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MIL-DTL-26482J
w/AMENDMENT 1
24 January 2023
SUPERSEDING
MIL-DTL-26482J
05 February 2021
DETAIL SPECIFICATION
1. SCOPE
1.1 Scope. This specification covers the general requirements for two series of environment
resisting, quick disconnect, miniature, circular electrical connectors (and accessories). Each series
includes hermetic receptacles. The two series of connectors are intermateable when using power
contacts and are not intermateable when using shielded contacts. When intermated, the minimum
performance requirement for series 1 type connectors will be met.
1.1.1 Part or Identifying Number (PIN). The following are examples of PINs:
MS3114 E 12 A 10 A P Y T
Comments, suggestions, or questions on this document should be addressed to DLA Land and
Maritime-VAI, P.O. Box 3990, Columbus OH 43218-3990 or emailed to [email protected].
Since contact information can change, you may want to verify the currency of this address information
using the ASSIST Online database at https://assist.dla.mil.
AMSC N/A FSC 5935
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
MS3470 L 12 A 10 A P Y
1.1.2 Series description. The connectors are identified as series 1 or series 2 and are designed to
provide contact protection during mating.
a. Series 1 – Connector, bayonet coupling, solder or front release crimp removable contacts
(125ºC). Series 1, hermetic are also available. Alternative conductive finishes, including W,
T and K, are available (See 3.3.9.4) (See 6.1 for intended use.).
b. Series 2 – Connector, bayonet coupling, rear release crimp removable contacts (classes A
and L (200ºC) and classes H, N, T, W K, V, and AA (175°C)). Series 2, hermetic connectors
are available with nonremovable solder type contacts or crimp removable terminations (see
6.2).
1.2 Classification.
1.2.1 Class. The class and series of connectors are identified as shown in table I.
1.2.2 Shell size. Shell sizes are as specified on the applicable MS standard.
1.2.3 Termination type and shell material (hermetic receptacles only). The type of termination and
shell material are designated as follows:
Type A – Solder cup termination – stainless steel shell (series 1 and 2).
Type B – Eyelet termination – stainless steel shell (series 1 and 2).
Type C – Solder cup termination – ferrous alloy shell (series 1 and 2), in accordance with
ASTM A108.
Type D – Crimp termination – ferrous alloy shell (series 2), in accordance with ASTM A108.
Type Y – Eyelet termination – ferrous alloy shell (series 1), in accordance with ASTM A108.
1.2.4 Insert arrangement. The insert arrangements showing quantity, size, service rating, and
positional location of contacts are as specified in MIL-STD-1669.
a. The following contact designators are for use with connectors that utilize standardized
contact arrangements as specified in MIL-STD-1669:
C – Feedthrough contacts.
P – Pin contacts.
S – Socket contacts.
The C, P, and S designators are used to indicate that connectors will be used with full
compliments of the applicable standard contacts in accordance with MIL-STD-1669. These
designators are part of the connector PIN and are marked on the connectors (see 1.1.1).
Standard crimp removable contacts are required to be qualified to SAE- AS39029.
Connectors that accommodate crimp removable contacts (P and S) may be ordered without
standard contacts by adding an appropriate note on the purchase order. However, the
connector PIN and the marking requirements remain unchanged (see 6.3).
b. The following contact designators are for use with connectors utilizing non-standard
contact complements (i.e., contacts complements which are other than those specified in
MIL-STD-1669):
A - Less pin contacts.
B - Less socket contacts.
When A or B designators are used, standard contacts should not be supplied with the
connectors. The contacts that will be used with the connectors should be ordered separately
(see 3.7.1 and 6.3). The A and B designators are part of the connector PIN and should be
marked on the connectors.
A and B contact designators should be specified when connectors are intended for use with
contact complements that are not in accordance with the insert arrangements specified in
MIL-STD-1669. As an example, the standard connector insert arrangement may require
standard power contacts, but the user intends to populate the connector insert with types of
contacts (such as thermocouple contacts or coaxial contacts) or fiber optic termini that are
not specified in MIL-STD-1669 for that insert arrangement.
NOTE: If inserts are populated with contacts other than the standard complements of
contacts specified in MIL-STD-1669 for that insert arrangement, the connectors may not
meet the requirements stated herein.
1.2.6 Insert position. The insert position is the angular position of the insert relative to the master key
or keyway of the shell. Insert positions other than normal are indicated by letter designators in
accordance with the alternate insert positions specified in MIL-STD-1669.
1.2.7 Military PIN. The military PIN for qualified connectors in accordance with MIL-DTL-26482, and
which are provided in accordance with this specification, should conform to the latest issue in effect of
MIL-DTL-26482 and 1.1.1 herein.
1.3 Temperature.
1.3.1 Temperature (series 1). Series 1 connectors are rated for specified operation within a
temperature range of -55ºC (-67ºF) to 125ºC (257ºF). The upper temperature is the maximum internal hot
spot temperature resulting from any combination of electrical load and ambient temperature.
1.3.1.1 Insulation resistance (series 1). Insulation resistance varies with temperature as follows
(see figure 1):
Hot spot temperature Minimum insulation resistance
25ºC (77ºF) 5,000 megohms
105ºC (221ºF) 12 megohms
125ºC (257ºF) 3 megohms
1.3.1.2 Service life (series 1). Service life varies with temperature as follows (see figure 2):
1.3.2 Temperature (series 2). Series 2 connectors are capable of specified operation within a
temperature range of -55ºC (-67ºF) to 200ºC (392ºF) under any combination of electrical load and ambient
temperature. These connectors are rated for specified operation for 1,000 hours, at 200ºC (392ºF)
maximum internal hot spot temperature.
1.3.2.1 Insulation resistance (series 2). Insulation resistance limits vary with temperature as follows
(see figure 3):
Hot spot temperature Minimum insulation resistance
25ºC (77ºF) 5,000 megohms
200ºC (392ºF) 500 megohms
1.3.2.2 Service life (series 2). Service life varies with temperature as follows (see figure 4):
Hot spot temperature Service life
25ºC (77ºF) continuous
200ºC (392ºF) 1,000 hours
1.4 Wire range accommodations. The wire range given in table II is to be accommodated by series 1
and series 2 connectors as indicated.
1/ Dimensions are in inches. Metric equivalents are given for information only.
2/ Wire reference: SAE-AS22759.
3/ Minimum outside diameter (OD) for solder contact connectors is .060 inch (1.52 mm).
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification.
This section does not include documents cited in other sections of this specification or recommended for
addition information or as examples. While every effort has been made to ensure the completeness of
this list, document users are cautioned that they must meet all specified requirements documents cited in
sections 3 and 4 of this specification, whether or not they are listed.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and
handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the
issues of these documents are those cited in the solicitation or contract (see 6.2).
2.3 Non-Government publications. The following documents form a part of this specification to the
extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract (see 6.2).
ASME INTERNATIONAL
ASTM INTERNATIONAL
J-STD-006 - Electronic Grade Solder Alloys and Fluxed and Non-Fluxed Solid Solders
for Electronic Soldering Applications, Requirements for.
ISO/IEC 17025 - General requirements for the competence of testing and calibration
laboratories
SAE INTERNATIONAL
2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict
between the text of this document and the references cited herein (except for related specification
sheets), the text of this document takes precedence. Nothing in this document, however, supersedes
applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Specification sheet. The individual item requirements shall be as specified herein and in
accordance with the applicable specification sheet. In the event of any conflict between the requirements
of this specification and the specification sheet, the latter shall govern.
3.2 Qualification. The connectors and accessories furnished under this specification shall be products
that are authorized by the qualifying activity for listing on the applicable qualified products list before
contract award (see 4.3 and 6.5).
Upon application for qualification testing, the qualifying activity shall verify that the manufacturer has
established written procedures to assure actual connector performance to the requirements of this
specification. Emphasis shall be on the molded plastic retention system piece parts prior to assembly into
the connector. These procedures shall include:
a. Analysis of minimum/maximum dimensions of contacts and molded plastic retention discs.
b. Acceptable levels for:
(1) Plastic mixtures and chemical tests.
(2) Pureness of materials.
(3) Flash control in plastic parts.
(4) Method for flash removal.
c. Contact retention tests on molded plastic retention disc based on analysis of (a).
d. Insertion and removal forces for pin and socket contacts in plastic disc.
When approved by the qualifying activity, these shall become the minimum requirements for molded
plastic contact retention systems prior to assembly into connectors for that manufacturer.
3.2.1 Quality.
3.2.1.1 Statistical process control (SPC). The contractor shall implement and use SPC techniques in
the manufacturing process for parts covered by this specification. The SPC program shall be developed
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and maintained in accordance with SAE-EIA-557. The SPC program shall be documented and
maintained as part of the overall reliability assurance program as specified in MIL-STD-790.
3.3 Materials. Materials which are not specified (see 3.1), or which are not specifically described
herein shall be of the lightest practical weight and shall be suitable for the purpose intended.
3.3.1 Fungus resistance. Materials used in the construction of these connectors shall be fungus inert
(see 4.2).
3.3.2 Dissimilar metals. When dissimilar metals are used in intimate contact with each other,
protection against galvanic corrosion shall be provided. The use of dissimilar metals in contact, which
tend toward active galvanic corrosion (particularly brass, copper, or steel used in contact with aluminum
or aluminum alloy) is not acceptable. However, metal plating of dissimilar base metals to provide similar
or suitable abutting surfaces is permitted. The use of dissimilar metals separated by a suitable insulating
material is also permitted. Dissimilar metals and compatible couples are defined in accordance with
MIL-STD-889.
3.3.3 Nonmagnetic materials (except classes H and N). The relative permeability of the connector
assembly shall be less than 2.0µ when measured with an indicator in accordance with
ASTM A342/A342M.
3.3.4.1 Series I (except class H). Nonremovable contacts shall be made of suitably conductive
materials. Hoods shall be made of passivated stainless steel. Springs shall be suitably protected or
made from noncorrosive materials.
3.3.4.2 Classes H and N. Contacts shall be made of ferrous alloy or as specified. The materials used
shall be compatible with the requirements of this specification.
3.3.5 Contact finish. When tested as specified in 4.6.53, contact finish shall meet the requirements as
specified herein.
3.3.5.1 Series 1 solder contact finish (except class H). Nonremovable contacts shall have a finish as
specified in 3.3.5.1.1 or 3.3.5.1.2. Each desired finish shall be qualified.
3.3.5.1.1 Overall finish. Contact body shall be gold plated in accordance with MIL-DTL-45204 type II,
grade C, class 1, .00005 inches (50 microinches) (0.00127 mm) minimum, over a suitable underplate,
except silver shall not be used. Accessory members of the socket contacts need not be plated, but shall
comply with the requirements for dissimilar metals specified in 3.3.2.
3.3.5.1.2 Localized finish. Contact body shall be gold plated in accordance with MIL-DTL-45204 type
II, grade C, class 1 applied to areas X and Y (see figure 7), as applicable. All other body surfaces shall
be finished with gold in accordance with MIL-DTL-45204, any type and grade (no thickness specified).
The entire surface of the contact body shall be nickel underplated in accordance with SAE-AMS-QQ-N-
290, class 2, .00003 to .000150 inches (30 to 150 microinches) (0.000762 to 0.00381 mm) minimum.
Gold discoloration in areas other than areas X and Y is acceptable.
3.3.5.2.1 Types A and B, and type C (series 2). Nonremovable contacts shall be gold plated in
accordance with MIL-DTL-45204, .000050 inches (50 microinches) (0.00127 mm) minimum, over a
suitable underplate, except silver shall not be used. Wire marks on the back of the contact around the
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“nonfunctional” outside diameter (OD) of the wire well caused by electrical contact for plating are
permissible.
3.3.5.2.2 Types C and Y (series 1). Contact plating for class H, types C and Y, shall be gold plated to
a minimum of .000050 inches (50 microinches) (0.00127 mm) in accordance with MIL-DTL-45204, over a
suitable underplate, except silver shall not be used. Wire marks caused by electrical contact during
plating around the “nonfunctional” outside diameter of the nonmating end of the contact are permissible.
3.3.6 RFI finger spring. RFI finger springs shall be made of a spring temper copper alloy suitably
protected to prevent corrosion.
3.3.7.1 Insert and grommet. Insert and grommet materials shall be high grade dielectric having
hardness, electrical, and mechanical characteristic suitable for the purpose intended.
3.3.7.1.1 Rigid (except classes H and N). Rigid dielectric materials shall be high grade having
electrical and mechanical characteristics suitable for the purpose intended. The impact strength shall be
such that the material shall not chip, crack, or break during assembly or normal service.
3.3.7.1.2 Rigid (classes H and N). The rigid dielectric materials in hermetic connectors shall be of a
single piece of vitreous material.
3.3.7.1.3 Resilient. Resilient dielectric materials shall conform to the requirements specified herein.
The resilient faces of series 1 and 2 connectors shall be designed so that the performance requirements
are met when mated to counterpart connectors of either series 1 or 2.
3.3.7.1.4 Insert faces (series 1). Insert faces or blankets to a minimum depth of 0.080 inch (2.03 mm)
.033 inch (0.84 mm) on class H shall be resilient within a Shore A range of 35-85 for crimp contact
connectors and class H connectors and 65-85 for solder contact connectors.
3.3.7.1.5 Pin insert faces (series 2). Pin insert faces shall be resilient within a Shore A range of
30 to 55.
3.3.8 Potting form (series 1). Potting forms shall be made of translucent nylon. The form shall
incorporate a means for attachment to the connector.
3.3.9 Material and finish for shells, coupling rings and metallic accessories.
3.3.9.1 Series 1 (except class H). Shells, coupling rings, and protective covers shall be made of
high grade aluminum alloys. Die castings, if used, shall be in accordance with ASTM B85/B85M.
Accessories (backshells) shall be in accordance with SAE-AS85049.
a. Shells, coupling rings, and accessories shall be made of impact extruded, machined or die cast
aluminum alloy.
b. Accessories (backshells) shall be in accordance with SAE-AS85049.
3.3.9.3 Shells (classes H and N). Shell materials shall be as specified (see 3.1).
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3.3.9.4 Finish (series 1, except class H). Aluminum parts and accessory hardware, unless otherwise
specified, shall be in accordance with the following designations:
Finish K (125°C) - Zinc-nickel alloy in accordance with ASTM B841, Type D (black)
over a suitable underplate to withstand 500 hours dynamic salt
spray. Color shall be nonreflective, conductive, and shall meet the
requirements as specified herein.
Finish AB (125°C) - Same as finish V above with the following exceptions. Suitable
underplate to withstand 1000 hours dynamic salt spray.
3.3.9.4.1 Finish (series 1, class H). Unless otherwise specified (see 3.1), stainless steel shells
(shell types A and B) shall be passivated in accordance with ASTM A967/A967M. Tin plated ferrous alloy
shells (shell type C and Y) shall be in accordance with ASTM B339 and ASTM B545 over nickel in
accordance with SAE-AMS-QQ-N-290. The resultant finish shall be suitable for soft soldering to a
mounting surface.
