signal Module Config

Cantilever Excitation Mode
The following options are available:
– Internal source
Cantilever excitation is controlled by the easyScan 2 controller itself.
– External source
Cantilever excitation is controlled by an external source.
Tip Signal Mode
The following options are available:
– Current measurement input
Sets the tip signal to the input current measurement level.

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 SPM PARAMETERS DIALOG

– Voltage source output

Sets the tip signal to the measured output voltage.
– Direct feed through with “Tip Voltage” Input-BNC
Establishes a direct connection between the “Tip-Voltage” Input-BNC connector and the
cantilever.
These options are summarized in Figure 17-1: Tip Signal Mode schematic.

3 Cable Cantilever
2
1

10kOhm Tip Voltage Output

Tip Voltage Input
10V/100µA
Tip Voltage -
-1 -
(from Controller) +
-
+ AFM: Current
Switch settings: +
1: Current measurement input (to Controller)
2: Voltage source output
3: Direct feedthrough with “Tip Voltage” Input - BNC

Figure 17-1: Tip Signal Mode schematic. Describes the electronics behind the three Tip Signal
modes.

Sync output mode for Imaging / Spectroscopy

Allows configuration of the “Sync” output that can be used to synchronize external
equipment with the SPM controller. Different options can be used for the Imaging and
Spectroscopy modes.

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17.10: User Signal Editor dialog

The User Signal Editor dialog is used for editing the calibration of the User Input/Output
signals. The settings made in this dialog are stored in the active Scan Head calibration file.
Name
The name of the user signal. The entered name is used throughout the control software.
Unit
The base unit of the physical signal, without prefix (i.e. ‘m’, not ‘nm’ or ‘μm’).
Calibration
The physical signal values that correspond to the maximum and minimum signal voltages
should be entered here. Prefixes can be used.

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 VIBRATION FREQUENCY SEARCH DIALOG

17.11: Vibration Frequency Search dialog

17.11.1: General concept

The Vibration Frequency Search dialog provides all functionality to view, search and
change the vibration frequency used by the dynamic measurement modes. It is opened by
clicking the “Freq. Sweep” button in the Preparation group of the Acquisition tab. When
opened, the previous frequency sweep is shown. If no previous sweep was performed, the
charts are empty.
To find the cantilevers best operation frequency the control software measures a so called
Bode-Plot. This Bode-plot displays the cantilevers amplitude and phase response versus
excitation frequency. Based on this Bode-plot, the SPM Control Software is able to

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automatically detect the cantilever resonance peak and adjust the operating frequency
accordingly. In some cases (mostly in Liquid environment) it is necessary for the user to
adjust the operating frequency manually (based on the Bode-plot result), because the
automatic algorithm is not able to find the right frequency peak.
For recording the Bode-plot, the SPM Control Software tunes the cantilever excitation from
a start frequency slowly up to a higher frequency. During this tuning (or sweeping) the
cantilevers amplitude and phase response is measured and saved. The result is plotted in
an Amplitude and a Phase versus Frequency chart. The Excitation amplitude is held
constant during the sweep. Therefore, any change in detector amplitude and phase signal
is a result of cantilever response.
Resonance frequencies vary greatly between cantilevers, depending on the cantilever’s
respective physical properties. Cantilever manufacturers provide information on the
resonance frequency range of each cantilever type. The SPM Control Software therefore
has a built-in database of commonly used cantilevers. Other cantilever can be manually
added by the user (see Section 17.13: Cantilever Browser dialog (page 245)). Based on this
database information, the control software selects the frequency sweep range.
After a coarse and a fine sweep, the optimal operating frequency is chosen close to the
resonance frequency of the cantilever.

IMPORTANT
The Phase measurement and chart plot is performed only if a Mode Extension Module
is installed in the SPM controller. The Phase is always measured, independent on the
selected Operating Mode.

