Tessent Command Study Notes 5
Tessent Command Study Notes 5
1. report_gates
Displays netlist information and simulation results for specified
gates, as well as simulation results for specific user-defined
ATPG functions. This command requires a flattened netlist
before use.
2. set_gate_report
Specifies the information displayed by the report_gates
command.
3. report_scan_volume
Shows the amount of scan data used by the pattern set,
including chain test patterns. Because pattern count is not a
good measure of EDT compression for different scan
configurations, this command gives an equivalent standard
measure of EDT and conventional ATPG, making it easier to
compare their results.
4. add_scan_chains
Assign names to pre-existing scan chains in the design.
5. create_module
Create a new design module with no ports.
After you create a module using this command, you can use
the set_current_design command to set the new module as
the top-level design for all subsequent commands and
provide the name of the new module.
You can add a new port to the new module using the
create_port command, add an instance using the
create_instance command, and then connect the pins using
the create_connections command. Optionally, you can save
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the complete module to disk using the write_design
command.
6. create_port
Creates a port on the specified design block.
7. create_instance
Instantiate the module mod_spec in the design module of the
current design module. If the command succeeds, a collection
of newly created instances will be returned.
8. add_nonscan_instances
Sets a custom is_non_scannable attribute on specified
design objects to exclude the objects from the scan
insertion process.
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The tool does not perform scanability checks on non-scan
instances.
9. analyze_bus
Analyze the contention issues of specified bus gates.
10.add_input_constraints
Constrain PIs to specified values.
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Constraints derived form
ports with port attributes set to "power" or "ground" are
correctly constrained using constraint types "CT1" and "CT0".
(set_current_design)
11.add_dft_control_points
Instructs the tool to assume the presence of DFT control logic
during pre-DFT DRC and to insert the control logic during DFT
insertion (as part of process_dft_specification).
12.write_design_import_script
Generates a script that can be processed by a synthesis tool to
synthesize the RTL design that has the DFT inserted.
13.report_power_metrics
Displays the power consumption metirc of the shift and capture
of the specified test patterns. Use this information to identify
test patterns that may cause chip failures due to power
consumption issues.
14.set_power_control
Enable low power ATPG and set the switching or capture
threshold. You can also run this command without parameters
to report the current power control settings.
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Using set_power_control to meet the power constraint will
affect the ATPG test pattern count and the tool running time
because calculating the toggle rate of each test pattern
requires additional time.
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