3.3.9.5 Finish (series 2). Metal parts shall be of a corrosion resistant material or be protected to meet
the performance requirements of this specification. The type of finish and class designation shall be as
follows:
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3.3.10 Bayonet pins. Bayonet pins shall be made of corrosion resistant steel. To indicate that the
connectors are fully mated when the bayonet pins are fully visible, the top of the bayonet pins shall be
colored blue, orange or yellow and shall be a contrasting color as compared to the color of the connector
body. Bayonet pins with bright nickel or natural stainless steel finish used with connector shells with olive
drab or black finishes are also acceptable (see 3.4.4.1).
3.4 Design and construction. Connectors and accessories shall be designed and constructed to
withstand normal handling incident to installation and maintenance in service. Connector
interchangeability control dimensions shall be as specified on figure 5. Rear accessory interchangeability
control dimensions of series 2 connectors shall be as specified on figure 6.
3.4.1 Contacts. Contacts shall be so designed that neither the pins nor the sockets will be
damaged during mating of counterpart connectors. A quantity of crimp contacts consisting of the normal
complement, plus one spare contact for connector arrangements having 26 contacts or less and two
spares for arrangements over 26 contacts shall be included in the unit package. Unless otherwise
specified, connectors shall be supplied with contacts (see 1.2.5 and 6.3).
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3.4.1.1 Solder contacts (series 1). Solder contacts shall conform to the dimensions on figure 7 and
shall be nonremovable from the insert. Solder cups shall be so designed that during soldering no
components will be damaged. A vent hole or equivalent may be provided to prevent air entrapment
during soldering.
3.4.1.2.1 Crimp power contacts. Crimp power contacts shall be qualified to and in accordance with
SAE-AS39029/31 or SAE-AS39029/32.
3.4.1.2.2 Crimp shielded contacts. Size 8 shielded contacts shall be qualified to and in accordance
with SAE-AS39029/23 or SAE-AS39029/24. Size 12 shielded contacts shall be qualified to and in
accordance with SAE-AS39029/25 or SAE-AS39029/26. Unless otherwise specified, shielded contacts
shall not be supplied with the connector (see 6.3).
3.4.1.2.3 Insertion and removal tools (series 1). The individual contacts shall be positively retained in
the connector when installed with the applicable contact insertion tools in accordance with
SAE-AS81969/17 and SAE-AS81969/19. The individual contacts shall be capable of being removed from
the connector when using the applicable contact removal tools in accordance with SAE-AS81969/17 and
SAE-AS81969/19.
3.4.1.3 Through-bulkhead contacts (series 1). The engaging ends of contacts in through-bulkhead
connectors shall conform dimensionally to corresponding details on figure 7 (classes E, P and J).
Contacts shall be nonremovable.
3.4.1.4.1 Crimp power contacts. Crimp power contacts shall be in qualified to and in accordance with
SAE-AS39029/4, /5, /9, or /10. Neither the pin nor socket shall be damaged by twisting or forcing during
mating and unmating of the connectors, or by insertion of contacts into or removal of contacts from the
connector with the tools specified for insertion or removal.
3.4.1.4.2 Crimp shielded contacts. Size 12 shielded contacts shall be qualified to and in accordance
with SAE-AS39029/7 or SAE-AS39029/8. Contacts shall be inserted and removed with the same tools
used for the size 12 power contacts. Unless otherwise specified, shielded contacts shall not be supplied
with the connector (see 6.3).
3.4.1.4.3 Insertion and removal tools (series 2). Tools required for assembly or disassembly of
pin and socket contacts into their connector inserts, shall be in accordance with SAE-AS8196930 or
SAE-AS81969/14. Unless otherwise specified, connectors shall be supplied with insertion and removal
tools (see 6.3).
3.4.2.1 Insert design and construction (series 1). Inserts shall be of voidless construction and shall be
secured to prevent rotation within the shell. The inserts shall be nonremovable from the shell and shall
be installed in the position in accordance with MIL-STD-1669.
3.4.2.1.1 Inserts for crimp contact connectors (series 1). In crimp contact connectors, the insert and
wire sealing grommet or insulating spacer shall be one integral part. The design shall permit the removal
and reinsertion of individual contacts without any damage detrimental to connector performance to any
15
part of the insert, including contact retention mechanisms or the sealing members, in accordance with
SAE-AS81969/17 and SAE-AS81969/19 tools.
3.4.2.1.2 Contact arrangement (series 1). All solder cup openings shall be oriented with openings
facing the master key or keyway. All eyelet terminations shall be oriented with eyelet holes facing the
master key or keyway.
3.4.2.1.3 Contact spacing. Minimum nominal center-to-center spacing and minimum dielectric
thickness, contact to shell, or contact to contact shall be in accordance with the values shown in table III.
3.4.2.1.4 Contact alignment (series 1). Inserts for socket contacts shall provide an overall side-play of
the socket contacts of .0025 to .0075 inch (0.063 to 0.190 mm) from the required position to facilitate
alignment with mating pin contacts.
3.4.2.1.5 Class H (series 1). Contacts shall be fused into the vitreous inserts of class H connectors. A
resilient face shall be permanently bonded to the insert to ensure an interfacial seal in mating.
TABLE III. Minimum nominal contact spacing and minimum dielectric thickness. 1/ 2/
Service rating I Service rating II
Classes Contact
and size Center Dielectric Center Dielectric
finishes to center to center
rigid resilient rigid resilient
A, E, F, J, 20 .008 .012
.130 (3.30) .162 (4.11)
L, P, N, T, 16 (0.20) (0.30)
.168 (4.27) .190 (4.82)
W, V, AA, .006 .008
12 .205 (5.21) .230 (5.84)
AB
(0.15) (0.20)
H 20 .130 (3.30) .030 .162 (4.11) .030
16 .168 (4.27) (0.76) .190 (4.82) (0.76)
12 .205 (5.21) .230 (5.84)
1/ Dimensions are in inches.
2/ Metric equivalents are given for information only.
3.4.2.2 Insert design and construction (series 2). The inserts shall be rigid plastic and so designed and
constructed with proper-sections and radii that they will not chip, crack or break during normal assembly
or service. Hollow-type inserts shall not be used. The inserts shall be nonremovable, mechanically
retained, and bonded to the shell with the design and construction such that all air paths between cavities
are eliminated. The insert engaging faces shall be designed and constructed such that all air paths
between cavities at the connector interfaces shall be eliminated when the connectors are mated. The
inserts shall be so designed that positive locking of the contacts in the inserts is provided. Socket insert
face shall be of a rigid plastic material. The design shall permit the removal and reinsertion of individual
contacts without any damage detrimental to connector performance to any part of the insert, including
contact retention mechanisms and the sealing members, using the applicable tool in accordance with
SAE-AS81969/14 or SAE-AS81969/30.
3.4.2.2.1 Inserts (series 2, class H). Class H receptacle inserts shall be so designed and constructed
with proper sections and radii that they will not readily chip, crack or break during normal assembly or
service. The inserts shall be nonremovable from the shell and shall meet the requirements of this
specification.
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3.4.2.2.2 Inserts (series 2, class N). The inserts shall be bonded assembly forming a single unit; the
front shall be of a vitreous material with a resilient face and the back shall be rigid plastic. The inserts
shall be so designed and constructed with proper-sections and radii that they will not chip, crack or break
during normal assembly or service. Hollow-type inserts shall not be used. The insert assembly shall be
nonremovable such that all air paths between cavities are eliminated. The insert engaging connector
interfaces shall be designed and constructed such that all air paths between cavities at the connector
interfaces shall be eliminated when the connectors are mated. The inserts shall be so designed that
positive locking of the crimp terminals in the rigid plastic is provided.
3.4.2.2.3 Contact insertion and extraction (series 2, except class H). The connector design shall
permit individual insertion and extraction of contacts without removing the insert or sealing members.
Insertion of the contacts into and extraction of the contacts from the insert shall be accomplished from the
wire side of the connector and with the aid of tools specified in 3.4.1.4.3. Insertion/extraction shall be
possible with a full complement of maximum outside diameter (OD) wire (see table IV).
3.4.2.2.4 Contact arrangement identification. The contact positions shall be permanently designated in
contrasting color on the front face of the insert and on the rear face of the wire sealing grommet as noted
on the insert arrangement in accordance with MIL-STD-1669, and on figure 8.
3.4.2.2.5 Insert position (series 2). The inserts shall be positioned with respect to the shell within the
tolerance specified on figure 5.
3.4.2.2.6 Alternate insert position (series 2). Alternate insert position shall be in accordance with
MIL-STD-1669.
3.4.2.2.7 Contact alignment (series 2). The alignment of pin contacts assembled into either plug or
receptacle shall be in accordance with MIL-STD-1669 when measured at the engaging end of the
contacts.
3.4.2.2.8 Contact float (series 2). Socket contacts assembled in either plug or receptacle shall allow
for contact float of .0025 to .0075 inch (0.063 to 0.190 mm) from true alignment position.
3.4.3 Shell design (except classes H and N). The connector shells shall be seamless and shall retain
their inserts in a positive manner. The shells for the connectors shall be designed to accept and retain a
cable support or other accessory as shown in the applicable MS standard. Connectors shall be designed
in such a manner as to incorporate a static peripheral seal located within the receptacles.
3.4.3.1 Jam nut receptacle shells. Jam nut mounting connectors shall be provided with a mounting nut
and an O-ring seal.
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3.4.3.2 Connector shell (series 2). The connector shell shall have a blue color band in accordance
with ECIA EIA-359 indicating a rear release connector. The location of the color band shall be as
specified (see 3.1).
3.4.3.3 Backshell accessories (series 2). Backshells shall conform to requirements specified (see 3.1).
The backshells shall have provision for safety wiring. In addition, they shall have wire sealing grommet
compression capability. Backshells shall be free of any sharp edges or other configurations that could
cause damage to wire extending through them. In addition, the RFI backshell shall provide metal-to-
metal bottoming of the follower to the rear face of the connector shell. Interchangeability dimensions shall
be as specified in SAE-AS85049.
3.4.3.4 RFI finger spring (series 2) (RFI plugs). Grounding springs shall have a minimum of six fingers
per inch. Spring fingers shall be designed to make electrical contact with the mating shell without
interfering with proper engagement. The grounding springs shall be permanently fixed to the shell
periphery.
3.4.4 Engagement of connectors. Counterpart connectors of any arrangement and accessories shall
be capable of being fully engaged and disengaged without the use of tools. Engagement of connectors
shall be defined as full insertion of pins into sockets and proper sealing of the mating insert faces. Full
engagement shall be indicated by an audible sound at the completion of the coupling cycle, and a positive
detent shall be included in the coupling mechanism to lock connectors in the engaged position.
3.4.4.2 Shell polarization. Polarization of connectors shall be accomplished by matched integral key(s)
and keyway(s) of counterpart connectors. The polarization of counterpart connectors shall take place
before coupling rings are engaged, and before any pin contacts can touch the opposing insert face or
socket of the counterpart connector.
3.4.4.3 Lubrication. Bayonet coupling slots shall be coated with a suitable lubricant. Features which
are intended to provide potting compound anchorage shall be free of lubricant. Accessory threads of
series 1 shall be coated with a suitable lubricant.
3.4.4.4 Engagement seal. Connectors shall contain sealing means so that engaged connectors
comply with the requirements specified herein. The design of the seal shall be such that in mated
connectors all paths between adjacent contacts and between contacts and shells are eliminated. There
shall be interfacial mating of the engaged connector insert to provide dielectric under compression of
.005 inch (0.13 mm) minimum.
3.4.4.5 Protective covers and storage receptacles (series 1). When mated to counterpart connectors,
the protective covers and storage receptacles shall maintain the connector free of moisture, shall prevent
air leakage, and shall comply with the applicable requirements of this specification.
3.4.5.1 Classes E and F connectors (series 1). Class E and F connectors, except MS3112, MS3119,
MS3122 and MS3127 shall be provided with a wire-sealing resilient grommet and gland nut capable of
sealing on wires of the sizes specified in table II.
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3.4.5.1.1 Solder contact connectors (series 1). Class E solder contact connectors shall be provided
with a removable resilient grommet and retaining feature. The grommet shall be designed to fit firmly
against the rear face of the insert and around each contact and wire termination so that any air path from
each contact termination to all other terminations and the shell is interrupted by dielectric material under
compression of .005 inch (0.13 mm) minimum.
3.4.5.1.2 Crimp contact connectors (series 1). Crimp contact connectors shall be provided with an
integral grommet and insert.
3.4.5.2 Class P connectors (series 1). Class P connectors shall be provided with a plastic potting form
suitable to accept and bond to MIL-PRF-8516 potting material. Inserts of class P connectors shall be so
designed that potting material will adhere to the shell and insert without treatment by the user.
3.4.5.3 Class H connectors (series 1). Class H connectors shall not be supplied with wire sealing
grommet; however, the shells and inserts shall be so designed that MIL-PRF-8516 potting material will
adhere to the insert without treatment by the user.
3.4.5.4 Class J connectors (series 1). Class J connectors shall be provided with a resilient gland and
gland nut capable of sealing on appropriate single-jacketed multi-conductor cables.
3.4.5.5 Grommet sealing plugs (series 1). The grommets of classes E and F connectors shall be
designed to accept sealing plugs in accordance with MS3187 or MS27488, in lieu of wire where unwired
contacts are employed. Fifteen percent of the number of contacts but not less than one, shall be included
in the unit package. Unless otherwise specified, connectors shall be supplied with grommet sealing plugs
(see 6.3).
3.4.5.6 Wire sealing members (rear grommet) (series 2, classes A, L, T, W, K, V, AA, AB). The wire
sealing member shall provide suitable sealing for overall wire diameters listed in table II, and shall not be
removable from the shell. The seal shall accept a full complement of wire approaching the minimum OD
or a full complement of wire approaching the maximum OD.
3.4.5.7 Grommet sealing plugs (series 2, classes A, L, T, W, K, V, AA, AB). Grommet sealing plugs for
unused contact cavities shall be in accordance with MS3187 or MS27488. The same sealing plugs shall
be utilized in both connector plugs and receptacles. Fifteen percent of the number of contacts, but not
less than one, shall be enclosed in the unit package. Unless otherwise specified, connectors shall be
supplied with grommet sealing plugs (see 6.3).
3.4.6 Receptacle mounting. Receptacle mounting shall be one of the following as specified (see 3.1):
a. Flange mounting.
b. Jam nut mounting.
c. Solder mounting.
19
3.5.2 Interchangeability. All connectors and accessories having the same MS standard PIN shall be
completely interchangeable with each other with respect to installation (physical) and performance
(function) as specified herein.
3.6 Performance. Connectors shall perform as follows when subjected to the conditions and tests
specified. Unless otherwise specified, class A connectors must meet the performance requirements of
class L.
3.6.1 Maintenance aging (crimp contact connectors). After being tested as specified in 4.6.2, all crimp
contact connectors shall be capable of conforming to this specification. Contact retention (see 4.6.32),
shall be performed on contacts subjected to the maintenance aging test.
3.6.2 Mating and unmating forces (coupling torque) (series 1). When tested as specified in 4.6.3,
mating and unmating of protective covers and of counterpart connectors with the maximum number of
contacts installed, shall meet the torque requirements in table V.
3.6.3 Mating and unmating forces (coupling torque) (series 2). When tested as specified in 4.6.4,
completely assembled connectors, except RFI plugs, shall meet the torque requirements in table VI.
Mating and unmating forces for RFI shielded plugs shall not exceed the values specified in table VI by
more than 20 percent.