17.11.2: Automated vibration frequency search

Tools
Auto frequency set
A click to this button starts an automated vibration frequency peak search and
optimization procedure. This procedure consists of four phases:
1. First a coarse frequency sweep based on the database information of the currently
selected cantilever is performed. The frequency range of this sweep is shown in the
coarse sweep section.
2. Based on the best frequency peak found in this coarse sweep a narrow band fine
sweep is done. The frequency peak and sweep range used for the fine sweep is shown
in the fine sweep section.
3. Based on the amplitude reduction settings (accessed by choosing “Config...” from the
“Auto frequency set” buttons drop-down menu) the optimal vibration frequency is

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selected and the excitation amplitude tuned to get the desired free vibration
amplitude at this frequency.
4. After the amplitude tuning, a final fine sweep is performed with the new excitation
amplitude.
At the end of the procedure, the new operating frequency is shown by the marker (both
graphically and in numbers). Additionally, the “excitation amplitude” parameter shows the
amplitude required to obtain the desired free vibration amplitude.
The user may now just leave the dialog and accept the new frequency using the “OK”
button, reset to previous values with the “Cancel” button, do manual adjustment with the
marker, or change amplitude settings and/or customize frequency sweep ranges through
use of the edit boxes and action buttons.
Capture
Stores a copy of the current Bode-plot in the History page of the Gallery panel. The data is
stored as a new measurement and remains open in the Document space of the SPM
Control Software.
Config...
Selected from the “Auto frequency set” button’s drop-down menu, this menu option opens
the Auto frequency config dialog (see Section 17.11.4: Auto Frequency Config dialog (page
243)).

17.11.3: Manual sweep controls

Marker
The marker represents the currently selected frequency. It is shown as a dotted vertical line
in the amplitude and phase chart. The corresponding “Vibration frequency” and “Free
vibration amplitude” values (see below) are shown as automatically updating numbers in
the Vibration frequency and Free vibration amplitude edit boxes as well.
To move the marker by mouse, click and hold the line's handle (small black box in the center
of the line) and move it around. The vibration frequency is updated immediately during the
movement. At release of the marker the amplitude is measured and drawn as a horizontal
line in the amplitude chart and its value is displayed in the Free vibration amplitude edit
box.
To use the currently shown frequency as the new vibration frequency, leave the dialog with
the “OK” button.
Vibration frequency
This parameter shows the frequency at the marker's position. It is used as the actual
vibration frequency during operation of the microscope in the Dynamic operating modes.

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The value of this frequency can be changed manually by typing in the desired value, by
using the arrow keys beside the parameter field, or by dragging the frequency marker line
in the charts as described above.
Free vibration amplitude
This parameter shows the actual amplitude at the current marker frequency. If the user
enters a new value, the excitation amplitude is adjusted to obtain a free cantilever
amplitude with this new value. A new frequency sweep is immediately performed and its
results displayed. If the desired amplitude could not be set, an error dialog is shown.
Zoom
A click on this button starts a new frequency sweep with a smaller frequency range than
currently displayed in the charts. The center of the sweep is at the markers position. The
new sweep range and center position is shown in the Fine sweep parameter section.

Coarse sweep
Start / End Frequency
These parameters defines the sweep range of a coarse frequency sweep. This range is
normally set large enough to search for the initial resonance peak. “Auto frequency set”
sets these parameters to the range found in the Cantilever database for the currently
selected cantilever.
Step Frequency
This parameter defines the frequency steps used during the sweep. Therefore, the number
of data points of the sweep is defined as:

Datapoint = (End – Start) / Step.

Typical step sizes during a coarse sweep are 100 Hz or more.
Coarse s weep
The “Coarse sweep” button performs a coarse frequency sweep according to the coarse
sweep parameters entered (see above).

Fine sweep section

Center / Span Frequency
These parameters defines the sweep range of a fine frequency sweep. The range is
normally smaller than the coarse sweep range. “Auto frequency set” sets the center
frequency to the resonance peak found during the coarse sweep. The span is set according
to the quality factor found in the Cantilever database for the currently selected cantilever.
Span defines the start and end frequencies for the fine sweep as follows:

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 VIBRATION FREQUENCY SEARCH DIALOG

Start = Center – (Span / 2)

End = Center + (Span / 2)
Step Frequency
This parameter defines the frequency steps used during the sweep. Therefore, the number
of data points of the sweep is defined as:

Datapoints = (End – Start) / Step.

Typical steps are 10 Hz or less.
Fine sweep
The “Fine sweep” button starts a fine frequency sweep according to the fine sweep
parameters entered (see above).

Sweep parameter section

Excitation amplitude
This parameter defines the used excitation amplitude during the sweep. If the user enters
a new value a new frequency sweep is immediately performed and its results displayed.
The “Auto frequency set” sets this value to a predefined value according to the scan head
calibration file settings and the currently selected environment parameter.

