9 Best Practices for Optimizing

Your Signal Generator – Part 2

Making Better Measurements
In consumer wireless, military communications, or radar, you face
an ongoing bandwidth crunch in a spectrum that is filled with
interference. Testing your devices via signal simulation is critical.
Signal generators provide precise, highly stable test signals for a
variety of components and system test applications.

Knowing the capabilities and performance of your signal generators

is the first step to make accurate and consistent measurements. In
this two-part Application Note, we discuss the best practices to
optimize your signal generator.

Part 1:
1. Increase Amplitude Accuracy
2. Optimize Wide Bandwidth Signal Performance

Part 2:
3. Optimize Switching Speed
4. Optimize Signal Generator’s Phase Noise Profile

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 3. Optimize Switching Speed
As wireless devices increasingly integrate different functions, more tests and setups are required to
accommodate diverse conditions. A wireless device includes multiple wireless standards, frequency
bands, and antennas. This significantly increases test challenges in verification and production testing.
Test engineers are always looking for ways to improve test throughput and reduce cost.

Speed is all-important in manufacturing. The longer you test, the more it will cost you. Therefore, signal
generator speed matters in manufacturing. So, what is speed in a signal generator? Speed is defined as
how fast you can switch from one frequency/amplitude to another, or how fast you can switch from one
waveform to another.

Whenever the signal generator is set to a new frequency, the frequency synthesizer will change its output
to the desired frequency. The output amplifier will then adjust the power level so that the output power
stays the same at the new frequency. Essentially, frequency switching requires changes to both the
frequency synthesizer and output amplifier, which is why frequency switching is often slower than
amplitude switching. While switching, command processing takes up the most time.

For digital waveforms, the I/Q waveform data must also be computed and downloaded into the playback
memory. The sample rate and digital-to-analog converter (DAC) values must be computed and stored
with the file for accurate playback.

Figure 3.1: A typical vector signal generator block diagram

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BEST PRACTICE 5: Use Sweep Mode - STEP and LIST
There are various ways to control the signal generator’s output in automatic test systems. It is
straightforward to send commands to a signal generator for setting frequency, amplitude, and waveform.
This is useful when the frequency, amplitude, and waveform states are not initially known. Due to
command sending, parsing, and processing, there is an overhead time when using SCPI commands
before the switching can begin.

If the frequency, amplitude, and waveform combination is known in advance, then using STEP or LIST
sweep, which can switch multiple parameters simultaneously, is significantly faster.

Step sweep
Step sweep offers a linear or logarithmic progression from one selected frequency and
Dwell Time: The
amplitude setting to the next, pausing at linearly or logarithmically spaced points (steps)
time that the
along the sweep base.
signal is settled,
List sweep and you can make
a measurement
List sweep enables you to enter frequencies and amplitudes at unequal intervals, in
before the sweep
nonlinear ascending, descending, or random order. In addition to amplitude and
moves to the next
frequency, you can also switch baseband I/Q waveform at the same time. You need to
point.
provide frequency, amplitude level, waveform, and dwell time at each point. For fastest
switching speeds, use list sweep.

Figure 3.2: MXG N5182B list sweep configuration table.

Before you enable the sweep, you need to configure the sweep trigger or point trigger. The trigger setup
could be free run, trigger key (the front panel button), bus (trigger on a remote command), external trigger
or internal sync signal.

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BEST PRACTICE 6: Digital Baseband Tuning Technique
For most wireless device production test, the speed of the test process is often limited by the device itself.
Test response time of the device is typically measured in milliseconds. Traditional analog frequency and
amplitude tuning speed are sufficient to support device-level production tests. The ultimate speed
challenge occurs at the RF component level of the wireless food chain. For example, RF power
amplifiers, transceivers, front-end modules (FEM), system in package (SiP), and system on chip (SOC)
require fast test speed in the production line.

Digital baseband tuning techniques offer the ability to digitally shift both the frequency and amplitude
levels of the signal within the VSG’s available modulation bandwidth without the need to retune the
synthesizer. The baseband tuning is enabled by a proprietary application-specific integrated circuit
(ASIC), as shown in Figure 3.3. The ASIC includes three signal processing functions:

1. Real-time multiplier for amplitude offset.

2. Real-time numerical controller oscillator for the frequency offset.
3. Real-time channel correction to flatten amplitude and phase response.