20
3.6.4 Contact resistance (series 1). When tested as specified in 4.6.5, solder contacts in the mated
condition or mated contacts consisting of crimp contacts mated to solder contacts shall meet the contact
resistance requirements specified in table VII. Crimp contacts in the mated condition shall meet the
contact resistance requirements specified in SAE-AS39029.
3.6.5.1 Contact resistance (series 2, classes A, L, T, W, K, V, AA, AB). Crimp contacts in the mated
condition shall meet the contact resistance requirements specified in SAE-AS39029.
21
3.6.5.2 Contact resistance (series 2, classes H and N). When tested as specified in 4.6.6, the contact
resistance of receptacle shall not exceed that specified in table VIII by more than 700 percent.
3.6.6 Insulation resistance (series 1). Insulation resistance versus temperature shall be as shown on
figure 1.
3.6.6.1 Insulation resistance at ambient temperature (series 1). When connectors are tested as
specified in 4.6.7.1 at 25ºC, the insulation resistance shall be greater than 5,000 megohms.
3.6.6.2 Insulation resistance at elevated temperature – short time (series 1). When connectors are
tested as specified in 4.6.7.2 at 125ºC, the insulation resistance shall be greater than 3 megohms.
3.6.6.3 Insulation resistance at elevated temperature – long time (series 1). When connectors are
tested as specified in 4.6.7.3 at 105ºC, the insulation resistance shall be greater than 12 megohms.
3.6.7 Insulation resistance (series 2). Insulation resistance versus hot spottemperature shall be as
shown on figure 3.
3.6.7.1 Insulation resistance at ambient (series 2). The insulation resistance shall be greater than
5,000 megohms when connectors are tested as specified in 4.6.8.1 at 25ºC.
3.6.7.2 Insulation resistance (high temperature) (series 2). The insulation resistance shall be greater
than 500 megohms when classes A, L, and AA are tested as specified in 4.6.8.2 at 200ºC, and when
classes H, N, W, T, K, V, AB are tested as specified in 4.6.8.2 at 175°C.
3.6.8 Dielectric withstanding voltage (series 1). When tested as specified in 4.6.9.1 and 4.6.9.2,
connectors shall show no evidence of breakdown or flashover when subjected to the test voltages and
altitudes specified.
3.6.8.1 Working voltages. Maximum working voltages are as shown in table IX.
22
3.6.9.1 Dielectric withstanding voltage (sea level). When tested as specified in 4.6.10.1, maximum
leakage current shall be 2 milliamperes and there shall be no evidence of electric breakdown or flashover.
The service rating is on the applicable military standard.
3.6.9.2 Dielectric withstanding voltage (altitude). When tested as specified in 4.6.10.2, maximum
leakage current shall be 2 milliamperes and there shall be no evidence of electric breakdown or flashover.
3.6.10 Contact insertion and removal forces (crimp contact connectors) (series 1). The contact
insertion forces and the forces required to remove unlocked contacts shall not exceed the values
specified in table X when subjected to the maintenance aging test (see 4.6.11).
TABLE X. Contact insertion and removal forces (pounds, maximum) (series 1).
Contact size Insertion and removal forces
20 20
16 20
12 30
3.6.11 Contact insertion and removal forces (series 2) (except class H). When tested as specified in
4.6.11, the insertion force for any individual contact shall not exceed 15 pounds. The removal force shall
not exceed 10 pounds.
3.6.12 Thermal shock (temperature cycling) (series 1). When tested as specified in 4.6.12, there shall
be no evidence of damage detrimental to the operation of connectors.
3.6.13 Thermal shock (temperature cycling) (series 2). After testing as specified in 4.6.13, connectors
shall meet the subsequent test requirements listed in the applicable test sequence table.
3.6.14 Water pressure (series 1) (applicable to solder-type contact connectors, class E receptacles
and class J plugs). When tested as specified in 4.6.14, receptacle inserts and panel seals shall show no
leakage. In addition, there shall be no evidence of leakage at the connector interface of mated
connectors, neither shall there be evidence of water penetration into the J adapters of the mated and
unmated plugs; and the insulation resistance of mated connectors at the end of 48 hours, while still
immersed, shall be 100 megohms minimum. After removal of unmated connectors from the immersion
tank, the insulation resistance shall be 100 megohms minimum.
3.6.15.1 Solder contact receptacles (except class H), through-bulkhead receptacles, class J plugs,
stowage receptacles, and protective covers. When tested as specified in 4.6.15, the air leakage rate shall
be no greater than 1 atmospheric cubic inch per hour (4.55 x 10-3 cm3/s), including the flange O-ring seal
of all jam nut receptacles.
3.6.15.2 Class H connectors. When tested as specified in 4.6.15.2, the air leakage rate shall not
exceed 0.1 micron cubic foot per hour (1 x 10-6 cm3/s). The specified leakage rate shall apply only
through the connector and not through the flange and mounting surface area, unless solder mounted.
3.6.16 Air leakage (series 2, classes H and N). When receptacles are tested as specified in 4.6.16,
the leakage rate shall not exceed 0.1 micron cubic foot per hour (1 x 10-6 cm3/s) when subjected to a
23
differential pressure of 14.7 ± 0.3 pounds force per square inch (lbf/in2), 1.033 ± .02 kgs per square
centimeter (kg/cm2).
3.6.17 Durability (series 1). When tested as specified in 4.6.17, counterpart connectors shall show no
mechanical or electrical defects detrimental to the operation of the connector, after 500 cycles of coupling
and uncoupling.
3.6.18 Durability (series 2, except RFI plugs). When tested as specified in 4.6.18, connectors shall
meet the subsequent test requirements after 500 cycles of mating and unmating. Since dynamic salt
spray (corrosion) testing includes durability testing, durability requirements shall be fulfilled by successful
dynamic salt spray (corrosion) testing.
3.6.18.1 Durability (series 2) (RFI plugs). When tested as specified in 4.6.18, connectors shall meet
the subsequent test requirements after 250 cycles of mating and unmating. Since dynamic salt spray
(corrosion) testing includes durability testing, durability requirements shall be fulfilled by successful
dynamic salt spray (corrosion) testing.
3.6.19 Salt spray (corrosion) (series 1, class H and series 1, finish W). When tested as specified in the
applicable sections 4.6.19 or 4.6.20, unmated connectors, stowage receptacles, protective covers and
accessories shall show no exposure of the base metal under three power (3X) magnification, which will
adversely affect performance when evaluated in accordance with EIA/ECA-364-26. The connector shall
meet all subsequent test requirements.
3.6.20 Salt spray (corrosion) (series 2, classes A, H, L and N connectors and all classes of protective
covers). When tested as specified in 4.6.20, unmated connectors, stowage receptacles, protective
covers and accessories shall show no exposure of the base metal under three power (3X) magnification,
which will adversely affect performance when evaluated in accordance with EIA/ECA-364-26. The
connector shall meet all subsequent test requirements.
3.6.20.1 Salt spray (corrosion) (dynamic test, series 1, finishes T, K, V, AA, AB, and series 2, classes
T, W, K, V, and AA) When tested as specified in 4.6.20, unmated connectors, stowage receptacles,
protective covers and accessories shall show no exposure of the base metal under three power (3X)
magnification, which will adversely affect performance when evaluated in accordance with EIA/ECA-364-
26. The connector shall meet all subsequent test requirements.
3.6.21 Vibration (series 1). When tested as specified in 4.6.21, mated connectors shall not be
damaged and there shall be no loosening of parts. Counterpart connectors shall be retained in full
engagement, and there shall be no interruption of electrical continuity longer than 10 microseconds.
3.6.22 Random vibration (series 2). When tested as specified in 4.6.22, mated connectors shall not be
damaged and there shall be no loosening of parts. The coupling ring shall not loosen and there shall be
no interruption of electrical continuity longer than 1 microsecond.
3.6.23 Shock (specified pulse) (series 1). When tested as specified in 4.6.23, mated connectors shall
not be damaged and there shall be no interruption of electrical continuity longer than 10 microseconds.
3.6.24 Shock (specified pulse) (series 2). When tested as specified in 4.6.24, mated connectors shall
not be damaged and there shall be no interruption of electrical continuity longer than 1 microsecond.
3.6.25 Humidity (series 1). When tested as specified in 4.6.25, mated connectors shall maintain an
insulation resistance of 100 megohms or greater at 25ºC.
24
3.6.26 Humidity (series 2). When tested as specified in 4.6.26, insulation resistance shall be at least
100 megohms. The connector shall meet the subsequent tests listed in the applicable test sequence
table.
3.6.27 Fluid immersion (series 1). When tested as specified in 4.6.27, connectors shall mate within the
forces specified in table V.
3.6.28.1 Classes H, L, N, T, W, K, V, AA, AB. After being tested as specified in 4.6.28.1, connectors
shall mate properly and shall meet the requirements of all subsequent tests.
3.6.28.2 Retention system fluid immersion (series 2). When tested as specified in 4.6.28.2, connectors
shall meet the requirements of subsequent tests as specified herein. (Effects of fluids on resilient
sealing members shall not be a consideration of this test.)
3.6.29 Insert retention (series 1) (except class H). When tested as specified in 4.6.29, inserts shall not
be dislocated from their original positions. The effective pressure differential shall be 75 lbf/in2
(5.3 kg/cm2).
3.6.29.1 Insert retention (series 1) (class H). When tested as specified in 4.6.29, class H inserts shall
not be disclosed from the original positions. The effective pressure differential shall be 200 lbf/in2
(14.06 kg/cm2).
3.6.30 Insert retention (series 2, except classes H and N). When connectors are tested as specified in
4.6.30, inserts shall withstand an applied minimum pressure of 150 lbf/in2 (10.54 kg/cm2).
3.6.30.1 Insert retention (series 2, classes H and N). When tested as specified in 4.6.30.1, receptacles
shall support a minimum differential pressure in either direction of 100 lbf/in2 (7.03 kg/cm2) for shell sizes
8 through 24 static loading for a minimum of 5 minutes. The receptacle shall meet the subsequent test
requirements of the applicable test sequence table.
3.6.31 Gage location and retention (crimp type contacts). The axial location of series 1 pin contacts
and series 2 pin and socket contacts shall be measured as specified in 4.6.31 using test gages in
accordance with MS3460, MS3461, or MS3462, as applicable. Gage location measurements shall fall
within the range specified on figure 5. Test gages in accordance with MS3460, MS3461, or MS3462, as
applicable, shall be retained in the pin and socket cavities of series 1 and series 2 crimp contact
connectors, and in the rear termination cavities of class N connectors, with the axial loads specified in
table XI applied. The axial displacement of the test gages while under load shall not exceed 0.015 inch
(0.38 mm).
3.6.32 Contact retention. When tested as specified in 4.6.32, contacts shall be retained in their inserts
at the axial loads specified in table XI. The axial displacement of crimp contacts with respect to the shell
shall not exceed .012 inch (0.30 mm) while under load with the accessory tightened or .015 inches
(0.38 mm) while under load with the accessory removed. The axial displacement of solder contacts with
respect to the shell shall not exceed .012 inch (0.30 mm) within one minute after the load has been
removed.
25
3.6.33 Contact engaging and separating forces (series 1). When tested as specified in 4.6.33, socket
contacts shall comply with the engagement and separation forces in table XII.
3.6.34 Probe damage (series 1). When tested as specified in 4.6.34, socket contacts shall meet the
requirements of 3.6.33.
3.6.35 Cover chain, tensile strength (series 1 and 2). When tested as specified in 4.6.35, protective
covers with chains shall withstand a 25-pound (11.34 kg) tensile test without damage.
3.6.36 Altitude immersion (series 2). When connectors are tested as specified in 4.6.36, the insulation
resistance shall not be less than 1,000 megohms and the connector shall show no evidence of
breakdown, flashover or corona when subjected to a minimum of 1,500 volts root mean square (rms).
Maximum leakage current during the dielectric withstanding voltage test shall be 2 milliamperes.
3.6.37 Temperature life (series 2, class H). Following the test as specified in 4.6.37, the contact
resistance shall meet the requirements of 3.6.5.2.
3.6.37.1 Temperature life with contact loading (series 2, classes L, N, T, W, K, V, AA, AB). When
tested as specified in 4.6.37.1, the contacts shall maintain their specified locations as shown on figure 13
and there shall be no electrical discontinuity in excess of 1 microsecond.
3.6.38 Ozone exposure (series 2). When connectors are tested as specified in 4.6.38, there shall be
no evidence of cracking of materials or other damage that will adversely affect the subsequent
performance of the connectors in the applicable test sequence.
26
After conditioning
2B
3.6.39 Shell-to-shell conductivity (series 2, except class A). When tested as specified in 4.6.39, the
probes shall not puncture or otherwise damage the connector finish and the maximum measured
potential drop across assemblies shall be as follows:
3.6.40 Insert grommet bonding (series 2, all classes, except hermetics). Specimens of the insert
grommet bonded assembly and the insert interfacial seal bonded assembly shall be subjected to the test
specified in 4.6.40. There shall be evidence of cohesive failure of the insert face seal, grommet or insert
material rather than complete adhesive failure of bond. The test shall be conducted using only the
complete insert assemblies in their final form prior to assembly into the connector shell.
3.6.41 External bending moment (series 2, all classes, except hermetics). When tested as specified in
4.6.41 using the applicable bending moment shown in table XIII, connectors shall show no evidence of
damage detrimental to their normal operation, nor shall there be any interruption of electrical continuity.
27
8 55 (6.2 N-m)
10 61 (6.9 N-m)
12 115 (13.0 N-m)
14 134 (15.14 N-m)
16 154 (17.40 N-m)
18 199 (22.48 N-m)
20 245 (27.68 N-m)
22 270 (30.50 N-m)
24 328 (37.04 N-m)
3.6.42 Pin contact stability (series 2, all classes, except hermetics). When tested as specified in
4.6.42, the total displacement of the contact tip end shall not exceed the amount shown in table XIV.
3.6.43 RFI shielding (series 2, RFI plugs only, except class A). When tested as specified in 4.6.43, the
RFI shielding capabilities of the shells shall not be less than that specified in table XV at the specified
frequencies.
3.6.44 RFI finger spring force (series 2, except class A). When tested as specified in 4.6.44, the plug
and receptacle axial mating force shall be as specified in table XVI.
28
3.6.45 Insertion and removal tool abuse (series 2, all classes, except hermetics). When tested as
specified in 4.6.45, there shall be no damage to the contacts, the connector insert, or the contact retaining
mechanism. The connectors shall meet the requirements of subsequent testing.
3.6.46 Contact walk-out (series 2, classes L, N, T, W, K, V, and AA). When tested as specified in
4.6.46, contacts shall not become dislodged from their normal position.
3.6.47 Accessory thread strength (series 2, all classes, except hermetics). When tested as specified in
4.6.47, the accessory threads and portion of the connector that accepts connector accessories shall be
capable of withstanding torques as specified in table XXX.
3.6.48 Impact (drop) (qualification only) (series 2 only). When connectors are tested as specified in
4.6.50, there shall be no breaking or cracking of inserts, bending of pins, nor any other damage which
prevents the connectors from being mated or renders them unfit to continue further testing. Any chipping
of the inserts which affects its polarization or retention in the shell shall be considered a failure.
