lTRF+IEC 61215-23A2 Part 1 of 2-Solar Panel
lTRF+IEC 61215-23A2 Part 1 of 2-Solar Panel
0
TRF Template 2017-05-17
Responsible Testing Laboratory (as applicable), testing procedure and testing location(s):
TÜV SÜD Branch: TÜV SÜD Certification and Testing (China) Co., Ltd.
Shanghai Branch
Testing location/address.............................: No. 151 Heng Tong Road, Shanghai 200070, P. R. China
Associated Testing Laboratory: China Telecommunication Technology Labs.
Testing location/address.............................: CuiHu Cloud Center, No.1 Gaolizhang Road, Wenquan
Town, Haidian District, Beijing, China.
Tested by (name + signature) .....................: Yang Xu
Testing procedure:
SMT/CTF Stage 3 or 4:
Testing location/address.............................:
Tested by (name + signature) .....................:
Witnessed by (name + signature) ...............:
Approved by (name + signature) ................:
Summary of testing:
The product fulfils the requirements of EN 61215-1: 2016, EN 61215-1-1: 2016 & EN 61215-2:
2017
(Note: The marking plate represents all models covered by this report except for difference in electrical ratings
and model designation. See “General product information” for electrical ratings for all models. As there will be
other lower wattages to be covered under same report which follows same back label format.)
GENERAL REMARKS:
"(See Enclosure #)" refers to additional information appended to the report.
"(See appended table)" refers to a table appended to the report.
This TRF has been created in cooperation with CTL ETF-9 and German National Committee (DKE).
The originator’s responsibility of this TRF in IECEE CB Scheme has been assigned to TÜV SÜD
Product Service GmbH.
Throughout this report a comma / point is used as the decimal separator.
Manufacturer’s Declaration per sub-clause 4.2.5 of IECEE 02:
The application for obtaining a TÜV SÜD Test Yes
Certificate includes more than one factory location Not applicable
and a declaration from the Manufacturer stating that
the sample(s) submitted for evaluation is (are)
representative of the products from each factory has
been provided .......................................................... :
When differences exist; they shall be identified in the General product information section.
a. LONGi Solar Technology (Taizhou) Co., Ltd. (Production facility
Name and address of factory (factories)................... : No: 99605)
No.268 Xingtai South Road Hailing District 225300 Taizhou
Jaingsu People’s republic of China
MQT 01
Visual inspection
MQT 19.1
Initial Stabilization
MQT 06.1
Performance at STC
MQT 03
Insulation test
MQT 15
Wet leakage current
M10; M11; M13 M4; M5 M8; M9 M6; M7
M12
A B C1 C2 D1 D2 E1 E2
MQT 06.2 MQT 05 MQT 10 MQT 11 MQT 13
Performance Measurement of UV precondition Thermal cycling test Damp heat test
at NMOT NMOT test 200 cycles 1 000 h
MQT 08 Outdoor 15 kWh/m2 –40 °C to 85 °C 85 °C / 85 % RH
Exposure Test
60 kWh/m2 1 module 1 module
7. PASS CRITERIA P
7.2 Power output and electric circuitry P
7.2.1 Verification of rated label values (Gate No. 1) P
Manufacturer’s tolerances and Laboratory uncertainties P
t1 t2 t3
manufacturer’s rated lower/upper 3 3 3
production tolerance in %
m1 m2 m3 —
measurement uncertainty in % of
2.6 0.6 2.4
laboratory
Laboratory reproducibility r ................. : 0.23
After stabilization, each individual module meets the requirements P
Pmax .......................................................................... : See Table 03 P
Voc ............................................................................ : See Table 03 P
Isc: ............................................................................. : See Table 03 P
4. TESTING OVERVIEW P
Initial examination All modules P
4.1 Visual inspection (MQT 01)) .............................. : See Table 01 P
Sequence 1 Module P
B
4.5 Measurement of nominal module operating N/A
temperature (NMOT, °C) (MQT 05) ................... :
4.8 Outdoor exposure test (MQT 08) ......................... : See Table 10 N/A
4.18.1 Bypass diode thermal test (MQT 18.1) N/A
Maximum allowed junction temperature............... : —
Calculated junction temperature .......................... : —
Final measurements............................................ : See Table 11 N/A
4.18.2 Bypass diode functionality test (MQT 18.2) ......... : See Table 12 N/A
4.19.6 Final stabilization (MQT 19.2) .............................. : See Table 12.1 – 12.3 N/A
4.9 Hot spot endurance test (MQT 09) ...................... : See Table 13.1 - 13.5 P
Sequence 2 Modules P
D
4.11 Thermal cycling test 200 cycles (MQT 11) ........... : See Table 18.1 - 18.2 P
TABLE 03: MQT 06.1 ini: Performance at STC after initial stabilization(frontside) P
Test Date [YYYY-MM-DD] ..................... : 2022-05-26 —
Pmax(lab) lower limit (W) ...................... : See table below: Pmax [W] – Min calc. —
lower limit (W) ...................... : 557.185 —
Voc(lab) upper limit (V) ......................... : See table below: Voc [V] Max. calc. —
Isc (lab) upper limit (A) .......................... : See table below: Isc [A] Max. calc. —
Test method ......................................... : Simulator Natural sunlight —
Isc [A] Voc [V] Pmax [W]
Resu
Sample # Meas. Max. Meas. Max. Imp [A] Vmp [V] Meas. Min. FF [%]
lt
calc. calc. calc.