17.11.4: Auto Frequency Config dialog

Auto frequency parameters

Amplitude reduction
This parameter defines the final position of the automated operating frequency search.
Normally, the operating frequency is not at the resonance peak but somewhere beside it.
“Auto frequency set” adjusts the free vibration frequency in such a way that the cantilever
vibration amplitude is smaller than the vibration amplitude at the resonance frequency as
defined by this parameter:

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AmplitudeVibr. freq. = AmplitudeRes. freq. * (1 - Amplitude reduction/100)

Use upper side band

When checked, the vibration frequency is set to a frequency higher than the resonance
frequency. When unchecked, the vibration frequency is set to a frequency lower than the
resonance frequency.

17.12: Laser Alignment dialog

The Scan Head Laser Alignment dialog displays the current position of the AFM laser spot
on the detector and the used laser power. It is only available when a Nanosurf FlexAFM scan
head is attached. The dialog is opened by clicking the “Laser align” button in the
Preparation group of the Acquisition tab.
Laser working point
This graph shows the efficiency of the laser detection system. A small white diamond-
shaped marker should be found anywhere within the green area, meaning that a sufficient
amount of the laser signal is being reflected by the cantilever and correctly makes it back
to the photodiode detector.

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If the marker resides in the red area to the right, it will turn red too, signaling that too little
laser light is being detected. This can be caused by a misaligned cantilever, or by something
blocking the optical path of the laser.
If the marker resides in the red area to the left, too much light is being detected by the
photodiode detector, usually caused by strong environmental light. This condition is very
rare, however.
Laser position
This graphical area shows where the deflected laser beam hits the photodiode detector. A
green spot anywhere within the area enclosed by the dotted square means that the
cantilever deflection detection system (consisting of laser, cantilever, and detector) is
properly aligned. If the laser spot falls outside this area, it will become red, meaning that
the alignment does not allow proper measurements to take place. Usually this is caused by
a misaligned cantilever, which can be easily corrected. The position of the laser spot is also
given as a percentage of the maximum deflection the detector can identify.

17.13: Cantilever Browser dialog

The Cantilever Browser dialog displays the list of stored cantilever types in the database of
the SPM Control Software. In this database, many cantilevers of different manufactures are
saved with their typical physical properties. The Cantilever Browser dialog is opened via the
drop-down menu entry “Cantilever browser” of the “cantilever” button in the Preparation
group of the Acquisition tab.

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New...
Opens the Cantilever Editor dialog for a new cantilever type. You can create new cantilever
types that are not defined in the default configuration. See section x.1 The Cantilever Editor
Edit...
Opens the “Cantilever Editor” dialog to modify the currently selected cantilever type. See
section x.1 The Cantilever Editor
Delete
Deletes the currently selected cantilever type.
Default
Sets all known cantilevers types back to their default factory settings. It also restores
deleted known cantilevers. After a software update, new known cantilevers are added. User
defined cantilevers are always kept as defined.

Attention:
Please note that scan heads with cantilever holders based on the Alignment Chip
technology can only be used with cantilevers possessing the following properties:
• The sensor chip must have grooves that fit onto the alignment chip.
• The cantilever should have a nominal length of 225 μm or more, and a top width of 40
μm or more (please distinguish between mean width specified by most
manufacturers and the actual top width of trapezoid-shaped cantilevers).
• The back of the cantilever must have a coating that reflects infrared light. Uncoated
cantilevers transmit much of the infrared light of the cantilever deflection detection
system.

Deflection signal unit

For all Static Force operating modes, it is possible to select different signal units to be used
for deflection as displayed in charts and as used for the Setpoint. Three choices are
available for each:
– Use meters based on head calibration
The deflection of the cantilever is displayed in meters. This is the default setting for Chart.
– Use Newtons based on mounted cantilever's spring constant
The deflection of the cantilever is displayed in Newtons in all charts. This is particularly
useful for recording Force-Distance curves with the Spectroscopy Window. This is the
default settings for SetPoint.
– Use meters based on head calibration
The deflection of the cantilever is displayed in Volt.