3.6.49 Solder contact plating thickness (except class H) (series 1). When measured as specified in
4.6.51, the plating thickness, except for corners, shall be as specified in 3.3.5. All other plated surfaces
shall be plated to a thickness to assure specified performance of the contact.
3.6.50 Humidity-temperature cycling (series 1, solder contact with localized finish only) (except
class H). When tested as specified in 4.6.52, there shall be no evidence of defects detrimental to the
electrical performance.
3.6.51 Hexavalent chromium detection. Applicable as specified in table II when hexavalent chromium
is used in manufacturing process. When tested as specified in 4.6.54, finish shall be negative for
hexavalent chromium (Cr(VI)). Detection is done to validate the absence or acceptably low level of
hexavalent chromium. It is preformed because some manufacturers may use hexavalent chromium in
processing. They use a post process to convert the hexavalent chromium to trivalent chromium. This test
is to validate that the hexavalent chromium conversion was successful in bringing the hexavalent
chromium levels below an acceptable amount.
3.7 Marking.
3.7.1 Connector marking (series 1 and series 2). Connectors and accessories shall be permanently
marked on the shell or coupling ring with the PIN, date code, manufacturer and assembly plant when
applicable (see 1.2.1 and 3.1). The manufacturer and assembly plants may be identified by the use of
Commercial or Government Entity Number (CAGE code), name, trademark or symbol and shall be as
specified in SAE-AIR1351. Stamping shall be in accordance with MIL-STD-1285 where space permits, in
the location specified (see 3.1). Marking shall remain legible following completion of all inspections.
Marking shall be nonfading. The characters shall be a minimum of .037 inch (0.94 mm) in height. The
minimum character height does not apply to shell sizes 8, 10, and 12. In addition, all rear release
29
connectors shall be marked around the periphery of the shell with a blue color band to identify the
connectors as having the rear release contact system. The location of the blue band shall be as specified
(see 3.1). A single digit shell size and/or insert arrangement shall be marked with a single digit (example:
shell size 8 shall be marked “8” not “08”), however, to allow existing stock to be exhausted, the use of 2
digits is allowed (example: shell size “8” may be marked “08”) for a period of one year from the date of
this specification.
3.7.2 Insert marking. Inserts shall be marked in accordance with MIL-STD-1669. Raised or depressed
characters shall not be used on mating faces.
3.7.3 Grommet marking. Wire openings on the rear face of grommets shall be marked with legible
characters corresponding to the insert contact designators. On grommets of solder contact connectors, it
is permissible to identify, where space limitations dictate, only those wire openings which are located on
the vertical centerline.
3.7.4 JAN and J marking. The United States Government has adopted and is exercising legitimate
control over the certification marks "JAN" and "J", respectively, to indicate that items so marked or
identified are manufactured to, and meet all the requirements of specifications. Accordingly, items
acquired to, and meeting all of the criteria specified herein and in applicable specifications shall bear the
certification mark "JAN" except that items too small to bear the certification mark "JAN" shall bear the
letter "J". The "JAN" or "J" shall be placed immediately before the part number except that if such
location would place a hardship on the manufacturer in connection with such marking, the "JAN" or "J"
may be located on the first line above or below the part number. Items furnished under contracts or
orders which either permit or require deviation from the conditions or requirements specified herein or in
applicable specifications shall not bear "JAN" or "J". In the event an item fails to meet the conditions or
requirements of this specification or in applicable specification sheets, the manufacturer shall remove
completely military part number and the "JAN" or the "J" from the sample tested and also from all items
represented by the sample. The "JAN" or "J" certification mark shall not be used on products acquired to
contractor drawings or specifications. The United States Government has obtained Certificate of
Registration Number 504,860 for the certification mark "JAN" and Registration Number 2,577,735 for the
certification mark “J”.
Note: The “JAN” or “J” is not part of the PIN but indicates a certification.
3.8 Workmanship. Connectors and accessories shall meet all design dimensions and intermateability
requirements of this specification. Loose contacts, poor molding fabrication, loose materials, defective
bonding, damaged or improperly assembled contact, peeling, or chipping of plating or finish, galling of
mating parts and post molding warpage will be considered adequate basis for rejection of items of quality
inferior for the purpose intended. The connector shall be fabricated in a manner such that the criteria for
appearance, fit and adherence to specified tolerances are observed. Particular attention shall be given to
neatness and thoroughness of marking parts, plating, welding, soldering, riveting, staking, and bonding.
The visual examination under three power (3X) magnification shall include examination of each retention
cavity for molding discrepancies, retention features, and excessive adhesive. The connectors shall be
free from crazing, cracks, voids, pimples, chips, blisters, pinholes, sharp cutting edges, nicks, burrs, and
other defects that will adversely affect life, serviceability, or appearance.
30
3.9 Change effectivity. Unless otherwise specified by the preparing activity and/or the qualifying
activity, all changes from the previous revision of MIL-DTL-26482 shall become effective within 90 days
from the date of publication of the latest revision. If unable to implement changes within the 90 day time
period, additional time shall be requested from the qualifying activity. Manufacturers that are QPL listed
and have concerns regarding possible changes to retention reporting requirements should contact the
qualifying activity for clarification.
3.10 Disposition of stock. Unless otherwise specified by the preparing activity and/or the qualifying
activity, qualified manufacturers and their selling agents or distributors may ship from stock; connectors
and accessories which were manufactured in accordance with the previous revision of MIL-DTL-26482 for
a period of 18 months from the date of the latest revision, provided that form, fit and function
requirements are not affected.
3.11 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and
externally. Tin content of connectors, their components and solder shall not exceed 97 percent, by mass.
Tin shall be alloyed with a minimum of 3 percent lead, by mass (see 6.12).
4. VERIFICATION
4.1 Classification of inspection. The inspection requirements specified herein are classified as
follows:
4.1.1 Inspection of product for delivery. Inspection of product for delivery shall consist of Groups A
and B inspection.
4.1.2 Inspection conditions. Unless otherwise specified, tests and examinations required by this
specification shall be performed under any combination of conditions within the following ranges. Any
specified condition shall not affect the other two ambient ranges.
4.1.2.1 Test equipment and inspection facilities. Test and measuring equipment and inspection
facilities of sufficient accuracy, quality and quantity to permit performance of the required inspection shall
be established and maintained by the supplier. The establishment and maintenance of a calibration
system to control the accuracy of the measuring and test equipment shall be in accordance with
ISO/IEC 17025.
4.1.2.2 Established reliability assurance program. A reliability assurance program shall be established
and maintained in accordance with MIL-STD-790. Evidence of such compliance shall be verified by the
qualifying activity of this specification as a prerequisite for qualification and continued qualification.
4.1.2.3 Statistical process control (SPC). A SPC program shall be established and maintained in
accordance with SAE-EIA-557. Evidence of such compliance shall be verified by the qualifying activity as
a prerequisite for qualification and retention of qualification.
4.1.3 Assembly plants. Assembly plants must be listed on or approved for listing on the applicable
Qualified Products List. The qualified connector manufacturer shall certify that the assembly plant is
approved for the distribution of the manufacturer’s parts. The assembly plant shall use only piece parts
31
supplied by the qualified connector manufacturer. No testing other than visual examination is required of
certified piece parts obtained from the qualified connector manufacturer, except when there is cause for
rejection. Assemblies produced at the assembly plant shall be subjected to inspection to assure that the
assembly process conforms with that established at the qualified manufacturing plant. Quality control
requirements, including Government inspection surveillance, shall be the same as required for the
qualified connector manufacturer.
4.3.1 Qualification of additional connectors. For connectors of the same series which have identical
contacts and finish, and differ only in shell size and/or configuration from those which have been
previously qualified (or are currently being qualified), the qualifying activity may grant qualification upon
successful completion of inspections and tests as specified in 4.3.2, provided that the manufacturer
submits test data necessary to validate the differing feature(s). In addition, connectors which differ only
in shell size shall be subjected to the following tests and the results shall be forwarded to the qualifying
activity:
4.3.2 Qualification samples. Samples of each class for which qualification is desired shall be
tested in the sequence specified in table XVIII or table XIX, as applicable. Each connector subjected to
qualification testing shall be provided with a counterpart connector for those tests requiring mating
assemblies. The counterpart connectors provided for this purpose shall be new, previously qualified
connectors or new connectors submitted for qualification testing. Manufacturers not producing mating
connectors shall submit data substantiating that tests were performed with approved counterpart
connectors. Specific details on preparation of samples shall be as follows:
4.3.2.1 Series 1. A sufficient number of connectors shall be supplied to provide a minimum of 110
contact cavities of the size of contacts for which qualification of the crimp contact retention feature is
desired.
4.3.2.1.1 Wire-to-contact assembly. Where wired contacts are required, terminations shall be
accomplished as applicable (see 4.3.2.1.1.1 and 4.3.2.1.1.2).
4.3.2.1.1.1 Solder contacts. Solder contacts wire terminations shall be tested in accordance with
MIL-STD-202-208.
32
4.3.2.1.2 Connector assemblies (classes E, F and P). Three complete connector assemblies, class E
wall-mount receptacles and class F straight plugs, with insert arrangements in the densest configuration
of each voltage rating for which qualification is desired, in each shell size and each finish, shall be
provided. Separate samples are required for crimp-contact connectors and solder-contact connectors.
Crimp contacts shall be supplied but shall not be installed in connectors submitted for qualification testing.
a. One sample shall have pin contacts in the plug and socket contacts in the receptacle.
Both halves shall be wired with approximately 3 feet (0.91 m) of wire approaching the
minimum OD specified in table II. These samples shall be subjected to the tests in
table XVIII, group 1.
b. The other samples shall have socket contacts in the plug and pin contacts in the
receptacle. Both halves shall be wired with approximately 3 feet of wire approaching
the maximum OD specified in table II. These samples shall be divided into two groups
and shall be subjected to all the tests in table XVIII, groups 2 and 3. One group of
connectors is to be assigned to each test sequence.
c. Qualification of these samples shall admit qualification of other types and the balance
of insert patterns in classes E, F and P by similarity. If qualification of class E or F is
not sought, samples of class P shall be substituted for class E or F in the foregoing,
except that nominal gage wire may be used.
4.3.2.1.3 Connector assemblies (class H). Three class H receptacles, with insert arrangements in
the densest configuration of each voltage rating for which qualification is desired, in each shell size and
contact style shall be provided, together with counterpart class E straight plugs.
a. All halves shall be wired with approximately 3 feet of wire of nominal gage.
b. The samples shall be divided into three equal groups and shall be subjected to all the
tests in table XVIII, groups 4, 5, and 6, one group of connectors to be assigned to
each test sequence. Qualification of these samples will admit qualification of other
types and the balance of insert patterns in class H by similarity.
4.3.2.1.4 Connector assemblies (class J). One mated pair of class J connector assemblies, in
each shell size, shall be subjected to the tests in table XVIII, group 10.
a. The Class J connectors shall be assembled, unwired, using a solid polychloroprene cylinder of
suitable length and OD in table XVII. The Shore A durometer of the test cylinder shall be from
75 to 85. The mating Class E connector shall be wired.
b. Qualification of these samples will admit qualification of all class J assemblies if class E are
being qualified at the same time or have previously been qualified to this specification. If not,
class J assemblies shall be subjected to all of the tests in table XVIII, test groups 1 and 2.
33
4.3.2.1.5 Solder contacts (series 1). A sufficient number of series 1 solder contact connectors and
contacts shall be provided as follows:
a. Fifty of each socket contact configuration shall be subjected to the tests in table XVIII, group 7.
Sockets which are not completely assembled prior to installation in the insert (e.g. class H,
socket style), may be provided and tested in connectors.
b. Two pin contacts and two socket contacts, uninstalled but representative of each contact
configuration supplied assembled in the insert, shall be provided for inspection of contact finish
in accordance with 3.3.5 and 4.6.51 (table XVIII, group 12).
c. Eight pin contacts and eight socket contacts (localized finish only) (see 3.3.5.1.2) of each
configuration, installed into inserts, shall be provided. Samples shall be wired as required and
subjected to the tests in table XVIII, group 11.
4.3.2.1.6 Protective covers. Two protective covers of each shell size with mating class E connectors,
shall be subjected to the tests in table XVIII, group 8.
4.3.2.1.7 Stowage receptacles. Two stowage receptacles of each size, with mating class E
connectors, shall be subjected to the tests in table XVIII, group 8.
4.3.2.1.8 Crimp connectors. Connectors supplied in accordance with 4.3.2.1 shall be subjected to
the tests specified in table XVIII, group 9.
4.3.2.2 Series 2.
34
The full complement of contacts shall be installed but need not be wired. Individual sample assemblies
shall be as follows:
NOTE: For test group 7, the sample size and configuration requirements for the insert grommet
bonding test shall be as specified in 4.3.2.2.4.
4.3.2.2.2 Hermetic receptacles (classes H and N) (Initial qualification only). Forty two hermetic
receptacles together with suitable counterpart mating plugs shall be provided for test groups 1 through 7
in table XX as follows: 21 receptacles for class H and 21 receptacles for class N. For each test group in
each class, provide 3 receptacles; 1 small, 1 medium and 1 large shall size (that is a total of 42
receptacles and 42 mating plugs). Three additional hermetic receptacles (1 small, 1 medium and 1 large,
in either class H or class N or a mix of the two) together with their suitable counterpart series 1 mating
plugs shall be provided for test group 9 in table XIX. Twenty four additional connectors (12 from class H
and 12 from class N for a ratio of 1 sample per fluid) shall be provided for the fluid immersion test of
4.6.28.1. All samples shall be fully wired with applicable nominal diameter wire (approximate).
Termination of wire to class H receptacles shall be accomplished with solder in accordance with
J-STD-006. Termination of wire to crimp contacts of class N receptacles shall be accomplished with a
class 1 crimping tool conforming to M22520/1-01 or M22520/2-01.
4.3.2.2.3 Samples for retention system tests (non-metallic contact retention systems only). Seven
complete connector assemblies shall be provided for test groups 1 through 7 in table XXI. (Wire sealing
grommets may be removed at the option of the test facility.) Class N samples shall consist of receptacles
only. Contacts shall be wired with nominal diameter wire unless otherwise specified in the test
paragraph.
4.3.2.2.4 Qualification of insert grommet bonding (all classes, except hermetics). Two bonded insert
grommet assemblies and two bonded insert interface seal assemblies which have not been assembled
into the connector shell shall be tested. The assemblies shall be of the size and contact arrangement for
which qualification is to be conducted. Bonded sample assemblies shall be subjected to insert grommet
bonding and examination of product only in table XIX, group 7. These assemblies shall meet the
requirements of 3.6.40.
35
4.3.2.2.5 Protective covers. Two protective covers of each shell size with mating class A or L
connectors, shall be subjected to the tests in table XIX, group 11.
4.3.2.2.6 Stowage receptacles. Two stowage receptacles of each size, with mating class A or L
connectors, shall be subjected to the tests in table XIX, group 11.
4.3.3 Qualification rejection. There shall be no failures during any examination or tests of the
connectors or accessories submitted for qualification tests. After notification of any failure, the activity
responsible for qualification testing shall receive details of corrective action from the manufacturer before
initiating any further tests deemed necessary to assure compliance with connector requirements.