557.185
3-1# 13.551 52.210 13.507 42.239 570.537 80.64 P
13.878 53.201
3-2# 13.640 52.254 53.201 13.302 43.099 573.284 557.185 80.43 P
13.878
3-3# 13.692 52.257 53.201 13.536 42.370 573.515 557.185 80.15 P
13.878
1# 13.690 52.232 53.201 13.343 42.975 573.408 557.185 80.19 P
13.878
Average — 572.686 557.185 — P
Supplementary information: The limit values are calculated considering manufacturer’s tolerances t of rated
nameplate values and laboratory measurement uncertainties m.
TABLE 13.6: MQT 15 - Wet leakage current test after hot-spot endurance test P
Test Date [YYYY-MM-DD] .................................. : 2022-08-11 —
Test Voltage applied [V] ..................................... : 1500 —
TABLE 13.7: MQT 18.2 - Bypass diode functionality test after Hot-spot endurance test P
Test Date [YYYY-MM-DD] ............................ : 2022-08-11 —
Method A —
Ambient temperature [°C] ........................... : —
Current flow applied [A] ............................... : —
Sample # VFM VFMrated VFM = (N × VFMrated) ± 10 % Result
1# Yes No
Supplementary information:
Method B P
IV curve after shading Result
Diode 1 Turn on P
Diode 2 Turn on P
Diode 3 Turn on P
Supplementary information: N/A
TABLE 14.2: MQT 15 - Wet leakage current test after UV preconditioning test N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ....................................... : —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
N/A
N/A
Supplementary information: N/A
TABLE 14.3: MQT 02 – Max. power determination after UV preconditioning test - Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Module temperature [°C] .............................. : —
Irradiance [W/m2] ......................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
—
—
Supplementary information: N/A
TABLE 14.4: MQT 03 - Insulation test after UV preconditioning test - Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Size of module [m²] ...................................... —
Required Resistance [MΩ] ............................ : —
Sample # Measured Dielectric breakdown Result
[MΩ] Yes (description) No
N/A
N/A
Supplementary information: N/A
TABLE 15.1: MQT 01 - Visual inspection after thermal cycling 50 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
N/A
N/A
Supplementary information: N/A
TABLE 15.2: MQT 15 - Wet leakage current test after thermal cycling 50 test N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C] …………………….: —
Size of module [m²] ........................................ —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
N/A
N/A
Supplementary information: N/A
TABLE 15.3: MQT 03 – Max. power determination after thermal cycling 50 test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
2
Irradiance [W/m ) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]
—
—
Supplementary information: N/A
TABLE 15.4: MQT 03 - Insulation test after thermal cycling 50 test - Optional N/A
Test Date [YYYY-MM-DD] ...........................: ——
Test Voltage applied [V] ..............................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample # Measured Dielectric breakdown Result
[MΩ] Yes (description) No
N/A
N/A
Supplementary information: Size of module [m²]:1.95.