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 CANTILEVER BROWSER DIALOG

Chart
Sets the deflection signal unit as displayed in the Chart area.
Setpoint
Sets the deflection signal unit to be used for entering the PID controller’s Setpoint.

17.13.1: Cantilever Editor dialog

The Cantilever Editor dialog allows and editing of existing cantilever types and the creation
of new cantilever types that are not defined in the default configuration.

Cantilever
Name
Name of the cantilever type. This name appears in the Cantilever type drop-down menu in
the Preparation group of the Acquisition tab. The list is sorted by the manufacturer's name.
Manufacturer
Name of the cantilever manufacturer.

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Properties
Spring constant
This parameter defines the nominal spring constant of the cantilever type. This value is
used to calculate the correct force used for Z-Controller Setpoint and chart signals in all
operating modes that use the Static Force for Z-control.

IMPORTANT
The deflection calibration value of the current scan head calibration file is used to
calculate the force:
Force [N] = Spring Constant [N/m] * Deflection [m]
Cantilever length
The nominal length of this cantilever type (for information only, currently not used by the
control software).
Cantilever width
The mean width of this cantilever type (for information only, currently not used by the
control software).
Resonance frequency air / Resonance frequency liquid
The nominal resonance frequency of the cantilever type in air or in liquid measurement
environment. This frequency is used for calculation of the automatic coarse frequency
sweep search range (see Section 17.11: Vibration Frequency Search dialog (page 239)).
Q-factor air / Q-factor liquid
The apparent quality factor of the cantilever in air or in liquid measurement environment.
The higher the number, the sharper the peak. By default, this number is 500 in air and 5 in
liquid. The quality factor is used for calculation of the automatic fine frequency sweep
search range (see Section 17.11: Vibration Frequency Search dialog (page 239)).

17.14: ATS Stage and TSC 3000 driver configuration

The configuration of the ATS Stage and TSC 3000 Controller is accessed through the TSC
3000 driver software. It is only required for AFM systems equipped with such stages and
controllers (usually Nanite).

Starting the TSC 3000 driver

Usually, the TSC 3000 driver start together with the easyScan 2 control software and will be
running in the background. If this is the case, the tray icon will be visible in the
Windows Notification Area (bottom right part of the Windows desktop, also known as
System Tray).

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When the driver is not running:

1 Open the Microsoft Windows “Start” menu.
2 Select the menu item “Programs” >> “Nanosurf Translation Stage” >> “Nanosurf TSC
3000 Driver”.
The name of the menu “Programs” may vary, depending on the language of your
Windows operating system.

Checking the stage configuration

To check the stage configuration:
1 Move the mouse over the icon and wait for the configuration filename to pop up.
2 Check that the name of the stage configuration file displayed in the Window title
matches the automated stage that is connected.

CAUTION
Using an incorrect stage configuration will cause the stage to behave incorrectly. This
may cause damage to the system. Only change settings when instructed to do so by
Nanosurf support personnel.

The driver menu

To change the TSC 3000 driver configuration and to access further driver functionality, the
driver menu has to be opened. To do this:
> Right-click the icon in the Windows Notification Area.

From the opened TSC 3000 driver menu, the following options are
available:
Load configuration...
Allows a predefined or custom-saved configuration (“.stage” file) to be loaded into the
driver software.
Once you have changed the configuration, you must search for the reference position of
the stage (see Stage Position section (page 133) in Section 13.5: Stage panel).

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Save configuration as...

Allows the current configuration to be saved (“.stage” file).
Save configuration as...
Allows the current configuration to be edited via the Stage Configuration dialog (see
below). As with the “Load configuration option”, you must search for the reference position
of the stage (see Stage Position section (page 133) in Section 13.5: Stage panel) whenever
changes to the stage configuration have been made.
Set COM Port...
Opens the COM Port Configuration dialog (see Section 17.14.2: The COM Port Configuration
dialog), which allows the appropriate COM port for the TSC 3000 Controller to be set.
About
Shows the TSC 3000 driver version information in a separate dialog.
Exit
Closes the TSC 3000 driver software.

17.14.1: Stage Configuration dialog

The Stage configuration dialog reflects various properties of the ATS stage. This dialog
should only be used for trouble-shooting.

CAUTION
Using an incorrect stage configuration will cause the stage to behave incorrectly. This
may cause damage to the system. Only change the settings when instructed to do so by
Nanosurf support personnel.