36
37
38
39
Group 8 – Protective covers and stowage receptacles 3.1, 3.3 thru 4.6.1
Examination of product 3.5, 3.7, & 3.8
Group 11 – Localized finish solder contacts only 3.1, 3.3 thru 4.6.1
3.5, 3.7, & 3.8
Examination of product
3.6.4 4.6.5
Contact resistance (25°C)
3.6.5 4.6.53
Humidity – temperature cycling 3.6.4 4.6.5
Contact resistance (25°C)
40
41
42
43
44
45
46
47
Group 1
48
Group 2
49
Group 3
50
Group 4
51
Group 5
52
Group 6
Group 7
53
Group 1
Group 2
54
Group 3
Group 4
Group 5
55
Group 6
Group 7
4.4.1 Inspection of product for delivery. Inspection of product for delivery shall consist of groups
A and B inspection.
4.4.1.1 Inspection lot. An inspection lot shall consist of all connectors of the same shell size,
covered by the same MS standard, produced under essentially the same conditions, and offered for
inspection at one time.
4.4.1.1.1 Group A inspection. Connectors shall be subjected to the individual tests shown in table XXII
for group A inspection. Except for referee purposes, the documentation and standard test conditions of
EIA-364 do not apply.
56
4.4.1.1.2 Rejected lots (group A). Table XXII tests shall be performed on a production lot basis. If one
or more defects are found, the lot shall be rescreened for that particular defect and defective parts shall
be removed. A new sample shall then be randomly selected as specified in table XXIV. If one or more
defects are found in this second sample, then the lot shall be rejected and shall not be supplied to this
specification. When defects have no effect on the use or performance of the subject parts, reworking of
the parts may be permitted upon approval of the qualifying activity.
4.4.1.2 Group B inspection. Group B inspection shall consist of the applicable tests specified in
table XXIII, and shall be made on sample units which have been subjected to and have passed the group
A inspection. For group B, except for referee purposes, the documentation and standard test conditions
of EIA-364 do not apply.
4.4.1.2.1 Sampling plan (group B). A sample size shall be randomly selected as specified in table
XXIV. If one or more defects are found, the lot shall be rescreened and defects removed. A new sample
shall then be randomly selected as specified in table XXIV. If one or more defects are found in this
second sample, then the lot shall not be supplied to this specification.
4.4.1.2.2 Lot definition (group B inspection). The production lot definition in accordance with
MIL-STD-790 is further defined as follows:
a. A production lot consists of all connectors covered under one military specification or standard,
manufactured from the specified raw materials, processed under the same specification and
procedures, produced by the same type of equipment, and submitted for inspection at one time.
Each production lot of assembled connectors shall be a group identified by a common
manufacturing record through all significant assembly operations.
b. Traceability of connectors to specific physical/chemical test reports of incoming raw material is not
required.
c. Common manufacturing records and traceability shall begin with machining and molding and shall
include connector assembly.
57
1 to 13 100 percent
14 to 150 13 units
151 to 280 20 units
281 to 500 29 units
501 to 1200 34 units
1200 to 3200 42 units
4.4.1.2.3 Disposition of sample units. Sample units which have passed group B inspection may be
delivered on the contract or purchase order if the lot is accepted and sample units are still within specified
tolerances.
4.5 Periodic inspection. Qualification verification inspection shall consist of group C. Except when the
results of these inspections show noncompliance with the applicable requirements (see 4.5.1.1.5),
delivery of products which have passed group B shall not be delayed pending the results.
4.5.1 Group C inspection. Group C inspection shall consist of the tests specified in table XXV and
table XXVI in the order shown. Group C inspection shall be performed every 24 months, which must be
accomplished within this period after notification of qualification. Group C inspection shall be performed
on sample units selected from inspection lots which have passed the groups A and B inspection.
4.5.1.1 Sampling plan. Every 24 months, mated connector sample units which have passed groups A
and B inspections shall be subjected to the tests specified in table XXV and table XXVI. Samples shall be
selected in sufficient quantity to provide two samples per applicable test group (table XXV and table
XXVI), as determined by the series (series 1 or series 2) and the class of the samples to be tested.
58
Group 4
Group 5
Group 6
59
Group 1
3.6.31 4.6.31
Gage location and retention
3.6.18 4.6.18
Durability
3.6.3 4.6.4
Mating and unmating forces
3.6.26 4.6.26
Humidity
3.6.3 4.6.4
Mating and unmating forces
Group 2
3.6.31 4.6.31
Gage location and retention
3.6.20 4.6.20
Salt spray (corrosion)
3.6.3 4.6.4
Mating and unmating forces
Group 3
3.6.18 4.6.18
Durability
3.6.26 4.6.26
Humidity
Group 4
Group 5
Group 6
60
4.5.1.1.1 Connector samples (series 1). For group C testing, series 1 connectors shall be provided as
follows:
a. Class E, F or P – Separate samples (complete connector assemblies or mated pairs) are
required for crimp-contact connectors and solder-contact connectors. Four mated pairs with
each type finish shall be provided. Two mated pairs shall have pin contacts in the plug and
socket contacts in the receptacle, and shall be wired with approximately three feet of wire
approaching the minimum OD specified in table II. The other two mated pairs shall have
socket contacts in the plug and pin contacts in the receptacle, and shall be wired with
approximately 3 feet (.9144 m) of wire approaching the maximum OD specified in table II.
Two of the mated pairs (one with minimum wire and one with maximum wire) shall be subject
to test group 1 in table XXV. The other two mated pairs shall be subjected to test group 2 in
table XXV.
b. Class H – Four mated pairs shall be provided together with counterpart class E straight
plugs. The connectors shall be wired with approximately three feet of wire of nominal gage
specified in table II. The mated pairs shall be subjected to test groups 3 and 4 in table XXV.
c. Class J – Four mated pairs of connectors with each pair composed of a Class J connector
mated to a Class E connector, assembled as specified in 4.3.2.1.4a, shall be divided into two
equal groups and shall be subjected to test groups 5 and 6 in table XXV.
4.5.1.1.2 Connector samples (series 2). For group C testing, series 2 connectors shall be provided
as follows:
b. Classes H and N – Four samples of each class shall be provided, together with counterpart
class L plugs. Two mated pairs of each class shall be wired with wire of nominal gage within
the applicable range of table II and subjected to the tests in table XXVI, group 3. The balance
of the samples shall have the full complement of contacts installed in the plugs but need not
be wired. These shall be subjected to the tests in table XXVI, test group 4.
c. RFI plugs – Four samples total of class A, L, T, W, K, V, AA, AB shall be provided, together
with counterpart receptacles. These samples shall have a full complement of contacts
installed but need not be wired. The mated pairs shall be divided into two equal groups and
shall be subjected to the tests in table XXVI, test groups 5 and 6. In addition, two receptacle
connectors without inserts and with the bayonet pins removed shall be provided for test aids
for group 5 (RFI finger spring force).
4.5.1.1.3 Failures. If one or more sample units fail to pass group C inspection, the sample shall be
considered to have failed, and corrective action shall be taken in accordance with 4.5.1.1.5.
4.5.1.1.4 Disposition of sample units. Sample units which have been subjected to group C inspection
shall not be delivered on the contract or purchase order.
61
4.5.1.1.5 Noncompliance. If a sample fails to pass group C inspection, the supplier shall take
corrective action on the materials or processes, or both, as warranted, and on all units of product which
can be corrected and which were manufactured with essentially the same materials, processes, etc., and
which are considered subject to the same failure. Acceptance of the product shall be discontinued until
corrective action, acceptable to the qualifying activity, has been taken. After the corrective action has
been taken, group C inspection shall be repeated on additional sample units (all inspections, or beginning
with the inspection which the original sample failed, at the option of the qualifying activity). Groups A and
B inspections may be reinstituted; however, final acceptance shall be withheld until the group C
reinspection has shown that the corrective action was successful. In the event of failure after
reinspection, information concerning the failure and corrective action taken shall be furnished to the
cognizant inspection activity and the qualifying activity.
4.5.1.1.6 Retention of qualification. To retain qualification, the manufacturer shall forward reports to
the Qualifying Activity (see 6.3) as follows:
a. At 24 month intervals, unless otherwise specified by the Qualifying Activity, the qualified
manufacturer shall forward a report with a summary of the results of groups A and B testing (see
4.4.1.1.1 and 4.4.1.2). The results of tests of all reworked lots shall be identified and accounted
for.
b. At 24 month intervals, unless otherwise specified by the Qualifying Activity, the qualified
manufacturer shall submit requalification, group C test reports (see 4.5.1). The report shall include
results of all qualification verification inspection testing performed during that period.
Reports shall include certification that the qualified source continues to produce qualified product
under the same conditions as originally qualified (i.e., same processes, materials, design,
construction, etc., including manufacturing locations), unless such changes have been authorized
by the Qualifying Activity.
Note: The Qualifying Activity establishes the initial reporting date. The qualified source shall
immediately notify the Qualifying Activity at any time during the reporting period when inspection
data indicates failure of the qualified product to meet the requirements of the specification. If the
summary of test results indicates nonconformance with the specification requirements, and
corrective action acceptable to the Qualifying Activity has not been taken, then action may be
taken to remove failing product from the QPL. In addition, failure to submit the report within thirty
days after the end of each reporting period may result in loss of qualification for that product. In
the event that no production occurred during the reporting period, the qualified manufacturer shall
submit a report certifying that the company still has the capability and facilities required to produce
the qualified product. If there has been no production during two consecutive reporting periods,
the Qualifying Activity, at its discretion, may require the manufacturer submit a representative
product of each type, class, etc., to retention testing in accordance with qualification inspection
requirements.
4.6.1 Examination of product. The connectors, accessories, and piece parts shall be examined to
ensure conformance with this specification and the applicable detail documents not covered by the
performance requirements of 3.6. In-process controls of component parts, unrelated to lot sizes of
finished connectors, may be utilized in lieu of examination of these components in the finished connectors
to assure conformance of these component parts. Visual inspection of each molded contact retention
device for molding discrepancies shall be a required in process control for all removable contact
connectors.
62
Examination in a continuing manner shall be performed to assure compliance with the following
requirements:
a. Applicable MS standard.
b. Materials.
c. Design and construction.
d. Interchangeability.
e. Finish.
f. Marking.
g. Workmanship.
4.6.2 Maintenance aging (crimp contacts only) (see 3.6.1). Connectors shall be tested in
accordance with test procedure EIA-364-24. The following details shall apply:
a. Contacts shall be removed and reinserted once using the appropriate SAE-AS81969/17 and
SAE-AS81969/19 tools for series 1 and SAE-AS81969/14 for series 2.
b. Connectors shall be mated and unmated 10 times. A minimum of 20 percent but not less than
three of the contacts shall be removed and reinserted nine times.
Maximum forces shall be as specified in table X.
4.6.3 Mating and unmating forces (series 1) (see 3.6.2). Mating connectors shall be tested in
accordance with test procedure EIA/ECA-364-13. The following details shall apply:
4.6.4 Mating and unmating forces (series 2) (see 3.6.3). Mating connectors shall be tested in
accordance with test procedure EIA/ECA-364-13. The following details shall apply:
4.6.5 Contact resistance (series 1) (see 3.6.4). Contact resistance shall be measured in accordance
with test procedure EIA-364-06. For all solder contacts, test current for contact sizes 20, 16, and 12 shall
be 5.0, 10.0, 17.0 amperes, respectively.
4.6.6 Contact resistance (series 2, hermetic connector contacts only) (see 3.6.5). Contact resistance
shall be measured in accordance with test procedure EIA-364-06. For class H and N contacts, test
current for sizes 20, 16, and 12 shall be 5.0, 10.0, 17.0 amperes, respectively.
4.6.7 Insulation resistance (series 1) (see 3.6.6). Unmated connectors shall be tested in accordance
with test procedure EIA/ECA-364-21.
4.6.7.1 At ambient temperature (see 3.6.6.1). The following details shall apply:
Measurement shall be made between all, but not more than 6, pairs of adjacent contacts and
between all, but not more than 6, contacts adjacent to the shell, and the shell. Contacts
selected shall be those having the closest spacing between measuring points. Temperature
shall be 25° ± 3ºC.
63
4.6.7.2 At elevated temperature (short time) (see 3.6.6.2). The details of 4.6.7.1 and the following
details shall apply:
Connectors shall be exposed to a temperature of 125° ± 3ºC for 250 hours. During this period,
at least eight measurements shall be recorded at intervals of not less than 24 hours. After the
completion of the 250 hours and while at 125° ± 3ºC, measurements shall be recorded on all
samples.
4.6.7.3 At elevated temperature (long time) (see 3.6.6.3). The details of 4.6.7.1 and the following
details shall apply:
The connectors shall be exposed to a temperature of 105°± 3ºC for 1,000 hours. At the end of
this period and while the connectors are still at elevated temperature, measurements shall be
recorded.
4.6.7.4 Insulation resistance for Group A inspection (series 1). The procedure of 4.6.7.1 shall apply
except simulated contacts may be used and measurements need only be made between at least one pair
of adjacent contacts and between one peripheral contact and the shell.
4.6.8 Insulation resistance (series 2) (see 3.6.7). Wired, unmated connectors shall be tested in
accordance with test procedure EIA/ECA-364-21.
4.6.8.1 At ambient temperature (see 3.6.7.1). The following details shall apply:
Measurements shall be made between each wired contact and all other wired contacts and the
shell electrically connected together.
4.6.8.2 At elevated temperature (see 3.6.7.2). The details of 4.6.8.1 and the following details shall
apply:
4.6.8.3 Insulation resistance for Group A inspection (series 2). The procedure of 4.6.8.1 shall apply
except simulated contacts may be used and the measurements shall be made between at least one pair
of adjacent contacts and between one peripheral contact and the shell.
4.6.9 Dielectric withstanding voltage (series 1) (see 3.6.8). Unmated connectors shall be tested in
accordance with test procedure EIA-364-20, test method A.
4.6.9.1 At sea level (see 3.6.8). The following details shall apply:
The applicable test voltage in table XXVII shall be applied between all adjacent contacts and
between the shell and each peripheral contact for a minimum of five seconds. If an insert
possesses two service ratings, similar connections shall be made for the different test voltages,
as necessary.
64
4.6.9.2 At altitude (see 3.6.8). The details of 4.6.9.1 and the following details shall apply:
a. Connectors shall be tested after 30 minutes at the simulated altitude in table XXVII.
b. Only the engaging face of classes H and J shall be subjected to the high altitude. The rear
faces shall be suitably protected.
4.6.9.3 Dielectric withstanding voltage for Group A inspection (series 1). The procedure of 4.6.9.1
shall apply except simulated contacts may be used and the period of application of test voltage shall be
one second minimum.
4.6.10 Dielectric withstanding voltage (series 2) (see 3.6.9). Unmated, wired connectors shall be
tested in accordance with test procedure EIA-364-20, test method A.
4.6.10.1 At sea level (see 3.6.9.1). The following details shall apply:
The applicable test voltage in table XXVII shall be applied between each contact and each
adjacent contact and the shell for a minimum period of one minute at the standard test conditions.
Switching transient potentials in excess of the specified test voltage shall not be permitted.
4.6.10.2 At altitude (see 3.6.9.2). The details of 4.6.10.1 and the following details shall apply:
a. Connectors shall be placed in a suitable chamber and stabilized for a minimum period of one
minute at each altitude specified in table XXVII prior to the application of test voltages.
b. The rear faces of classes H and N connectors shall be suitably protected.