Figure 3.3: Signal processing block diagram for digital baseband tuning

As new VSGs offer wider modulation bandwidths, the digital baseband allows wider frequency shifts. The
maximum frequency shift is dependent on the modulation bandwidth of the VSG. For example, the RF
bandwidth of Keysight PXI VSG M9381A is 160 MHz. The waveform can be shifted arbitrarily within the
160 MHz bandwidth. The amplitude shift is within about 20 dB. The frequency shift speed can be down to
10 µs. The same speed also applies to any level change within a 20-dB range.

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Although the signal bandwidth is smaller than the maximum bandwidth of the VSG, a real-time channel
correction is required when the tuning ranges extend to 160 MHz. The real-time channel correction can
flatten the amplitude and phase response across the entire tuning band as shown in Figure 3.4.

Figure 3.4: Baseband tuning across 160 MHz bandwidth and 20-dB amplitude range

Digital baseband tuning introduces a new VSG architecture that is dramatically faster than traditional RF
tuning techniques. Table 3.1 shows the measurement speed comparison between RF and baseband
tuning.

Keysight PXI VSG RF Tuning Baseband Tuning

Descriptions Changes to the RF Carrier Changes to the frequency offset and
Frequency and Output Amplitude Offset in the signal processing
Attenuation using the “RF” ASIC using the “Modulation” interface of the
interface of the IVI driver IVI Driver
• Frequency Range: Modulation BW of
the VSG
• Amplitude Range 0 to -20 dB
Programmed • CW: 500 µSec to 1.4 x2~x14 Speed improved compare with RF
Command mSec tuning
Tuning Speeds • Frequency and Amplitude: 250 µSec
• Modulation: 3.4 mSec to
3.5 mSec • Amplitude Only: 250 µSec
List Mode Tuning Frequency and Amplitude (ALC x12~x22 Speed improved compare with RF
Speed Off/On): 220 µSec tuning
• Frequency and Amplitude (ALC Off):
10 µSec

Table 3.1: Measurement speed comparison between RF tuning and baseband tuning

Production test engineers must take linearity into account. Figure 3.5 shows the output power linearity.
The baseband tuning (green line) offers a very small degradation in linearity because all the adjustments
are done digitally. The RF tuning has fewer errors on average but is jagged due to the ALC circuit.

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Figure 3.5: Output power linearity error within ±0.05 dB range with baseband tuning

4. Optimize Signal Generator’s Phase Noise

The phase noise performance of a signal generator is a key factor in obtaining accurate measurements. It
can be a limiting factor for many applications, such as radar testing, ADC testing, and OFDM
communication systems. These applications require signal generators with ultra-low phase noise at
different frequency offsets. You need to understand where you care most first. Even with some
improvements in phase noise, it makes big difference in measurement results.

Signal generators provide several ways to optimize phase noise for your applications. Let’s start with the
signal generator’s phase noise profile and why the profile impacts your measurements. Then you will
learn how to optimize a signal generator’s phase noise profile for your applications.

Signal Generators’ Architecture and Phase Noise

Most signal generators’ architecture includes reference oscillator, synthesizer, voltage-controlled or
yttrium iron garnet (YIG) oscillator, and output amplifier. Each component has different effects on the
phase noise characteristics, as shown in Figure 4.1. For offsets below 1 kHz, the noise is dominated by
the performance of the reference oscillator, which is multiplied up to the carrier frequency. From offsets
1 kHz to roughly 100 kHz, synthesizer influences most. The VCO or YIG oscillator is from 100 kHz to
2 MHz, and the output amplifier is at offsets above 2 MHz.

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Figure 4.1: Contributions to the phase noise performance

When the Phase Noise Matters

Phase noise performance is often the key factor in the selection of a signal generator for demanding
applications, such as radar systems and orthogonal frequency-division multiplexing modulation schemes.

Orthogonal Frequency-Division Multiplexing (OFDM)

OFDM is a popular modulation scheme for wideband digital communications. OFDM uses many closely
spaced orthogonal sub-carrier signals to transmit data in parallel. When frequency conversion occurs with
a poor phase noise local oscillator (LO), the sub-carrier with phase noise spreads into other sub-carriers
as an interference. The phase noise degrades the modulation quality of the OFDM signal. Table 4.1 is
sub-carrier spacing of modern wireless standards with OFDM modulation scheme.