TABLE 16.2: MQT 15 - Wet leakage current test after humidity freeze 10 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Solution temperature [°C]…………………….: —
Size of module [m²] ...................................... : —
TABLE 16.3: MQT 02 - Maximum power determination after humidity freeze 10 test - N/A
Optional
Test Date [YYYY-MM-DD] ............................ : —
Module temperature [°C] .............................. : —
Irradiance [W/m2) ......................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]
—
—
Supplementary information: N/A
TABLE 16.4: MQT 03 Insulation test after humidity freeze 10 test) -Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Size of module [m²] ...................................... : —
Required Resistance [MΩ] ............................ : —
Sample # Measured Required Dielectric breakdown Result
MΩ MΩ Yes (description) No
P
P
Supplementary information: N/A
TABLE 17.1: MQT 14.1 Retention of junction box on mounting surface N/A
Sample # —
Supplementary information: N/A
TABLE 17.2: MQT 01 - Visual inspection after retention of junction box on mounting
N/A
surface
Test Date [YYYY-MM-DD] ............................... : —
Sample # Nature and position of initial findings – comments or attach photos —
N/A
Supplementary information: N/A
TABLE 17.3: MQT 15 - Wet leakage current test after retention of junction box on
N/A
mounting surface
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ........................................ —
Required Resistance [MΩ] ............................. : —
Sample # Measured [MΩ] Limit [MΩ] Result
N/A
Supplementary information: N/A
Supplementary information:
TABLE 17.5: MQT 01 - Visual inspection after retention of test of cord anchorage N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
N/A
Supplementary information:
TABLE 17.6: MQT 15 - Wet leakage current test after retention of test of cord anchorage N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ........................................ —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
N/A
Supplementary information: N/A
TABLE 17.7: MQT 03 - Insulation test after test of cord anchorage N/A
Test Date [YYYY-MM-DD] ..................... : —
Test Voltage applied [V] ........................ : —
Size of module [m²] ............................... : —
Required Resistance [MΩ] ..................... : —
Sample # Measured Required Dielectric breakdown Result
MΩ MΩ Yes (description) No
3-2# No P
3-3# No P
Supplementary information: N/A
TABLE 18.1: MQT 01 - Visual inspection after thermal cycling 200 test P
Test Date [YYYY-MM-DD] ......................... : 2022-07-12 —
Sample # Nature and position of initial findings – comments or attach photos —
3-2# No major defects P
3-3# No major defects P
Supplementary information: N/A
TABLE 18.2: MQT 15 - Wet leakage current test after thermal cycling 200 test P
Test Date [YYYY-MM-DD] ................................. : 2022-07-12 —
Test Voltage applied [V] .................................... : 1500 —
Solution temperature [°C].................................. : 22.4 —
Size of module [m²] ........................................... : 2.58 —
Required Resistance [MΩ] ................................. : 15.50 —
Sample # Measured [MΩ] Limit [MΩ] Result
3-2# 4379 15.50 P
TABLE 19.1: MQT 01 - Visual inspection after damp heat 1000 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
N/A
N/A
Supplementary information: N/A
TABLE 19.2: MQT 15 - Wet leakage current test after damp heat 1000 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Solution temperature [°C]............................. : —
Size of module [m²] ...................................... : —
Required Resistance [MΩ] ............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result
N/A
N/A
Supplementary information: Solution resistivity 2739 [Ω∙cm].
Sample # Voc [V] Vmp [V] Isc [A] Imp [A] Pmax [W] FF [%]
—
—
Supplementary information: Size of module 1.95[m²]. The maximum resistance measurement range is
5000 MΩ.
1# P
52.248 42.397 13.625 13.508 572.681 80.45 572.089 0.10%
Supplementary information: Pmax [W] (Lab_GateNo.1) is calculated by considering the reproducibility r of
control module. r=0.23.
Supplementary information:
Step 3: Stabilization determination
Result
Stable power Pmax1 after alternative stabilization (W)
Stable power Pmax2 after light exposure (W)
Power change Pmax2 to Pmax1 (%)
Allowed power change Pmax2 to Pmax1 (%)
Is alternative stabilization method valid? (Yes/No)
Supplementary information:
Initial — — — — 592.973 — —
1 5 >800 40-60 Yes 592.366 — —
2 5 >800 40-60 Yes 591.620 0.13 Yes
Sample # GDP2202 Test Date (YYYY-MM-DD) start/end ......... : 2022-06-09/2022-06-10
73-15
Integrated Module Pmax (W) at
Test cycle Irradiance Resistive Pmax – Pmin) / Stable
irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — 559.735 — —
1 5 >800 40-60 Yes 558.822 — —
2 5 >800 40-60 Yes 558.544 0.05 Yes
Sample # GDP2202 Test Date (YYYY-MM-DD) start/end .........: 2022-06-09/2022-06-10
73-16
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — 558.755 — —
1 5 >800 40-60 Yes 557.911 — —
2 5 >800 40-60 Yes 557.267 0.12 Yes
Supplementary information: N/A
Other stabilization procedures
Sample # Test Date (YYYY-MM-DD) start/end ............ :
Low 1
Low 2
High 1
High 2
Test method description:
Supplementary information:
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.
A completed list of used test equipment shall be provided in the Test Reports when a Manufacturer Testing
Laboratory according to CTF stage 1 or CTF stage 2 procedure has been used.
Note: This page may be removed when CTF stage 1 or CTF stage 2 are not used. See also clause 4.8 in OD
2020 for more details.
Testing / measuring
Measurement / Last Calibration Calibration
Clause equipment / material used, Range used
testing date due date
(Equipment ID)