4.6.10.3 Dielectric withstanding voltage for Group A inspection (series 2). The procedure of 4.6.10.1
shall apply except simulated contacts may be used and the period of application of test voltage shall be
one second minimum.
4.6.11 Contact insertion and removal forces (removable crimp contacts) (see 3.6.10 or 3.6.11).
Unmated, wired connectors shall be tested in accordance with test procedure EIA-364-05. The following
details shall apply:
4.6.12 Thermal shock (temperature cycling) (series 1) (see 3.6.12). Unmated connectors shall be
tested in accordance with test procedure EIA-364-32. The following details shall apply:
Test condition letter A, minimum temperature -55ºC and maximum temperature 125ºC.
65
4.6.13 Thermal shock (temperature cycling) (series 2) (see 3.6.13). Mated, wired connectors, shall be
tested in accordance with test procedure EIA-364-32, condition I, 5 cycles, with the following exceptions:
a. Plugs with “J” adapters shall be assembled to test cylinders (see table XVII) which simulate
jacketed cables.
b. Class E receptacles shall be mounted by their normal mounting means, with mounting flange
gaskets. Jam nut mounting receptacle flanges shall be sealed only with O-ring seals provided
as accompanying hardware. One-half of the wall mounting receptacles shall be front mounted
and the remaining half shall be back mounted. The terminal ends of the receptacles shall be
external to the tank.
c. Fifty percent of the connectors tested shall be mated, and insulation resistance of the mated
immersed connectors shall be measured and values recorded at the end of the 48-hour
period. The other fifth percent of the connectors shall be tested unmated. Upon completion of
the test, the connectors shall be removed from the tank, all external moisture removed from
the connectors by shaking them at room temperature, and insulation resistance measured and
recorded within one-half hour after removal from the water. All mated connectors shall be
inspected for internal leakage of water at the connector interface and cable housing. All
unmated plugs with “J” adapters shall be inspected for water penetration into the adapter.
Class E receptacles, mated and unmated shall be inspected for leakage through or around the
insert and for leakage of the panel seals.
4.6.15.1 Classes E, F, J, and P. Solder contact receptacles and class J plugs shall be mounted in a
manner suitable for application of a 30 lbf/in2 (2.11 Kg/cm2) pressure differential across the connectors.
The leakage rates shall be measured in both directions after the connector has been exposed to -55º ±
3ºC (-67ºF) for 30 minutes, and allowed to return to room temperature.
4.6.15.2 Class H. Class H receptacles shall be mounted in a manner suitable for the application
of 1atmosphere pressure differential across the receptacles and tested in accordance with test procedure
EIA-364-02, except the minimum period of measurement shall be 10 seconds. The leakage rate shall be
determined while pressurized air or gas, containing not less than 10 percent of helium by volume, is
applied to the receptacle.
4.6.15.3 Stowage receptacles and protective covers. Stowage receptacles and protective covers
shall be mated to connectors having either contacts or inserts removed so that a pressure of 10 lbf/in2
(.703 Kg/cm2) can be applied against the insides of the protective covers or stowage receptacles.
4.6.16 Air leakage (series 2, classes H and N) (see 3.6.16). Classes H and N receptacles shall be
mounted in a suitable test apparatus for the application of specified test pressure across the connector.
Wires attached to receptacles for any of the previous tests may be removed for this test. A suitable
means shall be used for determining the leakage of air, or gas containing not less than 10 percent helium
by volume through the connector while the specified test pressures are maintained for a minimum period
of 1 minute.
66
4.6.17 Durability (series 1, except finishes T, K, V, AA, AB) (see 3.6.17). Counterpart connectors shall
be mated and unmated 500 times at a rate of 200 ± 100 cycles per hour with the coupling rings operated
in a manner to simulate actual service.
4.6.18 Durability (series 2, except classes T, W, K, V, AA, AB) (see 3.6.18). The wired, assembled
plugs and receptacles shall be subjected to the number of cycles of mating and unmating specified in
3.6.18 and 3.6.18.1, at the rate of 200 ± 100 cycles per hour. The coupling rings shall be operated in a
manner to simulate actual service. The plug and receptacle shall be completely separated during each
cycle.
4.6.19 Salt spray (corrosion) (series 1, class H and series 1, finish W) (see 3.6.19). Unmated
connectors and protective covers shall be tested in accordance with test procedure EIA/ECA-364-26.
The following details shall apply:
a. Test condition letter – B.
b. Connectors shall not be dipped in water after exposure.
c. Prior to all subsequent tests, corrosion tested connectors shall be engaged and disengaged for
one cycle to remove free salt deposits. Contact resistance shall be measured on the first
mating of the connector.
4.6.20 Salt spray (corrosion) (series 2, classes A, H, L and N connectors and all classes of protective
covers) (see 3.6.20). Unmated, wired connectors and protective covers shall be tested in accordance
with test procedure EIA/ECA-364-26. The following details shall apply:
a. Test condition letter – B.
b. Class N connectors shall have their rear faces suitably protected.
4.6.20.1 Salt spray (corrosion) (dynamic test, series 1, finishes T, K, V, AA, AB and series 2, classes T,
W, K, V, AA, AB) (see 3.6.20). The wired assembled plugs and receptacles shall be mated and unmated
50 cycles of durability at a rate of 200 ± 100 cycles per hour. The details specified in 4.6.18 shall apply.
The sample connectors shall then be subjected to the spray test in accordance with test procedure
EIA/ECA-364-26, the following details and exceptions shall apply:
a. Four hundred fifty-two (452) hours mated followed by forty-eight (48) hours unmated.
b. The samples shall not be mounted, but shall be suspended from the top using waxed twine or
string, glass rod or glass cord.
c. Wire ends must be protected to prevent salt migration.
After salt spray exposure, the remaining number of durability cycles specified in 3.6.18 or 3.6.18.1 shall
be completed. Requirements of 3.6.18 or 3.6.18.1 and 3.6.20 shall apply.
4.6.21 Vibration (series 1) (see 3.6.21). Mated connectors shall be tested in accordance with test
procedure EIA-364-28. The following details shall apply:
67
c. The duration of test shall be 8 hours in the longitudinal direction and 8 hours in the
perpendicular direction (see table XXVIII for the breakdown in duration and temperature). All
contacts shall be wired in a series circuit and 100 to 150 milliamperes shall be caused to flow
during vibration.
4.6.23 Shock (specified pulse) (series 1) (see 3.6.23). Mated, wired connectors shall be tested in
accordance with test procedure EIA-364-27. The following details shall apply:
4.6.24 Shock (specified pulse) (series 2) (see 3.6.24). Mated, wired connectors shall be tested in
accordance with test procedure EIA-364-27. The following details shall apply:
a. The pulse shall be an approximate half sine wave of 300 G ± 15 percent magnitude,
with a duration of 3 ± 1 milliseconds.
b. One shock in each direction of the three major axes.
c. All contacts shall be wired in series with 100 ± 10 milliamperes of current flowing through the
contacts during the test.
d. Discontinuity shall be 1 microsecond maximum.
4.6.25.1 Crimp contact connectors. Mated connectors shall be tested in accordance with test
procedure EIA-364-31. The following details shall apply:
a. 100 volt dc polarization voltage during steps 1 through 6 applied between alternate contacts
connected together electrically and the remaining contacts and metal connector shell
connected together electrically. Polarity of the metal shell shall be negative.
b. Mated test samples.
c. Method IV, temperature cycling test.
d. The insulated conductors used for measurements of insulation resistance shall have an
insulation resistance greater than 100 kilohms.
e. After a minimum of 3 hours at step 7 of the tenth cycle, insulation resistance shall be
measured while connectors are subjected to high humidity conditions. Following the tenth
cycle measurements, the connectors shall be maintained at a temperature of 25ºC ± 2ºC and
50 percent relative humidity for 24 hours. Insulation resistance shall again be measured while
at this environment.
4.6.25.2 Solder contact connectors. Mated solder contact connectors shall be subjected to the
following test. The test chamber shall consist of a box approximately 12 inches (.305 meters) deep by
16 inches (.406 meters) wide by 24 inches (.610 meters) long, capable of being sealed, and shall be
constructed of materials that will not, in the presence of water, affect deterioration of the samples.
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A suitable open screen tray shall be provided to support the test specimens approximately 8 inches (.203
meters) below the top of the box. Provisions shall be made to bring out wires for measurement purposes
through vapor-tight seals near the top of the box. Suitable controls shall be provided that will cause the
chamber air temperature to vary 5ºC (9ºF) once each hour for 20 days, from any temperature between 22º
and 28ºC (72ºF and 82ºF), causing heavy condensation to form on the samples once each hour. The
bottom of the test chamber shall be covered with approximately .250 inch (6.35 millimeter) of tap water to
start the test. The heat application to supply the temperature variation shall be of any method which
ensures the proper variation as described above.
4.6.26 Humidity (series 2) (see 3.6.26). Wired, mated connectors shall be tested in accordance with
test procedure EIA-364-31. The following details shall apply:
4.6.27 Fluid immersion (series 1) (see 3.6.27). Unmated connectors shall be immersed fully in the
fluids specified below for the required periods. At least one connector shall be immersed in each fluid.
After removal from the fluid, each connector shall remain for 1 hour in free air at room conditions.
Subsequent testing shall be performed on connectors mated with mating connectors that had been
immersed simultaneously.
a. Hydraulic fluid in accordance with MIL-PRF-83282 or MIL-PRF-87257 – 20 hours.
b. Lubricating oil in accordance with MIL-PRF-7808 – 20 hours.
4.6.28.1 Classes H, L , N, T, W,K, V, AA, AB (see 3.6.28.1). At least one connector for each fluid as
detailed in table XXIX of each class shall be subjected to each of the tests in table XXIX. After testing in
accordance with the individual test procedure, the connectors shall be visually (no magnification)
inspected for cracks and tears and shall be mated by hand.
4.6.28.2 Retention system fluid immersion (series 2, classes L, N, T, W, K, V, AA, AB) (see 3.6.28.2).
Connectors shall be unmated and contacts shall be removed. Connectors shall be immersed in the
following fluids (one sample per fluid) for 20 hours at room temperature (applicable to non-metallic
contact retention systems only).
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After removal, excess fluid shall be allowed to drain from the connectors for 4 hours and the contacts
shall be reinstalled. The connectors shall then be subjected to the subsequent tests specified in
table XXI.
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4.6.29 Insert retention (series 1) (see 3.6.29). Connectors, less insert removable grommets or insert
supporting accessories, shall be tested in accordance with test procedure EIA/ECA-364-35.
4.6.30 Insert retention (series 2, classes L, T, W, K, V, and AA) (see 3.6.30). Unmated, wired
connectors, with backshells removed, shall be tested in accordance with test procedure EIA/ECA-364-35.
The following details shall apply:
Samples shall be divided into two equal groups and designated A and B. Group A shall have an
axial load applied to the mating face and group B shall have an axial load applied to the rear face.
4.6.30.1 Insert retention (series 2, classes H and N) (see 3.6.30.1). Unmated receptacles shall be
tested in accordance with test procedure EIA/ECA-364-35. The following details shall apply:
4.6.31 Gage location and retention (crimp type contacts) (see 3.6.31). Applicable test gages shall
be installed in 3 randomly selected cavities of each connector. Accessory rear hardware shall be
removed, and remaining cavities shall have contacts in place. With the test gages fully seated back
against the contact retention device, the axial location of the front end of the gages shall be measured
relative to the reference point indication on figure 5. The axial load specified in table XI shall then be
applied to individual test gages in both directions. The load shall be applied at a rate of approximately 1
pound (.453 kg) per second until the specified load has been reached. Gage displacement shall be
measured with respect to the connector shell after an initial load of 2 pounds (.907 kg) has been applied
to assure that all slack between the gage and the retention device has been removed. For group B
inspection, gage displacement (retention) measurements are not required, and remaining contact cavities
may be empty.
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4.6.32 Contact retention (see 3.6.32). Connectors shall be tested in accordance with test procedure
EIA/ECA-364-29. Axial loads shall be as specified in table XI. The following details shall apply:
a. Number of samples – The test shall be performed on 20 percent of the contact complement;
but not less than three contacts in each connector half.
b. Applied axial load – Preload to 3 pounds (1.36 kg) maximum. Apply load as specified in
table XI.
c. Special requirements – Where the test sequence requires maintenance aging prior to contact
retention, the contacts which were subjected to maintenance aging shall also be selected for
contact retention.
d. Axial direction – The applicable forces shall be applied along the longitudinal axes of individual
contacts in the direction tending to displace the contacts to the rear.
e. Only the contacts to be tested need be installed in the connector.
4.6.32.1 Solder type and class N. Contact displacement shall be measured after the axial load
has been removed. For class N connectors, the test shall apply to the pin contact members only.
4.6.32.2 Crimp types. Contact displacement shall be measured with the contact under load, after
the load has been applied for a minimum of 5 seconds. Retention of the crimp terminals of class N
connectors shall be similarly tested.
4.6.33 Contact engaging and separating forces (series 1) (see 3.6.33). Socket contacts shall be
tested in accordance with the contact engagement and separation test in accordance with SAE-AS39029.
Solder contacts may be tested installed in the connectors.
4.6.34 Probe damage (series 1) (see 3.6.34). Socket contacts shall be tested in accordance with test
procedure EIA-364-25. The following detail shall apply:
Probe depth shall be .50 inch (12.7 mm), .750 inch (19.05 mm), and full.
4.6.35 Cover chain, tensile strength (series 1) (see 3.6.35). The protective cover shall be securely
held and a tensile static load of 25 pounds (11.34 kg) shall be applied to the end of the chain for 5
minutes in each of the following directions as specified:
a. With the axis of the chain at right angles to the axis of the holding fastener.
b. With the axis of the chain in the same axis as that of the fastener.
4.6.36 Altitude immersion (series 2) (see 3.6.36). Mated, wired connectors shall be tested in
accordance with test procedure EIA-364-03. The following details shall apply:
Dielectric withstanding voltage and insulation resistance shall be measured as specified in 4.6.10
and 4.6.8 after the third cycle with the connectors still submerged in the solution.
4.6.37 Temperature life (series 2, class H) (see 3.6.37). Mated, wired connectors shall be tested in
accordance with test procedure EIA-364-17. The following details shall apply:
a. Temperature test condition – 6, except contacts shall not carry current.
b. Test time condition – D.
c. Contact resistance shall be measured in accordance with 4.6.6 at the conclusion of exposure.
4.6.37.1 Temperature life with contact loading (series 2, classes L and AA (at 200°C) (392°F), N, T, W,
K, V, AB (at 175°C) (347°F)). Connectors with removable contacts shall have one mating pair of contacts
removed and replaced with contacts crimped to steel core copper wire (copperweld or equivalent) of the
appropriate size. The axial location of these contacts shall be measured for conformance with the
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applicable dimensions shown on figure 5 and a load of 2 pounds (.907 kg) applied to seat the contact
back against the retention device. The connector shall then be mounted in a fixture as shown on figure
14. A weight equal to 50 percent of the axial load specified in table XI for the applicable contact size shall
be suspended freely from each steel core wire. A current of 100 ± 10 milliamperes supplied from a 10.0
Vdc maximum power source shall be applied to the test contacts and a suitable instrument shall be used
to monitor the circuit for discontinuity in excess of one microsecond. The connector mounted as shown
on figure 13 shall then be subjected to the temperature life test of 4.6.37. After the connectors return to
ambient temperature, they shall be unmated and the contact locations remeasured (see figure 5) with 2
pounds (.907 kg) axial load applied to seat the contact back against the retention device. The tested
contacts shall then be replaced with unwired contacts and sealing plugs, and those cavities shall be
exempted from subsequent testing.