Sub-carrier spacing
IEEE 802.11ac 312.5 kHz
IEEE 802.11ax 78.125 kHz
LTE/LTE-A 7.5, 15 kHz
5G new radio (NR) 15, 30, 60, 120, 240, 480 kHz

Table 4.1: Sub-carrier spacing of OFDM signals

In the table above, the sub-carrier spacings appear in a signal generator’s synthesizer or oscillator
session. In order to get a modulation quality performance, you need to reduce the carrier’s phase noise
specific frequency offset as low as possible.

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Doppler RADAR
In radar systems, good phase noise is critical for stable local oscillators (STALOs) and coherent
oscillators (COHOs) because these signals are at the heart of the radar. For example, a radar receiver
cannot identify the moving object if the downconverted signal of interest is masked by the phase noise as
shown in Figure 4.2 below.

Figure 4.2: Poor LO phase noise affects receiver sensitivity

The Doppler shift is proportional to the radar frequency multiplied by the radial velocity, divided by the
propagation velocity. The frequency shift could be from hundreds of Hz to hundreds of kHz. The range is
across reference and synthesizer session of a signal generator as shown in figure 4.1.

BEST PRACTICE 7: Adjust Reference Oscillator Bandwidth - Close to Carrier

Phase Noise
The PSG with
At frequency offsets below approximately 1 kHz, the stability and phase noise are Option UNR/UNX/
determined by the internal or external frequency reference. It is straightforward to have a UNY can be
stable and extremely low phase noise reference oscillator that improves the carrier’s adjusted in fixed
phase noise in the offset frequency range below 1 kHz. Keysight PSG signal generator steps for either an
provides an option to improve close-in phase noise. The reference oscillator bandwidth internal or
(sometimes referred to as loop bandwidth) in the signal generator, is adjustable in fixed external 10 MHz
steps for either an internal or external 10 MHz frequency reference. You can optimize the frequency
phase noise performance of the signal generator for your applications.

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Figure 4.3: Reference oscillator’s PLL bandwidth adjustments

BEST PRACTICE 8: Phase-Lock Loop Bandwidth - Synthesizer Session

In the synthesizer session, you can set the phase-lock loop bandwidth to optimize
This capability is
phase noise above or below 150 kHz on Keysight PSG signal generators, as shown in
supported on all
Figure 4.4. The light blue curve is optimized for < 150 kHz frequency offset and the
PSG models with
yellow curve is optimized for > 150 kHz. Evaluate your application to choose the
Option UNY.
appropriate phase noise setting for wider offset frequencies.

Figure 4.4: Optimize pedestal phase noise at synthesizer session

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BEST PRACTICE 9: Real-Time Phase Noise Impairments
Optimizing phase noise performance is not always necessary or even desirable. Some
applications and tests require a specific amount of phase noise for accurate signal
substitution or tolerance testing of phase noise. This feature is
available only in
Keysight RF signal generator N5182B/N5172B allows users to adjust phase noise
Keysight X-Series
impairment on the synthesizer section. This feature lets you degrade the phase noise
vector signal
performance of the signal generator by controlling two frequency points and amplitude
generators.
values, as shown in Figure 4.5. This customized phase noise is produced by internal
algorithms of the signal generator, operating on a real-time baseband ASIC and
processor accelerator. This allows you to simulate a more realistic signal and is
helpful in evaluating and troubleshooting your device under test.

Figure 4.5: Phase noise impairment setting and measurement

Phase noise is an important performance characteristic of a signal generator and obtaining accurate
measurements. It is a trade-off for cost, switching speed optimization for far-out or close-in offsets. Some
signal generators offer two or more levels of phase noise performance and allow optimization for wide or
narrow offsets. On the other hand, you may inject a certain amount of phase noise to simulate a more
realistic signal to characterize your device’s performance.

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Conclusion
Signal generators provide precise, highly stable test signals for a variety of component and
system test applications. Different applications require different performance requirements.
Keysight’s signal generators offer flexibility and diverse capabilities to optimize performance and
measurement speed. The best solutions will come from your experience, insight, and creativity,
combined with signal generators and measurement software that enable you to generate the
signals required to effectively test your DUT.

For more best practices on making better measurements, visit the RF Test blog. For more
information about Keysight signal generators, visit www.keysight.com/find/sg.

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For more information on Keysight Technologies’ products, applications or services,
please contact your local Keysight office. The complete list is available at:
www.keysight.com/find/contactus

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This information is subject to change without notice. © Keysight Technologies, 2018, Published in USA, October 19, 2018, 5992-3422EN