Axis calibration
The axis calibration determines the relationship between the number of steps that the
motor that drives a certain axis has made and the physical position coordinates of that axis.
The motor controller converts the Stepcount to the position according to the formula:

Stepcount from Limit position × Fullstep size [µm]

Position [ µm ] =
Ministeps / Fullstep

Enable
Allows individual axis (X, Y, Z, or phi) to be enabled or disabled. Depending on the type of
translation stage used and on the axes selected, the rotation axis “phi” may become
available.

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 ATS STAGE AND TSC 3000 DRIVER CONFIGURATION

Figure 17-2: The Stage configuration dialog

Fullstep size
The amount of distance that the stage travels when the stepper motor makes one step.
Max Movement
The maximum distance that the stage moves.
Ministeps/Fullstep
The number of steps in which a full stepper motor step can be sub-divided by the
controller.
Ref Switch Pos.
“At the end” must be checked when the limit switch is located at the end of the translation
stage’s movement range (i.e., the position most distant to the motor). When checked, the
controller will move the stage towards the end of the range until it finds the position of the
reference switch of the stage.
Position value
“Inverted” must be checked when the axis coordinate should decrease (rather than
increase) when the stage moves towards the end.

Speed Settings
Maximal move speed:
In (Ministep)counts/second. If the Maximal move speed is set too high, the stepper motor
in the stage may fail to finish a step before the TSC 3000 controller commands it to make
the next one. As a consequence the stage will not be in the correct position after moving.

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Reference move speed:

In (Ministep)counts/second.

17.14.2: The COM Port Configuration dialog

The TSC 3000 COM Port Configuration dialog sets the Serial Interface/COM port that the
TSC 3000 Controller is connected to. The dialog is opened via the TSC 3000 Driver menu
option “Set COM Port” (see Section 17.14: ATS Stage and TSC 3000 driver configuration (page
248)).

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Quick reference
 Quick reference
Dialogs Ribbon tabs/groups
About ............................................................... 202 Acquisition .....................................................128
Auto Frequency Config ............................. 243 Approach ...............................................130
Cantilever Browser ...................................... 245 Imaging ..................................................131
Cantilever Editor .......................................... 247 Lithography ..........................................160
Chart Properties ........................................... 174 Preparation ...........................................129
COM Port Configuration ........................... 252 Scripting .................................................132
Controller Configuration .......................... 220 Analysis ............................................................186
Digital Video Properties ............................ 140 Correction ..............................................189
File Rename ................................................... 185 Filter .........................................................193
Laser Alignment ........................................... 244 Measure ..................................................187
Layer Editor .................................................... 157 Report .....................................................196
Mask Editor .................................................... 183 Roughness .............................................191
Move Stage To .............................................. 134 Tools ........................................................195
Object Editor ................................................. 159 File .....................................................................203
Options ............................................................ 206 Chart arrangement ............................205
Pixel Graphic Import ................................... 165 Exit ...........................................................206
Scan Axis Correction ................................... 218 Export chart/document ....................204
Scan Head Calibration ............................... 215 Open ........................................................203
Scan Head Diagnosis .................................. 218 Options ...................................................206
Scan Head Selector ..................................... 214 Parameters ............................................205
SPM Parameters ........................................... 221 Print/Print preview .............................205
Stage Configuration ................................... 250 Save/Save as .........................................204
User Signal Editor ........................................ 238 Settings ...........................................................212
Vector Graphic Import ............................... 163 Hardware ...............................................213
Vibration Frequency Search .................... 239 Scan Head ..............................................213
View ..................................................................118
Operating windows
Panels ......................................................118
Imaging ........................................................... 121
Window ..................................................119
Lithography ................................................... 151
Workspace .............................................118
Spectroscopy ................................................ 145
Toolbars
Panels
Analog Video Camera ................................136
Data Info ......................................................... 170
Data Info ..........................................................171
Gallery .............................................................. 181
Digital Video Camera ..................................137
Imaging ........................................................... 123
Gallery ..............................................................182
Lithography ................................................... 154
Imaging ...........................................................127
Online .............................................................. 142
Lithography ...................................................161
Spectroscopy ................................................ 148
Quick Access ..................................................203
Stage ................................................................ 133
Spectroscopy .................................................149
Video ................................................................ 135

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