4.6.38 Ozone exposure (series 2) (see 3.6.38). Unmated, wired connectors shall be tested in
accordance with test procedure EIA-364-14.
4.6.39 Shell-to-shell conductivity (series 2, except class A) (see 3.6.39). The dc resistance of the
wired, mated, assembled connectors shall be measured from a point on the rear accessory thread of the
plug to the mounting flange of the receptacle, or the rear thread of a cable connecting receptacle. The
point of measurement on the square flange receptacle shall be adjacent to the mounting holes and
adjacent to the O-ring on the front or mounting side of the flange for the single hole amount receptacle.
The dc resistance shall not exceed the values specified in 3.6.39 when measured by the voltmeter-
ammeter method. The applied potential shall be 1.5 Vdc maximum. A resistance shall be inserted in the
circuit to limit the current to 1 ± .01 ampere. Probes with spherical ends of .05 inch (1.27 millimeter)
minimum radius shall be used to make the voltage measurements on the connectors. The probes shall
not puncture or otherwise damage the connector finish.
4.6.40 Insert grommet bonding (series 2, all classes, except hermetics) (see 3.6.40). The insert
assemblies shall be placed in a circulating air oven for a minimum period of 100 hours. The ambient
temperature of the air circulating past the assemblies shall be 200º +3º -0ºC (392º +5º -0ºF) for class L,
and 175º ± 3°C (347º +5º -0º F) for classes T and W. At the end of this conditioning period the bonded
assemblies shall be cooled to room temperature and the resilient grommets and interfacial seal shall be
pulled or torn from the hard dielectric disk. The assemblies shall meet the requirements of 3.6.40.
4.6.41 External bending moment (series 2, all classes, except hermetics) (see 3.6.41). The receptacle
connector shall be mounted as in normal service to a rigid panel. Before mating the plug connector to the
receptacle, an adapter or test torque arm shall be attached as shown on figure 9. After mating the plug
and receptacle connectors, the distance “L” from the point of load application “P” shall then be determined
as the bending moment listed in table XIII divided by the level arm “L”. This load shall be applied at a rate
of approximately 10 pounds per second until the required load is achieved. The load so applied shall be
held for a period of 1 minute after which the load shall be released. Continuity of the contacts shall be
monitored during the test. The test circuit used to monitor this test shall be capable of detecting any
discontinuity of 1 microsecond or greater.
4.6.42 Pin contact stability (series 2, all classes, except hermetics) (see 3.6.42). The unmated
connectors shall have 10 percent (but not less than one) of their pin contacts subjected to this test. Gage
pins shall be used to measure displacement. The gage pins shall be in accordance with MS3461. The
connector shall be held in a holding device. A force of 3 pounds (1.36 kg) shall be applied to the exposed
rod as shown on figure 10. The rate of load application shall not exceed one inch per minute. The total
pin tip displacement shall be measured as shown on figure 10.
4.6.43 RFI shielding (series 2, RFI plugs only, except class A) (see 3.6.43). The RFI shielding
effectiveness of mated connectors with RFI backshells shall be measured in a triaxial radio frequency
leakage fixture. The RFI leakage from the conductor inside the connector in the inner coaxial line into the
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outer coaxial line shall be measured at the frequencies specified in table XV within a frequency accuracy
of ± 5 percent. The level of detected signal power shall be indicated by a tunable radio frequency field
intensity meter isolated from the test circuit by a 10 dB pad. Care shall be taken to ensure that the signal
is a result of RFI leakage from within the mated connector and not due to a faulty termination inside the
fixture. All terminations inside the fixture, whether to the RFI backshells or between internal conductors,
shall have a leakage at least 10 dB less than the test requirement. The test arrangement shall be as
shown on figure 11 and figure 12. The signal source shall be set to the desired frequency. The signal
shall be fed through a 10 dB isolation pad to a parallel circuit consisting of a coaxial switch (double pole,
double throw or DPDT) so connected that the signal can be manually or electronically fed alternately to
the fixture and to a variable 100 dB reference attenuator. The attenuator shall be adjustable in 1 dB steps
and calibrated to ± 3 dB.
a. The inserts may be removed from the connectors under test or the contacts removed and a
hole drilled through the inserts to accommodate a center conductor of suitable geometry to
provide a good 50 ohm impedance match with the ID of the mated connector shells and RFI
backshells. Tapered transitions may be used to provide a means of changing diameters
without introducing significant discontinuities in the line. The maximum VSWR in the inner
coaxial line shall be 1.5. The outer shall of the test fixture shall be so constructed as to
provide a good 50 ohm impedance match with the OD of the mated connector shells, coupling
ring and RFI backshells. The maximum VSWR of the outer coaxial line shall be 1.5.
b. A sliding circumferential short shall be positioned behind the connector on the signal input end
of the fixture to provide for tuning the outer coaxial line for maximum output at each test
frequency. The allowable travel of this short shall be greater than ½ wave length at the lowest
test frequency or 1.5 meters minimum for 100 MHz. The inner coaxial line shall be terminated
in a fixed 50 ohm load impedance behind the connector at the output end of the fixture.
c. The connectors used to couple together the various elements of the test system shall be of a
low leakage type which have a nominal impedance of 50 ohms, a VSWR of less than 1.5, and
a minimum leakage attenuation of 100 dB. The output impedance of the signal source and
the input impedance of the detector shall be nominally 50 ohms with a maximum VSWR of
1.5. the input and output VSWR of the standard attenuator shall be less than 1.5 in the 20 to
100 dB range.
d. The relative signal level in the variable attenuator shall be equaled to that through the leakage
fixture by adjusting the attenuator. The signal loss in the fixture can then be read from the
setting on the variable attenuator.
4.6.44 RFI finger spring force (series 2, classes L, T, W, K, V, AA, AB, except class A) (see 3.6.44).
RFI plugs shall be completely mated and unmated with counterpart receptacles less bayonet pins and
inserts. On the initial mating and unmating the axial forces necessary to engage and separate shall be
within the values listed in table XVI.
4.6.45 Insertion and removal tool abuse (series 2, classes L, N, T, W, K, V, AA, AB) (see 3.6.45).
Steps a, b, c, and d shall be performed. Separate groups of 5 connect cavities each shall be used for
each step.
a. Removal tool – The tool shall be inserted as if to remove a contact and a total of 3 pounds
(1.36 kg) axial load shall be applied. With the force applied, the tool shall be rotated
180º and then removed, also removing the contact. The contact shall be reinserted. These
steps shall be repeated three times on each of the five contacts selected.
b. Insertion tool – The contact shall first be removed. With the insertion end of the tool, insert the
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contact and continue to press until an axial load of 3 pounds (1.36 kg) is applied. With
the force applied, the tool shall be rotated 180º and then removed. These steps shall be
repeated three times on each of the five contacts selected.
c. Insertion tool – The contact shall first be removed. With the insertion end of the tool, the
contact shall be inserted and an axial load of 10 pounds (4.53 kg) applied to the tool.
These steps shall be performed only once on each of the five contacts selected. A new tool
shall be used for each contact.
d. Removal tool – The tool shall be inserted as if-to remove a contact and a total of 10 pounds
(4.53 kg) axial load shall be applied. The tool shall then be removed, also removing the
contact. These steps shall be performed only once on each of the five contacts selected. A
new tool shall be used for each contact.
4.6.46 Contact walk-out (series 2, classes L, N, T, W, K, V, and AA) (see 3.6.46). Two contacts in
each plug and receptacle shall be tested. The contacts shall be crimped to stranded steel cable of an
appropriate size and installed in the connector. The unmated connector shall be mounted in a test fixture
as shown on figure 14. A 3 pound (1.36 kg) load shall be applied to the cable. One 360º rotation of the
fixture with the connector mounted shall constitute one cycle. The connector shall be subjected to 100
cycles at a rate of 10 to 20 cycles per minute.
4.6.47 Accessory thread strength (series 2, classes L, T, W, K, V, and AA) (see 3.6.47). The mated
connector shall be mounted as in normal service to a rigid panel. The torque wrench shall be attached as
shown on figure 15. After mating the plug and receptacle connectors, a torque shall be applied to the
accessory end of the plug and receptacle connectors as shown on figure 15, a torque shall be applied to
the accessory end of the plug at a rate of approximately 10 pounds (4.53 kg) per second until the required
torque is achieved (see table XXX). The load so applied shall be held for a period of 1 minute after which
the load shall be released. The test shall be repeated on the accessory end of the receptacle. The
connectors shall then be unmated and inspected to 3X magnification for damage or breakage.
4.6.48 Magnetic permeability (see 3.3.3). The wired, assembled, and fully mated connectors shall
be measured for relative permeability with an indicator in accordance with ASTM A342/A342M.
4.6.49 Final examination of product. The marking on connectors and accessories shall be legible
after all tests specified in table XVIII, table XIX, table XX and table XXI.
4.6.50 Impact (drop) (see 3.6.48). The connector shall be wired as intended for normal service,
complete with accessories and tested in accordance with test procedure EIA 364-42 at a drop height of 4
feet, service class, light with a total of eight drops.
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4.6.51.1 Overall finish (see 3.3.5.1.1). Minimum finish thickness shall be measured in accordance with
MIL-DTL-45204. Measurements shall be made on the external surfaces of the contact body at the
locations shown on figure 16.
4.6.51.2 Localized finish (see 3.3.5.1.2). Minimum finish thickness shall be measured in accordance
with MIL-DTL-45204. Measurements shall be made at point B or C on figure 17, as applicable.
4.6.52 Humidity - temperature cycling (series 1, localized gold finish contacts only (see 3.6.50).
Wired mated contacts shall meet the requirements of 3.6.49 when tested in accordance with test
procedure EIA-364-31, method IV, test condition A. Current applied to contacts during exposure shall be
100 ±10 milliamps.
4.6.53 Contact finish. Contact finish shall be measured by any method which will give results within
±10% of the true finish thickness (see 3.3.5 and 4.6.51.2).
4.6.54 Hexavalent chromium detection. See 3.6.51. Sample shall be tested in accordance with
IEC 62321-7-1 using the boiling water extraction procedure. One sample shall be used for testing.
5. PACKAGING
5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.3). When packaging of materiel is to be performed by DoD or in-house contractor
personnel, these personnel need to contact the responsible packaging activity to ascertain packaging
requirements. Packaging requirements are maintained by the Inventory Control Point’s packaging
activities within the Military Service or Defense Agency, or within the military service’s system commands.
Packaging data retrieval is available from the managing Military Department’s or Defense Agency’s
automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but is not
mandatory.)
6.1 Intended use (series 1). The various classes and types of connectors are intended for application
as follows:
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f. If air leakage requirements are critical, a resilient insert, solder contact receptacle, a through
bulkhead receptacle, or class H receptacle should be used, or the connector should be potted.
g. For finished wire diameters less than specified in table II, shrink-fit sleeving should be used over
the wire.
h. Where two or more wires are used in a solder cup or wire barrel, grommet sealing is not
obtainable. Wires should be potted if sealing is required.
i. Connectors are available with finishes T, W, K, V, AA, AB for corrosion protection.
a. Connector backshells must be installed to meet the specified moisture sealing requirements.
b. Class A connectors are intended for use in application where 200ºC temperature, grommet seal,
and nonconductive finish are required.
c. Class L connectors are intended for use in environment resisting applications at 200ºC
temperature and are fluid resistant. These connectors have wire sealing grommets.
d. Class H and N receptacles are intended for use in applications wherein pressure must be
contained by the connectors across walls or panels on which they are mounted. They have fluid
resistant insert face seals. In addition, class N receptacles have crimp type terminations.
e. Mechanical strain reliefs are intended for use where a saddle type clamp is desired.
f. Shielded contacts are intended for use with shielded and jacketed single conductor cables, and
may be used with certain coaxial cables when impedance matching is not required. Shielded
contacts are not furnished with connectors, and must be ordered separately when required.
Shielded contacts will not intermate with standard size 12 contacts or with series 1 shielded
contacts. It is the user’s responsibility to assure mating contact compatibility at time of contact
installation.
g. RFI backshell and grounding fingers on plug are available in class L and provide RFI shielding.
h. Classes T, W, K, V, and AA connectors are intended for use in salt spray environments providing
a corrosive resistant shell, conductive finish, and fluid resistance at 175°C/200°C service
temperature.
6.3.1 Accessory hardware. Accessory hardware, such as dust covers or mounting hardware especially
designed for these connectors, is shown on the separate drawings.
6.3.2 Crimp contacts. Crimp contacts may be ordered in bulk in accordance with SAE-AS39029.
6.4 Definitions.
6.4.1 Alternate insert position. The inner position illustrated in accordance with MIL-STD-1669 should
be termed “normal” position. Where possible, the order of design selection of insert position should be
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“normal” first. This should be followed by the alternate positions as needed in the order in which they are
presented in the tabulation included in the detail document covering the arrangement.
6.4.2 Backshell. The backshell consists of an accessory nut end follower. The accessory nut is
captivated to the follower and is used to attach the backshell to the connector (except the RFI backshell).
6.4.3 Overall finish. A finish having a specified minimum thickness applied (i.e., barrel plating
techniques, non-selective types, etc.) on all external plating surface diameters except for corners, which
assures the specified performance of the contact.
6.5 Qualification. With respect to products requiring qualification, awards will be made only for
products which are, at the time of award of contract, qualified for inclusion in the Qualified Products List
QPL No. 26482, whether or not such products have actually been so listed by that date. The attention of
the contractors is called to these requirements, and manufacturers are urged to arrange to have products
that they propose to offer to the Federal Government tested for qualification in order that they may be
eligible to be awarded contracts or orders for the products covered by this specification. Information
pertaining to qualification of products may be obtained from DLA Land and Maritime-VQ, P.O. Box 3990,
Columbus, Ohio 43218-3990 or by email from [email protected]. An online listing of products qualified to
this specification may be found in the Qualified Products Database (QPD) at https://assist.dla.mil.
6.5.1 Copies of “Provisions Governing Qualification SD-6”. Copies of the “Provisions Governing
Qualification SD6” may be found online at https://assist.dla.mil.
6.5.2 Application information. The information shown on figure 18 is for guidance in design and
application. The flashover voltages shown on figure 18 do not include corona or any safety factor.
6.6 Intermetallic contact. The finishing of metallic areas to be placed in intimate contact by
assembly presents a special problem, since intermetallic contact of dissimilar metals results in electrolytic
couples which promote corrosion through galvanic action. To provide the required corrosion protection,
intermetallic couples are restricted to those specified in table XXXI. Table XXXI shows metals and alloys
(or plates) by groups which have common electromotive forces (EMF) within 0.05 volt when coupled with
a saturated calomel electrode in sea-water at room ambient temperatures. All members of a group are
considered as completely compatible, one with the other. Compatible couples between groups have
been specified in table XXXI based on a potential difference of 0.25 volt maximum. To simplify any
arithmetic involved, table XXXI shows, in addition to EMF against a calomel electrode, a derived “anodic
index” with group 1 (gold, etc) as 0 and group 18 (magnesium, etc) as 175. Subtraction of a lower group
anodic index gives the EMF difference in hundredths of a volt.
6.6.1 Groups. Table XXXI sets up 18 primary groups. It may be noted that neither the metallurgical
similarity nor dissimilarity of metals is the parameter for selection of compatible couples. All members
within a group, regardless of metallurgical similarity, are considered inherently non-susceptible to galvanic
action, when coupled with any member within the group; for example, such dissimilar metals as platinum
and gold. Similarly, such basically dissimilar alloys as austenitic stainless steel, silver-solder, and low
brass (all members of group 5) are inherently non-susceptible when coupled together.
6.6.2 Selection of compatible couples. Proper selection of metals in the design of equipment will result
in fewer intermetallic contact problems. For example, for sheltered exposure, neither silver nor tin require
protective finishes. However, since silver has an anodic index of 15 and tin 65, the EMF generated as a
couple is 0.50 volt, which is not allowable as specified in table XXXI. In this case, other metals or plates
will be required. It should be noted that, in intermetallic couples, the member with the higher anodic index
is anodic to the member with the lower anodic index and will be susceptible to corrosion in the presence
of an electrolytic medium. If the surface area of the cathodic part is significantly greater than that of the
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anodic part, the corrosive attack on the contact area of the anodic part may be greatly intensified.
Material selection for intermetallic contact parts, therefore; should establish the smaller part as the
cathodic member of the couple, whenever practicable.
6.6.3 Plating. When base metals intended for intermetallic contact form couples not allowed by
table XXXI, they are to be plated with those metals which will reduce the potential difference to that
allowed as specified in table XXXI.
6.7 Patent notice. The Government has a royalty-free license under the following listed patents for the
benefit of manufacturers of the item either for the Government or for use in equipment to be delivered to
the Government.
U.S. patent numbers
2,563,712
2,984,811.
Patents 2,563,712 and 2,984,811.
6.8 Military unique statement. This connector is military unique because it is an environment resisting,
miniature, quick disconnect circular connector, capable of operating in high shock, high vibration and high
temperature environments as well as meeting the salt spray corrosion requirements of this specification.
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6.10 Guidance on use of alternative parts with less hazardous or nonhazardous materials. This
specification provides for a number of alternative plating materials via the PIN. Users should select the
PIN with the least hazardous material that meets the form, fit and function requirements of their
application.
Contact
Coupling, bayonet
Crimp
Front release
Jam-nut
Localized finish
Overall finish
Rear release
Solder
6.12 Tin whisker growth. The use of alloys with tin content greater than 97 percent, by mass, may
exhibit tin whisker growth problems after manufacture. Tin whiskers may occur anytime from a day to
years after manufacture and can develop under typical operating conditions, on products that use such
materials. Conformal coatings applied over top of a whisker-prone surface will not prevent the formation
of tin whiskers. Alloys of 3 percent lead, by mass, have shown to inhibit the growth of tin whiskers. For
additional information on this matter, refer to ASTM-B545 (Standard Specification for Electrodeposited
Coatings of Tin) (see 3.11).
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6.15 Guidance on use of inactive documents. “Inactive for New Design” is defined by Defense
Standardization Program, Policies and Procedures, DoD 4120-24M, available. In accordance with AP1.37
of the aforementioned document, an inactive document is a term applied to an existing standardization
document for an item no longer approved for use in new designs or equipment. The document can be
used for procurements in support of existing designs or equipment.
6.16 Amendment notations. The margins of this specification are marked with vertical lines to indicate
modifications generated by this amendment. This was done as a convenience only and the Government
assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are
cautioned to evaluate the requirements of this document based on the entire content irrespective of the
marginal notations.
82
83
84
85
86
Applies to series
1 only 1 only 1 only 1 only 1 and 2 1 only
A B C D E F
Shell package (see note 1) socket pin (see note 4) pin
size location insert contact insert
location location location
8
10
12 .392 (9.96) .153 (3.89) .025 (0.64) .050 (1.27)
14 .372 (9.45) .075 (1.91) .005 (0.13) .030 (0.76)
.133 (3.38)
16 .085 (2.16) .093 (2.36)
18 .055 (1.40)
20
22 .454 (11.53) .215 (5.46) .087 (2.21) .112 (2.84)
.434 (11.02) .137 (3.48) .067 (1.70) .172 (4.37) .092 (2.34)
24
.132 (3.35)
Applies to series
1 and 2 1 and 2 1 only 1 only 1 only 1 and 2
Shell G H J K L M
size bay pin bay pin pin pin (see note 1) socket
dia location contact insert insert
location location location
8
10
12 .095 (2.41) .332 (8.43) .357 (9.07)
.084 (2.13) .100 TP .065 (1.65) .312 (7.92) .337 (8.56)
14
.076 (1.93) (2.54) .143 (3.63)
16 .065 (1.65)
18
20
22 .157 (3.99) .394 (10.01) .419 (10.64)
.131 (3.33) .109 TP .127 (3.22) .374 (9.50) .399 (10.13)
24
.123 (3.12) (2.77)
87
Applies to series
1 and 2 1 and 2 1 and 2 1 and 2 1 and 2
Shell
N P R S T
size
shoulder max insert shell dia over shell
location dia ID keyways OD
.367 (9.32) .417 (10.59) .474 (12.04)
8 .285 (7.24)
.361 (9.17) .406 (10.31) .468 (11.89)
.495 (12.57) .545 (13.84) .591 (15.01)
10 .402 (10.21)
.489 (12.42) .534 (13.56) .585 (14.86)
.612 (15.54) .694 (17.63) .751 (19.08)
12 .516 (13.11)
.363 (9.22) .606 (15.39) .683 (17.35) .745 (18.92)
.343 (8.71) .737 (18.72) .819 (20.80) .876 (22.25)
14 .641 (16.28)
.731 (18.57) .808 (20.52) .870 (22.10)
.862 (21.89) .944 (23.98) 1.001 (25.43)
16 .766 (19.46)
.856 (21.74) .933 (23.70) .995 (25.27)
.967 (24.56) 1.044 (26.52) 1.126 (28.60)
18 .855 (21.72)
.961 (24.41) 1.033 (26.24) 1.120 (28.45)
1.092 (27.74) 1.169 (29.69) 1.251 (31.78)
20 .980 (24.89)
1.086 (27.58) 1.158 (29.41) 1.245 (31.62)
1.217 (30.91) 1.294 (32.87) 1.376 (34.95)
22 .425 (10.79) 1.105 (28.07)
1.211 (30.76) 1.283 (32.59) 1.370 (34.80)
.405 (10.29)
1.342 (34.09) 1.419 (36.04) 1.501 (38.13)
24 1.229 (31.22)
1.336 (33.93) 1.408 (35.76) 1.495 (37.97)
88
Applies to series
1 and 2 1 and 2 1 and 2 1 and 2 1 and 2 1 and 2
Shell U V W X Y Z
size dia cpig R cpig R dia shell min
over groove ID over OD shell
bays dia keys ID
.563 (14.30) .581 (14.76) .486 (12.34) .403 (10.24) .358 (9.09)
8 .292 (7.42)
.547 (13.89) .570 (14.48) .480 (12.19) .392 (9.96) .352 (8.94)
.680 (17.27) .702 (17.83) .607 (15.42) .531 (13.49) .486 (12.34)
10 .409 (10.39)
.664 (16.86) .691 (17.55) .601 (15.27) .520 (13.21) .480 (12.19)
.859 (21.82) .876 (22.25) .766 (19.46) .680 (17.27) .598 (15.19)
12 .523 (13.28)
.843 (21.41) .865 (21.97) .760 (19.30) .669 (16.99) .592 (15.04)
.984 (25.00) 1.000 (25.40) .890 (22.61) .805 (20.45) .723 (18.36)
14 .648 (16.46)
.968 (24.59) .989 (25.12) .884 (22.45) .794 (20.17) .717 (18.21)
1.108 (28.14) 1.125 (28.58) 1.015 (25.78) .930 (23.62) .848 (21.54)
16 .772 (19.61)
1.092 (27.94) 1.114 (28.30) 1.009 (25.63) .919 (23.34) .842 (21.39)
1.233 (31.32) 1.250 (31.75) 1.141 (28.98) 1.030 (26.16) .948 (24.08)
18 .862 (21.89)
1.217 (30.91) 1.239 (31.47) 1.135 (28.83) 1.019 (25.88) .942 (23.93)
1.358 (34.49) 1.375 (34.93) 1.265 (32.13) 1.155 (29.34) 1.073 (27.25)
20 .987 (25.07)
1.342 (34.09) 1.364 (34.65) 1.259 (31.98) 1.144 (29.06) 1.067 (27.10)
1.483 (37.67) 1.500 (38.10) 1.390 (35.31) 1.280 (32.51) 1.198 (30.43)
22 1.111 (28.22)
1.467 (37.26) 1.489 (37.82) 1.384 (35.15) 1.269 (32.23) 1.192 (30.28)
1.610 (40.89) 1.629 (41.38) 1.515 (38.48) 1.405 (35.69) 1.323 (33.60)
24 1.237 (31.42)
1.594 (40.49) 1.618 (41.10) 1.509 (38.33) 1.394 (35.41) 1.317 (33.45)
Applies to series
Shell 2 only 2 only 2 only 1 and 2 2 only
size AA CC FF GG KK
(see note 5) socket pin bay pin pin
insert insert groove insert
8
10
12 .335 (8.51) .022 (0.56) .045 (1.14) .106 (2.69) .334 (8.48)
14 .315 (8.00) .005 (0.13) .025 (0.64) .089 (2.26) .317 (8.05)
16
18
20
22 .397 (10.08) .084 (2.13) .107 (2.72) .396 (10.06)
24 .377 (9.58) .067 (1.70) .087 (2.21) .153 (3.89) .379 (9.63)
.136 (3.45)
89
90
NOTES:
1. ‘B’ and ‘L’ distance between end of shell and the point at which a gage pin having the same basic
diameter as the mating contact and a square face first engages socket contact spring
(applies to series 1 only).
2. Details ‘A’ and ‘B’ apply to both plugs and receptacles (applies to series 2 only).
3. ‘XX’ where space does not permit use of normal diameters, reduced diameters are used. Refer to
applicable MS connector sheets for affected arrangements (applies to series 2 only).
4. ‘E’ distance from plug shell shoulder to locking point of coupling ring
(applies to series 1 and series 2).
5. ‘AA’ initial contact with static seal (applies to series 2 only).
6. Dimensions are in inches. Metric equivalents are given for information only.
91
Shell A B C D E dia.
size thread Receptacle Plug
(class 2) (max) (min)
8 .305 (7.75) .370 (9.40) .437 (11.10) .500-20 UNF .499 (12.67) .470 (11.94)
10 .405 (10.29) .497 (12.62) .572 (14.53) .625-24 UNEF .625 (15.88) .600 (15.24)
12 .531 (13.49) .613 (15.57) .687 (17.45) .750-20 UNEF .750 (19.05) .724 (18.39)
14 .665 (16.89) .738 (18.75) .812 (20.62) .875-20 UNEF .875 (22.23) .849 (21.56)
16 .790 (20.07) .863 (21.92) .937 (23.80) 1.000-20 UNEF 1.000 (25.40) .974 (24.74)
18 .869 (22.07) .919 (23.34) .992 (25.20) 1.0625-18 UNEF 1.062 (26.97) 1.030 (26.16)
20 .994 (25.25) 1.044 (26.52) 1.117 (28.37) 1.1875-18 UNEF 1.187 (30.15) 1.154 (29.31)
22 1.119 (28.42) 1.169 (29.69) 1.242 (31.55) 1.3125-18 UNEF 1.312 (33.32) 1.279 (32.49)
24 1.244 (31.60) 1.294 (32.87) 1.367 (34.72) 1.4375-18 UNEF 1.437 (36.50) 1.404 (35.66)
Inches mm Inches mm
.045 1.14 .849 21.56
.046 1.17 .863 21.92
.061 1.55 .869 22.07
.070 1.78 .875 22.23
.130 3.30 .919 23.34
.190 4.83 .937 23.80
.290 7.37 .974 24.74
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for information only.
92
DETAIL A
CLASSES E, P AND J
CLASS H
93
SOCKET CONTACT WITH SEPARATE PRESSURE MEMBER AS PRIMARY CURRENT CARRYING INTERFACE
AREAS OF APPLICATIONS OF LOCALIZED FINISH
94
PIN CONTACTS
AREAS OF APPLICATIONS OF LOCALIZED FINISH
Contact A C D E F G H J K L
size ± .001 max min + .063 min max ± .031 ± .010 max min min
(0.02) (1.60) (0.79) (0.25)
- .016
(0.41)
20 .040 .100 .042 .125 .061 .088 .094 .037 .085 .012 .042
(1.02) (2.54) (1.07) (3.18) (1.55) (2.24) (2.39) (0.94) (2.16) (0.30) (1.07)
16 .0625 .130 .069 .096 .116 .054 .115 .020 .065
(1.59) (3.30) (1.75) .188 (2.44) (2.95) .125 (1.37) (2.92) (0.51) (1.65)
12 .094 .190 .112 (4.78) .139 .150 (3.18) .070 .190 .096
(2.39) (4.83) (2.84) (3.53) (3.81) (1.78) (4.83) (2.44)
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for information only.
3. Dimension “N” equals length of maximum electrical contact (wiping) area plus .020 (0.51 mm)
minimum. Maximum wipe shall be equal to maximum “M” of mating pin engagement minus the
spherical radius.
4. Surface finish shall be in accordance with ASME-B46.1.
5. Dimension “A” is measured over plating.
NOTES:
1. Contact identification letters on rear grommet face of socket and pin insert shall be within 45º either
side of vertical centerline above the contact cavity.
2. Letters shall be placed on socket insert engaging face as shown. The letters shall be above the
horizontal centerline of the chamfered lead-ins. Where space precludes the application of letters an
ever expanding orbital line is permissible.
3. Letters on the engaging face of the pin insert shall be on the raised seal barrier or at the base of the
raised seal barrier above or beside the pin contact cavity. Letters shall not extend into the lower
sector of the raised seal barrier which extends 45º to either side of the vertical centerline. Where
space precludes their application an expanding orbital line is permissible.
4. On outer row of contacts individual cavity identification may be deleted from those cavities where
space precludes its application.
5. Underscoring of lower case letters is optional.
96
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for information only.
97
98
99
100
Inches mm
.100 2.54
.150 3.81
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for information only.
101
NOTES:
1 Dimensions are in inches.
2. Metric equivalents are given for information only.
3. F = .290 inches (7.37 mm) minimum and E = .290 inches (7.37 mm) minimum; F equals length of
maximum electrical contact (wiping) area +.000, -.020 inches (0.51 mm). Maximum wipe shall be
equal to maximum E of mating pin engagement minus the spherical radius.
102
FIGURE 18. Typical flashover voltage vs altitude on unmated miniature connectors (see 6.6).
CONCLUDING MATERIAL
Review activities:
Army - AR, AV
Navy - EC, SH
NOTE: The activities listed above were interested in this document as of the date of this document.
Since organizations and responsibilities can change, you should verify the currency of the information
above using the ASSIST Online database at https://assist.dla.mil.
103